Mobile phone chip testing device
By integrating a display screen, voltage and current meters, and test components, the mobile phone chip testing device solves the problems of operational complexity and high cost caused by independent modules, realizes comprehensive testing and efficient detection of mobile phone chips, and ensures normal operation of chips in various environments.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- 东莞市台易电子科技有限公司
- Filing Date
- 2025-08-04
- Publication Date
- 2026-08-04
Smart Images

Figure CN224594777U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of testing devices, and more specifically to a mobile phone chip testing device. Background Technology
[0002] The modules of existing mobile phone chip testing equipment are usually independent of each other, and then connected and debugged when testing is required. This not only greatly increases the complexity of operation and the risk of human error, but also requires equipment maintenance, calibration and upgrades to be carried out separately for each module, which drives up the overall operating cost. Ultimately, this leads to longer testing cycles, insufficient resource utilization and limited testing coverage depth, which seriously restricts product development speed and overall testing efficiency. Utility Model Content
[0003] To address the aforementioned problems, this utility model provides a mobile phone chip testing device, including a housing box. A display screen and a voltmeter / ammeter are mounted on the top of the housing box. A testing component is disposed on one side of the display screen. The testing component is electrically connected to the display screen and the voltmeter / ammeter. The testing component includes a base. A receiving groove is disposed on the top of the base for placing a mobile phone chip. A pressing component is disposed above the base for pressing the mobile phone chip firmly into the receiving groove.
[0004] Furthermore, a support is provided inside the receiving box, the support is fixed to the inner side of the top surface of the receiving box, and the base is installed on the support.
[0005] Furthermore, the base includes an upper clamping plate and a lower clamping plate, the receiving groove is installed on the top of the upper clamping plate, a circuit board is disposed between the upper clamping plate and the lower clamping plate, the circuit board is clamped and fixed by the upper clamping plate and the lower clamping plate, and the circuit board is electrically connected to the display screen and the voltage and current meter.
[0006] Furthermore, a first through hole is provided at the bottom of the receiving groove, a needle plate is provided between the upper clamping plate and the circuit board, a plurality of test probes are installed on the top of the needle plate, the test probes are electrically connected to the circuit board, the test probes are located directly below the first through hole, and a spring is provided between the needle plate and the receiving groove.
[0007] Furthermore, the pressing assembly includes a surrounding plate and a cover, which are connected by a pivot shaft. The surrounding plate is disposed on the top of the receiving groove and surrounds the surrounding groove, and a pressing block is disposed on the cover.
[0008] Furthermore, a knob is provided on the top of the cover, and the pressure block passes through the cover and is connected to the knob. A stud is connected between the knob and the pressure block. The stud is disposed in the cover and is rotatably connected to the cover by threads.
[0009] Furthermore, a latch is provided on the side wall of the cover, and a limiting groove is provided on the surrounding plate to cooperate with the latch.
[0010] Furthermore, two operating levers protrude outwards from one side of the knob, and the operating levers are arranged opposite each other.
[0011] Compared with the prior art, the beneficial effects of this utility model are: This application integrates a display screen, voltage and current meters, and test components within a housing. By injecting predetermined signals into the pins of the chip under test, the response generated by the chip's output port is detected, enabling comprehensive testing of the chip's functionality, performance, and reliability. This ensures that the chip functions normally under various operating environments, thereby achieving the desired effect.
[0012] Additional aspects and advantages of this invention will be set forth in the description which follows, and some will be obvious from the description or may be learned by practice of the invention. Attached Figure Description
[0013] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.
[0014] Figure 1 This is a cross-sectional view of the overall structure of this utility model; Figure 2 This is an exploded view of the structure of the test component of this utility model; Figure 3 This is an exploded view of the base of this utility model; Figure 4 This is a schematic diagram of the structure of the pressing component of this utility model; Figure 5 This is a cross-sectional view of the pressing component of this utility model.
[0015] The reference numerals and names in the figure are as follows: The components include: a housing box 10, a display screen 100, a voltmeter and ammeter 200, a test assembly 20, a base 300, a receiving groove 310, a pressing assembly 400, a support seat 11, an upper clamping plate 320, a lower clamping plate 330, a circuit board 340, a first through hole 311, a needle plate 350, a spring 360, a test probe 351, a surrounding plate 410, a cover 420, a rotating shaft 430, a pressure block 421, a knob 422, a stud 423, a latch 424, a limiting groove 411, and an operating lever 425. Detailed Implementation
[0016] The technical solutions in the embodiments of this utility model will be clearly and completely described below. Obviously, the described embodiments are only some embodiments of this utility model, and not all embodiments. Based on the embodiments of this utility model, all other embodiments obtained by those skilled in the art without creative effort are within the protection scope of this utility model.
[0017] The present invention will now be described in more detail. It should be understood that the specific embodiments described herein are for illustrative purposes only and are not intended to limit the scope of the invention. It should be noted that when an element is described as being "fixed to" another element, it can be directly on the other element, or one or more intermediate elements may exist between them. When an element is described as being "connected to" another element, it can be directly connected to the other element, or one or more intermediate elements may exist between them.
[0018] In the description of this utility model, it should be noted that directional terms such as "front, back, up, down, left, right," "horizontal, vertical, horizontal," and "top, bottom," indicating directions or positional relationships, are generally based on the directions or positional relationships shown in the accompanying drawings. They are used only for the convenience of describing this utility model and simplifying the description. Unless otherwise stated, these directional terms do not indicate or imply that the device or component referred to must have a specific orientation or be constructed and operated in a specific orientation, and therefore should not be construed as limiting the scope of protection of this utility model. The directional terms "inner" and "outer" refer to the inner and outer contours of each component itself. In the description of this utility model, it should be noted that the use of terms such as "first" and "second" to define components is merely for the convenience of distinguishing the corresponding components. Unless otherwise stated, the above terms have no special meaning and therefore should not be construed as limiting the scope of protection of this utility model. In the description of the embodiments of this application, "multiple" means two or more, unless otherwise explicitly specified.
[0019] Unless otherwise defined, all technical and scientific terms used in this specification have the same meaning as commonly understood by one of ordinary skill in the art to which this invention pertains. The terminology used in this specification is for the purpose of describing particular embodiments only and is not intended to limit the scope of the invention.
[0020] Furthermore, the technical features involved in the different embodiments of this application described below can be combined with each other as long as they do not conflict with each other.
[0021] The preferred embodiments of this utility model will now be further described with reference to the accompanying drawings. Figure 1 , Figure 2 and Figure 3 As shown, a mobile phone chip testing device includes a housing 10, a display screen 100 and a voltmeter / ammeter 200 mounted on the top of the housing 10, a testing component 20 disposed on one side of the display screen 100, the testing component 20 being electrically connected to the display screen 100 and the voltmeter / ammeter 200 respectively, the testing component 20 including a base 300, a receiving groove 310 disposed on the top of the base 300 for placing a mobile phone chip, and a pressing component 400 disposed above the base 300 for pressing the mobile phone chip tightly within the receiving groove 310.
[0022] In the working state of this embodiment, the mobile phone chip to be tested is first placed in the receiving slot 310, and then pressed by the pressing component 400. Then, the power is turned on, and a predetermined signal is injected into the pin of the chip under test. Then, the response generated by the chip output port is carefully detected by the display screen 100 and the voltage and current meter 200, so as to accurately determine whether the chip can work normally and whether it achieves the expected effect.
[0023] Compared with the prior art, this application integrates a display screen 100, a voltage and current meter 200, and a test component 20 into a housing 10. By injecting a predetermined signal into the pins of the chip under test, the response generated by the chip's output port is detected, so as to perform comprehensive testing of the chip's function, performance, and reliability, ensuring that the chip can work normally in various usage environments, thereby achieving the expected effect.
[0024] Furthermore, based on the above embodiments, combined with Figure 1 and Figure 2 As shown, a support 11 is provided inside the housing 10. The support 11 is fixed to the inner side of the top surface of the housing 10. The base 300 is installed on the support 11, so that the entire test assembly 20 can be fixed to the top of the housing 10.
[0025] Furthermore, based on the above embodiments, such as Figure 3 As shown, the base 300 includes an upper clamping plate 320 and a lower clamping plate 330. The receiving groove 310 is installed on the top of the upper clamping plate 320. A circuit board 340 is disposed between the upper clamping plate 320 and the lower clamping plate 330. The circuit board 340 is clamped and fixed by the upper clamping plate 320 and the lower clamping plate 330. The circuit board 340 is electrically connected to the display screen 100 and the voltmeter and ammeter 200. Since the base 300 is suspended on the top surface of the receiving box 10, the circuit board 340 can be clamped and fixed by the upper clamping plate 320 and the lower clamping plate 330 first, thereby preventing the circuit board 340 from shaking when the base 300 is installed on the support 11.
[0026] Furthermore, based on the above embodiments, such as Figure 3 As shown, a first through hole 311 is provided at the bottom of the receiving groove 310. A pin plate 350 is provided between the upper clamping plate 320 and the circuit board 340. Several test probes 351 are installed on the top of the pin plate 350. The test probes 351 are electrically connected to the circuit board 340. The test probes 351 are located directly below the first through hole 311. A spring 360 is provided between the pin plate 350 and the receiving groove 310. When the mobile phone chip is placed in the receiving groove 310 and pressed by the pressing assembly 400, the receiving groove 310 moves downward as a whole under the support of the spring 360. The test probes 351 pass through the first through hole 311 and contact the pins at the bottom of the mobile phone chip, so that a predetermined signal can be injected into the pins of the chip under test. Then, the response generated by the chip output port can be carefully detected by the display screen 100 and the voltage and current meter 200.
[0027] Furthermore, based on the above embodiments, combined with Figure 4 and Figure 5 As shown, the pressing assembly 400 includes a surrounding plate 410 and a cover 420. The surrounding plate 410 and the cover 420 are connected by a pivot 430. The surrounding plate 410 is disposed on the top of the receiving groove 310 and surrounds the receiving groove 310. A pressing block 421 is provided on the cover 420. When the cover 420 and the surrounding plate 410 are closed with the pivot 430 as the axis, the surrounding plate 410 can ensure that the pressing block 421 can extend into the receiving groove 310 to press the mobile phone chip.
[0028] Furthermore, based on the above embodiments, combined with Figure 4 and Figure 5As shown, a knob 422 is provided on the top of the cover 420. The pressure block 421 passes through the cover 420 and is connected to the knob 422. A stud 423 is connected between the knob 422 and the pressure block 421. The stud 423 is disposed inside the cover 420 and is rotatably connected to the cover 420 by a thread. That is, the stud 423 can be rotated inside the cover 420, so that the stud 423 can move up and down inside the cover 420. When the cover 420 and the surrounding plate 410 are closed, the knob 422 can be operated to rotate the stud 423, so that the pressure block 421 can gradually press the mobile phone chip, thereby avoiding damage to the mobile phone chip caused by sudden pressing.
[0029] Furthermore, based on the above embodiments, combined with Figure 4 and Figure 5 As shown, a latch 424 is provided on the side wall of the cover 420, and a limiting groove 411 is provided on the surrounding plate 410 to cooperate with the latch 424. When the cover 420 and the surrounding plate 410 are closed, the latch 424 can be fastened in the limiting groove 411, thereby preventing the cover 420 and the surrounding plate 410 from disengaging from the closed state.
[0030] Furthermore, based on the above embodiments, combined with Figure 4 and Figure 5 As shown, two operating levers 425 protrude outward on one side of the knob 422. The operating levers 425 are arranged opposite each other, so that the operator can rotate the knob 422 more conveniently by moving the operating levers 425.
[0031] The details of the above exemplary embodiments are provided, and the present invention can be implemented in other specific forms without departing from the spirit or essential characteristics of the present invention. Therefore, the embodiments should be regarded as exemplary and non-limiting in all respects, and the scope of the present invention is defined by the appended claims rather than the foregoing description. Therefore, it is intended that all changes falling within the meaning and scope of equivalents of the claims be included within the present invention.
Claims
1. A handset chip testing apparatus, characterized by, The device includes a housing (10), on which a display screen (100) and a voltmeter and ammeter (200) are mounted. A test component (20) is provided on one side of the display screen (100). The test component (20) is electrically connected to the display screen (100) and the voltmeter and ammeter (200) respectively. The test component (20) includes a base (300), on which a receiving groove (310) is provided. The receiving groove (310) is used to place a mobile phone chip. A pressing component (400) is provided above the base (300). The pressing component (400) is used to press the mobile phone chip into the receiving groove (310).
2. The handset chip test apparatus of claim 1, wherein A support (11) is provided inside the container (10), the support (11) is fixed to the inner side of the top surface of the container (10), and the base (300) is installed on the support (11).
3. The handset chip test apparatus of claim 2, wherein The base (300) includes an upper clamping plate (320) and a lower clamping plate (330). The receiving groove (310) is installed on the top of the upper clamping plate (320). A circuit board (340) is disposed between the upper clamping plate (320) and the lower clamping plate (330). The circuit board (340) is clamped and fixed by the upper clamping plate (320) and the lower clamping plate (330). The circuit board (340) is electrically connected to the display screen (100) and the voltage and current meter (200).
4. The handset chip test apparatus of claim 3, wherein A first through hole (311) is provided at the bottom of the receiving groove (310). A needle plate (350) is provided between the upper clamping plate (320) and the circuit board (340). A plurality of test probes (351) are installed on the top of the needle plate (350). The test probes (351) are electrically connected to the circuit board (340). The test probes (351) are located directly below the first through hole (311). A spring (360) is provided between the needle plate (350) and the receiving groove (310).
5. The handset chip test apparatus of claim 1, wherein The pressing assembly (400) includes a surrounding plate (410) and a cover (420), which are connected by a pivot (430). The surrounding plate (410) is disposed on the top of the receiving groove (310) and surrounds the receiving groove (310). A pressing block (421) is provided on the cover (420).
6. The handset chip test apparatus of claim 5, wherein, A knob (422) is provided on the top of the cover (420). The pressure block (421) passes through the cover (420) and is connected to the knob (422). A stud (423) is connected between the knob (422) and the pressure block (421). The stud (423) is disposed inside the cover (420) and is rotatably connected to the cover (420) by a thread.
7. The handset chip test apparatus of claim 6, wherein, A latch (424) is provided on the side wall of the cover (420), and a limiting groove (411) is provided on the surrounding plate (410) that can cooperate with the latch (424).
8. The handset chip test apparatus of claim 7, wherein, Two operating levers (425) protrude outwards on one side of the knob (422) and are arranged opposite each other.