A test probe module

Abstract

This utility model discloses a test probe module, including a housing, a test section and a mounting section arranged axially; a plurality of test probes, detachably mounted in the test section and the mounting section, with their two ends extending to the outer sides of the test section and the mounting section respectively; the outer wall of the mounting section is provided with at least one pair of positioning structures to facilitate the installation of the test probe module onto a fixture. Compared with the prior art, the test probe module claimed in this application, through the centrally symmetrically arranged positioning structures, achieves non-directional installation of the module, allowing for rapid alignment with the fixture without distinguishing between front and back directions, significantly reducing the installation error rate, while also reducing the complexity of the fixture's positioning reference and adapting to more types of test fixtures.

Description

Technical Field

[0001] This utility model relates to the field of high-frequency transmission probe device technology, and in particular to a test probe module. Background Technology

[0002] The most commonly used type of MINI FAKRA is the multi-channel (4-channel / 2-channel). In existing test probe connectors, it typically consists of a mounting base, a housing, and probes. The probes are usually first fixed to the base, and then the base and housing are connected by screws.

[0003] Depending on the testing method, probe applications can be categorized into those allowing for larger-scale correction (above 0.5mm) and those allowing only smaller correction (approximately 0.2mm). Each type has its advantages and disadvantages. Larger-scale correction requires less precision in the fixture and offers greater flexibility; however, the large correction range can lead to significant concentricity misalignment at the probe contact point, affecting electrical properties and potentially causing short circuits or false tests. Smaller-scale correction requires higher precision in the fixture, necessitating alignment of the product under test and the test module during insertion and removal.

[0004] Therefore, since the probe and housing are usually connected by threads, vibrations during use can cause the threads to loosen. The conventional structure makes it difficult to detect problems and repairs, greatly increasing maintenance time. If a probe in one channel is damaged, the entire module needs to be replaced, increasing testing costs. Furthermore, common test probe modules are often fastened with screws or simply plugged in and out, lacking clear positioning guidance. During installation, the direction needs to be corrected, and misalignment can easily cause shaking, affecting test consistency. Utility Model Content

[0005] This application provides a test probe module that is easy to install, accurately positioned, and capable of distinguishing between different directions.

[0006] To achieve the above objectives, the technical solution adopted by this utility model is: a test probe module, comprising:

[0007] The housing includes a test section and a mounting section arranged along the axial direction;

[0008] Several test probes are detachably installed in the test section and the mounting section, with their two ends extending to the outside of the test section and the mounting section, respectively.

[0009] The outer wall of the mounting part is provided with at least one pair of positioning structures. The mounting part includes a first side wall and a second side wall that are disposed opposite to each other. The pair of positioning structures are respectively disposed on the first side wall and the second side wall. The positioning structure is a positioning hole. The positioning hole is respectively disposed on the first side wall and the second side wall. The pair of positioning holes are symmetrically arranged with respect to the center of the mounting part, so that the housing can be installed into the fixture in a non-directional manner.

[0010] Furthermore, the first and second sidewalls are respectively provided with protective portions that extend and protrude along the axial direction of the housing, the protective portions being used to ensure the stability of the test probe contact.

[0011] Furthermore, each of the test probes has a wrench engagement portion formed thereon, and the wrench engagement portion is located on the outer periphery of the test probe, corresponding to the inner side of the protective portion.

[0012] Furthermore, the wrench mating part is configured as a polygonal or flat structure that mates with a socket wrench.

[0013] Furthermore, the mounting portion is provided with several guide structures, which are inner cavities or guide grooves extending along the axial direction of the housing, for accommodating and limiting the radial displacement of the test probe.

[0014] Furthermore, the guide structure has a fixing structure inside, which is a groove, buckle, or threaded connection part provided on the inner wall of the guide structure.

[0015] Furthermore, the testing section is provided with a receiving cavity communicating with the guide structure, for accommodating the test probe and connecting it to the device under test.

[0016] Furthermore, the housing is a one-piece molded structure or consists of interconnected testing and mounting parts.

[0017] The beneficial effects of this utility model are as follows:

[0018] Non-directional positioning installation with enhanced adaptability: The centrally symmetrical positioning hole structure enables non-directional installation of the module, allowing for quick alignment with the fixture without distinguishing between front and back directions, significantly reducing the error rate. It also reduces the complexity of the fixture's positioning reference, making it compatible with more types of test fixtures.

[0019] Dual guidance protection significantly improves test stability: The internal guiding structure and the external protective part form a dual constraint: the guiding structure restricts the radial displacement of the probe and ensures the axial alignment of the probe; the protective part provides lateral support during the test pressing process to prevent the probe from shifting laterally, while protecting the probe tip from external force damage, effectively improving the stability of test contact, reducing the probability of poor contact and signal jump, and increasing the test yield to over 99.9%.

[0020] The probes are easy to install and remove, significantly reducing maintenance costs: The base is eliminated, and the wrench fitting on the test probe can be used with a standard socket wrench to achieve quick installation, removal, and torque locking of the probes without the need for special tooling. This greatly shortens the module's maintenance time and avoids damage to the probes during installation and removal, extending the probes' service life.

[0021] High structural strength and long service life: The one-piece molding design of the shell and the reinforced structure of the protective part improve the overall deformation resistance of the module. It can withstand more than one million test pressing cycles. The shell is not easy to warp or deform during long-term use, and the positioning accuracy and guiding performance remain stable. The overall service life of the module is increased by more than 30%. Attached Figure Description

[0022] Figure 1 This is a schematic diagram of the overall structure of the test probe module in an embodiment of this utility model;

[0023] Figure 2 This is an exploded view of the test probe module in an embodiment of the present invention;

[0024] Figure 3 This is a schematic diagram of the cross-sectional structure of the test probe module in an embodiment of this utility model;

[0025] Figure 4 This is a schematic diagram of the structure of the housing in the test probe module in this embodiment of the present invention;

[0026] Figure 5 This is a schematic diagram of the housing in the test probe module from another perspective in an embodiment of this utility model;

[0027] Reference numerals: 1-Housing, 2-Test probe, 10-Test section, 11-Mounting section, 100-Receiving cavity, 110-Positioning structure, 111-Protective section, 112-Guiding structure, 113-First sidewall, 114-Second sidewall, 20-Wrench mating section, 21-Mating threaded section, 22-Elastic telescopic section, 23-First connecting end, 24-Second connecting end. Detailed Implementation

[0028] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0029] Example 1

[0030] like Figures 1-2As shown, this embodiment provides a test probe module, including: a housing 1 and a plurality of test probes 2. The housing 1 is axially divided into a test section 10 and a mounting section 11. The plurality of test probes 2 are detachably installed in the internal channel of the housing 1, with their two ends extending to the outer sides of the test section 10 and the mounting section 11, respectively, to achieve electrical connection between the test piece (not shown in the figure) and the test probe module. The number of test probes 2 can be four or two, and the specific number is not limited. The outer wall of the mounting section 11 is provided with a pair of positioning structures to facilitate the quick and accurate installation of the test probe module onto the test fixture. Specifically, the mounting section 11 includes a first sidewall 113 and a second sidewall 114 disposed opposite to each other, and a pair of positioning structures 110 are symmetrically disposed on the first sidewall 113 and the second sidewall 114, respectively.

[0031] In this embodiment, as Figures 3-4 As shown, the positioning structure 110 is configured as positioning holes, which are respectively located on the first side wall 113 and the second side wall 114, and are symmetrically arranged at 180° with respect to the central axis of the housing 1. During actual installation, the test fixture is equipped with positioning pins that mate with the positioning holes. Due to the symmetrical distribution of the two positioning holes, the housing 1 can rotate 180° around the axis and still precisely engage with the positioning pins, achieving directionless installation without the need for manual judgment of the installation direction. This effectively avoids problems such as reverse installation and misalignment, while also reducing the complexity of the fixture's positioning reference.

[0032] The first sidewall 113 and the second sidewall 114 are respectively provided with protective portions 111 extending and protruding along the length direction. The protective portion 111 is a boss structure extending along the axial direction of the housing 1. Its end face maintains a certain preset distance from the end face of the test probe 2. It can provide lateral support for the probe during the test pressing process and limit the radial displacement of the probe. At the same time, the protective portion 111 can form a physical barrier to prevent the probe from directly contacting external hard objects, prevent bumps and contamination, and ensure the stability of the test probe contact.

[0033] Continue to refer to Figure 4 The mounting section 11 contains several guide structures 112. Each guide structure 112 is an inner cavity or guide groove extending axially along the housing 1, used to accommodate and restrict the radial displacement of the test probe 2. The guide structure 112 has a fixing structure inside, which is a slot, snap-fit, or threaded connection on the inner wall of the guide structure 112. This fixing structure can cooperate with the snap-fit ​​locking mechanism on the fixture to achieve quick fixing and disassembly of the module. No additional tools are required during the assembly and disassembly process, making operation convenient. The inner diameter of the guide structure 112 is clearance-fitted with the outer diameter of the test probe 2 (e.g., a single-sided clearance of 0.02mm) to accommodate and restrict the radial displacement of the test probe 2, ensuring that the test probe 2 remains axially aligned during installation and testing, avoiding the risk of poor contact or short circuit due to misalignment.

[0034] like Figure 5 As shown, the test section 10 has a receiving cavity 100 that communicates with the guide structure 112. The inner diameter of the receiving cavity 100 is larger than that of the guide structure 112, forming a floating space for the probe test end. This space is used to accommodate the test probe 2 and make it elastically contact the test end of the test piece. At the same time, it provides guidance for the elastic compression of the test probe 2 and prevents the probe from bending during test pressing.

[0035] The overall structure of test probe 2 is as follows Figure 2 As shown, a wrench mating part 20 is formed in the middle of the test probe 2, and the wrench mating part 20 is arranged along the axial direction of the test probe 2, corresponding to the inner side of the protective part 111. In this embodiment, the wrench mating part 20 has a hexagonal structure, which can be mated with a standard socket wrench, facilitating the quick installation, disassembly, and torque tightening of the probe using standard tools, eliminating the need for special tooling and greatly improving maintenance efficiency. During actual assembly, the operator can directly apply torque to the probe using a socket wrench to ensure a firm connection between the probe and the housing, avoiding poor contact caused by probe loosening during testing.

[0036] In addition to the wrench-fitting part 20, the test probe 2 also includes a second connecting end 24, a mating threaded part 21, an elastic telescopic part 22, and a first connecting end 23 arranged sequentially along the axial direction. Each part is a coaxial or parallel integral structure: the second connecting end 24 is the lowest lead-out end of the test probe 2, which can be inserted into the PCB board or other corresponding sockets; the mating threaded part 21 is the external threaded section above the wrench-fitting part 20, which adopts a threaded structure. This external thread can be screwed into the threaded connection part on the inner wall of the guide structure 112 to achieve axial locking between the test probe 2 and the mounting part 11; at the same time, the axial position of the test probe 2 can be finely adjusted by adjusting the thread engagement depth to adapt to different test stroke requirements; the elastic telescopic part 22 is the elastic section above the mating threaded part 21, which is formed by an independent helical spring metal part. It can ensure the consistency of the contact pressure of the test probe 2, and at the same time absorb the dimensional tolerances and installation errors of the test piece, avoiding the problem of loose connection. The first connection end 23 is the upper contact end of the elastic telescopic part 22. It is a contact terminal structure with a hemispherical contact at the top of the terminal, which can directly contact the pins or contacts of the device under test.

[0037] In this embodiment, the shell 1 is a one-piece molded structure, which is formed in one step by injection molding process, which can ensure the overall strength and coaxiality of the shell and avoid the assembly errors caused by the split structure.

[0038] Example 2

[0039] The difference between this embodiment and Embodiment 1 is as follows: the housing 1 is a split structure, assembled by ultrasonic welding of the interconnected test part 10 and the mounting part 11, which facilitates the processing and maintenance of the internal guide structure; the positioning structure 110 adopts a positioning boss set on the first side wall 113 and the second side wall 114, which cooperates with the positioning groove on the fixture, and can also achieve installation without direction distinction; the wrench mating part 20 is a flat structure, which can be used with an open wrench, and is suitable for installation scenarios with limited space; the fixing structure is a threaded connection part, which locks the module to the fixture with screws, and is suitable for test scenarios with high installation strength requirements; the rest of the structure is the same as that in Embodiment 1, and will not be described again here.

[0040] Example 3

[0041] The difference between this embodiment and Embodiment 1 is that the guide structure 112 inside the mounting part 11 is a stepped inner cavity, with a slightly larger inner diameter at the end near the testing part 10, forming a guide step to further improve the axial alignment accuracy of the probe; the end face of the protection part 111 is provided with an avoidance groove corresponding to the probe arrangement, which can avoid interference with the non-test area of ​​the test piece and adapt to higher density probe arrangement scenarios; the rest of the structure is the same as in Embodiment 1, and will not be described again here.

[0042] Verification of the beneficial effects of the embodiments: Through the structural optimization of the above embodiments, this application has achieved the following technical effects: the non-directional positioning structure improves the installation efficiency of the module; the dual-guide protection structure reduces the radial offset of the probe, reduces the contact failure rate, and improves the test stability; the standard wrench matching structure shortens the probe disassembly and assembly time, eliminates the need for special tooling, and reduces maintenance costs; the one-piece molded shell and reinforced protection structure enable the module to withstand more than one million test pressing cycles, extending its service life.

[0043] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0044] In the description of this application, unless otherwise expressly specified and limited, the terms "connected" and "linked" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a direct connection or an indirect connection through an intermediate medium. Those skilled in the art can understand the meaning of the above terms in this application according to the specific circumstances.

[0045] In the description of this embodiment, the terms "upper," "lower," "front," and "rear," etc., refer to the orientation or positional relationship shown in the accompanying drawings. They are used only for ease of description and simplification of operation, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this application. The terms "first" and "second" are used only for distinction in description and have no special meaning.

[0046] The embodiments described above are merely illustrative of the implementation methods of this application, and while the descriptions are specific and detailed, they should not be construed as limiting the scope of protection of this application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these modifications and improvements all fall within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the appended claims.

Claims

1. A test probe module, characterized by, include: The housing includes a test section and a mounting section arranged along the axial direction; Several test probes are detachably installed in the test section and the mounting section, with their two ends extending to the outside of the test section and the mounting section, respectively; The outer wall of the mounting part is provided with at least one pair of positioning structures. The mounting part includes a first side wall and a second side wall that are disposed opposite to each other. The pair of positioning structures are respectively disposed on the first side wall and the second side wall. The positioning structure is a positioning hole. The positioning hole is respectively disposed on the first side wall and the second side wall. The pair of positioning holes are symmetrically arranged with respect to the center of the mounting part, so that the housing can be installed into the fixture in a non-directional manner.

2. The test probe module of claim 1, wherein, The first and second sidewalls are respectively provided with protective portions that extend and protrude along the axial direction of the housing, and the protective portions are used to ensure the stability of the test probe contact.

3. The test probe module of claim 2, wherein, Each of the test probes has a wrench engagement portion, which is located on the outer periphery of the test probe, corresponding to the inner side of the protective portion.

4. The test probe module of claim 3, wherein, The wrench mating part is configured as a polygonal or flat structure that mates with a socket wrench.

5. The test probe module of claim 1, wherein, The mounting section is provided with several guide structures, which are inner cavities or guide grooves extending along the axial direction of the housing, used to accommodate and limit the radial displacement of the test probe.

6. The test probe module of claim 5, wherein, The guide structure has a fixing structure inside, which is a groove, buckle or threaded connection part set in the inner wall of the guide structure.

7. The test probe module of claim 6, wherein, The test section has a receiving cavity that communicates with the guide structure, which is used to receive the test probe and connect it to the device under test.

8. The test probe module of claim 1, wherein, The housing is either a one-piece molded structure or consists of interconnected testing and mounting sections.

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