Ultrasonic Scanning Microscope

CN309246837SActive Publication Date: 2025-04-18HAIJIU INTELLIGENT TECHNOLOGY (SUZHOU) CO LTD
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Patent Information

Application Number
CN202430576320.6
Authority / Receiving Office
CN · China
Patent Type
Designs(China)
Current Assignee / Owner
Filing Date
2024-09-10
Publication Date
2025-04-18
Estimated Expiration
2039-09-10

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Abstract

1. The name of the product of this design: ultrasonic scanning microscope. 2. Purpose of this design product: used to scan and detect internal defects of the semiconductor or material products under test, such as voids, delamination, cracks, foreign matter, etc. 3. The design key point of this appearance design product lies in the shape. 4. The picture or photo that best illustrates the design points: Stereoscopic diagram 1. 5. Other situations that need explanation Other explanations: Part A, Part B and Part C in the three-dimensional figure 1 are made of transparent materials, Part D in the three-dimensional figure 2 is made of transparent material, and Part E and Part F in the three-dimensional figure 3 are made of transparent materials.
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