New type of chip tester test probe

Abstract

This utility model discloses a novel chip testing probe, comprising two needles (21), a needle tube (22), and a spring (26). The needle tube (22) has connecting tubes (23) at both ends. The inner diameter of the connecting tubes (23) is equal to that of the needle tube (22), and the outer diameter of the connecting tubes (23) is smaller than that of the needle tube (22). The two needles (21) are respectively installed inside the two connecting tubes (23). The spring (26) is installed inside the needle tube (22) and located between the two needles (21). A limiting member (25) is provided at the outer end of each needle (21), and the outer diameter of the limiting member (25) is larger than the inner diameter of the connecting tube (23). Multiple riveting points (24) are provided at the end of the connecting tube (23) near the needle tube (22). This utility model facilitates needle assembly and prevents deformation of the needle tube and needles.

Description

Technical Field

[0001] This utility model relates to the field of test probes, and in particular to a novel test probe for a chip testing machine. Background Technology

[0002] like Figure 1 As shown, the existing test probe includes two probe tips 11 and a probe tube 13. The probe tube 13 has probe connecting tubes 12 integrally formed at both ends with an outer diameter smaller than the probe tube 13. The two probe tips 11 are respectively installed at both ends of the probe tube 13. Through a riveting process, a riveting disc is rotated to form a probe riveting groove 14 around the outer wall of the two probe connecting tubes 12. Through extrusion deformation, the probe tips 11 are prevented from detaching from the probe tube 13. Although this riveting method is the most reliable, it is prone to deformation during the riveting process, which can lead to jamming and poor contact stability. The outer ends of the two probe tips 11 are both straight, and tweezers are needed to hold the outer ends of the probe tips 11 during riveting to prevent them from falling into the probe tube 13, resulting in low assembly efficiency. Utility Model Content

[0003] To overcome the above-mentioned shortcomings, the purpose of this utility model is to provide a new type of chip testing machine test probe that improves the needle assembly efficiency and prevents needle deformation.

[0004] To achieve the above objectives, one of the technical solutions adopted by this utility model is: a novel chip testing machine test probe, comprising two needles, a needle tube, and a spring. The needle tube has connecting tubes at both ends. The inner diameter of the connecting tube is equal to that of the needle tube, and the outer diameter of the connecting tube is smaller than that of the needle tube. The two needles are respectively installed in the two connecting tubes, and the spring is installed in the needle tube and located between the two needles.

[0005] The outer end of the needle is provided with a limiting member, the outer diameter of which is larger than the inner diameter of the connecting tube;

[0006] The connecting tube has multiple rivet points at one end near the needle tube.

[0007] The beneficial effects of the novel chip testing machine test probe of this utility model are:

[0008] Firstly, the outer diameter of the limiting component in this application is larger than the inner diameter of the connecting tube, so that the needle will not fall into the syringe. Compared with the original straight head structure, which requires tweezers to hold the needle during riveting, the limiting component can prevent the needle from falling into the syringe and does not require additional clamping of the needle during riveting. This improves assembly efficiency and solves the problem of the needle falling into the syringe.

[0009] Secondly, the original roller riveting structure has been changed to dot riveting, which makes it less prone to deformation during the riveting process, prevents the probe from getting stuck, and ensures good contact stability.

[0010] Preferably, the limiting member is a limiting protrusion integrally formed on the outer end of the needle tip, and the outer end face of the limiting protrusion is conical to ensure the stability of the test.

[0011] Preferably, the outer wall of the needle installed inside the connecting tube is provided with a groove, and the riveting point corresponds to the groove. The groove allows the needle to slide smoothly inside the connecting tube.

[0012] Preferably, steel balls are installed between each end of the spring and the two needles, and the needle end face in contact with the steel balls is beveled. This ensures that the needle and needle tube generate a large lateral force, ensuring stable contact between the needle and needle tube and guaranteeing reliable contact.

[0013] Preferably, the angle between the inclined plane and the plane containing the diameter of the needle is 25°-30°. Compared to an inclination angle of 12°, this application increases the inclination angle to 25°-30°, thus doubling the lateral force.

[0014] Preferably, the needle tube has a gold-plated layer inside.

[0015] Preferably, the thickness of the gold plating layer is 0.2 μm. Attached Figure Description

[0016] Figure 1 A three-dimensional view of a test probe in the prior art;

[0017] Figure 2 This is a perspective view of this embodiment;

[0018] Figure 3 This is a cross-sectional view of this embodiment;

[0019] Figure 4 for Figure 3 A magnified view of a portion of point A in the middle.

[0020] In the attached image:

[0021] 11. Probe tip; 12. Probe connecting tube; 13. Probe tube; 14. Probe roller groove;

[0022] 21. Needle; 22. Needle tube; 23. Connecting tube; 24. Riveting point; 25. Limiting component; 26. Spring; 27. Steel ball; 28. Groove; 29. ​​Inclined surface. Detailed Implementation

[0023] The preferred embodiments of the present invention will now be described in detail with reference to the accompanying drawings, so that the advantages and features of the present invention can be more easily understood by those skilled in the art, thereby making a clearer and more definite definition of the scope of protection of the present invention.

[0024] See Figures 2 to 4 As shown, this embodiment discloses a novel chip testing machine test probe, including two needles 21, a needle tube 22, and a spring 26. The needle tube 22 has connecting tubes 23 at both ends. The inner diameter of the connecting tube 23 is equal to that of the needle tube 22, and the outer diameter of the connecting tube 23 is smaller than that of the needle tube 22. The two needles 21 are respectively installed in the two connecting tubes 23, and the spring 26 is installed in the needle tube 22 and located between the two needles 21.

[0025] A limiting member 25 is provided at the outer end of the needle 21. The outer diameter of the limiting member 25 is larger than the inner diameter of the connecting tube 23. In this embodiment, the limiting member 25 is a limiting protrusion integrally formed on the outer end of the needle 21, and the outer end face of the limiting protrusion is conical.

[0026] The connecting tube 23 has multiple rivet points 24 near the end of the needle tube 22. The outer wall of the needle 21 installed inside the connecting tube 23 has a ring of grooves 28, and the rivet points 24 correspond to the grooves 28. Figure 4 As shown, the corresponding point here means that the inner wall of the rivet point 24 of the connecting tube 23 is recessed inward to form a protrusion. The protrusion extends into the groove 28, and the needle 21 can move back and forth inside the connecting tube 23. However, due to the protrusion, the needle 21 cannot be moved out of the connecting tube 23.

[0027] Steel balls 27 are installed between each end of the spring 26 and the two needles 21. The end face of the needle 21 that contacts the steel balls 27 is a bevel 29. In this embodiment, the angle between the bevel 29 and the plane containing the diameter of the needle 21 is 25°-30°. In some embodiments, the bevel angle can be selected as 25°, and in some embodiments, the bevel angle can be selected as 30°.

[0028] The needle tube 22 has a gold-plated layer inside, with a thickness of 0.2 μm.

[0029] During assembly, first place one needle 21 inside the needle tube 22, and use a riveting device to rivet the needle 21 and the needle tube 22 together. From the other end of the needle tube 22, insert the steel ball 27, spring 26, steel ball 27, and needle 21 in sequence. Finally, press the other needle 21 and rivet it together with the needle tube 22. The specific working principle is as follows: pressing the upper and lower needles 21 generates an elastic force during the pressing process due to the spring in this new probe. This elastic force is transmitted to the steel ball 27, which contacts the beveled surface of the needle 21. The pressure is decomposed into an axial force and a radial force. The radial force pushes the needle tube 22 and needle 21 into reliable contact.

[0030] The above embodiments are only for illustrating the technical concept and features of this utility model. Their purpose is to enable those skilled in the art to understand the content of this utility model and implement it. They cannot be used to limit the protection scope of this utility model. All equivalent changes or modifications made in accordance with the spirit and essence of this utility model should be covered within the protection scope of this utility model.

Claims

1. A novel chip testing probe, comprising two needles (21), a needle tube (22), and a spring (26), wherein the needle tube (22) has connecting tubes (23) at both ends, the inner diameter of the connecting tubes (23) being equal to that of the needle tube (22), and the outer diameter of the connecting tubes (23) being smaller than that of the needle tube (22), the two needles (21) being respectively installed in the two connecting tubes (23), and the spring (26) being installed in the needle tube (22) and located between the two needles (21); characterized in that: The outer end of the needle (21) is provided with a limiting member (25), and the outer diameter of the limiting member (25) is larger than the inner diameter of the connecting tube (23); The connecting tube (23) has multiple rivet points (24) at one end near the needle tube (22).

2. The novel chip testing machine test probe according to claim 1, characterized in that: The limiting member (25) is a limiting protrusion integrally formed on the outer end of the needle (21), and the outer end face of the limiting protrusion is conical.

3. The novel chip testing machine test probe according to claim 1, characterized in that: A groove (28) is provided on the outer wall of the needle (21) installed in the connecting tube (23), and the rivet point (24) corresponds to the groove (28).

4. The novel chip testing machine test probe according to claim 1, characterized in that: Steel balls (27) are installed between the two ends of the spring (26) and the two needles (21), respectively, and the end face of the needle (21) in contact with the steel balls (27) is a bevel (29).

5. The novel chip testing machine test probe according to claim 4, characterized in that: The angle between the inclined plane (29) and the plane containing the diameter of the needle (21) is 25°-30°.

6. The novel chip testing machine test probe according to claim 1, characterized in that: The needle (22) has a gold-plated layer inside.

7. The novel chip testing machine test probe according to claim 6, characterized in that: The thickness of the gold plating layer is 0.2 μm.

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