Device for amplifying a signal using self-reference quantitative phase imaging

Abstract

The invention relates to a quantitative phase imaging device (1) comprising: - an optical imaging system (3) for imaging an object (14) in an image plane, - a light source (2) for emitting light radiation (I) onto the Fourier plane (C) of the optical imaging system, - an optical spatial filter (4) in the Fourier plane having a zone of least attenuation (41) and a zone of greatest attenuation (42), - a wavefront sensor (5) for measuring, in the image plane, the intensity and the phase of the light radiation that has passed through the optical imaging system and the optical spatial filter, and at least some of which light radiation has interacted with the object, in order to quantify the phase induced by the object, the light source, the optical imaging system and the optical spatial filter being such that, in the absence of the object, the light radiation (I) is focused on the zone of greatest attenuation.

Description

[0001]SIGNAL AMPLIFICATION DEVICE IN SELF-REFERENCED QUANTITATIVE PHASE IMAGING Technical Field The present invention relates to a quantitative phase imaging device, in particular for the characterization of nano-objects. Prior Art When a transparent or semi-transparent object is observed in conventional transmission microscopy, i.e. in bright field, the contrast observed on the image is generally low. This complicates the study of the object, in particular when the size of the object is less than a micrometer. Phase contrast microscopy developed by Frederik Zernike is an imaging method consisting of exploiting the phase changes of a light wave passing through an object to be imaged. A disadvantage of the phase contrast microscope is the halo it introduces on the image around the observed objects. Phase contrast microscopy is based on a measurement of the intensity of the light wave,and on the assumption that part of the phase information is transmitted in the intensity by interference phenomenon. Thus, it has the major disadvantage of not quantifying the phase of the wave, and does not allow the intensity contribution to be isolated from the phase contribution. However, as described below, the precise measurement of the phase is particularly important in many applications, notably for the study of microorganisms or the characterization of nanoparticles. Quantitative phase microscopy is another imaging method based on the analysis of the wavefront of the light which illuminates and interacts with the object to be imaged. It measures the optical phase, or a proportional quantity of this wave. In most cases, it simultaneously measures the light intensity. It implements a measurement, by a digital camera attached to diffractive, refractive or reflective optical elements,of a total field resulting from the sum of an incident field and a field scattered by the object, for example semi-transparent, non-absorbing and weakly scattering. Quantitative phase microscopy generates contrasts superior to those obtained in conventional microscopy for transparent or semi-transparent objects, and thus makes it possible to study in detail objects of smaller size than in conventional microscopy. Quantitative phase measurement makes it possible in particular to access the density or mass measurement of an observed object. Quantitative phase microscopy techniques include: - so-called "reference arm" techniques, based on the measurement of interference between a reference wave and a wave having interacted with the object to be imaged, such as holography, and - self-referenced techniques based on a phase gradient measurement. In particular,Self-referenced techniques can be implemented using a wavefront analyzer imaging the object. In particular, the wavefront analyzer can be based on the use of an optical mask, for example a Hartmann-type hole array, a Shack-Hartmann-type microlens array, a grating, a modified Hartmann mask, a diffuser, or a meta-surface, upstream of a camera. Unlike reference arm techniques, which require complex and vibration-sensitive optical setups, self-referenced quantitative phase imaging techniques are simple to implement and achieve good phase sensitivity. Quantitative phase microscopy has many applications, particularly in biology to image weakly scattering subcellular components while obtaining characteristic biophysical values. But observation at the molecular level is complex, if not impossible,due to the weak light-matter interaction of semi-transparent nano-objects. Quantitative phase microscopy also makes it possible to detect and characterize nanoparticles or to monitor chemical reactions. The detection limit of objects or material flows depends directly on the phase sensitivity of the method used. Quantitative phase microscopy also makes it possible to map variations in the refractive index resulting from a thermal disturbance. It thus makes it possible to map a temperature distribution with micrometric spatial precision. Increasing the phase sensitivity would then make it possible to increase the temperature sensitivity. This would also make it possible to map with greater sensitivity changes in the refractive index resulting from an electrical, acoustic or magnetic disturbance. In optical metrology, particularly for quality control in lithography or nano-imprinting,Quantitative phase microscopy allows the measurement of the profile of a surface, with variations in thickness inducing a local variation in the measured phase shift. Good phase sensitivity is crucial for quantifying sub-nanometric variations in thickness. However, a common defect of known quantitative phase microscopy techniques is the fact that the amplitude of the field scattered by the object(s) to be imaged is very low compared to the amplitude of the incident field. This results in a weak phase signal, which makes it difficult to characterize nano-objects, even more so when they are in motion. Modifications of reference arm techniques have been proposed to try to overcome this drawback,but they remain complex to implement and are characterized by a sensitivity limited by the vibrations of the reference arm of the optical assembly. There is therefore a need to improve the detectability of self-referenced quantitative phase imaging techniques, that is to say to have a self-referenced quantitative phase imaging technique capable of detecting at least one object, in particular semi-transparent and / or of a size less than 100 nanometers, in particular such an object in motion, with high contrast. Summary of the invention The invention provides a quantitative phase imaging device comprising: - an imaging optical system for imaging an object in an image plane, - a light source for emitting light radiation on at least a part of the Fourier plane of the imaging optical system,- an optical spatial filter extending in the Fourier plane of the imaging optical system and comprising a zone of least attenuation of the light radiation and a zone of greatest attenuation of the light radiation, - a wavefront sensor for measuring, in the image plane, the intensity and the phase of the electromagnetic field associated with the light radiation emitted by the light source and which has passed through the imaging optical system and the optical spatial filter, and at least part of which has interacted with the object, in order to quantify the phase induced by the object, the light source, the imaging optical system and the optical spatial filter being arranged so that in the absence of the object to be imaged, the light radiation is focused on the zone of greatest attenuation. The "Fourier plane" of the imaging optical system is the plane in which the Fraunhofer diffraction pattern, i.e. the Fourier transform of the object studied, can be observed. Thus,the user of the device can visualize, in the Fourier plane, the spatial frequencies of the object studied. In a variant, the imaging optical system is telecentric, that is to say that its entrance pupil or its exit pupil is at infinity, and the Fourier plane is coincident with a pupil plane of the imaging optical system. A “pupil plane” of the imaging optical system is a plane in which the pupil of the optical system, or an image of it by a part of the optical system, is observed. In the presence of an object to be imaged by the imaging optical system, the incident light radiation from the light source and not diffracted and / or not scattered by the object is focused on the zone of greatest attenuation of the spatial filter, while the light radiation diffracted and / or scattered by the object is located at least partly on the zone of least attenuation. Thus,the optical spatial filter specifically attenuates the intensity of the incident light radiation not diffracted and / or scattered by the object, while keeping almost unchanged the intensity of the radiation diffracted and / or scattered by the object outside the zone of greatest attenuation. The invention makes it possible to attenuate the contribution of the incident electromagnetic field associated with the incident light radiation emitted by the light source and not diffracted and / or scattered by the object to the electromagnetic field detected by the wavefront sensor, which amplifies the phase signal. From the measurement of the phase and the intensity, and taking into account the complex transmittance of the zones of greatest and least attenuation, an analytical model or numerical processing makes it possible to determine the quantified value of the phase which would be measured in the absence of the optical spatial filter,with an increased signal-to-noise ratio. It is thus possible to calculate relevant quantitative quantities, such as the dry mass of the object, the index value of the object, or the thickness of the object, from this quantified value of the phase. The areas of greater and lesser attenuation preferably affect the phase of the wave differently. The "area of ​​greater attenuation" induces an attenuation at the wavelength(s) that make up the light radiation emitted by the light source, which is lower in norm than the "area of ​​lesser attenuation". Wavefront sensor The wavefront sensor measures at least one variation, in particular a gradient, of the phase of the light radiation that has passed through the object, the imaging optical system and the optical spatial filter,or a characteristic quantity of said phase such as the optical path difference traveled by two light rays. The phase induced by the object can be determined from the characteristic quantity, by integration of the measured gradient. The wavefront sensor further measures the intensity of said radiation. The wavefront sensor preferably comprises a detector of the light radiation, for example a camera, and in particular comprises a two-dimensional sensor for sampling the intensity. Optionally, the wavefront sensor comprises a wavefront analysis mask arranged in front of the detector along the optical path of the light radiation,in order to determine the spatial distribution of the gradient of the phase of the light radiation or of a signal proportional to said phase. The wavefront analysis mask may in particular simultaneously measure the phase and the intensity of the detected light radiation. The wavefront analysis mask preferably comprises a diffractive optical element, periodic or aperiodic, and / or a refractive optical element. The wavefront analysis mask may be placed close to the detector or close to a plane conjugate to the plane in which the detector extends. The wavefront analysis mask may be chosen in particular from a mask comprising a microlens array, for example a Shack-Hartmann mask, a modified Hartmann mask, for example as described by P. Bon et al. In “Quadriwave lateral shearing interferometry for quantitative phase microscopy of living cells”, Opt. Express, 17, 13080-13094 (2009), and a thin diffuser,for example as described by P. Berto, H. Rigneault and M. Guillon in “Wavefront sensing with a thin diffuser”, Opt. Lett. 42, 5117-5120 (2017). The light radiation detector preferably comprises a digital camera for acquiring the light radiation which, preferably, has interacted with the wavefront analysis mask. The digital camera may comprise a light sensor, for example CMOS or CCD, for acquiring the light radiation and which measures the intensity of said light radiation. Optical spatial filter The zone of greatest attenuation and, optionally, the zone of least attenuation, are adapted to attenuate the intensity of the light radiation. Preferably, the zone of least attenuation does not attenuate the intensity of the light radiation,in order to maintain maximum light intensity for the measurement. The area of ​​greatest attenuation induces a greater attenuation of the intensity of the light radiation than the area of ​​least attenuation. The area of ​​greatest attenuation and / or the area of ​​least attenuation may induce a phase shift between the light radiation which is incident on said areas respectively and the light radiation attenuated by said areas so as to amplify the signal-to-noise ratio of the measured phase and intensity signals. According to a variant, the optical spatial filter is adapted to reflect the light radiation, the area of ​​greatest attenuation being semi-reflective. The area of ​​least attenuation may be semi-reflective or, preferably, reflective. The areas of least attenuation and greatest attenuation may have different thicknesses,in order to induce different phase shifts in the light radiation that they attenuate. According to another variant, the spatial filter is adapted to transmit the light radiation, the zone of greatest attenuation being semi-transparent. The zone of least attenuation may be semi-transparent or, preferably, transparent. The higher the attenuation of the intensity, the lower the transmission. The zone of greatest attenuation may have a complex transmittance t defined by the relation t=t0*e, -Lȕwith 0 < t0 ^^^^7, the amplitude t0 being measured on at least part of the wavelength spectrum(s) of the light radiation emitted by the light source, and optionally the phase shift ȕ^is such that -1 rad [S] ^^ȕ^^^1 rad [S], in particular in order to amplify the signal on the phase in absolute value. The amplitude t0 of the complex transmittance can be measured by focusing a light beam on the area of ​​greatest attenuation and measuring the attenuation of the intensity of the light beam which gives access to the transmission T= t0². The GpSKDVDJH^ȕ can be measured by interferometry. 'H^ SUpIpUHQFH^^ 7^ ^^ ^^15, for example T = 0.1. The optical spatial filter may comprise a transparent support and a semi-opaque coating partially covering the support, the area of ​​greatest attenuation being defined by the superposition of the support and the semi-opaque coating. The transparent support may be made of glass.The semi-opaque coating may have the shape of at least one disc of radius r. fs , preferably less than 0.1*r p , r p being the maximum radius of the disk within which the spatial frequencies collected in the Fourier plane are distributed. For example, rfs ^^ 100 µm. Depending on the variant where the imaging optical system is telecentric, the Fourier plane is confused with a pupil plane. pthen represents the radius of the image of the aperture pupil of the imaging optical system in the Fourier plane. Alternatively, the semi-opaque coating has the shape of a ring. It can have any shape corresponding to the angular spectrum of the illumination. The semi-opaque coating can be centered on the optical axis of the optical spatial filter. The semi-opaque coating can have a thickness of less than 100 nm. The semi-opaque coating can comprise a semi-opaque layer of a metal chosen from gold, silver, aluminum, chromium, titanium, and their alloys, for example gold. The semi-opaque coating can comprise a bonding layer sandwiched between and in contact with the support and the semi-opaque layer, for example made of chromium and / or titanium.The zone of greatest attenuation may have a complex transmittance that is variable, in particular depending on the polarization of the light radiation and / or the temperature of said zone, and / or modifiable by the user. The zone of greatest attenuation may comprise a thermochromic material, the transmission of which may vary depending on the temperature, and / or a polarizing material, the transmission of which may vary depending on the polarization of the light radiation. The thermochromic material may be chosen from thermochromic liquid crystals, thermochromic leuco-dyes, thermochromic oxides, optionally doped, and mixtures thereof, for example being chosen from the group formed by VO2, BiVO4, NbO2 and mixtures thereof.The zone of greater attenuation and / or the zone of lesser attenuation may comprise at least one layer of a material capable of inducing a phase shift between the radiation incident on said zones respectively, and the radiation attenuated by said zones. For example, they comprise a layer comprising a polymer, a glass, or titanium dioxide. They may comprise a stack of layers made of at least two different materials, for example a stack of a layer of titanium dioxide, a layer of silicon dioxide and another layer of titanium dioxide, or a metasurface. The zone of greater attenuation and / or the zone of lesser attenuation may comprise a layer of a birefringent material which induces a phase shift between the radiation incident on said zones respectively and the radiation attenuated by said zones, which can be modulated by rotating the direction of polarization of the light source.The zone of greater attenuation and / or the zone of lesser attenuation may comprise a layer of a material having a non-zero thermo-optical coefficient, which induces a phase shift varying as a function of the temperature, in particular a liquid, for example glycerol, or a polymer, for example polydimethylsiloxane. The device may comprise a thermal regulation module for modifying the temperature of the zone of greater attenuation and / or the zone of lesser attenuation in order to modify the transmission of said zones and / or the phase shift induced by said zones. The thermal regulation module may comprise an optical, electrical or magnetic heating member, for example by the Joule effect.For example, in a variant where the lower transmittance area comprises a gold layer, the optical heating of said layer modifies the refractive index of the layer, which results in a variation of the optical phase shift induced by the greater attenuation area between the radiation incident on said area and the radiation attenuated by said area. Alternatively, the heating may be electrically induced by a resistive wire, in particular an indium-tin oxide (ITO) wire. The use of a thermal regulation module makes it possible in particular to vary the phase shift induced by the optical spatial filter in real time, so as to optimize the signal-to-noise ratio on both the intensity signal and the phase signal.The optical spatial filter may comprise a spatial light modulator, known by the abbreviation SLM (Space Light Modulator), or a phase-controlled optical grating, in particular in order to modulate the complex transmittance. The spatial light modulator may optionally be coupled to an opaque mask in order to attenuate a portion of the radiation diffracted and / or scattered by the object. The spatial filter may comprise several zones of greater attenuation of the light radiation which are separated from each other. The device may comprise several optical spatial filters. The optical spatial filters may be arranged one after the other along the propagation path of the light radiation. The optical spatial filters may be removable, the addition or removal of at least one of the optical spatial filters modifying the equivalent complex transmittance of all of said spatial filters.Imaging optical system The imaging optical system can combine an object plane with the image plane, the object being for example located outside the object plane but close to it. The device makes it possible to digitally refocus an object located outside the object plane. The optical system can comprise an objective. Alternatively, the optical system preferably comprises one or more additional lenses, in particular converging lenses, and / or one or more mirrors. The optical system is preferably stigmatic or substantially stigmatic. The optical system is preferably aplanatic. The object numerical aperture NAobject of the optical system is preferably between 0.12 and 1.7 to maximize the light radiation diffracted and / or scattered by the object which will be detected by the wavefront sensor.The magnification of the imaging optical system, which is related to the image numerical aperture by the relation NAimage = NAobject / magnification, is preferably chosen to phase-sample the image percussion response (PSF). image) of the imaging optical system by meeting the Nyquist criterion (>2 measurement points / PSFimage). Light source The light source preferably comprises a light generator for generating the light radiation, for example chosen from a lamp, in particular a halogen lamp, and an intense laser, in particular a super-continuum laser. The light radiation emitted by the light source has an angular spectrum which can be shaped by an additional optical system upstream of the object to be imaged in order to distribute the energy of the incident light radiation over the area of ​​greatest attenuation. In an exemplary embodiment, the area of ​​greatest attenuation has the shape of a disc centered on the optical axis and the light source can comprise an additional optical system for generating Köhler illumination.The additional optical system may be arranged between the light generator and the object, in the direction of propagation of the light radiation, in particular in order to collimate the light radiation incident on the object. The light source may be configured to emit monochromatic or polychromatic radiation. When the phase shift induced by the optical spatial filter between the radiation incident thereon and the filtered radiation is non-zero, the light radiation of nominal wavelength ^. ^^^^^^^^ has a spectral extent ο^ preferably satisfying the condition ǻȕ^ȕnominal < 50%. ȕnominal HW^ǻȕ correspond to the phase shift and the phase shift variation induced by the optical spatial filter for ^ ^^^^^^^^and on the spectral range ǻȕ respectively. The spectral range of the light radiation is preferably fixed by the way of generating the phase shift induced by the optical spatial filter. For a phase shift induced by the optical spatial filter generated by refractive effect, 1^ < 50%. The radiation may be visible, X-ray or infrared radiation. The light radiation emitted by the light source may be polarized. The light source may include a filter for selecting at least one wavelength of the light radiation emitted by the light generator and / or a polarization filter for said light radiation. The selection filter and / or the polarization filter may be arranged, along the path of the light radiation, between the light generator and the object to be imaged. Other components of the device The device may include an additional digital camera, in particular for measuring the intensity of the light radiation in the Fourier plane of the imaging optical system. The additional digital camera makes it possible in particular to image the Fourier plane in order to precisely position the optical spatial filter in this plane.The device may comprise a microscope having an objective, the optical spatial filter being distant or not from the microscope. The microscope may comprise the light source, in particular the microscope may itself emit Köhler illumination. The microscope may comprise a sample holder. The microscope may comprise other elements of the optical system, in particular one or more lenses and / or one or more mirrors. The device may comprise one or more additional optical elements, for example chosen from a lens, in particular a converging lens, a reflecting mirror, a semi-reflecting mirror, a dichroic mirror, and wavelength filters.Method Furthermore, the invention also relates to a method for acquiring at least one digital image of a sample comprising an object by means of the device according to the invention, the method comprising: a) the emission with the light source of incident light radiation directed onto the object, b) the detection by the wavefront sensor of the total light radiation having interacted with the object, transmitted by the optical imaging system and the optical spatial filter, and c) the processing of the signal detected in step b) to quantify a quantity chosen from the phase of the radiation and / or a variation in the phase of the radiation, and optionally to generate a digital image of said quantity. Preferably, the processing in step c) further comprises the quantification of the intensity of the light radiation and preferably the generation of a digital image of the intensity of the light radiation. The processing in step c) is quantitative, i.e.it includes the correction of the signal detected in step b) by taking into account the effect of the phase shift and attenuation induced by the optical filter on the value of the quantity. The sample may include one or more objects whose size is smaller than the resolution of the optical imaging system. The resolution of the optical imaging system is defined by R , where ^ is the wavelength of the radiation. bright and ^^ ^^^^௧is the object numerical aperture of the imaging optical system. The object may be transparent or semi-transparent to light radiation. Alternatively, the object may be opaque to said radiation. The sample may be chosen from a biological material comprising a microorganism, a powder, a biological culture solution, a group of cells or micro-tissues, an inert material comprising a nanoparticle or a particle mixture solution. The microorganism may be a bacterium, a vesicle or a virus. The light radiation may have a wavelength spectrum as described above. The invention finally relates to the use of the device for the study of one or more nanoparticles, or for the analysis of a chemical reaction or an electrochemical reaction, or a photografting or photopolymerization reaction,or for mapping a temperature distribution or the specific detection of molecules via their absorption in a pump-probe regime. Brief description of the drawings The invention may be better understood by reading the detailed description which follows, of non-limiting examples of its implementation, and by examining the appended drawing, in which: - Figure 1A represents, schematically and partially, an example of a device according to the invention, - Figure 1B represents, schematically and partially, an example of a wavefront sensor, - Figures 2A and 2B illustrate schematically the spatial distributions of the incident and scattered fields in the Fourier plane, for the device according to the invention, respectively without and with the presence of the spatial filter, and Figures 2C, 2D and 2E show the complex representations of the incident, scattered and total fields,in the case of Figure 2A for Figure 2C and in the case of Figure 2B for Figures 2D and 2E, - Figures 3A, 3B and 3C represent results of numerical simulations of the phase images and Figures 3D, 3E and 3F numerical simulations of the intensity images, of a spherical object, respectively without filtering (3A and 3D), with filtering (3B and 3E), and with filtering and quantitative processing (3C and 3F), - Figures 4A and 4B respectively represent maps of the simulated phase and intensity contrast gain values ​​as a function of the transmission coefficient and the phase shift of the spatial filter, - Figures 5A and 5B represent maps of the simulated relative phase and intensity errors as a function of the transmission coefficient and the phase shift of the spatial filter,- Figures 6A and 6B represent the simulated relative phase and intensity errors as a function of the ratio between the radius of the spatial filter and the radius of the exit pupil of the optical system, - Figure 7A is an experimental image of the Fourier plane, Figures 7B and 7C are each the image and profile of the incident radiation in the Fourier plane, respectively with and without a filter, - Figures 8A, 8B and 8C are each intensity and phase images as well as intensity and phase profiles according to the segments represented in the intensity and phase images, - Figures 9A and 9B show enlargements of the phase images of Figures 8A and 8C, - Figures 10A, 10B and 10C show three different angular spectra of the light radiation in the Fourier plane and Figures 10D, 10E and 10F show the corresponding optical spatial filters,- Figure 11A schematically and partially represents an alternative embodiment of the optical spatial filter and Figure 11B shows the complex representations of the incident, scattered and total fields after filtering by the optical spatial filter of Figure 11A, - Figures 12A and 12B are experimental intensity and phase images respectively, of the same object in the absence of the optical spatial filter of Figure 11A (group 1 on the left) and in the presence of the optical spatial filter of Figure 11A (group 2 on the right) for different values ​​of variable phase shift applied, and - Figures 13A and 13B represent the evolution of the intensity contrast and the phase gain respectively, corresponding to Figures 12A and 12B. Detailed description Figure 1A illustrates an example of a quantitative phase imaging device 1 according to the invention. The device comprises a light source 2, a telecentric optical imaging system 3,an optical spatial filter 4 and a wavefront sensor 5. A part of the optical system 3 is housed in a microscope 9. This part of the optical system 3 comprises an objective 31, a mirror 32 and a tube lens 33. The microscope 9 also comprises a sample holder 10 arranged in the object focal plane A of the optical system 3. To image an object, the user of the device 1 places a sample 14 comprising the object on the sample holder 10. The light source 2 comprises a light generator 21 and may comprise, between the light generator 21 and the object focal plane A, an optical system 22 making it possible to create Köhler-type illumination at the object focal plane A, and therefore at the sample 14 if necessary. The incident radiation I, coming from the source 2, is thus collimated and at normal incidence in the object focal plane A,on the sample holder 10. A part D of this radiation is then diffused by the sample 14. In the example illustrated, the image focal plane B of the objective 31, corresponding to the Fourier plane of the optical system, is inaccessible because it is located inside the microscope 9. Advantageously, the spatial filter 4 can be arranged in a plane C conjugated to the Fourier plane B, transferred after the tube lens 33 by a converging lens 34 of the imaging optical system 3. The conjugate plane C thus corresponds to the Fourier plane of the optical system 3. As illustrated in FIG. 1B, the wavefront sensor 5 can comprise a digital camera 51 and a wavefront analysis mask 53, for example of the Shack-Hartman type,arranged upstream of the camera 51. A radiation R characterized by its wavefront F arrives on the wavefront analysis mask 53 before being detected by the camera 51. The wavefront analysis mask 53 can modify the path of the light radiation and the complex amplitude variation generated makes it possible to simultaneously measure the phase and the intensity of the light radiation. Thus, the wavefront sensor illustrated in FIG. 1B measures the intensity and the phase of the total light radiation that it receives. The wavefront sensor 5 is preceded, in the example illustrated in FIG. 1A, in the direction of propagation of the light radiation,of a converging lens 35 forming part of the imaging optical system 3 and making it possible to image the sample 14 on the digital camera 51. The device 1 also comprises an additional camera 15 for imaging the Fourier plane C using a pivoting or semi-transparent mirror 16 and an optical system 17 with two lenses. The spatial filter 4 can thus be positioned precisely in the Fourier plane C, centered on the optical axis, for example using a translation stage, not shown. The optical spatial filter 4 has a zone of greater attenuation 41 and a zone of lesser attenuation 42. In the example illustrated, the spatial filter comprises a support 43 having the shape of a transparent plate, for example made of glass, and of square shape, covered with a metallic coating 44 having the shape of a disc of radius r, fsarranged in the center of the plate. The zone of least attenuation 42 can be delimited by the portion of the support 43 not covered by the coating 44 and the zone of greatest attenuation is delimited by the superposition of the support 43 and the coating 44. Figure 2A schematically illustrates the spatial distributions in the Fourier plane of the incident and scattered electromagnetic fields obtained by the device 1 according to the invention, without the presence of the spatial filter 4. When a sample 14 is arranged in the object focal plane A on the sample holder 10 of the device without spatial filter 4, the incident electromagnetic field corresponding to the incident radiation I not impacted by the sample is noted ^ ^ and the scattered electromagnetic field corresponding to the scattered radiation D is noted ^ ௗ . ^ ^ ௗ ^^ ^ ^ ^ respectively represent the spatial Fourier transforms of the scattered fields ^ ௗand ^ ^ . In the case where the sample 14 is a semi-transparent, non-absorbent and weakly scattering object, the total electromagnetic field ^௧is expressed by the relation (1):^௧ = ^^ + ^ௗ (1)In this example, the incident radiation I being collimated at the level of the sample 14, it has a point distribution at the center of the Fourier plane C, corresponding to the image of the pupil of the optical system 3. When the sample 14 is smaller than the wavelength(s) of the incident radiation, for example of a dimension less than 100 nm, the radiation D is scattered in a quasi-isotropic manner. It thus has a homogeneous distribution on the image of the pupil of the optical system 3 in the Fourier plane C. The fields ^ ^ and ^ ௗ can be observed in the Fourier plane C as schematically illustrated in Figure 2A, thanks to the additional camera 15 which images the Fourier plane C. The field ^ ௗfills the Fourier plane C while the field ^ ^ is here concentrated at a point at the center of the Fourier plane C. More generally, the field ^ ^ is distributed according to the angular distribution of the light radiation I emitted by the light source 2. In the case of a weakly diffusing object, and as illustrated in Figure 2C, the module |^ ௗ | of the scattered field is small compared to the modulus of the incident field |^ ^ |. For example, it is more than 1000 times smaller than the modulus of the incident field |^ ^ |. It can then be considered that the total field ^௧ is equal to the incident field ^^ phase shifted by a phase shift^, hence the relation (2):^ ௧ = ^ ^ ^ ି^ఝ (2)For biological objects, such as vesicles or viruses, or even nanoparticles, the phase shift ^ is small, notably less than 0.05 rad, so that we can use the Taylor expansion in ^, hence the relation (4):^௧ ^ ^^(1 െ ^^) (4)By identification between relations (1) and (4), the scattered field ^ ௗ can be written, according to relation (5), as the incident field ^ గ^ attenuated by ^, and phase shifted by approximately ଶ : Figure 2C shows the complex representation of the incident ^^, scattered ^ௗ and total ^௧ fields obtained with device 1 without spatial filter. In this figure we observe the phase shift close to గ ଶ of the diffused field ^ ௗ relative to the incident field ^ ^ . In the case of the device according to the invention with the presence of the optical spatial filter 4 in the Fourier plane C, ^ ^^ is the contribution of the incident electromagnetic field, corresponding to the incident radiation I after transmission by the spatial filter 4, and ^ ௗ ^the contribution of the scattered electromagnetic field, corresponding to the scattered radiation D after transmission by the spatial filter 4, to the total electromagnetic field ^ ௧ ^ reaching the wavefront sensor 5. In the case where the sample 14 is a semi-transparent, non-absorbing and weakly scattering object, the following relation (6) can be defined:^௧^ = ^^^ + ^ௗ^ (6)The complex transmittance t of the lower transmittance region is defined as ^ = ^ ^ ^ ି^ఉ . The ray ^ ^ of the area of ​​lower transmittance is preferably at least 5 times less than the radius ^ ^of the image of the pupil of the optical system 3 in the Fourier plane. Thus, the zone of greatest attenuation only affects the incident field and not the scattered field, as can be observed in Figure 2B. The following relations (7) to (9) can thus be written: Figures 2D and 2E show the complex representation of the incident fields after filtering ^ ^ ᇱ , broadcast after filtering ^ ௗ and total after filtering ^ ௧ ^, respectively GDQV^OH^FDV^R^^ȕ^HVW^QXO^HW^GDQV^OH^FDV^R^^ȕ^HVW^QRQ^QXO. We observe in particular the reduction in the amplitude of the incident field after filtering ^ ^ ᇱ , relative to the amplitude of the incident field ^ ^unfiltered image shown in Figure 2C. The transmittance amplitude t0 is chosen such that |^^^| = |^^^| ^ |^ௗ| in order to achieve the best compromise between attenuation of^^ and signal level necessary for good phase reconstruction. Preferably, 0 < t0< 0.7. The region of greatest attenuation is semi-transparent. Complete cancellation of the incident field ^ ^ ^ = 0 by an opaque area of ​​greater attenuation would produce dark-field illumination but would prevent the wavefront phase from being defined across the entire field of view. The total transmitted field ^ ௧ ^ carries a new phase shift ^ ᇱ > ^ relative to the field ^ ^ ^. The phase shift ^ induced by sample 14 can be quantified from the measurement of the field intensity and phase ^ ௧ ^. Combining relations (1) and (8), we obtain relation (10): ^௧ and ^௧^ are the relative intensities respectively of the total fields ^௧ in the case of a device 1 without spatial filter 4 and after filtering ^ ௧ ^ in the case of a device 1 with spatial filter 4. Relations (11) and (12) can be formulated: as well as relation (13) from relation (10): The wavefront sensor 5 measures a relative intensity, i.e. the ratio between a reference image without sample and an image in the presence of the sample 14. The intensity ratios ^ ^ and ^ ^ ^ defined by relations (14) and (15) can thus be mesurés : Relation (16) can then be formulated from relation (13): Knowing the complex transmission of spatial filter 4 and from the measured quantities ^^ ᇱ^^ and ^ in the presence of spatial filter 4, the phase shift ^ and absorption^^ induced by the scattering object of sample 14 can be quantified. Numerical simulations of the implementation of device 1 were carried out, in order to determine the optimal conditions of use. They were implemented following the method defined in the article P. Bon, B. Wattellier, and S. Monneret, “Modeling quantitative phase image formation under tilted illuminations,” Opt. Lett. 37, 1718 (2012). Sample 14 studied is a polystyrene bead with an optical index equal to 1.62, immersed in water with an optical index equal to 1.33. Sample 14 was illuminated with monochromatic light radiation of ORQJXHXU^G¶RQGH^^^ ^^^^^QP^^ / ¶REMHFWLI^31 used had a numerical aperture of 1.4. Spatial filtering was simulated on the field ^ ^ ௧, spatial Fourier transform of the total field ^ ௧ . The simulated electromagnetic field enclosed in a disk of radius ^ ^^ , radius of the zone of greatest attenuation 41 of the spatial filter 4, was then multiplied by the complex transmittance ^ ^ ^ ି^ఉ of the spatial filter 4 to simulate the interaction with said spatial filter 4. The area of ​​the field located outside a disk of radius ^ ^ , the pupil image radius of optical system 3 in the Fourier plane C, was set to 0 to simulate the finite numerical aperture of optical system 3. The field ^ ^ ௧ ^ was thus simulated, according to relation (17): with k the image vectors in the pupil, and ^^ being the numerical aperture of the optical system 3 and ^ the wavelength of the light radiation. The value of the total field after filtering ^ ௧^, measurable on the wavefront sensor 5, was calculated by performing an inverse spatial Fourier transform of this field ^ ^ ௧ ^.ᇲ మ The intensity ^ ^ ᇱ and phase ^ ᇱ , calculated respectively by หா^ห ௧ మ బ and arg(^ ௧ ᇱ ), are shown in the intensity and phase images of Figures 3E and 3B respectively. They were calculated by considering ^ ^ ^ = 0.1 , ^ = 0 and ^ೞ ^ ^ = 7%. Figure 3B shows that an amplification of the measured phase is obtained ^ ᇱ, the value of which is up to more than ten times higher than the value of the phase shift ^ calculated in the absence of the spatial filter and represented in Figure 3A. As for the intensity map of Figure 3E, it corresponds to a partially dark field image, where the light scattered by the object, in the center of the figure, is predominant compared to the incident light. Figure 4A represents the phase amplifications and Figure 4B the intensity contrast amplifications simulated as a function of the transmission T and the sage ^ of the spatial filter 4, for ^ phase shift ^ೞ ^ ^ = 7%. For a phase shift ^ induced by the spatial filter 4 close to 0 [2^], the amplification of the phase is all the stronger as the transmission Test is weak. This means that the device 1 operates optimally when the ratio ^ா^ா^ ^ is balanced. A treatment allowing to go back to the quantitative quantities was applied to the intensity ^ᇱ ᇱ^ and to the phase ^ calculated, according to the relation (18): By comparing the actual phase and intensity values ​​(^, ^ ^ ), and those found after filtering and quantitative processing (^ ^ , ^ ^,^ ), the relative error induced by the spatial filter 4 has been estimated and is particularly low. It can be observed, by comparing Figure 3C with Figure 3A, as well as Figure 3F and with Figure 3D, that the phase and intensity values ​​found (^ ^ , ^ ^,^ ) are almost identical to the actual phase and intensity values ​​(^, ^ ^). This comparison reflects the correct operation of the quantitative processing allowing to return to the values ​​in the absence of a filter. As illustrated in Figure 5, modifying the complex transmission of the spatial filter 4 leads to relative errors of less than 10 ିଶ for the phase (figure 5A) and at 10 ିସ for intensity (Figure 5B). Figure 6 illustrates the effect of the ratio ^ ^ ^ ^ of the radius of the spatial filter 4 on the radius of the image of the pupil of the optical system 3 in the Fourier plane C, on the relative phase and intensity errors. We note that below ^ ^ = 10%, the phase errors are less than 1% (Figure 6A) and those in intensity less than 10 ିଷ % (Figure 6B). This ratio value is then established as the limit below which the hypothesis that the presence of spatial filter 4 does not modify the scattered field ^ is considered reasonable.ௗ . Example 1 The microscope 9 used was a commercial Olympus IX71 microscope, equipped with a microscope objective of x60 magnification, and numerical aperture 0.9 (Olympus UPlanFLN). The illumination of the sample 14 was ensured thanks to the native Köhler illumination of the microscope 9 (halogen lamp), filtered in wavelength. The wavefront sensor 5 was an ID4L analyzer (Quadrilateral Shift Interferometer) composed of an Andor Zyla 5.5 camera and a 2D diffraction grating of periodicity 10 µm, optimized for the wavelength 650 nm. This grating was re-imaged on the camera via a telescope of x2 magnification, composed of 2 achromatic lenses. The effective distance between the diffraction grating and the camera was ^ = 1.2 ^^. The area of ​​greatest attenuation 41 of spatial filter 4 was a disk of 80 nm gold on 5 nm chromium, and of radius = 100 µm, deposited via electron bombardment evaporation on a glass slide. The transmission of the optical spatial filter was experimentally measured at T = 7% j^^^ ^^^^^HW^^^^^QP^^HQ^PHVXUDQW^ in the absence of sample, the intensity signal I1without filter and the intensity signal I2with filter, to deduce T=I2 / I 1.The phase shift ^ = 0.5 ^^^ was measured by interferometry. Figure 7A shows an image of the Fourier plane of the experimental device acquired by the additional camera 15. The white disk corresponds to the scattered radiation D by a sample formed by a superposition of sheets of paper, over the entire image of the pupil of the optical system 3 in the Fourier plane C, and the black disk in the middle corresponds to the spatial filter 4. Comparison of Figures 7B and 7C highlights the effect of the spatial filter 4 on the intensity of the incident radiation I. The sample 14 studied was a set of polystyrene beads with an optical index ^^^^௬ = 1.62 and a diameter ^ = 100 ^^ immersed in water with an optical index The results obtained in the case without spatial filter 4 and with spatial filter 4, as well as with the quantitative reconstruction, using equation 16 from the filtered images, are presented in Figure 8. Figure 8A shows the results obtained without spatial filter 4, Figure 8B shows the results obtained with spatial filter 4 and Figure 8C shows the results obtained with spatial filter 4 and following the quantitative processing from the measurements. Experimentally, we measure a gain of a factor of about 3 of the phase signal going from ^ = 3.5 ^^ without spatial filter, to ^ ᇱ = 11^^ with spatial filter, close to the theoretical value simulated by the model and illustrated in Figure 4A. The phase values ​​are expressed in nm because they refer to the optical path difference ^ traveled, a quantity that can be related to the phase in radians by the relation: ^ = 2^ ఋఒ, where ^ is the wavelength of the radiation. Since the modulus of the field scattered by the beads is very small compared to that of the incident field, the beads do not appear in the unfiltered intensity image of Figure 8A. We see in Image 8B that the presence of the spatial filter 4 produces a partially dark field configuration and allows the beads to stand out with a contrast of 0.2, also close to the expected theoretical value found in Figure 4B. After quantitative reconstruction, the reconstructed intensity and phase values, visible in Figure 8C, are identical to the raw intensity and phase values, but with a clear gain in the signal-to-noise ratio. Figure 9A represents an enlargement of the phase image of Figure 8B and Figure 9B shows an enlargement of the phase image of Figure 8C. The noise is calculated on the areas delimited by dotted lines in Figures 9A and 9B. An RMS phase noise of ^ is observed= 0.42 ^^ for the measurements without spatial filter of Figure 9A, and of ^ఝ = 0.29 ^^ for the filtered and then reconstructed measurements of Figure 9B. In a variant, the angular spectrum of the incident light radiation I is a disk centered in the Fourier plane C, as can be seen in Figure 10A, the white area corresponding to the incident light radiation I. The area of ​​greatest attenuation 41 is a disk at the center of the optical spatial filter 4, as shown in Figure 10D, the gray area corresponding to the area of ​​greatest attenuation 41. In a variant, the angular spectrum of the incident light radiation I is represented in the Fourier plane C by several spaced disks, as can be seen in Figure 10B, the white areas corresponding to the incident light radiation I.The area of ​​greatest attenuation 41 is composed of several disks distributed on the optical spatial filter 4 in the same way as the incident light radiation I in the Fourier plane C, as shown in Figure 10E, the gray areas corresponding to the area of ​​greatest attenuation 41. In another variant, the angular spectrum of the incident light radiation I is a ring in the Fourier plane C, as can be seen in Figure 10A, the white area corresponding to the incident light radiation I. The area of ​​greatest attenuation 41 is a corresponding ring on the optical spatial filter 4, as shown in Figure 10D, the gray area corresponding to the area of ​​greatest attenuation 41. Example 2 The same sample 14 and the same device as for Example 1 were used, with the exception of the optical spatial filter 4.The latter, observable in figure 11A, here presented a zone of greater attenuation 41 comprising a chamber 48 containing a medium having a high thermo-optical coefficient dn / dT, such as glycerol for which dn / dT=-2.7.10. -4 , in contact with the gold disc 46 of 80 nm thickness described previously, the chamber 48 and the disc 46 being between two glass plates 45 of the optical spatial filter 4. The chamber 48 made it possible, thanks to a heating system 47 by focused laser, to vary the phase shift induced by the optical spatial filter 4 on the incident field Ei. The total phase shift ȕ total induced by the optical spatial filter 4 on the incident field E i was then the sum of a variable component ȕ variable and a fixed component ȕ fixe , as can be observed in Figure 11B, where ^ ^ ᇱ , ^ ௗ and ^ ௧^ are respectively the complex representations of the incident fields after filtering, scattered fields after filtering and total fields after filtering. The variable phase shift allowed the phase shift values ​​to be optimized ^ ᇱ and intensity |^^ ௧ | ଶ . Figures 12A and 12B show the experimental intensity and phase images respectively, in the absence of a filter (group 1 on the left) and in the presence of the filter VSDWLDO^RSWLTXH^^^SRXU^GLIIpUHQWHV^YDOHXUV^GH^ȕ variableobtained by heating the heat-sensitive chamber (group 2 on the right). The curves in Figures 13A and 13B represent respectively the variation of the contrasts in intensity and in phase, as a function of the phase shift induced by the optical spatial filter 4. We note that we find experimentally the results of the simulations presented in Figures 4A and 4B, for a transmission T equal to 7%. The use of the chamber 48 and the heating system 47 makes it possible to vary the phase shift induced by the optical spatial filter 4 in real time, so as to optimize the signal-to-noise ratio on both the intensity signal and the phase signal.

Claims

Claims 1. Quantitative phase imaging device (1) comprising: - an imaging optical system (3) for imaging an object (14) in an image plane, - a light source (2) for emitting light radiation (I) on at least a part of the Fourier plane (C) of the imaging optical system (3), - an optical spatial filter (4) extending in the Fourier plane (C) of the imaging optical system (3) and comprising a zone of lesser attenuation (41) of the light radiation (D) and a zone of greater attenuation (42) of the light radiation (I), - a wavefront sensor (5) for measuring in the image plane, the intensity and the phase of the electromagnetic field associated with the light radiation (I;D) emitted by the light source (2) and which has passed through the imaging optical system (3) and the optical spatial filter (4), and at least part of which has interacted with the object (14), in order to quantify the phase induced by the object, the light source (2), the imaging optical system (3) and the optical spatial filter (4) being arranged so that in the absence of the object (14) to be imaged, the light radiation (I) is focused on the zone of greatest attenuation (41).

2. Device according to claim 1, the zone of greatest attenuation (41) having a complex transmittance t defined by the relation t=t; 0* e -Lȕwith 0 < t0^^0.7, the amplitude t0 being measured on at least part of the wavelength spectrum(s) of the light radiation (I) emitted by the light source (2), and optionally the phase shift ȕ being such that -1 rad [S] ^^ȕ^^^1 rad [S], in particular in order to amplify the signal on the phase in absolute value.

3. Device according to any one of claims 1 and 2, the optical spatial filter (4) comprising a transparent support (43) and a semi-opaque coating (44) partially covering the support (43), the zone of greatest attenuation (41) being defined by the superposition of the support (43) and the semi-opaque coating (44).

4. Device according to claim 3, the semi-opaque coating (44) having the shape of at least one disc of radius rfs, preferably less than 0.1*rp, rp being the radius maximum of the disk within which the spatial frequencies collected in the Fourier plane (C) are distributed, for example r fs^^^^^^^P^ 5. Device according to claim 3, the semi-opaque coating (44) having the shape of a ring.

6. Device according to any one of claims 3 to 5, the semi-opaque coating (44) being centered on the optical axis of the optical spatial filter (4).

7. Device according to any one of claims 3 to 6, the semi-opaque coating (44) comprising a semi-opaque layer of a metal chosen from gold, silver, aluminum, chromium, titanium, and their alloys, for example gold.

8. Device according to the preceding claim, the semi-opaque coating (44) comprising a bonding layer sandwiched between and in contact with the support (43) and the semi-opaque layer, for example made of chromium and / or titanium. 9.Device according to any one of the preceding claims, the wavefront sensor (5) comprising a detector of the light radiation and, optionally, a wavefront analysis mask (53) arranged in front of the detector along the optical path of the light radiation, in order to determine the spatial distribution of the gradient of the phase of the light radiation (I; D; R) or of a signal proportional to said phase.

10. Device according to the preceding claim, the wavefront analysis mask (53) being chosen from a mask comprising a microlens array, for example a Shack-Hartmann mask, a modified Hartmann mask and a thin diffuser.

11. Device according to any one of claims 9 and 10, the detector of the light radiation (I; D; R) comprising a digital camera (51) for acquiring the light radiation (I; D; R) which, preferably, has interacted with the wavefront analysis mask (53).

12. Device according to the preceding claim, the digital camera (51) comprising a light sensor, for example CMOS or CCD, for acquiring the light radiation (I; D; R) and which measures the intensity of said light radiation (I; D; R).

13. Device according to any one of the preceding claims, comprising an additional digital camera (15), in particular for measuring the intensity of the light radiation (I; D) in the Fourier plane (C) of the optical imaging system (3).

14. Device according to any one of the preceding claims, comprising a microscope (9) having an objective (31), and optionally the microscope comprising a sample holder (10) and / or the light source (2), the optical spatial filter (4) being distant from the microscope (9). 15.Device according to any one of the preceding claims, the zone of greatest attenuation (41) having a variable complex transmittance, in particular as a function of the polarization of the light radiation (I) and / or the temperature of said zone (41), and / or modifiable by the user.

16. Device according to the preceding claim, the zone of greatest attenuation (41) comprising a thermochromic and / or polarizing material.

17. Device according to the preceding claim, the thermochromic material being chosen from thermochromic liquid crystals, thermochromic leuco-dyes, thermochromic oxides, optionally doped, and their mixtures, for example being chosen from the group formed by VO2, BiVO4, NbO2 and their mixtures. 18.Device according to any one of the preceding claims, the zone of greater attenuation (41) and / or the zone of lesser attenuation (42) comprising at least one layer of a material capable of inducing a phase shift between the incident radiation. (I; D) on said areas respectively, and the radiation (I; D) attenuated by said areas, for example a layer comprising a polymer, a glass, or titanium dioxide, a stack of layers, or a metasurface.

19. Device according to the preceding claim, the area of ​​greater attenuation (41) and / or the area of ​​lesser attenuation (42) comprising a layer of a birefringent material.

20. Device according to one of claims 18 and 19, the area of ​​greater attenuation and / or the area of ​​lesser attenuation comprising a layer of a material having a non-zero thermo-optical coefficient, in particular a liquid, for example glycerol, or a polymer, for example polydimethylsiloxane. 21.Device according to any one of the preceding claims, comprising a thermal regulation module for modifying the temperature of the zone of greatest attenuation (41) and / or of the zone of least attenuation (42) in order to modify the transmission of said zones (41; 42) and / or the phase shift induced by said zones (41; 42).

22. Device according to any one of the preceding claims, comprising several optical spatial filters (4).

23. Device according to any one of the preceding claims, the light source (2) comprising a light generator (21) for generating the light radiation (I), for example chosen from a lamp, in particular a halogen lamp, and an intense laser, in particular a super-continuum laser. 24.Device according to the preceding claim, the zone of greatest attenuation having the shape of a disc centered on the optical axis and the light source (2) comprising an additional optical system (22) for generating Köhler illumination, the additional optical system (22) being arranged between the light generator (21) and the object (14), in the direction of propagation of the light radiation (I), in particular in order to collimate the incident light radiation (I) on the object (14).

25. Method for acquiring at least one digital image of a sample comprising an object (14) by means of the device (1) according to any one of the preceding claims, the method comprising: a) the emission with the light source (2) of an incident light radiation (I) directed onto the object (14), b) the detection by the wavefront sensor (5) of the total light radiation (I; D; R) having interacted with the object (14), transmitted by the optical imaging system (3) and the optical spatial filter (4), and c) the processing of the signal detected in step b) to quantify a quantity chosen from the phase of the light radiation (I; D; R) and / or a variation of the phase of the light radiation (I; D; R), and optionally to generate a digital image of said quantity.Method according to the preceding claim, the processing in step c) further comprising the quantification of the intensity of the light radiation (I; D; R) and preferably the generation of a digital image of the intensity of the light radiation (I; D; R).

27. Method according to any one of claims 25 and 26, the sample (14) comprising one or more objects (14) whose size is smaller than the resolution of the optical imaging system (3).

28. Method according to any one of claims 25 to 27, the sample being chosen from a biological material comprising a microorganism, a powder, a biological culture solution, a group of cells or micro-tissues, an inert material comprising a nanoparticle or a particle mixture solution.

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