Power supply circuit for an X-ray device, X-ray device and method for operating an X-ray device

Abstract

The invention relates to a power supply circuit for an X-ray device, comprising a voltage supply unit and a monitoring unit, wherein the power supply unit has an operating path and a maintenance path, wherein the operating path is designed to supply several components of the X-ray device for normal operation, wherein the maintenance path is designed to feed a subset of the plurality of components of the X-ray device for maintenance operation, wherein the monitoring unit is designed to detect an input voltage at a voltage supply input of the voltage supply unit by means of a sensor, wherein the voltage supply unit is designed to provide an electrical operating voltage via the operating path or an electrical maintenance voltage via the maintenance path to the respective components as a function of the input voltage. The invention further relates to an X-ray device and a method for operating an X-ray device.

Description

[0001] The present invention relates to a power supply circuit for an X-ray device, an X-ray device and a method for operating an X-ray device.

[0002] Computed tomography systems, or CT systems for short, are used for medical imaging examinations of patients. Other terms for CT systems include CT device or CT system. An X-ray source attached to a rotating part of the CT system exposes an area to be examined with X-rays from different directions. The attenuated X-rays are recorded by a rotating X-ray detector or count rate detector.

[0003] The new generation of photon-counting detectors for CT systems typically incorporate a semiconductor material as the sensor material, for example, CdTe, CdZnTe, CdTeSe, CdZnTeSe, CdMnTe, GaAs, Si, or Ge. An electric field is often generated in the sensor material by applying a bias voltage. The electric field can enable a radiation flux in the sensor material under X-ray illumination, which can then be analyzed using a directly connected application-specific integrated circuit (ASIC). The electric field can lead to heating of the sensor material. Temperature differences in the X-ray sensor layer, especially the sensor material, for example, due to switching the bias voltage on or off, can lead to undesired drift and / or image artifacts.It can take up to 24 hours for the detector, especially the sensor material, to return to a stable, particularly thermal, state after cycling the bias voltage. During this time, measurements cannot be performed or can only be performed with reduced image quality. For this reason, the bias voltage is switched off as infrequently as possible, which in turn leads to increased energy consumption of the CT system.

[0004] Document DE 10 2021 214 335 B3 discloses a power supply circuit for a CT system. The power supply circuit comprises a stationary power distribution device, a co-rotating bias voltage supply device, a standard power supply path with a power transmission device between the stationary power distribution device and the co-rotating bias voltage supply device, and an alternatively switchable service power supply path with a voltage protection device.

[0005] The document EP 3 795 081 A1 discloses a computer tomography scanner with a holding frame and a rotating ring, wherein the rotating ring has an X-ray detector with a semiconductor material that is operable in an equilibrium of statistical population states. The computer tomography scanner comprises a first power supply that is configured to supply power to a first set of components of the computer tomography scanner, which are arranged on the rotating ring for an image generation process, in an operating state of the computer tomography scanner, and a second power supply that is circuit-detachable from the first power supply and configured to supply power to a second set of components of the computer tomography scanner in a rest state of the computer tomography scanner, wherein the components of the second set are configured to maintain the semiconductor material in said equilibrium.

[0006] Document DE 10 2022 200 649 A1 discloses a power supply circuit for a computed tomography system, comprising a stationary power distribution device having an uninterruptible power source and a co-rotating bias supply device. The co-rotating bias supply device comprises a voltage supply input, a bias supply output, and a bias monitoring unit. The bias monitoring unit is configured to activate or deactivate the bias supply output depending on an electrical input voltage detected at the voltage supply input and, for this purpose, has a sensor for detecting the electrical input voltage at the voltage supply input.Part of the co-rotating bias supply device is also an auxiliary voltage source with an energy buffer for supplying the bias monitoring unit with electrical energy in the event of deactivation of the bias supply output.

[0007] The document DE 10 2013 227 214 A1 discloses a medical imaging device comprising a detector with an active material operable in a thermodynamic equilibrium state, a main power supply configured to supply power to the medical imaging device in an operating state, and a secondary power supply configured to maintain a thermodynamic equilibrium in the active material of the detector in a rest state of the medical imaging device in order to keep the detector in a standby state.

[0008] It is therefore the object of the present invention to provide an energy-saving possibility for maintaining a stable, in particular thermal, state of a photon-counting detector.

[0009] The object is achieved according to the invention by the subject matter of the independent claims. Advantageous embodiments with useful further developments are the subject matter of the subclaims. Regardless of the grammatical gender of a particular term, it encompasses persons with male, female, or other gender identities.

[0010] In a first aspect, the invention relates to a power supply circuit for an X-ray device. The power supply circuit comprises a voltage supply unit and a monitoring unit. The voltage supply unit has an operating path and a maintenance path. The operating path is designed to supply power to a plurality of components of the X-ray device for normal operation. Furthermore, the maintenance path is designed to supply a subset of the plurality of components of the X-ray device for maintenance operation. The monitoring unit is designed to detect an input voltage at a voltage supply input of the voltage supply unit using a sensor.Furthermore, the voltage supply unit is designed to provide an electrical operating voltage via the operating path or an electrical maintenance voltage via the maintenance path to the respective components depending on the detected input voltage.

[0011] The multiple components of the X-ray device may include, for example, an X-ray source and / or an X-ray detector.

[0012] The power supply unit can be configured to be powered by at least one voltage source. For this purpose, the power supply unit can have a voltage supply input for receiving electrical energy. Advantageously, the at least one voltage source can provide the input voltage to the power supply unit, in particular to the voltage supply input, in an operating state of the power supply circuit.

[0013] The monitoring unit can have a sensor, for example a voltage sensor, which is designed to detect the electrical input voltage, in particular a value of the input voltage, at the voltage supply input of the voltage supply unit. The monitoring unit can be designed, for example, to provide a control signal depending on the input voltage detected by the sensor, in particular comprising qualitative or quantitative information about the value of the detected input voltage. In particular, the monitoring unit can be designed to provide the control signal to the voltage supply unit depending on the detected input voltage.

[0014] The operating path can designate an energy transmission path, in particular for transmitting electrical energy, for normal operation of the X-ray device. Normal operation can comprise intended operation, in particular an imaging operation, of the X-ray device, for example, for imaging an examination subject. Advantageously, the operating path can be configured to supply an electrical operating voltage provided by the power supply unit to all components of the X-ray device required for normal operation.

[0015] The maintenance path can designate a further energy transmission path, in particular for transmitting electrical energy, for maintenance operation of the X-ray device. The maintenance operation can advantageously comprise an operation for maintaining and / or stabilizing and / or conditioning at least a subset of the components of the X-ray device. Advantageously, the maintenance path can be configured to supply an electrical maintenance voltage provided by the voltage supply unit to the subset of the multiple components of the X-ray device for maintenance operation.

[0016] The maintenance path can be a sub-path of the operating path or can be different from the operating path except for the supply of the subset of the multiple components of the X-ray device.

[0017] The maintenance path may have a lower voltage, in particular a lower voltage requirement, and / or a lower energy requirement than the operating path. In particular, the operating voltage and / or an energy requirement of the operating path may correspond at least to the maintenance voltage and / or an energy requirement of the maintenance path.

[0018] The voltage supply unit can be designed to provide the operating voltage via the operating path to the multiple components of the X-ray device in a first operating state as a function of the detected input voltage, in particular as a function of the control signal, or to provide the maintenance voltage via the maintenance path to the subset of the multiple components of the X-ray device in a second operating state.

[0019] The proposed power supply circuit can advantageously enable energy-saving maintenance of a stable, particularly thermal, state of the subset of the multiple components of the X-ray device. In particular, the proposed power supply circuit can ensure a supply of the subset of the multiple components of the X-ray device for maintenance operation, particularly even during brief power interruptions, for example, when switching between a power supply from the mains and an emergency power supply. The power supply circuit can be hardware-efficient, in particular with minimal additional hardware complexity, and / or without additional digital functions.In particular, the proposed power supply circuit is designed to detect energy-saving operation, whereby components of the X-ray device, for example, components of a gantry, would be switched off and the subset of components, for example, a detector unit, would lose an operating point. This advantageously enables a particularly robust maintenance of the stable state of the subset of the multiple components of the X-ray device.

[0020] In a further advantageous embodiment of the proposed power supply circuit, the operating path can be configured to supply at least one digital component and at least one analog component of the X-ray device for normal operation. Furthermore, the maintenance path can be configured to supply at least one of the at least one analog component of the X-ray device for maintenance operation.

[0021] The X-ray device can have at least one digital component, in particular a plurality of digital components, and at least one analog component, in particular a plurality of digital components. The at least one digital component can, for example, comprise an application-specific integrated circuit (ASIC) and / or a programmable integrated circuit (field programmable gate array, FPGA). The at least one analog component can, for example, comprise a conditioning unit configured to provide energy to maintain a maintenance state of a detector unit of the X-ray device.

[0022] Advantageously, the operating path can be configured to supply an electrical operating voltage provided by the voltage supply unit to the at least one digital component, in particular the plurality of digital components, and the at least one analog component, in particular the plurality of analog components, of the X-ray device for normal operation. Furthermore, the maintenance path can be configured to supply an electrical maintenance voltage provided by the voltage supply unit to the at least one, in particular several, or each of the at least one analog component, in particular the plurality of analog components, of the X-ray device for maintenance operation.In particular, the maintenance path can be designed to supply at least one of the at least one analog component of the X-ray device for maintenance operation and not to supply the remaining, in particular digital, components during maintenance operation.

[0023] The proposed power supply circuit can advantageously enable energy-saving maintenance of a stable, in particular thermal, state of the at least one analog component of the X-ray device. In particular, the maintenance voltage for maintenance operation can be provided independently of a startup of the at least one digital component and / or a configuration process of the at least one digital component.

[0024] In a further advantageous embodiment of the proposed power supply circuit, the operating path and the maintenance path can be different except for the supply of the subset of the multiple components of the X-ray device.

[0025] Advantageously, the operating path and the maintenance path can be different except for a respective, in particular different or identical, contact for supplying the subset of the multiple components, for example the at least one of the at least one analog component, of the X-ray device. In particular, the operating path and the maintenance path can comprise a different, in particular disjoint, circuit except for the respective contact for supplying the subset of the multiple components of the X-ray device. The maintenance and operating paths can further be configured to be supplied, in particular fed, with the respective voltage, in particular the maintenance voltage or the operating voltage, by the same voltage supply unit.

[0026] The voltage supply unit can be configured to supply the operating voltage to the multiple components of the X-ray device via the operating path in a first operating state, depending on the detected input voltage, in particular depending on the control signal. Furthermore, the voltage supply unit can be configured to supply the maintenance voltage to the subset of the multiple components of the X-ray device via the maintenance path in a second operating state, depending on the detected input voltage, in particular depending on the control signal.

[0027] The proposed embodiment can advantageously enable the respective components to be supplied with power in a manner adapted to the respective operation, in particular normal operation or maintenance operation. In particular, the proposed embodiment eliminates the need to adapt the operating path.

[0028] In a further advantageous embodiment of the proposed power supply circuit, the maintenance path can be a partial path of the operating path.

[0029] Advantageously, the maintenance path can be a partial path, in particular a part of a circuit, of the operating path. The operating path can additionally have a selectively activatable, in particular switchable, circuit part, which is designed to provide the operating voltage to the remaining components of the X-ray device, in particular the digital components of the X-ray device. For example, the operating path can have a circuit element designed to activate or deactivate the part of the operating path that extends beyond the maintenance path depending on the detected input voltage, in particular depending on the control signal, and / or the voltage provided by the voltage supply unit, in particular the operating voltage or maintenance voltage.

[0030] The voltage supply unit can be configured to supply the operating voltage to the multiple components of the X-ray device via the operating path in a first operating state, depending on the detected input voltage, in particular depending on the control signal. Furthermore, the voltage supply unit can be configured to supply the maintenance voltage to the subset of the multiple components of the X-ray device via the maintenance path in a second operating state, depending on the detected input voltage, in particular depending on the control signal.

[0031] In particular, the respective voltage can be provided to the subset of the plurality of components of the X-ray device by means of the maintenance path in the first and the second operating state.

[0032] This can advantageously minimize the circuit effort.

[0033] In a further advantageous embodiment of the proposed power supply circuit, the monitoring unit can be configured to compare the input voltage with a predetermined voltage threshold. Furthermore, the voltage supply unit can provide the electrical operating voltage via the operating path when the voltage threshold is reached or exceeded, or provide the electrical maintenance voltage via the maintenance path when the voltage threshold is undershot.

[0034] The monitoring unit can have a comparator, for example a voltage comparator, which is designed to compare the input voltage, in particular a value of the input voltage that is present at the voltage supply unit, in particular momentarily, with the predetermined voltage threshold. The value of the input voltage can, for example, characterize a peak, an amplitude, a mean value, in particular a root mean square (RMS), or a rectified value of the input voltage. The input voltage can be embodied as a direct or alternating voltage. The comparator can, for example, comprise an operational amplifier, an analog-to-digital converter, a (shunt) reference, an LED, and / or an optocoupler.

[0035] Advantageously, the monitoring unit can be configured to provide the control signal to the voltage supply unit depending on the comparison. In particular, when the voltage falls below the voltage threshold, the monitoring unit can provide the control signal to the voltage supply unit in such a way that the voltage supply unit is prompted to provide the maintenance voltage via the maintenance path. Furthermore, when the voltage threshold is reached or exceeded, the monitoring unit can provide the control signal to the voltage supply unit in such a way that the voltage supply unit is prompted to provide the operating voltage via the operating path.

[0036] The proposed embodiment can advantageously ensure, in particular automatically, energy-saving maintenance of a stable, in particular thermal, state of the subset of the multiple components of the X-ray device. In particular, the input voltage can be used as a control signal for providing the respective voltage via the respective path, in particular the operating voltage via the operating path or the maintenance voltage via the maintenance path.

[0037] In a further advantageous embodiment of the proposed power supply circuit, the X-ray device can have a detector unit and a conditioning unit. The conditioning unit can be configured to provide energy to maintain a maintenance state of the detector unit. Furthermore, at least the maintenance path can be configured to supply power to at least the conditioning unit.

[0038] The detector unit can be configured for the detection, in particular photon-counting, of X-rays impinging on an X-ray-sensitive surface of the detector unit. The detector unit can have the X-ray-sensitive surface, in particular an X-ray detector layer, on its upper side. This can be arranged facing an X-ray source, at least in one operating state. Furthermore, the X-ray detector layer can be configured to detect X-rays emitted by the X-ray source.

[0039] Advantageously, the conditioning unit can be designed to provide energy for maintaining a state of preservation of the detector unit. The state of preservation can describe a state of the detector unit in which the detector unit is tempered within a predefined temperature range or to a predefined temperature, in particular above a predefined minimum temperature. Advantageously, the conditioning unit can be designed to provide the energy for tempering the detector unit to the predefined temperature, in particular above the predefined minimum temperature, or to a temperature within the predefined temperature range. The conditioning unit can, for example, be designed to provide electromagnetic and / or thermal energy for maintaining the state of preservation of the detector unit.For this purpose, the conditioning unit can be arranged on the detector unit, in particular at least partially integrated into the detector unit. Alternatively, the conditioning unit can be arranged at a distance from the detector unit, advantageously outside a direction of incidence of the X-ray radiation with respect to the X-ray-sensitive surface of the detector unit.

[0040] Advantageously, at least the maintenance path, in particular the maintenance path and the operating path, can be configured to supply at least the conditioning unit. In particular, the voltage supply unit can be configured to provide the maintenance voltage in the second operating state via the maintenance path at least to the conditioning unit. The conditioning unit can be selectively activated for maintenance operation and deactivated for normal operation, in particular by means of the maintenance path.

[0041] The proposed embodiment can enable an improved energy-saving maintenance of a stable, in particular thermal, state of the detector unit.

[0042] In a further advantageous embodiment of the proposed power supply circuit, the detector unit can comprise a semiconductor material and be configured for photon-counting detection of X-rays. The conditioning unit can be configured to keep the semiconductor material conditioned in the maintenance state using the provided energy.

[0043] The X-ray detector layer can comprise a direct-converting (semiconductor) X-ray sensor layer, for example, comprising CdTe, CdZnTe, CdTeSe, CdZnTeSe, CdMnTe, GaAs, Si, or Ge as semiconductor material. The X-ray detector layer can also comprise a layer with analog-to-digital converters, onto which the X-ray sensor layer is applied, wherein the A / D converter layer can be implemented in one or more ASICs. Incoming X-rays or photons can be converted into electrical pulses by a suitable converter material in the X-ray sensor layer. Incoming X-rays are converted into charge carriers in the converter material of the X-ray sensor layer depending on the locally deposited energy of an X-ray photon. Based on the charge carriers, a signal, typically an electrical pulse, can be generated in pixel-by-pixel pixel electronics, which is typically further processed pixel-by-pixel.The electrical pulses can be evaluated by evaluation electronics, such as an ASIC. For example, the incident X-ray radiation can be measured by counting the electrical pulses triggered by the absorption of X-ray photons in the converter material. The height or length of a generated electrical pulse is usually also proportional to the energy of the absorbed X-ray photon. This allows spectral information to be extracted by comparing the height or length of the electrical pulse with an energy threshold. Photon-counting detector units often have several adjustable energy thresholds for comparing the generated electrical pulses, enabling energy-resolved measurements depending on several energy ranges defined by the energy thresholds. A pixel element can be configured as pixel-by-pixel pixel electronics, i.e.Electronic pixels are understood to be the evaluation unit, which is signal-coupled to the X-ray sensor layer via a pixel electrode and further processes the signals received from the X-ray sensor layer via the respective pixel electrode. The pixel element can be assigned a corresponding detection volume in the X-ray sensor layer, which is formed by an electric field between a respective sensor pixel electrode and a top electrode applied on an opposite side of the X-ray sensor layer and which forms the sensitive detection volume of a pixel element. The electric field can be provided by applying a bias voltage to the respective sensor pixel electrode and the top electrode. The electric field can lead to heating of the semiconductor material of the X-ray sensor layer.Temperature differences of the X-ray sensor layer, for example due to switching the bias voltage on or off, can lead to unwanted drift and / or image artifacts.

[0044] The proposed embodiment can enable an improved energy-saving maintenance of a stable, in particular thermal, state of the semiconductor material.

[0045] In a further advantageous embodiment of the proposed power supply circuit, the conditioning unit can be designed to provide the energy for maintaining the conservation state by heat transfer and / or illuminating the detector unit.

[0046] The conditioning unit can comprise a heating element, for example a heating wire, which is designed to provide thermal energy to the detector element to maintain the state of preservation through heat transfer. The thermal energy can be provided by direct heat transfer between the heating element and the detector unit or by means of a heat-conducting medium, for example a fluid and / or heat-conducting material. Alternatively or additionally, the conditioning unit can comprise a light source, in particular an infrared light source, for emitting light, in particular infrared light, to illuminate the detector unit, in particular the X-ray sensor layer and / or the semiconductor material. The detector unit, in particular the X-ray sensor layer, can be heated by converting the incoming infrared light.

[0047] Advantageously, the conditioning unit can be designed to temper the detector unit, in particular the X-ray sensor layer, to the predefined temperature or a temperature within the predefined temperature range through heat transfer and / or illumination. This can advantageously ensure that the conditioning of the detector unit is maintained.

[0048] In a second aspect, the invention relates to an X-ray device comprising an X-ray source, a detector unit, at least one voltage source, and a proposed power supply circuit. The at least one voltage source optionally provides a maintenance voltage in a first operating state or an operating voltage as an input voltage to the power supply circuit in a second operating state. In the first operating state, the voltage supply unit, based on the input voltage, provides an electrical operating voltage via the operating path to the X-ray source and the detector unit for normal operation, such that X-ray radiation can be emitted by the X-ray source to illuminate the detector unit, and the X-ray radiation can be detected by the detector unit.In the second operating state, the voltage supply unit provides, based on the input voltage, an electrical maintenance voltage via the maintenance path for maintenance operation to a subset of the plurality of components of the X-ray device.

[0049] The advantages of the proposed X-ray device essentially correspond to the advantages of the proposed power supply circuit. Features, advantages, or alternative embodiments mentioned herein can also be applied to the other claimed subject matter, and vice versa.

[0050] In a further advantageous embodiment of the proposed X-ray device, the X-ray device can have a first and a second voltage source. The first voltage source can be configured to provide the electrical operating voltage in the first operating state as the input voltage to the power supply circuit. Furthermore, the second voltage source can be configured to provide the electrical maintenance voltage in the second operating state as the input voltage to the power supply circuit.

[0051] The proposed embodiment can advantageously enable a smaller design of the second voltage source compared to the first voltage source. In particular, the first voltage source can be adapted to the requirements of providing the operating voltage, and the second voltage source can be adapted to the requirements of providing the maintenance voltage.

[0052] In a further advantageous embodiment of the proposed X-ray device, the power supply circuit can comprise a detector unit and a conditioning unit. In the second operating state, the voltage supply unit can provide the electrical maintenance voltage to the conditioning unit via the maintenance path based on the input voltage.

[0053] In a further advantageous embodiment of the proposed X-ray device, the X-ray device can be designed as a computed tomography system. The X-ray source and the detector unit can be rotatably mounted in a defined arrangement.

[0054] In a third aspect, the invention relates to a method for operating an X-ray device comprising a proposed power supply circuit. In a first step, an input voltage is provided to the power supply circuit by means of at least one voltage source. In a further step, the input voltage at the power supply input of the power supply unit is detected by means of the sensor. In a further step, depending on the detected input voltage, an electrical operating voltage is provided via the operating path or an electrical maintenance voltage via the maintenance path to the respective components of the X-ray device.

[0055] The advantages of the proposed method essentially correspond to the advantages of the proposed power supply circuit and / or the proposed X-ray device.

[0056] Features, advantages or alternative embodiments mentioned herein may also be transferred to the other claimed subject matter and vice versa.

[0057] In a further advantageous embodiment of the proposed method, the X-ray device can have a power supply circuit comprising a detector unit and a conditioning unit. The power supply unit can supply the operating voltage or the maintenance voltage to the conditioning unit depending on the detected input voltage. In either case, the conditioning unit can provide energy to maintain the maintenance state of the detector unit.

[0058] Embodiments of the invention are illustrated in the drawings and described in more detail below. In different figures, the same reference numerals are used for the same features. They show: Fig. 1 to 3 show schematic representations of various advantageous embodiments of a proposed power supply circuit for an X-ray device, Fig. 4 shows a schematic representation of an advantageous embodiment of a proposed method for operating an X-ray device comprising a power supply circuit, Fig. 5 shows a schematic representation of a CT device as an exemplary embodiment of a proposed X-ray device

[0059] Fig. 1 shows a schematic representation of an advantageous embodiment of a proposed power supply circuit for an X-ray device RG. The power supply circuit can have a voltage supply unit VS and a monitoring unit SU. Furthermore, the voltage supply unit SU can have an operating path BP and a maintenance path EP. The operating path BP can be designed to supply a plurality of components FC and CP of the X-ray device 1 for normal operation. Furthermore, the maintenance path EP can be designed to supply a subset CP of the plurality of components CP and FC of the X-ray device RG for maintenance operation. The monitoring unit SU can be designed to detect an input voltage at a voltage supply input of the voltage supply unit SV by means of a sensor.In addition, the monitoring unit SU can be configured to provide a control signal SIG to the voltage supply unit SV as a function of the detected input voltage. The voltage supply unit SV can be configured to provide an electrical operating voltage via the operating path BP or an electrical maintenance voltage via the maintenance path EP to the respective components FC and / or CP as a function of the detected input voltage, in particular as a function of the control signal SIG.

[0060] The operating path BP can be configured to supply at least one digital component and at least one analog component of the X-ray device for normal operation. Furthermore, the maintenance path EP can be configured to supply at least one of the at least one analog component of the X-ray device for maintenance operation.

[0061] The operating path BP and the maintenance path EP can be different, except for the supply of the subset CP of the multiple components CP and FC of the X-ray device RG. Alternatively, the maintenance path EP can be a subpath of the operating path BP.

[0062] The monitoring unit SU can be configured to compare the input voltage with a predetermined voltage threshold. Furthermore, the voltage supply unit SV can provide the electrical operating voltage via the operating path BP when the threshold is reached or exceeded, or the electrical maintenance voltage via the maintenance path EP when the threshold is undershot. For example, the monitoring unit SU can be configured to provide the control signal SIG to the voltage supply unit SV depending on the comparison.

[0063] The voltage supply unit SV can have a first voltage source PS.N and a second voltage source PS.E. The first voltage source PS.N can be configured to supply the operating path for normal operation. Furthermore, the second voltage source PS.E can be configured to supply the maintenance path for maintenance operation. The voltage supply unit SV can, for example, have a switching element SE configured to switch between the first and second voltage sources PS.N and PS.E to supply the respective path for the respective operation.

[0064] Fig. 2 shows a schematic representation of a further advantageous embodiment of a proposed power supply circuit for an X-ray device RG.

[0065] The voltage supply unit SV can, for example, have a diode DS as a switching element, wherein the diode DS can enable switching between the first and second voltage sources PS.N and PS.E to supply the respective path for the respective operation.

[0066] Fig. Figure 3 shows a schematic representation of another advantageous embodiment of a proposed power supply circuit for an X-ray device. The X-ray device can have a detector unit 1 and a conditioning unit CU. The conditioning unit CU can be configured to provide energy to maintain a maintenance state of the detector unit 1. Furthermore, at least one maintenance path EP can be configured to supply at least one conditioning unit CU.

[0067] The detector unit can comprise a semiconductor material and be configured for photon-counting detection of X-rays. Furthermore, the conditioning unit CU can be configured to keep the semiconductor material conditioned in the conservation state using the provided energy. The conditioning unit CU can further be configured to provide the energy for maintaining the conservation state through heat transfer and / or illumination of the detector unit 1.

[0068] As in Fig. 3, a first current source CS.N can be configured to supply the operating path for normal operation. Furthermore, a second current source CS.E can be configured to supply the maintenance path for maintenance operation. The voltage supply unit VS can further comprise a first voltage source PS.N for providing an operating voltage for normal operation and a second voltage source PS.E for providing a maintenance voltage for maintenance operation. Furthermore, the voltage supply unit can comprise a third voltage source PS.C for providing a further voltage to the conditioning unit CU. A relay R can be used to switch between maintenance operation and normal operation, in particular between the maintenance path and the operating path.The conditioning unit CU can, for example, ensure that a base current, in particular a maintenance current, remains active in the semiconductor material of the detector unit under high voltage, in particular the bias voltage, even during maintenance operation.

[0069] Fig. 4 shows a schematic representation of an advantageous embodiment of a proposed method for operating an X-ray device, comprising a proposed power supply circuit. In a first step, an input voltage can be provided to the power supply circuit by means of at least one voltage source PROV-VI. In a further step, the input voltage at the voltage supply input of the voltage supply unit can be detected by means of the sensor DET-VI. In a further step, depending on the detected input voltage, an electrical operating voltage can be provided via the operating path to the plurality of components of the X-ray device PROV-VB or an electrical maintenance voltage can be provided via the maintenance path to the at least one component of the X-ray device PROV-VE.

[0070] Advantageously, the power supply unit can provide the operating voltage or the maintenance voltage to the conditioning unit CU PROV-VB or PROV-VE depending on the detected input voltage, in particular depending on the control signal SIG. In any case, the conditioning unit CU can provide energy to maintain the maintenance state of the detector unit 1.

[0071] Fig.5 shows a schematic representation of a CT system 33 as an exemplary embodiment of a proposed X-ray device RG. The CT system 33 can comprise an X-ray source 37, a detector unit 1, at least one voltage source SQ, a proposed power supply circuit, and a processing unit PRVS. The X-ray source 37 and the detector unit 1, in particular comprising an X-ray detector, can be arranged opposite one another. The X-ray source 37 can be configured to illuminate the detector unit 1, in particular the X-ray detector, with X-ray radiation along an X-ray incidence direction.

[0072] The at least one voltage source SQ can optionally provide an electrical operating voltage in a first operating state or an operating voltage as an input voltage to the power supply circuit in a second operating state. In particular, the CT system 33 can have a first and a second voltage source (not shown here). The first voltage source can be configured to provide the electrical operating voltage as the input voltage to the power supply circuit in the first operating state. Furthermore, the second voltage source can be configured to provide the electrical maintenance voltage as the input voltage to the power supply circuit in the second operating state.

[0073] In the first operating state, the voltage supply unit SV can, based on the detected input voltage, provide the operating voltage via the operating path BP to the X-ray source 37 and the detector unit 1 for normal operation, so that X-ray radiation can be emitted by the X-ray source 37 to illuminate the detector unit 1 and the X-ray radiation can be detected by the detector unit 1. In the second operating state, the voltage supply unit SV can, based on the detected input voltage, provide the maintenance voltage via the maintenance path EP for maintenance operation to a subset of the multiple components of the CT system 33.

[0074] Advantageously, the CT system 33 can further comprise a conditioning unit CU. The conditioning unit CU can be configured to provide energy for maintaining a maintenance state of the detector unit 1. Furthermore, at least the maintenance path EP can be configured to supply at least the conditioning unit CU. Furthermore, in the second operating state, the voltage supply unit SV can provide the maintenance voltage to the conditioning unit CU via the maintenance path EP based on the detected input voltage.

[0075] The CT system 33 can also include a gantry 32 with a rotor 35. The X-ray source 37 and the detector unit 1 can be arranged in a defined arrangement on the rotor 35, in particular integrated into the rotor 35 or attached to the rotor 35. The rotor 35 can be rotatably mounted about a rotation axis 43. An examination object 39 to be imaged can be mounted on the patient support device 41 and movable along the rotation axis 43 through the gantry 32. The processing unit PRVS can be used to control the CT system 33 and to calculate cross-sectional images or volume images of the examination object 39. An input device 47, for example a keyboard, and an output device 49, for example a screen and / or display, can be connected to the processing unit PRVS, in particular coupled by signal transmission.The input device 47 can advantageously be integrated into the output device 49, for example in a particularly resistive and / or capacitive input display.

[0076] The schematic representations contained in the figures described do not represent any scale or proportions.

[0077] Finally, it should be noted once again that the methods described in detail above, as well as the devices illustrated, are merely exemplary embodiments that can be modified in a variety of ways by those skilled in the art without departing from the scope of the invention. Furthermore, the use of the indefinite articles "a" or "an" does not exclude the possibility that the respective features may be present in multiple instances. Likewise, the terms "unit" and "element" do not exclude the possibility that the respective components consist of several interacting subcomponents, which may also be spatially distributed.

[0078] In the context of the present application, the expression "based on" can be understood in particular in the sense of the expression "using." In particular, a formulation according to which a first feature is generated (alternatively: determined, determined, etc.) based on a second feature does not exclude the possibility that the first feature can be generated (alternatively: determined, determined, etc.) based on a third feature.

Claims

[1] Power supply circuit for an X-ray device (RG), comprising a voltage supply unit (SV) and a monitoring unit (SU), wherein the power supply unit (SV) has an operating path (BP) and a maintenance path (EP), wherein the operating path (BP) is designed to supply several components of the X-ray device (RG) for normal operation, wherein the maintenance path (EP) is designed to feed a subset of the plurality of components of the X-ray device (RG) for maintenance operation, wherein the monitoring unit (SU) is designed to detect an input voltage at a voltage supply input of the voltage supply unit (SV) by means of a sensor, wherein the voltage supply unit (SV) is designed to provide an electrical operating voltage via the operating path (BP) or an electrical maintenance voltage via the maintenance path (EP) to the respective components as a function of the detected input voltage. [2] Power supply circuit according to claim 1, wherein the operating path (BP) is designed to feed at least one digital component and at least one analog component of the X-ray device (RG) for normal operation, wherein the maintenance path (EP) is designed to feed at least one of the at least one analog component of the X-ray device (RG) for maintenance operation. [3] Power supply circuit according to one of the preceding claims, wherein the operating path (BP) and the maintenance path (EP) are different except for the supply of the subset of the plurality of components of the X-ray device (RG). [4] Power supply circuit according to one of claims 1 or 2, wherein the maintenance path (EP) is a partial path of the operating path (BP). [5] Power supply circuit according to one of the preceding claims, wherein the monitoring unit (SU) is designed to compare the input voltage with a predetermined voltage threshold value, wherein the voltage supply unit (SV) provides the electrical operating voltage via the operating path (BP) when the voltage threshold is reached or exceeded, or provides the electrical maintenance voltage via the maintenance path (EP) when the voltage threshold is undershot. [6] Power supply circuit according to one of the preceding claims, wherein the X-ray device (RG) has a detector unit (1) and a conditioning unit (CU), wherein the conditioning unit (CU) is designed to provide energy for maintaining a maintenance state of the detector unit (1), wherein at least the maintenance path (EP) is designed to feed at least the conditioning unit (CU). [7] Power supply circuit according to claim 6, wherein the detector unit (1) comprises a semiconductor material and is designed for photon-counting detection of X-ray radiation, wherein the conditioning unit (CU) is designed to keep the semiconductor material conditioned in the maintenance state by means of the provided energy. [8] Power supply circuit according to claim 6 or 7, wherein the conditioning unit (CU) is designed to provide the energy for maintaining the conservation state by heat transfer and / or illuminating the detector unit (1). [9] X-ray device (RG), comprising an X-ray source (37), a detector unit (1), at least one voltage source (SQ) and a power supply circuit according to one of the preceding claims, wherein the at least one voltage source (SQ) optionally provides an electrical operating voltage in a first operating state or an electrical maintenance voltage in a second operating state as input voltage to the power supply circuit, where in the first operating state: - the voltage supply unit (SV) provides the operating voltage via the operating path (BP) to the X-ray source (37) and the detector unit (1) for normal operation based on the input voltage, that X-ray radiation can be emitted by means of the X-ray source (37) to illuminate the detector unit (1) and the X-ray radiation can be detected by means of the detector unit (1), wherein in the second operating state: - the voltage supply unit (SV) provides the maintenance voltage via the maintenance path (EP) for maintenance operation to a subset of the plurality of components of the X-ray device (RG) based on the input voltage. [10] X-ray device (RG) according to claim 9, comprising a first and a second voltage source, wherein the first voltage source is designed to provide the electrical operating voltage in the first operating state as the input voltage to the power supply circuit, wherein the second voltage source is configured to provide the electrical maintenance voltage in the second operating state as the input voltage to the power supply circuit. [11] X-ray device (RG) according to claim 9 or 10, comprising a power supply circuit according to one of claims 6 to 8, wherein the voltage supply unit (SV) in the second operating state provides the electrical maintenance voltage via the maintenance path (EP) to the conditioning unit (CU) based on the input voltage. [12] X-ray device (RG) according to one of claims 9 to 11, wherein the X-ray device (RG) is designed as a computer tomography system (33), wherein the X-ray source (37) and the detector unit (1) are rotatably mounted in a defined arrangement. [13] Method for operating an X-ray device (RG) having a power supply circuit according to one of claims 1 to 8, comprising: - Providing (PROV-VI) an input voltage to the power supply circuit by means of at least one voltage source (SQ), - Detecting (DET-VI) the input voltage at the power supply input of the power supply unit (SV) by means of the sensor, - Depending on the detected input voltage, providing an electrical operating voltage (PROV-VB) via the operating path (BP) or an electrical maintenance voltage (PROV-VE) via the maintenance path (EP) to the respective components of the X-ray device (RG). [14] Method according to claim 13, wherein the X-ray device (RG) comprises a power supply circuit according to one of claims 6 to 8, wherein the voltage supply unit (SV) provides the operating voltage or the maintenance voltage to the conditioning unit (CU) depending on the detected input voltage, wherein in each case energy is provided by means of the conditioning unit to maintain the state of the detector unit (1).

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