A lower detection row, a lower detection row assembly and a battery piece detection equipment
By designing the lower detection row to avoid gaps and cooperating with the drive components, the problem of interference between the lower detection row and the support bracket was solved, achieving efficient and stable cell detection.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- TONGWEI SOLAR (PENGSHAN) CO LTD
- Filing Date
- 2025-04-29
- Publication Date
- 2026-06-05
Smart Images
Figure CN224328212U_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of solar cell technology, and in particular to a lower detection row, a lower detection row assembly, and a cell testing device. Background Technology
[0002] Solar cells (also known as photovoltaic cells) are semiconductor devices that directly convert solar energy into electrical energy and are an important component of renewable energy technologies. The core principle of solar cells is the photovoltaic effect: when photons strike a semiconductor material, electron-hole pairs are excited, generating an electric current. The field of solar cell technology encompasses multiple aspects, including materials science, device physics, manufacturing processes, and system integration.
[0003] In the research, development, production, and application of solar cells, performance testing is essential, and IV testing (current-voltage characteristic testing) is a crucial method. IV testing allows the acquisition of key performance parameters such as open-circuit voltage and short-circuit current. During IV testing, the upper and lower test rows are simultaneously pressed against the upper and lower surfaces of the solar cell, and electricity is applied to the cell to obtain the current and voltage relationship of the solar cell under different light and temperature conditions.
[0004] During IV testing, the solar cells are placed on a support bracket, which is located between the lower and upper detection rows. When the lower and upper detection rows press the solar cells together using a needle-closing action, the lower detection row may interfere with or collide with the support bracket. Utility Model Content
[0005] This application discloses a lower detection row, a lower detection row assembly, and a battery cell testing device. The lower detection row has an avoidance notch to avoid the support bracket, so that when the lower detection row performs the needle closing action, the lower detection row is less likely to interfere with the support bracket.
[0006] To achieve the above objectives, in a first aspect, embodiments of this application disclose a lower detection row for detecting battery cells disposed on a support bracket, wherein the surface of the battery cell is provided with multiple main grids, and the lower detection row includes:
[0007] First main body section;
[0008] The first abutting part is disposed on the first side of the first main body part, and the first abutting part is used to press one of the multiple main gates along the length direction of the main gate;
[0009] Along the first horizontal direction, the length of the first abutment portion is less than the length of the main grid, so that the portion of the first side without the first abutment portion forms an avoidance gap, which is used to avoid the support bracket.
[0010] As an optional implementation, the first abutting portion is disposed in the middle region of the first side along the first horizontal direction, so that the avoidance gap is formed on both sides of the first abutting portion along the first horizontal direction.
[0011] As an optional implementation, the first main body and the first abutting part are integrally formed plate-like structures.
[0012] As an optional implementation, along the first horizontal direction, the first main body includes a first end and a second end, and the first abutting part includes a third end and a fourth end. The third end is disposed close to the first end, and the fourth end is disposed close to the second end. The distance from the third end to the first end is equal to the distance from the fourth end to the second end.
[0013] As an optional implementation, the length of the first abutment portion along the first horizontal direction is 80mm to 100mm.
[0014] Secondly, this application discloses a lower detection row assembly, the lower detection row assembly comprising:
[0015] Mounting rack;
[0016] Multiple lower detection rows are arranged parallel to each other and spaced apart along a second horizontal direction on the mounting frame. The second horizontal direction is perpendicular to the first horizontal direction. At least one of the multiple lower detection rows is a first lower detection row, which is a lower detection row as described in any of the first aspects. The main body of the first lower detection row is connected to the mounting frame.
[0017] As an optional implementation, the plurality of lower detection rows further includes a plurality of second lower detection rows. The second lower detection row includes a second main body portion and a second abutment portion connected to each other. The second main body portion is connected to the mounting bracket. The second abutment portion is used to press one of the main gates along the length direction of the main gate. The length of the second abutment portion is adapted to the length of the main gate.
[0018] Along the second horizontal direction, the first lower detection row is located between two adjacent second lower detection rows, and the distance between two second lower detection rows adjacent to the first lower detection row is 18mm to 19mm.
[0019] Thirdly, this application discloses a solar cell testing device, the solar cell testing device comprising:
[0020] As described in any of the second aspects, the lower detection row assembly is located at the detection station;
[0021] A support bracket is used to support and fix the battery cells. When the support bracket is located at the testing station, it is located above the lower testing row assembly.
[0022] A correction drive assembly is connected to a plurality of lower detection rows. The correction drive assembly can control the plurality of lower detection rows to move or rotate in the horizontal direction so that each lower detection row corresponds to each main grid in the vertical direction.
[0023] A pressing drive assembly is connected to a plurality of lower detection rows. The pressing drive assembly can drive the plurality of lower detection rows, after being adjusted in position, to move upward in a vertical direction to press the back of the battery cell, so that each lower detection row contacts each main grid. In addition, along the first horizontal direction, the support bracket can be located in the avoidance notch of the first lower detection row corresponding to the support bracket.
[0024] As an optional implementation, there are two support brackets, and the first abutment portion has the avoidance notch formed on both sides along the first horizontal direction. The two support brackets are spaced apart along the first horizontal direction so that when the pressing drive assembly drives the multiple lower detection rows to press the battery cells, the two support brackets can be located at the two avoidance notches respectively.
[0025] As an optional implementation, the cell testing equipment further includes:
[0026] The imaging device is located at the imaging station and is used to image the battery cell to obtain the coordinates of the battery cell. The imaging device is electrically connected to the correction drive assembly so that the correction drive assembly controls the lower detection row assembly to move or rotate in the horizontal direction according to the coordinate information obtained by the imaging device.
[0027] A rotary drive assembly is provided, which can drive the support bracket to rotate along a first rotation direction. The shooting station and the detection station are arranged sequentially along the first rotation direction so that the support bracket can move between the shooting station and the detection station.
[0028] Compared with the prior art, the beneficial effects of this application are:
[0029] The lower detection row provided in this application embodiment is used to detect battery cells disposed on a support bracket. The surface of the battery cell is provided with multiple main grids. The lower detection row includes a first main body and a first abutting part. The first abutting part is disposed on a first side of the first main body and is used to press one of the multiple main grids along the length direction of the main grids. Along the first horizontal direction, the length of the first abutting part is less than the length of the main grid, so that the part of the first side where the first abutting part is not disposed forms an avoidance gap. The avoidance gap is used to avoid the support bracket, so that when the lower detection row performs the needle closing action, the lower detection row is less likely to interfere with the support bracket, and the space between the lower detection rows can accommodate the support bracket is larger. Attached Figure Description
[0030] To more clearly illustrate the technical solutions in the embodiments of this application, the drawings used in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.
[0031] Figure 1 This is a schematic diagram of the lower detection row (first lower detection row) disclosed in the embodiments of this application from a first perspective;
[0032] Figure 2 This is a schematic diagram of the lower detection row (first lower detection row) disclosed in the embodiments of this application from a second perspective;
[0033] Figure 3 This is a schematic diagram of the lower detection row assembly disclosed in an embodiment of this application (mounting bracket omitted);
[0034] Figure 4 This is a schematic diagram of the lower detection row (excluding the main body) and the supporting bracket disclosed in the embodiments of this application;
[0035] Figure 5 This is a simplified structural diagram of the battery cell testing equipment disclosed in the embodiments of this application.
[0036] Explanation of reference numerals in the attached figures:
[0037] 100-First lower inspection row; a-Inspection station; b-Photography station; 1-First main body; 11-First side; 1a-First end; 1b-Second end; 2-First contact part; 2a-Third end; 2b-Fourth end; 3-Avoidance notch; 200-Lower inspection row assembly; 4-Second lower inspection row; 41-Second main body; 42-Second contact part; 300-Battery cell inspection equipment; 5-Support bracket; 6-Photography device; 7-Rotation drive assembly; X-First horizontal direction; Y-Second horizontal direction. Detailed Implementation
[0038] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.
[0039] In this application, the terms "upper," "lower," "inner," "vertical," and "horizontal," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. These terms are primarily for the purpose of better describing this application and its embodiments, and are not intended to limit the indicated device, element, or component to having a specific orientation, or to be constructed and operated in a specific orientation.
[0040] Furthermore, in addition to indicating location or positional relationship, some of the aforementioned terms may also have other meanings. For example, the term "above" may also be used in some cases to indicate a certain dependency or connection relationship. Those skilled in the art can understand the specific meaning of these terms in this application based on the specific circumstances.
[0041] Furthermore, the terms "installation," "setup," "equipped with," "connection," and "linked" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral structure; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium, or an internal connection between two devices, components, or parts. Those skilled in the art can understand the specific meaning of these terms in this application based on the specific circumstances.
[0042] Furthermore, the terms "first," "second," etc., are primarily used to distinguish different devices, elements, or components (which may be the same or different in specific type and construction), and are not intended to indicate or imply the relative importance or quantity of the indicated devices, elements, or components. Unless otherwise stated, "a plurality of" means two or more.
[0043] Solar cells (also known as photovoltaic cells) are semiconductor devices that directly convert solar energy into electrical energy and are an important component of renewable energy technologies. The core principle of solar cells is the photovoltaic effect: when photons strike a semiconductor material, electron-hole pairs are excited, generating an electric current. The field of solar cell technology encompasses multiple aspects, including materials science, device physics, manufacturing processes, and system integration.
[0044] In the research, development, production, and application of solar cells, performance testing is essential, and IV testing (current-voltage characteristic testing) is a crucial method. IV testing allows the acquisition of key performance parameters such as open-circuit voltage and short-circuit current. During IV testing, the upper and lower test rows are simultaneously pressed against the upper and lower surfaces of the solar cell, and electricity is applied to the cell to obtain the current and voltage relationship of the solar cell under different light and temperature conditions.
[0045] During IV testing, the solar cells are placed on a support bracket, which is located between the lower and upper detection rows. When the lower and upper detection rows press the solar cells together using a needle-closing action, the lower detection row may interfere with or collide with the support bracket.
[0046] Specifically, before IV testing, the support bracket containing the battery cells needs to acquire the cell coordinates at the shooting station. These coordinates are converted into motion values for three motors (X, Y1, and Y2) within the program. The X motor moves the upper and lower detection arrays along their extension direction, while the Y1 and Y2 motors rotate the ends of the upper and lower detection arrays along their arrangement direction to adjust their positions, thus achieving a correction effect and fixing each battery cell relatively in place on the silver array, achieving standardized testing. The indexing plate transfers the battery cells from the shooting station to the testing station, which consists of an upper and lower needle shaft. After the battery cells arrive at the testing station, the upper and lower needles engage, then a xenon lamp simulates sunlight, and data is collected through the gold wire and silver array. The four nozzle supports on the indexing plate need to interfere with the lower detection row. To prevent the nozzle supports from colliding with the lower detection row during the needle closing action, the program is set with soft limit to prevent fooling. The soft limit restricts the movement value of the Y1 / Y2 motor. For example, the original gap of the lower detection row is 7.6mm and the nozzle support itself is 4mm wide. This makes the movement range of the Y1 / Y2 motor only ±1.8mm. If the range is exceeded, the tester will not perform the needle closing action, which is called missed test. After the production line speeds up, the fluctuation of the battery cell position at the photo taking station becomes larger, and the machine frequently misses tests, generating a large amount of invalid production capacity every day.
[0047] Based on this, the present application discloses a lower detection row that can avoid the support bracket, so that when the lower detection row performs the needle closing action, the lower detection row is less likely to interfere with the support bracket, and the space between the lower detection rows can accommodate the support bracket is larger.
[0048] The technical solution of this application will be further described below with reference to the embodiments and accompanying drawings.
[0049] Please see Figure 1 and Figure 2 , Figure 1 This is a schematic diagram of the lower detection row (first lower detection row 100) disclosed in an embodiment of this application from a first-view perspective. Figure 2This is a schematic diagram of the lower detection row (first lower detection row 100) disclosed in the embodiments of this application from a second perspective.
[0050] Firstly, combining Figure 1 and Figure 2 , Figure 1 This is a schematic diagram of the lower detection row (first lower detection row 100) disclosed in an embodiment of this application from a first-view perspective. Figure 2 This is a schematic diagram of the lower detection row (first lower detection row 100) disclosed in this application embodiment from a second perspective. This application embodiment discloses a lower detection row (first lower detection row 100) for detecting battery cells disposed on a support bracket 5. The surface of the battery cell is provided with multiple main grids. The lower detection row includes:
[0051] First main body section 1;
[0052] The first abutting part 2 is provided on the first side 11 of the first main body part 1. The first abutting part 2 is used to press one of the multiple main grids along the length direction of the main grid.
[0053] Along the first horizontal direction X, the length of the first abutment 2 is less than the length of the main grid, so that the part of the first side 11 where the first abutment 2 is not provided forms an avoidance gap 3, which is used to avoid the bearing bracket 5.
[0054] To facilitate explanation and distinction between the lower detection row with clearance gap 3 and the unmodified lower detection row, the lower detection row with clearance gap 3 in the first aspect is named the first lower detection row 100.
[0055] When the lower detection row performs the closing action (i.e., the lower detection row moves upward to contact the main grid of the solar cell), the presence of the clearance notch 3 prevents the lower detection row from interfering with the support bracket 5. If the lower detection row did not have such a clearance structure, it might collide with or obstruct the support bracket 5 during the closing action, preventing the closing action from proceeding smoothly and potentially damaging the lower detection row or the support bracket 5, thus affecting the normal operation of the solar cell testing equipment 300. The clearance notch 3 provides a specific spatial position for the support bracket 5, allowing the lower detection row to avoid it during movement, ensuring the smooth execution of the closing action.
[0056] In the first horizontal direction X, the design of the clearance notch 3 in the first lower detection row 100 allows for more space for the support bracket 5, enabling the support bracket 5 to be placed more stably in its corresponding position. Furthermore, during equipment operation, the support bracket 5 will not conflict with the lower detection row due to insufficient space. This not only improves the rationality and stability of the equipment structure but also provides a more reliable guarantee for the support and detection of solar cells, helping to improve the accuracy and efficiency of solar cell detection and reduce detection errors or equipment failures caused by interference between equipment components.
[0057] As an optional implementation method, combined with Figure 1 and Figure 2 Along the first horizontal direction X, the first abutting part 2 is disposed in the middle region of the first side 11 so that the first abutting part 2 forms a clearance notch 3 on both sides along the first horizontal direction X.
[0058] When the support bracket 5 has protruding fixing structures or supporting components on both sides of the solar cell, the clearance notches 3 on both sides can provide clearance space for these components respectively. The first abutment part 2 is located in the middle region, which allows the lower detection row to apply pressure to the main grid of the solar cell relatively evenly when pressing it. Because the structures on both sides of the first abutment part 2 are relatively symmetrical, the pressure distribution from the lower detection row on the main grid is more even during the pressing process. It will not cause uneven stress on the main grid of the solar cell due to excessive or insufficient pressure on one side, thereby reducing the risk of deformation and damage to the solar cell due to uneven stress, ensuring the stability and reliability of the solar cell testing process, and helping to improve the accuracy of the test results.
[0059] Furthermore, since the clearance gaps 3 on both sides are identical, there is no need to distinguish the direction when installing the lower detection bar, reducing installation difficulty and improving installation efficiency. During equipment maintenance, the symmetrical structure on both sides also facilitates operators in inspecting, repairing, and replacing the lower detection bar, reducing operational errors and maintenance costs that may be caused by complex or asymmetrical structures.
[0060] Optionally, combined Figure 1 and Figure 2 The first main body 1 and the first abutting part 2 are integrally formed plate-shaped structures.
[0061] The one-piece molding structure eliminates the connection gap between the first main body 1 and the first abutment part 2, resulting in higher overall strength compared to structures connected by splicing or welding. During the pressing and testing of the battery cell main grid, it can better withstand pressure and external forces, reducing the likelihood of breakage or deformation, thus ensuring the structural integrity and reliability of the lower inspection row during long-term use.
[0062] In some possible implementations, combined Figure 1 and Figure 2 Along the first horizontal direction X, the first main body 1 includes a first end 1a and a second end 1b, and the first abutting part 2 includes a third end 2a and a fourth end 2b. The third end 2a is disposed close to the first end 1a, and the fourth end 2b is disposed close to the second end 1b. The distance from the third end 2a to the first end 1a is equal to the distance from the fourth end 2b to the second end 1b.
[0063] This position of the first contact part 2 on the first side 11 is in the center, making the entire first lower detection row 100 a symmetrical structure. When pressing the main grid of the battery cell, this ensures that the pressure applied by the first contact part 2 to the main grid is more uniform, avoiding deformation or even damage to the main grid due to uneven pressure. It also allows the lower detection row to maintain a better balance when cooperating with the support bracket 5 and during the detection of the battery cell.
[0064] The third end 2a and the fourth end 2b of the first abutment part 2 are close to the first end 1a and the second end 1b of the first main body part 1, respectively, and are equidistant. This design ensures that the first abutment part 2 effectively presses against the main grid while making full use of the space in the first main body part 1. The equidistant design on both sides provides a reasonable spatial layout to avoid the bearing supports 5 located on both sides, allowing the bearing supports 5 to cooperate more smoothly with the lower detection row, further reducing the possibility of interference, and making the space between the lower detection row and the bearing supports 5 more efficiently utilized.
[0065] In some embodiments, the length of the first abutting portion 2 along the first horizontal direction X is 80mm to 100mm.
[0066] When the length of the first contact portion 2 is less than 80mm, the contact area with the main grid is relatively small. During the cell testing process, the current on the main grid needs to be collected and conducted through the first contact portion 2 for relevant tests. A small contact area means that the current that can be collected is limited, which cannot fully and accurately reflect the actual current situation on the main grid. This leads to deviations in the test results, making the test results unable to truly reflect the electrical performance of the cell's main grid and affecting the judgment of the cell's quality and performance.
[0067] When the length of the first abutment portion 2 is greater than 100mm, the space occupied by the first abutment portion 2 along the first horizontal direction X is too large, which will compress the space of the clearance notch 3. Since the support bracket 5 needs to avoid interference with the lower detection row by passing through the clearance notch 3, the excessive length of the first abutment portion 2 will make it easy for the support bracket 5 to collide or rub against the first abutment portion 2 when the detection row presses the battery cells, which may cause the support bracket 5 to fail to enter the predetermined position smoothly, making the entire detection process unable to proceed normally.
[0068] When the length of the first contact part 2 is between 80mm and 100mm, it can ensure effective pressing of the main grid while leaving sufficient space to avoid the bearing support 5. The size of the avoidance notch 3 is moderate, allowing the bearing support 5 to pass through the avoidance notch 3 easily without interference with the lower detection row, ensuring the stability and accuracy of the bearing support 5 during the detection process, and helping to improve the operating efficiency and reliability of the entire detection equipment.
[0069] Secondly, combining Figure 3 , Figure 3 This is a schematic diagram of the lower detection row assembly 200 disclosed in an embodiment of this application (mounting bracket omitted). This application discloses a lower detection row assembly 200, which includes:
[0070] Mounting rack;
[0071] Multiple lower detection rows are arranged parallel to each other and spaced apart along a second horizontal direction Y on the mounting frame. The second horizontal direction Y is perpendicular to the first horizontal direction X. At least one lower detection row 100 is included among the multiple lower detection rows. The first lower detection row 100 is a lower detection row as described in any of the first aspects. The main body of the first lower detection row 100 is connected to the mounting frame.
[0072] The first lower inspection row 100 effectively avoids the support bracket 5 through the avoidance notch 3. When it is used as part of the lower inspection row assembly 200, the entire lower inspection row assembly 200 can avoid the support bracket 5, reserving more space for the support bracket 5. This allows the support bracket 5 to be placed more stably in its position, and during equipment operation, the support bracket 5 will not conflict with the lower inspection row due to insufficient space. This improves the rationality and stability of the entire lower inspection row assembly 200 structure, providing a more reliable guarantee for the support and inspection of solar cells, helping to improve the accuracy and efficiency of solar cell inspection, and reducing inspection errors or equipment failures caused by interference between equipment components.
[0073] Some possible implementation methods, combined with Figure 3 and Figure 4 , Figure 4 This is a schematic diagram of the structure of the lower detection row (excluding the main body) and the support bracket 5 disclosed in the embodiments of this application. The multiple lower detection rows also include multiple second lower detection rows 4. The second lower detection row 4 includes a second main body 41 and a second abutting part 42 connected to each other. The second main body 41 is connected to the mounting bracket. The second abutting part 42 is used to press one of the main grids along the length direction of the main grid. The length of the second abutting part 42 is adapted to the length of the main grid.
[0074] Among them, the lower detection row assembly 200 has one, two or more first lower detection rows 100 of the first aspect. When there is one first lower detection row 100 in the lower detection row assembly 200, the first lower detection row 100 is located between two second lower detection rows 4, and the support bracket 5 can be located between the second abutment portions 42 of the two second lower detection rows 4. When there are multiple first lower detection rows 100 in the lower detection row assembly 200, the multiple first lower detection rows 100 are spaced apart and respectively located between two second lower detection rows 4, or the multiple first lower detection rows 100 are arranged adjacently and located between two second lower detection rows 4.
[0075] In some embodiments, along the second horizontal direction Y, the first lower detection row 100 is located between two adjacent second lower detection rows 4, and the distance between the two second lower detection rows 4 adjacent to the first lower detection row 100 is 18mm to 19mm.
[0076] If the distance between two adjacent second lower detection rows 4 is less than 18mm, the clearance space for the support bracket 5 will be insufficient. The first lower detection row 100 avoids the support bracket 5 by setting a clearance notch 3. In the lower detection row assembly 200, the first lower detection row 100 is located between two adjacent second lower detection rows 4. When the distance is too small, the support bracket 5 may not be able to pass smoothly through the clearance notch 3 when entering the space, or may even interfere with the second lower detection row 4. This will not only hinder the support bracket 5 from being placed in the correct position, affecting the normal support and detection of the solar cells, but may also cause component damage due to collision during equipment operation, increasing the risk of equipment failure.
[0077] If the spacing between two adjacent second lower detection rows 4 is greater than 19mm, although it can provide more space for the support bracket 5, it will result in a waste of internal space. In the actual cell testing equipment 300, excessive spacing will cause the lower detection row assembly 200 to occupy too much space in the limited equipment space, compressing the layout space of other components and affecting the overall compactness and integration of the equipment. This may lead to an excessively large equipment size, increasing manufacturing costs and installation difficulty, and is also detrimental to equipment maintenance and management.
[0078] By controlling the spacing between 18mm and 19mm, the internal space of the equipment can be optimized to the maximum extent while meeting the clearance requirements of the support bracket 5. This design avoids both insufficient spacing that could affect the normal use of the support bracket 5 and excessive spacing that could lead to wasted space. This design also results in a more rational allocation of space between the lower detection array assembly 200 and other components of the equipment, thus improving the overall space utilization rate of the equipment.
[0079] Thirdly, combining Figures 1 to 5 , Figure 5This is a simplified structural diagram of the battery cell testing device 300 disclosed in this application embodiment. The battery cell testing device 300 includes:
[0080] As in any of the second aspects, the lower detection row assembly 200 is located at detection station a;
[0081] The support bracket 5 is used to support and fix the battery cells. When the support bracket 5 is located at the testing station a, the support bracket 5 is located above the lower testing row assembly 200.
[0082] A correction drive assembly is connected to multiple lower detection rows. The correction drive assembly can control the multiple lower detection rows to move in the horizontal direction (in the first horizontal direction X) or rotate in the second horizontal direction Y, so that each lower detection row corresponds to the position of each main grid in the vertical direction.
[0083] The pressing drive assembly is connected to multiple lower detection rows. The pressing drive assembly can drive the multiple lower detection rows after their positions are adjusted to move upward in the vertical direction to press the back of the battery cell, so that each lower detection row contacts each main grid. In the first horizontal direction X, the support bracket 5 can be located in the avoidance notch 3 of the first lower detection row 100 corresponding to the support bracket 5.
[0084] In the first horizontal direction X, the design of the clearance notch 3 of the first lower detection row 100 of the first aspect allows the lower detection row assembly 200 to reserve more space for the support bracket 5. When the correction drive assembly corrects the lower detection row, the lower detection row assembly 200 has more room to move in the second horizontal direction Y. In this way, when the corrected lower detection row corresponds to the main grid, it can be ensured that the lower detection row and the support bracket 5 are staggered in the vertical direction. When the pressing drive assembly presses the lower detection row and the upper detection row (not shown in the figure) to press the battery cell, the support bracket 5 will not interfere with the lower detection row.
[0085] To prevent the lower inspection row from colliding with the support bracket 5, the program of the cell inspection equipment 300 sets a predetermined range. This predetermined range is typically half the distance between two adjacent inspection rows minus the width of the support bracket 5 in the second horizontal direction Y. If the distance exceeds this range, the testing machine will not perform the needle engagement action, which is called a missed test. By setting the first lower inspection row 100, the gap between the ends of the second abutting parts 42 of the two second lower inspection rows 4 adjacent to the first lower inspection row 100 along the second horizontal direction Y is increased. Since the predetermined range can be set to half the distance between the two second lower inspection rows 4 adjacent to the first lower inspection row 100 minus the width of the support bracket 5 in the second horizontal direction Y, the predetermined range can be set larger. After the production line speeds up, the fluctuation of the cell at the photographing station position increases, the lower inspection row can move a larger range, the possibility of missed tests by the machine is reduced, and the inspection efficiency is improved.
[0086] In some embodiments, the correction drive assembly includes a first drive member, a second drive member, and a third drive member. The first drive member can drive the lower detection row assembly 200 to move along a first horizontal direction X. The second drive member can drive the first end 1a of the lower detection row along the first horizontal direction X to move along a second horizontal direction Y. The third drive member can drive the second end 1b of the lower detection row assembly 200 along the first horizontal direction X to move along the second horizontal direction Y, thereby adjusting the position of the lower detection row so that each lower detection row corresponds to the position of the main gate.
[0087] Optionally, combined Figure 4 There are two support brackets 5. The first abutment part 2 has clearance notches 3 on both sides along the first horizontal direction X. The two support brackets 5 are spaced apart along the first horizontal direction X so that when the pressing drive assembly drives multiple lower detection row pressing battery cells, the two support brackets 5 can be located at the two clearance notches 3 respectively.
[0088] During the cell inspection process, the two support brackets 5 can support the cells from both sides, making the supporting force on the cells more even. The two support brackets 5 are spaced apart and correspond to the two clearance notches 3 located on the first lower inspection row 100. The two support brackets 5 correspond to the clearance notches 3 on both sides of the first lower inspection row 100, so that the support brackets 5 can maintain a safe distance from the lower inspection row during equipment operation, whether carrying the cells into the inspection station a or during the inspection process, thus avoiding mutual interference.
[0089] Furthermore, combined Figure 4There are four support brackets 5, arranged in pairs. Each pair of support brackets 5 is positioned at two clearance notches 3 in the first lower detection row 100. The two groups of support brackets 5 are spaced apart along the second horizontal direction Y. The four support brackets 5 support the edges of the battery cells and are positioned near the four corners of the cells. Each support bracket 5 is elongated and extends along the first horizontal direction X. Additionally, each support bracket 5 serves as a suction nozzle, fixed to the indexing plate, and is used to fix and support the battery cells.
[0090] As an optional implementation method, combined with Figure 5 The 300 cell testing equipment also includes:
[0091] The imaging device 6 is located at the imaging station b and is used to photograph the battery cell to obtain the coordinates of the battery cell. The imaging device 6 is electrically connected to the correction drive assembly so that the correction drive assembly controls the lower detection row assembly 200 to move or rotate in the horizontal direction according to the coordinate information obtained by the imaging device 6.
[0092] The rotary drive assembly 7 can drive the support bracket 5 to rotate along the first rotation direction. The shooting station b and the inspection station a are arranged in sequence along the first rotation direction so that the support bracket 5 can move between the shooting station b and the inspection station a.
[0093] When the battery cell undergoes IV testing, the battery cell is first placed on the support bracket 5. The support bracket 5 with the battery cell is initially located at the imaging station. The imaging device 6 captures the battery cell to obtain its coordinate information and transmits this coordinate information to the correction drive assembly. The rotation drive assembly 7 drives the support bracket 5 with the battery cell to rotate 90 degrees, so that the support bracket 5 moves from the imaging station b to the testing station a. The correction drive assembly drives the upper and lower detection rows to move along the first horizontal direction X and controls the two ends of the lower detection row along the first horizontal direction X to adjust their positions along the second horizontal direction Y. The pressing drive assembly drives the upper and lower detection rows to press the battery cell together. The clearance notch 3 at both ends of the first lower detection row 100 and the gap between the two adjacent second lower detection rows 4 form a clearance space, within which the support bracket 5 can be located.
[0094] When the pressing drive assembly drives the lower detection row to perform the pin-closing action (i.e., the lower detection row moves upward and contacts the main grid of the solar cell), due to the presence of the clearance notch 3, the lower detection row is less likely to interfere with the support bracket 5. In the first horizontal direction X, the design of the clearance notch 3 of the first lower detection row 100 allows the lower detection row to reserve more space for the support bracket 5, reducing the possibility of missed detections. This allows the support bracket 5 to be placed more stably in the corresponding position, and during equipment operation, the support bracket 5 will not conflict with the lower detection row due to insufficient space. This not only improves the rationality and stability of the equipment structure, but also provides a more reliable guarantee for the support and detection of solar cells, helping to improve the accuracy and efficiency of solar cell detection, and reducing detection errors or equipment failures caused by interference between equipment components.
[0095] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this application, and are not intended to limit them. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some or all of the technical features therein. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of this application.
Claims
1. A lower detection row for detecting battery cells mounted on a support bracket, wherein the surface of the battery cell is provided with a plurality of main grids, characterized in that, The lower detection row includes: First main body section; The first abutting part is disposed on the first side of the first main body part, and the first abutting part is used to press one of the multiple main gates along the length direction of the main gate; Along the first horizontal direction, the length of the first abutment portion is less than the length of the main grid, so that the portion of the first side without the first abutment portion forms an avoidance gap, which is used to avoid the support bracket.
2. The lower detection row according to claim 1, characterized in that, Along the first horizontal direction, the first abutting portion is disposed in the middle region of the first side, so that the first abutting portion forms the avoidance gap on both sides along the first horizontal direction.
3. The lower detection row according to claim 1, characterized in that, The first main body and the first abutting part are integrally formed plate-shaped structures.
4. The lower detection row according to claim 2, characterized in that, Along the first horizontal direction, the first main body includes a first end and a second end, and the first abutting part includes a third end and a fourth end. The third end is disposed close to the first end, and the fourth end is disposed close to the second end. The distance from the third end to the first end is equal to the distance from the fourth end to the second end.
5. The lower detection row according to claim 4, characterized in that, Along the first horizontal direction, the length of the first abutting portion is 80mm to 100mm.
6. A lower detection array assembly, characterized in that, include: Mounting rack; Multiple lower detection rows are arranged parallel to each other and spaced apart along a second horizontal direction on the mounting frame. The second horizontal direction is perpendicular to the first horizontal direction. At least one of the multiple lower detection rows is a first lower detection row, which is the lower detection row as described in any one of claims 1-5. The main body of the first lower detection row is connected to the mounting frame.
7. The lower detection row assembly according to claim 6, characterized in that, The plurality of lower detection rows further include a plurality of second lower detection rows. The second lower detection row includes a second main body and a second abutment portion connected to each other. The second main body is connected to the mounting bracket. The second abutment portion is used to press one of the main grids along the length direction of the main grid. The length of the second abutment portion is adapted to the length of the main grid. Along the second horizontal direction, the first lower detection row is located between two adjacent second lower detection rows, and the distance between two second lower detection rows adjacent to the first lower detection row is 18mm to 19mm.
8. A battery cell testing device, characterized in that, include: The lower detection row assembly as described in any one of claims 6-7, wherein the lower detection row assembly is located at the detection station; A support bracket is used to support and fix the battery cells. When the support bracket is located at the testing station, it is located above the lower testing row assembly. A correction drive assembly is connected to a plurality of lower detection rows. The correction drive assembly can control the plurality of lower detection rows to move or rotate in the horizontal direction so that each lower detection row corresponds to each main grid in the vertical direction. A pressing drive assembly is connected to a plurality of lower detection rows. The pressing drive assembly can drive the plurality of lower detection rows, after being adjusted in position, to move upward in a vertical direction to press the back of the battery cell, so that each lower detection row contacts each main grid. In addition, along the first horizontal direction, the support bracket can be located in the avoidance notch of the first lower detection row corresponding to the support bracket.
9. The battery cell testing equipment according to claim 8, characterized in that, There are two support brackets. The first abutment portion has the avoidance notch formed on both sides along the first horizontal direction. The two support brackets are spaced apart along the first horizontal direction so that when the pressing drive assembly drives the plurality of lower detection rows to press the battery cells, the two support brackets can be located at the two avoidance notches respectively.
10. The battery cell testing equipment according to claim 8, characterized in that, The battery cell testing equipment also includes: The imaging device is located at the imaging station and is used to image the battery cell to obtain the coordinates of the battery cell. The imaging device is electrically connected to the correction drive assembly so that the correction drive assembly controls the lower detection row assembly to move or rotate in the horizontal direction according to the coordinate information obtained by the imaging device. A rotary drive assembly is provided, which can drive the support bracket to rotate along a first rotation direction. The shooting station and the detection station are arranged sequentially along the first rotation direction so that the support bracket can move between the shooting station and the detection station.