Images for inspecting light-emitting devices

Abstract

The images relating to the present design are used to inspect a light-emitting device under analysis, and are images for identifying light-emitting regions within periodically formed light-emitting chip regions on the light-emitting device. The "Image Diagram" displays light-emitting chip region indicators surrounding each light-emitting chip region periodically formed on the light-emitting device under analysis. From this state, by selecting a predetermined operation unit, the display changes to "Image Diagram 1 of the changed state," which shows one light-emitting chip region indicator. Furthermore, as shown in "Image Diagram 2 of the changed state," it is possible to set a light-emitting region indicator that surrounds the light-emitting region within the light-emitting chip region from the light-emitting region setting unit, which displays the area surrounded by the light-emitting chip region indicator. As a result, the same light-emitting region is recognized in each light-emitting chip region indicator, so that only each light-emitting region can be targeted for analysis.

Images