A cleaning device for integrated circuit test probes

Abstract

This utility model relates to the field of integrated circuit manufacturing and testing technology, specifically an integrated circuit test probe cleaning device, comprising: a base on which a cleaning cylinder is fixedly connected; a fixing assembly including a connecting plate, a rotating ring, and a supporting sleeve, wherein the connecting plate is welded to the inner wall of the cleaning cylinder, the rotating ring is rotatably connected to the connecting plate, the supporting sleeve is welded to one side of the rotating ring, and the supporting sleeve is located on the side close to the outer wall of the cleaning cylinder; and a cleaning assembly including a rotating shaft, a cleaning cylinder, a brush, a water supply pipe, and a spray head, wherein the rotating shaft is rotatably connected to the base via a supporting seat, the cleaning cylinder is keyed to the rotating shaft, the brush is fixedly connected to the outer wall of the cleaning cylinder, the water supply pipe passes through the side wall of the cleaning cylinder and is fixedly connected to the side wall of the cleaning cylinder, and the spray head is fixedly connected to the water supply pipe and located inside the cleaning cylinder, thereby improving cleaning efficiency while ensuring cleaning effect.

Description

Technical Field

[0001] This utility model relates to the field of integrated circuit manufacturing and testing technology, specifically to an integrated circuit test probe cleaning device. Background Technology

[0002] Traditional probe cleaning methods are mostly manual, involving wiping with alcohol or brushing with simple tools. These methods have the following problems: First, the cleaning efficiency is low, making it difficult to meet the needs of batch testing; second, the cleaning effect is uneven, and differences in the force and angle of manual operation can easily lead to the residue of some impurities; third, improper operation may damage the probe, increasing production costs.

[0003] A search revealed existing technology (application number: CN222469895U), which describes an "integrated circuit probe card cleaning device." This utility model has multiple cleaning brushes at one end of its main body, an internal gas nozzle, a gas flow regulating valve in the middle, and an air pipe at the other end, which connects to the gas flow regulating valve, the gas nozzle, and the air gun.

[0004] However, the lack of a structure to fix the probe may affect the cleaning effect due to probe shaking. Furthermore, it relies solely on gas and brushes for cleaning without liquid assistance, resulting in low cleaning efficiency and cleanliness. Utility Model Content

[0005] The purpose of this invention is to address the shortcomings of existing technologies by proposing an integrated circuit test probe cleaning device.

[0006] To achieve the above objectives, the present invention adopts the following technical solution: an integrated circuit test probe cleaning device, comprising: a base on which a cleaning cylinder is fixedly connected; a fixing assembly including a connecting plate, a rotating ring, and a supporting sleeve, wherein the connecting plate is welded to the inner wall of the cleaning cylinder, the rotating ring is rotatably connected to the connecting plate, the supporting sleeve is welded to one side of the rotating ring, and the supporting sleeve is located on the side close to the outer wall of the cleaning cylinder; and a cleaning assembly including a rotating shaft, a cleaning cylinder, a brush, a water supply pipe, and a spray head, wherein the rotating shaft is rotatably connected to the base via a supporting seat, the cleaning cylinder is keyed to the rotating shaft, the brush is fixedly connected to the outer wall of the cleaning cylinder, the water supply pipe passes through the side wall of the cleaning cylinder and is fixedly connected to the side wall of the cleaning cylinder, and the spray head is fixedly connected to the water supply pipe and located inside the cleaning cylinder.

[0007] As a further description of the above technical solution:

[0008] The fixing components are provided in two sets, with multiple components in each set. Each set is evenly distributed around the inner wall of the cleaning cylinder, and the two sets are symmetrically distributed at both ends of the inner wall of the cleaning cylinder.

[0009] As a further description of the above technical solution:

[0010] The fixing assembly further includes: a control sleeve, threadedly connected to the support sleeve; a locking block, slidably connected to the side wall of the support sleeve and penetrating through the side wall of the support sleeve; and a probe placed inside the support sleeve.

[0011] As a further description of the above technical solution:

[0012] The locking block is wedge-shaped, wider at the top and narrower at the bottom, and engages with the side wall of the support sleeve. The top of the locking block is a slope, which is slidably connected to the control sleeve.

[0013] As a further description of the above technical solution:

[0014] A timing belt is also provided on the rotating shaft, and the other end of the timing belt is keyed to the output shaft of the drive motor, which is placed on the base.

[0015] As a further description of the above technical solution:

[0016] The cleaning assembly also includes: a water tank placed on a base; and a water pump connected to the water tank via a water pipe, with the other end connected to a water delivery pipe.

[0017] As a further description of the above technical solution:

[0018] The bottom of the cleaning cylinder is provided with a water guide groove, the bottom of which is an inclined sliding groove. A wastewater tank is provided at the lower end of the water guide groove, which is placed on the base. A leakage hole is provided at the connection between the wastewater tank and the water guide groove.

[0019] This utility model has the following beneficial effects:

[0020] The device securely holds the probes with multiple sets of fixing components, and together with the rotating brush and water spray structure in the cleaning component, it can efficiently clean multiple probes at the same time, improving cleaning efficiency while ensuring cleaning effect.

[0021] In addition, the drive motor provides rotational power, the water pump supplies clean water, and the water guide channel and wastewater tank achieve centralized wastewater treatment, forming a complete cleaning process that ensures the quality of probe cleaning and maintains the cleanliness of the device itself. Attached Figure Description

[0022] Figure 1 This is a schematic diagram of the overall structure of this utility model;

[0023] Figure 2 This is a schematic diagram of the internal structure of the present invention;

[0024] Figure 3 This is a schematic diagram of the structure of the fixing component of this utility model;

[0025] Figure 4This is a partial structural diagram of the cleaning component of this utility model.

[0026] Legend:

[0027] 1. Base; 11. Cleaning cylinder; 2. Fixing assembly; 21. Connecting plate; 22. Rotating ring; 23. Support sleeve; 24. Control sleeve; 25. Locking block; 26. Probe; 3. Cleaning assembly; 31. Drive motor; 32. Rotating shaft; 33. Cleaning drum; 34. Brush; 35. Water tank; 36. Water pump; 37. Water pipe; 38. Spray head; 39. Wastewater tank. Detailed Implementation

[0028] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0029] In the description of this utility model, it should be noted that the terms "center," "upper," "lower," "left," "right," "vertical," "horizontal," "inner," and "outer," etc., indicating the orientation or positional relationship, are based on the orientation or positional relationship shown in the accompanying drawings and are only for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this utility model. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and should not be construed as indicating or implying relative importance. The utility model will be further described in detail below with reference to the accompanying drawings.

[0030] In this utility model, unless otherwise explicitly specified and limited, the terms "installation," "connection," "joining," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in this utility model according to the specific circumstances.

[0031] Example 1:

[0032] like Figures 1 to 4As shown, this embodiment provides an integrated circuit test probe cleaning device, including: a base 1, on which a cleaning cylinder 11 is fixedly connected; a fixing assembly 2, including a connecting plate 21, a rotating ring 22 and a supporting sleeve 23, wherein the connecting plate 21 is welded to the inner wall of the cleaning cylinder 11, the rotating ring 22 is rotatably connected to the connecting plate 21, the supporting sleeve 23 is welded to one side of the rotating ring 22 and is located on the side close to the outer wall of the cleaning cylinder 11; and a cleaning assembly 3, including a rotating shaft 32, a cleaning rotating cylinder 33, a brush 34, a water supply pipe 37 and a spray head 38, wherein the rotating shaft 32 is rotatably connected to the base 1 through a support seat, the cleaning rotating cylinder 33 is keyed to the rotating shaft 32, the brush 34 is fixedly connected to the outer wall of the cleaning rotating cylinder 33, the water supply pipe 37 penetrates the side wall of the cleaning cylinder 11 and is fixedly connected to the side wall of the cleaning cylinder 11, and the spray head 38 is fixedly connected to the water supply pipe 37 and located inside the cleaning cylinder 11.

[0033] The cleaning solution used for the cleaning probe 26 in this application can be a neutral detergent solution. This solution has low viscosity, will not cause the brush to swell or age, can dissolve light grease, fingerprints and other organic matter, leaves no residue, does not corrode most probe materials, requires no special protection during operation, and is suitable for batch automated cleaning.

[0034] In this embodiment, the base 1, the cleaning cylinder 11, the fixing component 2, and the cleaning component 3 constitute an integrated circuit test probe cleaning device according to this application.

[0035] Example 2:

[0036] Specifically, the fixing components 2 are provided in two sets, with multiple components in each set. Each set is evenly distributed around the inner wall of the cleaning cylinder 11, and the two sets are symmetrically distributed at both ends of the inner wall of the cleaning cylinder 11.

[0037] Specifically, the fixing component 2 also includes: a control sleeve 24, which is threadedly connected to the support sleeve 23; a locking block 25, which is slidably connected to the side wall of the support sleeve 23 and penetrates through the side wall of the support sleeve 23; and a probe 26, which is placed inside the support sleeve 23.

[0038] The control sleeve 24 has protrusions welded on its side wall to facilitate rotation of the control sleeve 24.

[0039] Specifically, the locking block 25 is wedge-shaped with a larger top and a smaller bottom, and it cooperates with the side wall of the support sleeve 23. The top of the locking block 25 is a slope, and the slope is slidably connected to the control sleeve 24.

[0040] In this embodiment, multiple sets of fixing components 2 can fix multiple probes at the same time, improving cleaning efficiency. Rotating the control sleeve 24 can push the locking block 25 to move, thereby locking and unlocking the probe 26, firmly fixing the probe 26 and preventing it from shaking during cleaning.

[0041] Example 3:

[0042] Specifically, a timing belt is also provided on the rotating shaft 32, and the other end of the timing belt is keyed to the output shaft of the drive motor 31, which is placed on the base 1.

[0043] In another embodiment, a housing is provided on the outside of the drive motor 31, and heat dissipation holes are provided on the housing.

[0044] Specifically, the cleaning component 3 also includes: a water tank 35, placed on the base 1; and a water pump 36, which is connected to the water tank 35 via a water pipe, with the other end connected to a water supply pipe 37.

[0045] Specifically, a water guide channel is provided at the bottom of the cleaning cylinder 11. The bottom of the water guide channel is an inclined chute. A wastewater tank 39 is provided at the lower end of the water guide channel. The wastewater tank 39 is placed on the base 1. A leakage hole is provided at the connection between the wastewater tank 39 and the water guide channel.

[0046] The cleaning cylinder 11 has baffles at both ends connected by bolts. The baffles are rotatably connected to the rotating shaft 32 and a sealing ring is provided at the connection. The bottom of the baffle located above the wastewater tank 39 has a groove.

[0047] In this embodiment, the drive motor 31 drives the rotating shaft 32 to rotate via a synchronous belt, providing power to the cleaning drum 33 and enabling the brush 34 to rotate and clean. The water pump 36 pumps water from the water storage tank 35 to the water supply pipe 37, and then sprays it out through the spray head 38, providing water for the cleaning process and enhancing the cleaning effect. The wastewater generated during cleaning flows through the inclined slide of the water guide channel to the drain hole and enters the wastewater tank 39, realizing the centralized collection of wastewater and keeping the device clean.

[0048] In actual use, the operator first places the probe 26 inside the support sleeve 23, then rotates the control sleeve 24 to press the locking block 25, thus pressing the probe 26. Then, the baffle is fixed to the cleaning cylinder 11 with bolts. Then, the water pump 36 is started, and the water pump 36 delivers the cleaning liquid inside the water storage tank 35 to the water supply pipe 37. The water supply pipe 37 delivers the cleaning liquid to the spray head 38, and the spray head 38 sprays the cleaning liquid onto the probe 26. Then, the drive motor 31 is started, and the drive motor 31 drives the rotating shaft 32, the cleaning drum 33, and the brush 34 to rotate. The brush 34 contacts the side wall of the probe 26 and drives the probe 26 to rotate, so that the entire side wall of the probe 26 can be in contact with the brush 34. The wastewater after cleaning flows into the wastewater tank 39 through the water guide channel. After cleaning, the bolts on the baffle are removed, the baffle is slid along the rotating shaft 32, and then the control sleeve 24 is rotated to remove the probe 26.

[0049] It should be noted that all electrical components mentioned in this article are connected to an external main controller and 220V AC mains power. The main controller can be a conventional known device that can be controlled by a computer or other means. The detailed description of known functions and known components is omitted in the specific implementation of this disclosure. In order to ensure the compatibility of the device, the operating methods used are consistent with the parameters of commercially available instruments.

[0050] Finally, it should be noted that the above description is only a preferred embodiment of the present utility model and is not intended to limit the present utility model. Although the present utility model has been described in detail with reference to the foregoing embodiments, those skilled in the art can still modify the technical solutions described in the foregoing embodiments or make equivalent substitutions for some of the technical features. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present utility model should be included within the protection scope of the present utility model.

Claims

1. A device for cleaning integrated circuit test probes, characterized in that: include: The base (1) has a cleaning cylinder (11) fixedly connected to it; The fixing component (2) includes a connecting plate (21), a rotating ring (22) and a support sleeve (23). The connecting plate (21) is welded to the inner wall of the cleaning cylinder (11). The rotating ring (22) is rotatably connected to the connecting plate (21). The support sleeve (23) is welded to one side of the rotating ring (22) and is located on the side close to the outer wall of the cleaning cylinder (11). The cleaning assembly (3) includes a rotating shaft (32), a cleaning drum (33), a brush (34), a water supply pipe (37), and a spray head (38). The rotating shaft (32) is rotatably connected to the base (1) via a support seat. The cleaning drum (33) is keyed to the rotating shaft (32). The brush (34) is fixedly connected to the outer wall of the cleaning drum (33). The water supply pipe (37) passes through the side wall of the cleaning drum (11) and is fixedly connected to the side wall of the cleaning drum (11). The spray head (38) is fixedly connected to the water supply pipe (37) and located inside the cleaning drum (11).

2. The integrated circuit test probe cleaning device according to claim 1, characterized in that: The fixing components (2) are provided in two sets, each set having multiple components. Each set is evenly distributed around the inner wall of the cleaning cylinder (11), and the two sets are symmetrically distributed at both ends of the inner wall of the cleaning cylinder (11).

3. The integrated circuit test probe cleaning device according to claim 1, characterized in that: The fixing component (2) also includes: The control sleeve (24) is threadedly connected to the support sleeve (23); The locking block (25) is slidably connected to the side wall of the support sleeve (23) and penetrates the side wall of the support sleeve (23); The probe (26) is placed inside the support sleeve (23).

4. The integrated circuit test probe cleaning device according to claim 3, characterized in that: The locking block (25) is wedge-shaped with a larger top and a smaller bottom, and it cooperates with the side wall of the support sleeve (23). The top of the locking block (25) is an inclined surface, which is slidably connected to the control sleeve (24).

5. The integrated circuit test probe cleaning device according to claim 1, characterized in that: A timing belt is also provided on the rotating shaft (32), and the other end of the timing belt is keyed to the output shaft of the drive motor (31), which is placed on the base (1).

6. The integrated circuit test probe cleaning device according to claim 1, characterized in that: The cleaning component (3) also includes: A water storage tank (35) is placed on a base (1); The water pump (36) is connected to the water storage tank (35) via a water pipe, and the other end is connected to the water delivery pipe (37).

7. The integrated circuit test probe cleaning device according to claim 1, characterized in that: The bottom of the cleaning cylinder (11) is provided with a water guide groove. The bottom of the water guide groove is an inclined sliding groove. A wastewater tank (39) is provided at the lower end of the water guide groove. The wastewater tank (39) is placed on the base (1). A water leakage hole is provided at the connection between the wastewater tank (39) and the water guide groove.

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