External line fault detection apparatus for service board and test machine

Abstract

The application relates to an external line fault detection device of a service board card and a testing machine. The external line fault detection device comprises an external detection line, a target point of a connecting cable, the connecting cable being connected between the service board card and a device to be detected, a voltage acquisition circuit connected with the external detection line, which acquires a voltage signal transmitted by the external detection line and outputs voltage data, and a voltage processing circuit connected with the voltage acquisition circuit, which receives the voltage data and outputs reference data for external line fault detection. In combination with the reference data, the external line can be detected for faults, the external line fault of the service board card is avoided to affect the test, and the test reliability is improved.

Description

Technical Field

[0001] This application relates to the field of semiconductor testing technology, and in particular to an external circuit fault detection device and testing machine for a business board. Background Technology

[0002] With the rapid development of the domestic integrated circuit industry, the types and functions of chips are becoming more and more abundant. However, at the same time, higher requirements are being placed on chip testing, such as the power supply accuracy of chips. The power supply of chips has higher requirements for the accuracy of voltage and current, which puts forward higher requirements for the signal acquisition circuit of the business board, as well as higher requirements for protection chips.

[0003] Traditional business boards use detection circuits at their output ports to acquire data and regulate signals to ensure that the voltage and current output from the output ports meet the requirements. However, if there is a fault in the external wiring between the board's output port and the device under test (DUT), it will still affect the test, resulting in low test reliability. Utility Model Content

[0004] Therefore, it is necessary to provide an external circuit fault detection device and tester for service boards that can improve test reliability in response to the above problems.

[0005] The first aspect of this application provides an external line fault detection device for a service board, comprising:

[0006] External test line, target point for connecting cable; the cable connects the service board and the device under test;

[0007] A voltage acquisition circuit is connected to the external detection line, acquires the voltage signal transmitted by the external detection line, and outputs voltage data.

[0008] A voltage processing circuit, connected to the voltage acquisition circuit, receives the voltage data and outputs reference data for external line fault detection.

[0009] In one embodiment, the external detection line includes a first detection line and a second detection line, wherein a first end of the first detection line is connected to the HS line in the cable, a second end of the first detection line is connected to the voltage acquisition circuit, and a second end of the second detection line is connected to the voltage acquisition circuit.

[0010] The first end of the second detection line is connected to the second end of the HF line in the cable, and the second end of the HF line is connected to the first end of the device under test; or, the first end of the second detection line is connected to the first end of the HF line in the cable, and the first end of the HF line is connected to the service board; or, the first end of the second detection line is connected to the LS line in the cable.

[0011] In one embodiment, the voltage acquisition circuit includes an amplifier and a switch K2. The first input terminal of the amplifier is connected to the second terminal of the first detection line, the second input terminal of the amplifier is connected to the second terminal of the second detection line through the switch K2, and the output terminal of the amplifier is connected to the voltage processing circuit.

[0012] In one embodiment, the voltage acquisition circuit further includes a switch K1, and the second input terminal of the amplifier is also connected to the LS line in the cable via the switch K1.

[0013] In one embodiment, the voltage processing circuit includes an ADC driver, an ADC, and a processor, wherein the ADC driver is connected to the voltage acquisition circuit and the ADC, and the ADC is connected to the processor.

[0014] In one embodiment, the voltage processing circuit includes a comparator, a voltage reference source, and a processor, wherein the comparator is connected to the voltage acquisition circuit and the voltage reference source, and the processor is connected to the comparator and the voltage reference source.

[0015] In one embodiment, the external detection line connects the first ends of the HS line and the HF line in the cable, the first end of the HF line is connected to the service board, and the voltage processing circuit performs external line impedance attenuation detection based on the received voltage data.

[0016] In one embodiment, the external detection line connects the second ends of the HS line and the HF line in the cable, the second end of the HF line is connected to the first end of the device under test, and the voltage processing circuit performs external line glitch detection based on the received voltage data.

[0017] In one embodiment, the external detection line is connected to the HS line and LS line in the cable, and the voltage processing circuit performs external short circuit detection and / or external open circuit detection based on the received voltage data.

[0018] A second aspect of this application provides a test machine, including a service board, cables, and the aforementioned external line fault detection device.

[0019] In one embodiment, the cable includes an HF line, an HS line, an LF line, and an LS line for connecting the service board. The HF line and the HS line are also used to connect to a first end of the device under test, and the LF line and the LS line are also used to connect to a second end of the device under test.

[0020] The aforementioned external line fault detection device and tester for the service board are connected by cables between the service board and the device under test (DUT). The external detection line connects the target point of the cable to the voltage acquisition circuit, and the voltage processing circuit connects to the voltage acquisition circuit. The voltage acquisition circuit acquires the voltage signal transmitted from the external detection line and outputs voltage data. The voltage processing circuit receives the voltage data and outputs reference data for external line fault detection. By combining the reference data, external line faults can be detected, preventing external line faults on the service board from affecting the test and improving test reliability. Attached Figure Description

[0021] Figure 1 This is a structural block diagram of an external line fault detection device in one embodiment;

[0022] Figure 2 This is a schematic diagram of the structure of an external line fault detection device in one embodiment;

[0023] Figure 3 This is a schematic diagram of the external line fault detection device in another embodiment;

[0024] Figure 4 This is a schematic diagram of the impedance attenuation detection principle of an external line fault detection device in one embodiment;

[0025] Figure 5 This is a schematic diagram of the external short-circuit / open-circuit detection principle of an external line fault detection device in one embodiment;

[0026] Figure 6 This is a schematic diagram of the external line burr detection principle of an external line fault detection device in one embodiment;

[0027] Figure 7 This is a schematic diagram of the external line burr detection principle of the external line fault detection device in another embodiment. Detailed Implementation

[0028] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application.

[0029] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the application.

[0030] It is understood that the term "connection" in the following embodiments should be understood as "electrical connection," "communication connection," etc., if the connected circuits, modules, units, etc., have electrical signal or data transmission with each other.

[0031] When used herein, the singular forms of “a,” “an,” and “the” may also include the plural forms unless the context clearly indicates otherwise. It should also be understood that the terms “comprising,” “including,” or “having,” etc., specify the presence of the stated feature, whole, operation, component, part, or combination thereof, but do not preclude the possibility of the presence or addition of one or more other features, wholes, operations, components, parts, or combinations thereof.

[0032] In one embodiment, such as Figure 1 As shown, an external line fault detection device for a service board is provided, including an external detection line, a voltage acquisition circuit 110, and a voltage processing circuit 120. The external detection line connects to the target point of the cable, and the cable connects the service board and the device under test (DUT). The voltage acquisition circuit 110 is connected to the external detection line, acquires the voltage signal transmitted by the external detection line, and outputs voltage data. The voltage processing circuit 120 is connected to the voltage acquisition circuit 110, receives the voltage data, and outputs reference data for external line fault detection.

[0033] The service board can include, but is not limited to, test boards such as VI source boards, FVI source boards, or digital boards, and the device under test (DUT) can be an electronic device such as a chip that needs to be tested. The cable includes HF (H_FORCE) lines, HS (H_SENSE) lines, LF (L_FORCE) lines, and LS (L_SENSE) lines connecting to the service board. The HF and HS lines are also used to connect to the first terminal of the DUT, and the LF and LS lines are used to connect to the second terminal of the DUT. External line fault detection can specifically include at least one of impedance attenuation detection, glitch detection, short circuit detection, and external open circuit detection. Depending on the type of external line fault detection, the connection method of the external detection lines will vary, and the reference data output by the voltage processing circuit 120 will also vary accordingly. For example, the external detection lines connect to the first terminals of the HS and HF lines in the cable, the first terminal of the HF line is connected to the service board, and the voltage processing circuit 120 performs external line impedance attenuation detection based on the received voltage data. Alternatively, the external detection line connects to the second ends of the HS and HF lines in the cable, with the second end of the HF line connected to the first end of the device under test (DUT). The voltage processing circuit 120 performs external line glitch detection based on the received voltage data. Or, the external detection line connects to the HS and LS lines in the cable, and the voltage processing circuit 120 performs external short-circuit detection and / or external open-circuit detection based on the received voltage data.

[0034] The voltage processing circuit 120 can output reference data to external analysis equipment or display it on a monitor for analysis by the equipment or manual judgment by testing personnel to determine whether there is an external line fault. Alternatively, it can output the reference data to a host computer via a bus for detection and judgment of external line faults. Furthermore, the voltage processing circuit 120 can perform comparative analysis based on the reference data to directly obtain fault detection results for testing personnel to review.

[0035] Specifically, the exact location of the target point will vary depending on the type of external line fault detection. For example... Figure 2 As shown, taking the transmission line resistance on the HF line as an example, the points on both sides of the transmission line resistance are respectively designated as the first and second ends of the HF line. The first end of the HF line is connected to the service board, and the second end of the HF line is connected to the device under test (DUT). When performing impedance attenuation detection, the first end of the HF line can be used as the target point (E_SENSE point). The external detection line is connected to the first end of the HF line and the HS line. The voltage acquisition circuit 110 detects the voltage difference between the first end of the HF line and the HS line, and transmits it as voltage data to the voltage processing circuit 120. The voltage processing circuit 120 processes the voltage difference to obtain the transmission line resistance as reference data for external line fault detection. Based on the transmission impedance, it can be determined whether an impedance attenuation fault exists.

[0036] like Figure 2 As shown, the HF, HS, LF, and LS lines are all connected to the output port POGO of the service board. The HF and HS lines are also connected to the first terminal of the device under test (DUT), and the LF and LS lines are also connected to the second terminal of the DUT. Resistor R1 is the equivalent resistance of the DUT. The output port POGO of the service board supplies power to the DUT through a power supply loop formed by the HF and LF lines, and forms an internal detection loop through the HS and LS lines. The HF and HS lines, and the LF and LS lines are connected at both ends of the DUT to detect the supply voltage from the service board to the DUT. Faults can be detected by adjusting the E_SENSE point.

[0037] In one embodiment, the external detection lines include a first detection line and a second detection line (ES line). The first end of the first detection line is connected to the HS line in the cable, and the second end of the first detection line is connected to the voltage acquisition circuit 110. The second end of the second detection line ES is fixedly connected to the voltage acquisition circuit 110. Depending on the type of external line fault detection, the first end of the second detection line ES can have different connection methods, falling into three categories: First, the first end of the second detection line ES is connected to the second end of the HF line in the cable, and the second end of the HF line is connected to the first end of the device under test (DUT); Second, the first end of the second detection line ES is connected to the first end of the HF line in the cable, and the second end of the HF line is connected to the service board; Third, the first end of the second detection line ES is connected to the LS line in the cable. Specifically, the first end of the first detection line is connected to the HS line near the first end of the DUT. The first and second detection lines transmit voltage to the voltage acquisition circuit 110, which then acquires the required voltage data and sends it to the voltage processing circuit 120.

[0038] The voltage acquisition circuit 110 includes an amplifier 112 and a switch K2. The first input terminal of the amplifier 112 is connected to the second terminal of the first detection line, and the second input terminal of the amplifier 112 is connected to the second terminal of the second detection line via switch K2. The output terminal of the amplifier 112 is connected to the voltage processing circuit 120. When external line fault detection is required, switch K2 is closed, the position of the first terminal of the second detection line is adjusted, and voltage detection is performed on the corresponding target point. The voltage data is then output by the voltage acquisition circuit 110 and sent to the voltage processing circuit 120. Switch K2 can be a relay or other control switch, and the amplifier 112 can be, but is not limited to, an instrumentation amplifier. A resistor R2 exists between the two input terminals of the amplifier 112 to improve the frequency response and increase the stability of the amplifier.

[0039] In addition, the voltage acquisition circuit 110 may also include a switch K1, and the second input terminal of the amplifier 112 is also connected to the LS line of the cable via the switch K1. Specifically, the switch K1 is connected to the second terminal of the LS line near the device under test (DUT). When internal circuit calibration is required (i.e., when calibrating the subsequent voltage acquisition circuit and voltage processing circuit), the switch K1 is closed, and calibration is performed through the calibration circuit inside the service board, and the calibration data is saved. The switch K1 can also be a relay or other control switch.

[0040] Specifically, during internal line calibration, switch K1 is closed and switch K2 is closed. The voltage is output through the POGO terminal of the service board to collect the voltage of the first detection line and the line where switch K1 is located (i.e., the voltage of the HS line and the LS line). The collected voltage is compared with the output voltage, the difference is normalized to obtain calibration data, and finally, the calibration data is stored. During external line fault detection, switch K1 is closed and switch K2 is closed. The position of the first end of the second detection line ES is adjusted to detect the voltage at the target point, and the data is analyzed to obtain reference data for external line fault detection.

[0041] In one embodiment, continue to refer to Figure 2 The voltage processing circuit 120 includes an ADC driver 121, an ADC (analog-to-digital converter) 122, and a processor 123. The ADC driver 121 is connected to the voltage acquisition circuit 110 and the ADC 122, and the ADC 122 is connected to the processor 123. Specifically, the ADC driver 121 is connected to the amplifier 112 in the voltage acquisition circuit 110, and the processor 123 can be a processing chip such as an FPGA, MCU, or CPU.

[0042] Specifically, amplifier 112 acquires the voltage difference between the voltage at point E_SENSE and the reference voltage (voltage value of the HS line). The acquired voltage difference is converted into a differential signal by ADC driver 121 and transmitted to ADC 122. ADC 122 converts the analog voltage signal into a digital signal and transmits it to processor 123 for data processing. Processor 123 directly processes the voltage signal sent by ADC 122, comparing the acquired voltage with a voltage threshold range. If the voltage is within the threshold range, no fault occurs; otherwise, a fault is determined to have occurred.

[0043] Current test equipment lacks a fault detection solution beyond the POGO output of the service board. It can only roughly judge external faults through the internal loop of the service board, and cannot make accurate judgments. Moreover, the internal detection is used for loop response and cannot be used specifically for fault detection. This application provides a fault detection solution specifically for the POGO output of the service board. In addition, since the internal loop bandwidth of the service board is limited, it is impossible to detect glitches and noise with excessive bandwidth. In this application, a high-bandwidth instrumentation amplifier and ADC can be selected to avoid the bandwidth limitation and enable fault detection with ultra-high bandwidth.

[0044] In another embodiment, such as Figure 3As shown, the voltage processing circuit 120 includes a comparator 124, a voltage reference source 125, and a processor 126. The comparator 124 is connected to the voltage acquisition circuit 110 and the voltage reference source 125, and the processor 126 is connected to the comparator 124 and the voltage reference source 125. Specifically, the comparator 124 is connected to the amplifier 112 in the voltage acquisition circuit 110. The processor 126 can be a processing chip such as an FPGA, MCU, or CPU. The processor 126 outputs a control signal (Control) to control the reference voltage source to set the comparison voltage. The voltage reference source 125 outputs a comparison voltage V to the comparator 124. The comparator 124 compares the voltage data output by the amplifier 112 with the comparison voltage V and outputs the comparison result to the processor 126.

[0045] During testing, there are usually accuracy requirements for the input voltage of the device under test (DUT). For example, if a voltage V requires an accuracy of 5%, then the voltage range is from V×0.95 to V×1.05. The processor 126 can set the comparison voltage according to this voltage range (for example, to detect glitches, values ​​exceeding V×1.05 are considered glitches, so the comparison voltage is set to V×1.05). The voltage value acquired by the amplifier 112 is then compared with the comparison voltage via the comparator 124. The processor 126 determines whether a fault exists based on the comparison result of the comparator 124.

[0046] The aforementioned external line fault detection device, by adding an external detection line, allows for the selection of target points according to needs, enabling rapid detection and response of critical components. Using the external detection line (specifically the ES line) in conjunction with the HF line functions like a multimeter, providing flexible fault detection with a wide detection bandwidth range, not limited by the loop bandwidth of the internal detection link, effectively meeting customer requirements.

[0047] External line fault detection devices can be used to detect the line impedance of service boards in the output loop. For example... Figure 4 As shown, the impedance of the red segment in the detection line is measured. The E_SENSE point is moved to the beginning of the red detection line, and the voltage difference between the E_SENSE point and the HS line is detected by amplifier 112. Then, the ADC 122 performs digital-to-analog conversion and transmits the data to processor 123. Processor 123 divides the voltage difference by the current value I to obtain the impedance of this segment of the line. The line impedance can also be used to determine whether there is a fault. It should be noted that... Figure 4 Medium voltage processing circuits can also use, for example Figure 3 The comparator 124, voltage reference source 125, and processor 126 shown can also calculate impedance and determine whether the line impedance is faulty.

[0048] External line fault detection devices can be used to detect short-circuit and open-circuit faults on service boards at the device under test (DUT) terminals. For example... Figure 5 As shown, to detect short-circuit and open-circuit faults in the device under test (DUT) within the red box, the E_SENSE point is moved to the LS line (specifically connected to the second end of the LS line closest to the DUT). The voltage difference between the E_SENSE point and the HS line is detected by amplifier 112. After digital-to-analog conversion by ADC 122, the current acquired voltage value is transmitted to processor 123. Processor 123 compares the current acquired voltage value with 0V. If the acquired voltage value equals 0V, the DUT is short-circuited. Processor 123 also compares the current acquired voltage value with the POGO output voltage. If the current acquired voltage value equals the POGO output voltage, the DUT is open-circuited. It should be noted that... Figure 5 Medium voltage processing circuits can also use, for example Figure 3 The comparator 124, voltage reference 125, and processor 126 shown are used to determine the short circuit and open circuit fault conditions at the device under test (DUT) terminals. The voltage reference outputs a comparison voltage of 0V.

[0049] External line fault detection devices can be used to detect burrs in external lines. For example... Figure 6 As shown, to detect the voltage in the red-marked line (from the red starting point to the first terminal of the device under test (DUT), an E_SENSE point is added at the red starting point. Switch K2 is closed, connecting the ES line. Based on the voltage at E_SENSE point, amplifier 112 detects the voltage difference between the HS point and E_SENSE point. This voltage difference is output to ADC 122 via ADC driver 121. ADC 122 performs analog-to-digital conversion on the voltage difference and outputs the voltage difference value to processor 123. Processor 123 analyzes the voltage difference value; if the voltage at HS point exceeds the voltage value at E_SENSE point, a glitch has occurred in the red-marked line. In other embodiments, such as... Figure 7 As shown, the comparison voltage V can also be set by the voltage reference source 125. The comparator 124 compares the voltage difference output by the amplifier 112 with the comparison voltage V. The processor 126 determines whether a glitch is generated in the red-marked line based on the return value of the comparator 124.

[0050] In one embodiment, a test machine is also provided, including a service board, cables, and the aforementioned external line fault detection device. The cables include HF, HS, LF, and LS lines for connecting the service board. The HF and HS lines are also used to connect to the first terminal of the device under test (DUT), and the LF and LS lines are also used to connect to the second terminal of the DUT.

[0051] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0052] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the utility model patent. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this patent application should be determined by the appended claims.

Claims

1. An external line fault detection device for a service board, characterized in that, include: External detection line, target location for connecting cables; The cable connects the service board and the device under test; A voltage acquisition circuit is connected to the external detection line, acquires the voltage signal transmitted by the external detection line, and outputs voltage data. A voltage processing circuit, connected to the voltage acquisition circuit, receives the voltage data and outputs reference data for external line fault detection.

2. The apparatus according to claim 1, characterized in that, The external detection line includes a first detection line and a second detection line. The first end of the first detection line is connected to the HS line in the cable, and the second end of the first detection line is connected to the voltage acquisition circuit. The second end of the second detection line is also connected to the voltage acquisition circuit. The first end of the second detection line is connected to the second end of the HF line in the cable, and the second end of the HF line is connected to the first end of the device under test; or, the first end of the second detection line is connected to the first end of the HF line in the cable, and the first end of the HF line is connected to the service board; or, the first end of the second detection line is connected to the LS line in the cable.

3. The apparatus according to claim 2, characterized in that, The voltage acquisition circuit includes an amplifier and a switch K2. The first input terminal of the amplifier is connected to the second terminal of the first detection line, the second input terminal of the amplifier is connected to the second terminal of the second detection line through the switch K2, and the output terminal of the amplifier is connected to the voltage processing circuit.

4. The apparatus according to claim 3, characterized in that, The voltage acquisition circuit also includes a switch K1, and the second input terminal of the amplifier is also connected to the LS line in the cable through the switch K1.

5. The apparatus according to claim 1, characterized in that, The voltage processing circuit includes an ADC driver, an ADC, and a processor. The ADC driver is connected to the voltage acquisition circuit and the ADC, and the ADC is connected to the processor.

6. The apparatus according to claim 1, characterized in that, The voltage processing circuit includes a comparator, a voltage reference source, and a processor. The comparator is connected to the voltage acquisition circuit and the voltage reference source, and the processor is connected to the comparator and the voltage reference source.

7. The apparatus according to any one of claims 1 to 6, characterized in that, The external detection line connects the first ends of the HS line and the HF line in the cable. The first end of the HF line is connected to the service board. The voltage processing circuit performs external line impedance attenuation detection based on the received voltage data.

8. The apparatus according to any one of claims 1 to 6, characterized in that, The external detection line connects the second ends of the HS line and HF line in the cable. The second end of the HF line is connected to the first end of the device under test. The voltage processing circuit performs external line glitch detection based on the received voltage data.

9. The apparatus according to any one of claims 1 to 6, characterized in that, The external detection line connects the HS line and LS line in the cable, and the voltage processing circuit performs external short circuit detection and / or external open circuit detection based on the received voltage data.

10. A testing machine, characterized in that, Includes service boards, cables, and the external line fault detection device as described in any one of claims 1 to 9.

11. The testing machine according to claim 10, characterized in that, The cable includes an HF line, an HS line, an LF line, and an LS line that connect to the service board. The HF line and the HS line are also used to connect to the first end of the device under test, and the LF line and the LS line are also used to connect to the second end of the device under test.

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