Probe adapter and measuring system

Abstract

A probe adapter characterized in that it comprises the following: a first interface which is designed for the electrical connection of the probe to receive the measurement signal; a second interface designed for the electrical connection of the measuring device for inputting the measurement signal into the measuring device; a signal transmission line comprising a first signal transmission line, a second signal transmission line and a line selector switch, wherein the first signal transmission line and the second signal transmission line are both arranged between the first interface and the second interface; wherein the line selector switch is configured to select either the first signal transmission line or the second signal transmission line to route the first interface and the second interface; a signal conditioning circuit located on the second signal transmission line and designed to adapt the impedance of the measured signal to the input impedance of the measuring instrument and / or to adapt the amplitude of the measured signal to the measuring range of the measuring instrument.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of oscilloscopes and in particular to a probe adapter and a measuring system. STATE OF THE ART

[0002] The digital oscilloscope offers unique advantages such as waveform capture, storage, display, measurement, waveform data analysis, and processing, making it an indispensable tool for the development, manufacture, and repair of electronic devices. Given the rapid development of electronic devices, engineers need the best tools to quickly and accurately solve the measurement challenges they face. As the "eyes" of the engineer, digital oscilloscopes are essential for addressing today's demanding measurement challenges. Furthermore, digital oscilloscopes exhibit smaller errors compared to analog oscilloscopes, making their applications increasingly popular.

[0003] Among them, high-bandwidth oscilloscopes are more commonly used due to their wider application range. However, high-bandwidth oscilloscopes are generally low-input impedance oscilloscopes, such as 50 ohms. Their input connectors are mostly high-frequency interface connectors or custom interface connectors, and they cannot use ordinary high-impedance passive or active probes. CONTENT OF THE PRESENT INVENTION

[0004] Against this background, embodiments of the present application provide a probe adapter and a measuring system to solve at least one problem existing in the prior art.

[0005] In a first aspect, embodiments of the present application provide a probe adapter for a measuring device, comprising: a first interface configured to electrically connect the probe to receive the measurement signal; a second interface designed for the electrical connection of the measuring device for input of the measuring signal into the measuring device; a signal transmission line comprising a first signal transmission line, a second signal transmission line, and a line selection switch, wherein the first signal transmission line and the second signal transmission line are both arranged between the first interface and the second interface; wherein the line selection switch is configured to select the first signal transmission line to conduct the first interface and the second interface, or to select the second signal transmission line to conduct the first interface and the second interface; a signal conditioning circuit located on the second signal transmission line and configured to adapt the impedance of the measured signal to the input impedance of the measuring device and / or to adapt the amplitude of the measured signal to the measuring range of the measuring device.

[0006] Optionally, the probe adapter also includes the following: a control component configured to control the line selection switch to select the first signal transmission line or the second signal transmission line to conduct the first interface and the second interface; wherein the line selection switch is communicatively connected to the control component. Optionally, the control component is configured in particular to: Obtaining a type of probe connected to the first interface and controlling the line selection switch to select the first signal transmission line to conduct the first interface and the second interface if the type of probe connected to the first interface is a first probe; controlling the line selection switch to select the second signal transmission line to conduct the first interface and the second interface if the type of probe connected to the first interface is a second probe.

[0007] Optionally, the signal conditioning circuit includes the following: an amplifier configured to match the impedance of the measured signal to the input impedance of the measuring device and / or to match the amplitude of the measured signal to the measuring range of the measuring device; a differential amplifier configured to convert the differential signal output by the gain amplifier into an unbalanced signal to match the type of measurement signal of the measuring instrument.

[0008] Optionally, the probe adapter also includes the following: an identification circuit communicatively connected to both the control component and the first interface, the identification circuit being configured to identify the type of a probe connected to the first interface and to send that type to the control component.

[0009] Optionally, the probe adapter also includes the following: a calibration circuit communicatively connected to both the control component and the first interface, the calibration circuit configured to calibrate the bias of a signal output by a probe connected to the first interface and to adapt the DC component of the measured signal to the display surface of the measuring device.

[0010] Optionally, the probe adapter also includes the following: a first selector switch comprising a first fixed end and a first selector end, the first fixed end being electrically connected to the first interface; the first selector end being electrically connected to one of the signal transmission lines according to an instruction from the control component; a second selection switch comprising a second fixed end and a second selection end, the second fixed end being electrically connected to the second interface; the second selection end being electrically connected to one of the signal transmission lines according to an instruction from the control component.

[0011] Optionally, the probe adapter also includes the following: a third interface designed to draw electrical energy from the measuring device; a power supply line electrically connected at one end to the third interface and at the other end to the first interface for transmitting the electrical energy to the probe.

[0012] Optionally, the first probe has an output impedance of 50 ohms and the second probe has an output impedance of 1 megohm.

[0013] In a second aspect, embodiments of the present application provide a measuring system comprising: a measuring instrument, a probe, and a probe adapter connected between the measuring instrument and the probe; wherein the probe adapter is one of the probe adapters described above.

[0014] The probe adapter and measuring system as described above comprises: a first interface configured to electrically connect the probe to receive the measurement signal; a second interface configured to electrically connect the measuring device to input the measurement signal to the measuring device; a signal transmission line comprising a first signal transmission line, a second signal transmission line, and a line selection switch, wherein the first signal transmission line and the second signal transmission line are both arranged between the first interface and the second interface; wherein the line selection switch is configured to select the first signal transmission line to conduct the first interface and the second interface, or to select the second signal transmission line to conduct the first interface and the second interface; a signal conditioning circuit,which is located on the second signal transmission line and is designed to adapt the impedance of the measured signal to the input impedance of the measuring device and / or to adapt the amplitude of the measured signal to the measuring range of the measuring device. It can be seen that in the probe adapter and the measuring system of the exemplary embodiment of the present application, two signal transmission lines, namely a first signal transmission line and a second signal transmission line, are provided between the first interface and the second interface of the present application, and a signal conditioning circuit is provided on the second signal transmission line, which is designed to adapt the impedance and / or amplitude of the measured signal.to adapt them to the input impedance and / or measurement range of the measuring instrument. This allows high-bandwidth oscilloscopes to use conventional high-impedance passive probes and / or active probes via probe adapters without having to swap the probe adapters for other probes.

[0015] Additional aspects and advantages of the application will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the application. SHORT DESCRIPTION OF THE DRAWING

[0016] The accompanying drawings described herein are intended to provide a better understanding of the present application and form a part of the present application, and the illustrative embodiments and descriptions of the present application are intended to explain the present application and do not unduly limit the present application. In the figures: Fig. 1 is a schematic structural diagram of a probe adapter provided by an embodiment of the present application; Fig. 2 is a schematic structural diagram of a probe adapter provided by another embodiment of the present application; Fig. 3 is a schematic structural diagram of a probe adapter provided by another embodiment of the present application; Fig. 4 is a schematic structural diagram of a calibration circuit in an embodiment of the present application; Fig. 5 is a schematic structural diagram of a measurement system provided by an embodiment of the present application; Fig. 6 shows a schematic structural diagram of the measuring system when the measuring device is an oscilloscope; Fig. 7 shows a schematic structural diagram of the probe adapter in Fig. 6; Fig. Figure 8 shows a schematic structural diagram of the first interface to the third interface in the probe adapter in Fig. 7. Reference symbols in the figures:

[0017] 11. first interface; 12. second interface; 13. third interface; 21. first signal transmission line; 22. second signal transmission line; 24. signal conditioning circuit; 241. gain amplifier; 242. differential amplifier; 26. first selection switch; 27. second selection switch; 31. control component; 32. identification circuit; 33. calibration circuit; 34. power supply module; 60. probe; 70. measuring device. DETAILED DESCRIPTION

[0018] To make the technical solutions and advantageous effects of the present application more obvious and easier to understand, detailed descriptions are given below, listing specific embodiments. The attached drawings are not necessarily to scale, and local features may be enlarged or reduced to more clearly illustrate details of local features. Unless otherwise defined, the technical and scientific terms used herein have the same meaning as the technical and scientific terms in the technical field to which the present application belongs.

[0019] In describing this application, an azimuth or positional relationship refers to terms such as "center," "longitudinal," "transverse," "length," "width," "thickness," "top," "bottom," "front," "back," "left," "right," "vertical," "horizontal," "top," "bottom," "inside," "outside," "clockwise," "counterclockwise," and the like, which have an azimuth or positional relationship based on the drawing. They are intended to facilitate and simplify the description of this application, rather than indicating or implying that the device or component mentioned must have a particular orientation, be constructed, and operate in a particular orientation; that is, they should not be construed as limiting this application.

[0020] In this application, the terms "first" and "second" are used solely for the purpose of clarity of description and should not be understood as indicating the relative importance of the specified features or the number of specified technical features. Therefore, a feature defined as "first" or "second" may expressly include at least one of these features. In the description of this application, "multiple" means at least two, for example, two, three, etc.; "plural" means at least one, for example, one, two, three, etc., unless expressly defined otherwise.

[0021] In the present application, it is necessary to point out that the terms "installing," "connecting," "connecting," "fixing," and "arranging" are to be understood in a broad sense unless expressly defined otherwise. For example, "connecting" may be a fixed connection, a detachable connection, or a one-piece connection; it may be a mechanical connection or an electrical connection; it may be a direct connection or an indirect connection via an intermediate medium; and it may be a connection within the two elements or an interaction between both elements. For general technical personnel in the field, the specific meaning of the above terms in the present application may be understood depending on the specific circumstances.

[0022] In the present application, unless expressly defined otherwise, when a first feature is located "above," "on," "over," "above," "below," "below," "below," or "beneath" with respect to the second feature, it means that the first feature and the second feature are in direct contact, or the first feature and the second feature may be in indirect contact via an intermediate medium. Furthermore, when the first feature is located "on," "over," and "above" with respect to the second feature, it means that the first feature is directly above or diagonally above the second feature, or simply that the horizontal height of the first feature is greater than the horizontal height of the second feature.It means that if the first feature is "below", "under", and "beneath" with respect to the second feature, the first feature is directly below or diagonally below the second feature, or simply that the horizontal height of the first feature is less than the horizontal height of the second feature.

[0023] To thoroughly understand the present application, the following description provides detailed steps and detailed structures to illustrate the technical solution of the present application. The preferred embodiments of the present application are described in detail below. However, in addition to these detailed descriptions, the present application may also include other embodiments.

[0024] The inventor discovered during technology research and development that the input connectors of high-bandwidth oscilloscopes are mostly high-frequency interface connectors or custom interface connectors, and that ordinary high-impedance passive and active probes cannot be used, which limits the application range of high-bandwidth oscilloscopes. However, using a probe adapter to connect ordinary high-impedance passive and active probes requires the purchase of multiple probe adapters, which not only increases the purchase cost but also reduces the efficiency of use. In addition, errors are easily caused when replacing the probe adapter, which may cause damage to the oscilloscope, the probe, or the probe adapter, or lead to erroneous test results.

[0025] Therefore, through further research and development, the inventor provided the following technical solution.

[0026] An embodiment of the present application provides a probe adapter with reference to Fig. 1, which includes: a first interface 11 designed to electrically connect the probe 60 to receive the measurement signal; a second interface 12 which is designed for the electrical connection of the measuring device 70 for inputting the measurement signal into the measuring device 70; a signal transmission line comprising a first signal transmission line 21, a second signal transmission line 22, and a line selection switch, wherein the first signal transmission line 21 and the second signal transmission line 22 are both arranged between the first interface 11 and the second interface 12; wherein the line selection switch is configured to select the first signal transmission line 21 to conduct the first interface 11 and the second interface 12, or to select the second signal transmission line 22 to conduct the first interface 11 and the second interface 12; a signal conditioning circuit 24 located on the second signal transmission line 22 and configured to match the impedance of the measured signal to the input impedance of the measuring device and / or to match the amplitude of the measured signal to the measuring range of the measuring device. In the present embodiment, when describing the probe adapter, the measuring device 70 and the probe 60 are placed in a normal operating state, that is, the measuring device 70 is placed horizontally and the axis of the input terminal of the measuring device 70 is in the horizontal direction. Therefore, the probe 60 and the probe adapter extend in the horizontal direction. Therefore, the first interface 11 and the second interface 12 are respectively located at both ends of the probe adapter in the horizontal direction, which are the left end and the right end in the figure.

[0027] In the present embodiment, the measuring device may be an oscilloscope. In the following, an oscilloscope will be used primarily as an example for the introduction. It should be understood that other instruments similar to an oscilloscope can also adopt the above technical solution.

[0028] It is understood that the first signal transmission line 21 and the second signal transmission line 22 are set to be separate and not communicate with each other, and there are no restrictions on the structure and location.

[0029] The line selection switch is configured to select a signal transmission line that electrically connects the first interface 11 and the second interface 12. That is, it is configured to select and electrically connect either the first signal transmission line 21 or the second signal transmission line 22.

[0030] It is understood that measuring instruments use probes with different output impedances. In high-bandwidth measuring instruments, the signal input interfaces are set to a low impedance, for example, 50 ohms. Therefore, probes with high output impedance, such as passive high-impedance probes, cannot directly output signals to high-bandwidth measuring instruments. Therefore, the impedance of the measured signal must be matched to the input impedance of the measuring instrument 70 via the signal conditioning circuit 24. At the same time, the amplitude of a high-impedance signal may generally exceed the measuring range of the measuring instrument 70. Therefore, the amplitude of the measured signal must be matched via the signal conditioning circuit 24.

[0031] In the probe adapter of the present embodiment of the present application, two signal transmission lines, namely a first signal transmission line 21 and a second signal transmission line 22, are provided between the first interface 11 and the second interface 12 of the present application. A signal conditioning circuit 24 is provided on the second signal transmission line 22, which is configured to adjust the impedance and / or amplitude of the measured signal to suit the input impedance and / or measurement range of the measuring device. Thus, even with the probe adapter of this embodiment, high-bandwidth oscilloscopes can use conventional high-impedance passive probes and / or active probes via probe adapters, without having to replace the probe adapters with other probes.

[0032] In some embodiments, the probe adapter comprises, with reference to Fig. 2 furthermore the following: a control component 31 configured to control the line selection switch to select the first signal transmission line 21 or the second signal transmission line 22 to route the first interface 11 and the second interface 12; wherein the line selection switch 31 is communicatively connected to the control component.

[0033] The communication connections include wired connections and wireless connections. Therefore, the control component 31 can control the line selection switch wired or wirelessly. In addition, wireless connections may also occur between other components. Therefore, readers are not limited to the direct connections between the various components in the drawings, but can determine the relationship between the various components from the text descriptions herein and the functions of the embodiments of the present application. The line selection switch is an execution component for selecting a signal transmission line for the probe adapter, and the execution of the line selection switch is controlled by the control component 31. The control component 31 controls the execution of the line selection switch, which has the characteristics of high efficiency and fewer errors.

[0034] It is understood that the line selection switch can also be controlled manually.

[0035] In some embodiments, the control component 31 is particularly designed to: Obtaining a type of probe 60 connected to the first interface 11 and controlling the line selection switch to select the first signal transmission line 21 to conduct the first interface 11 and the second interface 12 if the type of probe 60 connected to the first interface 11 is a first probe; controlling the line selection switch to select the second signal transmission line 22 to conduct the first interface 11 and the second interface 12 if the type of probe 60 connected to the first interface 11 is a second probe.

[0036] It should be noted that there is a certain relationship between the output impedance of probe 60 and the measured signal. On the one hand, the type of probe 60, including the magnitude of the output impedance, is selected based on the measured signal. Therefore, different probes 60 illustrate different measured signals. On the other hand, after the measured signal passes through probe 60, the measured value of the measured signal is also affected by the relevant parameters of probe 60, such as the output impedance and change. Therefore, the probe adapter needs to set up two different signal transmission lines according to the output impedance of probe 60 and select one for use in the test.

[0037] By first determining the type of probe 60 connected to the first interface 11 and then controlling the line selection switch, automatic control of the line selection switch can be better realized. Furthermore, this is also the purpose of constructing two or more signal transmission lines, thus adapting to different probes via different signal transmission lines.

[0038] In the present embodiment, two signal transmission lines, namely the first signal transmission line 21 and the second signal transmission line 22, are provided, but it is understood that more signal transmission lines may also be provided.

[0039] The type of probe 60 may include a low output impedance probe, a high output impedance probe, and the like. It is understood that other types of probes may also be included. Via the communication connection with the first interface 11, the control component 31 can determine the type of probe 60 connected to the first interface 11.

[0040] In some embodiments, the signal conditioning circuit 24 comprises: a gain amplifier 241 configured to match the impedance of the measured signal to the input impedance of the measuring device, and / or to match the amplitude of the measured signal to the measuring range of the measuring device; a differential amplifier 242 configured to convert the differential signal output by the gain amplifier 241 into an unbalanced signal in order to match it to the type of measurement signal of the measuring device 70.

[0041] The gain amplifier 241 has a high input impedance, a low output impedance, and a high voltage gain, which not only reduces the impedance of the measured signal but also increases the gain of the measured signal, thereby making the test of the measuring device 70 more accurate. Note that the gain amplifier 241 is used to increase the gain. The signal after the gain is increased, that is, the output signal of the gain amplifier 241, is a differential signal, and the signal measurable by the measuring device is a single-ended signal. Therefore, a differential amplifier 242 must be provided at the output stage of the gain amplifier 241 to convert the differential signal output by the gain amplifier 241 into a single-ended signal to match the measurement signal type of the measuring device 70.

[0042] In some embodiments, the probe adapter comprises, with reference to Fig. 3 furthermore the following: an identification circuit 32 communicatively connected to both the control component 31 and the first interface 11, wherein the identification circuit 32 is configured to identify the type of a probe 60 connected to the first interface 11 and to send this type to the control component 31.

[0043] That is, when the probe 60 is inserted into the first interface 11, the identification circuit 32 can identify the type of the probe 60 and then send the type of the probe 60 to the control component 31. The control component 31 can control the selection of the line selection switch accordingly. The identification principle of the identification circuit 32 is not part of the invention of the embodiment of the present application and will not be described in detail.

[0044] In some embodiments, the probe adapter further comprises: a calibration circuit 33 communicatively connected to both the control component 31 and the first interface 11, the calibration circuit 33 being configured to calibrate the bias of a signal output by a probe 60 connected to the first interface 11 and to adapt the DC component of the measured signal to the display surface of the measuring device 70.

[0045] It is understood that the gain and bias of the active amplifier inside the active probe may vary with temperature or aging, and to compensate for this variation, the probe 60 must be calibrated regularly. In related technologies, calibrating the probe 60 requires professional equipment, which increases test complexity and reduces test efficiency. Moreover, some probes or measuring instruments in related technologies incorporate a calibration function. However, on the one hand, this increases the complexity of the probe or measuring instrument and increases the cost, and on the other hand, the calibration efficiency is not high. Therefore, in the embodiment of the present application, a calibration circuit 33 is provided in the probe adapter to enhance the calibration function of the probe adapter without increasing the complexity of the probe or measuring instrument, and the calibration efficiency is high.

[0046] It should be understood that the DC component of the measured signal does not need to match the display surface of the meter 70. For example, the amplitude of the measured signal is 0-100 V, and the display surface of the meter 70 has O as the horizontal axis, which is located at the center of the high and low positions of the surface. Therefore, the measured signal can be biased to -50 V to +50 V via the calibration circuit 33 to match the display surface of the meter 70.

[0047] Similarly, the present embodiment creatively utilizes the calibration circuit 33 in the probe adapter, increasing the biasing function of the probe adapter and improving the display effect of the measuring device without requiring corresponding adjustments in the probe or measuring device and increasing the complexity of the probes or measuring devices. Specifically, the control component 31 may be a microcontroller unit (MCU).MCU, also known as a single-chip microcomputer or monolithic microcomputer, appropriately reduces the frequency and specifications of the central processing unit (CPU) and integrates peripheral interfaces such as memory, counters (timers), universal serial bus (USB), analog-to-digital conversion (A / D), universal asynchronous receiver / transmitter (UART), programmable logic controllers (PLCs), direct memory access (DMA), and even liquid crystal display (LCD) driver circuitry onto a single chip to form a chip-level computer capable of performing various combinational controls for various applications. MCUs can be found in everything from mobile phones, personal computer (PC) peripherals, and remote controls to automotive electronics, industrial stepper motors, and robot arm controllers.

[0048] The identification circuit 32 and the calibration circuit 33 can be submodules controlled or driven by an MCU. This makes the probe type identification, calibration, and bias control functions more accurate and reliable, and the MCU control more flexible.

[0049] In particular, the calibration circuit 33 may be a pulse-width modulated digital-to-analog converter (PWM-DAC). The pulse-width modulated digital-to-analog converter is a commonly used digital signal processing technology that can convert digital signals into analog signals and control the amplitude of the analog output signal according to the pulse width of the digital input signal. As shown in Fig. As shown in Figure 4, the PWM DAC may include a PWM output module, an RC low-pass filter module, and a drive boost module connected in series. The PWM output module can be programmed by a microcontroller via software to realize a PWM waveform with an adjustable duty cycle. When the system power supply voltage (typically 5V or 3.3V) is determined, the duty cycle of the PWM waveform determines the magnitude of the DAC voltage output. The RC low-pass filter module can filter out the harmonic components of the PWM waveform and suppress the ripple of the output voltage.

[0050] The drive amplifier module may be a voltage follower constructed with an operational amplifier that may be configured to improve the drive capability of the output voltage.

[0051] In addition, the functions of the identification circuit 32 and the calibration circuit 33 can also be integrated on the MCU, making the structure simpler and the control more reliable. That is, the identification circuit 32 and the calibration circuit 33 are not provided separately, but only the control component 31 is provided, and the control component 31 integrates the functions of the identification circuit 32 and the calibration circuit 33; or the control component 31 does not integrate the above functions, but can manually input the type of the probe 60 and realize the above functions through the external calibration circuit 33.

[0052] In some embodiments, the probe adapter further comprises: a first selection switch 26 comprising a first fixed end and a first selection end, the first fixed end being electrically connected to the first interface 11; the first selection end being electrically connected to one of the signal transmission lines according to an instruction from the control component 31; a second selection switch 27 including a second fixed end and a second selection end, the second fixed end being electrically connected to the second interface 12; the second selection end being electrically connected to one of the signal transmission lines according to an instruction from the control component 31.

[0053] The first selection switch 26 and the second selection switch 27 are provided at the first interface 11 and the second interface 12, respectively, to be electrically connected to the first interface 11 and the second interface 12. Specifically, the selection ends of the first selection switch 26 and the second selection switch 27, i.e., the first selection end and the second selection end, may be connected. That is, the first selection end selects the connection to the first signal transmission line 21, and the second selection end also selects the connection to the first signal transmission line 21. Only in this way can the first interface 11 and the second interface 12 be routed. In this way, control is also simpler, and the control component 31 only needs to control either the first selection switch 26 or the second selection switch 27.

[0054] In some embodiments, the first selector switch 26 and / or the second selector switch 27 are electromagnetic relays.

[0055] Electromagnetic relays require very little power, are sensitive in operation and have a long service life.

[0056] In some embodiments, the probe adapter further comprises: a third interface 13 designed to receive electrical energy from the measuring device 70; a power supply line electrically connected at one end to the third interface 13 and at the other end to the first interface 11 for transmitting the electrical energy to the probe 60.

[0057] It is understood that active probes require the use of electrical energy. Therefore, the third interface 13 is designed to receive the electrical energy from the measuring device 70 and then transmit the electrical energy to the probe 60 via the power supply line. It should be noted that the first interface 11, in addition to receiving the measurement signal, is also designed to supply electrical energy to the probe 60.

[0058] Furthermore, the control component 31, the signal conditioning circuit 24, the identification circuit 32, the calibration circuit 33, etc. of the probe adapter all require the use of electrical power. Thus, electrical power can also be supplied via the third interface 13.

[0059] In particular, electrical energy can be supplied to the control component 31, the signal conditioning circuit 24, the identification circuit 32, the calibration circuit 33, etc., via the first interface 11. The first interface 11 is electrically connected to the control component 31, the signal conditioning circuit 24, the identification circuit 32, the calibration circuit 33, and the like. It is understood that the electrical connection here and the communication connection between the first interface 11 presented above and the control component 31, the signal conditioning circuit 24, the identification circuit 32, the calibration circuit 33, etc., can use the same line, for example, the same line.

[0060] In particular, the first interface 11 may be a male end interface or a female end interface of a BNC (Bayonet Nut Connector), the second interface 12 may be a male end interface or a female end interface of a radio frequency coaxial connector (e.g., an SMA (Subminiature A) connector or a 3.5 mm connector, etc.), the third interface 13 may include, but is not limited to, a male end interface or a female end interface of a universal serial bus connector (e.g., USB Type-C, etc.).

[0061] In particular, the probe adapter also includes the following: The power module 34 is electrically connected to the third interface 13 at one end and to the first interface 11 at the other end. Electrical power is supplied to the probe 60, the control component 31, the signal conditioning circuit 24, the identification circuit 32, the calibration circuit 33, and so on via the first interface 11.

[0062] In some embodiments, the first probe has an output impedance of 50 ohms and the second probe has an output impedance of 1 megohm.

[0063] The 60 probes with both output impedances are relatively widely used and exhibit a certain degree of universality. Therefore, the probe adapter is configured according to the two 60 probes and can have a wider range of applications.

[0064] The embodiment of the present application also provides a measuring system as in Fig. 5, which comprises: a measuring device 70, a probe 60, and a probe adapter connected between the measuring device 70 and the probe 60; wherein the probe adapter is the probe adapter described above.

[0065] In the measurement system according to the embodiment of the present application, two signal transmission lines, namely a first signal transmission line 21 and a second signal transmission line 22, are provided between the first interface 11 and the second interface 12 of the present application, and the line selection switch is controlled via the control component 31 to select either the first signal transmission line 21 or the second signal transmission line 22 for routing the first interface 11 and the second interface 12. In this way, the high-bandwidth measurement device 70 can also use ordinary high-impedance passive probes and / or active probes via the above-mentioned probe adapter, and there is no need to replace various probes with corresponding probe adapters.

[0066] Probe 60 may be a passive high-impedance probe and / or an active probe. A passive high-impedance probe may refer to a probe that does not contain an active device requiring a power supply and has a relatively high output impedance. For example, for an oscilloscope, a passive probe with an output impedance of approximately 1 MΩ is a passive high-impedance probe. Measurement device 70 may be, but is not limited to, an oscilloscope, a signal analyzer, etc. Fig. For example, Figure 6 shows a schematic structural diagram of the measuring system when the measuring device is an oscilloscope, Fig. 7 shows a schematic structural diagram of the probe adapter in Fig. 6 and Fig. Figure 8 shows a schematic structural diagram of the first interface to the third interface in the probe adapter in Fig. 7. The Fig.The oscilloscope shown in Figure 6 may be a high-bandwidth oscilloscope whose input channel is a coaxial connector with a diameter of 3.5 mm. Regarding the signal analyzer, reference is made to the corresponding description in the prior art, which is not described in detail here.

[0067] It should be understood that the above embodiments are exemplary and are not intended to encompass all possible embodiments contained in the claims. Various modifications and changes may be made based on the above embodiments without departing from the scope of the present application. Likewise, various technical features of the above embodiments may also be arbitrarily combined to form additional embodiments of the present application, which may not be explicitly described. Therefore, the above embodiments represent only some embodiments of the present application and do not limit the scope of the patent of the present application.

Claims

[1] A probe adapter, characterized by that it includes: a first interface configured to electrically connect the probe to receive the measurement signal; a second interface designed for the electrical connection of the measuring device for input of the measuring signal into the measuring device; a signal transmission line comprising a first signal transmission line, a second signal transmission line, and a line selection switch, wherein the first signal transmission line and the second signal transmission line are both arranged between the first interface and the second interface; wherein the line selection switch is configured to select either the first signal transmission line or the second signal transmission line to guide the first interface and the second interface; a signal conditioning circuit located on the second signal transmission line and configured to adapt the impedance of the measured signal to the input impedance of the measuring device and / or to adapt the amplitude of the measured signal to the measuring range of the measuring device. [2] Probe adapter according to claim 1, characterized by that the probe adapter further comprises: a control component configured to control the line selection switch to select the first signal transmission line or the second signal transmission line to route the first interface and the second interface; wherein the line selection switch is communicatively connected to the control component. [3] Probe adapter according to claim 2, characterized by that the control component is designed in particular to: Obtaining a type of probe connected to the first interface and controlling the line selection switch to select the first signal transmission line to conduct the first interface and the second interface if the type of probe connected to the first interface is a first probe; controlling the line selection switch to select the second signal transmission line to conduct the first interface and the second interface if the type of probe connected to the first interface is a second probe. [4] Probe adapter according to claim 3, characterized by that the first probe has an output impedance of 50 ohms and the second probe has an output impedance of 1 megohm. [5] Probe adapter according to claim 2, characterized by that the probe adapter further comprises: an identification circuit communicatively connected to both the control component and the first interface, the identification circuit being configured to identify the type of a probe connected to the first interface and to send that type to the control component. [6] Probe adapter according to claim 2, characterized by that the probe adapter further comprises: a calibration circuit communicatively connected to both the control component and the first interface, the calibration circuit configured to calibrate the bias of a signal output by a probe connected to the first interface and to adapt the DC component of the measured signal to the display surface of the measuring device. [7] Probe adapter according to claim 6, characterized bythat the calibration circuit includes a PWM output module, an RC low-pass filter module and a driver amplifier module. [8] Probe adapter according to claim 2, characterized by that the probe adapter further comprises: a first selector switch comprising a first fixed end and a first selector end, the first fixed end being electrically connected to the first interface; the first selector end being electrically connected to one of the signal transmission lines according to an instruction from the control component; a second selection switch comprising a second fixed end and a second selection end, the second fixed end being electrically connected to the second interface; the second selection end being electrically connected to one of the signal transmission lines according to an instruction from the control component. [9] Probe adapter according to claim 1, characterized bythat the signal conditioning circuit includes: an amplifier configured to match the impedance of the measured signal to the input impedance of the measuring device and / or to match the amplitude of the measured signal to the measuring range of the measuring device; a differential amplifier configured to convert the differential signal output by the gain amplifier into an unbalanced signal to match the type of measurement signal of the measuring device. [10] Probe adapter according to claim 1 or 2, characterized by that the probe adapter further comprises: a third interface designed to draw electrical energy from the measuring device; a power supply line electrically connected at one end to the third interface and at the other end to the first interface for transmitting the electrical energy to the probe. [11] Probe adapter according to claim 10, characterized by that the third interface comprises a male end interface or a female end interface of a universal serial bus connector. [12] Probe adapter according to claim 1, characterized by that the first interface comprises a male end interface or a female end interface of a BNC connector. [13] Probe adapter according to claim 1, characterized by that the second interface comprises a male end interface or a female interface of a radio frequency coaxial connector. [14] Measuring system, characterized by in that it comprises: a measuring instrument, a probe, and a probe adapter connected between the measuring instrument and the probe; wherein the probe adapter is a probe adapter according to any one of claims 1-13. [15] Measuring system according to claim 14, characterized by that the measuring instrument includes an oscilloscope or a signal analyzer. [16] Measuring system according to claim 15, characterized by that the probe is a high-impedance passive probe or an active probe.

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