A serial scan box test system
The serial scanning box test system utilizes RS485 communication modules and isolation driver modules to achieve multi-channel high-voltage output control, solving the problems of low safety and single channel output in existing high-voltage testers, and realizing efficient and safe high-voltage testing.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- SHENZHEN MERRICK ELECTRONIC TECH CO LTD
- Filing Date
- 2025-05-26
- Publication Date
- 2026-05-26
AI Technical Summary
Most existing high-voltage testers are analog-regulated voltage boosters, which have low safety and single-channel output, making it difficult to achieve multi-channel high-voltage testing and remote control.
The controller module receives signals from the host via the RS485 communication module, controls the isolation drive module and the multi-channel drive switching control module to perform withstand voltage tests, and transmits the results to the host. The system includes a DC-DC power supply module, an RS485 communication module, a setting module, a storage module, an isolation drive module and a switching control module, realizing parallel control of 12 serial scanning boxes, and can output up to 128 channels of high voltage.
It enables multi-channel high-voltage output control, improves test safety and work efficiency, supports remote control and automated data observation, and is suitable for high-voltage insulation withstand voltage testing.
Smart Images
Figure CN224287054U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of serial scanning box testing technology, and in particular to a serial scanning box testing system. Background Technology
[0002] Serial scanning box testing systems are mainly used for withstand voltage testing of household appliances, wires and cables, instruments and meters, ultimate withstand voltage testing of insulating materials, and polarization testing of electroacoustic equipment. Most existing high-voltage testers are mainly based on analog adjustment to ultra-high voltage, and very few are programmable high-voltage testers. Testers need to manually adjust the voltage at close range, resulting in a low safety factor, and the channel output is generally relatively simple. Utility Model Content
[0003] To overcome the shortcomings of the existing technology, this utility model provides a serial scanning box test system, which realizes that the controller module receives the test signal transmitted by the host through the RS485 communication module, controls the isolation drive module and the multi-channel drive switching control module to perform withstand voltage test, and transmits the withstand voltage transmission result to the host.
[0004] To achieve the above-mentioned objectives, this utility model adopts the following technical solution:
[0005] A serial scanning box test system includes a controller module, an RS485 communication module, a setting module, a storage module, an isolation drive module, a switching control module, a DC-DC power supply module, and an AC-DC power supply module. The controller module is connected to the RS485 communication module, the setting module, the storage module, the isolation drive module, and the DC-DC power supply module. The AC-DC power supply module is connected to the DC-DC power supply module, the isolation drive module, and the switching control module. The AC-DC power supply module is used to convert AC voltage to DC voltage 24V. The DC-DC power supply module is connected to the isolation drive module, the RS485 communication module, the setting module, and the storage module. The DC-DC power supply module is used to convert DC voltage 24V to DC voltage 5V and DC voltage 3V. The controller module receives test signals transmitted from the host through the RS485 communication module, controls the isolation drive module and the multi-channel drive switching control module to perform withstand voltage tests, and transmits the withstand voltage transmission results to the host.
[0006] Furthermore, the DC-DC power module includes a first DC-DC step-down module and a second DC-DC step-down module. The first DC-DC step-down module is used to convert a DC voltage of 24V to a DC voltage of 5V, and the second DC-DC step-down module is used to convert a DC voltage of 5V to a DC voltage of 3.3V. The output terminal of the first DC-DC step-down module is connected to the input terminal of the second DC-DC step-down module and the storage module, respectively. The output terminal of the second DC-DC step-down module is connected to the setting module, the RS485 communication module, the isolation drive module, and the controller module, respectively.
[0007] Furthermore, the setting module is used to set a specific address of the scanning box. The address code is a 2-digit 8421 DIP switch, which is connected to an external input signal through the BM1 interface.
[0008] Furthermore, the isolation drive module includes a first isolation submodule, a second isolation submodule, a third isolation submodule, a fourth isolation submodule, a first drive submodule, and a second drive submodule. The controller module is connected to the first isolation submodule, the second isolation submodule, the third isolation submodule, and the fourth isolation submodule, respectively. The first drive submodule is connected to the first isolation submodule, the second isolation submodule, and the switching control module, respectively. The second drive submodule is connected to the third isolation submodule, the fourth isolation submodule, and the switching control module, respectively.
[0009] The beneficial effects of this application are: the controller module receives the test signal transmitted by the host through the RS485 communication module, controls the isolation drive module and the multi-channel drive switching control module to perform the withstand voltage test, and transmits the withstand voltage transmission result to the host.
[0010] This invention implements a serial scanning box testing system comprised of a main control module, a DC-DC power supply module, an RS485 module, an address code setting module, an I2C storage module, an AC-DC power supply module, a drive signal isolation module, and a high-voltage relay switching control module. It can control up to 12 serial scanning boxes in parallel, with each box controlling up to 8 high-voltage outputs, resulting in a maximum control of 128 high-voltage outputs. Remote control via a host computer is also possible, facilitating remote observation of test data during testing. The system boasts a high degree of automation, significantly improving the safety and efficiency of the entire AC / DC insulation withstand voltage testing process. This invention is ingeniously designed, simple in structure, and easy to use, making it suitable for application in high-voltage insulation withstand voltage testing. Attached Figure Description
[0011] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.
[0012] Figure 1 This is a schematic diagram of the controller module circuit of this utility model;
[0013] Figure 2 This is a circuit diagram of a practical RS485 communication module;
[0014] Figure 3 This is a circuit diagram of the first isolation submodule, the second isolation submodule, the third isolation submodule, and the fourth isolation submodule of this utility model;
[0015] Figure 4 This is a circuit diagram of the first and second driver submodules of this utility model;
[0016] Figure 5 This is a schematic diagram of the first practical DC-DC step-down module circuit;
[0017] Figure 6 This is a schematic diagram of the circuit of the second DC-DC step-down module in this utility model;
[0018] Figure 7 This is a circuit diagram of the practical switching control module. Detailed Implementation
[0019] The embodiments of this utility model will now be described in detail with reference to the accompanying drawings.
[0020] The following specific examples illustrate the implementation of this utility model. Those skilled in the art can easily understand other advantages and effects of this utility model from the content disclosed in this specification. Obviously, the described embodiments are only a part of the embodiments of this utility model, not all of them. This utility model can also be implemented or applied through other different specific embodiments, and the details in this specification can also be modified or changed based on different viewpoints and applications without departing from the spirit of this utility model. It should be noted that, in the absence of conflict, the following embodiments and features in the embodiments can be combined with each other. Based on the embodiments of this utility model, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this utility model.
[0021] A serial scanning box test system includes a controller module, an RS485 communication module, a setting module, a storage module, an isolation drive module, a switching control module, a DC-DC power supply module, and an AC-DC power supply module. The controller module is connected to the RS485 communication module, the setting module, the storage module, the isolation drive module, and the DC-DC power supply module. The AC-DC power supply module is connected to the DC-DC power supply module, the isolation drive module, and the switching control module. The AC-DC power supply module is used to convert AC voltage to DC voltage 24V. The DC-DC power supply module is connected to the isolation drive module, the RS485 communication module, the setting module, and the storage module. The DC-DC power supply module is used to convert DC voltage 24V to DC voltage 5V and DC voltage 3V. The controller module receives test signals transmitted from the host through the RS485 communication module, controls the isolation drive module and the multi-channel drive switching control module to perform withstand voltage tests, and transmits the withstand voltage transmission results to the host.
[0022] It should be noted that the controller module uses an APM32E103VET6 chip, which controls and operates the entire system. It sends and receives data via an RS485 module and processes various actions and controls according to the corresponding communication protocol. The storage module stores specific data; the APM32E103VET6 chip in the main control module performs read and write operations on the storage module based on specific read information during operation. The AC-DC power supply module provides power to the isolation drive module and the switching control module.
[0023] The RS485 communication module includes resistors R21, R23, R24, R25, R28, R29, R30, and R31; capacitors C21 and C22; diodes RX1, D3, and D4; diodes TVS1, TVS2, and TVS3; and chips U5 and U6. One end of resistor R21 is connected to the positive terminal of the power supply, and the other end is connected to the positive terminal of diode RX1. The negative terminal of diode RX1 is connected to one end of resistor R25 and the negative terminal of diode D4. Pin 1 of chip U6 is connected to the other end of resistor R25, the positive terminal of diode D4, and one end of capacitor C21. Pin 2 of chip U6 is connected to pin 3 of chip U5. Pin 14 of chip U6 is connected to the positive terminal of the power supply and one end of capacitor C23. The other ends of capacitors C21 and C23, and pin 7 of chip U6 are grounded. Pin 1 of U5 is connected to the negative terminal of diode D3. The positive terminal of diode D3 is connected to one end of resistor R23 and pin 69 of the controller module. Pin 4 of chip U5 is connected to one end of resistor R24. The other end of resistor R24 is connected to pin 68 of the controller module. Pin 8 of chip U5 is connected to the positive terminal of the power supply and one end of capacitor C22. The other end of capacitor C22 and pin 5 of U5 are grounded. Pin 6 of chip U5 is connected to one end of resistor R29 and one end of resistor R31. The other end of resistor R29 is connected to the positive terminal of the power supply. The other end of resistor R31 is connected to one end of diode TVS2 and one end of diode TVS3. Pin 7 of chip U5 is connected to one end of resistor R28 and one end of resistor R30. The other end of resistor R30 is connected to the other end of diode TVS2 and one end of diode TVS1. The other ends of resistor R28 and the other end of diode TVS1 are grounded.
[0024] It should be noted that the RS485 communication module is used to receive and send data. The received data is processed by the APM32E103VET6 chip in the controller module before the corresponding instructions are executed to perform the operation, and data is sent back to the host via RS485.
[0025] The DC-DC power module includes a first DC-DC step-down module and a second DC-DC step-down module. The first DC-DC step-down module converts a 24V DC voltage to a 5V DC voltage, and the second DC-DC step-down module converts a 5V DC voltage to a 3.3V DC voltage. The output terminal of the first DC-DC step-down module is connected to the input terminal of the second DC-DC step-down module and the storage module, respectively. The output terminal of the second DC-DC step-down module is connected to the setting module, the RS485 communication module, the isolation drive module, and the controller module, respectively.
[0026] The first DC-DC step-down module includes resistors R6, RCS1, R9, and R10, capacitors C11, C12, CE1, C13, and C14, inductor L1, and chip U2. Pin 4 of chip U2 is connected to one end of resistor R6, one end of capacitor CE1, one end of capacitor C12, one end of capacitor C11, and the positive terminal of the power supply, respectively. Pin 3 of chip U2 is connected to the other end of capacitor C11, and pin 2 of chip U2 is connected to one end of resistor RCS1. Connect the other end of resistor RCS1 to ground. Connect pin 1 of chip U2 to one end of resistor R9 and one end of resistor R10 respectively. Connect one end of inductor L1 to pin 5 and pin 6 of chip U2 and the cathode of Zener diode D2 respectively. Connect the anode of Zener diode D2 to ground. Connect the other end of inductor L1 to one end of capacitor C13, the other end of resistor R9 and one end of capacitor C14 respectively. Connect the other end of resistor R10, the other end of capacitor C14 and the other end of capacitor C13 to ground.
[0027] The second DC-DC step-down module includes resistors R11, R14, and R20, capacitors C17, C19, and C20, and chip U4. Optionally, chip U4 can be an AMS1117-3.3. The first DC-DC step-down module is connected to one end of resistor R11, one end of resistor R14, one end of capacitor C17, and pin 3 of chip U4. Pin 4 of chip U4 is connected to one end of capacitor C19, one end of capacitor C20, and one end of resistor R20. The other ends of resistors R11, R14, C17, C19, C20, and R20 are all grounded.
[0028] The setting module includes resistors R97, R98, R99, R100, R105, R106, R107, and R108, and chip BM1. Pin 1 of chip BM1 is connected to one end of resistor R97; pin 3 of chip BM1 is connected to one end of resistor R98; pin 5 of chip BM1 is connected to one end of resistor R99; pin 1 of chip BM1 is connected to one end of resistor R100; and pin 2 of chip BM1 is connected to one end of resistor R105. Pin 4 is connected to one end of resistor R106, pin 6 of chip BM1 is connected to one end of resistor R107, pin 8 of chip BM1 is connected to one end of resistor R108, and the other ends of resistors R97, R98, R99, R100, R105, R106, R107, and R108 are connected to the voltage output of the second DC-DC step-down module. Pins 9 and 10 of chip BM1 are grounded.
[0029] It should be noted that the setting module is used to set a specific address for the scan box. The address code is a 2-digit 8421 DIP switch, and the input signal is connected externally through the BM1 interface. The setting range is 01 to 16, and it can support up to 16 serial scan boxes to communicate with the host via RS485.
[0030] The isolation drive module includes a first isolation submodule, a second isolation submodule, a third isolation submodule, a fourth isolation submodule, a first drive submodule, and a second drive submodule. The controller module is connected to the first isolation submodule, the second isolation submodule, the third isolation submodule, and the fourth isolation submodule. The first drive submodule is connected to the first isolation submodule, the second isolation submodule, and the switching control module. The second drive submodule is connected to the third isolation submodule, the fourth isolation submodule, and the switching control module. The controller module receives test signals transmitted from the host via an RS485 communication module, controls the isolation drive module to drive the switching control module to perform withstand voltage tests, and transmits the withstand voltage transmission results to the host.
[0031] It should be noted that the isolation drive module is used to optically isolate the test signal from the APM32E103VET6 chip of the controller module. The optocouplers are U7-U10 PS2805-4. Then the output signal is sent to the drive chips U11 and U12UNL2003ADR, which then drive the high-voltage relays RL1-RL16.
[0032] The first driving submodule includes resistors R64, R65, R66, R67, R68, R69, R70, and R71, transistor Q1, and chip U11. Pin 1 of chip U11 is connected to one end of resistor R64, pin 2 of chip U11 is connected to one end of resistor R65, pin 3 of chip U11 is connected to one end of resistor R66, pin 4 of chip U11 is connected to one end of resistor R67, and pin 5 of chip U11 is connected to... One end of resistor R68 is connected to the ground. Pin 6 of chip U11 is connected to one end of resistor R69. Pin 7 of chip U11 is connected to one end of resistor R70. Pin 8 of chip U11 is grounded. Pin 9 of chip U11 is connected to the positive terminal of the 24V power supply. The other end of resistor R64 is connected to the other end of resistor R48. The other end of resistor R65 is connected to the other end of resistor R49. The other end of resistor R66 is connected to the other end of resistor R50. The other end of resistor R67 is connected to resistor R50. The other end of resistor R1 is connected to the other end of resistor R68, the other end of resistor R52 is connected to the other end of resistor R69, the other end of resistor R53 is connected to the other end of resistor R70, the other end of resistor R54 is connected to the other end of resistor R71, the other end of transistor Q1 is connected to one end of resistor R71, the emitter of transistor Q1 is grounded, the collector of transistor Q1 is connected to pin 8 of the switching control module, and pin 16 of chip U11 is connected to the switching control module. Pin 1 of the switching control module is connected; pin 15 of chip U11 is connected to pin 2 of the switching control module; pin 14 of chip U11 is connected to pin 3 of the switching control module; pin 13 of chip U11 is connected to pin 4 of the switching control module; pin 12 of chip U11 is connected to pin 5 of the switching control module; pin 11 of chip U11 is connected to pin 6 of the switching control module; and pin 10 of chip U11 is connected to pin 7 of the switching control module.
[0033] The second drive submodule includes resistors R72, R73, R74, R75, R76, R77, R78, and R79, transistor Q2, and chip U12. Pin 1 of chip U12 is connected to one end of resistor R72, pin 2 is connected to one end of resistor R73, pin 3 is connected to one end of resistor R74, pin 4 is connected to one end of resistor R75, and pin 5 is connected to... One end of R76 is connected; pin 6 of chip U12 is connected to one end of resistor R77; pin 7 of chip U12 is connected to one end of resistor R78; pin 8 of chip U12 is grounded; pin 9 of chip U12 is connected to the positive terminal of the 24V power supply; the other end of resistor R72 is connected to the other end of resistor R56; the other end of resistor R73 is connected to the other end of resistor R57; the other end of resistor R74 is connected to the other end of resistor R58; and the other end of resistor R75 is connected to the other end of resistor R59. One end of resistor R76 is connected to the other end of resistor R60; the other end of resistor R77 is connected to the other end of resistor R61; the other end of resistor R78 is connected to the other end of resistor R62; the other end of resistor R79 is connected to the other end of resistor R63; the base of transistor Q2 is connected to one end of resistor R79; the emitter of transistor Q2 is grounded; the collector of transistor Q2 is connected to pin 16 of the switching control module; pin 16 of chip U12 is connected to the switching control module. Pin 9 of the chip is connected, pin 15 of chip U12 is connected to pin 10 of the switching control module, pin 14 of chip U12 is connected to pin 11 of the switching control module, pin 13 of chip U12 is connected to pin 12 of the switching control module, pin 12 of chip U12 is connected to pin 13 of the switching control module, pin 11 of chip U12 is connected to pin 14 of the switching control module, and pin 10 of chip U12 is connected to pin 15 of the switching control module.
[0034] The first isolation submodule includes resistors R32, R33, R34, R35, R48, R49, R50, R51, chip U7, and chip 11. Pins 1, 3, 5, and 7 of chip U7 are connected to the positive terminal of a 3.3V power supply; pins 10, 12, 14, and 16 of chip U7 are connected to the positive terminal of a 24V power supply; pin 2 of chip U7 is connected to one end of resistor R32; the other end of resistor R32 is connected to pin 15 of the controller module; and pin 4 of chip U7 is connected to one end of resistor R33. The other end is connected to pin 16 of the controller module. Pin 6 of chip U7 is connected to one end of resistor R34. The other end of resistor R34 is connected to pin 15 of the controller module. Pin 8 of chip U7 is connected to one end of resistor R35. The other end of resistor R35 is connected to pin 16 of the controller module. Pin 9 of chip U7 is connected to one end of resistor R51. Pin 11 of chip U7 is connected to one end of resistor R50. Pin 13 of chip U7 is connected to one end of resistor R49. Pin 15 of chip U7 is connected to one end of resistor R48.
[0035] The second isolation submodule includes resistors R36, R37, R38, R39, R52, R53, R54, R55, and chip U8. Pins 1, 3, 5, and 7 of chip U8 are connected to the positive terminal of the 3.3V power supply; pins 10, 12, 14, and 16 of chip U8 are connected to the positive terminal of the 24V power supply; pin 2 of chip U8 is connected to one end of resistor R36; the other end of resistor R36 is connected to pin 23 of the controller module; pin 4 of chip U8 is connected to one end of resistor R37; and the other end of resistor R37... Pin 24 of the controller module is connected to pin 6 of chip U8. One end of resistor R38 is connected to pin 29 of the controller module. Pin 8 of chip U8 is connected to one end of resistor R39. The other end of resistor R39 is connected to pin 30 of the controller module. Pin 9 of chip U8 is connected to one end of resistor R55. Pin 11 of chip U8 is connected to one end of resistor R54. Pin 13 of chip U8 is connected to one end of resistor R53. Pin 15 of chip U8 is connected to one end of resistor R52.
[0036] The third isolation submodule includes resistors R40, R41, R42, R43, R56, R57, R58, R59, and chip U9. Pins 1, 3, 5, and 7 of chip U9 are connected to the positive terminal of the 3.3V power supply; pins 10, 12, 14, and 16 of chip U9 are connected to the positive terminal of the 24V power supply; pin 2 of chip U9 is connected to one end of resistor R40; the other end of resistor R40 is connected to pin 31 of the controller module; pin 4 of chip U9 is connected to one end of resistor R41; and the other end of resistor R41... Pin 32 of the controller module is connected to pin 6 of chip U9. Pin 6 of chip U9 is connected to one end of resistor R42. The other end of resistor R42 is connected to pin 33 of the controller module. Pin 8 of chip U9 is connected to one end of resistor R43. The other end of resistor R43 is connected to pin 34 of the controller module. Pin 9 of chip U9 is connected to one end of resistor R59. Pin 11 of chip U9 is connected to one end of resistor R58. Pin 13 of chip U9 is connected to one end of resistor R57. Pin 15 of chip U9 is connected to one end of resistor R56.
[0037] The fourth isolation submodule includes resistors R44, R45, R46, R47, R60, R61, R62, and R63, and chip U10. Pins 1, 3, 5, and 7 of chip U10 are connected to the positive terminal of the 3.3V power supply; pins 10, 12, 14, and 16 of chip U10 are connected to the positive terminal of the 24V power supply; pin 2 of chip U10 is connected to one end of resistor R44; the other end of resistor R44 is connected to pin 35 of the controller module; pin 4 of chip U10 is connected to one end of resistor R45; and the other end of resistor R45... Pin 36 of chip U10 is connected to the controller module. Pin 6 of chip U10 is connected to one end of resistor R46. The other end of resistor R46 is connected to pin 38 of the controller module. Pin 8 of chip U10 is connected to one end of resistor R47. The other end of resistor R47 is connected to pin 39 of the controller module. Pin 9 of chip U10 is connected to one end of resistor R63. Pin 11 of chip U10 is connected to one end of resistor R62. Pin 13 of chip U10 is connected to one end of resistor R61. Pin 15 of chip U10 is connected to one end of resistor R60.
[0038] Those skilled in the art will clearly understand that, for the sake of convenience and brevity, the specific working process of the system and unit described above can be referred to the corresponding process in the foregoing method embodiments, and will not be repeated here.
Claims
1. A serial scanning box testing system, characterized in that, The system includes a controller module, an RS485 communication module, a setting module, a storage module, an isolation drive module, a switching control module, a DC-DC power supply module, and an AC-DC power supply module. The controller module is connected to the RS485 communication module, the setting module, the storage module, the isolation drive module, and the DC-DC power supply module. The AC-DC power supply module is connected to the DC-DC power supply module, the isolation drive module, and the switching control module. The DC-DC power supply module is connected to the isolation drive module, the RS485 communication module, the setting module, and the storage module. The controller module receives test signals transmitted from the host through the RS485 communication module, controls the multi-channel drive switching control module of the isolation drive module to perform withstand voltage tests, and transmits the withstand voltage transmission results to the host.
2. The serial scanning box testing system according to claim 1, characterized in that, The AC-DC power module is used to convert AC voltage to DC voltage of 24V.
3. The serial scanning box testing system according to claim 1, characterized in that, The DC-DC power module is used to convert a DC voltage of 24V to a DC voltage of 5V and a DC voltage of 3V.
4. The serial scanning box testing system according to claim 3, characterized in that, The DC-DC power module includes a first DC-DC step-down module and a second DC-DC step-down module. The first DC-DC step-down module is used to convert a DC voltage of 24V to a DC voltage of 5V, and the second DC-DC step-down module is used to convert a DC voltage of 5V to a DC voltage of 3.3V. The output terminal of the first DC-DC step-down module is connected to the input terminal of the second DC-DC step-down module and the storage module, respectively. The output terminal of the second DC-DC step-down module is connected to the setting module, the RS485 communication module, the isolation drive module, and the controller module, respectively.
5. The serial scanning box testing system according to claim 4, characterized in that, The first DC-DC step-down module includes resistors R6, RCS1, R9, and R10, capacitors C11, C12, CE1, C13, and C14, an inductor L1, and a chip U2. Pin 4 of chip U2 is connected to one end of resistor R6, one end of capacitor CE1, one end of capacitor C12, one end of capacitor C11, and the positive terminal of the power supply, respectively. Pin 3 of chip U2 is connected to the other end of capacitor C11, and pin 2 of chip U2 is connected to one end of resistor RCS1. The connection is as follows: the other end of resistor RCS1 is grounded; pin 1 of chip U2 is connected to one end of resistor R9 and one end of resistor R10 respectively; one end of inductor L1 is connected to pin 5 and pin 6 of chip U2 and the cathode of Zener diode D2 respectively; the anode of Zener diode D2 is grounded; the other end of inductor L1 is connected to one end of capacitor C13, the other end of resistor R9 and one end of capacitor C14 respectively; and the other end of resistor R10, the other end of capacitor C14 and the other end of capacitor C13 are grounded.
6. The serial scanning box testing system according to claim 1, characterized in that, The setting module is used to set a specific address of the scanning box. The address code is a 2-digit 8421 DIP switch, and the input signal is connected to the external interface via BM1.
7. The serial scanning box testing system according to claim 1, characterized in that, The isolation drive module includes a first isolation submodule, a second isolation submodule, a third isolation submodule, a fourth isolation submodule, a first drive submodule, and a second drive submodule. The controller module is connected to the first isolation submodule, the second isolation submodule, the third isolation submodule, and the fourth isolation submodule. The first drive submodule is connected to the first isolation submodule, the second isolation submodule, and the switching control module. The second drive submodule is connected to the third isolation submodule, the fourth isolation submodule, and the switching control module.
8. The serial scanning box testing system according to claim 7, characterized in that, The first driving submodule includes resistors R64, R65, R66, R67, R68, R69, R70, and R71, transistor Q1, and chip U11. Pin 1 of chip U11 is connected to one end of resistor R64, pin 2 of chip U11 is connected to one end of resistor R65, pin 3 of chip U11 is connected to one end of resistor R66, pin 4 of chip U11 is connected to one end of resistor R67, and pin 5 of chip U11... One end of resistor R68 is connected to the resistor; pin 6 of chip U11 is connected to one end of resistor R69; pin 7 of chip U11 is connected to one end of resistor R70; pin 8 of chip U11 is grounded; pin 9 of chip U11 is connected to the positive terminal of the 24V power supply; the other end of resistor R64 is connected to the other end of resistor R48; the other end of resistor R65 is connected to the other end of resistor R49; the other end of resistor R66 is connected to the other end of resistor R50; and the other end of resistor R67 is connected to the resistor R... The other end of resistor R51 is connected to the other end of resistor R68, the other end of resistor R52 is connected to the other end of resistor R69, the other end of resistor R53 is connected to the other end of resistor R70, the other end of resistor R54 is connected to the other end of resistor R71, the other end of transistor Q1 is connected to one end of resistor R71, the emitter of transistor Q1 is grounded, the collector of transistor Q1 is connected to pin 8 of the switching control module, and pin 16 of chip U11 is connected to... Pin 1 of the switching control module is connected; pin 15 of chip U11 is connected to pin 2 of the switching control module; pin 14 of chip U11 is connected to pin 3 of the switching control module; pin 13 of chip U11 is connected to pin 4 of the switching control module; pin 12 of chip U11 is connected to pin 5 of the switching control module; pin 11 of chip U11 is connected to pin 6 of the switching control module; and pin 10 of chip U11 is connected to pin 7 of the switching control module.
9. The serial scanning box testing system according to claim 7, characterized in that, The first isolation submodule includes resistors R32, R33, R34, R35, R48, R49, R50, R51, chip U7, and chip 11. Pins 1, 3, 5, and 7 of chip U7 are connected to the positive terminal of a 3.3V power supply; pins 10, 12, 14, and 16 of chip U7 are connected to the positive terminal of a 24V power supply; pin 2 of chip U7 is connected to one end of resistor R32; the other end of resistor R32 is connected to pin 15 of the controller module; pin 4 of chip U7 is connected to one end of resistor R33; and resistor R3... The other end of chip 3 is connected to pin 16 of the controller module. Pin 6 of chip U7 is connected to one end of resistor R34. The other end of resistor R34 is connected to pin 15 of the controller module. Pin 8 of chip U7 is connected to one end of resistor R35. The other end of resistor R35 is connected to pin 16 of the controller module. Pin 9 of chip U7 is connected to one end of resistor R51. Pin 11 of chip U7 is connected to one end of resistor R50. Pin 13 of chip U7 is connected to one end of resistor R49. Pin 15 of chip U7 is connected to one end of resistor R48.
10. The serial scanning box testing system according to claim 1, characterized in that, The RS485 communication module includes resistors R21, R23, R24, R25, R28, R29, R30, and R31; capacitors C21 and C22; diodes RX1, D3, and D4; diodes TVS1, TVS2, and TVS3; chip U5; and chip U6. One end of resistor R21 is connected to the positive terminal of the power supply, and the other end is connected to the positive terminal of diode RX1. The negative terminal of diode RX1 is connected to one end of resistor R25 and the negative terminal of diode D4. Pin 1 of chip U6 is connected to the other end of resistor R25, the positive terminal of diode D4, and one end of capacitor C21. Pin 2 of chip U6 is connected to pin 3 of chip U5. Pin 14 of chip U6 is connected to the positive terminal of the power supply and one end of capacitor C23. The other ends of capacitors C21 and C23, and pin 7 of chip U6 are grounded. Pin 1 of chip U5 is connected to the negative terminal of diode D3. The positive terminal of diode D3 is connected to one end of resistor R23 and pin 69 of the controller module. Pin 4 of chip U5 is connected to one end of resistor R24. The other end of resistor R24 is connected to pin 68 of the controller module. Pin 8 of chip U5 is connected to the positive terminal of the power supply and one end of capacitor C22. The other end of capacitor C22 and pin 5 of U5 are grounded. Pin 6 of chip U5 is connected to one end of resistor R29 and one end of resistor R31. The other end of resistor R29 is connected to the positive terminal of the power supply. The other end of resistor R31 is connected to one end of diode TVS2 and one end of diode TVS3. Pin 7 of chip U5 is connected to one end of resistor R28 and one end of resistor R30. The other end of resistor R30 is connected to the other end of diode TVS2 and one end of diode TVS1. The other end of resistor R28 and the other end of diode TVS1 are grounded.