Ultrasonic Scanning Microscope
CN309246837SActive Publication Date: 2025-04-18HAIJIU INTELLIGENT TECHNOLOGY (SUZHOU) CO LTD
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Patent Information
- Application Number
- CN202430576320.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2024-09-10
- Publication Date
- 2025-04-18
- Estimated Expiration
- 2039-09-10
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Figure 000007_ABST
Abstract
1. The name of the product of this design: ultrasonic scanning microscope. 2. Purpose of this design product: used to scan and detect internal defects of the semiconductor or material products under test, such as voids, delamination, cracks, foreign matter, etc. 3. The design key point of this appearance design product lies in the shape. 4. The picture or photo that best illustrates the design points: Stereoscopic diagram 1. 5. Other situations that need explanation Other explanations: Part A, Part B and Part C in the three-dimensional figure 1 are made of transparent materials, Part D in the three-dimensional figure 2 is made of transparent material, and Part E and Part F in the three-dimensional figure 3 are made of transparent materials.
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