PARAMETER ADJUSTING DEVICE, PARAMETER ADJUSTING METHOD AND PROGRAM

Abstract

A parameter adjustment device according to an embodiment of the present disclosure includes: a generation circuit for acquiring past parameter values for each of a plurality of control parameters set in the past for a device, and generating, based on the past parameter values, at least one of first information indicating a parameter value dispersion state for each control parameter and second information indicating a state for each adjustment achieved by expressing the past parameter value using at least one line segment; and a display control circuit for displaying a current parameter value set for each of the plurality of control parameters on a user interface, superimposed on at least one of the first information and the second information.

Description

Technical area

[0001] The present invention relates to a parameter adjusting apparatus, a parameter adjusting method and a program. General state of the art

[0002] In production equipment used in factories, such as component assembly machines and assembly robots, a multitude of servomotors are combined to perform complex and precise operational control. In such a device, the operation of a control target is controlled according to numerous control parameters. To achieve the desired performance, users adjust the control parameters empirically.

[0003] The process of adjusting these control parameters becomes increasingly difficult as operating conditions become more diverse and complex, and the number of parameters increases, requiring considerable effort and time. Therefore, there is a growing need to automate these adjustment processes.

[0004] For this reason, a technology for modeling a device to be controlled and extracting candidate parameters for adjustment using simulation has been disclosed (see, for example, Patent Document 1 (hereinafter referred to as “PTL”)). ReferencesPatent specification

[0005] PTL 1 Japanese Patent Application No. 2017-167607 Brief description of the invention

[0006] However, when the number of control parameters ranges from dozens to hundreds, and the number of operating conditions that meet performance requirements also increases, such as dozens, the number of combinations becomes enormous, making it difficult to efficiently configure appropriate inspection priorities, inspection ranges, etc. This can make it difficult to efficiently configure appropriate parameter values.

[0007] A non-limiting and exemplary embodiment of the present invention facilitates providing a parameter adjustment apparatus, a parameter adjustment method, and a program that enable efficient configuration of parameter values.

[0008] A parameter adjustment device according to an embodiment of the present invention comprises: generation circuits that, in operation, acquire a past parameter value for each of a plurality of control parameters configured in the past for a device and generate at least one of the first information and the second information based on the past parameter value, wherein the first information indicates a parameter value dispersion state for each control parameter, wherein the second information indicates a state for each configuration, wherein the past parameter value is expressed using one or more line segments;and display control circuitry operable to display a current parameter value configured for each of the plurality of control parameters at a user interface such that the current parameter value is superimposed on at least one of the first information and the second information;

[0009] A parameter adjustment method according to an embodiment of the present invention is performed by a parameter adjustment device and includes: acquiring a past parameter value for each of a plurality of control parameters configured in the past for a device; generating at least one of first information and second information based on the past parameter value, the first information indicating a parameter value dispersion state for each control parameter, the second information indicating a state for each configuration, the past parameter value being expressed using one or more line segments;and displaying a current parameter value configured for each of the plurality of control parameters at a user interface such that the current parameter value is superimposed on at least one of the first information and the second information;

[0010] A program according to an embodiment of the present invention is a program for causing a computer to perform the following: acquiring a past parameter value for each of a plurality of control parameters configured in the past for a device; generating at least one of first information and second information based on the past parameter value, the first information indicating a parameter value dispersion state for each control parameter, the second information indicating a state for each configuration, the past parameter value being expressed using one or more line segments; and displaying a current parameter value configured for each of the plurality of control parameters at a user interface such that the current parameter value is superimposed on at least one of the first information and the second information.

[0011] It should be noted that these general or specific embodiments may be implemented as a system, apparatus, method, integrated circuit, computer program, or storage medium, or any combination thereof.

[0012] According to an embodiment of the present invention, it is possible to provide a technology that enables efficient configuration of parameter values.

[0013] Additional advantages and effects of an embodiment of the present invention will become apparent from the description and drawings. These advantages and / or effects are provided by various embodiments and features described in the description and drawings, but they need not all be provided to achieve one or more of the same features. Short description of the drawings

[0014] They show: Fig. 1 is a block diagram illustrating an example of an automatic parameter adjustment system according to an embodiment of the present invention; Fig. 2A is a block diagram illustrating an example of a hardware configuration of the automatic parameter adjustment device according to an embodiment of the present invention; Fig. 2B is a block diagram illustrating an example of a functional configuration of the automatic parameter adjustment device according to an embodiment of the present invention; Fig. 2C is a block diagram illustrating a more detailed example of the operational configuration of the automatic parameter adjustment system according to an embodiment of the present invention; Fig. 3A illustrates an example of a data configuration of adaptation elements according to an embodiment of the present invention; Fig. 3B illustrates an example of a data configuration of adaptation elements according to an embodiment of the present invention; Fig. 3C illustrates an example of a data configuration of adaptation elements according to an embodiment of the present invention; Fig. 4 illustrates an example of a display screen (UI screen) displayed in a UI section according to an embodiment of the present disclosure; Fig. 5 shows an example of the display screen (UI screen) displayed in the UI section according to an embodiment of the present invention; Fig. 6 is a flowchart depicting an exemplary operation of the automatic parameter adjustment system according to an embodiment of the present invention; Fig. 7 a flow chart showing details of the Fig. 6 shows step S608; Fig. 8 an example of a display screen (UI screen) with reference to the Fig. 7 shown step S707; Fig. 9 an example of a display screen (UI screen) with reference to the Fig. 7 shown step S712; and Fig. 10 is a block diagram illustrating an example of a remote automatic parameter adjustment system according to a variant of the embodiment of the present invention. Description of the embodiments

[0015] Hereinafter, embodiments of the present disclosure will be described in detail with reference to the drawings as appropriate. However, unnecessary detailed descriptions may be omitted. For example, detailed descriptions of well-known topics and redundant descriptions of substantially the same configuration may be omitted. This is to avoid unnecessary redundancy in the following description and to facilitate understanding by those skilled in the art.

[0016] It should be noted that the accompanying drawings and the following description are provided so that a person skilled in the art can sufficiently understand the present disclosure and are not limited to the subject matter mentioned in the claims. EmbodimentConfiguration overview of the automatic parameter adjustment system

[0017] Fig. 1 is a block diagram illustrating an example of an automatic parameter adjustment system according to an embodiment of the present disclosure. As shown in Fig. 1, the automatic parameter adjustment system 100 includes a user interface (UI) section 101, a database (DB) section 102, an automatic parameter adjustment device 103, a device 104, and a sensor 105. The automatic parameter adjustment device 103 is an example of a parameter adjustment device and a computer according to the present disclosure.

[0018] The UI section 101 is an example of a display according to the present disclosure.

[0019] The automatic parameter adjustment system 100 examines and adjusts control parameters so that a predetermined operation (operating condition) to be performed by the device 104, such as a component assembly machine, satisfies an objective value representing a predetermined performance.

[0020] In this description, parameters that represent operating conditions (e.g., movement speed, movement distance, stop position, etc.) are referred to as operating parameters (or operating condition parameters), and parameters within device 104 that form the operating conditions (e.g., control gain, filter time constant, etc.) are referred to as control parameters (or control condition parameters). The target of parameter exploration is the control parameters. Here, exploration means automatically finding parameter values ​​that satisfy an objective value using various known algorithms. Adjustment means varying parameter values ​​through exploration or manual variation. Parameters related to exploration (experiment priority, exploration range, exploration frequency, exploration conditions (configuration of the objective value), etc.) are called hyperparameters.

[0021] The UI section 101 is implemented by a UI device or UI unit such as a display, keyboard, mouse, etc., and receives adjustment items (e.g., operating conditions, desired performance, priority parameters, examination area, etc.) from a user (by the user operating the UI section 101) and outputs (outputs, transmits) the received adjustment items to the automatic parameter adjustment device 103 (more specifically, the adjustment item setting device 106, which will be described later) so that the automatic parameter adjustment device configures the adjustment items. The UI section 101 receiving the adjustment items from the user and passing them to the automatic parameter adjustment device 103 may mean that the user configures the adjustment items.

[0022] The UI section 101 displays information configured in the automatic parameter adjustment device 103, trial history, etc., output (or transmitted) from the automatic parameter adjustment device 103 in text and / or graphic form. A trial refers to a series of operations in which the automatic parameter adjustment device 103 evaluates control parameter values ​​that are candidates for configuration and, based on the evaluation results, determines the next candidate control parameter values ​​to be configured for the device 104, thereby optimizing the control parameter values ​​configured for the device 104.

[0023] The UI section 101 is shown separately from the automatic parameter adjustment device 103, but it may be integrated into the automatic parameter adjustment device 103.

[0024] The DB section 102 is formed by a storage device or storage device, such as a hard disk drive in a data management server or a data center, and stores profiles, histories of parameters configured in the past, and the like for the device 104 to be adjusted (also referred to as an optimization target) and / or a sensor 105 used for operation evaluation, as will be described in more detail below.

[0025] In addition, the profiles, histories of parameters configured in the past, and the like of the device 104 to be adjusted and / or the sensors 105, which are stored in the DB section 102 for operation evaluation, are read by the automatic parameter adjusting device 103 (more specifically, the adjusting element setting device 106, which will be described later).

[0026] The DB section 102 is shown as separate from the automatic parameter adjustment device 103, but it may be integrated into the automatic parameter adjustment device 103.

[0027] The automatic parameter adjustment device 103 performs the examination and adjustment of the control parameters for the device 104 by determining the examination range of the control parameters for the device 104 based on the adjustment items received from the user and information stored in the DB section 102. For example, the automatic parameter adjustment device 103 performs the examination and adjustment of the control parameters as follows.

[0028] The automatic parameter adjustment device 103 generates a combination of control parameter values ​​(hereinafter referred to as a vector) that improves the objective value based on a past test result.

[0029] The automatic parameter adjustment device 103 configures a trial vector consisting of a generated vector and operating conditions (operating parameters) used for adjustment in the automatic parameter adjustment device 103 and forwards (outputs, transmits, or configures) it to the device 104. This allows the automatic parameter adjustment device 103 to control the device 104 to operate according to the trial vector.

[0030] It should be noted that when a device or functional unit (processor) configures information, such as parameters, this can mean one or more of: the device or functional unit (processor) stores this information in a data table, operates according to this information, and controls other devices or functional units (processors) to operate according to this information.

[0031] The automatic parameter adjustment device 103 receives an operating result of the device 104, which was operated according to the test vector, from the sensor 105 and evaluates the operating result to determine whether the objective value has improved. The automatic parameter adjustment device 103 uses this series of test results as a previous distribution for the next vector generation.

[0032] The automatic parameter adjustment device 103 stores (writes) a trial value (parameter value) distribution for each parameter, a vector distribution for each trial (or configuration), and an evaluation value distribution for each trial (or configuration) in the DB section 102.

[0033] The automatic parameter adjustment device 103 generates a parameter value scatter diagram (first information) based on the trial value distribution for each parameter, a vector diagram (line graph, second information) based on the vector distribution for each trial, and a distribution diagram (histogram) of evaluation values ​​(evaluation scores according to the present disclosure) based on the evaluation value distribution for each trial, and outputs (outputs, transmits) them to the UI section 101 for display by the UI section 101.

[0034] Device 104 may, for example, be a conversion machine, such as a production device (which is subject to control parameter adjustment), or a model that simulates the operation of the conversion machine. If device 104 is a model, the model may be implemented using hardware, software, or a combination of hardware and software. The model may be referred to as a virtual device.

[0035] The device 104 performs predetermined operations according to the trial vector configured by the automatic parameter adjustment device 103.

[0036] The sensor 105 can be a real device or a model that simulates the operation of the sensor. If the sensor 105 is a model, the model can be implemented using hardware, software, or a combination of hardware and software. The sensor can be referred to as a virtual sensor.

[0037] The sensor 105 detects (samples, measures) the operating result (e.g., the power values) of the device 104 operating according to the configured test vector, and outputs (outputs, transmits) the detected operating result to the automatic parameter adjustment device 103 (more precisely, the operation evaluation device 109, which will be described later).

[0038] The performance values ​​related to operation can be, for example, physical quantities such as displacement, speed, vibration, noise, voltage and current at an adjustment target location.

[0039] Thus, the automatic parameter adjustment system 100 enables the display to the user of information, experimental progress, and the like configured for the automatic parameter adjustment device 103, allowing the user to manipulate the test conditions while referring to (e.g., comparing) parameters configured in the past, thereby making it possible to efficiently configure appropriate control parameters. In addition, it becomes possible to efficiently perform the test and adjustment of the control parameters. Furthermore, the user can easily understand the progress of the test or adjustment through the displayed information, experimental progress, etc. This allows even inexperienced users, such as beginners, to efficiently configure appropriate control parameters.

[0040] It should be noted that one or more blocks depicted in the figures may be implemented in a single device or may be implemented in different devices. For example, the device 104 may be implemented as a single device including the UI section 101, the DB section 102, the automatic parameter adjustment device 103, and the sensor 105. Alternatively, the automatic parameter adjustment device 103 may be implemented in the cloud, and the UI section 101 may be implemented on a user's local workstation (PC), a smartphone, a tablet, etc., with each block connected via a communication network (not depicted). Additionally, a plurality of instances of the device 104 and / or the sensor 105 may be installed.

[0041] Furthermore, the UI section 101 and / or the automatic parameter adjustment device 103 can not only configure adjustment items input by the user, but also perform configuration of control parameters and acquisition of operation results by operating a graphical user interface (GUI) of adjustment software of an existing technology to manually adjust the parameters of a device 104 of an existing technology using robotic process automation (RPA) that automatically controls using image recognition, etc. Thus, automatic parameter adjustment can be performed even for a device 104 of an existing technology that does not have a dedicated communication interface. Configuration of the automatic parameter adjustment device

[0042] The automatic parameter adjustment device 103 is implemented by any computer device (calculator, computer), such as a server, a PC, or the like, or an information processing device. For example, the automatic parameter adjustment device 103 may Fig. 2A have the hardware configuration shown. Fig. 2A is a block diagram illustrating an example of the hardware configuration of the automatic parameter adjustment device according to an embodiment of the present disclosure. For example, as shown in Fig. 2A, the automatic parameter adjustment device 103 may include a storage device 151, a processing device 152, a UI device 153, and a communication device 154, each interconnected via a bus 155.

[0043] The programs or instructions for implementing functions and processes, which will be described later, in the automatic parameter adjusting device 103 may be downloaded from an external device (e.g., a server) via a network or the like, or may be provided from a removable storage medium such as a CD-ROM (“Compact Disc Read Only Memory”) or a flash memory.

[0044] The storage device 151 is configured by random access memory (RAM), flash memory, a hard disk drive, and the like, and stores files, data, and the like used to execute the installed programs or instructions along with the programs or instructions. The storage device 151 may comprise a non-transitory storage medium.

[0045] When the DB section 102 is integrated into the automatic parameter adjustment device 103, the DB section 102 can be stored in the storage device 151.

[0046] The processing device 152 may be implemented by a general-purpose processor or controller (circuit) or by a dedicated processor or controller (circuit). When implemented by a general-purpose processor, the processing device 152 may be implemented by one or more central processing units (CPUs), graphics processing units (GPUs), processing circuits, and the like, which may consist of one or more processor cores, and performs the functions and processes of the automatic parameter adjustment device 103 described above and below according to data such as programs or instructions stored in the storage device 151, parameters used to execute the programs or instructions, and so on.

[0047] The UI device 153 may include an input device such as a keyboard, a mouse, a camera, and a microphone; an output device such as a display, a speaker, a headset, and a printer; and an input / output device such as a touch panel, and forms an interface between the user and the automatic parameter adjustment device 103. For example, the user operates the automatic parameter adjustment device 103 using the keyboard, mouse, and the like to operate a GUI displayed on the display or a touch panel.

[0048] If the UI section 101 is integrated into an automatic parameter adjustment device 103, the UI section 101 may be partially or entirely formed by the UI device 103.

[0049] The communication device 154 may be configured by various communication circuits that perform communication processing with a communication network such as an external device, the Internet, a local area network (LAN), and a virtual private network (VPN).

[0050] The hardware configuration of the automatic parameter adjustment device 103 described above is purely exemplary, and the automatic parameter adjustment device 103 according to the present disclosure may be implemented by other suitable hardware configurations.

[0051] Fig. 2B is a block diagram illustrating an example of the functional configuration of the automatic parameter adjustment device according to an embodiment of the present disclosure. For example, as shown in Fig. 2B, the automatic parameter adjustment device 103 comprises a device 106 for setting adjustment elements, a parameter examination device 107, a device 108 for setting test vectors and an operation evaluation device 109. As will be explained with reference to Fig. 2C, the automatic parameter adjustment device 103 also includes other components, and the adjustment element adjustment device 106 includes various functional subsections or processors. The adjustment element adjustment device 106 is an example of a generator and display controller according to the present disclosure. The parameter examination device 107 is an example of a parameter value generator according to the present disclosure. The operation evaluation device 109 is an example of an evaluation device according to the present disclosure.

[0052] The adjustment item setting device 106 outputs (outputs, transmits, configures) the operating conditions (operating parameters) used for parameter adjustment, control parameters to be adjusted, and hyperparameters for configuring the examination to the parameter examination device 107 based on information (such as configuration items) input from the UI section 101 and / or the DB section 102.

[0053] The adjustment item setting device 106 generates a trial value distribution diagram, a vector diagram, an evaluation value distribution diagram, and the like based on information from the trial value distribution detecting device 1031, the vector distribution detecting device 1032, the evaluation value distribution detecting device 1033, the trial value distribution history DB 1022, the vector distribution history DB 1023, the evaluation value distribution history DB 1024, and the like, as will be described later.

[0054] The adjustment item setting device 106 forwards (or transmits) the generated trial value distribution diagram, the vector diagram, the evaluation value distribution diagram, and the like to the UI section 101, whereby the generated trial value distribution diagram, the vector diagram, the evaluation value distribution diagram, and the like are displayed on the UI section 101.

[0055] The parameter examination device 107 performs an examination of control parameters based on the configuration by the adjustment element setting device 106. Various known algorithms can be used for parameter examination by the parameter examination device 107. For example, heuristic algorithms such as Bayesian optimization, genetic algorithms, and particle swarm optimization; mathematical programming methods; various combinatorial optimization solutions; and the like can be used.

[0056] The parameter examination device 107 generates a combination (a vector) of control parameter values ​​that improves the objective value based on past test results.

[0057] The parameter examination device 107 outputs (outputs, transmits, configures) a trial vector consisting of the generated vector and the operating conditions (operating parameters) used for the adjustment to the trial vector setting device 108.

[0058] The parameter examination device 107 determines whether the objective value input by the operation evaluation device 109 has improved. The parameter examination device 107 uses the test result as a prior distribution for the next vector generation. If the parameter examination device 107 determines that a vector that meets (satisfies) the objective value has been found, it decides that this vector is the parameter value to be ultimately configured for the device 104 and terminates the examination.

[0059] The experimental vector setting device 108 outputs (outputs, transmits, configures) the experimental vector input from the parameter examination device 107 to the device 104 and the operation evaluation device 109.

[0060] When the trial vector consists of the generated vector (control parameters) and a plurality of operating conditions (operating parameters), the trial vector setting device 108 operates the device 104 under each operating condition.

[0061] For example, the trial vector setting apparatus 108 configures the device 104 with the control parameters, then configures a single operating condition for a single device 104, and operates the device 104 in turn.

[0062] Also, for example, if there are a plurality of identical devices 104, the trial vector setting device 108 may configure the control parameters for all of the identical devices 104, then configure different operating conditions for each identical device 104, and operate the identical devices 104 in parallel.

[0063] The operation evaluation device 109 evaluates the operation result of the device 104 operated according to the configured trial vector based on the performance values ​​input from the sensor 105.

[0064] When the trial vector consists of the generated vector (control parameters) and a plurality of operating conditions (operating parameters), the operation evaluation device 109 evaluates the operation under each operating condition.

[0065] The performance evaluation device 109 converts the performance values ​​from the sensor 105 into evaluation values ​​for the generated vector (control parameters) according to the hyperparameters, converts these multiple evaluation values ​​into an objective value, and returns (provides, transmits, outputs) the objective value to the parameter examination device 107. The details of the evaluation value and the objective value will be described later.

[0066] Thus, the automatic parameter adjustment system 100 allows the information, experimental history, and the like configured for the automatic parameter adjustment device 103 to be displayed to the user, thereby enabling the user to manipulate the examination conditions while referring to (e.g., comparing) parameters configured in the past, thereby making it possible to efficiently configure appropriate control parameters. Furthermore, this makes it possible to efficiently perform the examination and adjustment of control parameters. In addition, the user can easily understand the progress during the examination or adjustment through the displayed information, experimental history, etc. As a result, even inexperienced users, such as beginners, can efficiently configure appropriate control parameters.

[0067] Detailed configuration of the automatic parameter adjustment system Fig. 2C is a block diagram depicting a more detailed example of the functional configuration of the automatic parameter adjustment system according to an embodiment of the present disclosure. As in Fig. 2C, the DB section 102 includes an operating condition / control condition DB 1021, a trial value distribution history DB 1022, a vector distribution history DB 1023, and an evaluation value distribution history DB 1024. Also includes, as shown in Fig. 2C, the device 106 for setting adjustment elements includes a device 1061 for inputting a configurable range, a device 1062 for inputting an examination priority, a device 1063 for inputting an examination range, a device 1064 for inputting a vector adjustment, a scatter diagram generator 1065, a vector diagram generator 1066, and a distribution diagram generator 1067. In addition, as shown in Fig. As shown in Figure 2C, the automatic parameter adjustment device 103 further includes a trial value distribution detecting device 1031, a vector distribution detecting device 1032, and an evaluation value distribution detecting device 1033. The scatter plot generator 1065, the vector plot generator 1066, and the distribution plot generator 1067 are examples of the generator and the display controller according to the present disclosure.

[0068] As described above, the automatic parameter adjustment device 103 (adjustment item setting device 106) configures the operating conditions (operating parameters) used for parameter adjustment, the control parameters to be adjusted, and the hyperparameters for configuring the examination based on information (such as configuration items) input from the UI section 101 and / or the DB section 102 (DBs 1021 to 1024).

[0069] The automatic parameter adjustment device 103 (the parameter examination device 107) generates and configures trial vectors based on these parameters.

[0070] The automatic parameter adjustment device 103 (the operation evaluation device 109) performs an operation evaluation on the device 104 as an optimization target based on the trial vector.

[0071] The automatic parameter adjustment device 103 (the parameter examination device 107) repeats the experiments to examine parameters that satisfy the objective value based on the operational evaluation results. During this process, the automatic parameter adjustment device 103 (the experimental value distribution acquisition device 1031, the vector distribution acquisition device 1032, and the evaluation value distribution acquisition device 1033) acquires the distribution of experimental values, vectors, and evaluation values. The automatic parameter adjustment device 103 (the scattergram generator 1065, the vector diagram generator 1066, and the distribution diagram generator 1067) generates experimental value scattergrams, vector diagrams, and evaluation value distribution diagrams, stores their histories in the DB section 102 (DBs 1021 to 1024), and the UI section 101 displays them. This will be explained below.

[0072] The operating condition / control condition DB 1021 stores definitions of operating parameters and control parameters that can be configured for the device 104 that is the target of parameter adjustment (profiles such as parameter types, ranges of configurable values, etc.). The information stored in the operating condition / control condition DB 1021 is read by the configurable range input device 1061 (or the operating condition / control condition DB 1021 outputs the stored information to the configurable range input device 1061).

[0073] The experimental value distribution history DB 1022 stores the information output from the experimental value distribution acquisition device 1031. The information stored in the experimental value distribution history DB 1022 is read by the parameter examination device 107 and the scattergram generator 1065 (or the experimental value distribution history DB 1022 outputs the stored information to the parameter examination device 107 and the scattergram generator 1065).

[0074] The vector distribution history DB 1023 stores the information output from the vector distribution acquisition device 1032. The information stored in the vector distribution history DB 1023 is read by the parameter examination device 107 and the vector diagram generator 1066 (or the vector distribution history DB 1023 outputs the stored information to the parameter examination device 107 and the vector diagram generator 1066).

[0075] The evaluation value distribution history DB 1024 stores the information read by the evaluation value distribution acquisition device 1033. The information stored in the evaluation value distribution history DB 1024 is read by the parameter examination device 107 and the distribution diagram generator 1067 (or the evaluation value distribution history DB 1024 outputs the stored information to the parameter examination device 107 and the distribution diagram generator 1067).

[0076] The configurable range input device 1061 outputs the operating parameters and control parameters read (or input) from the operating condition / control condition DB 1021 to the UI section 101, thereby displaying the operating parameters and control parameters on the UI section 101. The configurable range input device 1061 receives the configurable range of each parameter based on the user's operation on the UI section 101 and outputs the received configurable range to the parameter examination device 107.

[0077] The examination priority input device 1062 receives the priority of parameters to be examined by the parameter examination device 107 based on the user's operation on the UI section 101 (parameter order rearrangement handle 4011, which will be described later) and outputs the received priority to the parameter examination device 107.

[0078] The examination range input device 1063 receives the examination range of parameters to be examined by the parameter examination device 107 based on the user's operation on the UI section 101 (examination lower limit drag handle 4013 and / or examination upper limit drag handle 4014, which will be described later) and outputs the received examination range to the parameter examination device 107.

[0079] The vector adjustment input device 1064 receives an input regarding the adjustment of parameter values ​​based on the user's operation on the UI section 101 (configuration value handle 4016, which will be described later) and outputs the received input regarding the adjustment to the trial vector setting device 108.

[0080] The scattergram generator 1065 generates a scattergram of experimental values ​​for each parameter based on the information input from the experimental value distribution acquisition device 1031 and the information read (or input) from the experimental value distribution history DB 1022. The scattergram generator 1065 outputs the generated scattergram of experimental values ​​for each parameter (e.g., a scattergram of past experimental values, a scattergram of current experimental values, etc.) to the UI section 101, thereby displaying the scattergram of experimental values ​​for each operating parameter on the UI section 101.

[0081] For example, for the past trial value scattergram, the scattergram generator 1065 obtains the respective past parameter values ​​of the plurality of control parameters configured for the device 104 in the past from the trial value distribution history DB 1022 and generates a scattergram of trial values ​​(parameter values) for each control parameter based on the respective past parameter values ​​of the plurality of control parameters. For the current trial value scattergram, the scattergram generator 1065 obtains the respective current parameter values ​​configured for the plurality of control parameters of the device 104 from the trial value distribution acquisition device 1031 and generates a scattergram of current trial values ​​(parameter values) based on these current parameter values.Then, the scatter plot generator 1065 overlays the current trial value scatter plot on the scatter plot of past trial values.

[0082] The vector diagram generator 1066 generates a vector diagram for each trial (or configuration) based on the information input from the vector distribution acquisition device 1032 and the information read (or input) from the vector distribution history DB 1023. The vector diagram generator 1066 outputs the generated vector diagram for each trial (e.g., the past configuration vector diagram, the current trial vector diagram, the optimal vector diagram, etc.) to the UI section 101, thereby displaying the vector diagram for each trial on the UI section 101.

[0083] For example, the past configuration vector diagram generator 1066 obtains the respective past parameter values ​​of the plurality of control parameters configured for the device 104 in the past from the vector distribution history DB 1023 and generates a line graph for each trial (or configuration) representing the respective past parameter values ​​of the plurality of control parameters as a polygonal line (one or more line segments) based on the respective past parameter values ​​of the plurality of control parameters.For the current trial vector diagram, the vector diagram generator 1066 obtains the respective current parameter values ​​configured for the plurality of control parameters of the device 104 from the vector distribution acquisition device 1032 and generates a line graph representing the respective current parameter values ​​configured for the plurality of control parameters as a polygonal line based on these current parameter values. The vector diagram generator 1066 then overlays the current trial vector diagram on the past configuration vector diagram.

[0084] The distribution diagram generator 1067 generates a score distribution diagram for each trial (or configuration) based on the information input from the score distribution acquisition device 1033 and the information read (or input) from the score distribution history DB 1024. The distribution diagram generator 1067 outputs the generated score distribution diagram for each trial (e.g., the distribution diagram of past vector score values, the distribution diagram of current trial vector score values, the distribution diagram of optimal vector score values, etc.) to the UI section 101, thereby displaying the score distribution diagram for each trial on the UI section 101.The distribution diagram generator 1067 may include, as applicable, a maximum / minimum line of evaluation values ​​representing the minimum / maximum evaluation value in the selected evaluation value distribution, and an objective value line representing the objective value of the parameter study in the evaluation value distribution diagram.

[0085] For example, for the distribution diagram of past vector score values, the distribution diagram generator 1067 obtains the past score values ​​for each trial (or configuration) from the score distribution history DB 1024 and generates a histogram representing the distribution of past scores based on the past score values ​​for each trial. For the distribution diagram of current trial vector score values, the distribution diagram generator 1067 obtains the score value of the current trial (or configuration) from the score distribution acquisition device 1033 and generates a histogram representing the distribution of current scores based on the score value of the current trial.Then, the distribution diagram generator 1067 overlays the distribution diagram of current trial vector evaluation values ​​on the distribution diagram of past vector evaluation values.

[0086] The trial value distribution acquisition device 1031 receives the parameter values ​​attempted by the parameter examination device 107, determines the trial value distribution for each parameter based on the received parameter values, and outputs the determined trial value distribution for each parameter to the scattergram generator 1065 and the trial value distribution history DB 1022 (stores (writes) it in the trial value distribution history DB 1022).

[0087] The vector distribution acquisition device 1032 receives the vector configured by the trial vector setting device 108, determines the vector distribution for each trial based on the received vector, and outputs the determined vector distribution for each trial to the vector diagram generator 1066 and the vector distribution history DB 1023 (stores (writes) it in the vector distribution history DB 1023).

[0088] The evaluation value distribution acquisition device 1033 receives the evaluation value evaluated by the operation evaluation device 109, determines the evaluation value distribution for each trial based on the received evaluation value, and outputs the determined evaluation value distribution for each trial to the distribution diagram generator 1067 and the evaluation value distribution history DB 1024 (stores (writes) it in the evaluation value distribution history DB 1024).

[0089] Thus, the automatic parameter adjustment system 100 enables the information, experimental history, and the like configured for the automatic parameter adjustment device 103 to be displayed to the user, allowing the user to manipulate the test conditions while referring to (e.g., comparing) parameters configured in the past, thereby enabling efficient configuration of appropriate control parameters. Furthermore, it becomes possible to efficiently perform the test and adjustment of control parameters. In addition, the user can easily understand the progress during the test or adjustment through the displayed information, experimental history, etc. Therefore, even inexperienced users, such as beginners, can efficiently configure appropriate control parameters. Data structure

[0090] Fig. 3A to 3C are diagrams showing examples of the data structure of adaptation elements according to the embodiment of the present disclosure. Note that the adaptation elements shown are purely exemplary, and suitable adaptation elements can be configured according to device 104.

[0091] In Fig. 3A shows exemplary operating parameters 301; in Fig. 3B, exemplary control parameters 302 are shown; and in Fig. 3C shows exemplary evaluation parameters 303.

[0092] As in Fig. As shown in Figures 3A to 3C, the adjustment elements consist of M operating conditions, and the operating parameters are configured for each operating condition. The operating conditions here refer to operating patterns decomposed into sub-operations, such as an arm operation, a part assembly operation, etc.

[0093] The operating parameters 301 define the desired operation of the device 104 and consist of the Fig. 3A, consisting of C condition parameters and T target performance parameters. The condition parameters may include, for example, a movement direction, a movement distance, an acceleration, an acceleration time, an acceleration limit, etc. The target performance parameters may include, for example, the settling time for positioning, a positioning error, an excess amount of vibration, etc.

[0094] The control parameters 302 define the configuration range of the control parameters of the device 104, and consist of the Fig. 3B, consisting of P control parameters and T power-weight parameters. The control parameters may include, for example, numerical data such as the resonant frequency of a control filter, a time constant, a control gain, etc., the configurable range that can be configured for the device 104, such as category data such as settings of a filter configuration mode, etc., configuration units (steps), discrete value sets, etc. The power-weight parameters may be used to configure how much weight to assign to each element of the target performance in the evaluation.

[0095] The control parameters selected from this input data are configured for device 104 (including the model). Accordingly, device 104 executes the predetermined operation according to the configured control parameters. Sensor 105 then detects (samples, measures) the power value, which is the operating result of the operation.

[0096] The evaluation parameters 303 are evaluation values ​​used during the parameter investigation and are weighted values ​​that represent the performance weight parameters for respective output results (performance values; for example, those in Fig. 3C, which indicate the operating results of the device 104 when the control parameters (trial vectors; for example, those shown in Fig. 3C) are configured for M operating conditions. For example, if the target performance is met under all operating conditions, the weights are configured the same for all parameters. On the other hand, if, for each operating condition, the operating conditions are prioritized (receive priorities) or a desired performance is prioritized (received a priority), the evaluation values ​​can be calculated by adjusting the weights. In addition, the evaluation values ​​can be values ​​obtained by converting the weighted output results using an evaluation function. The evaluation function can simply sum the weighted output results, or it can sum the converted success values ​​(ratio) of the output results relative to the target performances. Next, the objective values ​​are explained.

[0097] The objective values ​​may, for example, be values ​​representing predetermined performances such as position accuracy, settling time, vibration, noise, power consumption, etc., their combinations (e.g., their sum), weighted values ​​thereof, or combinations (e.g., the sum) of these weighted values, or various statistical characteristic values, such as the mode, minimum, maximum, average, etc., of the evaluation values ​​for all operating conditions (e.g., the Fig. 3A to 3C). If weighting is used, the power-weight parameters (not shown) are calculated for each power (e.g., settling time, position error, as shown in Fig. 3C), similar to the previously mentioned power-to-weight parameters. Display screen

[0098] Next, an example of a display screen (also called UI screen) displayed at the UI section 101 will be described with reference to Fig. 4 and Fig. 5. The display screen may be displayed via a dedicated parameter configuration application associated with the automatic parameter adjustment device 103, or it may be displayed via a web browser.

[0099] Fig. 4 is a diagram showing an example of a display screen (also called a UI screen) displayed at the UI section 101 according to an embodiment of the present disclosure.

[0100] The display screen 400 includes, for example, a field 401 for displaying the parameter configuration, a field 402 for displaying a graph of the objective value / evaluation value, a field 403 for displaying the numerical configuration of an objective value / evaluation value, a handle 4011 for rearranging the parameter order, a parameter value display axis 4012, a lower examination limit handle 4013, an upper examination limit handle 4014, a trial value distribution marker 4015, a configuration value handle 4016, a configuration value vector line 4017, an evaluation value distribution line 4021, and an objective value line 4022.

[0101] On the display screen 400, the user can display or manipulate the range of each parameter, the distribution of experimental values, and the like by manipulating the UI section 101.

[0102] On the display screen 400, combinations of parameter values ​​(vectors) are displayed as a polygonal line, and the user can manipulate each vertex via the UI section 101. Additionally, on the display screen 400, the evaluation value distribution for all operating conditions for each vector is displayed as a histogram, and statistical information such as the best value, the worst value, and the operating condition at that time for the evaluation and the objective values ​​are displayed.

[0103] The parameter configuration display field 401 is a field for configuring or displaying parameters to be examined (e.g., parameter 0 to parameter 9 in the figure), and it displays parameter values ​​on a number line and as text. The parameter configuration display field 401 uses the number line to display a numerical axis normalized by the configurable minimum and maximum values, and displays the minimum value (e.g., the "low" field in the figure), the maximum value (e.g., the "high" field in the figure), and the real (trial) value (value before normalization) (e.g., the "value" field in the figure) as text in a text field. For example, regarding parameter 0, the configurable range is [68, 130], and 106.20 is configured as the trial value. The same applies to the other parameters. In this example, the vector is represented as a polygonal line [106.20, 0.25, 94.90, ..., 104.90, 0.46, 110.10].

[0104] The objective value / evaluation value graph display field 402 displays distribution graphs of objective and evaluation values ​​during study trials.

[0105] The objective value / evaluation value numerical configuration display field 403 displays the numerical values ​​of specific points in the graph displayed in the objective value / evaluation value graph display field 402 as text in a text field. The objective value / evaluation value numerical configuration display field 403 displays, for example, the minimum value (the "low" field in the figure), the average value (the "medium" field in the figure), the maximum value (the "high" field in the figure), and the like of the distribution of objective values ​​("objective value" in the figure) during test trials.In addition, the objective value / evaluation value numerical configuration display area 403 displays the minimum value (the "low" field in the figure), the average value (the "medium" field in the figure), the maximum value (the "low" field in the figure), and the like of the distribution of evaluation values ​​(evaluation value in the figure), and simultaneously displays the operating condition number ("condition number" in the figure) when these values ​​were obtained. In this example, the objective and evaluation values ​​represent the settling time.

[0106] The parameter order reorder handle 4011 is a handle for specifying the name of the parameter to be manipulated and manipulates this row. By moving it in the row direction (up and down), the order of the displayed parameters can be rearranged. By linking this movement manipulation with the priority (priority order) of the examination parameters, which are hyperparameters, the user can perform manipulations such as configuring the examination priority (priority order) to decrease compared to the parameters displayed above.

[0107] The parameter value display axis 4012 displays the parameter value of the parameter being manipulated on a numeric line. The parameter value display axis 4012 displays a numeric axis normalized by the configurable minimum and maximum values ​​for each parameter. If the parameter value takes on discrete values, the parameter value display axis 4012 can display its configuration step (interval).

[0108] The lower limit handle 4013 is a handle for configuring the lower limit of the parameter being manipulated. It configures the hyperparameters: moving it to the right increases the lower limit, and moving it to the left decreases the hyperparameter. When this movement is performed, the lower limit parameter value is displayed in the lower limit field of the text box (e.g., the "low" field in the figure). Additionally, the lower limit field of the text box can be entered, and in this case, the position of the lower limit handle 4013 can be changed along with the value entered in this field.

[0109] The upper limit handle 4014 is a handle for configuring the upper limit of the parameter being manipulated. It configures the hyperparameters: moving it to the left to lower the upper limit, and moving it to the right to increase the hyperparameters. In conjunction with this movement, the parameter value of the upper limit of the analysis is displayed in the upper limit field of the text field (e.g., the "high" field in the figure). Additionally, the upper limit field of the text field can be entered, and in this case, the position of the upper limit handle 4014 can be changed along with the value entered in this field.

[0110] If the lower examination limit handle 4013 and the upper examination limit handle 4014 are configured to the same position, this parameter can be set to the value corresponding to this position, and the examination of this parameter cannot be performed.

[0111] The scattergram generator 1065, the vector diagram generator 1066, or another functional section (processor) (not shown) included in the adjustment element setting device 106 generates a different lower limit (lower examination limit handle 4013) and upper limit (upper examination limit handle 4014) for limiting the parameter values ​​configured for a plurality of parameters, respectively, to a narrower range than the configurable range defined by the predetermined configurable minimum (lower limit) and maximum (upper limit) values ​​displayed in the parameter configuration display field 401, so that the user can change the range and output the generated range to the UI section 101 for display.

[0112] The experimental value distribution marker 4015 is a marker indicating the distribution of values ​​configured for this parameter during research experiments or in the past. Depending on the configured frequency, one or more elements of concentration, color, shape, and the like of the experimental value distribution marker 4015 can be changed and displayed. This makes it possible to display the history, such as where frequently configured values ​​and infrequently configured values ​​are located. In addition, based on the evaluation value of the configured values, one or more elements of size, pattern, and the like of the experimental value distribution marker 4015 can be changed and displayed. This makes it easier to understand the relationship between the experimental values ​​and the evaluation values.The scatter plot generator 1065 generates a scatter plot of experimental values ​​(parameter values) with different display modes for these parameter values ​​according to the frequency with which the parameter value of each control parameter is configured.

[0113] The configuration value handle 4016 is a handle for expressing the parameter value to be configured or currently being configured. It can decrease the parameter value by moving it to the left and increase it by moving it to the right. Along with this movement, the parameter value is displayed in the configuration value field of the text field (e.g., the "Value" field in the figure). In addition, the configuration value field of the text field can be entered, and in this case, the position of the configuration value handle 4016 can be changed along with the value entered in the field.

[0114] The scatter plot generator 1065, the vector diagram generator 1066, or another functional unit (processor) included in the device 106 for setting adjustment elements (not shown) generates parameter values ​​(configuration value handle 4016) each configured for the plurality of control parameters so that the user can change the values, and outputs the values ​​to the UI section 101 for display.

[0115] The configuration value vector line 4017 represents a combination of configuration parameter values ​​(vector) and is displayed as a polygonal line connecting the configuration parameter values ​​(configuration value handle 4016) in order of investigation priority (from top to bottom). Displaying this shape makes comparison with another vector in the experiment or another vector configured in the past visually easy. The polygonal line diagram of the configuration parameter values ​​is generated by the vector diagram generator 1066.

[0116] The evaluation value distribution line 4021 indicates the distribution of evaluation values, which are the results of an operational evaluation performed under a variety of operating conditions by configuring the just-designated vector for the device 104 in a histogram. For example, the evaluation value distribution line 4021 in the histogram 100 indicates the evaluation values ​​obtained by configuring each parameter value indicated by the configuration value vector line 4017 (e.g., parameter 0 to parameter 10 in the figure) for the device 104 and by operating the 104 under 100 different operating conditions. For example, in the case of the Fig. From the example shown in Figure 4, it can be seen that there are 60 operating conditions (frequency in the figure) where the evaluation value ("evaluation value" in the figure) is approximately 30. The histogram of the evaluation value distribution is generated by the distribution diagram generator 1067.

[0117] The objective value line 4022 displays the objective value for parameter analysis. For example, if the user configures the evaluation value mode for all operating conditions as the objective value (via UI section 101), the objective value line 4022 is displayed in the evaluation value distribution line 4021 mode. Alternatively, various statistical characteristic values, such as the minimum, maximum, or average, of the evaluation values ​​for all operating conditions can be used as the objective value.

[0118] Thus, by displaying and manipulating the range for each parameter, vector, trial value, and the distribution of evaluation values ​​on the display screen 400, the user can easily understand the relationship between the combination of numerous parameters (vectors) and evaluation values.

[0119] Fig. 5 is a diagram illustrating an example of a display screen (UI screen) displayed at the UI section 101 according to an embodiment of the present disclosure. Fig. The display screen 400 shown in Figure 5 is a screen after several manipulations on the Fig. 4 shown display screen 400.

[0120] In addition to some elements in the Fig. The display screen 400 shown in Figure 4 shows the Fig. 5, for example, the trial vector line 4018, the evaluation value minimum line (also called minimum value line) 4023, the evaluation value maximum line (also called maximum value line) 4024, and the evaluation value distribution line 4025 of the trial vector.

[0121] In the Fig. For example, in the display screen 400 shown in Figure 5, the parameter examination priorities (priority order) are configured in order from parameter 0 to parameter 9. For parameter 0, the examination range is the same as the configurable range. Meanwhile, for parameter 1, the lower examination limit and the upper examination limit are moved to configure a narrower examination range, and for parameter 2, the lower examination limit is moved to a value larger than the lower limit of the configurable range. In addition, for parameter 3, the lower examination limit handle 4013 and the upper examination limit handle 4014 are moved to the same position and configured to a fixed value.

[0122] When these hyperparameters are configured and the investigation begins, experimental parameter values ​​(vector) are generated, and the experimental vector line 4018 representing the experimental vector is displayed. In addition, the evaluation value distribution line 4025 of the experimental vector, which represents the distribution of operational evaluation values ​​by the experimental vector line 4018, is displayed. Since the evaluation value distribution line 4021, which represents the distribution of operational evaluation values ​​by the configuration value vector line 4017 selected from the experimental vectors, is also displayed, it is possible to compare the vector and the evaluation value distribution.

[0123] In addition, the rating value minimum line 4023, which represents the minimum rating value in the selected rating value distribution, and the rating value maximum line 4024, which represents the maximum rating value in the selected rating value distribution, are displayed.

[0124] In addition, the distribution of experimental parameters (test values) in the study, the vector and the evaluation value distribution are displayed, and when selected by the user via the UI section 101, related information can be highlighted. Operation of the automatic parameter adjustment system

[0125] Next, with reference to Fig. 6 and Fig. 7 describes an example of the operation of the automatic parameter adjustment system 100.

[0126] Fig. 6 is a flowchart depicting an example of the operation of the automatic parameter adjustment system 100 according to an embodiment of the present disclosure.

[0127] In step S601, the automatic parameter adjustment device 103 reads the definition of control parameters for the adjustment target device 104 from the DB section 102 (operation condition / control condition DB 1021) and configures the configurable range in a data table (e.g., see Fig. 3B).

[0128] In step S602, the automatic parameter adjustment device 103 configures the operating parameters for operating the adjustment target device 104, which are input from the UI section 101, in a data table (e.g., see Fig. 3A).

[0129] In step S603, the automatic parameter adjustment device 103 configures the power-to-weight ratio and the objective value of the evaluation value based on the input from the UI section 101 and information stored in the DB section 102.

[0130] In step S604, the UI section 101, under the control of the automatic parameter adjustment device 103, displays a historical data table if it exists in the DB section 102 and is similar to the current data table configured in the previous steps. Through step S604, if parameters and adjustment results from past adjustments made to the same model or similar models under conditions similar to those configured in the previous steps exist, these adjustment results can be displayed as an example of the configuration values.

[0131] In step S605, the UI section 101, under the control of the automatic parameter adjustment device 103, displays the currently configured control parameter values ​​using the configuration value handle 4016. For example, the default initial values ​​configured in the DB section 102 before the start of the examination or values ​​that have satisfied the objective value in the past can be used as the control parameter values.

[0132] In step S606, according to the user's manipulation of the parameter order rearrangement handle 4011, the automatic parameter adjustment device 103 configures the priority of the parameters to be examined. Regarding the priority, for example, before the start of the examination, default priorities configured in the DB section 102 or priorities that have satisfied the objective value in the past can be used.

[0133] In step S607, the automatic parameter adjustment device 103 configures the range of parameters to be examined according to the user's manipulation of the lower examination limit handle 4013 and / or the upper examination limit handle 4014. Regarding the examination range, for example, standard examination ranges configured in the DB section 102 before the start of the examination or examination ranges that met the objective value in the past can be used.

[0134] In step S608, the automatic parameter adjustment device 103 generates trial vectors based on the configured priority, range, and power-to-weight ratio, performs an operation evaluation, and examines parameter values ​​that satisfy all operating conditions.

[0135] In step S609, the UI section 101, under the control of the automatic parameter adjustment device 103, updates the display of the distribution of experimental values ​​(parameter values), vectors, evaluation value histograms, objective values, etc.

[0136] In step S610, the automatic parameter adjustment device 103 determines whether an examination termination condition has been met. The examination termination condition can be configured in advance (e.g., by the user via the UI section 101) as one or more of the following: detection of a parameter that meets a predetermined objective value, reaching a predetermined examination frequency, and reaching a predetermined examination time.

[0137] If the examination termination condition has not been met (step S610; NO), the flow returns to step S608.

[0138] On the other hand, if the examination termination condition has been satisfied (step S610; YES), the flow proceeds to step S611.

[0139] In step S611, the UI section 101, under the control of the automatic parameter adjusting device 103, sorts and displays the operation result of each operation condition based on the vector (the optimal vector) with which the investigation is made and which leads to the best result.

[0140] In step S612, the automatic parameter adjustment device 103 performs fine-tuning of the parameters as applicable according to the user's manipulation of the configuration value handle 4016. Then, the UI section 101, under the control of the automatic parameter adjustment device 103, displays the operation evaluation results through the fine-tuned vector.

[0141] In step S613, the automatic parameter adjustment device 103 determines whether the final operation evaluation results satisfy the objective value.

[0142] If the objective value is not satisfied (step S613; NO), the flow returns to step S602.

[0143] On the other hand, if the objective value is satisfied (step S613; YES), the flow proceeds to step S614.

[0144] In step S614, the automatic parameter adjustment device 103 adds the information used for the investigation, hyperparameters, trial values ​​(parameter values), vectors, evaluation values, and the like to the DB section 102.

[0145] In step S615, the automatic parameter adjustment device 103 configures the device 104 with the optimal vector as the adjustment result. Then, the process is terminated.

[0146] Thus, the automatic parameter adjustment system 100 allows the information, experimental history, and the like configured for the automatic parameter adjustment device 103 to be displayed to the user, allowing the user to manipulate the test conditions while referring to (e.g., comparing) configured parameters in the past, thereby making it possible to efficiently configure appropriate control parameters. Furthermore, it becomes possible to efficiently perform the test and adjustment of control parameters. In addition, the user can easily understand the progress during the test or adjustment through the displayed information, experimental history, etc. This allows even inexperienced users, such as beginners, to efficiently configure appropriate control parameters.

[0147] Furthermore, by repeatedly adjusting the hyperparameters related to the investigation, running automatic investigations based on these adjustments, and performing fine-tuning by the user, it becomes possible to efficiently investigate and adjust parameters that meet the objective value, also referring to past experimental results.

[0148] Fig. Fig. 7 is a flowchart showing the details of step S608 shown in Fig. 6 is shown. In the Fig. In the example shown in Fig. 7, the operating condition having the minimum evaluation value and the operating condition having the maximum evaluation value are identified from all the operating conditions, and by repeating similar processing for an operating condition subset including these operating conditions, vector exploration is performed.

[0149] In step S701, the automatic parameter adjustment device 103 generates trial vectors within the study range of each parameter. For example, the automatic parameter adjustment device 103 may generate the trial vectors using any suitable sampling method, such as random sampling, Bayesian sampling, or genetic algorithm-based sampling.

[0150] In step S702, the automatic parameter adjustment device 103 configures the trial vectors for the device 104 as an optimization target.

[0151] In step S703, the automatic parameter adjusting device 103 operates the device 104 as an optimization target under all operating conditions and obtains the evaluation value for each operating condition.

[0152] In step S704, the automatic parameter adjusting device 103 obtains the objective value calculated based on the evaluation values ​​under all operating conditions.

[0153] In step S705, the automatic parameter adjustment device 103 determines whether the objective value obtained in step S704 satisfies the objective value configured for the examination (e.g., by the user via the UI section 101).

[0154] If the objective value is satisfied (step S705; YES), the flow proceeds to step S706.

[0155] On the other hand, if the objective value is not satisfied (step S705; NO), the flow advances to step S707.

[0156] In step S706, the automatic parameter adjustment device 103 selects the trial vector that improved the objective value as the optimal vector. Then, the flow proceeds to step S609.

[0157] In step S707, the automatic parameter adjustment device 103 sorts the weighted evaluation values ​​and selects the operating conditions that resulted in the minimum and maximum values, respectively.

[0158] A specific example regarding step S707 will be described with reference to Fig. 8. For example, in the Fig. 8, the automatic parameter adjustment device 103 selects the operating condition number that resulted in the minimum evaluation value indicated by the minimum value line 4023 of the evaluation value distribution line (dashed line) for the trial vector (dashed line) (e.g., operating condition 13 displayed in the text box (Condition number: 13)), and the operating condition number that resulted in the maximum evaluation value indicated by the maximum value line 4024 (e.g., operating condition 40 displayed in the text box (Condition number: 40)).

[0159] In step S708, the automatic parameter adjusting device 103 uses the distributions of parameter values ​​from previous test results as past distributions and generates a trial vector by combining parameter values ​​sampled from these distributions so that the objective value improves.

[0160] In step S709, the automatic parameter adjustment device 103 configures the device 104 as an optimization target with the trial vector generated in step S708.

[0161] In step S710, the automatic parameter adjustment device 103 performs operation evaluations on at least two operating conditions selected in S707 (e.g., operating conditions 13 and 40 at the time previously selected in Fig. 8) and obtains the objective value calculated based on the assessment values ​​of these operational evaluations.

[0162] In step S711, the automatic parameter adjusting device 103 determines whether a predetermined examination termination condition is met (e.g., whether the objective value has improved).

[0163] If the predetermined examination termination condition is satisfied (step S711; YES), the flow proceeds to step S712.

[0164] On the other hand, if the predetermined examination termination condition is not satisfied (step S711; NO), the flow returns to step S708.

[0165] In step S712, the automatic parameter adjustment device 103 selects the trial vector that improves the objective value. Then, the flow returns to step S702.

[0166] A specific example regarding step S712 will be described with reference to Fig. 9. For example, if the objective value is configured to reduce variation in the evaluation values, the minimum value line and the maximum value line approach each other, as shown in Fig. 9, and the automatic parameter adjustment device 103 selects a trial vector (configuration value pull point) 4016 with reduced variation of the evaluation value distribution.

[0167] Note that in step S705, the automatic parameter adjusting device 103 may determine whether the predetermined examination termination condition is satisfied, and if the predetermined examination termination condition is satisfied, the flow may proceed to step S706, and if the predetermined examination termination condition is not satisfied, the flow may proceed to step S707.

[0168] By examining vectors in this way, it is possible to perform numerous attempts to examine a vector, reconciling operating conditions that are incompatible with the same vector (an operating condition with the minimum evaluation value and an operating condition with the maximum evaluation value). In addition, by displaying the trend of the overall evaluation values ​​each time while reducing the number of evaluations for all operating conditions, the user can adjust the hyperparameters (see, for example, Fig. 8 and Fig. 9), which makes the investigation of vectors that satisfy a variety of operating conditions efficient. variant

[0169] Next, a variation of the above-described embodiment will be explained. In this variation, the explanation mainly focuses on configurations and operations different from the above-described embodiment, and the explanation of configurations and operations similar to the above-described embodiment will be omitted.

[0170] In this variant, a plurality of automatic parameter adjustment systems, identical to the previously described automatic parameter adjustment system 100, are operated in a coordinated manner via a network. For this purpose, a remote control system is provided to control the coordination between these systems. Configuration of a remote automatic parameter adjustment system

[0171] Fig. 10 is a block diagram illustrating an example of a remote automatic parameter adjustment system according to this variant. As in Fig. As shown in Figure 10, the remote automatic parameter adjustment system 110 includes the local automatic parameter adjustment systems 1001 to 100n and the remote control system 1101. The remote automatic parameter adjustment system 110 and the local automatic parameter adjustment systems 1001 to 100n are interconnected via a network.

[0172] As in Fig. For example, as shown in Figure 10, local automatic parameter adjustment systems 1001, 1002, and 100n are identical or similar to automatic parameter adjustment system 100, except that they do not include a DB section, whereas local automatic parameter adjustment system 1003 does not include UI section 101 of automatic parameter adjustment system 100. Note that local automatic parameter adjustment system 1003, which does not include a UI section, may be connected to local automatic parameter adjustment systems 1001, 1002, 100n, and the like, and thus may be connected to UI section 1102 of these systems, whereby local automatic parameter adjustment system 1003 may also include UI functionality. Additionally, some or all of local automatic parameter adjustment systems 1001 to 100n may include a DB section.

[0173] As in Fig. For example, as shown in Figure 10, the remote control system 1101 includes the UI section 1102, the remote adaptation device 1103, and the DB section 1104.

[0174] The remote control system 1101 remotely controls each of the plurality of local automatic parameter adjustment systems 1001 to 100n via the network NW.

[0175] The UI section 1102 has the same or similar functions as the UI section of the local automatic parameter adjustment systems 1001 to 100n (e.g., the UI section 101 of the automatic parameter adjustment system 100).

[0176] The remote adjustment device 1103 has the same or similar functions as the automatic parameter adjustment devices of the local automatic parameter adjustment systems 1001 to 100n (e.g., the automatic parameter adjustment device 103 of the automatic parameter adjustment system 100).

[0177] In addition to its function, the remote adjustment device 1103 includes a remote controller (not shown) that can perform control such as causing a plurality of automatic parameter adjustment devices of the local automatic parameter adjustment systems 1001 to 100n to perform a plurality of operational evaluations in parallel, and causing the plurality of automatic parameter adjustment devices to inform each other of the parameter distributions being examined by the plurality of automatic parameter adjustment devices. This can improve the efficiency of the examination from a plurality of local automatic parameter adjustment systems 1001 to 100n.

[0178] The DB section 1104 has the same or similar functions as the DB sections of the local automatic parameter adjustment systems 1001 to 100n (for example, the DB section 102 of the automatic parameter adjustment system 100).

[0179] The DB section 1104 can further centralize and manage study histories, hyperparameters, and the like in local automatic parameter adjustment systems 1001 to 100n. This enables efficient parameter study for the same model under different operating conditions and environments, and also enables efficient parameter study under similar operating conditions and environments for different models.

[0180] In addition to the effects in the above embodiment, the remote control system 1101 can remotely perform automatic parameter investigation and adjustment, referring to the parameters of another device of the same model or to parameters under the same operating conditions for different models.

[0181] In the above embodiment (including the variant), an example is described in which the trial value (parameter value) scattergram and the vector diagram (line graph) generated by the scattergram generator 1065 and the vector diagram generator 1066, respectively, are displayed on the display screen. However, at least one of the trial value scattergram and the vector diagram may be displayed on the display screen. In addition, the evaluation value distribution diagram (histogram) generated by the distribution diagram generator 1067 may also be displayed on the display screen, or it may not be displayed. For example, the user can instruct the automatic parameter adjustment device 103 via the UI section 101 about which of the trial value scattergram, the vector diagram, and the evaluation value distribution diagram is generated and displayed.

[0182] One or more of the functional sections (processors) used in the above embodiment (including the variant) (see Fig. 2B and Fig. 2C, etc.) may be integrated as applicable, or a functional section (processor) may be divided into a plurality of functional subsections (subprocessors).

[0183] The sequences of steps in the flowcharts described in the above embodiment are purely exemplary and are not limited to the sequences shown.

[0184] The descriptions in the above embodiment can be suitably combined as long as they do not contradict each other or are expressly stated as not combinable.

[0185] In the embodiment described above, the term "portion" may be replaced by another term such as "circuit(s)", "arrangement", "device", "unit" or "module". Effect of the embodiment

[0186] The adjustment element setting device 106 (scatter diagram generator 1065, vector diagram generator 1066) of the automatic parameter adjustment device 103 acquires historical parameter values ​​of a plurality of control parameters configured for the device 104 in the past. The adjustment element setting device 106 generates first information (parameter value scatter diagram) indicating a parameter value scatter state for each control parameter based on the acquired historical parameter values. Alternatively or additionally, the adjustment element setting device 106 may generate second information (line graph) indicating the state of each configuration expressed using one or more line segments based on the acquired historical parameter values.The adjustment element setting device 106 displays a current parameter value configured for each of the plurality of control parameters on the UI section 101 such that the current parameter value is superimposed on at least one of the first information and the second information. The UI section 101 then displays the current parameter values ​​superimposed on either the first information or the second information.

[0187] This configuration enables efficient configuration of the control parameters with reference to historical parameter values ​​configured for the facility in the past and specified in at least either the first information or the second information. Brief description of the embodiment

[0188] A parameter adjustment device according to an embodiment of the present disclosure comprises: generation circuits that, in operation, acquire a past parameter value for each of a plurality of control parameters configured in the past for a device, and generate at least one of the first information and the second information based on the past parameter value, wherein the first information indicates a parameter value dispersion state for each control parameter, wherein the second information indicates a state for each configuration, wherein the past parameter value is expressed using one or more line segments;and display control circuitry operative to display a current parameter value configured for each of the plurality of control parameters at a user interface such that the current parameter value is superimposed on at least one of the first information and the second information;

[0189] In the present parameter adjustment device, the display control circuits display the current parameter value on the user interface in such a way that it is expressed by one or more line segments, with the current parameter value being superimposed on the second information.

[0190] In the present parameter adjusting device, the generating circuits generate the first information for each control parameter in a display mode of the past parameter value, the display mode being varied according to a frequency of configuring the past parameter value.

[0191] In the present parameter adjustment device, the display control circuits display a configurable range of the current parameter value on the user interface such that it can be changed by a user.

[0192] In the present parameter adjustment device, the display control circuits display the current parameter value on the user interface in such a way that it can be changed by a user.

[0193] The present parameter adjustment device further comprises: evaluation circuits that, in operation, evaluate an operating result of the device operated according to the current parameter value under a plurality of operating conditions and generate an evaluation score for the current parameter value, the evaluation score being based on the operating result for each operating condition, wherein the generation circuits further generate a histogram representing a distribution of the evaluation score, and the display control circuits further display the histogram on the user interface.

[0194] The present parameter adjustment device further comprises: evaluation circuits that, in operation, evaluate an operating result of the device operated according to the current parameter value under a plurality of operating conditions and generate an evaluation score for the current parameter value, wherein the evaluation score is based on the operating result for each operating condition; and parameter value generation circuits that, in operation, select a first operating condition in which the evaluation score is minimum and a second operating condition in which the evaluation score is maximum from the plurality of operating conditions and generate the current parameter value with which a second objective value is achieved, wherein the second objective value is obtained by improving a first objective value representing a predetermined performance,which is calculated at least based on a first evaluation score under the first operating condition and a second evaluation score under the second operating condition, in which the evaluation circuits repeatedly generate the evaluation score for the current parameter value, and the parameter value generation circuits repeatedly generate the current parameter value until the second objective value satisfies a predetermined condition, and when the second objective value satisfies the predetermined condition, the parameter value generation circuits determine the generated current parameter value as a parameter value to be configured for the device.

[0195] A parameter adjustment method according to an embodiment of the present disclosure includes the following steps, performed by a parameter adjustment device: acquiring a historical parameter value for each of a plurality of control parameters configured in the past for a device; generating at least one of first information and second information based on the historical parameter value, the first information indicating a parameter value dispersion state for each control parameter, the second information indicating a state for each configuration, the historical parameter value being expressed using one or more line segments;and displaying a current parameter value configured for each of the plurality of control parameters at a user interface such that the current parameter value is superimposed on at least one of the first information and the second information;

[0196] A program according to an embodiment of the present disclosure causes a computer to perform the following: acquiring a historical parameter value for each of a plurality of control parameters configured in the past for the device; generating at least one of first information and second information based on the historical parameter value, the first information indicating a parameter value dispersion state for each control parameter, the second information indicating a state for each configuration, the historical parameter value being expressed using one or more line segments; and displaying, at a user interface, a current parameter value configured for each of the plurality of control parameters such that the current parameter value is superimposed on at least one of the first information and the second information.

[0197] According to the above parameter adjusting device, the parameter adjusting method and the program, it becomes possible to efficiently configure control parameters with reference to past parameter values ​​indicated in at least one of the first information and the second information and configured for the facility in the past.

[0198] Although the embodiments have been described above with reference to the drawings, the present disclosure is not limited to these examples. Of course, those skilled in the art would come up with variations and modifications within the scope described in the claims. It is understood that these variations and modifications are within the technical scope of the present disclosure. Furthermore, any combination of features of the aforementioned embodiments may be made without departing from the spirit of the disclosure.

[0199] The present disclosure may be embodied by software, hardware, or software in combination with hardware.

[0200] Each functional block used in the description of each embodiment described above may be partially or entirely formed by an LSI, such as an integrated circuit, and each process described in each embodiment may be partially or entirely controlled by the same LSI or a combination of LSIs. The LSI may be formed individually as chips, or a chip may be formed to include part or all of the functional blocks. The LSI may include a data input and output coupled thereto. The LSI may be referred to as an IC, system LSI, super LSI, or ultra LSI depending on a difference in the degree of integration.

[0201] However, the technique of implementing an integrated circuit is not limited to the LSI and can be implemented using a dedicated circuit, a general-purpose processor, or a special-purpose processor. Additionally, an FPGA (field-programmable logic array) that can be programmed after the LSI is fabricated, or a reconfigurable processor in which the connections and settings of circuit cells arranged in the LSI can be reconfigured, can be used. The present disclosure can be implemented as digital processing or analog processing.

[0202] If a future integrated circuit technology replaces LSIs as a result of advances in semiconductor technology or another derivative technology, the functional blocks could be integrated using the future integrated circuit technology. Biotechnology may also be applied.

[0203] The present disclosure may be embodied by any type of device, apparatus, or system having a communication function, referred to as a communication device. The communication device may include a transceiver and processing / control circuitry. The transceiver may include and / or function as a receiver and a transmitter. The transceiver as transmitter and receiver may include an RF (radio frequency) module and one or more antennas. The RF module may include an amplifier, an RF modulator / demodulator, or the like. Some non-limiting examples of such a communication device include a telephone (e.g., cell phone, smartphone), a tablet, a workstation (PC) (e.g., laptop, desktop, netbook), a camera (e.g., digital still / video camera), a digital player (digital audio / video player), a wearable device (e.g.,a wearable camera, a smart watch, a tracking device), a game console, a digital book reader, a telehealth / telemedicine (remote health and medicine) device, and a vehicle providing communication functionality (e.g., automobile, aircraft, ship), and various combinations thereof.

[0204] The communication device is not limited to being portable or movable, and may also include any type of device, apparatus, or system that is difficult to carry or stationary, such as a smart home device (e.g., household appliance, lighting, smart meter, control panel), a vending machine, and any other “things” in an Internet of Things (IoT) network.

[0205] Communication may include the exchange of data via, for example, a cellular system, a wireless LAN system, a satellite system, etc., and various combinations thereof.

[0206] The communication device may include a device, such as a controller or a sensor, coupled to a communication device that performs a communication function described in the present disclosure. For example, the communication device may include a controller or a sensor that generates control signals or data signals used by a communication device that performs a communication function of the communication device.

[0207] The communication device may also include an infrastructure facility such as a base station, an access point, and any other device, apparatus, or system that communicates with or controls devices such as those in the above non-limiting examples.

[0208] Various embodiments have been described with reference to the above drawings. Of course, the present disclosure is not limited to these examples. Of course, those skilled in the art would come up with variations and modifications within the scope described in the claims, and it is understood that these variations and modifications are within the technical scope of the present disclosure. Furthermore, any combination of features of the aforementioned embodiments may be made without departing from the spirit of the present disclosure.

[0209] Although examples of the present disclosure have been described in detail above, these examples are merely illustrative and do not limit the scope of the appended claims. The techniques disclosed within the scope of the appended claims include various modifications and variations of the specific examples previously discussed.

[0210] The disclosure of Japanese Patent Application No. 2023-005785, filed on January 18, 2023, including the specification, drawings, and abstract, is hereby incorporated by reference in its entirety. Industrial applicability

[0211] An embodiment of the present disclosure is useful for parameter adjustment systems. LIST OF REFERENCE SYMBOLS 100 automatic parameter adjustment system 101 User Interface (UI) Section 102 Database (DB) section 1021 Operating condition / control condition DB 1022 Experimental value distribution history DB 1023 Vector distribution history DB 1024 Valuation value distribution history DB 103 automatic parameter adjustment device 1031 Device for recording a test value distribution 1032 Device for detecting a vector distribution 1033 Device for recording a rating value distribution 104 Facility 105 Sensor 106 Device for adjusting adjustment elements 1061 Device for entering a configurable area 1062 Examination priority input 1063 Examination area input 1064 Vector fitting input 1065 Scatter Plot Generator 1066 Vector diagram generator 1067 Distribution Diagram Generator 107 Parameter testing device 108 Device for setting test vectors 109 Operational evaluation device 110 remote automatic parameter adjustment system 1001 local automatic parameter adjustment system 1002 local automatic parameter adjustment system 1003 local automatic parameter adjustment system 100n local automatic parameter adjustment system 1101 remote control system 1102 UI section 1103 remote adaptation device 1104 DB section QUOTES CONTAINED IN THE DESCRIPTION

[0000] This list of documents submitted by the applicant was generated automatically and is included solely for the convenience of the reader. This list is not part of the German patent or utility model application. The DPMA assumes no liability for any errors or omissions. Cited patent literature

[0000] JP 2017-167607

[0005] JP 2023-005785

[0210]

Claims

[1] Parameter adjustment device, comprising: Generation circuits operative to acquire a historical parameter value for each of a plurality of control parameters configured in the past for a device and to generate at least one of first information and second information based on the historical parameter value, the first information indicating a parameter value dispersion state for each control parameter, the second information indicating a state for each configuration, the historical parameter value being expressed using one or more line segments; and Display control circuitry operable to display a current parameter value configured for each of the plurality of control parameters at a user interface such that the current parameter value is superimposed on at least one of the first information and the second information. [2] The parameter adjusting device according to claim 1, wherein the display control circuits display the current parameter value on the user interface such that it is expressed by one or more line segments, the current parameter value being superimposed on the second information. [3] The parameter adjusting device according to claim 1, wherein the generating circuits generate the first information for each control parameter in a display mode of the past parameter value, the display mode being configured according to a frequency of the past parameter value. [4] The parameter adjustment device of claim 1, wherein the display control circuits display a configurable range of the current parameter value on the user interface in a manner that can be changed by a user. [5] The parameter adjustment device according to claim 1, wherein the display control circuits display the current parameter value on the user interface in a manner that can be changed by a user. [6] The parameter adjustment device according to claim 1, further comprising: Evaluation circuits that, in operation, evaluate an operating result of the device operated according to the current parameter value from a plurality of operating conditions and generate an evaluation score for the current parameter value, the evaluation score being based on the operating result for each operating condition, wherein the generation circuits further generate a histogram representing a distribution of the evaluation score, and the display control circuits further display the histogram on the user interface. [7] The parameter adjustment device according to claim 1, further comprising: Evaluation circuits that, in operation, evaluate an operating result of the device operated according to the current parameter value from a plurality of operating conditions and generate an evaluation score for the current parameter value, the evaluation score being based on the operating result for each operating condition; and Parameter value generation circuits that, in operation, select a first operating condition in which the evaluation score is minimum and a second operating condition in which the evaluation score is maximum from the plurality of operating conditions and generate the current parameter value with which a second objective value is achieved, wherein the second objective value is achieved by improving a first objective value representing a predetermined performance calculated at least based on a first evaluation score under the first operating condition and a second evaluation score under the second operating condition, wherein the evaluation circuits repeatedly generate the evaluation score for the current parameter value and the parameter value generation circuits repeatedly generate the current parameter value until the second objective value satisfies a predetermined condition, and when the second objective value satisfies the predetermined condition, the parameter value generation circuits determine the generated current parameter value as a parameter value to be configured for the device. [8] A parameter adjustment method performed by a parameter adjustment device, comprising: capturing a historical parameter value for each of a plurality of control parameters configured for the facility in the past; Generating at least one of first information and second information based on the past parameter value, the first information indicating a parameter value scatter state for each control parameter, the second information indicating a state for each configuration, the past parameter value being expressed using one or more line segments; and Displaying a current parameter value configured for each of the plurality of control parameters at a user interface such that the current parameter value is superimposed on at least one of the first information and the second information. [9] A program to cause a computer to do the following: capturing a historical parameter value for each of a plurality of control parameters configured in the past for a facility; Generating at least one of first information and second information based on the past parameter value, the first information indicating a parameter value scatter state for each control parameter, the second information indicating a state for each configuration, the past parameter value being expressed using one or more line segments; and Displaying a current parameter value configured for each of the plurality of control parameters at a user interface such that the current parameter value is superimposed on at least one of the first information and the second information.

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