Microscope for inspecting fiber end surfaces with a dual light source

DE602021023504T2Active Publication Date: 2024-12-18EXFO
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Patent Information

Application Number
DE602021023504
Authority / Receiving Office
DE · DE
Patent Type
Patents
Current Assignee / Owner
Priority Date
2021-08-26
Filing Date
2021-11-25
Publication Date
2024-12-18
Estimated Expiration
2041-11-25

AI Technical Summary

Technical Problem

Optical-fiber connector inspection microscopes face challenges in reliably detecting small defects like dust and scratches on multi-fiber connectors due to non-uniform illumination and mechanical imperfections, leading to saturation and double image artifacts.

Method used

Activating illumination sources in sequence to prevent overlap and capturing images separately to ensure uniform illumination, with additional cross-illumination images to address tilted connector issues, allowing for accurate defect detection.

Benefits of technology

This approach results in more uniformly lit images with reduced dark spots and double image artifacts, enhancing the ability to detect small defects on multi-fiber connectors.

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