A 2.5d package chip testing device with multi-light source synchronous coupling

Abstract

The utility model discloses a 2.5D packaging chip testing arrangement of multi -light source synchronization coupling relates to testing arrangement technical field, including frame body, lighting unit, camera group and push part, lighting unit includes lighting part, the limiting part for clamping lighting part and the drive part for driving lighting part rotation, and lighting part includes arc lamp stand and the lighting lamp of arrangement on arc lamp stand, and limiting part includes two groups of rotary chuck wheel that set up about vertical board center axis symmetry, and two groups of rotary chuck wheel support lamp stand, the rotation of arc lamp stand is realized lighting lamp multi -angle switching with the help of drive part, and the cooperation camera group captures the chip image under different illumination, can high -efficiently identify shallow scratch, and the overall improvement chip test's accuracy, comprehensiveness and reliability.

Description

Technical Field

[0001] This utility model relates to the field of testing device technology, and in particular to a 2.5D packaged chip testing device with multi-light source synchronous coupling. Background Technology

[0002] In the manufacturing process of 2.5D packaged chips, the surface quality of the chip is a key factor affecting its performance and reliability. In particular, minute defects such as shallow scratches on the surface, if not detected in time, may lead to problems such as short circuits and abnormal signal transmission during subsequent use, seriously affecting the lifespan of the chip and the normal operation of the equipment.

[0003] In the chip production and testing process, a camera team continuously photographs the chips during transport. Testers analyze the captured images to determine whether there are scratches on the chip surface. Deep scratches on the chip surface are relatively easy to capture and identify by the camera team because of their prominent features. However, for shallow scratches, due to their fine traces, it is often difficult to form obvious optical contrast under normal lighting conditions. Especially in the reflective areas of the chip surface, light reflection will further mask the features of shallow scratches, making it difficult for the camera team to capture them accurately and easily leading to missed detections.

[0004] To address these issues, this invention proposes a 2.5D packaged chip testing device with multi-source synchronous coupling to solve the aforementioned problems. Utility Model Content

[0005] In view of the problems existing in the prior art, this utility model is proposed.

[0006] To solve the above-mentioned technical problems, the present invention provides the following technical solution: a 2.5D packaged chip testing device with multi-light source synchronous coupling, which includes a frame body, including a horizontally placed base plate and a vertical plate arranged on the base plate;

[0007] A lighting unit includes a lighting component, a limiting component for engaging the lighting component, and a driving component for driving the lighting component to rotate. The lighting component includes an arc-shaped lamp holder and lighting lamps arranged on the arc-shaped lamp holder. The limiting component includes two sets of rotating locking wheels symmetrically arranged about the central axis of the upright plate. The two sets of rotating locking wheels support the arc-shaped lamp holder.

[0008] The camera group consists of two groups, which are symmetrically arranged on both sides of the upright plate and close to the curved light frame.

[0009] The pushing component includes a pushing platform and a lifting frame, wherein the pushing platform is mounted on the top of the lifting frame.

[0010] Preferably, the driving component includes a motor mounting plate installed on the side of the upright plate away from the arc-shaped lamp holder, a rotary motor mounted on the motor mounting plate, and two drive wheels rotatably assembled on the same side of the upright plate and the motor mounting plate. The surfaces of the two drive wheels are fitted with drive chains, and the drive end of the rotary motor is connected to one of the drive wheels.

[0011] Preferably, the driving component further includes two linkage wheels installed on the same side of the upright plate as the rotary positioning wheel. The two linkage wheels correspond to the positions of the two driving wheels, and the wheel body of the driving wheel passes through the upright plate and is connected to the linkage wheels.

[0012] Preferably, a central wheel is also provided between the two sets of linkage wheels, and a drive belt is connected between the central wheel and the two linkage wheels. The two linkage wheels are driven to press against the side of the arc-shaped lamp holder away from the lighting lamp.

[0013] Preferably, the rotary positioning wheel is vertically mounted on the reference column on the upright plate and a circular chuck that rotates on the reference column. The circular chuck has an annular groove, and the width of the annular groove is the same as the width of the arc-shaped lamp holder.

[0014] Preferably, the lifting frame includes an L-shaped base plate mounted on the base plate, two transverse locking plates bolted to the L-shaped base plate, and a cylinder locked by the two sets of transverse locking plates. The cylinder is arranged vertically, and a pusher is mounted on the top of the cylinder.

[0015] Preferably, the push platform is spaced apart from the arc-shaped lamp holder.

[0016] The beneficial effects of this utility model are as follows: This utility model uses a driving component to rotate an arc-shaped lamp holder to achieve multi-angle switching of the lighting lamp. Combined with a camera group to capture chip images under different lighting conditions, it can efficiently identify shallow scratches and improve the accuracy, comprehensiveness and reliability of chip testing as a whole. Attached Figure Description

[0017] To more clearly illustrate the technical solutions of the embodiments of this utility model, the drawings used in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0018] Figure 1 This is a top front view of the 2.5D packaged chip testing device of this utility model;

[0019] Figure 2 This is a top view of the reverse side of the 2.5D packaged chip testing device of this utility model;

[0020] Figure 3 This is a front isometric view of the 2.5D packaged chip testing device of this utility model;

[0021] Figure 4 In this utility model Figure 3 Enlarged view of the structure at point A.

[0022] The attached figures are labeled as follows: 100, frame; 101, base plate; 102, upright plate; 200, lighting unit; 211, curved lamp holder; 212, lighting lamp; 221, motor mounting plate; 222, rotary motor; 223, drive wheel; 224, drive chain; 225, linkage wheel; 226, center wheel; 2261, wheel base; 227, drive belt; 231, reference column; 232, circular chuck; 233, annular groove; 300, camera assembly; 400, pushing component; 411, L-shaped base plate; 412, transverse locking plate; 413, cylinder; 422, pushing platform. Detailed Implementation

[0023] To make the above-mentioned objectives, features and advantages of this utility model more apparent and understandable, the specific embodiments of this utility model will be described in detail below with reference to the accompanying drawings.

[0024] Many specific details are set forth in the following description in order to provide a full understanding of the present invention. However, the present invention may also be implemented in other ways different from those described herein. Those skilled in the art can make similar extensions without departing from the spirit of the present invention. Therefore, the present invention is not limited to the specific embodiments disclosed below.

[0025] Secondly, the term "an embodiment" or "embodiment" as used herein refers to a specific feature, structure, or characteristic that may be included in at least one implementation of the present invention. The phrase "in one embodiment" appearing in different places in this specification does not necessarily refer to the same embodiment, nor is it a single or selective embodiment that excludes other embodiments.

[0026] Reference Figures 1-4 As shown, a multi-light source synchronously coupled 2.5D packaged chip testing device includes:

[0027] The frame 100 includes a horizontally placed base plate 101 and a vertically arranged upright plate 102 on the base plate 101. The side of the base plate 101 facing away from the upright plate 102 is provided with no less than four sets of feet, through which the frame 100 is installed on the plane.

[0028] The lighting unit 200 includes a lighting component, a limiting component for engaging the lighting component, and a driving component for driving the lighting component to rotate. The lighting component includes an arc-shaped lamp holder 211 and lighting lamps 212 arranged on the arc-shaped lamp holder 211. The limiting component includes two sets of rotating locking wheels symmetrically arranged about the central axis of the upright plate 102. The two sets of rotating locking wheels support the arc-shaped lamp holder 211.

[0029] Furthermore, the driving component includes a motor mounting plate 221 mounted on the side of the upright plate 102 opposite to the arc-shaped lamp holder 211, a rotary motor 222 mounted through the motor mounting plate 221, and two drive wheels 223 rotatably mounted on the same side of the upright plate 102 and the motor mounting plate 221. The surfaces of the two drive wheels 223 are fitted with drive chains 224, and the drive end of the rotary motor 222 is connected to one drive wheel 223. When the rotary motor 222 starts, its drive end drives the drive wheel 223 connected to it to rotate. Under the transmission action of the drive chain 224, the other drive wheel 223 rotates synchronously.

[0030] Furthermore, the driving component also includes two linkage wheels 225 installed on the same side of the rotating positioning wheel on the upright plate 102. The two linkage wheels 225 correspond to the positions of the two driving wheels 223, and the wheel body of the driving wheel 223 passes through the upright plate 102 and is connected to the linkage wheel 225.

[0031] Furthermore, a central wheel 226 is also provided between the two sets of linkage wheels 225. A drive belt 227 is connected between the central wheel 226 and the two linkage wheels 225. The two linkage wheels 225 are driven to press against the side of the arc-shaped lamp holder 211 away from the lighting lamp 212. The central wheel 226 and the two linkage wheels 225 are arranged in a triangle. The two linkage wheels 225 are driven to rotate first by the corresponding drive wheels 223. During the rotation, the central wheel 226 is driven to rotate along with it by the drive belt 227. The two linkage wheels 225 are driven by the two sets of drive wheels 223 to maintain synchronous rotation, continuously forming a stable pressing force on the arc-shaped lamp holder 211.

[0032] Reference Figure 4 As shown, a wheel base 2261 is arranged between the center wheel 226 and the upright plate 102. The center wheel 226 is mounted on the upright plate 102 through the wheel base 2261, and the center wheel 226 and the wheel base 2261 are rotatably connected.

[0033] Furthermore, the rotary positioning wheel is vertically mounted on the reference column 231 on the upright plate 102 and a circular locking wheel 232 that is locked and rotated on the reference column 231. The circular locking wheel 232 has an annular locking groove 233. The groove width of the annular locking groove 233 is the same as the width of the arc-shaped lamp holder 211. The interior of the arc-shaped lamp holder 211 is locked into the arc-shaped locking groove.

[0034] Reference Figure 2 and Figure 3 As shown, the pushing component 400 includes a pushing platform 422 and a lifting frame, wherein the pushing platform 422 is mounted on the top of the lifting frame.

[0035] The lifting frame includes an L-shaped base plate 411 mounted on a base plate 101, two transverse locking plates 412 bolted to the L-shaped base plate 411, and a cylinder 413 locked by the two sets of transverse locking plates 412. The cylinder 413 is arranged vertically, and a pusher platform 422 is mounted on the top of the cylinder 413.

[0036] The push platform 422 is spaced apart from the arc-shaped lamp holder 211, so that during the rotation and movement of the arc-shaped lamp holder 211 driven by the driving component, the push platform 422 is always outside the movement trajectory of the arc-shaped lamp holder 211, and the arc-shaped lamp holder 211 and the push platform 422 do not contact each other and do not interfere with each other's movements.

[0037] Two sets of camera groups 300 are symmetrically arranged on both sides of the upright plate 102 and close to the curved lamp holder 211, and their positions remain unchanged. As the curved lamp holder 211 moves the lighting lamp 212 to change the position and angle of the illumination, the camera groups 300 always shoot the chip on the push platform 422 at the best angle. By capturing images of the chip surface under different lighting conditions, it is possible to more accurately determine whether there are shallow scratches on the chip surface, and avoid poor chip quality after testing due to the difficulty in detecting shallow scratches.

[0038] Working principle: First, the device is stably installed on the plane by the feet of the frame 100. The 2.5D packaged chip to be tested is placed on the push platform 422 of the push component 400. The cylinder 413 of the lifting frame can drive the push platform 422 to rise and fall, adjusting the chip to a suitable test height.

[0039] When the lighting lamp 212 and the rotary motor 222 are turned on, the drive end of the motor drives the drive wheel 223 connected to it to rotate. Under the transmission action of the drive chain 224, another drive wheel 223 rotates synchronously. Since the drive wheel 223 passes through the vertical plate 102 and is connected to the linkage wheel 225, the two linkage wheels 225 are also driven to rotate. When the two linkage wheels 225 rotate, the drive belt 227 sleeved between them and the central wheel 226 drives the central wheel 226 to rotate. The two linkage wheels 225 continuously and stably press the side of the arc-shaped lamp holder 211 away from the lighting lamp 212 through the drive belt 227.

[0040] Driven by the linkage wheel 225 and limited by the rotating positioning wheel, the arc-shaped lamp holder 211 rotates, and the lighting lamp 212 on it moves accordingly, thereby changing the position and angle of the lighting lamp 212 and illuminating the chip on the push platform 422 with multiple light sources in synchronous coupling.

[0041] At this time, the camera group 300, symmetrically fixed on both sides of the upright plate 102 and close to the curved lamp holder 211, remains stationary, but continuously captures images of the chip as the curved lamp holder 211 moves the lighting lamp 212. Since different angles and positions of illumination can cause shallow scratches on the chip surface to exhibit different optical characteristics, after the camera group 300 captures images under these different lighting conditions, the staff can analyze the images to more accurately determine whether shallow scratches exist on the chip surface. This prevents chips of poor quality from passing testing due to undetected shallow scratches, ensuring the reliability and accuracy of chip testing.

[0042] Finally, the following points should be noted: First, in the description of this application, it should be noted that, unless otherwise specified and limited, the terms "installation", "connection", and "linkage" should be interpreted broadly, and can be mechanical or electrical connections, or internal connections between two components, or direct connections. "Up", "down", "left", "right", etc. are only used to indicate relative positional relationships. When the absolute position of the described object changes, the relative positional relationship may change.

[0043] Secondly: The accompanying drawings of the embodiments disclosed in this utility model only involve the structures involved in the embodiments disclosed in this utility model. Other structures can refer to the general design. In the absence of conflict, the same embodiment and different embodiments of this utility model can be combined with each other.

[0044] Finally: The above description is only a preferred embodiment of the present utility model and is not intended to limit the present utility model. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present utility model should be included within the protection scope of the present utility model.

Claims

1. A multi-light source synchronously coupled 2.5D package chip testing apparatus, characterized in that, include: The frame (100) includes a horizontally placed base plate (101) and vertical plates (102) arranged on the base plate (101); The lighting unit (200) includes a lighting component, a limiting component for engaging the lighting component, and a driving component for driving the lighting component to rotate. The lighting component includes an arc-shaped lamp holder (211) and a lighting lamp (212) arranged on the arc-shaped lamp holder (211). The limiting component includes two sets of rotating locking wheels symmetrically arranged about the central axis of the upright plate (102). The two sets of rotating locking wheels support the arc-shaped lamp holder (211). Two sets of camera groups (300) are symmetrically arranged on both sides of the upright plate (102). The pushing component (400) includes a pushing platform (422) and a lifting frame, wherein the pushing platform (422) is mounted on the top of the lifting frame.

2. The multi-source synchronously coupled 2.5D packaged chip test apparatus of claim 1, wherein: The driving component includes a motor mounting plate (221) mounted on the side of the upright plate (102) away from the arc-shaped lamp holder (211), a rotary motor (222) mounted through the motor mounting plate (221), and two drive wheels (223) rotatably mounted on the same side of the upright plate (102) and the motor mounting plate (221). The surfaces of the two drive wheels (223) are fitted with drive chains (224), and the drive end of the rotary motor (222) is connected to one of the drive wheels (223).

3. The multi-source synchronously coupled 2.5D packaged chip test apparatus of claim 2, wherein: The driving component also includes two linkage wheels (225) installed on the same side of the rotating positioning wheel on the upright plate (102). The two linkage wheels (225) correspond to the positions of the two driving wheels (223), and the wheel body of the driving wheel (223) passes through the upright plate (102) and is connected to the linkage wheel (225).

4. The multi-source synchronously coupled 2.5D packaged chip test apparatus of claim 3, wherein: A central wheel (226) is also provided between the two sets of linkage wheels (225). A drive belt (227) is connected between the central wheel (226) and the two linkage wheels (225). The two linkage wheels (225) are driven to press against the side of the arc-shaped lamp holder (211) away from the lighting lamp (212).

5. The multi-source synchronously coupled 2.5D packaged chip test apparatus of claim 4, wherein: The rotary positioning wheel is vertically mounted on the reference column (231) on the upright plate (102) and the circular chuck (232) is mounted and rotates on the reference column (231). The circular chuck (232) has an annular groove (233) with the same width as the arc-shaped lamp holder (211).

6. The multi-source synchronously coupled 2.5D packaged chip test apparatus of claim 5, wherein: The lifting frame includes an L-shaped base plate (411) mounted on a base plate (101), two transverse locking plates (412) bolted to the L-shaped base plate (411), and a cylinder (413) locked by the two sets of transverse locking plates (412). The cylinder (413) is arranged vertically, and a pusher (422) is mounted on the top of the cylinder (413).

7. The multi-source synchronously coupled 2.5D packaged chip test apparatus of claim 6, wherein: The push platform (422) is spaced apart from the arc-shaped lamp holder (211).

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