Wafer optical inspection machine
CN309497294SActive Publication Date: 2025-09-16창추안 테크놀로지 (수저우) 컴퍼니 리미티드
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Patent Information
- Application Number
- CN202430724655.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2024-11-15
- Publication Date
- 2025-09-16
- Estimated Expiration
- 2039-11-15
Smart Images
Figure 000007_ABST
Abstract
1. The name of this design product: Wafer optical inspection machine. 2. Purpose of this design product: used to detect defects in wafers. 3. The key point of the design of this product lies in its shape. 4. The picture or photo that best illustrates the design points: Stereoscopic drawing 1.
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