Self-opening and ejection system with system-integrated test holder

Abstract

System-integrated test device (200), including: an in-circuit tester (102) with a body having an upper plate (202a) and a lower plate (202b), wherein the upper and lower plates (202a, 202b) each comprise one or more electrical drivers designed to test electrical connections of one or more electronic components (208); one or more actuators (206), each coupled to both the upper plate (202a) and the lower plate (202b) and designed such that the upper and lower plates (202a, 202b) are moved relative to each other; and a control unit (104) coupled to the in-circuit tester (102) and the actuators (206) and designed to cause the actuators (206) to automatically close the plates (202a, 202b) so that the plates (202a, 202b) clamp the electronic components (208) at the beginning of a test program, and to automatically open the plates (202a, 202b) so that the plates (202a, 202b) are separated at the end of the test program, wherein the control unit (104) has a memory, wherein the test program is stored in the memory, wherein the test program causes the components (208) to be tested by the in-circuit tester (102), and wherein the test program contains embedded opening commands which cause the actuators (206) to open the upper and lower plates (202a, 202b) to open, and wherein the test program contains closing commands which cause the actuators (206) to close the upper and lower plates (202a, 202b).

Description

AREA OF INVENTION

[0001] The present invention is generally directed to the field of in-circuit testing (ICT) fixtures. More specifically, the invention is directed to the field of a system-integrated test fixture for testing printed circuit board assemblies and printed circuit boards. BACKGROUND OF THE INVENTION

[0002] Printed circuit board assemblies (PCBAs) and printed circuit boards (PCBs) are typically inspected after manufacturing to detect any production defects. Generally, PCB inspection can be categorized as the inspection of bare PCBs, while PCBA inspection can be categorized as the inspection of assembled PCBs. Bare PCB inspection involves testing an unpopulated PCB without any components or parts attached to it to verify the continuity of the traces between the contacts and / or vias on the board. Assembled PCB inspection involves testing a PCBA with some or all of the electrical components and / or parts mounted on it to verify that all necessary electrical connections have been completed correctly.In addition, testing of populated printed circuit boards can also include testing of integrated circuits (hereinafter referred to as "ICs") to verify that the components mounted on the PCB function within their specifications. These tests require one or more operators to provide input to the test control unit, continuously monitor the units under test (UUTs), and manually open and close the test equipment before and after testing. This activity increases the cost of the testing process and, consequently, the cost of the UUTs.

[0003] Such test devices or test adapters are known from US 4 812 754 A and from the product catalog of the company “ingun Prüfmittelbau GmbH” (“Test Adapter Catalog 2008”, page 31 / 33, ingun Prüfmittelbau GmbH). SUMMARY OF THE INVENTION

[0004] Embodiments of the device, system, and operating procedure for in-circuit testing are directed toward a control unit electrically coupled to a test device, one or more UUTs, and an actuating device. The control unit can use the actuating device to automatically open or close the test device when the UUTs are in the position under test and / or have completed the test. Consequently, the system can offer the advantage of eliminating the risks and costs associated with human operators opening and closing the test device.

[0005] One embodiment is directed towards a system-integrated test device. The device comprises an in-circuit tester with a body having an upper and a lower plate. The upper and lower plates are designed to test electrical connections of one or more electronic components. One or more actuators are connected to each of the upper and lower plates and are designed to move the upper and lower plates relative to each other. A control unit is connected to the in-circuit tester and the actuators and is designed to cause the plates to close automatically via the actuators, so that at the beginning of a test program the plates clamp the electronic components and the plates open automatically so that the plates are separated at the end of the test program.In some embodiments, the in-circuit tester incorporates a vacuum, and the control unit causes the vacuum to create a hermetic seal between the upper and lower plates and the components after the plates are closed. In some embodiments, the in-circuit tester includes one or more safety sensors that detect when an object is present between the upper and lower plates. According to the invention, the control unit includes a memory for storing the test program, wherein the test program causes the in-circuit tester to test the components and contains embedded opening commands that cause the actuators to open the upper and lower plates, and closing commands that cause the actuators to close the upper and lower plates. In some embodiments, one or more of the actuators are pneumatic actuators.In some embodiments, the in-circuit tester includes a failover switch which, when activated, disables all other inputs and allows the upper and lower panels to be opened. In some embodiments, the control unit is integrated into the housing of the in-circuit tester. In some embodiments, the in-circuit tester includes one or more component holders that provide an electrical interface between the components and the circuit-integrated boards, enabling the in-circuit tester and the components to exchange electrical signals via the component holders.

[0006] Another embodiment is directed towards a working method in a system-integrated test device.The method comprises positioning one or more electronic components within an in-circuit tester with a body comprising an upper plate and a lower plate, wherein one or more actuators are caused to automatically close the plates with a control unit connected to the in-circuit tester, so that the plates clamp the electronic components at the beginning of a test program, wherein the one or more actuators are each connected to both the upper plate and the lower plate and are designed to move the upper and lower plates relative to each other by checking the electrical connections of the one or more electronic components to the upper and lower plates based on the test program, and wherein one or more actuators are caused to automatically open the plates with the control unit so that the plates are separated at the end of the test program.In some embodiments, the method further comprises creating a vacuum in the in-circuit tester to generate a hermetic seal between the upper and lower plates and the control unit assemblies after the plates are closed. In some embodiments, the method further comprises using one or more safety sensors of the in-circuit tester to detect whether an object is located between the upper and lower plates and to interrupt the closing of the upper and lower plates by the actuators if the safety sensors detect that the object is located between the upper and lower plates.According to the invention, the test program causes the components to be tested by the in-circuit tester and includes embedded opening commands that cause the actuators to open the upper and lower plates, as well as closing commands that cause the actuators to close the upper and lower plates. In some embodiments, one or more of the actuators are pneumatic actuators. In some embodiments, the method also includes allowing the upper and lower plates to be opened regardless of a contrary input from the test program if a failover switch of the in-circuit tester is activated. In some embodiments, the control unit is integrated into the housing of the in-circuit tester.In some embodiments, positioning the one or more electronic components within the in-circuit tester includes connecting the components to one or more component holders of the in-circuit tester, wherein the component holders provide an electrical interface between the components and the system-integrated boards, so that the in-circuit tester and the components can exchange electrical signals via the component holders. BRIEF DESCRIPTION OF THE DRAWINGS

[0007] Several exemplary embodiments are described with reference to the drawings, in which identical components are designated with the same reference numerals. These exemplary embodiments are intended to illustrate the invention but not to limit it. The drawings include the following figures: Fig. Figure 1 illustrates a system-integrated test facility according to some embodiments; Fig. Figure 2 illustrates a system-integrated test device according to some embodiments; Fig. 3A and Fig. 3B illustrates control commands for tests within the circuit according to some embodiments; Fig. Figure 4 illustrates a working procedure of a system-integrated test facility according to some embodiments. DETAILED DESCRIPTION OF THE EXECUTION FORMS

[0008] Embodiments of the present application are directed to the device, system, and method of operation for testing within the circuit. Those skilled in the art will recognize that the following detailed description of the device, system, and method of operation for testing within the circuit is merely explanatory and in no way limiting. It will be readily apparent to those skilled in the art from other embodiments of the invention how to benefit from this disclosure.

[0009] Detailed reference will now be made to the design of the device, system, and operating procedures for testing within the circuit, as illustrated in the accompanying drawings. The same reference symbols, which refer to the same or similar parts, are used throughout the drawings and the following detailed description. For the sake of clarity, not all routine features of the designs described here will be shown and described. It is, of course, recognized that the development of any such current design requires numerous design-specific decisions to meet the specific objectives of the developer, such as fulfilling application- and work-related constraints, and that these specific objectives will vary from one design to another and from one developer to another.Furthermore, it is recognized that such a development effort could be complex and time-consuming, but would nevertheless be routine for the expert who benefits from this disclosure to incorporate it technically.

[0010] Fig. Figure 1 illustrates a system-integrated test facility 100 according to several embodiments. As in Fig. As shown in Figure 1, the system 100 comprises an ICT (In-Circuit Tester) 102, an actuator mechanism 106, a control unit 104, and one or more UUTs 108. Alternatively, the control unit 104 can be incorporated into the ICT 102, so that the ICT 102 includes an integrated control unit that manages the operation of the ICT 102. In some embodiments, the control unit 104 includes a display and / or one or more peripheral devices for displaying and providing a user interface with the results of the ICT 102 test. Alternatively, the display and / or peripheral devices can be separate from the control unit 104 if the control unit 104 is incorporated within the ICT 102. It is understood that the ICT 102, the actuator 106 and / or the control unit 104 may include processing elements, memory and / or other circuits known in themselves, which have been omitted here for the sake of brevity.

[0011] The ICT 102 can be physically coupled to the actuator 106, enabling it to physically open or close the ICT 102. The UUT 108 can be selectively electrically coupled to the ICT 102, allowing the ICT 102 to perform electrical tests on each of the coupled UUT 108. Although the ICT 102, as described in Fig. As shown in Figure 1, which is coupled with three UUT 108 units, more or fewer UUT 108 units are considered. The control unit 104 is electrically coupled to the ICT 102 and / or the actuator 106 to transmit electrical control signals (see, for example, Figure 1). Fig. 3A and Fig. 3B) to send to the ICT 102 and / or the actuator 106, which control their function. For example, the control unit 104 can cause the actuator 106 to close the ICT 102 when the UUT 108 is in position inside the ICT 102, for the ICT 102 to check the UUT 108, and for the actuator 106 to then open automatically when the test is complete. This gives the system 100 the advantage of eliminating the need for an operator to constantly open and close the ICT 102.

[0012] In some embodiments, the system 100 also includes one or more UUTs and / or operator safety sensors coupled to the ICT 102, the control unit 102, and / or the actuator 106. In some embodiments, one or more of the UUT sensors can detect the position of the UUT 108 within the ICT 102 and prevent the ICT 102 from being closed by the actuator 106 if one or more of the UUTs 108 are misaligned or otherwise inaccurately connected to the ICT 102. In some embodiments, the UUT safety sensors can detect the position of the UUT 108 mechanically and / or electrically based on physical and / or electrical connections between the UUTs 108 and the ICT 102 monitored by the sensors.Alternatively or additionally, the UUT safety sensors can visually detect the position of the UUT 108 using a camera or other light-detecting device that can monitor the positioning of the UUT 108 within the ICT 102. In some embodiments, one or more operator safety sensors can detect the position of operators or other users relative to the ICT 102 and prevent the ICT 102 from closing via the actuator 106 if an operator or user is in a hazardous area. For example, the operator safety sensors can detect whether an object (e.g., an operator's hand) is located between or near the plates of the ICT 102 and / or in the path of the closing plates of the ICT 102.Similar to UUT safety sensors, these operator sensors can visually detect the position of operators based on a camera or other light-detecting device that can monitor the positioning of operators relative to the ICT 102.

[0013] During operation, as described above, after the UUT 108 has been positioned inside the ICT 102 (and no warning signals have been received from the safety sensors), the control unit 104 sends control commands to the ICT 102 and / or actuator 106 to automatically close the ICT 102 around the UUT 108 and begin the testing process. During the testing process, the ICT 102 provides a practical and efficient method for testing the UUT 108 (e.g., a printed circuit board) by measuring each component of the UUT to verify that it is in its correct position and has the correct value. Because most defects in a UUT 108 originate from the manufacturing process and typically consist of short circuits, open circuits, or incorrect components, this test method addresses most problems found on a printed circuit board.These can be easily tested by using simple measurements of resistance, capacitance, and sometimes the inductive impedance between two points on the UUT 108. In some embodiments, each of the UUT 108 is tested in parallel. Alternatively, one or more of the UUT 108 can be tested in series. After the testing of the UUT 108 is complete, the control unit 104 then sends control commands to the ICT 102 and / or actuator 106 to open the ICT 102 around the UUT 108 so that the UUT 108 can be removed.

[0014] Fig. 2 represents a system-integrated test device 200 according to some embodiments. As in Fig. As shown in Figure 2A, the device 200 comprises an ICT 202 with an upper plate 202a and a lower plate 202b, an actuator 206 with a plurality of extending elements 206a and a control interface 206b, a control unit 204 with a display 204a and one or more peripheral devices 204b, and one or more UUTs 208. As described above, some or all of the control units 204 can be incorporated into the ICT 202. In some embodiments, the ICT 202, as described above, can include one or more UUT safety sensors 98 and / or one or more operator safety sensors 97. Although the safety sensors 98 and 97, as shown in Figure 2A, are not integrated into the ICT 202, the device 200 can be integrated into the ICT 202. Fig. As shown in Figure 2, which are located on the lower plate 202b of the ICT 202, one or more of the safety sensors 98, 97 may be arranged in other positions on the ICT 202 (e.g. the upper plate 202a) and / or separately from the ICT 202, but connected to it.

[0015] Each of the extending elements 206a of the actuator 206 has a first end that is connected to the upper plate 202a of the ICT 202, and a second end that is connected to the lower plate 202b. As shown in Fig. As shown in Figure 2, the elements 206a are connected to opposite sides of the ICT 202.

[0016] Alternatively, one or more of the elements 206a can be arranged on other parts of the ICT 202. Additionally, the first and second ends of the extending elements 206a can move relative to each other (e.g., via an extension process), causing the upper plate 202a to cover and / or come into contact with the lower plate 202b, so that the UUT 208 is clamped as the ends move closer together, and the upper plate 202a and the lower plate 202b separate and release the UUT 208 as the ends move apart. The control interface 206b is electrically coupled to the control unit 204 and is functional (e.g.,electrically) and / or physically connected to the extension elements 206a, such that, based on commands received from the control unit 204, the control interface 206b can cause one or more of the elements 206a to selectively extend or retract their ends as needed, thereby selectively and automatically opening or closing the system-integrated test plates 202a, 202b. In some embodiments, the control interface 206b causes the ends to move between an open and a closed position. Alternatively, the control interface 206b can move the elements 206a together or independently between any number of positions or extension lengths. In some embodiments, the extension elements 206a include pneumatic pistons, a pneumatic valve, a tube divider, an air pressure regulator, and / or an air release valve.Alternatively, one or more of the extension elements 206a can comprise pneumatic, hydraulic, mechanical, electrical, or other types of pistons, actuators, or actuating devices known per se. In some embodiments, the control unit 204 connects to or communicates with the ICT 202 (e.g., a system-integrated test system card) via the control interface 206b. Alternatively, the control unit 204 can connect to or communicate with the ICT 202 directly via the control interface 206b.

[0017] The ICT 202 is electrically coupled to the control unit 204 and selectively connected to the UUT 208, so that the ICT 202 can perform tests on any of the connected UUT 208. Although the ICT 202, as in Fig. Figure 2, which is connected to two UUT 208s, is considered to have more or fewer UUT 208s. The control unit 204 is electrically connected to the ICT 202 (and / or the control interface 206b of the actuator 206 as described above) to receive electrical control signals (see e.g. Fig. 3A and Fig. 3B) to the ICT 202 and / or the actuator 206, which control their operation. This allows the control unit 204 to select the position of the ICT plates 202a, 202b (e.g., open or closed) by sending command signals to the control interface 206b, while simultaneously sending command signals to the ICT 202 that cause the ICT 202 to begin testing the UUT 208 when they are closed. In some embodiments, the control unit 204 can additionally receive one or more warning signals from the sensors 98, 97 and interrupt and / or reverse the operation of the ICT 202 and / or the actuator 206 based on the warning signals to prevent injury or malfunction.

[0018] The plates 202a, 202b of the ICT 202 can be rotatably connected to one another, allowing one plate 202a to move relative to the other plate 202b. For example, in some embodiments, the ends of the plates 202a, 202b are connected to each other via a hinge that allows the plates 202a, 202b to rotate relative to each other from a stacked or parallel position, in which the UUT 208 is inserted between the plates 202a, 202b, to an "open" position, in which the plates 202a, 202b are arranged at an angle to each other, so that the UUT 208 is accessible. In some embodiments, the plates 202a, 202b include a grid of drivers and sensors used to set up and perform the measurements and operations for testing the UUT 208.For example, the plates 202a and 202b can include a vacuum device that can hermetically seal the plates 202a and 202b together by applying a vacuum between them while they are in the closed position. Consequently, the UUT 208 can be sealed between the plates 202a and 202b, creating a better test environment.

[0019] In some embodiments, the ICT 202 may also include one or more brackets 202c that provide an interface between the plates 202a, 202b and the UUT 208. Specifically, the brackets 202c may provide the connections for the drive sensor points of the plates 202a, 202b and guide them directly to the relevant points on the UUT 208 by using various guide devices (e.g., a "bed of nails"). Although all of the brackets 202c can connect to the plates 202a, 202b (and / or the rest of the ICT 202), each bracket 202c is UUT-specific, meaning that its design or configuration is based on one or more types of UUT 208, and it can only connect to those types of UUT 208 based on its design.Consequently, different mounting brackets 202c can be replaced and / or mixed or adapted so that the ICT 202 can connect to and test different types of UUT 208 by simply selecting a mounting bracket 202c designed based on the desired type or types of UUT 208. In some embodiments, the ICT 202 includes a failover switch 99 designed to automatically cause the actuator 206 to open the plates 202a, 202b, and / or to disengage the actuator 206 so that the plates 202a, 202b can be opened manually in an emergency. Alternatively, the failover switch 99 can be designed to turn the ICT 202 on and off. In some embodiments, the UUT 208 include integrated circuits and / or printed circuit board assemblies with integrated circuits and / or other electrical components.Alternatively, one or more of the UUT 208 can include other electrical components for testing. This gives the device 200 the advantage of eliminating the need for an operator to constantly open and close the ICT 202, as well as providing safety measures for safer operation of the automatic opening and closing mechanism.

[0020] Fig. 3A and Fig. 3B represents control commands for tests within the circuit according to some embodiments. In particular, it illustrates Fig. Figure 3A describes the start of an exemplary test program 300a in which the automatic closing commands 302a for in-circuit tests are embedded in the program 300a. Consequently, during the execution of the program 300a, the control unit 204 will cause the mechanism 206 to close the plates 202a, 202b around the UUT 208 and then proceed with the test operations. In some embodiments, the test program 300a may also include an embedded vacuum sealing command that causes a vacuum to be created between the plates 202a, 202b, as described above. In some embodiments, the test program 300a may also include a safety closing test command that queries or checks an input from one or more of the safety sensors 98, 97, as described above, before automatically closing and / or proceeding with the test operations. Similarly illustrated Fig. 3B describes the shutdown of an exemplary test program 300b, in which the automatic opening commands 302b for tests within the circuit are embedded in the program 300b. Consequently, during the execution of program 300b, after completion of the test operation on the UUT 208, the control unit 204 will cause the device 206 to automatically open the plates 202a, 202b, exposing the UUT 208. In some embodiments, the test program 300b may also include a safety opening test command that queries or checks an input from one or more of the safety sensors 98, 97, as described above, before automatically opening to ensure that nothing is in a hazardous area. It should be noted that the specific language of the test operations of programs 300a, 300b is based on the hardware / software of the ICT 202 and / or the type of UUT 208 to be tested.For example, different types of tests and / or different parameters for the tests to be performed as directed by programs 300a, 300b can be tailored based on the type of UUT 208 to be tested.

[0021] Fig.Figure 4 illustrates a working procedure of a system-integrated test system according to some embodiments. In step 402, one or more UUTs 208 are functionally connected to the ICT 202. In some embodiments, the connection to the ICT 202 includes the physical and / or electrical connection of each of the UUTs 208 to a corresponding holder 202c of the ICT 202. In step 404, the control unit 204 executes a test power-up program that automatically closes the plates 202a, 202b of the ICT 202 with the actuator 206 and begins testing the UUTs 208. In some embodiments, the control unit 204 checks the state or input of one or more of the safety sensors 98, 97 while the test power-up program is executed and closes the plates 202a, 202b only if the safety sensors 98, 97 indicate that it is safe to do so.In some embodiments, while the test power-on program is running, the control unit 204 causes a vacuum device of the ICT 202 to create a vacuum between the plates 202a, 202b in order to seal the UUT 208 inside the ICT 202. In step 406, the control unit executes a test shutdown program that automatically opens the plates 202a, 202b with the actuator 206 when the testing of the UUT 208 has finished. In some embodiments, while the test shutdown program is running, the control unit 204 checks the state or input of one or more of the safety sensors 98, 97 and opens the plates 202a, 202b only if the safety sensors 98, 97 indicate that it is safe to do so (i.e., no users are detected within the area).Consequently, the procedure has the advantage of eliminating the need for an operator to open and close the ICT 202, thus eliminating human error, saving costs and reducing the risk of injury.

Claims

[1] System-integrated test equipment (200), comprising: an in-circuit tester (102) with a body having an upper plate (202a) and a lower plate (202b), wherein the upper and lower plates (202a, 202b) each comprise one or more electrical drivers designed to test electrical connections of one or more electronic components (208); one or more actuators (206), each coupled to both the upper plate (202a) and the lower plate (202b) and designed such that the upper and lower plates (202a, 202b) are moved relative to each other; and a control unit (104) coupled to the in-circuit tester (102) and the actuators (206) and designed to cause the actuators (206) to automatically close the plates (202a, 202b) so that the plates (202a, 202b) clamp the electronic components (208) at the beginning of a test program, and to automatically open the plates (202a, 202b) so that the plates (202a, 202b) are separated at the end of the test program, wherein the control unit (104) has a memory, wherein the test program is stored in the memory, wherein the test program causes the components (208) to be tested by the in-circuit tester (102), and wherein the test program contains embedded opening commands which cause the actuators (206) to open the upper and lower plates (202a, 202b) to open, and wherein the test program contains closing commands which cause the actuators (206) to close the upper and lower plates (202a, 202b). [2] System-integrated test device (200) according to claim 1, wherein the in-circuit tester (102) encloses a vacuum and the control unit (104) causes the vacuum to create a hermetic seal between the upper and lower plates (202a, 202b) and the assembly units (208) after the plates (202a, 202b) are closed. [3] System-integrated test device (200) according to claim 1, wherein the in-circuit tester (102) has one or more safety sensors that detect when an object is located between the upper and lower plates (202a, 202b). [4] System-integrated test device (200) according to claim 1, wherein one or more of the actuators (206) are pneumatic actuators (206). [5] System-integrated test device (200) according to claim 1, wherein the in-circuit tester (102) comprises a fail switch which, when activated, renders all other inputs ineffective and enables the opening of the upper and lower plates (202a, 202b). [6] System-integrated test device (200) according to claim 1, wherein the control unit (104) is installed in the housing of the tester (102) of circuit components. [7] System-integrated test device (200) according to claim 1, wherein the in-circuit tester (102) comprises one or more component holders which provide an electrical interface between the components (208) and the boards (202a, 202b) so that the in-circuit tester (102) and the components (208) can exchange electrical signals via the component holders. [8] Working procedure of a system-integrated test device, wherein the procedure comprises: Positioning one or more electronic components (208) within an in-circuit tester (102) of circuit components with a body comprising an upper plate (202a) and a lower plate (202b), wherein both the upper plate (202a) and the lower plate (202b) comprise one or more electrical drivers; Causing one or more actuators (206) to automatically close the plates (202a, 202b) with a control unit (104) coupled to the in-circuit tester (102), so that the plates (202a, 202b) clamp the electronic components (208) at the beginning of a test program, wherein the one or more actuators (206) are each coupled to both the upper plate (202a) and the lower plate (202b) and are designed such that the upper and lower plates (202a, 202b) are moved relative to each other; Testing the electrical connections of one or more electronic assemblies (208) with the one or more drivers of the upper plate (202a) and the lower plate (202b) based on the test program; wherein the test program causes the assemblies (208) to be tested by the in-circuit tester (102) and wherein the test program contains embedded opening commands which cause the actuators (206) to open the upper and lower plates (202a, 202b), and wherein the test program contains closing commands which cause the actuators (206) to close the upper and lower plates (202a, 202b), and cause one or more actuators (206) to automatically open the plates (202a) with the control unit (104) so ​​that the plates (202a, 202b) are separated at the end of the test program based on the embedded opening commands. [9] Method according to claim 8, further comprising bringing about a vacuum in the in-circuit tester (102) to create a hermetic seal between the upper and lower plates (202a, 202b) and the assembly units (208) with the control unit (104) after the plates (202a, 202b) are closed. [10] Method according to claim 8, further comprising detecting with one or more safety sensors of the in-circuit tester (102) of circuit components whether an object is located between the upper and the lower plate (202a, 202b); and interrupting the actuators (206) to close the upper and the lower plate (202a, 202b) when the safety sensors detect that the object is located between the upper and the lower plate (202a, 202b). [11] Method according to claim 8, wherein one or more of the actuators (206) are pneumatic actuators (206). [12] Method according to claim 8, further comprising enabling the upper and lower plates (202a, 202b) to be opened by the test program regardless of any contrary input when a failure switch of the in-circuit tester (102) of circuit components is activated. [13] Method according to claim 8, wherein the control unit (104) is installed in the housing of the in-circuit tester (102) of circuit components. [14] Method according to claim 8, wherein positioning one or more electronic components (208) within the in-circuit tester (102) of circuit components comprises connecting the components (208) to one or more component holders of the in-circuit tester (102) of circuit components, wherein the component holders provide an electrical interface between the components (208) and the boards (202a, 202b) so that the in-circuit tester (102) and the components (208) can exchange electrical signals via the component holders.

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