A USB-powered chip test fixture

Abstract

This utility model relates to the field of chip testing technology, specifically to a USB-powered chip testing fixture, including a test base and a pressure base. The test base has a test protrusion on its top; the test protrusion has a telescopically movable test probe; the test base has a circuit board and a USB interface; the test probe and the USB interface are electrically connected to the circuit board; the pressure base includes a fixed base and a flip base; the fixed base is fixedly connected to the outer periphery of the test protrusion; the fixed base has a through-hole pressure channel; the bottom of the flip base has a movable pressure block; it also includes a push block; the push block is threadedly connected to the flip base; the bottom of the push block abuts against the pressure block; the top of the push block is connected to a rotating plate. This utility model, by providing a USB interface, facilitates power supply to the chip testing fixture; furthermore, by controlling the rotation angle of the rotating plate, the downward pressure distance of the pressure block can be adjusted, thereby adapting to chips of different thicknesses under test.

Description

Technical Field

[0001] This utility model relates to the field of chip testing technology, and specifically to a USB-powered chip testing fixture. Background Technology

[0002] In the chip manufacturing industry, the pre-shipment testing stage is crucial, directly impacting the chip's quality and performance. Currently, chip manufacturing processes are constantly evolving, with various chips exhibiting diverse development trends in size, function, and internal structure. This places extremely high demands on the adaptability of chip testing fixtures. Traditional chip testing fixtures mostly employ a vertical pressing design. In the testing process, the operator first precisely places the chip to be tested in the designated position on the fixture. Then, the fixture is activated, pressing the chip tightly against the test board vertically to establish an electrical connection, thereby completing various performance tests. However, this traditional fixture has a serious limitation. With the rapid development of chip manufacturing technology, the thickness differences between different chip models are becoming increasingly significant. The pressing stroke of traditional vertical pressing fixtures is pre-fixed. When dealing with chips with varying thicknesses, if the pressing stroke is too long, excessive pressure during testing could cause irreversible physical damage to the chip, rendering it unusable. If the pressing stroke is too short, sufficient contact between the chip and the test board cannot be achieved, making accurate testing impossible. This means that existing fixtures are insufficient to meet testing requirements when encountering new chips with varying thicknesses. Companies are forced to invest significant manpower, resources, and time in redesigning and manufacturing these fixtures. This not only greatly increases chip testing costs and extends product launch cycles but also severely hinders chip manufacturers' ability to respond quickly to diverse market demands. It prevents them from achieving the goal of using a single fixture to efficiently test chips of various thicknesses, becoming a key bottleneck restricting efficiency improvements and cost control in the chip testing process. Utility Model Content

[0003] The purpose of this invention is to address the aforementioned shortcomings in the prior art by providing a USB-powered chip testing fixture.

[0004] The objective of this utility model is achieved through the following technical solution: a USB-powered chip testing fixture, comprising a test base and a pressure base; a test protrusion is provided on the top of the test base; a test probe is movably mounted on the test protrusion; the test base is provided with a circuit board and a USB interface; the test probe and the USB interface are electrically connected to the circuit board respectively;

[0005] The pressure seat includes a fixed seat and a flip seat; the fixed seat is fixedly connected to the outer periphery of the test boss; one end of the flip seat is hinged to one end of the fixed seat; the other end of the flip seat is detachably connected to the other end of the fixed seat; the fixed seat is provided with a pressure channel; the bottom of the flip seat is provided with a pressure block that can be raised and lowered; the pressure block is movably disposed in the pressure channel.

[0006] The USB-powered chip test fixture also includes a push block; the push block is threadedly connected to a flip seat; the bottom of the push block abuts against a pressure block; and a rotating plate is connected to the top of the push block.

[0007] The present invention is further configured such that a limiting rod is connected to the top of the pressure block; the limiting rod is telescopically movably mounted on the flipping seat; and a return spring is provided between the limiting rod and the flipping seat.

[0008] The present invention is further provided that the rotating plate is provided with a handle.

[0009] The present invention is further provided that a gasket is provided between the push block and the pressure block.

[0010] The present invention is further configured such that a heat dissipation block is provided on the top of the pressure block; a plurality of heat dissipation fins are provided on the top of the heat dissipation block; and the heat dissipation block passes through the push block and the rotating plate.

[0011] The present invention is further configured such that a cooling fan is provided on the top of the heat dissipation fins; and a heat dissipation channel is provided through the heat dissipation block.

[0012] The present invention is further configured such that: a connecting fastener is provided at the other end of the flipping seat; the middle part of the connecting fastener is hinged to the other end of the flipping seat; a backing spring is provided between the top of the connecting fastener and the flipping seat; a first locking block is provided at the bottom of the connecting fastener; and a second locking block is provided at the other end of the fixing seat to engage with the first locking block.

[0013] The present invention is further provided with a buffer spring between the test probe and the test seat.

[0014] The present invention is further configured such that a limiting pin is provided at the top of the flipping seat; an arc-shaped limiting groove is provided at the bottom of the rotating plate; and the limiting pin is movably disposed in the arc-shaped limiting groove.

[0015] The present invention is further configured such that the top of the flipping seat is provided with a plurality of limiting holes along the circumferential surface; the limiting pin is detachably connected to the limiting holes.

[0016] The beneficial effects of this utility model are as follows: By setting a USB interface, this utility model can easily power the chip test fixture; in addition, by controlling the rotation angle of the rotating plate, the pressing distance of the pressure block can be adjusted, thereby adapting to chips of different thicknesses. Attached Figure Description

[0017] The utility model will be further described with reference to the accompanying drawings, but the embodiments in the drawings do not constitute any limitation on the present utility model. For those skilled in the art, other drawings can be obtained based on the following drawings without creative effort.

[0018] Figure 1 This is a schematic diagram of the structure of this utility model;

[0019] Figure 2 This is a cross-sectional view of the present invention;

[0020] Figure 3 This is a schematic diagram of the structure of the pressure seat of this utility model;

[0021] Figure 4 This is a structural schematic diagram of the pressure seat of this utility model from another perspective;

[0022] Figure 5 This is a cross-sectional view of the pressure seat of this utility model;

[0023] Figure 6 This is a cross-sectional view of the pressure seat of this utility model from another perspective;

[0024] The components are as follows: 1. Test base; 11. Test boss; 12. Test probe; 13. Buffer spring; 14. Circuit board; 2. USB interface; 3. Fixing base; 31. Pressing channel; 32. Second locking block; 4. Flip base; 41. Limiting pin; 42. Limiting hole; 5. Pressing block; 51. Limiting rod; 52. Reset spring; 6. Push block; 61. Washer; 7. Rotating plate; 71. Handle; 72. Arc-shaped limiting groove; 8. Heat sink; 81. Heat sink fins; 82. Heat sink fan; 83. Heat dissipation channel; 9. Connecting fastener; 91. Abutment spring; 92. First locking block. Detailed Implementation

[0025] The present invention will be further described in conjunction with the following embodiments.

[0026] Depend on Figures 1 to 6 As can be seen, the USB-powered chip test fixture described in this embodiment includes a test base 1 and a pressure base; the top of the test base 1 is provided with a test protrusion 11; the test protrusion 11 is movably provided with a test probe 12; the test base 1 is provided with a circuit board 14 and a USB interface 2; the test probe 12 and the USB interface 2 are electrically connected to the circuit board 14 respectively.

[0027] The pressure seat includes a fixed seat 3 and a flip seat 4; the fixed seat 3 is fixedly connected to the outer periphery of the test boss 11; one end of the flip seat 4 is hinged to one end of the fixed seat 3; the other end of the flip seat 4 is detachably connected to the other end of the fixed seat 3; the fixed seat 3 is provided with a pressure channel 31; the bottom of the flip seat 4 is provided with a pressure block 5 that can be raised and lowered; the pressure block 5 is movably disposed in the pressure channel 31.

[0028] The USB-powered chip test fixture also includes a push block 6; the push block 6 is threadedly connected to the flip seat 4; the bottom of the push block 6 abuts against the pressure block 5; and a rotating plate 7 is connected to the top of the push block 6.

[0029] Specifically, in the USB-powered chip test fixture described in this embodiment, the USB interface 2 on the test socket 1 serves as the power supply interface, allowing direct use of the 5V power supply from the USB interface 2. This results in more stable voltage and more reliable power supply. When the tested chip is unstable, the USB interface 2 can also limit current and save the signal. In addition, the single-port chip test fixture powered by the USB interface 2 has the advantages of small size, short line distance, fewer lines, and stable signal. The test mode of one USB interface 2 corresponding to one chip is closer to the environment in which the chip is used, and has advantages such as small test error.

[0030] Specifically, in this embodiment, the USB-powered chip test fixture is used by first placing the chip under test in the test boss 11 so that the test probe 12 abuts against the chip under test. Then, the flip seat 4 is rotated so that the flip seat 4 and the fixed seat 3 are closed. After the cover is closed, the pressure block 5 is separated from the chip under test. Then, by rotating the rotating plate 7 in the forward direction, the rotating plate 7 drives the push block 6 to rotate. Since the push block 6 is threadedly connected to the flip seat 4, the push block 6 drives the pressure block 5 to move downward during the rotation, so that the pressure block 5 abuts against the chip under test. This embodiment can adjust the downward pressure distance of the pressure block 5 by controlling the rotation angle of the rotating plate 7, so as to adapt to chips under test of different thicknesses.

[0031] In this embodiment, a USB-powered chip testing fixture is described, wherein the top of the pressure block 5 is connected to a limiting rod 51; the limiting rod 51 is movably and telescopically mounted on the flip base 4; and a reset spring 52 is provided between the limiting rod 51 and the flip base 4. Specifically, through the above arrangement, when the rotating plate 7 is rotated in the reverse direction, the pressure block 5 can move upward and reset under the action of the reset spring 52.

[0032] This embodiment describes a USB-powered chip testing fixture, wherein the rotating plate 7 is equipped with a handle 71. This design facilitates the rotation of the rotating plate 7.

[0033] In this embodiment, a USB-powered chip testing fixture is provided with a pad 61 between the push block 6 and the pressure block 5. This arrangement protects the pressure block 5.

[0034] This embodiment describes a USB-powered chip testing fixture, in which a heat sink 8 is provided on the top of the pressure block 5; the heat sink 8 is provided on the top of the pressure block 5 with multiple heat dissipation fins 81; the heat sink 8 passes through the push block 6 and the rotating plate 7. This arrangement facilitates heat dissipation for the chip under test and the chip testing fixture.

[0035] This embodiment describes a USB-powered chip testing fixture, in which a cooling fan 82 is provided on the top of the heat sink 81; and a heat dissipation channel 83 is provided through the heat sink 8. These features further enhance heat dissipation for both the chip under test and the chip testing fixture.

[0036] This embodiment describes a USB-powered chip testing fixture. The flip base 4 has a connecting fastener 9 at one end; the middle of the connecting fastener 9 is hinged to the other end of the flip base 4; a retaining spring 91 is provided between the top of the connecting fastener 9 and the flip base 4; a first locking block 92 is provided at the bottom of the connecting fastener 9; and a second locking block 32 is provided at the other end of the fixed base 3 to engage with the first locking block 92. With these features, when the first locking block 92 engages with the second locking block 32, the retaining spring 91 ensures a stable connection between the flip base 4 and the fixed base 3.

[0037] In this embodiment, a USB-powered chip testing fixture is provided with a buffer spring 13 between the test probe 12 and the test socket 1. This arrangement provides a buffering effect.

[0038] In this embodiment, a USB-powered chip testing fixture is provided, wherein the top of the flip base 4 is provided with a limiting pin 41; the bottom of the rotating plate 7 is provided with an arc-shaped limiting groove 72; and the limiting pin 41 is movably disposed in the arc-shaped limiting groove 72. In this embodiment, the top of the flip base 4 is provided with multiple limiting holes 42 along its circumferential surface; and the limiting pin 41 is detachably connected to the limiting holes 42.

[0039] Specifically, in this embodiment, by setting multiple limiting holes 42, the limiting pin 41 can be fixed with different limiting holes 42. That is, by cooperating with the arc-shaped limiting groove 72, the rotation angle of the rotating plate 7 can be limited, thereby controlling the pressing distance of the pressure block 5, so as to match the test chip of different thicknesses.

[0040] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this utility model, and are not intended to limit the scope of protection of this utility model. Although this utility model has been described in detail with reference to preferred embodiments, those skilled in the art should understand that modifications or equivalent substitutions can be made to the technical solutions of this utility model without departing from the essence and scope of the technical solutions of this utility model.

Claims

1. A USB-powered chip test fixture, characterized by: It includes a test base (1) and a pressure seat; the test base (1) has a test boss (11) on its top; the test boss (11) is movably equipped with a test probe (12); the test base (1) has a circuit board (14) and a USB interface (2); the test probe (12) and the USB interface (2) are electrically connected to the circuit board (14) respectively; The pressure seat includes a fixed seat (3) and a flip seat (4); the fixed seat (3) is fixedly connected to the outer periphery of the test boss (11); one end of the flip seat (4) is hinged to one end of the fixed seat (3); the other end of the flip seat (4) is detachably connected to the other end of the fixed seat (3); the fixed seat (3) is provided with a pressure channel (31); the bottom of the flip seat (4) is provided with a pressure block (5) that moves up and down; the pressure block (5) is movably located in the pressure channel (31); The USB-powered chip test fixture also includes a push block (6); the push block (6) is threadedly connected to the flip seat (4); the bottom of the push block (6) abuts against the pressure block (5); and a rotating plate (7) is connected to the top of the push block (6).

2. The USB-powered chip test fixture according to claim 1, characterized in that: The top of the pressure block (5) is connected to a limiting rod (51); the limiting rod (51) is telescopically movably mounted on the flip seat (4); a return spring (52) is provided between the limiting rod (51) and the flip seat (4).

3. The USB-powered chip test fixture according to claim 1, characterized in that: The rotating plate (7) is provided with a handle (71).

4. The USB-powered chip test fixture according to claim 1, characterized in that: A gasket (61) is provided between the push block (6) and the pressure block (5).

5. A USB-powered chip testing fixture according to claim 1, characterized in that: The top of the pressure block (5) is provided with a heat dissipation block (8); the top of the heat dissipation block (8) is provided with multiple heat dissipation fins (81); the heat dissipation block (8) passes through the push block (6) and the rotating plate (7).

6. A USB-powered chip test fixture according to claim 5, characterized in that: The top of the heat dissipation fins (81) is provided with a heat dissipation fan (82); the heat dissipation block (8) is provided with a heat dissipation channel (83).

7. A USB-powered chip test fixture according to claim 1, characterized in that: The other end of the flip seat (4) is provided with a connecting fastener (9); the middle part of the connecting fastener (9) is hinged to the other end of the flip seat (4); a retaining spring (91) is provided between the top of the connecting fastener (9) and the flip seat (4); a first locking block (92) is provided at the bottom of the connecting fastener (9); and a second locking block (32) is provided at the other end of the fixing seat (3) to engage with the first locking block (92).

8. A USB-powered chip test fixture according to claim 1, characterized in that: A buffer spring (13) is provided between the test probe (12) and the test seat (1).

9. A USB-powered chip test fixture according to claim 1, characterized in that: The top of the flip seat (4) is provided with a limiting pin (41); the bottom of the rotating plate (7) is provided with an arc-shaped limiting groove (72); the limiting pin (41) is movably disposed in the arc-shaped limiting groove (72).

10. A USB-powered chip test fixture according to claim 9, characterized in that: The top of the flip seat (4) is provided with a plurality of limiting holes (42) along the circumferential surface; the limiting pin (41) is detachably connected to the limiting hole (42).

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