一种均压环端子用铜钨合金叠层接触组件
By employing a gradient stacking design of low-copper-content tungsten copper, transition layer, and high-copper-content tungsten copper, along with the coordination of contact ends and locking devices, the conductivity, arc resistance, and structural stability issues of traditional equalizing ring terminal contact assemblies have been resolved. This has resulted in high conductivity, arc resistance, and environmental adaptability, thereby improving the operational reliability and safety of the equipment.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- YANGZHOU JUYAO ELECTRIC CO LTD
- Filing Date
- 2025-07-07
- Publication Date
- 2026-07-17
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Figure CN224520231U_ABST
Abstract
Claims
1. A copper-tungsten alloy laminated contact assembly for a grading ring terminal, comprising: Insulating rubber layer (1), characterized in that: The inner wall of the insulating rubber layer (1) is bonded with a contact device (2), which is connected by sliding. The outer wall of the insulating rubber layer is symmetrically fixed with locking devices (3). The contact device (2) includes a low copper tungsten copper (20), a transition layer (21) is fixedly connected to the top end of the low copper tungsten copper (20), and a high copper tungsten copper (22) is fixedly connected to the top end of the transition layer (21).
2. The copper-tungsten alloy stack contact assembly for a grading ring terminal according to claim 1, wherein: The low-copper-content tungsten copper (20), the transition layer (21), and the high-copper-content tungsten copper (22) are in a stepped state from low to high, and the outer wall of the low-copper-content tungsten copper (20) is bonded to the inner wall of the insulating rubber layer (1).
3. The copper-tungsten alloy stack contact assembly for a grading ring terminal according to claim 2, wherein: The top ends of the low copper tungsten copper (20), the transition layer (21) and the high copper tungsten copper (22) are all fixedly connected to contact ends (23). The bottom ends of the contact ends (23) are arranged in a circular array along the central axis of the low copper tungsten copper (20). The outer wall of the contact ends (23) is slidably connected to a connecting groove (24), which is opened on the inner wall of the connecting end (25).
4. The copper-tungsten alloy stack contact assembly for a grading ring terminal according to claim 3, wherein: The top end of the low copper tungsten copper (20) contacts the bottom end of the connecting end (25), the outer walls of the transition layer (21) and the high copper tungsten copper (22) are slidably connected to the inner wall of the connecting end (25), and the outer wall of the connecting end (25) is bonded to the inner wall of the insulating rubber layer (1).
5. The copper-tungsten alloy stack contact assembly for a grading ring terminal according to claim 1, wherein: The locking device (3) includes a limiting frame (30), a slider (31) is symmetrically slidably connected to the inner wall of the limiting frame (30), an inclined area (32) is opened on the outer wall of the slider (31), a compression spring (33) is fixedly connected to the outer wall of the slider (31), and a locking frame (34) is slidably connected to the outer wall of the slider (31).
6. A copper-tungsten alloy stack contact assembly for a grading ring terminal according to claim 5, wherein: The side wall of the limiting frame (30) is fixedly connected to the outer wall of the insulating rubber layer (1), the outer wall of the inclined area (32) is slidably connected to the inner wall of the locking frame (34), and the side wall of the locking frame (34) is fixedly connected to the outer wall of the insulating rubber layer (1).