Adjustable probe testing device for perovskite solar cell

Abstract

The utility model discloses a kind of adjustable probe testing device for perovskite solar cell piece, including mounting frame, probe row, probe, wire, multiple probe rows are in the plane of mounting frame with same direction distribution layout, probe row both ends are movably connected with mounting frame, multiple probes are distributed layout in the length direction of probe row, probe is vertically arranged in probe row and is fixed with it, each probe upper portion on same probe row is connected by a wire and is connected in conduction, wire both ends are fixed with mounting frame, measuring instrument and wire both ends are connected to form loop. Probe testing device moves on mounting frame by probe row, changes the position of probe lower end on cell piece, ensure that at least one probe and electrode form effective conduction when testing, flexibly adjust and select according to the actual demand of electrode pattern of cell piece, to realize accurate measurement, same test device is suitable for different size cell piece, large size cell piece universal, test efficiency is improved.

Description

Technical Field

[0001] This utility model relates to an electrical performance testing device for perovskite solar cells, and in particular to a probe testing device for measuring the electrical performance of electrode patterns. Background Technology

[0002] Perovskite solar cells have been extensively studied by researchers since their inception. As a highly promising new photovoltaic technology, they have received widespread attention and rapid development. In the research and development and production of perovskite solar cells, accurate measurement of the electrical performance of the cells is crucial. This includes measuring parameters such as open-circuit voltage, short-circuit current, fill factor, and photoelectric conversion efficiency. These parameters directly reflect the quality and performance of the cells.

[0003] The electrodes of perovskite solar cells are typically patterned, and the pattern design can be flexibly varied. In practice, the pattern design is often optimized and the cell size is designed in a variety of ways.

[0004] Existing fixed probe testing devices are customized one-to-one according to the specific size or electrode pattern of the solar cell to be tested. Especially for large-area perovskite solar cells, fixed probe testing devices cannot be universally applied and are difficult to adapt to the diverse size specifications of solar cells. When the size of the solar cell changes slightly, the probe testing device needs to be customized again, which increases the cost and time consumption and affects the progress of laboratory experiments. Utility Model Content

[0005] Purpose of this utility model: The purpose of this application is to provide an adjustable probe testing device for perovskite solar cells, which is applicable to large-area perovskite solar cells, cell size variations, and electrode pattern variations.

[0006] Technical Solution: An adjustable probe testing device for perovskite solar cells includes a mounting frame, probe rows, probes, and wires. Multiple probe rows are arranged in the same direction within the plane of the mounting frame. Both ends of each probe row are movably connected to the mounting frame. Multiple probes are arranged along the length of each probe row. Each probe is vertically inserted through and fixed to the probe row. The upper parts of each probe on the same probe row are connected and conductive via a wire. Both ends of the wire are fixed to the mounting frame. A measuring instrument is connected to both ends of the wire to form a circuit.

[0007] Furthermore, on a set of opposing frame sides of the mounting frame, U-shaped grooves with opposite openings are formed along the length of the frame sides. Magnet strips are embedded within the frame sides along the length of the U-shaped grooves. Iron members are provided at both ends of the probe array, and the ends of the probe array are inserted into the U-shaped grooves, where the iron members attract the magnet strips. This structure facilitates the movement of the probe array on the mounting frame to change its position. The attractive connection maintains an effective connection between the probe array and the mounting frame, preventing detachment, while also allowing for convenient movement of the probe array within the U-shaped grooves.

[0008] Furthermore, the probe array is made of quartz, and the light-transmitting probe array does not obstruct the battery cells, thus improving the authenticity of the test results under illumination testing conditions.

[0009] Furthermore, both ends of the wire are flat ends with screw holes. The flat ends are fixed to the mounting frame by conductive screws passing through the screw holes, which facilitates the fixing of the wire to the mounting frame and the connection of the measuring instrument to the wire, forming an effective conductive circuit.

[0010] Furthermore, the wire length has a margin to accommodate movement of the probe array without interfering with the probe array and the probes.

[0011] Furthermore, the upper part of the probe extends upward from the probe array, and the two sides of the wire form inclined sections to provide slack.

[0012] Beneficial effects: This application has the following advantages: It forms an array of probes on the mounting frame, and the probes move on the mounting frame to change the position of the lower end of the probe on the solar cell. During the test, it ensures that at least one probe forms effective conduction with the electrode. It can be flexibly adjusted and selected according to the actual needs of the electrode pattern of the solar cell, thereby achieving accurate measurement. The same testing device is applicable to solar cells of different sizes and is universal for large-size solar cells. There is no need to customize the probe testing device for each solar cell, thus improving the testing efficiency. Attached Figure Description

[0013] Figure 1 This is a front view of the probe testing device;

[0014] Figure 2 for Figure 1 Top view. Detailed Implementation

[0015] The present application will be further explained below with reference to the accompanying drawings and specific embodiments.

[0016] An adjustable probe testing device for perovskite solar cells, as shown in the attached figure. Figure 1 , 2 As shown, it includes mounting frame 1, probe array 2, probe 3, and wire 4.

[0017] The mounting frame 1 is a rectangular frame structure made of insulating material, consisting of four side frames. A U-shaped groove 11 is formed on one set of opposite side frames 12 and 13. The U-shaped groove 11 is formed on the opposite surfaces of side frames 12 and 13, along the length of each side frame 12 and 13. The opening of the U-shaped groove 11 on side frame 12 is opposite to the opening of the U-shaped groove 11 on side frame 13. Along the length of the U-shaped groove 11, a magnet strip 5 is embedded in the side frame 12 on at least one of the three surfaces of the U-shaped groove 11. The magnet strip does not protrude from the surface of the U-shaped groove; preferably, it is flush with the surface of the U-shaped groove, thus exposing the surface of the magnet strip on the surface of the U-shaped groove.

[0018] The probe array 2 is made of a long strip structure of quartz material with good light transmittance. At least one of the ends has sheet-like iron material on its surface. The probe array 2 connects to the frames 12 and 13 by extending its two ends into the U-shaped grooves 11 on the frame 12 and 13 respectively. Simultaneously, since the iron material and the magnet strip 5 are magnetically attracted to each other, the probe array 2 can move along the U-shaped grooves 11 on the mounting frame 1, forming a sliding connection. Multiple probe arrays 2 are distributed between the frames 12 and 13 within the plane of the mounting frame 1, all in the same direction, i.e., all between the frames 12 and 13.

[0019] Multiple probes 3 are distributed along the length of probe row 2. Vertical through holes are opened on probe row 2 to allow probes 3 to pass through vertically. The upper part of probe 3 extends upward and the lower part extends downward from probe row 2. Probes 3 are fixed to probe row 2, thus forming an array of probes on the mounting frame. Probes 3 are generally copper probes.

[0020] The upper parts of each probe 3 on the same probe array 2 are connected in series via a wire 4 to form a conductive path. The wire 4 has flat ends with screw holes at both ends. These flat ends are fixed to the frame 12 and 13 by conductive screws through the screw holes, thus securing the wire 4 to the mounting frame 1. A circuit is formed by connecting the measuring instrument to the conductive screws at both ends of the wire 4. The wire 4 is typically made of copper.

[0021] The adjustable probe testing device of this application is used by placing it above the battery cell, with the lower end of the probe 3 in contact with the electrode pattern on the battery cell, and the wire 4 collecting current to form a circuit. The device collects current, voltage and other signals from the electrodes and transmits them to the measuring instrument through the wire 4.

[0022] By shifting the probe array 2 between frames 12 and 13, or by slightly deflecting it without it falling off, the position of the probe array 2 on the mounting frame 1 can be changed, thereby changing the position of the lower end of the probe 3 on the solar cell. During testing, it is sufficient to ensure that at least one probe forms effective conductivity with the electrode. Selecting multiple probes to form conductivity with the electrode improves the reliability of the connection. The probe array 2 can be flexibly adjusted and selected according to the actual requirements of the electrode pattern of the solar cell, thereby achieving accurate measurement. The same testing device is suitable for solar cells of different sizes and is universal for large-sized solar cells. The iron material at the end of the probe array 2 is attracted to the magnets in frames 12 and 13, which not only keeps the probe array 2 effectively connected to the mounting frame 1 but also facilitates the movement of the probe array 2 within the U-shaped groove 11.

[0023] The length of the wire 4 on the probe row 2 needs to have a margin to accommodate the movement of the probe row without interfering with the probe row and the probe. On the one hand, since the upper part of the probe 3 extends upward from the probe row 2, the length of the wire 4 needs to be greater than the length of the probe row 2 in order to connect and fix it with the frame 12 and 13. That is, the wire 4 forms a diagonal pull section on both sides, thus having a margin. On the other hand, an extra wire length can be reserved appropriately, and different wires 4 can be kept out of tangling.

[0024] The light-transmitting probe array, compared to the conventional metal probe array, does not obstruct the solar cells, thus improving the accuracy of test results under illumination testing conditions.

Claims

1. An adjustable probe testing device for perovskite solar cells, characterized in that: The system includes a mounting frame (1), probe arrays (2), probes (3), and wires (4). Multiple probe arrays (2) are arranged in the same direction within the plane of the mounting frame (1). Both ends of the probe arrays (2) are movably connected to the mounting frame (1). Multiple probes (3) are arranged along the length of the probe arrays (2). The probes (3) are vertically inserted through the probe arrays (2) and fixed thereto. The upper parts of each probe (3) on the same probe array (2) are connected and conductive through a wire (4). Both ends of the wire (4) are fixed to the mounting frame (1). The measuring instrument is connected to both ends of the wire (4) to form a circuit.

2. The adjustable probe testing device for perovskite solar cells according to claim 1, characterized in that: On a set of opposite frames of the mounting frame (1), U-shaped grooves (11) with opposite openings are opened along the length direction of the frame. Magnet strips (5) are embedded in the frame along the length direction of the U-shaped grooves (11). Iron materials are provided at both ends of the probe row (2). The ends of the probe row (2) are inserted into the U-shaped grooves (11), and the iron materials are attracted to the magnet strips (5).

3. The adjustable probe testing device for perovskite solar cells according to claim 1, characterized in that: The probe array (2) is made of quartz.

4. The adjustable probe testing device for perovskite solar cells according to claim 1, characterized in that: The conductor (4) has flat ends with screw holes at both ends. The flat ends are fixed to the mounting frame (1) by passing through the screw holes with conductive screws.

5. The adjustable probe testing device for perovskite solar cells according to claim 1, characterized in that: The length of the conductor (4) has a margin.

6. The adjustable probe testing device for perovskite solar cells according to claim 1, characterized in that: The upper part of the probe (3) extends upward from the probe array (2).

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