High-frequency test probe device

Abstract

High-frequency test probe device (10) for releasably contacting a, preferably multi-pole, contact partner (50), in particular an H-MTD connector, with an inner housing (1) having an end-side arranged and at least one inner and outer contact (4a, 4b;4c) forming a contact section (4) for interaction with the contact partner (50) for testing purposes, wherein the inner housing (1) is guided in an outer housing (2) of the high-frequency test probe device (10) and relative to it, in particular along a longitudinal axis (L) of the device, such that in a first contact-free relative position the inner housing (1) is arranged in a positionally secure manner about the longitudinal axis (L) of the device in the outer housing (2) and is rotationally fixed, and in a second relative position contacting a contact partner (50) at least a rotation about the longitudinal axis (L) of the device and / or a tilting in a plane perpendicular to the longitudinal axis (L) of the device is enabled, characterized in that the outer housing (2) has on a side facing the contact section (4) of the inner housing (1) a sleeve-like guide section (11) with guide means (11a) formed on its inner circumferential surface for interaction with the inner housing (1).

Description

[0001] The present invention relates to a test pin device for releasably contacting a contact partner, particularly in the high-frequency range or in the area of ​​high-speed data transmission.

[0002] High-frequency test probe devices with a contact head are well known in the art and are used in test fields or other testing contexts to check the functionality of a test partner, for example, an electronic assembly with a suitable socket section. The test probe device is attached to the contact partner under test as a plug. Test signals are then applied to the contact partner via a suitable contact. Typically, several such test probe or test plug devices are provided in a common mounting device for connecting to corresponding contact partners of a device under test, or are interchangeable on this device, for example, by means of a mounting grid.

[0003] In regular testing operations, contact is typically established at periodic intervals, for example by bringing the mounting device with the attached test probes and the test specimen into relative proximity. In the present technical field of high-frequency technology, high contact quality is essential during the testing process, as poor electrical contact not only leads to increased wear and thus a reduced service life, but also to poor resistance and therefore wave matching, resulting in unwanted reflections and thus potentially faulty contact or measurement results.

[0004] In addition to the desired provision of high contact quality during the testing process, there is a need for a simple and compact design that simultaneously enables reliable actuation of the test pin device for a large number of test cycles.

[0005] DE 20 2011 001 670 U1 describes a generic test pin device with an inner housing guided in an outer housing and comprising several test pins for contacting a contact partner by means of a contact section arranged at its end, wherein the inner housing is guided section by section within the outer housing and is movable relative to it. In a force-free relative position between the inner and outer housings, these are positioned relative to each other in a rotationally secure manner to prevent rotation. After partial compression of the inner housing within the outer housing, the degrees of freedom are released such that tilting and rotation of the inner housing containing the test pins relative to the outer housing is permitted. This tolerance compensation is achieved by a [missing information] on the rear side of the device, i.e.,a guide slot arranged on a rear side of the outer housing facing away from the contact section, in the outer circumferential surface of the outer housing and a stop guided therein on the rear side of the inner housing enables.

[0006] DE 10 2005 113 815 A1 discloses a high-frequency connector comprising an inner housing with an end-mounted contact section and a mounting flange or outer housing in which the inner housing is guided. Here, an outer cone of the inner housing is adapted to an inner cone of the outer housing such that, in the non-contacted state, a form-fit tilting stability is provided without, however, providing anti-rotation protection. In the contacted or spring-loaded state of the device, deflection in the axial longitudinal direction is also prevented.

[0007] Tilting is possible. The inner cone of the mounting flange, which interacts with the outer cone of the inner housing, is located on a rear side of the mounting flange facing away from the contact section.

[0008] DE 10 2017 208 108 A1 discloses a connector for providing a detachable electrical connection. To enable simplified contacting and disconnection in the insertion and withdrawal directions, the female connector has an outer housing and an inner housing guided therein, which are arranged to slide within one another and wherein spring elements are arranged as an elastic link.

[0009] DE 20 2018 107 093 U1 discloses a contact head for a high-frequency probe device with a continuously floating bearing and guidance of an inner housing in an outer housing of the device.

[0010] US Patent 2017 / 0227579 A1 discloses a probe for measuring components of a printed circuit board, comprising several main body parts with central conductors, and a connecting element that joins the several main body parts together. The connecting element includes a recessed section with a base surface from which the tips of the several central conductors protrude.

[0011] Based on the known prior art, the object of the present invention is to provide an improved test pin device which, in addition to high contact quality during the testing process, enables a simple design and reliable operation of the test pin device. Furthermore, a compact design of the test pin device is to be provided.

[0012] This problem is solved by a device and a system according to the independent claims. The dependent claims describe advantageous embodiments of the present invention.

[0013] In a first aspect, the present invention relates to a high-frequency test probe device for releasably contacting a, preferably multi-pole, contact partner, in particular an H-MTD connector, with an inner housing having an end-arranged contact section forming at least one inner and one outer contact for interacting with the contact partner for testing purposes, wherein the inner housing is guided in an outer housing of the high-frequency test probe device and relative to it, in particular along a longitudinal axis of the device, such that in a first contact-free relative position the inner housing is arranged in a positionally secure manner about the longitudinal axis of the device and is rotationally fixed in the outer housing, and in a second relative position contacting a contact partner at least a rotation about the longitudinal axis of the device and / or a tilting in a plane perpendicular to the longitudinal axis of the device is enabled.wherein the outer housing has, on a side facing the contact section of the inner housing, a sleeve-like guide section with guide means formed on its inner circumferential surface for interaction with the inner housing.

[0014] The design according to the invention simultaneously enables precise alignment of the device with a contact partner in the first relative position and provides a tolerance for any positional and / or dimensional deviations of the contact partner in the second relative position. The arrangement and design of the guide section of the outer housing, which is configured to guide the inner housing according to the invention, simultaneously enables a structurally simple and, compared to the prior art, very compact design of the test pin device. Furthermore, the arrangement of the guide means on an inner circumferential surface, in particular compared to a slot-shaped design on the outer circumferential surface known from the prior art, prevents possible interaction with external environmental elements during testing of the device, thereby achieving high operational safety and reliability of the device.

[0015] The first relative position preferably corresponds to an end position of the inner housing within the outer housing, in which the inner housing is pre-tensioned in the outer housing by means of a force storage device, in particular a spring element such as a coil spring. The second relative position preferably corresponds to a partially compressed state of the inner housing within the outer housing in the longitudinal direction of the device.

[0016] In a preferred embodiment, the guide means are formed by a geometric feature extending along the guide section in the direction of the device's longitudinal axis on the inner circumferential surface of the guide section, which engages with a correspondingly shaped first or second outer circumferential surface and / or outer contour of the inner housing depending on its relative position. The geometric feature can have one or more recesses or projections.

[0017] In the longitudinal direction of the device along the guide section, the guide means preferably have a homogeneous geometric shape. The guide means preferably extend over the entire length of the guide section in the longitudinal direction of the device. The guide means can, in particular, be formed by a polygonal, and especially rectangular, recess in the otherwise sleeve-like and thus preferably circular inner circumferential surface of the guide section. Preferably, the corners of the geometric shape are rounded.

[0018] The guide section is preferably arranged on a side of the outer housing facing the contact section of the inner housing. The guide section is preferably arranged adjacent to a guide recess in the outer housing, which extends along the longitudinal axis of the device. In particular, this recess preferably extends from the guide section to a side of the outer housing facing away from the contact section of the inner housing. The guide recess preferably has a circular inner circumferential surface or contour.

[0019] The positionally secure arrangement in the first relative position of the inner and outer housings is preferably achieved by the guide means engaging, preferably in a form-fitting manner, a correspondingly shaped first outer circumferential surface and / or outer contour of the inner housing. Preferably, the guide means and the first outer circumferential surface and / or outer contour of the inner housing have a geometrically complementary shape to each other, such that, in particular, relative rotation about the longitudinal axis, but also tilting of the inner housing in a plane orthogonal to the device's longitudinal axis, is prevented. In the first relative position, a centering section of the inner housing can additionally engage in an end-end widening of the guide recess of the outer housing. This provides additional security, particularly against tilting of the inner housing within the outer housing.

[0020] In a preferred embodiment, the guide means are designed to limit, in the second relative position, the movement of the inner housing relative to the outer housing and, in particular, a rotation about the longitudinal axis of the device, a tilting in a plane perpendicular to the longitudinal axis of the device and / or an offset parallel to the longitudinal axis of the device to a respective maximum value, in particular to a maximum angle of rotation, a maximum angle of tilting and / or a maximum offset, by means of an interaction with a correspondingly shaped outer circumferential surface and / or outer contour of the inner housing.

[0021] The maximum rotation angle is preferably in the range of 3 to 25°, more preferably in the range of 3 to 20°, and particularly preferably in the range of 3 to 16°. The maximum tilt angle is preferably in the range of 1 to 20°, more preferably in the range of 1 to 15°, and particularly preferably in the range of 1 to 10°. The maximum offset is preferably in the range of 0.1 to 2 mm, more preferably in the range of 0.1 to 1 mm, and particularly preferably in the range of 0.1 to 0.7 mm.

[0022] In a preferred embodiment, the inner housing of the high-frequency probe device has a bearing axis section extending away from the contact section, comprising at least a first and a second area. The first and second areas, which are preferably arranged sequentially in the longitudinal direction of the device on the bearing axis section, have a first and second outer circumferential surface and / or outer contour, respectively, which engages with the guide means of the guide section in a position-dependent manner.

[0023] The first and second sections of the inner housing's bearing axis, which interact with the guide elements, have essentially the same, and in particular geometrically uniform, outer contours in cross-section. The outer contour of the first and second sections differs with respect to its geometric extent in the direction orthogonal to the device's longitudinal axis. Specifically, the outer contour of the second section has a smaller geometric extent in the direction orthogonal to the device's longitudinal axis. For example, the first and second sections can have an essentially quadrilateral geometric shape, preferably with rounded corners, with the second section having a smaller height and width of the outer contour or the shaped quadrilateral in cross-section.

[0024] The respective outer contour of the first and second regions of the bearing axis section is not limited to the example mentioned above. In particular, the respective outer contour can be essentially polygonal, especially rectangular or triangular. Preferably, the respective outer contour has rounded corners. The guide means of the guide section have or form a corresponding inner contour, which is designed for relative position-dependent interaction with the outer contour of the first and second regions of the bearing axis section of the inner housing.

[0025] By using a polygonal shape for the inner contour of the guide elements and a corresponding shape for the first or second section of the bearing axis guided within it, a direction-dependent tolerance can also be achieved, for example, by means of an elongated rectangular shape for the recess or the guide elements. In particular, this allows for a direction-dependent offset and / or tilting within different direction-dependent limits.

[0026] The contact section of the inner housing preferably has an oval or polygonal, in particular rectangular, inner and / or circumferential contour. The inner and / or circumferential contour is preferably adapted for contacting a High-Speed ​​Modular Twisted-Pair Data (H-MTD) connector. "H-MTD" is a registered trademark of Rosenberger Hochfrequenztechnik GmbH & Co. KG.

[0027] The contact section is preferably multi-pole. The contact section preferably has two internal contacts, which are preferably formed by at least two test pins arranged in the inner housing, which are known per se. These are preferably designed to be contactable at an end opposite the contact section in the longitudinal direction of the device. The test pins can be arranged in the inner housing in a selectively interchangeable manner. For this purpose, the inner housing can have locking means for the test pins, which are known per se.

[0028] In a preferred embodiment, the outer housing has a substantially homogeneous polygonal and, in particular, rectangular outer contour along the longitudinal axis of the device.

[0029] Preferably, the outer housing has a position coding achieved through geometric shaping, which is designed to interact with a receiving unit belonging to the high-frequency probe device and / or at least one further, preferably as claimed, high-frequency probe device. In particular, the position coding can be formed by a shape of the outer housing or its outer contour that varies in a longitudinal direction of the device and / or in a direction orthogonal to the longitudinal direction of the device.

[0030] The position coding of the high-frequency test probe device can be configured such that it ensures a predefined orientation of the high-frequency test probe device when inserted into a corresponding receiving unit, in particular a contact socket, for selective connection with a mounting device. The position coding can also be configured such that it ensures a predefined orientation of the high-frequency test probe device when it is arranged in a row and / or stacked with another high-frequency test probe device according to the invention. In particular, when at least two high-frequency test probe devices according to the invention are arranged side by side and / or stacked, a predefined orientation is ensured by the position coding by means of a corresponding adjacent arrangement of their respective outer housings, preferably forming surface contact.

[0031] In a preferred embodiment, the inner housing has at least one connection area arranged opposite the contact section, with locking elements projecting into it, preferably in a barb-like form, in particular in the form of at least one locking lamella. The locking elements are designed to ensure reliable contact of the conductors arranged in the inner housing, in particular the test probes, by means of corresponding connectors in the connection area.

[0032] In a further aspect, the present invention relates to a system comprising a receiving unit and at least one high-frequency probe device as described above, wherein the receiving unit is designed for the selective receiving of the at least one high-frequency probe device.

[0033] The receiving unit is preferably a contact socket, which preferably has centrally arranged receiving means or a receiving opening for receiving at least one high-frequency probe device. The receiving means or the receiving opening is adapted to the outer contour of the probe device. The receiving unit and / or the receiving means are preferably designed to interact with the position encoding of the high-frequency probe device, such that receiving the high-frequency probe device is only possible in a predefined, in particular rotational, orientation. Preferably, the receiving unit has at least one receiving element that can interact with a positioning element of the position encoding of the high-frequency probe device.In a further preferred embodiment, the receiving means of the receiving device are designed to receive at least two or four high-frequency probe devices. These can be arranged in the receiving means in a row and / or stacked on top of each other.

[0034] To avoid repetition, reference is made to the above description of the high-frequency probe device according to the invention. The features disclosed therein shall also be deemed disclosed and claimable for the system according to the invention, and vice versa.

[0035] Details, advantageous effects and specifics of the present invention are explained below with reference to the purely schematic, merely exemplary drawings.

[0036] It shows: Fig. 1a: a high-frequency test pen device according to a preferred embodiment of the invention in perspective side view; Fig. 1b: the embodiment according to Fig. 1a in perspective side view rotated by 180°; Fig. 1c: the embodiment according to Fig. 1a, Fig. 1b looking down at the high-frequency test probe device; Fig. 1d: the embodiment according to Fig. 1a, Fig. 1b Side view of the high-frequency probe device; Fig. 1e: a front view of the embodiment according to Fig. 1a-1d; Fig. 2a: a side sectional view of the top view according to Fig. 1c in a contactless first relative position of the inner and outer housing of the high-frequency test probe device; Fig. 2b: a lateral sectional view of the side view according to Fig. 1d in a contactless first relative position of the inner and outer housing of the high-frequency probe device; Fig. 2c: a perspective sectional view of a guide section of the outer housing in a contactless first relative position of the inner and outer housing of the high-frequency test probe device; Fig. 3a: a side sectional view of the top view according to Fig. 1c in a partially spring-loaded, second relative position of the inner and outer housing of the high-frequency test probe device; Fig. 3b: a perspective side view of the device according to Fig. 1 in a second relative position of the inner and outer housing of the high-frequency test probe device contacting a contact partner; Fig. 3c: a perspective sectional view of a guide section of the outer housing in a second relative position of the inner and outer housing of the high-frequency test probe device, contacting a contact partner; Fig. 3d: a perspective sectional view of the device in a second relative position of the inner and outer housing of the high-frequency probe device, contacting a contact partner; Fig. 4: a perspective side view of the system according to the invention, showing the high-frequency probe device according to the invention and an associated recording unit; Fig. 5a: a perspective side view of two high-frequency probe devices according to the invention, inserted into an alternative embodiment of an associated receiving unit; Fig. 5b: a top view of the system according to Fig. 5a; Fig. 6a: a perspective side view of the system according to the invention with a third embodiment of the recording unit according to the invention; and Fig. 6b: a top view of the system according to Fig. 6a.

[0037] Fig. Figures 1a-1e show a preferred embodiment of the high-frequency test probe device 10 according to the invention. This device has an inner housing 1 with an end-mounted contact section 4 forming at least one inner and one outer contact. This contact section has at least one inner contact 4a, preferably at least two inner contacts 4a, 4b, which are arranged in a preferably common outer or ground contact 4c. This outer or ground contact has an oval or polygonal inner contour for external contacting of a contact partner. The inner contacts 4a, 4b are connected by two test probes 8a, 8b, which are preferably interchangeable and known per se (see Figure 1a). Fig. 2b) formed or comprised of these, which are arranged or stored in the inner housing 1.

[0038] The high-frequency probe device 10 also has an outer housing 2 in which the inner housing 1 is at least partially mounted and guided. The inner housing 1 is movably guided in the outer housing 2 essentially along a longitudinal axis L of the device. A force storage element 3, preferably a spring element, arranged between the inner and outer housings 1, 2, provides a preload force that holds the device in the contactless end position or first relative position between the inner and outer housings 1, 2 shown.

[0039] On the rear side of the high-frequency test probe device 10, at an end section opposite the contact section 4, a connection section 9 is provided on the inner housing 1, at which the electrical signals detected and transmitted by the inner and outer contacts 4a, 4b, 4c can be coupled out, transmitted, or passed on. The connection section 9 preferably comprises a contact area 9a, in particular a connection lamella extending along the longitudinal axis L of the device, for the common outer or ground contact 4c, which is arranged circumferentially on the inner housing 2. Furthermore, the connection section 9 comprises connection areas 9b and 9c (see Figure 1). Fig. 2a, Fig. 2b) for the inner contacts 4a, 4b, which is provided on the inner housing 1. Into these contacts, respective contact sections 13a, 13b of the test pins 8a, 8b forming the inner conductors project, which are guided through corresponding longitudinal bores in the inner housing 1 to the connection section 9. The respective connection area 9b, 9c preferably has locking elements 14 projecting into it, in particular at least one locking lamella 14. This lamella projects in a barb-like form in the opposite direction to the removal of a connector into the respective connection area 9b, 9c and is designed to ensure secure contact of the contact sections 13a, 13b by means of corresponding connectors.

[0040] The outer housing 2 can have a position coding 5 by means of geometric shaping. This is for interaction with a receiving unit 30 belonging to the test pin device (see figure). Fig. 4) and / or at least one further preferably claimed high-frequency test probe device 10' (see Fig. 5a, Fig. 6a). In particular, the position coding 5 is designed such that it ensures a predefined orientation of the high-frequency test probe device 10 when inserted into the receiving unit 30 and / or when aligned and / or stacked with a further high-frequency test probe device 10', 10'' according to the claim. The outer housing 2 preferably has a substantially polygonal, in particular rectangular, outer contour in the direction of the device's longitudinal axis L.

[0041] The position coding 5 can include at least one positioning element 5a extending along the longitudinal axis L of the device, in particular a keyway. On an opposite outer housing side 15c, a corresponding receiving element 5b, in particular a complementary one, is arranged in the form of a correspondingly shaped groove (see Figure 1). Fig. 1b). The positioning element 5a is preferably designed to engage with a correspondingly shaped receiving element 5c of a receiving unit 30 belonging to the high-frequency test pin device 10 (see Figure 1b). Fig. 4) and thus ensures a desired alignment of the high-frequency test pin device 10 in the receiving unit.

[0042] The position coding 5 can additionally include a shaped plate 6 arranged on the end face of the outer housing 2 and facing the contact section 4 of the inner housing 1. This plate is arranged in a plane orthogonal to the longitudinal axis L of the device or extends in this plane. As in Fig. As can be seen in Figure 1e, the form plate 6 protrudes at least partially from at least one of the outer housing sides 15a. This enables, in particular, a positionally secure resting of the outer housing 2 on an end face 30a of a receiving unit 30 belonging to the high-frequency test pin device 10 (see Figure 1e). Fig. 4) The mold plate 6 can also have a projection and / or recess 6a,7a extending orthogonally to the longitudinal axis L of the device, as well as a corresponding, in particular complementary, receiving element 6b,7b on an opposite side of the housing on the mold plate 6.

[0043] Fig. Figures 2a-2c show a contactless first relative position of the inner and outer housings 1,2 of the high-frequency test probe device 10. In the embodiment described below, the inner housing 1 is guided or mounted in the outer housing 2 such that, in the first contactless relative position shown, the inner housing 1 is arranged in a positionally secure manner and, in particular, is rotationally fixed about a longitudinal axis L in the outer housing 2.

[0044] As in Fig. 2a and Fig. As shown in Figure 2b, the inner housing 1 has a bearing axis section 16 with a varying outer contour extending axially between the contact section 4 and a connection section 9 formed at the other end. This bearing axis section is at least partially received or guided in a guide recess 19 of the outer housing 2 extending along the longitudinal axis L of the device.

[0045] The inner housing 1 and outer housing 2 are pre-tensioned against each other and axially pressed apart by the action of the spring element 3, in particular a coil spring, wherein the coil spring 3 engages at one end a first annular shoulder 1a of the inner housing and at the other end a second annular shoulder 2a of the outer housing 2 opposite the inner housing 2 along the longitudinal axis L of the device, thus driving the inner housing 1 and outer housing 2 apart. A maximum stroke is limited by a centering section 17a of the inner housing 1, arranged on its outer surface, or by an associated annular shoulder 17b, which engages in an end-side expansion of the outer housing 2 or rests against an end-side annular shoulder 2b of the outer housing 2.

[0046] Extending in the direction of the contact section 4 of the inner housing 1, the bearing axis section 16 of the inner housing preferably has a first and second region 16a, 16b, which interact differently with the outer housing 2 depending on the relative position of the inner and outer housings 1, 2. In the embodiment shown, the bearing axis section 16 has a first region 16a, a second region 16b and a third region 16c, wherein the third region 16c is arranged adjacent to the contact section 4, followed by the second region 16b, and in turn followed by the first region 16a.

[0047] The bearing axis section 16 is designed for the selective interaction of at least the first and second areas 16a,16b with the guide recess 19 of the outer housing 2 and in particular with a sleeve-like guide section 11 of the guide recess 19, which is arranged on a side of the outer housing 2 facing the contact section 4.

[0048] The first and second regions 16a, 16b of the bearing axis section 16 preferably have a varying outer contour or specifically shaped outer circumferential surface 12a, 12b, which allow for different relative movement of the respective region and thus different relative movement of the inner and outer housings 1, 2. In the first relative position shown, the first region 16a of the bearing axis section 16 is in engagement with the guide section 11. The outer contour or outer circumferential surface 12a in the first region 16a has a greater radial extent and thus a larger diameter or width compared to the outer contour or outer circumferential surface 12b in the second region 16b.

[0049] The guide section 11 has guide means 11a which comprise or are formed by a geometrically and preferably polygonally shaped recess in the guide section 11 extending along the guide section 11 in the longitudinal direction L of the device. As in Fig. As shown in Figure 2c, the guide means 11a engage with the specifically shaped outer contour or outer circumferential surface 12a of the first region 16a in the first relative position shown, such that relative movement of the inner housing 1 to the outer housing 2, and in particular rotation about the longitudinal axis L as well as tilting and / or displacement in a plane orthogonal to the longitudinal axis L, is prevented. The corresponding shape of the guide means 11a and the outer contour 12a is, in this case, essentially rectangular or square with rounded corners. However, the outer contour 12a can also have other shapes, particularly polygonal ones, which engage with correspondingly shaped guide means 11a.In this case, the essentially rectangular outer contour 12a rests on correspondingly rectangular guide means 11a in surface contact and circumferentially, so that rotation, tilting and displacement of the inner housing 1 relative to the outer housing 2 is prevented.

[0050] In the first relative position, a cylindrical area 17c of the inner housing 1 can additionally engage in the guide recess 19 of the outer housing, in particular in a rearwardly arranged, preferably hollow cylindrical, area. This provides a second contact or bearing point of the inner housing 1 in the outer housing 12 at a distance from the guide means 11a, thereby achieving additional securing, in particular against tilting of the inner housing 1 in the outer housing 2.

[0051] When the inner housing 1 is now partially inserted into the outer housing 2 upon contact with a contact partner 50, in this case an H-MTD connector (second relative position), the second area 16b of the bearing axis section 16 of the inner housing 1 is now in engagement with the guide section 11 of the outer housing 2 (see figure). Fig. 3a-3d).

[0052] The second area 16b, analogous to the first area 16a, has a substantially rectangular outer contour or outer circumferential surface 12b with rounded corners. However, this is smaller in dimension than the first area 16a, perpendicular to the longitudinal direction of the device axis, so that there is a substantial circumferential distance d between the outer contour 12b and the guide means 11a of the guide section 11 (cf. Fig. 3c) arises. The distance d provided in this second relative position is preferably formed homogeneously around the circumference by appropriately dimensioning the guide means 11a and the outer contour 12b engaging with them. This allows rotation, tilting, and offset of the inner housing 1 relative to the outer housing 2 in the second relative position to compensate for tolerances when contacting the contact partner 50. At the same time, a respective maximum value for rotation, tilting, and / or offset is set by appropriately coordinating the guide means 11a and the outer contour 12b.By varying the guide means 11a and / or the outer contour 12b, the distance d can also be designed differently depending on the direction, so that a direction-dependent tolerance compensation could also be provided, for example by means of an essentially elongated rectangular cutout as guide means 11a.

[0053] The third area 16c of the bearing axis section 16 of the inner housing shown in the figures preferably has a circular outer contour 12c. This primarily serves for the centric mounting of the spring element 3.

[0054] Fig. Figures 4-6 show the high-frequency probe device according to the invention inserted into a respective associated receiving unit, which is designed in particular for arranging the high-frequency probe device on a mounting device. The additional position coding of the high-frequency probe device ensures a predefined orientation of the device.

[0055] As in Fig. As shown in Figure 4, the receiving unit 30 is designed for the selective receiving of the high-frequency test probe device 10 and for connection with a fastening device 40. For this purpose, the receiving unit 30 has a preferably centrally arranged receiving opening 31 for receiving at least one high-frequency test probe device 10. The receiving opening 31 is adapted to the outer contour of the high-frequency test probe device 10. The receiving unit has at least one receiving element 5c, which can interact with a positioning element 5a of the position coding 5 of the high-frequency test probe device. When the high-frequency test probe device 10 is inserted into the receiving opening 31, the forming plate 6 and / or a positioning element of the forming plate rests at least partially on the end face 30a of the receiving unit 30, thus ensuring a predefined insertion depth.To secure the high-frequency test probe device 10 against falling out of the receiving opening, the rear contact of the high-frequency test probe device 10 to connection section 9 serves. In addition, locking devices known per se may be provided which secure the high-frequency test probe device 10 in the receiving opening. Fig. Hold the position shown in 4 in the receiving opening 31.

[0056] The receiving unit 30 preferably has two bores 32a, 32b, which serve to securely connect the receiving unit 30 to a fastening device 40, in particular by means of a screw connection. The preferably axially parallel bores 32a, 32b can be aligned with a predetermined mounting grid of a fastening device 40 with regard to their dimensions and / or relative position.

[0057] Fig. 5a and Fig. Figure 5b shows a further embodiment of the receiving unit 30'. This has a difference compared to the first, in Fig. In the embodiment shown in Figure 4, a recess 31' is enlarged twice in height or width (in plan view). This dimensioned recess 31' can thus accommodate two preferably identical high-frequency test probe devices 10, 10'. The relative position of the high-frequency test probe devices 10, 10' is determined by the provided position coding 5 not only to each other but also with respect to their arrangement relative to the receiving unit 30'. In particular, the high-frequency test probe devices 10, 10' can be stacked on top of each other in a predefined arrangement by interlocking the respective positioning elements 5a, 5b, 7a, 7b, so that a polarity reversal of the high-frequency test probe devices 10, 10' in the receiving unit 30 can be avoided. This is analogous to the embodiment shown in Figure 4. Fig. 4 The general orientation of the high-frequency test probe devices 10, 10' to the receiving unit 30' is defined by the engagement of at least one positioning element 5a with a receiving element 5c of the receiving unit 30'. By means of the receiving unit 30' associated with the high-frequency test probe devices 10, 10", the present arrangement for contacting and testing a multi-pin connector can be extended in the simplest way possible while maintaining simple and safe handling of the high-frequency test probe device(s) 10, 10'.

[0058] Fig. 6a and Fig.Figure 6b shows a further embodiment of the receiving unit 30''. Compared to the first embodiment, this now has a recess 31'' that is twice as large in height and width (in plan view). The recess 31'', dimensioned in this way, can thus accommodate four preferably identical high-frequency test probe devices 10, 10', 10'', 10'''. Here, the relative position of the high-frequency test probe devices 10, 10', 10'', 10''' is determined by the provided position coding 5, analogous to the previous embodiment, not only with respect to each other but also with respect to their arrangement relative to the receiving unit 30''. For this purpose, the receiving unit 30'' has two correspondingly arranged receiving elements 5c.In particular, the high-frequency test probe devices 10,10',10'',10''' can be stacked and lined up in a predefined arrangement by interlocking the respective positioning elements 5a,5b,6a,6b,7a,7b, so that a reversal of the polarity of the high-frequency test probe devices 10,10',10'',10''' in the receiving unit 30" can be avoided.

Claims

[1] High-frequency test probe device (10) for releasably contacting a, preferably multi-pole, contact partner (50), in particular an H-MTD connector, with an inner housing (1) having an end-arranged contact section (4) forming at least one inner and outer contact (4a, 4b; 4c) for interaction with the contact partner (50) for testing purposes, wherein the inner housing (1) is guided in an outer housing (2) of the high-frequency test probe device (10) and relative to it, in particular along a longitudinal axis (L) of the device, such that in a first contact-free relative position the inner housing (1) is arranged in the outer housing (2) in a position-secure manner about the longitudinal axis (L) of the device and is rotationally fixed, and in a second relative position contacting a contact partner (50) at least a rotation about the longitudinal axis (L) of the device and / or a tilting in a plane perpendicular to the longitudinal axis (L) of the device is permitted. becomes, characterized by, that the outer housing (2) has on a side facing the contact section (4) of the inner housing (1) a sleeve-like guide section (11) with guide means (11a) formed on its inner circumferential surface for interaction with the inner housing (1). [2] High-frequency test probe device according to claim 1, characterized by , that the guide means (11a) are formed by a geometric shaping extending along the guide section (11) in the direction of the device longitudinal axis (L), in particular at least one recess and / or projection, in the inner circumferential surface of the guide section, which engages with a correspondingly shaped first or second outer circumferential surface and / or outer contour (12a,12b) of the inner housing (1) depending on the relative position. [3] High-frequency test probe device according to claim 1 or 2, characterized by, that the guide means (11a) along the guide section (11) in the longitudinal direction (L) of the device have a homogeneous geometric shape. [4] High-frequency test probe device according to one of claims 1 to 3, characterized by , that the guide means (11a) are formed by a polygonal, and in particular rectangular, recess in the inner circumferential surface of the guide section (11) with, preferably rounded, corners. [5] High-frequency probe device according to one of the preceding claims, characterized by , that the position-secure arrangement in the first relative position is realized by a, preferably positive-locking, engagement of the guide means (11a) in a correspondingly shaped first outer circumferential surface and / or outer contour (12a) of the inner housing (1). [6] High-frequency test probe device according to claim 5, characterized by, that in the first relative position, an additional centering section (17a) of the inner housing (1) engages in an end-side widening of the outer housing inner circumference. [7] High-frequency probe device according to one of the preceding claims, characterized by , that the guide means (11a) are designed to limit, in the second relative position, by means of an interaction with a correspondingly shaped outer circumferential surface and / or outer contour (12b) of the inner housing (1), the movement of the inner housing (1) relative to the outer housing (2), and in particular a rotation about the longitudinal axis (L) of the device, a tilting in a plane perpendicular to the longitudinal axis (L) of the device and / or an offset parallel to the longitudinal axis (L) of the device to a respective maximum value, in particular to a maximum angle of rotation, a maximum angle of tilting and / or a maximum offset. [8] High-frequency probe device according to claim 7, characterized bythat the maximum angle of rotation is in the range of 3 to 25°, preferably in the range of 3 to 20°, particularly preferably in the range of 3 to 16°. [9] High-frequency probe device according to claim 7 or 8, characterized by that the maximum tilt angle is in the range of 1 to 20°, preferably in the range of 1 to 15°, particularly preferably in the range of 1 to 10°. [10] High-frequency test probe device according to any one of claims 1 to 9, characterized by , that the maximum offset is in the range of 0.1 to 2 mm, preferably in the range of 0.1 to 1 mm, particularly preferably in the range of 0.1 to 0.7 mm. [11] High-frequency test probe device according to one of the preceding claims, characterized by, that the inner housing (1) has a bearing axis section (16) extending away from the contact section (4) with at least one first and second area (16a,16b) and a respective first and second outer circumferential surface and / or outer contour (12a,12b) which engage with the guide means (11a) of the guide section (11) depending on the relative position. [12] High-frequency test probe device according to one of the preceding claims, characterized by , that a first and second area (16a,16b) of a bearing axis section (16) of the inner housing (1) cooperating with the guide means (11a) has an essentially similar, in particular geometrically uniform, outer contour in cross-section, the respective geometric extent of which is different in the direction orthogonal to the device longitudinal axis (L). [13] High-frequency probe device according to claim 12, characterized by, that the respective outer contour of the first and second areas (16a,16b) of the bearing axis section (16) is essentially polygonal, in particular rectangular, and preferably has rounded corners. [14] High-frequency probe device according to one of the preceding claims, characterized by that the contact section (4) is multipole and has at least two internal contacts (4a,4b), preferably formed by at least two test pins (8a,8b) arranged in the inner housing (1). [15] High-frequency probe device according to one of the preceding claims, characterized by , that the contact section (4) has an oval or polygonal inner and / or circumferential contour. [16] High-frequency test probe device according to one of the preceding claims, characterized by , that the outer casing (2) has a substantially homogeneous rectangular outer contour along the longitudinal axis (L) (10) of the device, [17] High-frequency test probe device according to one of the preceding claims, characterized by , that the outer housing (2) has a position coding (5) by geometric shaping, which is designed to interact with a receiving unit (30) belonging to the high-frequency test pin device (10) and / or at least one further test pin device (10'), preferably according to the claim. [18] High-frequency test probe device according to one of the preceding claims, characterized by , that the inner housing (1) has at least one connection area (9a) arranged opposite the contact section (4) with locking means (14) projecting into it, preferably in a barb-like form, in particular in the form of at least one locking lamella. [19] System comprising a receiving unit (30) and at least one high-frequency test pin device (10) according to one of the preceding claims, wherein the receiving unit (30) is designed for selectively receiving the at least one test pin device (10) and for connecting it to a fastening device (40).

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