Ion optics that can be inserted and removed without destruction in a mass spectrometer

Abstract

A non-destructively insertable and removable ion optic is described. A set comprising an ion optic according to the invention and a receiving element for the ion optic is also described. Furthermore, a mass spectrometer, in particular a MALDI-TOF mass spectrometer, comprising an ion optic according to the invention and / or a set according to the invention is described.

Description

[0001] The present invention relates to an ion optic that can be inserted into and removed from a mass spectrometer without damage. The present invention further relates to a set comprising an ion optic according to the invention and a receiving element for the ion optic. The present invention also relates to a mass spectrometer, in particular a MALDI-TOF mass spectrometer, comprising an ion optic according to the invention and / or a set according to the invention.

[0002] The invention is defined in the attached claims. Preferred aspects of the present invention will also become apparent from the following description, including the examples.

[0003] Insofar as certain embodiments are designated as preferred for an aspect of the invention, the corresponding statements also apply to the other aspects of the present invention. mutatis mutandis.Preferred individual features of aspects of the invention (as defined in the claims and / or disclosed in the description) can be combined with each other and are preferably combined with each other, unless otherwise apparent to the person skilled in the art from the present text in the individual case.

[0004] The performance of a mass spectrometer can be reduced by contamination of its components, such as ion sources. For example, during the operation of a MALDI desorption ion source, a sometimes visible coating of organic material forms on the electrodes. Such coatings on ion optics in mass spectrometers have been described in the prior art by Girard et al. (Journal of Chromatography Science, 2010 Oct., 48 (9), 778-779) and Kenneth L. Busch ("Ionic Burn and the Dirt of Mass Spectrometry", online publication, September 1, 2010). The insulating organic coating becomes charged during operation of the ion source and thus generates an electric interference field. This field is superimposed on the desired electric field generated between the electrodes and the MALDI sample holder during operation of the desorption ion source, thereby disrupting the acceleration process.In particular, field changes interfere with the focusing properties of the accelerating electrodes. As a result, the ion beam is no longer well focused on the detector. Furthermore, time-of-flight errors increase in TOF-MS. These increased time-of-flight errors lead to a drop in resolution and reduced mass accuracy, since the extraction conditions are no longer constant due to the electrostatic charges.

[0005] One noticeable effect of such a coating is, for example, a decrease in the ion throughput to the mass analyzer connected to the ion source. This reduced ion throughput, in turn, necessitates the additional acquisition and summation of spectra to maintain a certain level of mass spectral quality. Furthermore, the reduced ion throughput limits the number of analyses possible per sample and lowers the detection limit of the mass spectrometer.

[0006] Girard et al. describe a method in which the charging effect can be neutralized by simply reversing the polarity of the ion source, thereby changing the polarity of the ions being analyzed. Since ions of both polarities are produced in a MALDI method, the polarity of the acceleration field would consequently have to be reversed for an analogous application of the method according to Girard et al. However, this method only addresses the symptoms of the throughput loss in the ion source and promises only short-term effectiveness.

[0007] Therefore, regardless of the aforementioned short-term solution, there is a regular need to remove the coating and thus restore the mass spectrometer's performance. In some cases—if cleaning is unable to restore the ion optics to near-ideal condition—they must be replaced with a new, clean one.

[0008] Prior art includes cleaning methods that can at least partially remove contamination. For example, patent application US 2004 / 0163673 A1 (Holle et al.) describes a sample carrier dummy with bristles that can remove interfering deposits by "scrubbing," as well as a spray cleaning device that utilizes the negative pressure in the vacuum chamber of the ion source to direct a jet of solvent onto the accelerating electrodes, causing deposits to be loosened and removed by its impact. Patent application DE 10 2008 008 634 A1 (Holle et al.) further discloses a method in which the deposit is removed by local heat application.

[0009] Another method for removing the deposits, still used in practice, is manual cleaning after venting and opening the mass spectrometer. This cleaning is usually carried out with solvents such as ethanol or acetone, but for stubborn contamination, it may also involve abrasive cleaning agents (such as toothpaste). Since cleaning the ion optics while installed is difficult due to the limited space, and to avoid contaminating adjacent components with the loosened dirt during cleaning, it is usually removed for this purpose.

[0010] The removal and cleaning processes themselves are generally quite straightforward, requiring some experience but otherwise no special expertise. These steps can therefore be carried out by semi-skilled personnel without major problems. However, things become more complicated when the removed components need to be reinstalled in the mass spectrometer. The necessary use of electromagnetic forces and fields for controlling and manipulating ions means that positioning specifications exist for the ion optics used, allowing only narrow tolerances. These tolerances should preferably not exceed ten micrometers, and in any case, should be less than 20 micrometers.For example, the surface-normal distance between a MALDI sample holder with the sample mounted on it and the first accelerating electrode significantly determines the acceleration distance of ions on their way to the mass analyzer and thus the kinetic energy imparted to them over that distance. Controlling and correctly adjusting this kinetic energy is crucial for the operation of, for example, a time-of-flight mass spectrometer. Even more critical is the change in the ion direction caused by a displacement perpendicular to the ion axis or a tilting of the lens pack. Deviations in the surface-normal distance between the sample and the accelerating electrode (even indirectly via a lateral displacement) can therefore significantly impair mass spectrometric analysis.

[0011] Furthermore, ion optics require a power supply. This means that the corresponding electrical leads, which are usually screwed in place, must be disconnected when removing the ion optics and reconnected when reinstalling them. This requires additional steps and increases the risk of incorrect or inaccurate installation or insertion of the ion optics after removal.

[0012] For these reasons, reinstalling an ion optics unit that has been removed, for example, for cleaning, often requires specially trained personnel from the manufacturer or its authorized dealers. These personnel may need to realign the reinstalled ion optics unit within the mass spectrometer to ensure high positional accuracy. If the mass spectrometer lacks alignment marks or similar indicators, it is often necessary to realign not only the ion optics unit relative to the mass spectrometer, but also other components such as a reflector or a detector (in two planes), not to mention the additional fine-tuning of the supply voltages.The personnel effort required for such maintenance work is considerable and also involves high costs for the user of the mass spectrometer, who, for example, has to pay the travel expenses of the specialist personnel.

[0013] US 2009 / 0242747 A1 (Guckenberger et al.) discloses a mass spectrometer in which an ion source and various ion-optical elements are combined into a subunit. The subunit is removed from the mass spectrometer under vacuum for cleaning of contaminants generated during operation and then reinserted.

[0014] US 7,601,951 B1 (Whitehouse et al.) describes an atmospheric pressure ion source designed such that all or some of the vacuum components, such as ion-focusing and ion-transporting electrostatic lenses and ion guidance systems, and two or more vacuum stages are combined into one unit and removed from an ion source or vacuum housing.

[0015] US 7,667,193 B2 (Finlay) discloses a modular mass spectrometer to provide a user with a personalized analytical instrument by installing a personalized analysis module.

[0016] EP 2 555 224 A1 (Kern et al.) discloses an arrangement consisting of a support holder and a complementary support for a removable ion optic in a mass spectrometer.

[0017] Initially, particular emphasis was placed on MALDI ion sources. However, the invention presented below is not limited to specific methods of generating or guiding ions in a mass spectrometer. Similar considerations can also be applied to electrospray ion sources, electron impact ion sources, chemically ionized ion sources, and others.

[0018] Against the background of the prior art described above, the primary object of the present invention was to provide an ion optic that can be easily removed from a mass spectrometer and then quickly reinserted into the mass spectrometer – for example, after cleaning. The ion optic should also be removable from and correctly reinserted into the mass spectrometer without requiring any special prior knowledge, and without the need for any special technical procedures for connecting and contacting the ion optic. Preferably, the removal and insertion of the ion optic should also be possible without tools and / or without adjustment, i.e., without the need for adjustment of the ion optic after insertion into the mass spectrometer – adjustments which often require complex and expert knowledge.

[0019] Further tasks arise from the following description and the patent claims.

[0020] The primary problem of the present invention is solved by an ion optic that can be inserted into and removed from a mass spectrometer without damage, comprising an element for the reversible mounting of the ion optics within the mass spectrometer, and an element to ensure reproducible positioning of the ion optics in the mass spectrometer, where i) the element for reversible mounting of the ion optics and / or ii) the element for ensuring reproducible positioning of the ion optics simultaneously serves as a contact point for applying an electrical voltage (or an electrical potential or an electric current) to the ion optics (that is, at least to parts of the ion optics, such as in particular to one or more electrically conductive components for the targeted manipulation of ions).

[0021] The element for reversibly mounting the ion optics and / or the element for ensuring reproducible positioning of the ion optics allows for the application of both a DC voltage and an AC voltage, for example, an RF voltage. Preferably, the element for reversibly mounting the ion optics and / or the element for ensuring reproducible positioning of the ion optics serves as a contact point for applying a DC voltage to the ion optics, preferably for applying a DC voltage in the range of 4 to 20 kV.

[0022] For the purposes of the present invention, an ion optic can be understood to be any structural element of a mass spectrometer and / or an ion source that serves for the targeted (i.e., intentional, goal-directed) manipulation of ions, preferably for the targeted manipulation of the beam path of an ion beam. Examples of ion optics or examples of (electrically conductive) components of ion optics for the targeted manipulation of ions, preferably for the targeted manipulation of an ion beam, within the meaning of the invention, include, for example, accelerating, shielding, and / or mass electrodes of an ion source, but also injection capillaries, multipole rod systems, ion funnels made of ring electrodes, ion deflectors (capacitors), and the like.

[0023] An ion optic according to the invention can be designed as a single unit or as a multi-part unit and may, for example, comprise several (electrically conductive) components for the targeted manipulation of ions. An ion optic according to the invention may also comprise a holder in which the components for the targeted manipulation of ions can be arranged and by which they can be held. An ion optic according to the invention may also comprise components made of an insulating material, which, for example, prevent electrical contact between several electrically conductive components for the targeted manipulation of ions in an ion optic.

[0024] The reversible mounting element for the ion optics within the mass spectrometer serves two purposes: firstly, to ensure secure and firm mounting of the ion optics within the mass spectrometer, and secondly, to allow for easy and non-destructive removal and reinstallation of the ion optics. This reversible mounting can be achieved, for example, using a spring, a magnetic element, a pneumatic element, a hydraulic element, or a combination of one or more of these mounting elements.

[0025] The element for ensuring reproducible positioning of the ion optics in the mass spectrometer serves to enable the ion optics to be positioned in the same way and / or at the same location in the mass spectrometer after removal, thus eliminating the need for any complex adjustment of the ion optics after removal and reinsertion into the mass spectrometer.

[0026] A key aspect of the invention is the realization that i) the element for reversibly mounting the ion optics and / or ii) the element for ensuring reproducible positioning of the ion optics can, in addition to its primary function, also be used as a contact point for applying an electrical voltage to the ion optics. This enables a simpler and more compact design of the ion optics, as it allows for the partial or complete elimination of other connection points on the ion optics for electrical contact. This also eliminates or reduces the risk of damage to such additional electrical connection points, which are often delicately designed due to the size of the ion optics.The possibility of reducing electrical connection points and / or making them more compact is particularly advantageous because high voltages are usually applied to ion optics and electrical connection points for high voltages are subject to particularly high technical requirements; that is, by simplifying the electrical connections, the structural requirements for the ion optics as a whole can be significantly simplified and improved.

[0027] A further advantage of simultaneously using element i) for the reversible mounting of the ion optics and / or element ii) to ensure reproducible positioning as a contact point for applying an electrical voltage to the ion optics is that this further simplifies the process of removing and inserting the ion optics, as the operator no longer needs to worry about the electrical contacting of the ion optics. This further reduces potential sources of error when removing and, especially, when reinserting the ion optics.

[0028] A preferred ion optic according to the invention is one in which the element for reversibly mounting the ion optic simultaneously serves as a contact point for applying an electrical voltage to the ion optic. A further preferred ion optic according to the invention is one in which only the element for reversibly mounting the ion optic serves as the contact point for applying an electrical voltage to the ion optic.

[0029] The invention includes embodiments in which the function of reversibly mounting the ion optics and the function of ensuring reproducible positioning of the ion optics are realized by one and the same element. Preferably, however, both functions are realized by different elements.

[0030] An ion optic according to the invention can also comprise more than one element for reversible attachment of the ion optic and / or more than one element for ensuring reproducible positioning of the ion optic, wherein the multiple elements can be of the same or different design and configuration.

[0031] For example, an ion optic according to the invention can have two different types of elements to ensure reproducible positioning of the ion optic, wherein one of these elements can primarily serve to correctly align the ion optic within the mass spectrometer (for example, so that a second element intended for finer positioning is first correctly aligned to a possible complementary counterpart within a mass spectrometer and correctly attached to this counterpart) and the second of these elements can serve to achieve a finer, always reproducible positioning of the ion optic within the mass spectrometer with, for example, an accuracy in the micrometer range.One of several elements of different types that may be present to ensure reproducible positioning can, for example, be designed as an anti-rotation device, which, after the ion optics have been positioned within a mass spectrometer, additionally ensures a firm hold and that the ion optics remain in this position.

[0032] A preferred option is an ion optic according to the invention, wherein the ion optic comprising at least three, preferably six, elements for the reversible attachment of the ion optics and / or comprising at least three elements to ensure reproducible positioning of the ion optics.

[0033] The presence of multiple elements for reversible mounting of the ion optics contributes to a more secure hold. The presence of multiple elements to ensure reproducible positioning of the ion optics increases the reproducibility and accuracy of the ion optics installation.

[0034] A further preferred option is an ion optic according to the invention, wherein i) the elements for reversible mounting of the ion optics and / or ii) the elements for ensuring reproducible positioning of the ion optics each is arranged at an equal distance from each other and / or from a center point of the ion optics.

[0035] Preferably, an ion optic according to the invention has several, preferably identical, elements for reversible attachment of the ion optic as well as several, preferably identical, elements for ensuring reproducible positioning of the ion optic, wherein the elements are each arranged at a regular and equal distance from a center point of the ion optic.

[0036] Preferably, the ion optics have a circular shape and the elements for reversible mounting and for ensuring reproducible positioning of the ion optics are each arranged at a uniform distance around the center of the circle.

[0037] A preferred ion optic according to the invention is one in which the reversible attachment of the ion optic is magnetic.

[0038] A magnetic fastening offers a secure and easy-to-use form of reversible fastening.

[0039] Preferably, the magnets for the reversible attachment of the ion optics are shielded relative to the ion axis.

[0040] It is also preferable to arrange the magnets on the ion optics as far away from the ion channel as possible in order to avoid or at least minimize any influence of the magnets on the ions or the ion beam. In cases where the ion channel is located in the center of the ion optics, the magnets for reversible attachment are therefore preferably arranged at the edge of the ion optics.

[0041] A preferred ion optic according to the invention comprises an element to ensure reproducible positioning of the ion optic, comprising a sphere or a spherical segment (partially recessed in the ion optic), preferably a hemisphere.

[0042] When multiple elements are present to ensure reproducible positioning, preferably all of these elements comprise a (partially recessed) sphere or a spherical segment.

[0043] Preferably, when mounted, the ion optics contact the mounting point, preferably a receiving element for the ion optics, only via the spheres or spherical segments, in order to ensure the most accurate and reproducible positioning of the ion optics. The spheres or spherical segments and their counterparts, typically present at the mounting point for inserting or attaching the spheres or spherical segments, are typically manufactured with greater precision than, for example, the elements for the reversible mounting of the ion optics. Therefore, when the ion optics contact is exclusively via the spheres or spherical segments, higher precision for reproducible positioning can be achieved.

[0044] Preferably, the elements for the reversible mounting of the ion optics are designed such that they do not contact the mounting point for the ion optics. This is preferably achieved by utilizing a magnetic attraction between the ion optics and the mounting point for the reversible mounting, since contact between the magnetically attracted components is not absolutely necessary for magnetic retention of the ion optics at the mounting point. The magnetic attraction required to hold the ion optics can still be sufficiently strong and designed for secure mounting even with a gap between the magnetically attracted components.

[0045] A preferred ion optic according to the invention comprises two, three or more than three electrically conductive components for the targeted manipulation of ions, preferably for the targeted manipulation of an ion beam.

[0046] The electrically conductive components can, in principle, be made of any electrically conductive material. Preferably, electrically conductive components are made of a material selected from the group consisting of stainless steel, nickel-plated aluminum, and brass, or comprise one of these materials.

[0047] During operation, specific electrical voltages or potentials are applied to the electrically conductive components intended for targeted manipulation of the ions, and the movement of the ions is influenced by an interaction with the resulting electric fields.

[0048] A preferred ion optic according to the invention is one in which at least two of the electrically conductive components for the targeted influencing of ions are arranged spatially separated from each other and / or electrically isolated from each other, and preferably all of the electrically conductive components for the targeted influencing of ions are arranged spatially separated from each other and / or electrically isolated from each other.

[0049] The spatial separation and / or electrical isolation of the electrically conductive components for the targeted manipulation of ions is intended to prevent any electrically conductive contact and / or charge equalization between the electrically conductive components. This spatial separation is preferably achieved by placing electrically insulating material between the electrically conductive components. Polyetheretherketone (PEEK), oxide ceramic, or glass ceramic is preferably used as the electrically insulating material.

[0050] A further preferred option is an ion optic according to the invention, wherein Different electrical voltages can be applied to at least two of the electrically conductive components for the targeted manipulation of ions during operation, and / or the elements for the reversible mounting of the ion optics and / or the elements for ensuring reproducible positioning of the ion optics simultaneously serve as contact points for the application of at least two differently adjustable electrical voltages to the ion optics, and / or at least two of the electrically conductive components for the targeted manipulation of ions (preferably all of the components present in the ion optics for the targeted manipulation of ions) can be electrically contacted separately from each other via elements for the reversible mounting of the ion optics and / or via elements for ensuring reproducible positioning of the ion optics.

[0051] In other words, an ion optic according to the invention is preferred, wherein the elements for reversibly mounting the ion optic and / or the elements for ensuring reproducible positioning of the ion optic can be used to apply different electrical voltages to electrically conductive components arranged electrically isolated from one another within the ion optic for the targeted manipulation of ions. For this purpose, a different element for reversible mounting or a different element for ensuring reproducible positioning is used for electrical contacting the electrically conductive components.

[0052] By using the elements for reversible mounting and / or the elements for ensuring reproducible positioning for applying different voltages to the ion optics, the supply of ion optics, which include several different electrical components for the targeted manipulation of ions (such as a shielding electrode and an accelerator electrode), can in principle be carried out exclusively via the elements for reversible mounting and / or the elements for ensuring reproducible positioning, and thus the design of the ion optics can be kept advantageously simple and compact even when supplied with several different voltages.

[0053] A preferred ion optic according to the invention is one in which the elements for ensuring reproducible positioning of the ion optic simultaneously serve as contact points for applying at least two differently adjustable electrical voltages to the ion optic. A further preferred ion optic according to the invention is one in which only the elements for ensuring reproducible positioning of the ion optic serve as contact points for applying at least two differently adjustable electrical voltages to the ion optic.

[0054] The use of only those elements to ensure a reproducible positioning of the ion optics as contact points for applying electrical voltages to the ion optics is also advantageous because preferably only these elements are in contact with the mounting point for the ion optics.

[0055] Part of the invention also includes a set comprising an ion optic according to the invention or preferably according to the invention (as defined above and in the claims), and a receiving element for the ion optic (preferably integrable into a mass spectrometer), wherein the receiving element also comprises (at least) one element for the reversible mounting of the ion optics and (at least) one element for ensuring reproducible positioning of the ion optics, and wherein the elements of the ion optics and the receiving element for reversible mounting, as well as the elements of the ion optics and the receiving element for ensuring reproducible positioning, are each designed to be complementary to each other, and wherein i) by joining the complementary elements of the ion optics and the receiving element for reversible mounting and / or ii) by joining the complementary elements of the ion optics and the receiving element for ensuring reproducible positioning, an electrical contact for applying an electrical voltage (or an electrical potential) to the ion optics (that is, at least to parts of the ion optics) is simultaneously provided.such as, in particular, one or more electrically conductive components for the targeted manipulation of ions).

[0056] It goes without saying that, in accordance with the invention, all elements for reversible fastening and / or all elements for ensuring reproducible positioning, which simultaneously serve as electrical contacts for applying an electrical voltage to the ion optics, are designed to be electrically conductive, i.e., are at least partially made of an electrically conductive material.

[0057] A preferred set according to the invention is one in which, by joining the complementary elements of the ion optics and the receiving element to ensure reproducible positioning, an electrical contact for applying an electrical voltage to the ion optics is simultaneously established. A further preferred set according to the invention is one in which, solely by joining the complementary elements of the ion optics and the receiving element to ensure reproducible positioning, an electrical contact for applying an electrical voltage to the ion optics is established.

[0058] The recording element of the set according to the invention is usually permanently installed in a mass spectrometer.

[0059] A set according to the invention is preferred in which the ion optics and the receiving element each comprise the same number of elements for reversible attachment of the ion optics and for ensuring reproducible positioning of the ion optics, and all of these elements of the ion optics and receiving element are designed to be complementary to each other.

[0060] A set according to the invention is also preferred, wherein the reversible attachment of the ion optics is effected via (magnetically attracting) pairs of magnets, wherein one magnet of each pair is arranged on the ion optics and the other magnet of each pair is arranged on the receiving element.

[0061] A set according to the invention is also preferred, wherein the (at least one) element encompassed by the receiving element is designed as a recess (preferably as a groove or notch) or as an opening to ensure reproducible positioning of the ion optics, into which the complementarily designed element of the ion optics can be inserted in a reproducible position. The recess or opening preferably has a circular shape.

[0062] A further preferred set according to the invention is one in which two rods running parallel to each other are arranged within the recess or opening of the receiving element (which serves to ensure reproducible positioning of the ion optics) and the element encompassed by the ion optics (at least one) is designed as a sphere or spherical segment (preferably as a hemisphere) to ensure reproducible positioning of the ion optics (partially recessed in the ion optics) and the sphere or spherical segment can be attached to the rods located in the recess or opening by assuming a reproducible position.

[0063] The design of the elements to ensure reproducible positioning as a recess or opening with parallel rods and an attachable ball or spherical segment enables, on the one hand, reproducible positioning with high accuracy in the micrometer range and (if the ball or spherical segment and the parallel rods are preferably manufactured from electrically conductive material), on the other hand, excellent electrical contact via the corresponding elements to ensure reproducible positioning.

[0064] A set according to the invention is preferred, wherein the production of an electrical contact i) when joining the complementary elements of the ion optics and the receiving element for reversible attachment and / or ii) when joining the complementary elements of the ion optics and the receiving element to ensure reproducible positioning Additionally, this is done using a movable electrical connecting element, preferably using a spring contact (also known as a pogo pin).

[0065] The use of a movable electrical connecting element also serves to establish a secure electrical contact via the complementary elements of the ion optics and the receiving element for reversible attachment and / or via the complementary elements of the ion optics and the receiving element to ensure reproducible positioning.

[0066] Part of the invention also includes a mass spectrometer, in particular a MALDI-TOF mass spectrometer, comprising an ion optic according to the invention or preferably according to the invention (as defined above and in the claims) and / or a set according to the invention or preferably according to the invention comprising an ion optic and a receiving element for the ion optic (as defined above and in the claims).

[0067] The invention is explained in more detail below with reference to exemplary embodiments and the accompanying figures. The exemplary embodiments given below are intended to describe and explain the invention in more detail without limiting its scope.

[0068] The elements in the accompanying illustrations are not necessarily shown to scale, but are primarily intended to illustrate the principles of the invention (mostly schematically). Corresponding elements in the different views are identified by the same reference numerals. They show:

[0069] Figure 1A : Perspective view of a set according to the invention consisting of an ion optic and a receiving element for the ion optic.

[0070] Figure 1B : A representation of the image rotated by 90° Figure 1A sets shown.

[0071] Figure 2A : Side view of the set shown in Figures 1A and 1B, where the ion optics are attached to the receiving element.

[0072] Figure 2B : Representation of a cross-section of a section of the in Figure 2AThe sets shown further illustrate the arrangement and interaction of the elements for reversible attachment and elements for ensuring reproducible positioning, which are located on both the ion optics and the receiving element and are designed to be complementary to each other.

[0073] Figure 3 : Representation of the ion optics already evident from the preceding illustrations, with a frontal view of the side of the ion optics on which its elements for reversible attachment and its elements for ensuring reproducible positioning are located.

[0074] Figure 4 : Representation of the receiving element already evident from the preceding illustrations, with a frontal view of the side of the receiving element on which its elements for reversible attachment and its elements for ensuring reproducible positioning are located.

[0075] Figures 1A and 1B show, from different perspectives, an example of a set according to the invention, consisting of an ion optic 1 and a receiving element 2 for the ion optic 1. The ion optic 1 and the receiving element 2 each have a circular shape. The ion optic 1 comprises, in its outer region, a first electrically conductive component 13, which serves as a shielding electrode during operation for the targeted manipulation of ions, and, in its inner region, a second electrically conductive component 14, which serves as an accelerator electrode for the targeted manipulation of ions. The accelerator electrode 14 also serves to attract or repel the ions that are typically formed in front of the ion optic 1 during operation and can therefore also be referred to as a retraction electrode. The shielding electrode 13 and the accelerator electrode 14 are each ring-shaped.The accelerating electrode 14 is also designed with multiple stages towards its center. The opening located at the center of the ion optics 1 serves as the entry point for the ions attracted (repelled) and accelerated by the accelerating electrode 14. The shielding electrode 13 and the accelerating electrode 14 are electrically insulated from each other by an electrically insulating material 15 arranged between them, which is designed as a ring made of PEEK.

[0076] On its inner surface, the shielding electrode 13 of the ion optics 1 has three partially recessed spheres 12, which are evenly distributed around the circumference of the shielding electrode 13 and serve as elements to ensure reproducible positioning of the ion optics 1. The shielding electrode 13 also has a total of six magnets 11 on its inner surface, which serve as elements for the reversible attachment of the ion optics 1. The magnets 11 are arranged to the left and right of the partially recessed spheres 12.

[0077] The receiving element 2 for the ion optics 1 has, in comparison to the ion optics, the same number of elements to ensure reproducible positioning and elements for reversible attachment of the ion optics 1, wherein these elements of the receiving element 2 are designed to be complementary to the elements of the ion optics 1 and are distributed on the edge of the receiving element 2 in such a way that all of these complementary elements of the ion optics 1 and receiving element 2 can be precisely aligned when the ion optics 1 is attached to the receiving element 2 and can thus fulfill their function.

[0078] The elements for reversible attachment located on the receiving element 2 also represent magnets 21, wherein a magnetic attraction force acts between the magnets 11 and 21 arranged on the ion optics 1 and the receiving element 2 when a magnet 11 approaches a magnet 21, and the attraction force of all pairs on magnets 11 and 21 is large enough to hold the ion optics 1 firmly on the receiving element 2.

[0079] The elements located on the receiving element 2, which ensure reproducible positioning, are circular openings 22 into which the partially recessed spheres 12 of the ion optics 1 can be inserted precisely until they encounter two rods 221 running parallel to each other in each opening 22. The partially recessed spheres 12 can then align themselves with these rods with high positional accuracy. This design of the elements for ensuring reproducible positioning enables the ion optics 1 to be positioned reproducibly with micrometer accuracy.

[0080] The partially recessed spheres 12 and the rods 221 running parallel to each other in the openings 22 are each made of an electrically conductive material, which enables electrical contacting of the shielding electrode 13 via the contact between the partially recessed spheres 12 and the rods 221 running parallel to each other in the openings 22.

[0081] Figure 2AFigure 1A and Figure 1B show a combination of the set consisting of the ion optics 1 and the receiving element 2 for the ion optics 1. In the illustrated embodiment, when the ion optics 1 is attached to its receiving element 2, contact is established between the partially recessed spheres 12 of the ion optics 1 and the rods 221 running parallel to each other in the openings 22 of the receiving element 2. An electrical voltage can be applied to the shielding electrode 13 of the ion optics via these rods. The magnets 11 and 12 of the ion optics 1 and the receiving element 2 do not make contact when the ion optics 1 is attached to the receiving element 2, as such contact would adversely affect the reproducible positional accuracy with which the ion optics 1 can be attached to the receiving element 2.

[0082] In the Figure 2BThe cross-section shown illustrates how the elements for reversible mounting and the elements for ensuring reproducible positioning of ion optics 1 and receiving element 2 are aligned relative to each other when ion optics 1 is mounted on receiving element 2. For example, the gap between magnets 11 and 12 of ion optics 1 and receiving element 2 is visible. Also visible is the contact between the partially recessed sphere 12 of ion optics 1 and the rods 221 running parallel to each other in the opening 22 of receiving element 2, through which an electrical contact is established. From the cross-section according to Figure 2B A spring contact (pogo pin) is also visible, which is also in contact with the rods 221 and serves to supply power to the rods 221.

[0083] In the illustrated embodiment, a voltage is applied to the accelerating electrode 14 via a separate movable electrical contact (not shown in the figures) which is attached to the receiving element 2 and which comes into contact with the accelerating electrode 14 when the ion optics 1 is attached to the receiving element 2. However, embodiments are also conceivable and encompassed by the present invention in which a voltage is applied to several or all electrodes of an ion optics system via elements for reversible attachment and / or via elements for ensuring reproducible positioning (preferably via elements for ensuring reproducible positioning).

[0084] Figures 3 and 4 show the ion optics 1 and the receiving element 2 individually and from a different perspective. Reference symbol list:

[0085] 1. Ion optics 2. Mounting element for the ion optics 11. Element located on the ion optics for reversible attachment of the ion optics (magnet) 12. Element located on the ion optics to ensure reproducible positioning of the ion optics (partially recessed sphere) 13. First electrically conductive component of the ion optics for targeted manipulation of ions (shielding electrode) 14. Second electrically conductive component of the ion optics for targeted manipulation of ions (acceleration electrode) 15. Electrically insulating material (PEEK) 21. Element located on the mounting element for reversible attachment of the ion optics (magnet) 22. Element located on the mounting element to ensure reproducible positioning of the ion optics (opening for insertion of the partially recessed sphere of the ion optics) 221. Rod inside the element located on the mounting element to ensure reproducible positioning of the ion optics (for adding the partially recessed sphere)(ion optics) 222 Spring contact (pogo pin)

Claims

1. Non-destructively insertable and removable ion optics in a mass spectrometer, comprising: - an element for reversibly mounting the ion optics within the mass spectrometer, and - an element for ensuring reproducible positioning of the ion optics in the mass spectrometer, wherein i) the element for reversibly mounting the ion optics and / or ii) the element for ensuring reproducible positioning of the ion optics simultaneously serves as a contact point for applying an electrical voltage to the ion optics.

2. Ion optics according to claim 1, wherein the ion optics comprises at least three, preferably six, elements for reversible attachment of the ion optics and / or at least three elements for ensuring reproducible positioning of the ion optics.

3. Ion optics according to claim 2, wherein i) the elements for reversible attachment of the ion optics and / or ii) the elements for ensuring reproducible positioning of the ion optics are each arranged at an equal distance from each other and / or from a center point of the ion optics.

4. Ion optics according to one of the preceding claims, wherein the reversible attachment of the ion optics is magnetic.

5. Ion optics according to one of the preceding claims, wherein the element to ensure reproducible positioning of the ion optics comprises a sphere or a spherical segment, preferably a hemisphere.

6. Ion optics according to one of the preceding claims, wherein the ion optics comprises two, three or more than three electrically conductive components for the targeted manipulation of ions.

7. Ion optics according to claim 6, wherein at least two of the electrically conductive components for targeted influencing of ions are arranged spatially separated from each other and / or electrically isolated from each other, wherein preferably all of the electrically conductive components for targeted influencing of ions are arranged spatially separated from each other and / or electrically isolated from each other.

8. Ion optics according to claim 7, wherein different electrical voltages can be applied to at least two of the electrically conductive components for the targeted manipulation of ions during operation, and / or the elements for the reversible mounting of the ion optics and / or the elements for ensuring a reproducible positioning of the ion optics simultaneously serve as contact points for the application of at least two differently adjustable electrical voltages to the ion optics, and / or at least two of the electrically conductive components for the targeted manipulation of ions can be electrically contacted separately from one another via elements for the reversible mounting of the ion optics and / or via elements for ensuring a reproducible positioning of the ion optics.

9. Set comprising - an ion optic as defined in any one of claims 1 to 8, and - a receiving element for the ion optic, wherein the receiving element also comprises an element for reversibly mounting the ion optic and an element for ensuring reproducible positioning of the ion optic, and wherein the elements of the ion optic and the receiving element for reversible mounting as well as the elements of the ion optic and the receiving element for ensuring reproducible positioning are each designed to be complementary to each other, and wherein i) by joining the complementary elements of the ion optic and the receiving element for reversible mounting and / or ii) by joining the complementary elements of the ion optic and the receiving element for ensuring reproducible positioning an electrical contact for applying an electrical voltage to the ion optic is simultaneously established.

10. Set according to claim 9, wherein the ion optics and the receiving element each comprise the same number of elements for reversibly attaching the ion optics and ensuring reproducible positioning of the ion optics, and all of these elements of the ion optics and receiving element are designed to be complementary to each other.

11. Set according to claim 9 or 10, wherein the reversible attachment of the ion optics is effected via pairs of magnets, wherein one magnet of each pair is arranged on the ion optics and the other magnet of each pair is arranged on the receiving element.

12. Set according to one of claims 9 to 11, wherein the element encompassed by the receiving element is designed as a recess or as an opening to ensure reproducible positioning of the ion optics, into which the complementarily designed element of the ion optics can be inserted assuming a reproducible position.

13. Set according to claim 12, wherein two rods running parallel to each other are arranged within the recess or opening of the receiving element and the element encompassed by the ion optics is designed as a sphere or spherical segment to ensure reproducible positioning of the ion optics and the sphere or spherical segment can be attached to the rods located in the recess or opening by assuming a reproducible position.

14. Set according to one of claims 9 to 13, wherein the production of an electrical contact i) when joining the complementary elements of ion optics and receiving element for reversible attachment and / or ii) when joining the complementary elements of ion optics and receiving element to ensure reproducible positioning is additionally carried out using a movable electrical connecting element, preferably using a spring contact.

15. Mass spectrometer, in particular MALDI-TOF mass spectrometer, comprising an ion optic as defined in any one of claims 1 to 8 and / or a set comprising an ion optic and a receiving element for the ion optic as defined in any one of claims 9 to 14.

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