A new electronic component aging resistance performance detection device

Abstract

The utility model relates to a kind of detection devices, more specifically, a kind of novel electronic component ageing resistance performance detection device.It includes base, the top of base is equipped with feeding mechanism and detection mechanism, the feeding mechanism is located between base and detection mechanism, the bottom of the detection mechanism is equipped with limiting mechanism, and the limiting mechanism is used to adjust the position of circuit board.The utility model, in the circuit board detection process, feeding mechanism is conveyed to the below of detection mechanism, the detection mechanism moves down and drives limiting mechanism to move at this time, make the guide plate of limiting mechanism contact with circuit board side wall, under the guidance of guide plate, drive the circuit board that has deviated to move, make the position of circuit board terminal and detection mechanism contact point correspond, reduce the damage caused by friction in the contact process between detection mechanism contact point and circuit board terminal, to improve the accuracy of circuit board performance detection result and prolong the service life of detection mechanism.

Description

Technical Field

[0001] This utility model relates to a testing device, specifically, a novel testing device for the aging resistance of electronic components. Background Technology

[0002] Electronic components are the basic units that make up electronic circuits. They are usually packaged independently and have two or more leads or terminals. During the production process, in order to evaluate the aging resistance of electronic components under different operating conditions (such as under high voltage stress), they need to be tested in a special testing device. When testing the aging resistance of different electronic components, such as circuit boards, the testing process includes: the feeding mechanism moves the circuit board to the base of the testing station, the testing equipment body 33 establishes an electrical connection with the leads of the circuit board, and then the testing equipment body 33 applies a high voltage current to the circuit board to simulate the performance change of the circuit board under this condition, so as to know the aging resistance of the circuit board.

[0003] However, when the feeding mechanism transports the circuit board to the bottom of the testing equipment body 33, due to inertia, the circuit board will slip slightly at the moment of stopping. At this time, the testing equipment body 33 presses down to try to establish a connection, and the contact point will be offset from the predetermined alignment position of the component terminal. This misalignment will cause unexpected lateral friction between the probe and the terminal, which can easily cause wear, deformation or scratching of the probe tip or the surface of the component terminal. Repeated friction damage not only affects the accuracy of the test results, but also significantly shortens the service life of the testing equipment body 33. In view of this, we propose a new type of electronic component aging resistance testing device. Utility Model Content

[0004] The purpose of this invention is to provide a novel aging resistance testing device for electronic components, in order to solve the problem mentioned in the background art of damage caused by friction at the connection between the circuit board misalignment and the testing mechanism.

[0005] To address the aforementioned problems, the present invention aims to provide a novel aging resistance testing device for electronic components, comprising a base, a feeding mechanism and a testing mechanism located above the base, the feeding mechanism being positioned between the base and the testing mechanism, and used to transport a circuit board to the bottom of the testing mechanism; a limiting mechanism being provided at the bottom of the testing mechanism, the limiting mechanism being used to adjust the position of the circuit board; the limiting mechanism comprising two adjusting components and a transmission component, the transmission component connecting the two adjusting components together; and two guide plates slidably connected at positions far apart on the bottom of the two adjusting components; the transmission component driving the two adjusting components to move the two guide plates in directions away from or close to each other; when the circuit board moves to the bottom of the limiting mechanism, the guide plates move downward to adjust the position of the circuit board.

[0006] As a further improvement to this technical solution, the adjustment component includes an adjustment housing, the interior of which is provided with a movable groove, and a sliding groove connected to the movable groove is provided on one side of the adjustment housing near the bottom.

[0007] As a further improvement to this technical solution, a screw parallel to the adjusting housing is rotatably connected inside the movable groove via a bearing. A slider is threaded onto the screw, and one side of the slider passes through the groove and is fixedly connected to the top of the guide plate. During rotation, the screw drives the slider and the guide plate to move.

[0008] As a further improvement to this technical solution, the transmission assembly includes a transmission housing fixedly connected to the ends of the two adjustment housings. The transmission housing is arranged perpendicularly to the adjustment housings, and the two adjustment housings are arranged parallel to each other.

[0009] As a further improvement to this technical solution, an installation groove is provided inside the transmission housing, and a worm gear parallel to the transmission housing is rotatably connected to the top of the installation groove via a bearing.

[0010] As a further improvement to this technical solution, the end of the screw near the worm penetrates the side wall of the adjusting housing and enters the interior of the mounting groove. The end of the screw located inside the mounting groove is coaxially and fixedly connected to a worm wheel that meshes with the worm. During the rotation of the worm, the worm wheel rotates, causing the screw to rotate.

[0011] As a further improvement to this technical solution, the bottoms of the two guide plates are inclined in a direction away from each other. During the descent, the inclined surface of the guide plate contacts one side of the top of the circuit board, and the descending guide plate squeezes the side of the circuit board to move it.

[0012] As a further improvement to this technical solution, a guide rail is fixedly connected to the bottom of the movable groove, and the slider is slidably connected to the guide rail. When the slider moves, it moves along the axial direction of the guide rail.

[0013] Compared with the prior art, the beneficial effects of this utility model are as follows: 1. In this novel electronic component aging resistance testing device, during the circuit board testing process, the feeding mechanism transports the circuit board to the bottom of the testing mechanism. At this time, the testing mechanism moves downward and drives the limiting mechanism to move, so that the guide plate of the limiting mechanism contacts the side wall of the circuit board. Under the guidance of the guide plate, the offset circuit board is moved, so that the position of the circuit board terminal corresponds with the contact point of the testing mechanism. This reduces the damage caused by friction between the contact point of the testing mechanism and the circuit board terminal during the contact process, thereby improving the accuracy of the circuit board performance testing results and extending the service life of the testing mechanism. Attached Figure Description

[0014] Figure 1This is one of the overall structural schematic diagrams of this utility model; Figure 2 This is the second schematic diagram of the overall structure of this utility model; Figure 3 This is one of the structural schematic diagrams of the limiting mechanism in this utility model; Figure 4 This is the second schematic diagram of the limiting mechanism in this utility model; Figure 5 This is the third schematic diagram of the limiting mechanism in this utility model; Figure 6 This is a cross-sectional view of the limiting mechanism in this utility model; Figure 7 This is an assembly diagram of the adjusting housing and the transmission housing in this utility model; Figure 8 This is a cross-sectional view of the assembly of the adjusting housing and the transmission housing in this utility model; Figure 9 This is a partial structural assembly diagram of the transmission component and the adjustment component in this utility model.

[0015] The meanings of the labels in the diagram are as follows: 1. Base; 2. Feeding mechanism; 3. Testing mechanism; 31. Mounting frame; 32. Electric telescopic pole; 33. Main body of testing equipment; 4. Limiting mechanism; 41. Adjusting housing; 411. Movable groove; 412. Slide groove; 42. Screw; 421. Slider; 422. Worm gear; 43. Guide plate; 44. Transmission housing; 441. Mounting slot; 45. Worm gear. Detailed Implementation

[0016] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0017] Example 1 Please see Figure 1 and Figure 2As shown, the purpose of this embodiment is to provide a novel aging resistance testing device for electronic components, including a base 1. A feeding mechanism 2 and a testing mechanism 3 are provided above the base 1. The feeding mechanism 2 includes a fixed frame and a conveying roller rotatably connected to the top of the fixed frame. The conveying roller moves the circuit board during rotation. The feeding mechanism 2 is existing technology and will not be described in detail here. A gap is provided between adjacent conveying rollers, the width of which is less than the length of the circuit board, to prevent the circuit board from falling off the conveying roller and affecting its conveying. The testing mechanism 3 includes a mounting frame 31 fixedly connected to the upper side of the base 1. The top of the mounting frame 31 is fixed... An electric telescopic rod 32 is connected, and the piston rod of the electric telescopic rod 32 passes through the top of the mounting frame 31 and is fixedly connected to the main body 33 of the testing equipment. The main body 33 of the testing equipment is existing technology and will not be improved in this solution, so it will not be described here. Several contact points are fixedly connected to the bottom of the main body 33 of the testing equipment. During the extension and retraction process, the piston rod of the electric telescopic rod 32 drives the main body 33 of the testing equipment to move up or down. The feeding mechanism 2 is located between the base 1 and the testing mechanism 3. The feeding mechanism 2 is used to transport the circuit board to the bottom of the testing mechanism 3. The bottom of the testing mechanism 3 is provided with a limiting mechanism 4, which is used to adjust the position of the circuit board. When the feeding mechanism 2 delivers the circuit board to the bottom of the testing mechanism 3, the central axes of the circuit board, the limiting mechanism 4, and the testing mechanism 3 are on the same plane. At this time, the piston rod of the electric telescopic rod 32 extends and drives the main body 33 of the testing equipment and the limiting mechanism 4 to move downward. During the movement, the limiting mechanism 4 drives the circuit board to move, so that the central axes of the circuit board and the main body 33 of the testing equipment coincide. Then, the contact point at the bottom of the main body 33 of the testing equipment is connected to the lead wire on the circuit board, so that the main body 33 of the testing equipment can test the aging resistance of the circuit board under high voltage.

[0018] refer to Figure 3 - Figure 5 The limiting mechanism 4 includes two adjusting components and a transmission component. The transmission component connects the two adjusting components together. Two guide plates 43 are slidably connected at the bottom of the two adjusting components at positions far apart from each other. The guide plates 43 include vertical sections and inclined sections. The width of the guide plates 43 is smaller than the gap between adjacent conveying rollers, allowing the guide plates 43 to pass through the gap and continue to move downward. The contact point at the bottom of the detection equipment body 33 is located between the vertical sections of the two guide plates 43. The transmission component drives the two adjusting components to move the two guide plates 43 in directions away from or close to each other. The distance between the vertical sections of the two guide plates 43 is adjusted according to the size of the circuit board, so that the limiting mechanism 4 can adjust the position of circuit boards of different sizes. When the circuit board moves below the limiting mechanism 4, the guide plate 43 moves downward to adjust the position of the circuit board. The bottoms of the two guide plates 43 are tilted away from each other. During the descent, the inclined surface of the guide plate 43 contacts one side of the top of the circuit board. The descending guide plate 43 squeezes the side of the circuit board to move it. The moved circuit board enters between the vertical sections of the two guide plates 43 so that the leads on the circuit board are aligned with the contact points at the bottom of the testing equipment body 33. Then the testing equipment body 33 continues to descend so that its contact points and the leads on the circuit board are connected together to perform performance testing on the circuit board.

[0019] refer to Figure 6 - Figure 9 The adjustment assembly includes an adjustment housing 41, with a movable groove 411 inside the adjustment housing 41. A sliding groove 412 connected to the movable groove 411 is provided on one side of the adjustment housing 41 near the bottom. A screw 42 parallel to the adjustment housing 41 is rotatably connected to the movable groove 411 through a bearing. A slider 421 is threaded onto the screw 42. One side of the slider 421 passes through the sliding groove 412 and is fixedly connected to the top of the guide plate 43. During rotation, the screw 42 drives the slider 421 and the guide plate 43 to move, so that the two guide plates 43 move away from or closer to each other, thereby adjusting the distance between the vertical sections of the two guide plates 43 for use with circuit boards of different sizes. A guide rail is fixedly connected to the bottom of the movable groove 411, and the slider 421 is slidably connected to the guide rail. When the slider 421 moves, it moves along the axis of the guide rail to prevent the screw 42 from rotating and causing the slider 421 to rotate, thus ensuring the normal movement of the slider 421.

[0020] refer to Figure 6 - Figure 9 The transmission assembly includes a transmission housing 44 fixedly connected to the ends of two adjusting housings 41. The transmission housing 44 is arranged perpendicularly to the adjusting housings 41, and the two adjusting housings 41 are arranged in parallel. The two adjusting housings 41 and the transmission housing 44 form a U-shaped mounting frame. The mounting frame is fixedly connected to the bottom of the main body 33 of the detection equipment. The main body 33 of the detection equipment moves during the movement of the mounting frame. An installation groove 441 is provided inside the transmission housing 44. A worm gear 45 parallel to the transmission housing 44 is rotatably connected to the top of the installation groove 441 via a bearing. One end of the worm gear 45 passes through the side wall of the transmission housing 44 and is fixedly connected to a knob. The end of the screw 42 near the worm gear 45 passes through the side wall of the adjustment housing 41 and enters the installation groove 441. The end of the screw 42 inside the installation groove 441 is coaxially fixedly connected to a worm wheel 422 that meshes with the worm gear 45. When it is necessary to adjust the distance between the vertical sections of the two guide plates 43, the operator turns the knob with a wrench to make the worm gear 45 rotate. During the rotation of the worm gear 45, the worm wheel 422 rotates, which in turn drives the screw 42 to rotate. The rotating screw 42 drives the slider 421 and the guide plate 43 to move, thereby adjusting the distance between the vertical sections of the two guide plates 43.

[0021] It should be emphasized that the distance between the two guide plates 43 is not adjusted when testing the same batch of circuit boards. The corresponding size adjustment is only made when the circuit board being tested is changed.

[0022] When using this device: In the initial state, the piston rod of the electric telescopic rod 32 retracts, causing the main body 33 of the testing equipment and the limiting mechanism 4 to be located away from the feeding mechanism 2. When it is necessary to test the aging resistance of the circuit board, the operator drives the transmission component to rotate the screw 42, which in turn moves the slider 421 and the guide plate 43, so that the distance between the vertical sections of the two guide plates 43 matches the size of the circuit board. During the circuit board performance testing process, the feeding mechanism 2 transports the circuit board to the bottom of the testing equipment body 33. At this time, the piston rod of the electric telescopic rod 32 extends and drives the testing equipment body 33 and the guide plate 43 to move downward. The inclined surface of the moving guide plate 43 contacts one side of the top of the circuit board and pushes the circuit board into the vertical section between the two guide plates 43, so that the testing equipment body 33 coincides with the central axis of the circuit board. The testing mechanism 3 continues to descend so that its contact point connects with the leads on the circuit board. The main body of the testing equipment 33 tests the aging resistance of the circuit board. When the circuit board is tested, the piston rod of the electric telescopic rod 32 retracts, causing the main body of the testing equipment 33 to move upward so that the limiting mechanism 4 separates from the circuit board. Then the feeding mechanism 2 removes the tested circuit board.

[0023] The foregoing has shown and described the basic principles, main features, and advantages of this utility model. Those skilled in the art should understand that this utility model is not limited to the above embodiments. The embodiments and descriptions in the specification are merely preferred examples and are not intended to limit the utility model. Various changes and modifications can be made to this utility model without departing from its spirit and scope, and all such changes and modifications fall within the scope of the claimed utility model. The scope of protection of this utility model is defined by the appended claims and their equivalents.

Claims

1. A novel aging resistance testing device for electronic components, comprising a base (1), a feeding mechanism (2) and a testing mechanism (3) being provided above the base (1), the feeding mechanism (2) being located between the base (1) and the testing mechanism (3), the feeding mechanism (2) being used to transport circuit boards to the area below the testing mechanism (3), characterized in that: The bottom of the detection mechanism (3) is provided with a limiting mechanism (4). The limiting mechanism (4) is used to adjust the position of the circuit board. The limiting mechanism (4) includes two adjusting components and a transmission component. The transmission component connects the two adjusting components together. The bottom of the two adjusting components are slidably connected to two guide plates (43) at positions far apart from each other. The transmission component drives the two adjusting components to move the two guide plates (43) in directions that are far apart from or close to each other. When the circuit board moves below the limiting mechanism (4), the guide plates (43) move downward to adjust the position of the circuit board.

2. The novel electronic component aging resistance testing device according to claim 1, characterized in that: The adjustment assembly includes an adjustment housing (41), the interior of which is provided with a movable groove (411), and a sliding groove (412) connected to the movable groove (411) is provided on one side of the adjustment housing (41) near the bottom.

3. The novel electronic component aging resistance testing device according to claim 2, characterized in that: Inside the movable groove (411), a screw (42) parallel to the adjusting housing (41) is rotatably connected via a bearing. A slider (421) is threaded onto the screw (42). One side of the slider (421) passes through the groove (412) and is fixedly connected to the top of the guide plate (43). During rotation, the screw (42) drives the slider (421) and the guide plate (43) to move.

4. The novel electronic component aging resistance testing device according to claim 3, characterized in that: The transmission assembly includes a transmission housing (44) fixedly connected to the ends of two adjusting housings (41). The transmission housing (44) is arranged perpendicularly to the adjusting housings (41), and the two adjusting housings (41) are arranged parallel to each other.

5. The novel electronic component aging resistance testing device according to claim 4, characterized in that: The transmission housing (44) has an installation groove (441) inside, and a worm gear (45) parallel to the transmission housing (44) is rotatably connected to the installation groove (441) near the top via a bearing.

6. The novel electronic component aging resistance testing device according to claim 5, characterized in that: The end of the screw (42) near the worm (45) passes through the side wall of the adjusting housing (41) and enters the interior of the mounting groove (441). The end of the screw (42) located inside the mounting groove (441) is coaxially and fixedly connected to a worm wheel (422) that meshes with the worm (45). During the rotation of the worm (45), the worm wheel (422) is driven to rotate, which in turn drives the screw (42) to rotate.

7. The novel electronic component aging resistance testing device according to claim 3, characterized in that: The bottoms of the two guide plates (43) are inclined in a direction away from each other. During the descent, the inclined surface of the guide plate (43) contacts one side of the top of the circuit board. The descending guide plate (43) squeezes the side of the circuit board to move it.

8. The novel electronic component aging resistance testing device according to claim 3, characterized in that: The bottom of the movable groove (411) is fixedly connected to a guide rail, and the slider (421) is slidably connected to the guide rail. When the slider (421) moves, it moves along the axis of the guide rail.

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