Three-axis motion platform for automated optical inspection machine
CN310129826SActive Publication Date: 2026-08-04长川科技(苏州)有限公司
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Patent Information
- Application Number
- CN202530769980.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2025-12-26
- Publication Date
- 2026-08-04
- Estimated Expiration
- 2040-12-26
Smart Images
Figure 000007_ABST
Abstract
1. Name of the product in this design: Three-axis motion platform of an automatic optical inspection machine. 2. Purpose of this design: To support wafers for three-dimensional (XYZ axis) motion positioning, as well as scanning and maintenance during wafer inspection. 3. The key design feature of this product is its shape. 4. The image or photograph that best illustrates the design's key points: 3D view 1.
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