Silicon photonics wafer testing equipment

Abstract

1. The name of this design product: Silicon photonic wafer testing equipment. 2. Purpose of this design product: used for testing single or batch wafers and collecting test data. 3. The key point of the design of this product lies in its shape. 4. The picture or photo that best illustrates the key points of the design: Design 1 3D drawing. 5. If the key design points are not involved, the top view of Design 1 will be omitted; if the key design points are not involved, the top view of Design 2 will be omitted; if the key design points are not involved, the top view of Design 3 will be omitted; if the key design points are not involved, the top view of Design 4 will be omitted. 6. Designate Design 1 as the base design. 7. Other situations that require explanation: The enlarged view of part A of design 1 is the enlarged view of point A in the stereoscopic drawing of design 1; the enlarged view of part B of design 2 is the enlarged view of point B in the stereoscopic drawing of design 2; the enlarged view of part C of design 3 is the enlarged view of point C in the stereoscopic drawing of design 3; the enlarged view of part D of design 4 is the enlarged view of point D in the stereoscopic drawing of design 4.

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