Improved irregular-shaped test socket

Abstract

This utility model discloses an improved irregular-shaped test socket, including an irregular-shaped pin plate. The pin plate has multiple sets of mounting holes, each set including multiple parallel pin slots, with the pin tip slot higher than the pin tail slot. A circular limiting groove penetrating multiple pin slots is provided in the center of each mounting hole, located above a hollowed-out portion. A silicone circular rod is installed within the circular limiting groove. The arc-shaped portion of the irregular-shaped pin is installed below the silicone circular rod, with the pin tip located in the pin tip slot and the pin tail slot within the pin tail slot. A silicone strip groove is provided above the circular limiting groove and the pin tail slot, containing a silicone strip used to press against the silicone circular rod and pin tip. The silicone strip is made of a softer material than the silicone circular rod. This utility model increases the rigidity of the rotating shaft, stabilizing the rotation of the irregular-shaped pin, preventing sliding friction, improving the lifespan of the circuit board, increasing the interference contact amount, and ensuring reliable contact.

Description

Technical Field

[0001] This utility model relates to the field of test sockets, and more particularly to an improved irregular-shaped test socket. Background Technology

[0002] As signal transmission frequencies increase and high-definition signals demand higher data transmission accuracy, the requirements for chips also become more stringent. Therefore, test sockets must minimize their impact on signal transmission. However, traditional test sockets suffer from impedance variations upon subsequent contact with the chip due to solder adhesion and wear. This impedance distortion during chip testing leads to significant deviations from test specifications, resulting in lower yield rates and ultimately causing good chips to be classified as defective.

[0003] In the current non-standard test socket, during the testing process, when the non-standard probes are in contact with the circuit board pads during the chip testing process, when the transition from a free state to a working state occurs, the bottom of the non-standard probes slides and moves on the pads, causing scratches on the pads. After the pads are scratched, the gold plating layer is worn away, resulting in unstable contact.

[0004] The existing structure has three technical problems:

[0005] 1. The circuit board is expensive, and the existing structure is prone to causing the circuit board to be scrapped. Because the current technology structure is easy to wear the circuit board, it will lead to the scrapping of the circuit board. The "L"-shaped silicone has no support surface. During the pressing of the irregular pin, the "L"-shaped silicone is easy to move backward, causing the irregular pin to scratch the circuit board pads and make it scrapped.

[0006] 2. The rotating shaft of the irregular needle is too soft, resulting in an unstable rotation trajectory;

[0007] 3. The interference contact between the irregularly shaped pin and the circuit board is too small, resulting in poor tolerance. Utility Model Content

[0008] To overcome the above-mentioned shortcomings, the purpose of this utility model is to provide an improved irregular test socket that increases the rigidity of the rotating shaft, stabilizes the rotation of the irregular pin, avoids sliding friction of the irregular pin, improves the life of the circuit board, increases the amount of interference contact, and ensures reliable contact.

[0009] To achieve the above objectives, one technical solution adopted by this utility model is: an improved irregular-shaped test socket, including an irregular-shaped needle plate, wherein the irregular-shaped needle plate has multiple sets of mounting holes, each set of mounting holes including multiple parallel needle grooves, the needle grooves being used to mount irregular-shaped needles, the middle part of the needle groove being a hollow part, one end of the needle groove being a needle tip groove, and the other end being a needle tail groove, the needle tip groove being higher than the needle tail groove; a circular limiting groove is provided in the middle of each mounting hole, the circular limiting groove penetrating multiple needle grooves, the circular limiting groove being positioned... Above the hollowed-out portion, a silicone circular rod is installed in the circular limiting groove. The top of the silicone circular rod protrudes from the circular limiting groove. The arc-shaped part of the middle of the irregular needle is installed below the silicone circular rod and protrudes from the bottom surface of the irregular needle plate. The tip of the irregular needle is located in the tip groove and is higher than the top surface of the irregular needle plate. The tail groove of the irregular needle is located in the tail groove. A silicone strip groove is provided above the circular limiting groove and the tail groove. A silicone strip is installed in the silicone strip groove. The silicone strip is used to press the silicone circular rod and the tip. The material of the silicone strip is softer than that of the silicone circular rod.

[0010] The beneficial effects of this improved irregular-shaped test socket are as follows: the irregular-shaped pin is placed inside the irregular-shaped pin plate, and the range of motion of the irregular-shaped pin is fixed by a silicone circular rod. The circular limiting groove structure on the irregular-shaped pin plate ensures the stable fixed position of the silicone circular rod, solving the problem of fixing the irregular-shaped pin to the rotating shaft; the combination of hard silicone circular rod and soft silicone strip replaces the "L"-shaped silicone strip of the same hardness, solving the problem of the irregular-shaped pin scratching the solder pads of the circuit board and ensuring the stability and reliability of the fixed shaft around which the irregular-shaped pin surrounds; compared with the prior art, this application has a simple structure, no increase in manufacturing cost, convenient installation, stable structure, avoids scratching the circuit board, and provides stable and reliable contact.

[0011] Preferably, the device further includes a chip guide frame located on the upper surface of the shaped needle plate and a test circuit board on the lower surface; a chip limiting hole is provided in the middle of the chip guide frame, a chip is installed in the chip limiting hole, a chip pad is provided at the bottom of the chip, the chip guide frame is fixed to the upper part of the shaped needle plate by bolts, and the needle tip is located below the chip pad of the chip; the test circuit board is provided with a circuit board pad, and the arc-shaped part protruding from the bottom surface of the shaped needle plate abuts against the circuit board pad. The chip guide frame and the test circuit board are used together, and the bolts fix the shaped needle plate and the chip guide frame together, thereby ensuring that when the shaped needle moves, the chip guide frame can exert a reaction force on the square silicone strip on the shaped needle. This force is transmitted to the needle tip of the shaped needle, part of which is decomposed into a scraping force with the chip pad in the X direction, and part of which is decomposed into a force acting on the chip pad in the Y direction, so that the friction force generated by the shaped needle during movement is balanced with the scraping force in the X direction.

[0012] Preferably, a positioning pin is provided between the chip guide frame and the irregular pin plate. The positioning pin is installed on the irregular pin plate to fix the relative position of the irregular pin plate and the chip guide frame, thereby ensuring that the position of the chip pad and the tip of the irregular pin are consistent during actual testing; in addition, the positioning pin also serves to position the irregular pin plate and the circuit board, ensuring that the bottom of the irregular pin plate and the pads on the circuit board are consistent in the future.

[0013] Preferably, the cross-section of the circular limiting groove is arc-shaped, and its top has an opening, wherein the arc shape is greater than 1 / 2 arc.

[0014] Preferably, the two ends of the circular limiting groove are provided with first clearance grooves.

[0015] Preferably, the silicone strip groove is provided with second clearance grooves at both ends.

[0016] Preferably, the hardness of the silicone strip is 40-50°, and the hardness of the silicone round rod is 90°. Attached Figure Description

[0017] Figure 1 This is a perspective view of this embodiment;

[0018] Figure 2 This is an exploded view of this embodiment;

[0019] Figure 3 This is a perspective view of the irregular needle in this embodiment;

[0020] Figure 4 This is a perspective view of the irregular needle plate from the first angle in this embodiment;

[0021] Figure 5 This is a perspective view of the irregular needle plate from the second angle in this embodiment;

[0022] Figure 6 This is a top view of the irregular needle plate in this embodiment;

[0023] Figure 7 for Figure 6 Sectional view at point AA;

[0024] Figure 8 This is a cross-sectional view of the mounting holes in this embodiment.

[0025] In the picture:

[0026] 10. Irregularly shaped needle plate; 11. Mounting hole; 12. Needle groove; 12a. Hollowed-out part; 12b. Needle tip groove; 12c. Needle tail groove; 13. Circular limiting groove; 13a. First clearance groove; 14. Silicone circular rod; 15. Silicone strip groove; 15a. Second clearance groove; 16. Silicone strip; 17. Irregularly shaped needle; 17a. Needle tip; 17b. Arc-shaped part; 17c. Needle tail;

[0027] 20. Chip guide frame; 21. Chip positioning hole;

[0028] 30. Chips;

[0029] 40. Bolt; 41. Locating pin. Detailed Implementation

[0030] The preferred embodiments of the present invention will now be described in detail with reference to the accompanying drawings, so that the advantages and features of the present invention can be more easily understood by those skilled in the art, thereby making a clearer and more definite definition of the scope of protection of the present invention.

[0031] See Figures 1 to 8 As shown, this embodiment discloses an improved irregular-shaped test socket, including an irregular-shaped pin plate 10, a chip guide frame 20, and a test circuit board. The chip guide frame 20 is located on the upper surface of the irregular-shaped pin plate 10, and the test circuit board is located on the lower surface of the irregular-shaped pin plate 10. The irregular-shaped pin plate 10 has multiple sets of mounting holes 11. Each set of mounting holes 11 includes multiple parallel pin slots 12 for mounting irregular-shaped pins 17. The middle part of the pin slot 12 is a hollow portion 12a, one end of the pin slot 12 is a pin tip slot 12b, and the other end is a pin tail slot 12c. The pin tip slot 12b is higher than the pin tail slot 12c. A circular limiting groove 13 is provided in the middle of each mounting hole 11, penetrating multiple pin slots 12. The circular limiting groove 13 is located above the hollow portion 12a, and a silicone circular rod 14 is installed inside the circular limiting groove 13. The top of the silicone circular rod 14 protrudes circularly. The circular limiting groove 13 is provided. The arc-shaped part 17b of the irregular needle 17 is installed below the silicone circular rod 14 and protrudes from the bottom surface of the irregular needle plate 10. The needle tip 17a of the irregular needle 17 is located in the needle tip groove 12b and is higher than the top surface of the irregular needle plate 10. The needle tail 17c of the irregular needle 17 is located in the needle tail groove 12c. A silicone strip groove 15 is provided above the circular limiting groove 13 and the needle tail groove 12c. A silicone strip 16 is installed in the silicone strip groove 15. The silicone strip 16 is used to press the silicone circular rod 14 and the needle tip 17a. In this embodiment, the silicone strip 16 is square in shape and the material of the silicone strip 16 is softer than that of the silicone circular rod 14.

[0032] In this embodiment, the hardness of the silicone strip 16 is 40-50°, and the hardness of the silicone round rod 14 is 90°. The material is of the TRK1133-1183 series.

[0033] The chip guide frame 20 has a chip limiting hole 21 in the middle, and a chip 30 is installed in the chip limiting hole 21. The bottom of the chip 30 has a chip pad. The chip guide frame 20 and the irregular needle plate 10 are locked together by bolts 40. The needle tip 17a is located below the chip pad of the chip 30. The test circuit board has a circuit board pad, and the arc-shaped part 17b protruding from the bottom surface of the irregular needle plate 10 abuts against the circuit board pad. In this embodiment, a positioning pin 41 is provided between the chip guide frame 20 and the irregular needle plate 10 for positioning.

[0034] In this embodiment, the cross-section of the circular limiting groove 13 is arc-shaped, and its top has an opening. The arc shape is greater than 1 / 2 arc, which ensures that the silicone circular rod 14 can be fixed.

[0035] To facilitate the installation and removal of the silicone round rod 14, the two ends of the round limiting groove 13 are provided with first clearance grooves 13a. When installing or removing materials, the silicone round rod 14 can be easily installed or removed from the first clearance grooves 13a.

[0036] When installing or removing silicone strip 16, the silicone strip groove 15 has second clearance grooves 15a at both ends, so that silicone strip 16 can be easily installed or removed from the second clearance grooves 15a.

[0037] The above embodiments are only for illustrating the technical concept and features of this utility model. Their purpose is to enable those skilled in the art to understand the content of this utility model and implement it. They cannot be used to limit the protection scope of this utility model. All equivalent changes or modifications made in accordance with the spirit and essence of this utility model should be covered within the protection scope of this utility model.

Claims

1. An improved special-shaped test socket, comprising a special-shaped needle needle plate (10) provided with a plurality of groups of mounting holes (11), each group of the mounting holes (11) comprising a plurality of needle slots (12) arranged side by side in parallel, the needle slots (12) being used to mount special-shaped needles (17), characterized in that: a middle part of the needle slot (12) is a hollow part (12a), one end of the needle slot (12) is a needle tip slot (12b), and the other end is a needle tail slot (12c), the needle tip slot (12b) being higher than the needle tail slot (12c); a middle part of each of the mounting holes (11) is provided with a circular limiting groove (13) penetrating through the plurality of needle slots (12), the circular limiting groove (13) being located above the hollow part (12a), a silica gel circular rod (14) being mounted in the circular limiting groove (13), an arc-shaped part (17b) of the middle part of the special-shaped needle (17) being mounted below the silica gel circular rod (14) and protruding from a bottom surface of the special-shaped needle needle plate (10), a needle tip (17a) of the special-shaped needle (17) being located in the needle tip slot (12b) and being higher than a top surface of the special-shaped needle needle plate (10), and a needle tail (17c) of the special-shaped needle (17) being located in the needle tail slot (12c); a silica gel strip groove (15) is provided above the circular limiting groove (13) and the needle tail slot (12c), a silica gel strip (16) being mounted in the silica gel strip groove (15), the silica gel strip (16) being used to press the silica gel circular rod (14) and the needle tip (17a), and a material of the silica gel strip (16) being softer than a material of the silica gel circular rod (14).

2. The improved special-shaped test socket according to claim 1, characterized in that: further comprising a chip guide frame (20) located on an upper end surface of the special-shaped needle needle plate (10) and a test circuit board located on a lower end surface; a middle part of the chip guide frame (20) is provided with a chip limiting hole (21), a chip (30) being mounted in the chip limiting hole (21), the chip (30) being provided with a chip pad at a bottom part, the chip guide frame (20) and the special-shaped needle needle plate (10) being locked and fixed by a bolt (40) above the special-shaped needle needle plate (10), and the needle tip (17a) being located below the chip pad of the chip (30); the test circuit board is provided with a circuit board pad, and the arc-shaped part (17b) protruding from the bottom surface of the special-shaped needle needle plate (10) abuts against the circuit board pad. a positioning pin (41) is arranged between the chip guide frame (20) and the special-shaped needle needle plate (10). a cross section of the circular limiting groove (13) is in a circular arc shape, an opening being formed at a top part of the circular limiting groove (13), and the circular arc shape is greater than 1 / 2 of a circle. first relief grooves (13a) are arranged at two ends of the circular limiting groove (13). second relief grooves (15a) are arranged at two ends of the silica gel strip groove (15).

3. The improved test socket of claim 2, wherein: a hardness of the silica gel strip (16) is 40-50°, and a hardness of the silica gel circular rod (14) is 90°.

4. The improved test socket of claim 2, wherein: ​ 5. The improved test socket of claim 1, wherein: ​ 6. The improved test socket of claim 1, wherein: ​ 7. The improved test socket of claim 1, wherein: ​

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