Force-measuring film, motion automaton with force-measuring film and method for controlling the motion automaton using the force-measuring film

Abstract

Motion automaton (100) with: - at least one movement element (110), and - a force-measuring film (200) attached to a surface of the moving element (110) for detecting a contact force (KF) acting on the moving element (110), wherein the force-measuring film has: - a top layer (210) to absorb the contact force (KF), - an application layer (220) with which the force-measuring film (200) is attached to the surface, as well as - a sensor layer (230) which is designed such that - the electrical resistance of the sensor layer (230) changes as a function of the contact force (KF) acting on the force-measuring film (200), and - at least one measurement signal based on electrical resistance (MSa, MSb) can be tapped, characterized in that - the top layer (210) has at least a partially transparent protective film (211), wherein - the protective film is printed on the back, or - a substantially opaque decorative film (212) is arranged on the inside of the protective film (211).

Description

[0001] The invention relates to a force-measuring film for detecting a contact force acting on the force-measuring film. Furthermore, the invention relates to a motion automaton comprising one or more force-measuring films. In particular, the invention relates to a medical device comprising one or more force-measuring films. The invention further relates to the use of the force-measuring film for controlling the movement of a motion automaton or medical device. The invention also relates to a computer-implemented method for controlling the movement of a motion automaton or medical device comprising one or more force-measuring films.

[0002] With increasing automation, more and more movements of devices with one or more moving elements are being automatically controlled, not only in medical technology. Such devices are called motion machines. Actuators built into the motion machines, such as motors, servos, hydraulic systems, etc., are controlled by corresponding control units to move the moving elements (or motion elements) of these motion machines in a targeted manner.

[0003] In medical technology, motion automation systems can include (or be included in) medical devices such as imaging systems, patient positioning devices, or medical robots used for the examination and / or treatment of a patient. Motion elements, such as automatically adjustable arms, attachments, lifting elements, handling elements, etc., can position medical positioning, interventional, or examination devices. An examination device, for example, might include a detector or radiation source of a medical imaging modality, such as an X-ray detector in a C-arm X-ray machine. An interventional device, for example, might include a radiotherapy device such as an ion source.

[0004] One challenge in automation lies in controlling the motion of the moving elements. It must be ensured that a movement is stopped if, for example, collisions occur within the motion machine or with external objects. This becomes more complex when interacting with human users or operators, whose behavior is unpredictable. For safety reasons, moving elements must also only touch users or operators with a maximum force, and it must be guaranteed at all times that a movement is stopped immediately if an increased force indicates contact with a user.

[0005] Traditionally, a wide variety of sensors are installed in such motion controllers. For example, these sensors can include force sensors in the housing bearings of the motion controllers, torque sensors in the rotary bearings of the motion controllers, load sensors in the actuators of the motion controllers, or mechanical pushbuttons and capacitive sensor surfaces in or on the housing of the motion controllers.

[0006] The sensors mentioned above, and others, often cannot currently meet all the requirements placed upon them. For example, sensors integrated into the mechanics of a device do not allow for direct measurement of the forces acting upon them. As a result, depending on the point of contact and the lever arm, high forces can be exerted on a user before a movement is stopped. Furthermore, many measuring systems are unsuitable for use in medical devices, as their high electromagnetic fields can interfere with the sensors. In addition, these sensors are often expensive.

[0007] JP 2018 / 185 273 A discloses a robot with a contact force sensor. DE 103 411 60 A1 discloses a sensor for high-resolution measurement of force and pressure profiles. EP 3 726 191 A1 and DE 11 2019 006 091 T5 disclose pressure sensors.

[0008] It is an object of the present invention to provide a motion automaton in which improved measurement of a contact force is ensured. Furthermore, it is an object of the present invention to provide an improved measuring device for measuring a contact force in a motion automaton. In addition, it is an object of the present invention to provide a method for controlling a motion automaton using the measuring device.

[0009] These and other tasks are solved by a motion automaton, a method for controlling the motion automaton, and a force-measuring film for detecting a contact force. Advantageous further developments are specified in the dependent claims.

[0010] According to one aspect, a motion automaton is provided which has at least one moving element and a force-measuring film attached to a surface of the moving element for detecting a contact force acting on the moving element. The force-measuring film has: a cover layer for receiving the contact force, an application layer with which the force-measuring film is attached to the surface, and a sensor layer which is designed such that the electrical resistance of the sensor layer changes as a function of the contact force (transmitted from the cover layer to the sensor layer) and at least one measurement signal based on the electrical resistance can be tapped.

[0011] The motion machine can have at least one functional element for performing an action. The motion machine can have one or more axes of movement around or along which a movement for positioning the functional element can occur. A movement of the motion machine can be freely programmable (i.e., without mechanical or human intervention) with respect to a sequence of movements, including movement paths or angles for positioning the functional element. Furthermore, such a movement can be sensor-guided. The motion machine can have one or more actuators for performing a movement. One or more of the actuators can be designed as an electric motor, servo motor, and / or hydraulic actuator, etc. The motion machine can have one or more sensors for controlling a movement. In particular, the motion machine can be universally applicable.

[0012] The motion machine can have one or more moving elements that can be moved in space by a movement of the motion machine, for example, as part of a sequence of movements. In particular, one or more actuators of the motion machine can be provided for each moving element to move it. The moving element can be a connecting element movable about an axis of the motion machine, such as an arm or rotary element. The moving element can also be an element movable along an axis of the motion machine, in particular an element that can be extended and retracted, such as a lifting or telescopic element. A functional element for performing an action can be attached to at least one of the moving elements. A sequence of movements of a moving element can result, in particular, from a sequence of movements of other moving elements of the motion machine.

[0013] A contact force can be understood as a mechanical load or force acting on a moving element or on a force-measuring film attached to a surface of the moving element. The contact force can be mediated, for example, by an object that comes into contact with the moving element or the force-measuring film and exerts a mechanical force or load on it. The object can come into contact with the moving element or exert a force through its own movement and / or through movement of the moving element within the motion machine. The object can be an external object outside the motion machine. The object can be an internal object within the motion machine. The object can be, for example, a fixed or movable spatial obstacle to a movement sequence of the moving element. For example, the object can be a human user or operator of the motion machine.

[0014] The force-sensing film is designed to detect a contact force acting upon it and thus upon the moving element located beneath it. For this purpose, the force-sensing film incorporates a sensor layer. This sensor layer is designed such that a contact force acting upon the force-sensing film can be detected by an electrical resistance that varies depending on the applied contact force. In other words, the sensor layer can be described as a piezoresistive force-sensing element. Furthermore, the force-sensing film can be described as a piezoresistive force-sensing film. In particular, the sensor layer can be arranged between the top layer and the cover layer.

[0015] To provide such piezo-resistive properties, the sensor layer can have a piezo-resistive material or one or more piezo-resistive elements which, individually or in combination, provide a piezo-resistive property of the force-measuring film.

[0016] The phrase "variable as a function" or "depending on" the contact force can mean, in particular, that the force-measuring film or sensor layer provides at least two different electrical resistance values ​​at different values ​​of the applied contact force. In embodiments, the electrical resistance of the force-measuring film or sensor layer can increase or decrease, at least section by section, with increasing contact force. In particular, the electrical resistance of the force-measuring film or sensor layer can increase or decrease, at least section by section, proportionally to an increasing contact force. Furthermore, the sensor layer can be designed such that a threshold value with respect to the applied contact force must be overcome before the electrical resistance of the force-measuring film or sensor layer changes.

[0017] The electrical resistance of the force-sensing film or sensor layer is determined by means of one or more measured values ​​that can be tapped from the force-sensing film or sensor layer. These measured values ​​can be, for example, electrical currents. To enable the tapping of these measured values, the force-sensing film or sensor layer can have one or more electrical connections, which can be part of an interface of the force-sensing film or be connected to one.

[0018] The force-sensing film, and thus the layers it contains, can be flexible, at least in sections. In particular, flexibility can mean that the force-sensing film and the layers it contains can be bent to a certain degree in one or more directions without being damaged.

[0019] For example, the force-sensing film can have a thickness of 50 µm to 10 cm. Preferably, the force-sensing film has a thickness of 1 mm to 20 mm.

[0020] The cover layer can generally refer to the surface or layer of the force-sensing film facing outwards, i.e., away from the moving element or the mounting layer. The cover layer can be part of the sensor layer or be formed separately from it. The cover layer can be designed to protect the force-sensing film, and in particular the sensor layer, from environmental influences and / or to identify the force-sensing film by means of back printing or printing. The cover layer can, for example, be made of or comprise a plastic material. In particular, the cover layer can be made of or comprise a polymer material.

[0021] The mounting layer can generally refer to a surface or layer of the force-sensing film that allows the film to be attached to a surface. The mounting layer can be designed to attach the force-sensing film to a surface. That is, the mounting layer can be designed to provide a contact or mounting surface to that surface. The mounting layer can be part of the sensor layer or be separate from it. The mounting layer can have one or more mounting elements for attaching the force-sensing film to a surface. For example, these mounting elements can include recesses into which corresponding protruding fasteners of the surface can engage, or the mounting elements can include protruding fasteners that can engage in corresponding recesses in the surface.In particular, the application layer can comprise, at least in sections, an adhesive material for bonding the force-measuring film to the surface. The application layer can, for example, be made of or comprise a plastic material. In particular, the application layer can be made of or comprise a polymer material.

[0022] By providing a motion controller with a piezoresistive force-sensing film, a system is created with a cost-effective, easy-to-install, and flexibly adaptable force-sensing component for controlling the motion controller. In particular, the film design with the described layer structure allows for flexible attachment to the motion elements of the motion controller. The piezoresistive properties enable the implementation of a cost-effective contact force measurement system. Furthermore, piezoresistive measurement is less susceptible to interference than other measurement principles, as piezoresistive properties are less affected by the high electromagnetic fields often found in the vicinity of motion controllers.

[0023] According to one aspect, the motion automaton is designed as a medical technology device and has a medical intervention and / or examination device that is attached (directly or indirectly) to the motion element and can be moved spatially by moving the motion element.

[0024] The medical intervention and / or examination device can be designed as a functional element of the motion automaton. In particular, the medical device can have an imaging modality. For example, the medical intervention and / or examination device can include a functional element for medical imaging, such as an X-ray emitter, an X-ray detector, an ultrasound probe, a (movable) patient table, a magnetic resonance tunnel, etc. Furthermore, the medical intervention and / or examination device can include a component for performing a therapeutic procedure on a patient, such as a surgical robot for performing a minimally invasive procedure, a radiation source, etc.

[0025] According to one aspect, the motion automaton also has a control device designed to control a movement of the motion element based on the at least one measurement signal, and in particular to stop a movement of the motion element if the measurement signal or a contact force based thereon exceeds a threshold value.

[0026] The control unit can be in data communication with the force-sensing film to receive the measurement signals. Based on these signals, the control unit can provide one or more control commands suitable for controlling the moving element. The control unit can also be in data communication with one or more actuators of the motion machine to provide these control commands. Furthermore, the control unit can be configured to determine a contact force acting on the force-sensing film or the moving element based on the measurement signal(s). Finally, the control unit can be configured to compare the measurement signal(s) or the determined contact force with a predetermined threshold value.

[0027] The computing device can, for example, include one or more processors. The computing device can comprise a computing unit or part of a computing unit of the motion automaton.

[0028] According to one aspect, the force measuring film has an interface for establishing a data connection (e.g. with the computing device) or for transmitting the measurement signals, whereby the interface is designed in particular as a wireless interface.

[0029] The interface allows the measurement signals to be transmitted. Its wireless design enables the force-measuring film to be easily connected to control devices or similar equipment without obstructing, for example, the motion controller or the user with cables.

[0030] The wireless interface can be, for example, a WLAN, Bluetooth, or ZigBee interface. As an alternative to a wired or wireless interface, the interface can also be a wired interface (e.g., a USB interface) and / or have both wireless and wired channels.

[0031] According to one aspect, the force-measuring film also includes a power supply device for operating the force-measuring film.

[0032] The power supply device can include a current-carrying conductor to ensure a wired power supply for the force-measuring film. Power can be supplied via the interface.

[0033] Alternatively or additionally, the power supply device can include a battery, particularly in the form of a rechargeable battery. The latter has the advantage that the force-measuring film can be positioned freely in space without having to consider connecting cables. For charging the rechargeable battery, the power supply device can also have a battery interface via which the battery can be recharged.

[0034] According to one aspect, the control device is also designed to perform a functional check of the force-measuring film.

[0035] The functional check ensures that the force-measuring film works correctly and provides reliable measured values ​​for the control of the motion controller.

[0036] According to one aspect, the sensor layer comprises a first and a second sensor layer. The first sensor layer is designed such that its electrical resistance changes as a function of the contact force acting on the force-measuring film (or the cover layer), and a first component of the measurement signal can be tapped from the first sensor layer, this first component being based on the electrical resistance of the first sensor layer. The second sensor layer runs essentially parallel to the first sensor layer and is designed such that its electrical resistance also changes as a function of the contact force acting on the force-measuring film (or the cover layer), and a second component of the measurement signal can be tapped from the second sensor layer, this second component being based on the electrical resistance of the second sensor layer.

[0037] In particular, the first part of the measurement signal is independent of the second part of the measurement signal, and vice versa. Specifically, the first sensor layer is electrically isolated from the second sensor layer.

[0038] In other words, a two-layer sensor layer is provided, in which the first and second sensor layers are arranged on top of each other.

[0039] The dual-layer design of the sensor layer enables dual-channel measurement of the contact force (using the first and second components of the measurement signal). This provides redundancy should one sensor layer fail. Furthermore, it allows for mutual verification of the two channels, which can improve the reliability and accuracy of the measurement.

[0040] According to one aspect, the control device is designed to control a movement of the moving element based on the two components of the measurement signal, and in particular to stop a movement of the moving element if at least one of the components of the measurement signal exceeds a threshold value.

[0041] By taking both channels into account in the control device, even more reliable control and, in particular, interruption of an ongoing movement can be achieved.

[0042] According to one aspect, the sensor layer has a conductive layer and a measuring layer. The measuring layer has a measuring electrode arrangement for detecting the measurement signal, and the measuring electrode arrangement is spaced away from the conductive layer if no contact force acts on the force-measuring film (or the cover layer) (the sensor layer is designed such that the measuring electrode arrangement is spaced away from the conductive layer if no contact force acts on the force-measuring film or the cover layer).

[0043] Furthermore, the sensor layer can be designed such that the measuring electrode arrangement comes into contact with the conductive layer if a contact force acts on the force-measuring film (or the cover layer). In particular, the sensor layer can be designed such that the measuring electrode arrangement comes into contact with the conductive layer if a contact force acts on the force-measuring film (or the cover layer) that is greater than a contact force threshold value (defined by the sensor layer).

[0044] According to embodiments of the invention, the first and / or the second sensor layer can each have a measuring layer and a conductive layer, which can be designed as described herein.

[0045] In other words, the conductive layer and the measuring layer interact to form a sensor element whose electrical resistance changes depending on the contact force acting on the force-sensing film. Specifically, when the measuring electrode arrangement makes contact with the conductive layer, the electrical resistance of the conductive layer changes. This implementation represents a simple, cost-effective, and robust way to create a piezoresistive measuring element. Optionally, contact can be made only above a certain contact force threshold to ensure that only significant contact forces are detected, thus preventing excessive sensitivity of the force-sensing film.

[0046] According to one aspect, the sensor layer has a spacer layer arranged between the conductive layer and the measuring layer, which is designed such that, if no contact force acts on the sensor layer, the spacer layer creates a distance between the conductive layer and the measuring layer, and, if a contact force acts on the sensor layer, the spacer layer allows contact between the conductive layer and the measuring layer.

[0047] In particular, the spacer layer can be designed such that, once a contact force threshold (defined by the spacer layer) is exceeded, the spacer layer allows contact between the conductive layer and the measuring layer. In particular, the spacer layer can be designed such that, with increasing contact force acting on the sensor layer, the spacer layer allows increasing contact (e.g., through an increasing contact area) between the conductive layer and the measuring layer.

[0048] For example, the spacer layer can be at least partially made of a material that is at least partially elastic. For example, the spacer layer can be made of or contain a plastic material. For example, the spacer layer can have an adhesive material on both sides to create a bond between the conductive layer and the measuring layer. For example, the spacer layer can have one or more recesses / passages to allow contact between the conductive layer and the measuring layer.

[0049] According to one aspect, the measuring electrode arrangement has a first electrode structure and a second electrode structure, wherein the second electrode structure is electrically isolated from the first electrode structure.

[0050] The sensor layer can be configured such that, when a contact force acts on the sensor element, the measuring electrode arrangement comes into contact with the conductive layer, establishing an electrical connection between the first and second electrode structures via the conductive layer. In particular, the sensor layer can be configured such that, when a contact force acts on the sensor element that exceeds a contact force threshold (defined by the sensor layer), the measuring electrode arrangement comes into contact with the conductive layer, establishing an electrical connection between the first and second electrode structures via the conductive layer.Furthermore, the sensor layer can be designed in such a way that the measuring electrode arrangement comes into contact with the conductive layer if a contact force acts on the sensor element, such that an electrical connection between the first and the second electrode structure established via the conductive layer is more electrically conductive the greater the contact force acting on the sensor element.

[0051] The first and / or the second electrode structure can each be comb- or grid-shaped. In particular, the first and the second electrode structure can be comb-shaped, with the comb elements (prongs) of the first and the second electrode structure interlocking.

[0052] The first electrode structure and the second electrode structure can be located in or on the measuring layer.

[0053] By using two electrode structures that are isolated from each other, a simple and robust arrangement can be created, the resistance of which decreases with increasing contact force by bridging via the conductive layer.

[0054] According to one aspect, the measuring electrode arrangement has a conductor loop. In particular, both the first electrode structure and the second electrode structure have a conductor loop. In particular, the conductor loop (or loops) extends in or on the measuring layer in several conductor loops. In particular, the conductor loops can meander in or on the measuring layer. In particular, the conductor loop of the second electrode structure can run at least partially parallel to the conductor loop of the first electrode structure.

[0055] By using conductor loops, the effects of contact between the measuring layer and the conductive layer can be detected by measuring the current flow through the respective conductor loops. The electrical resistance in the sensor layer can be determined, for example, by measuring the current flow between the conductor loop of the first electrode structure and the conductor loop of the second electrode structure. This allows for reliable measurement of the electrical resistance and thus the contact force. Furthermore, when using conductor loops, a functional test of the measuring electrode arrangement, and therefore of the sensor layer, can be performed by checking the current flow through the respective conductor loops. If a conductor loop is interrupted in this respect, no current flows through it, indicating a fault in the arrangement.

[0056] According to one aspect, the measuring layer has a second measuring electrode arrangement, separate from the measuring electrode arrangement, for capturing a further component of the measurement signal. In particular, the second measuring electrode arrangement can be configured separately from, or electrically isolated from, the measuring electrode arrangement in or on the measuring layer.

[0057] Using a second measuring electrode arrangement enables dual-channel measurement of the signal. This provides redundancy should one measuring electrode arrangement fail. Furthermore, it allows for mutual verification of the two channels, which can improve the reliability and accuracy of the measurement.

[0058] The second measuring electrode arrangement can have a shape and configuration as described in connection with the measuring electrode arrangement. In particular, the second measuring electrode arrangement can have the same shape and configuration as the measuring electrode arrangement.

[0059] In a two-layer design, the second measuring electrode arrangement can be arranged in the second sensor layer, while the measuring electrode arrangement is arranged in the first sensor layer.

[0060] According to one aspect, the conductor elements of the measuring electrode arrangement run at least sectionally orthogonal to conductor elements of the second measuring electrode arrangement (in a top view of the force measuring foil).

[0061] For example, in a comb-shaped design of the measuring electrode arrangement(s), the prongs of the measuring electrode arrangement can run orthogonally to the prongs of the second measuring electrode arrangement when viewed from above on the force-measuring foil. Similarly, in a conductor loop design, individual conductor track sections of the two measuring electrode arrangements can run orthogonally to each other when viewed from above.

[0062] According to one aspect, the conductive layer has a conductive polymer layer, which is specifically designed as a semiconductor.

[0063] According to one example, the conductive layer has a graphite-containing semiconducting polymer layer.

[0064] By using a conductive polymer layer, the conductive layer can be provided cost-effectively and with great freedom in its arrangement and design. Furthermore, such a conductive layer is flexible and can facilitate the application of the force-sensing film to curved surfaces.

[0065] According to one aspect, the conductive layer is designed in such a way that the electrical resistance of the conductive layer changes as a function of the contact force acting on the conductive layer.

[0066] In other words, the conductive layer can be understood as a measuring element that indicates a change in contact force through a changing (internal) resistance of the conductive layer. This enables precise measurement of the contact force. While with a conductive layer of constant electrical resistance, the total resistance of the arrangement results "only" from an increased or decreased contact between the measuring layer and the conductive layer due to a change in contact force, with a conductive layer of variable resistance, an additional factor contributes to this, resulting in good signal resolution.

[0067] According to one embodiment, an electrical resistance of the conductive layer that changes as a function of the contact force acting on the conductive layer can be achieved, for example, by the conductive layer having an at least partially compressible matrix in which conductive particles are embedded. When subjected to a contact force, more and more of the conductive particles can then come into contact with each other and reduce the electrical resistance of the conductive layer.

[0068] According to one aspect, the conductive layer comprises a flexible film onto which the conductive polymer layer is printed. In particular, the flexible film can be made of or have a plastic material.

[0069] By using a film as a substrate for the conductive polymer layer, a stable yet flexible design of the conductive layer can be achieved. Printing the conductive polymer layer onto the film provides an efficient and precise way to define a conductive layer. In other words, the conductive polymer layer can be considered the "ink" for providing a piezoresistive element.

[0070] According to one aspect, the measuring layer has a flexible substrate onto which the measuring electrode arrangement and, if applicable, the second measuring electrode arrangement are printed. In particular, the flexible substrate can be made of or comprise a flexible film, especially a flexible plastic film.

[0071] In other words, the measurement layer can comprise a printed circuit, enabling a cost-effective and flexible design of the measurement view.

[0072] According to embodiments of the invention, the first and / or the second sensor layer can each comprise a measuring layer, conductive layer and / or spacer layer as described herein.

[0073] According to one aspect, the sensor layer comprises a flexible film as well as the first and second sensor layers, wherein the first sensor layer and the second sensor layer each have a conductive layer, the conductive layer of the first sensor layer has a conductive polymer layer printed on a first side of the flexible film, and the conductive layer of the second sensor layer has a conductive polymer layer printed on a second side of the flexible film, which second side is opposite the first.

[0074] In other words, the two sensor layers “share” the carrier film for the conductive layer, which allows for a simpler and more cost-effective construction of a two-layer sensor layer.

[0075] According to one aspect, the sensor layer has at least two sensor fields, each covering different areas of the surface and from which independent measurement signals can be tapped, based on the contact force acting on the respective sensor field.

[0076] In other words, the sensor fields are each configured such that the electrical resistance of the respective sensor field changes as a function of the contact force acting on the respective sensor field, and at least one measurement signal based on the electrical resistance can be tapped from the sensor field. In particular, the sensor fields are each configured independently of one another. Specifically, each sensor field has at least one output for tapping at least one measurement signal (for example, in the form of one or more electrical connections).

[0077] According to one aspect, the control device is designed to control a movement of the moving element based on the at least two independent measurement signals, and in particular to stop a movement of the moving element if at least one of the independent measurement signals exceeds a threshold value.

[0078] The use of multiple independent sensor fields enables spatially resolved and therefore more accurate measurement of the contact force. Furthermore, reliability is increased and the force-measuring film becomes more flexible.

[0079] According to one aspect, the top layer has at least a partially transparent protective film, wherein the protective film is printed on the back, or an essentially opaque decorative film is arranged on the inside of the protective film.

[0080] A transparent top layer allows for a protective effect while also providing the user with customization options for the force-measuring film. This protective layer can, for example, be made of or constructed from a plastic film.

[0081] According to one aspect, the top layer has at least a partially compressible crumple layer, which in particular contains a foam.

[0082] In particular, the crumple layer can be 0.5 cm to 5 cm thick. In particular, the crumple layer can be 1 cm to 3 cm thick. In particular, the crumple layer can be 2 cm thick.

[0083] The crumple layer mitigates the impact of the moving element coming into contact with an obstacle, thus protecting human users in particular. Furthermore, the force-measuring film can be applied more effectively to three-dimensional surfaces, as any unevenness in the surface is concealed by the crumple layer.

[0084] According to one aspect, the control unit is further configured to perform a functional test of the force-measuring layer. In particular, the control unit is configured to perform a functional test of a measuring electrode arrangement. Specifically, the control unit is configured to perform a functional test of a measuring electrode arrangement by means of a current flow test on the measuring electrode arrangement.

[0085] The functional check ensures that the force-measuring film works correctly and provides reliable measured values ​​for the control of the motion controller.

[0086] According to one aspect, a computer-implemented method for controlling a motion automaton is provided. The method comprises the following steps: - Tapping a measurement signal from the resistive force-measuring film to detect a contact force acting on the moving element; - Controlling the moving element based on the measurement signal.

[0087] The advantages of this method are analogous to the advantages of the embodiments described herein. The method can be executed wholly or partially by the control device described herein. In particular, the method can be further developed by features described in connection with the operation of the control device.

[0088] In particular, the method may include a step of performing a functional test of the force-measuring film or measuring electrode arrangement, wherein the functional test of the measuring electrode arrangement may be carried out in particular by means of a current flow test on the measuring electrode arrangement.

[0089] According to another aspect, a computer program product is provided which includes a program and is directly loadable into a memory of a programmable controller (control device) and has program resources, e.g. libraries and auxiliary functions, to execute a method of controlling a motion automaton, in particular according to the embodiments / aspects described herein, when the computer program product is executed.

[0090] According to another aspect, a computer-readable storage medium is provided on which readable and executable program sections are stored in order to execute all steps of a method for controlling a motion automaton according to the embodiments / aspects described herein, when the program sections are executed by the controller (control device).

[0091] The computer program products can comprise software with source code that still needs to be compiled and bound or that only needs to be interpreted, or executable software code that only needs to be loaded into the processing unit for execution. The computer program products enable the processes to be executed quickly, identically, and robustly. The computer program products are configured so that they can execute the process steps according to the invention using the computing unit. The computing unit must have the necessary prerequisites, such as sufficient main memory, a suitable processor, a suitable graphics card, or a suitable logic unit, so that the respective process steps can be executed efficiently.

[0092] The computer program products are stored, for example, on a computer-readable storage medium or on a network or server, from where they can be loaded into the processor of the respective computing unit, which may be directly connected to the computing unit or be designed as part of the computing unit. Furthermore, control information for the computer program products can be stored on a computer-readable storage medium. The control information of the computer-readable storage medium can be configured such that, when the data carrier is used in a computing unit, it performs a method according to the invention. Examples of computer-readable storage media are a DVD, a magnetic tape, or a USB flash drive on which electronically readable control information, in particular software, is stored.When this control information is read from the data carrier and stored in a processing unit, all embodiments / aspects of the methods described above can be carried out according to the invention. Thus, the invention can also be based on the aforementioned computer-readable medium and / or the aforementioned computer-readable storage medium. The advantages of the proposed computer program products or the associated computer-readable media essentially correspond to the advantages of the proposed methods.

[0093] According to one aspect, a flexible force-measuring film is provided for detecting a contact force acting on the force-measuring film, wherein the force-measuring film has a flexible cover layer for receiving the contact force, a flexible application layer with which the force-measuring film can be applied to a surface, and a flexible sensor layer which is designed such that an electrical resistance of the sensor layer changes as a function of the contact force acting on the force-measuring film (or the contact force transmitted from the cover layer to the sensor layer) and at least one measurement signal based on the electrical resistance can be tapped.

[0094] The advantages of the force-measuring film are analogous to the advantages of the embodiments of the motion automaton described herein. The force-measuring film can be further developed, in particular, by features described in connection with the motion automaton. Conversely, the motion automaton can be further developed by features described in connection with the force-measuring film.

[0095] According to one aspect, the force-measuring film has at least one incision extending from an edge of the film. In other words, the force-measuring film has an incision at least at one point, extending from an edge of the film.

[0096] According to one aspect, the force-measuring film extends in a first direction and is cut along a second direction, different from the first, from at least one edge of the force-measuring film.

[0097] The direction of extension can, for example, be the direction in which the force-measuring film exhibits the greatest linear expansion. In particular, the force-measuring film can exhibit a certain degree of bending flexibility in its direction of extension.

[0098] By making incisions, the force-measuring film can exhibit improved bending flexibility, particularly in the direction of the incision, at least in certain areas. This is because only a portion of the film needs to be deformed, rather than the entire film, to conform to, for example, a curve on the surface to which the film is to be attached. This makes it easier to apply the force-measuring film to surfaces with multiple curves.

[0099] According to one aspect, the force-measuring film has at least two sensor fields, each covering different areas of the surface, from which independent measurement signals can be tapped that are proportional to the contact force acting on the respective sensor field. In particular, the force-measuring film can have a top layer, an application layer, and a sensor layer in the area of ​​the sensor fields, while in areas outside the sensor fields it has only a top layer and an application layer.

[0100] In particular, the sensor fields can each have a separate sensor layer. In particular, the sensor fields can each have a conductive layer and a measurement layer as described herein. In particular, the sensor fields can each have a spacer layer as described herein. In particular, the sensor fields can each have first and second sensor layers as described herein.

[0101] By dividing the film into sensor fields, better flexibility and adaptability of the force-measuring film to the surface to which it is to be attached can be ensured.

[0102] In particular, the at least two sensor fields can be arranged one behind the other in the direction of extension. This can further support the adaptability of the force-measuring film to a surface curved in the direction of extension.

[0103] In particular, the force-measuring film can exhibit higher flexural stiffness and thus lower flexibility in areas with sensor fields than in areas without sensor fields. Increased flexibility in areas without sensor fields allows the force-measuring film to conform better to the mounting surface. Specifically, the force-measuring film can exhibit lower tensile elasticity in areas without sensor fields than in areas with sensor fields. For example, the top layer and mounting layer may have a lower modulus of elasticity than the sensor layer (whose modulus of elasticity is determined, for example, by the measuring electrode arrangement). This allows the force-measuring film to "pull" onto the mounting surface, thus improving its conformity to the surface.

[0104] According to one aspect, a force-measuring film is provided which is cut in an area between two sensor fields from an edge of the force-measuring film.

[0105] The combination of incisions and sensor fields further supports the adaptability of the force-measuring film to particularly multiply curved mounting surfaces, since, for example, adjacent sensor fields separated by incisions can have different radii and directions of curvature.

[0106] Further features and advantages of the invention will become apparent from the following explanations of exemplary embodiments with reference to schematic drawings. The modifications mentioned in this context can be combined with one another to form new embodiments. The same reference numerals are used for identical features in different figures. Fig. Figure 1 shows a schematic representation of a system for imaging a patient using a motion automaton with one or more force measuring foils. Fig. Figure 2 shows a force-measuring film attached to a surface according to one embodiment in a sectional view from the side. Fig. Figure 3 shows a force-measuring film according to a further embodiment in a sectional view from the side. Fig. Figure 4 shows a measuring electrode arrangement according to one embodiment in a top view. Fig. Figure 5 shows a measuring electrode arrangement according to a further embodiment in a top view. Fig. Figure 6 shows an equivalent circuit diagram of a measuring electrode arrangement according to one embodiment. Fig. Figure 7 shows a force-measuring film according to a further embodiment in a sectional view from the side. Fig. Figure 8 shows a force-measuring film according to one embodiment in a top view. Fig. Figure 9 shows a method for controlling a motion machine according to one embodiment.

[0107] In Fig. Figure 1 shows a medical device 100 for performing an imaging examination of a patient or an interventional procedure on a patient. The medical device 100 comprises a medical functional element 130 for performing an imaging examination of a patient or a therapeutic and / or interventional procedure on a patient and a movement device 120 for the at least semi-automatic operation of the functional element 130. The movement device 120 comprises at least one movement element 110 that is movable about at least one axis in space. In particular, the movement element 110 can be moved by a motor or hydraulically. Thus, the medical device 100 can be designed as a motion automaton 100.

[0108] In the example shown, the functional element 130 is configured as an X-ray examination modality with an X-ray emitter and a corresponding detector in a C-arm configuration. Other configurations are also possible. For example, the functional element 130 can include a radiation modality for administering radiation therapy or an interventional device for performing an interventional procedure on the patient. The medical device 100 can also include other devices not shown, such as a patient table or other equipment that can also be moved by the movement device 120.

[0109] The medical device 100 has at least one force-measuring film 200 on at least one moving element 110. In the example shown, two force-measuring films 200 are present, each arranged on different moving elements 110. The force-measuring films 200 can be attached to corresponding surfaces of the respective moving elements 110 – for example, by adhering the force-measuring films 200 to corresponding surfaces of the moving elements 110.

[0110] The force-measuring foils 200 are fundamentally designed to detect a contact force acting upon them—and thus upon the moving element 110—and to provide corresponding measurement signals MSa, MSb. The measurement signals MSa, MSb can then be provided to a control unit 300 of the medical device 100, which is designed to control the medical device 100 and, in particular, the moving device 120, based on the measurement signals MSa, MSb.

[0111] Several implementations are conceivable for the force-measuring film 200. One embodiment of a flexible force-measuring film 200 is described in Fig. 2 shown in a side sectional view.

[0112] The force-measuring film 200 has a cover layer 210, a sensor layer 230, and an application layer 220. The cover layer 210 forms the outer boundary of the force-measuring film 200. The sensor layer 230 is designed to detect a contact force KF acting on the force-measuring film 200. The application layer 220 serves to attach the force-measuring film 200 to a surface, such as the outer surface of a moving element 110.

[0113] The application layer 220 can, for example, have an adhesive layer with which the force-measuring film 200 can be adhered to a surface. In other words, the force-measuring film 200 can therefore be designed as a self-adhesive force-measuring film 200. The individual layers, 210, 220, 230 of the force-measuring film 200 are preferably at least partially flexible, which allows the force-measuring film 200 to adapt to a curved surface contour.

[0114] The cover layer 210 seals the force-measuring film 200 on the outside and, in particular, protects the underlying sensor layer 230. The cover layer 210 can, for example, have a protective layer or film 211. The protective layer 211 can be a plastic or polymer layer. Furthermore, the cover layer 210 can be at least partially transparent. The cover layer can also be reverse-printed, i.e., it can have a print 212 on the back side or on the side facing the sensor layer 230, which is visible from the outside through the partially transparent cover layer 210. Alternatively, the cover layer 210 can have a printed film 212 on the side facing the sensor film 230. As a further alternative, the cover layer 210 can be printed on the outside. For example, the protective layer 211 can be printed.

[0115] Furthermore, the protective layer 211 can be designed as a crumple layer to absorb part of the contact force KF acting on the force-measuring film 200 and thus on the moving element 110. For example, the crumple layer can be at least partially compressible. For example, the crumple layer can be designed as a foam layer.

[0116] The sensor layer 230 can be configured as a resistive sensor element. In other words, the sensor layer 230 can be configured as a piezoresistive sensor element. In other words, the sensor layer 230 can be configured such that its electrical resistance changes depending on a contact force KF acting on the force-measuring film 200. The electrical resistance of the sensor layer 230 can, for example, change proportionally to the applied contact force KF. In particular, the electrical resistance of the sensor layer 230 can increase or decrease with increasing contact force KF. Furthermore, the sensor layer 230 can be configured such that a force threshold must first be overcome (i.e., a minimum contact force KF must act on the force-measuring film 200) for the electrical resistance of the sensor layer 230 to change.

[0117] In particular, the sensor layer 230 can be configured such that one or more measurement signals MSa, MSb can be tapped from the sensor layer 230, which measurement signals MSa, MSb are based on the electrical resistance of the sensor layer 230 and are, in particular, proportional to it. Furthermore, the sensor layer 230 can be configured such that one or more control measurement signals MC1, MC2 can be tapped from the sensor layer 230, enabling functional testing of the sensor layer 230. For this purpose, the sensor layer 230 can, for example, have one or more connections that are linked to evaluation electronics. The evaluation electronics can be integrated into the control unit 300. The contact force KF acting on the force-measuring film 200 can therefore be detected using the measurement signals MSa, MSb.The evaluation electronics (the control unit 300) can be configured to determine the contact force KF acting on the force measuring film 200 based on the measurement signals MSa, MSb.

[0118] One possible realization of the piezo-resistive properties of the sensor layer 230 is in Fig. Figure 3 shows that the electrical resistance of the sensor layer 230, which varies depending on the applied contact force KF, is achieved through the interaction of a conductive layer 232a and a measuring electrode arrangement 235a spaced apart from it when no force is applied. The measuring electrode arrangement 235a is arranged on a measuring layer 234a. For example, the measuring electrode arrangement 235a and the measuring layer 234a can be formed as a printed circuit on a flexible substrate such as a plastic film.

[0119] The distance between the measuring electrode arrangement 235a and the conductive layer 234a can be ensured, for example, by a spacer element 233a arranged between the conductive layer 232a and the measuring layer 234a. The spacer element 233a can, for example, be at least partially compressible and be designed to be adhesively bonded on both sides to establish a connection with the measuring layer 234a and the conductive layer 232a. As shown in Fig. As shown in Figure 3, the spacer element 233a has recesses so that the conductive layer 232a can come into contact with the measuring electrode arrangement 235a when a contact force KF is applied. For example, the spacer element can have several objects (e.g., spheres or cylinders) made of elastic material that are arranged between the measuring surface 234a and the conductive layer 232a.

[0120] The conductive layer 232a can, for example, comprise a conductive polymer layer. The polymer layer can, for example, be printed onto a flexible carrier film 231. The polymer layer can be provided as a conductive ink for this purpose. The conductive polymer layer can be configured as a semiconductor. For example, the polymer layer can comprise a polymer matrix in which electrically conductive particles are embedded. In particular, the conductive layer 232a can be configured such that its electrical resistance changes as a function of the pressure acting upon it by the contact force KF.

[0121] In Fig. Figure 4 shows an exemplary measuring electrode arrangement 235a in a top view of the force-measuring foil 200. The measuring electrode arrangement 235a can, for example, have a first electrode structure ES1 and a second electrode structure ES2, which are separated or insulated from each other. The first and second electrode structures ES1, ES2 can each be comb-shaped or grid-shaped, respectively. The first and second electrode structures ES1, ES2 can each have an external connection. By measuring a current as a measurement signal MSa, the resistance between the first and second electrode structures ES1, ES2 can be measured.

[0122] If no contact force KF acts on the force-measuring film 200, the conductive layer 232a does not touch the measuring electrode arrangement 235a. Thus, the first and second electrode structures ES1, ES2 are isolated from each other, and no current flows between them. The resistance between the first and second electrode structures ES1, ES2 is therefore very high (in the MΩ range), and a current flow as a measurement signal MSa between the first and second electrode structures ES1, ES2 is practically non-existent.

[0123] When a contact force KF is applied to the force measuring foil 200, from a certain force threshold the measuring electrode arrangement 235a touches the conductive layer 232a and a current can flow between the first and the second electrode structure ES1, ES2 via the conductive layer 232a and the resistance tapped at the measuring electrode arrangement 235a decreases.

[0124] In the case of an electrically conductive layer 235a, whose electrical resistance changes as a function of the contact force KF, the change in resistance of the conductive layer 232a can also be determined with the measured current. For example, if the resistance of the conductive layer 232a decreases with increasing contact force KF, the current flow consequently increases as a measurement signal MSa.

[0125] As a further effect, with increasing contact force KF, the measuring electrode arrangement 235a is pressed more firmly against the conductive layer 232a. Consequently, more elements of the first and second electrode structures ES1, ES2 are connected to each other. This reduces the resistance and increases the current flow as the measurement signal MSa.

[0126] Another embodiment of a measuring electrode arrangement 235a is described in Fig. Figure 5 is shown in a top view. A corresponding equivalent circuit diagram is shown in Fig. Figure 6 shows the measuring electrode arrangement 235a in this embodiment, which has two conductor loops LS1 and LS2, each running in several loops on or in the measuring layer 234a. The conductor loops LS1 and LS2 each form a circuit in the measuring layer 234a, the current of which can be measured via corresponding connections. The second conductor loop LS2 is independent of the conductor loop LS1 and is insulated from the conductor loop LS1, at least without the influence of a contact force KF. The conductor loops of the second conductor loop LS2 preferably run parallel to the conductor loops of the conductor loop LS1 in certain sections.

[0127] As in Fig. As shown in Figure 6, the arrangement allows, firstly, the measurement of the current flow between the two conductor loops LS1 and LS2 as a measurement signal MSa proportional to the electrical resistance. The principle of the change in electrical resistance as a function of the contact force KF corresponds to that in connection with Fig. The principle discussed in section 4 applies. Above a certain contact force KF, the first and second conductor loops LS1 and LS2 are short-circuited via the conductive layer 232a. This results in a current flow between the two conductor loops LS1 and LS2, which can be measured as the signal MSa. Similarly, the further change in resistance (of the conductive layer 232a or the entire arrangement) can be detected via the current flow as the measurement signal MSa.

[0128] Secondly, the forward current through conductor loops LS1 and LS2 can be measured. The corresponding measurement signals MC1 and MC2 can then be used to check whether conductor loops LS1 and LS2 are intact or, for example, interrupted at a point. In other words, this allows for a functional test of sensor layer 230.

[0129] The in the Fig. 4 and Fig. The five arrangements of the measuring electrode arrangements 235a shown are merely examples. Any number of further modifications to the design of the measuring electrode arrangements 235a are conceivable. For example, the conductor loops of the conductor tracks LS1 and LS2 can be routed differently. Likewise, the combs can be arranged differently.

[0130] Another possible realization of the piezo-resistive properties of sensor layer 230 is in Fig. Figure 7 shows the embodiment shown, which has two sensor layers, SL1 and SL2. Both sensor layers, SL1 and SL2, are configured to change their electrical resistance depending on the applied contact force KF. Furthermore, each sensor layer, SL1, SL2, is configured to provide a measurement signal, MSa, MSb, based on the electrical resistance of the respective sensor layer, SL1, SL2. In particular, the measurement signals MSa, MSb are independent of each other, thus enabling a two-channel measurement with two independent channels.

[0131] The first sensor layer SL1 is constructed like the one in Fig. 3. Sensor layer 230 shown. In other words, an electrical resistance of the first sensor layer SL1, which varies depending on the applied contact force KF, is realized by the interaction of a conductive layer 232a and a measuring electrode arrangement 235a spaced away from it in the force-free state. The measuring electrode arrangement 235a is arranged on a measuring layer 234a. The distance between the measuring electrode arrangement 235a and the conductive layer 234a is ensured by a spacer element 233a, which is arranged between the conductive layer 232a and the measuring layer 234a. The measuring electrode arrangement 235a or the measuring layer 234a, as well as the conductive layer 232a and the spacer element 233a, can be configured as described in connection with Fig. 3 to 6 must be trained.

[0132] The second sensor layer, SL2, is also basically constructed in the same way as the one in Fig. 3. The embodiment of the sensor layer 230 shown. In other words, an electrical resistance of the second sensor layer SL2 that varies depending on the applied contact force is achieved through the interaction of a conductive layer 232b and a (second) measuring electrode arrangement 235b, which is spaced apart from it in the force-free state. The measuring electrode arrangement 235b is arranged on a measuring layer 234b. The distance between the measuring electrode arrangement 235b and the conductive layer 234b is ensured by a spacer element 233b, which is arranged between the conductive layer 232b and the measuring layer 234b. The measuring electrode arrangement 235b or the measuring layer 234a, as well as the conductive layer 232b and the spacer element 233b, can be arranged as described in connection with Fig. 3 to 6 must be trained.

[0133] In the Fig. In the embodiment shown in Figure 7, the layer arrangement of the second sensor layer SL2 is mirrored to the layer arrangement of the first sensor layer SL1. This makes it possible for the first conductive layer 232a and the second conductive layer 232b to share the same flexible carrier film 231. In particular, the flexible carrier film can be printed with the polymer layer on both sides.

[0134] In Fig. Figure 8 shows a force-measuring film 200 in a top view according to one embodiment. In the embodiment shown, the force-measuring film 200 has several sensor fields 200F. The sensor fields 200F cover different areas of the surface of the force-measuring film 200. The sensor fields 200F represent independent piezo-resistive measuring areas of the force-measuring film 200. The sensor fields 200F are each configured to have an electrical resistance that changes depending on the contact force KF acting on the respective sensor field 200F. The sensor fields 200F are each configured to provide at least one measurement signal MSa, which is based on an electrical resistance of the respective sensor field 200F. The measurement signals MSa provided by different sensor fields 200F are each independent of one another.

[0135] The individual sensor fields 200F can be configured as described in connection with Fig. 3 to 7. In particular, the sensor fields 200F can each have an (independent) sensor layer 230. The sensor layers 230 of the sensor fields 200F can be structured as described in connection with Fig. 3 to 7. In particular, the sensor fields 200F can each have one or two sensor layers SL1, SL2. In particular, the sensor fields 200F can each have at least one independent (i.e., not electrically connected to conductive layers of other sensor fields 200F) conductive layer 232a, 232b. The cover layer 210 and the mounting layer 220 can extend seamlessly over the sensor fields 200F.

[0136] The various sensor fields 200F enable, firstly, spatially resolved detection of the contact force KF acting on the force-measuring film 200. Secondly, the multiple individual sensor fields 200F allow for greater flexibility and thus adaptability of the force-measuring film 200 to the surface characteristics of the moving element 110 to which the force-measuring film 200 is to be attached. In particular, the sensor fields 200F support the adaptation of the force-measuring film 200 to a curved surface contour in a first direction.

[0137] To further improve the flexibility and thus the adaptability of the force-measuring film 200, the film can be cut at one or more points along its edges. In the example shown, the force-measuring film 200 has two cuts 200S on opposite edges. This allows the film to adapt to a curved surface contour in a second direction, different from the first.

[0138] In the example shown, several sensor fields 200F are arranged in a row in a first extension direction R of the force-measuring film 200, thus enabling good adaptation to a curved surface contour that is curved along the extension direction. Furthermore, the exemplary force-measuring film 200 has two incisions 200S perpendicular to the extension direction R from the edges of the force-measuring film 200. The incisions 200S run between two sensor fields 200F. This allows the force-measuring film 200 to adapt well to a curved surface contour that is curved perpendicular to the extension direction, i.e., along the incisions. This enables the force-measuring film 200 to be applied to such a doubly curved surface without creases.

[0139] The number and arrangement of the 200S cuts shown is only an example and can of course be varied depending on the surface on which the force measuring foil 200 is to be applied.

[0140] Fig. Figure 9 shows an exemplary embodiment of a computer-implemented method for controlling a medical device 100. The sequence of the method steps is not limited by either the depicted sequence or the chosen numbering. Thus, the order of the steps can be reversed, and individual steps can be omitted. Furthermore, one or more steps, in particular a sequence of steps, and optionally the entire method can be executed repeatedly. The steps are preferably executed by a suitably designed control unit 300.

[0141] In a first (optional) step S10, a functional test of the force-measuring film 200 is performed. Each sensor position SL1, SL2, or each sensor field 200F can be individually checked for functionality. For example, the measuring electrode assemblies 235a, 235b can be checked for any malfunctions. In particular, this can be done with a flow test, which can determine whether the measuring electrode assemblies 235a, 235b are interrupted.

[0142] In step S20, one or more measurement signals MSa, MSb are tapped from the force-measuring foil 300 and provided to the control unit 300. As mentioned, the measurement signals MSa, MSb are based on corresponding electrical resistances of the force-measuring foil 200, which vary depending on the contact forces KF acting on the force-measuring foil 200. In other words, in step S20, a contact force KF acting on the force-measuring foil 200, and thus on the moving element 110, is detected.

[0143] In step S30, control commands are determined based on the measurement signals MSa and MSb, which can be used to control the medical device 100 and, in particular, the motion element 110. Specifically, step S30 can determine whether the measured contact force KF or one or more measured values ​​MSa and MSb exceed a predetermined threshold (detection of a stop condition). If so, the movement of the motion element 110 can be stopped in step S30 by corresponding control commands to the medical device 100. Furthermore, the control commands can be designed to retract the motion element 110 by a predetermined amount after the stop condition has been determined, thus at least partially reversing any movement performed up to the point of the stop condition being determined.

[0144] In step S30, various measured values ​​MSa, MSb, or different channels of measured values ​​MSa, MSb can be considered individually or cumulatively. For example, the stop condition can be considered triggered as soon as a measured value MSa, MSb, or a channel of a measured value MSa, MSb exceeds the predetermined threshold.

[0145] Where not explicitly stated, but sensible and in line with the invention, individual embodiments, individual aspects or features thereof may be combined or exchanged without departing from the scope of the present invention. Advantages of the invention described with reference to one embodiment also apply to other embodiments, where applicable, without explicit mention.

Claims

[1] Motion automaton (100) with: - at least one movement element (110), and - a force-measuring film (200) attached to a surface of the moving element (110) for detecting a contact force (KF) acting on the moving element (110), wherein the force-measuring film has: - a top layer (210) to absorb the contact force (KF), - an application layer (220) with which the force-measuring film (200) is attached to the surface, as well as - a sensor layer (230) which is designed such that - the electrical resistance of the sensor layer (230) changes as a function of the contact force (KF) acting on the force-measuring film (200), and - at least one measurement signal based on electrical resistance (MSa, MSb) can be tapped, characterized by , that - the top layer (210) has at least a partially transparent protective film (211), wherein - the protective film is printed on the back, or - a substantially opaque decorative film (212) is arranged on the inside of the protective film (211). [2] Motion automaton (100) according to claim 1, further comprising: a control unit (300) that is trained to: - to control a movement of the movement element (110) based on at least one measurement signal (MSa, MSb), and - in particular to stop the movement of the moving element (110) if the measurement signal (MSa, MSb) exceeds a threshold value. [3] Motion automaton (100) according to claim 2, wherein the control device (300) is further configured to perform a functional check of the force measuring foil (200). [4] Motion automaton (100) according to one of the preceding claims, wherein the sensor layer (230) comprises: - a first sensor layer (SL1) which is designed such that - the electrical resistance of the first sensor layer (SL1) changes as a function of the contact force (KF) acting on the force-measuring film (200), and - a first component (MSa) of the measurement signal (MSa, MSb) can be tapped from the first sensor layer, which first component (MSa) is based on the electrical resistance of the first sensor layer (SL1), and - a second sensor layer (SL2) which runs essentially parallel to the first sensor layer (SL1) and is designed such that - the electrical resistance of the second sensor layer (SL2) changes as a function of the contact force (KF) acting on the force-measuring film (200), and - a second component (MSa) of the measurement signal (MSa, MSb) can be tapped from the second sensor layer (SL2), which second component (MSa) is based on the electrical resistance of the second sensor layer (232a). [5] Motion automaton (100) according to one of the preceding claims, wherein the sensor layer (230) comprises: - a conductive layer (232a, 232b), and - comprising a measuring layer (234a, 234b) and a measuring electrode arrangement (235a, 235b) for recording the measurement signal (MSa, MSb), wherein - the measuring electrode arrangement (235a, 235b) is spaced away from the conductive layer (232a, 232b) if no contact force acts on the sensor element. [6] Motion automaton (100) according to claim 5, wherein the conductive layer (232a, 232b) comprises a conductive polymer layer, which is in particular designed as a semiconductor. [7] Motion automaton (100) according to claim 6, in which the conductive layer (232a, 232b) is designed such that an electrical resistance of the conductive layer (232a, 232b) changes as a function of the contact force (KF) acting on the conductive layer (232a, 232b). [8] Motion automaton (100) according to one of the preceding claims, wherein the sensor layer (230) has at least two sensor fields (200F) which each cover different areas of the surface and which are each configured such that - the electrical resistance of the respective sensor field (200F) changes as a function of the contact force (KF) acting on the force measuring film (200) in the area of ​​the sensor field (200F), and - at least one measurement signal (MSa, MSb) can be tapped from each sensor field (200F), which is based on the electrical resistance of the respective sensor field (200F). [9] Motion machine (100) according to one of the preceding claims, wherein the cover layer (210) has an at least partially compressible crumple layer (211), which in particular has a foam. [10] Computer-implemented method for controlling a motion automaton (100) according to any of the preceding claims comprising the steps: - Extraction (S20) of a measurement signal (MSa, MSb) from the force measuring film (200) to detect a contact force acting on the movement element (110); - Control (S30) of the motion element (110) based on the measurement signal (MSa, MSb). [11] Flexible force-measuring film (200) for detecting a contact force (F) acting on the force-measuring film (200), wherein the force-measuring film (200) has: - a top layer (210) to absorb the contact force (KF), - an application layer (220) with which the force-measuring film (200) can be applied to a surface, and - a sensor layer (230) which is designed such that - the electrical resistance of the sensor layer (230) changes as a function of the contact force (KF) acting on the force-measuring film (200), and - at least one measurement signal based on electrical resistance (MSa, MSb) can be tapped, characterized by , that - the top layer (210) has at least a partially transparent protective film (211), wherein - the protective film is printed on the back, or - a substantially opaque decorative film (212) is arranged on the inside of the protective film (211). [12] Force measuring film (200) according to claim 11, wherein the force measuring film (200) has at least one incision (200S) from an edge of the force measuring film (200). [13] Force measuring film according to claim 11 or 12, wherein the force measuring film has at least two sensor fields (200F) which each cover different areas of the surface of the force measuring film (200), wherein the sensor fields (200F) are designed such that independent measurement signals can be tapped from them which are proportional to the contact force (KF) acting on the respective sensor field (200F). [14] Force measuring film according to claims 12 and 13, wherein the force measuring film (200) is cut in an area between two sensor fields (200F) by the cut (200S).

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