Water part

Abstract

To provide a water part member that exhibits excellent anti-fouling property under actual use environment, and exhibits also excellent small object placement stability.SOLUTION: A placement portion 12 includes a substrate and a functional layer formed on a surface of the substrate, the substrate is measured in accordance with JIS-B0633 (2001), the arithmetic average roughness Ra of the surface is less than 0.1 μm, and the surface contains silicon atoms and oxygen atoms, the functional layer includes a perfluoropolyether chain, and the surface of the placement portion 12 has a contact angle of the pseudo-sewage of 104° or more, which is ion-exchanged water containing 2 ppm of sodium stearate and 1 ppm of tristearin, and a ratio of the number of oxygen atoms in a perfluoropolyether chain to the number of carbon atoms constituting a main chain of the perfluoropolyether obtained by peak separation of a spectrum obtained by performing X-ray photoelectron spectroscopy (XPS) of the surface of the placement portion 12 is less than 0.6.SELECTED DRAWING: Figure 1

Description

[Technical field]

[0001] The present invention relates to a water-related component having both good antifouling properties and good stability for placing small items on it. [Background technology]

[0002] Since wet-area components (wet-area components) are used in an environment where water is present, water is likely to adhere to their surfaces. When the water that adheres to the surface dries, limescale containing silica and calcium, which are components contained in tap water, is formed on the surface of the wet-area components. In addition, dirt such as proteins, sebum, microorganisms such as mold, and metal soap is likely to adhere to the surface of the wet-area components. For example, in a washbasin, which is an example of a wet-area component, not only limescale but also human-derived organic dirt such as sebum is likely to adhere to the surface because actions such as hand washing are performed. Furthermore, when removing dirt and limescale that have adhered to the surface, a strong alkaline or strong acid detergent is used, the force required to wipe it off is strong, and the number of times it is wiped off is increased. In other words, wet-area components are used in a high-stress environment. Therefore, in recent years, a technology has been proposed in which a compound containing a perfluoropolyether chain, which has excellent adhesion and durability to wet-area components and can be treated to make the surface water- and oil-repellent to prevent dirt from adhering, is applied to the surface of the component.

[0003] For example, JP 2011-021088 A (Patent Document 1) describes forming an antifouling layer by applying an antifouling paint containing a base agent made of perfluoropolyether and a solvent containing an alkane of a specific average molecular weight to the surface of sanitary ware having a glaze layer. According to Patent Document 1, perfluoropolyether contains a CF3 side chain (paragraphs 0013-0014), and applying an antifouling paint containing this perfluoropolyether and an alkane of a specific average molecular weight forms an antifouling layer with excellent smoothness (paragraph 0016), which is said to improve both the antifouling properties based on water scale and the antifouling properties based on oil.

[0004] In addition, JP 2016-204656 A (Patent Document 2) describes that an article that has been surface-treated with a surface treatment agent containing a perfluoropolyether group-containing polymer-modified silane of a specific structure has excellent water and oil repellency and abrasion resistance.

[0005] In addition, JP 2022-059417 A (Patent Document 3) describes that an article having a layer formed by applying and curing a coating agent containing a side-chain perfluoropolyether group-containing polymer having a CF3 side chain and a linear perfluoropolyether group-containing polymer without a side chain in a predetermined ratio to a chemically strengthened glass substrate has excellent water and oil repellency and moderate slipperiness (dynamic friction coefficient).

[0006] In addition, Japanese Patent Application Laid-Open No. 2008-308628 (Patent Document 4) describes that the cured coating film of a fluorine-containing coating composition in which two types of perfluoropolyether-polysiloxane copolymer modified silane are mixed has a low dynamic friction coefficient, and the increase in the dynamic friction coefficient before and after ultrasonic cleaning is suppressed (a low dynamic friction surface can be maintained). [Prior art documents] [Patent documents]

[0007] [Patent Document 1] JP 2011-021088 A [Patent Document 2] JP 2016-204656 A [Patent Document 3] Patent Publication No. 2022-059417 [Patent Document 4] JP 2008-308628 A Summary of the Invention [Problem to be solved by the invention]

[0008] The inventors have discovered that by applying a specific perfluoropolyether chain to the surface of a substrate of a wet area component, due to the flexibility or elasticity of the perfluoropolyether chain, a wet area component can be obtained that exhibits good anti-fouling properties in the environment in which the wet area component is actually used (hereinafter also referred to as the "actual use environment"), for example, in an environment in which a mixture of tap water and organic dirt such as sebum comes into contact with the surface of the wet area component. By the way, some types of water-related components have a portion (a placement portion) on which small items to be used during use may be placed. The present inventors have found a new problem that when the surface of the substrate of such a placement portion is smooth, if the above-mentioned specific perfluoropolyether chain is applied to the surface of the substrate of the placement portion to impart the above-mentioned good antifouling properties to the placement portion, small items may slide off by themselves and, for example, fall into the water receiving portion. That is, the present inventors have found a new problem that the flexibility or elasticity of the specific perfluoropolyether chain that enables the exertion of good antifouling properties may hinder the stability of placing small items on the placement portion. The present inventors have now discovered a new configuration for a water-related component having a mounting part that realizes both good antifouling properties and good stability for placing small items in an actual usage environment. That is, they have discovered that by applying a more specific perfluoropolyether chain to the surface of a substrate having a smooth surface, a water-related component having a mounting part that exhibits good antifouling properties in an actual usage environment and also exhibits good stability for placing small items can be obtained. The present invention is based on these findings. [Means for solving the problem]

[0009] The water-related component according to the present invention is A water receiving section and a placing section are provided, The mounting portion includes a base material and a functional layer formed on a surface of the base material, The substrate has a surface having an arithmetic mean roughness Ra of less than 0.1 μm, as measured in accordance with JIS-B0633(2001) using a stylus surface roughness measuring device in accordance with JIS-B0651(2001); The substrate contains silicon atoms and oxygen atoms on its surface, The functional layer includes a perfluoropolyether chain, the contact angle of the surface of the placement portion with simulated wastewater, which is ion-exchanged water containing 2 ppm sodium stearate and 1 ppm tristearin, is 104° or more; The ratio of the number of oxygen atoms in the perfluoropolyether chain to the number of carbon atoms constituting the main chain of the perfluoropolyether chain (hereinafter referred to as the "O / C ratio"), which is obtained by peak separation of a spectrum obtained by measuring the surface of the mounting portion by X-ray photoelectron spectroscopy (XPS), is less than 0.6. Effect of the Invention

[0010] According to the present invention, by applying a specific perfluoropolyether chain to the surface of a substrate having a smooth surface, a water-related component is provided which exhibits good anti-fouling properties in an actual usage environment and is equipped with a mounting section which also exhibits good stability for placing small items. [Brief description of the drawings]

[0011] [Figure 1] 1 shows an example of a water-related component according to the present invention. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0012] Water-related materials In the present invention, the term "wet area member" refers to a member used in wet areas. The term "wet area" refers to a place or space where water, preferably water for daily use, more preferably tap water, is used in public facilities such as stations, parks, department stores, and homes, and examples of such places or spaces include washrooms, kitchens, toilets, and bathrooms. More specifically, a wet-related component is a component on whose surface water is applied or a component capable of temporarily or permanently storing water. Specific examples of wet-related components include a wash basin, a hand washing basin, a kitchen sink, etc. A washbasin is an item that is mainly installed in a washroom and is used to wash hands, face, clothes, small items, etc. with water or hot water supplied from a faucet, etc. A hand washing machine is an item that is mainly installed in a toilet and can be used to wash hands with water or hot water supplied from a faucet, etc. A kitchen sink is an item that is installed in a kitchen and is used to wash food and dishes and to cook with water or hot water supplied from a faucet, etc.

[0013] The wet-room component according to the present invention comprises at least a water receiving portion and a mounting portion. The "water receiving portion" is a portion on whose surface water can be splashed and which can store water temporarily or permanently. The "mounting portion" is a portion on which small items can be placed. Water can also be splashed onto the surface of the mounting portion. "Small items" refers to all items that can be used in conjunction with the use of the wet-room component. For example, if the wet-room component is a washbasin, small items refer to items used in the act of washing the face, such as hand soap, toothpaste, and cups.

[0014] The water receiving portion corresponds to a so-called bowl portion in a washbasin or hand washing basin, and corresponds to the kitchen sink itself in a kitchen sink.

[0015] As described above, the placement portion is a component on which small items can be placed, and in the present invention, the position, shape, etc. of the placement portion are not limited as long as the placement portion is capable of placing small items. For example, the mounting portion may be provided adjacent to or in the vicinity of the water receiving portion. Also, the mounting portion may be provided at a higher or lower position than the water receiving portion. Also, the mounting portion may be provided at a higher position than the drainage outlet of the water receiving portion. The placement section may be provided horizontally or inclined within a range in which small items can be placed. For example, the placement section may be provided with an inclination of less than 4 degrees so as to descend toward the water receiving section. The inclination angle can be determined, for example, by averaging 10 points on the midline between the side of the placement section closest to the water receiving section and the side of the placement section farthest from the water receiving section.

[0016] It should be noted that even if the water receiving part and the mounting part are provided at a location separate from each other, the present invention does not exclude such an embodiment, so long as the two are used in conjunction with the use of the water-related component and can be considered as a combination having functional or structural unity. For example, even if the water receiving part and the mounting part are provided at locations separated by a vertical surface or a wall, etc., if it is generally considered that the two are used together or have the possibility of being used together in conjunction with the normal use of the water-related component, the embodiment is naturally included in the scope of the present invention.

[0017] Fig. 1 shows one embodiment of a washbasin as an example of a bathroom component according to the present invention. In Fig. 1, the washbasin 1 comprises a water receiving portion 11 and a mounting portion 12. The mounting portion 12 comprises a substrate and a functional layer formed on the surface of the substrate. The functional layer contains a perfluoropolyether chain.

[0018] The mounting portion of the water-related component according to the present invention will be described in further detail below.

[0019] Placement section The mounting portion of the water-related component according to the present invention includes at least a base material and a functional layer formed on the surface of the base material.

[0020] Base material In the present invention, the substrate is characterized in that it contains silicon atoms and oxygen atoms on its surface. Such substrates are preferably ceramics, enamel, or plastics with a silica coating. Examples of ceramics include sanitary ware and ceramic plates that form washbasins and hand basins. Examples of enamel include steel plate enamel and cast iron enamel. Examples of plastics with a silica coating include composite materials formed by coating the surface of a plastic with a silica coating precursor made of a hydrolyzable silicon compound such as alkoxysilane, chlorosilane, or polysilazane, and composite materials in which a silica coating is formed on the surface of a plastic by thermal spraying.

[0021] In the present invention, the substrate is characterized in that its surface has an arithmetic mean roughness Ra of less than 0.1 μm, measured in accordance with JIS-B0633 (2001) using a stylus-type surface roughness measuring device in accordance with JIS-B0651 (2001). That is, in the present invention, the substrate has a smooth surface. The arithmetic surface roughness Ra is the average value of measurements taken at five random points on the surface of the substrate, excluding an area corresponding to an area within 1 cm from the outer periphery of the mounting portion and an area within 1 cm from the faucet fitting mounting hole.

[0022] In the present invention, a primer layer may be provided on the surface of the substrate. By providing a primer layer, it is possible to form perfluoropolyether chains at a high density on the surface of the substrate. The primer layer is preferably one that does not affect the Ra of the surface of the substrate, and its thickness is preferably on the order of nanometers. The primer layer is preferably a layer containing a metal oxide such as SiO2, TiO2, or Al2O3 that is generated by hydroxyl groups present on the surface.

[0023] Functional Layer The functional layer includes a specific perfluoropolyether chain. The specific perfluoropolyether chain is a chain that includes, in a repeating structure, a carbon atom to which a fluorine atom is bonded and an ether bond in which the carbon atom is bonded via an oxygen atom, and for example, -[(CF2) xIt may be a straight chain containing a repeating unit represented by -O]- (x is a natural number), or may have a branched chain (side chain) containing a repeating unit represented by -[CF(CF3)CF2-O]-. These perfluoropolyether chains have both not too high flexibility and moderate friction. Specifically, the specific perfluoropolyether chain may be a straight chain or side chain in which one or more ether bonds, which are repeating units such as (CF2)-O, (C2F4)-O, (C3F6)-O, (C4F8)-O, and CF(CF3)CF2-O, are randomly bonded. These perfluoropolyether chains may be both not too high flexibility and moderate friction. In addition, the functional layer may contain multiple types of perfluoropolyether chains with different structures. The linear perfluoropolyether chain or the branched perfluoropolyether chain described above has not too high flexibility and appropriate friction, and therefore has appropriate slip and friction properties, so that the placement part of the present invention can exhibit good antifouling properties and good stability for placing small items.

[0024] As described above, the substrate in the present invention has a smooth surface. A smooth surface has high slipperiness. When dirt comes into contact with such a highly slippery surface, the dirt tends to be removed naturally or, for example, by simple cleaning due to the slipperiness of the surface. On the other hand, when a small object is placed on such a highly slippery surface, the small object becomes more likely to slide on the surface. When water is present on the highly slippery surface, the slipperiness becomes even higher, and the small object becomes even more likely to slide on the surface. In other words, applying a highly flexible perfluoropolyether chain to the surface of a substrate having a smooth surface is equivalent to providing a highly slippery perfluoropolyether layer on the surface of a highly slippery substrate, and as a result, while good antifouling properties are obtained, the stability for placing small objects may be impaired. In other words, in the present invention having a substrate having a smooth surface, antifouling properties and stability for placing small objects are in a trade-off relationship with each other. In the present invention, by providing a functional layer containing a specific perfluoropolyether chain on the surface of a substrate having a smooth surface, it is possible to achieve both good antifouling properties and good stability for placing small items on the substrate. In the present invention, the functional layer preferably does not affect the surface roughness Ra of the substrate. For example, the thickness of the functional layer is preferably on the nano-order.

[0025] Specific perfluoropolyether chains In the present invention, the specific linear perfluoropolyether chain is preferably one generally represented by the following formula 1. [ka] Here, p, q, r, and s are the numbers of repeating units, i.e., integers of 0 or more, and the sum of p, q, r, and s is 3 to 200. The repeating units in the formula may be randomly bonded to form a chain, or polymer chains each made of the repeating units may be bonded to each other. f1 and R f2 each represents an organic chain containing carbon atoms in which a hydrogen atom is substituted with a fluorine atom. The repeating unit may be composed only of a straight chain, may be composed only of a side chain, or may include both a straight chain and a side chain.

[0026] As such a perfluoropolyether chain, preferred examples include perfluoropolyether chains represented by the following formulas 2 to 5. [ka] (wherein the average value of l is 22.9), [ka] (wherein the average value of l is 23.2), [ka] (wherein the average value of l is 18), [ka] (wherein the average value of l is 23.4),

[0027] In the present invention, the specific perfluoropolyether chain having a branched chain is preferably, for example, one represented by the following formula 6. [ka] (wherein the average value of l is 24). In a specific perfluoropolyether chain having a branched chain (side chain), it is believed that both the main chain and the side chain exhibit appropriate flexibility and frictional properties, with the side chain contributing relatively more to frictional properties.

[0028] The specific perfluoropolyether chain of the present invention can have both not too high flexibility and moderate friction.Therefore, the specific perfluoropolyether chain can be applied to the surface of the substrate having a smooth surface, and can maximize and specifically exhibit its flexibility and friction.As a result, the placement part of the present invention can exhibit both good antifouling property and good small item placement stability.

[0029] The ratio of the number of oxygen atoms in the perfluoropolyether chain to the number of carbon atoms constituting the main chain of the perfluoropolyether chain In the present invention, the perfluoropolyether chain has both not too high flexibility and moderate friction, that is, the balance between the two is good, and this can be quantitatively expressed using the ratio of the number of oxygen atoms in the perfluoropolyether chain to the number of carbon atoms constituting the main chain of the perfluoropolyether chain (hereinafter referred to as "O / C ratio"), which is obtained by peak separation of the spectrum obtained by measuring the surface of the mounting part by X-ray photoelectron spectroscopy (XPS). In the present invention, the O / C ratio of a specific perfluoropolyether chain is less than 0.6. By providing a functional layer containing a perfluoropolyether chain having an O / C ratio of less than 0.6 on the surface of a substrate having a smooth surface, the mounting part in the present invention can exhibit both good antifouling properties and good stability for mounting small items. The O / C ratio is preferably less than 0.6, and is more than 0 and less than 0.5. The calculation method of the O / C ratio will be described later.

[0030] The presence of perfluoropolyether chains in the functional layer, i.e., the surface of the mounting portion, can be identified, for example, by the following analytical method.

[0031] The presence of perfluoropolyether chains in the functional layer, i.e., the surface of the mounting portion, can be identified by X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (TOF-SIMS).

[0032] First, the surface of the mounting part is evaluated by X-ray photoelectron spectroscopy (XPS) to obtain C1s and F1s spectra. In this spectrum, a peak (peak position: 687 eV to 690 eV) of fluorine atoms having a C-F bond in F1s is obtained, and a peak (peak position: 289 eV to 297 eV) of carbon atoms having a C-F bond in C1s is obtained, so that it is found that the surface of the mounting part contains a C-F bond. Examples of compounds containing a C-F bond include perfluoropolyether chain-containing compounds and fluoroalkylsilane compounds. The XPS measurement is performed by "Acquisition of XPS spectrum" using the "XPS measurement conditions" described later.

[0033] The surface of the mounting area is then evaluated using TOF-SIMS. TOF.SIMS5 (ION-TOF) can be used as the TOF-SIMS device. TOF-SIMS is an analytical technique that detects secondary ions generated from the sample surface when the sample surface is irradiated with pulsed primary ions emitted from a primary ion source. The type of secondary ions generated and the detection sensitivity vary depending on the composition and chemical structure of the sample surface. By visualizing the distribution of various secondary ions on the sample surface, the distribution of the composition and chemical structure on the sample surface can be estimated.

[0034] By evaluating the surface of the mounting part using TOF-SIMS under the following measurement conditions, a secondary ion mass spectrum can be obtained, with the horizontal axis representing the mass number (m / z, i.e., the value obtained by dividing the mass m by the charge z) and the vertical axis representing the secondary ion intensity (number of counts). [TOF-SIMS measurement conditions] Primary ion source: Bi 3+ Primary ion acceleration voltage: 30 keV Primary ion current value: 0.2pA (at 10kHz) Primary ion punching: Yes Measurement range: 500μm×500μm Cycle time: 400μs Number of pixels: 128 x 128 pixels Vacuum degree: 9 -8 hPa Secondary ion: Negative Ion Neutralization gun: Yes

[0035] From the C1s and F1s peaks obtained by XPS, it can be determined whether or not the surface of the mounting part contains CF bonds. If it is found by XPS that the surface of the mounting part contains CF bonds, it is possible to confirm that the surface of the mounting part contains perfluoropolyether chains from the secondary ion mass spectrum obtained by TOF-SIMS under the above measurement conditions. Specifically, if there are fragments that appear periodically at equal mass intervals on the high mass side of the m / z of several hundred or more in the secondary ion mass spectrum obtained by TOF-SIMS, the molecular formula of the repeating unit can be inferred from the mass intervals. A similar inference can be made when there are multiple repeating units. From the presence of CF bonds obtained by XPS and the degree of agreement of the exact mass and isotopes obtained by TOF-SIMS, it can be determined that the molecular formula of the repeating unit is C x F y O z When there is a repeating unit identified as (x, y, z are integers equal to or greater than 1, where y=2x), it is found that the repeating unit contains perfluoroether. In addition, the total number of repeating units can be determined from fragments that appear periodically at equal mass intervals. From the above TOF-SIMS analysis, it is found that when the repeating unit contains perfluoroether and the total number of repeating units is at least 3, the surface of the mounting portion contains perfluoropolyether chains 3.

[0036] The perfluoropolyether chain is preferably bonded to the substrate via a Si atom. The perfluoropolyether chain is more preferably bonded to the substrate via a plurality of Si atoms. This improves the adhesion between the perfluoropolyether chain and the substrate. The Si atom is preferably bonded to the end of the perfluoropolyether chain. It is more preferable that the Si atom is bonded to the end of the perfluoropolyether chain. The perfluoropolyether chain may have Si atoms bonded to both ends, or may have Si atoms bonded to one end of the perfluoropolyether chain. The Si atom bonded to the perfluoropolyether chain may be derived from a reactive silyl group bonded to the perfluoropolyether chain contained in the raw material, or may be a Si atom generated by activating the surface of the substrate.

[0037] The hydroxyl group or hydrolyzable group contained in the reactive silyl group preferably functions as a bonding point with the substrate. That is, the hydroxyl group contained in the reactive silyl group, or the hydroxyl group obtained by hydrolysis of the hydrolyzable group, or the hydrogen atom contained in the hydroxyl group undergoes dehydration condensation with a functional group (such as a hydrogen atom or a hydroxyl group) present on the surface of the substrate. This allows the perfluoropolyether chain to bond with the surface of the substrate. The perfluoropolyether chain is preferably bonded to the substrate via a Si atom. In the present invention, the reactive silyl group preferably contains many hydroxyl groups or hydrolyzable groups. This improves the adhesion between the perfluoropolyether chain and the substrate.

[0038] The fact that the perfluoropolyether chain is bonded to the substrate via a silicon atom has been confirmed by, for example, surface-enhanced Raman spectroscopy (SERS) and 19 It can be identified by methods such as Si-NMR and infrared spectroscopy (IR).

[0039] XPS measurement method for the surface of the mounting part In the present invention, the O / C ratio is obtained by measuring the surface of the mounting portion by X-ray photoelectron spectroscopy (XPS). Before performing the XPS measurement, it is preferable to clean the surface of the mounting portion using a neutral detergent and a sponge, and then thoroughly rinse it with ultrapure water.

[0040] <Acquisition of XPS Spectrum> As the XPS apparatus, K-ALPHA (manufactured by thermo scientific) is used, and spectra of C1s, F1s, O1s, and Si2p can be obtained by performing XPS measurement under the following XPS measurement conditions. When measuring a plurality of samples together, in order to avoid decomposition of the C-F bond due to X-ray irradiation, it is preferable to perform XPS measurement with each sample separated by at least 1 cm or more. Note that XPS is a technique for irradiating the sample surface with soft X-rays, capturing the photoelectrons emitted due to ionization of the sample surface, and performing energy analysis. Since the obtained spectrum shows the photoelectron peaks emitted from each electron orbit, the obtained photoelectron peaks are denoted by the element symbol and the electron orbit (for example, the photoelectron peak obtained from the 1s orbit of carbon is denoted as "C1s").

[0041] [XPS Measurement Conditions] X-ray conditions: Monochromatized AlKα ray, 30 W, 12 kV Analysis area: 200 μmφ Neutralization gun conditions: 0.1 V, 200 μA Photoelectron extraction angle: 90° Time Per Step: 50 ms Sweep: 5 times Pass energy: 55 eV Analytical element (energy range, step size): C1s (278 - 308 eV, 0.01 eV), F1s (679 - 699 eV, 0.03 eV), O1s (523 - 543 eV, 0.03 eV)

[0042] In the spectrum obtained by XPS measurement of the surface of the mounting part, the type of bond state of the carbon atom contained in the perfluoropolyether chain (hereinafter, sometimes simply abbreviated as "bond type") is identified. There are seven bond types, (1) to (7), as shown in Table 1 below. Table 1 shows the bond energies of C1s for each of the bond types (1) to (7). However, the bond energy values ​​of C1s for the bond types (1) and (7) are the literature values ​​listed in NIST Standard Reference Database 20, Version 4.1 (https: / / srdata.nist.gov / xps / ). The bond energy values ​​of C1s listed in the above database are shifted and set up with the bond energy value of C1s of CC bond being 284.8 eV. Therefore, in order to match the conditions of this XPS measurement, the bond energy values ​​of C1s of organic compounds containing bond types (1) and (7) are corrected using the bond energy value of Si2p derived from the substrate, which is 103.2 eV, which is the same condition as the XPS measurement conditions.

[0043] [Table 1]

[0044] <Peak separation> The obtained spectrum is subjected to peak separation using data analysis software Avantage (Version 5, Thermo Scientific). Peak separation refers to performing waveform separation on the basis of the detected peaks in the overall waveform of the obtained spectrum, and identifying the bonding state corresponding to each obtained waveform. This peak separation makes it possible to calculate the ratio of different bonding states contained in the perfluoropolyether chain, even though it is the same element (carbon atom in the present invention). The details of the peak separation method are described below. First, in the obtained Si2p spectrum, the peak positions in the entire binding energy range of the measured C1s, F1s, O1s, and Si2p are corrected so that the Si2p binding energy of the peak originating from the substrate is 103.2 eV. In this state, peak separation is performed on the photoelectron spectra of the bond types (1) to (7) present in the C1s spectrum. A specific method for C1s peak separation is described below. First, in the range of 278 eV (start point) to 300 eV (end point) in the measurement range of C1s, the background of the peak is removed by the Shirley method. However, for the start point and end point, the average value of the intensity in the range of ±0.25 eV with each point as the median is used as the background intensity at that point. For example, at the start point of C1s at 278 eV, the average value of the intensity in the range of ±0.25 eV of the median value of 278 eV, that is, the range of 277.75 eV to 278.25 eV, is used as the background intensity at the start point. Then, the peak at 285 eV in the binding energy of C1s is used as the CC bond or CH bond, the peak at 286 eV in the binding energy of C1s is used as the CO bond, the peaks at the binding energy of C1s for the bond types (1) to (7) listed in Table 1 are used as the respective bond types, and the peak at 296.1 ±1.0 eV in the binding energy of C1s is used as the K2p 1 / 2 and add peaks. Other peaks proposed by the software are also added as necessary. The peak shape of the added peaks should follow the Gauss-Lorentz distribution. Then, fitting is performed using the peak fitting conditions below to obtain a spectrum for each bond type. If the fitting result does not meet the fitting completion criteria below, one peak is added at the position of the C1s binding energy that is the maximum among the positive maxima in the second derivative spectrum displayed on the screen, and fitting is performed again using the peak fitting conditions below. This operation is performed until the fitting completion criteria below are met, and fitting is then terminated. Next, K2p in the range of 296.1±1.0 eV 1 / 2If the peak of K is confirmed, the effect of the potassium peak is removed by the following procedure. First, the K2p peak determined by the above fitting is 1 / 2 The binding energy, peak height and full width at half maximum (FWHM) of the peak are specified on the software. 3 / 2 The binding energy of K2p 1 / 2 The binding energy of K2p is set to 2.8 eV smaller than the binding energy of 3 / 2 The half-width of K2p 1 / 2 Specify the value in the software as being equal to K2p 3 / 2 The peak area of ​​K2p 1 / 2 Adjust the peak height on the software so that it is 1.95 to 2.05 times the peak area of ​​the sample. In addition, the bond energies of the peaks of bond types (3) and (4) are close to each other, and it may be difficult to distinguish and assign them to each peak. The bond type (3) peak in the perfluoropolyether chain is a peak derived from the end or side chain of the perfluoropolyether chain. The (3) peak derived from the end has a very small presence rate compared to the main chain, so it can be ignored. In the case of the (3) peak derived from the side chain, the (3) peak and the (6) peak theoretically exist in a 1:1 ratio due to the structure of the perfluoropolyether chain. Therefore, when the (6) peak is confirmed, the (3) peak is assigned according to the following procedure. First, the values ​​of the bond energy, peak height, and full width at half maximum (FWHM) of the (6) peak determined by the above fitting are specified on the software. At this time, the bond energy of the (3) peak is set to 293.9 eV, and the peak height and full width at half maximum are set to be equal to those of the (6) peak on the software. Then, fitting is performed again using the following peak fitting conditions to take into account the potassium peak, and peaks (3) and (4) are accurately distinguished to obtain spectra for each bond type. This completes the XPS peak separation. [Peak fitting conditions] Fitting Algorithm:Powell Maximum Iterations: 500 Convergence: 1e-05 Gauss-Lorentz Mix: Product [Fitting Completion Criterion] Normalised Chi Square ≦ 10.0

[0045] [Calculation of the Composition Ratio of the Bond Types of Carbon Atoms Contained in the Perfluoropolyether Chain] From the spectra of the bond types (1) to (7) identified by peak separation of XPS, the composition ratios of the bond types (1) to (7) are calculated using data analysis software Avantage (Version 5, manufactured by Thermo Scientific). The ratio of the peak area intensity of each bond type (1) to (7) to the total peak area intensity (Area Intensity) of the spectra of each bond type (1) to (7) obtained by peak separation is defined as the composition ratio in the perfluoropolyether chain of each bond type (1) to (7), and is calculated in at% units.

[0046] [Calculation of O / C Ratio] From the composition ratios of the bond types (1) to (7) obtained by peak separation, the O / C ratio contained in the perfluoropolyether chain is obtained. Since the number of carbon atoms constituting the main chain of the perfluoropolyether chain and the number of oxygen atoms in the perfluoropolyether chain cannot be directly obtained from the calculated composition ratios of the bond types (1) to (7), the O / C ratio is calculated by the following method. Assume that the number of carbon atoms constituting the main chain of the perfluoropolyether chain is 100, and the composition ratios of the carbon atoms of each of the bond types (1), (2), (4), (5), (6), and (7) are regarded as the number of carbon atoms as they are. For bond type (3), since it is a bond derived from the side chain of the perfluoropolyether chain, it is not counted as a carbon atom constituting the main chain. Since the types of atoms bonded to each of the bond types (1), (2), (4), (5), (6), and (7) are fixed, the number of oxygen atoms when the number of carbon atoms constituting the main chain of the perfluoropolyether chain is 100 can be obtained. Thereby, the O / C ratio can be obtained.

[0047] For example, when (3), (4), and (6) are detected as the bond types contained in the perfluoropolyether chain represented by the above formula (6) and their composition ratios are 30.8, 35.4, and 33.8 at %, respectively, under the following conditions: Regarding bond type (3), since it is a bond derived from the side chain of the perfluoropolyether chain, it is not counted as a carbon atom constituting the main chain. If a carbon atom is bonded to the central atom, this carbon atom is not counted in the number of carbon atoms. If an O is bonded to the carbon atom of the central atom, this O is counted as 1 / 2. According to the above, the number of carbon atoms is 35.4 for the bond type (4) and 33.8 for the bond type (6), totaling 69.2, and the number of oxygen atoms is 35.4 x 1 x 1 / 2 for the bond type (4) and 33.8 x 1 x 1 / 2 for the bond type (6), totaling 34.6. Therefore, the O / C ratio is calculated as 0.50. The O / C ratio of the present invention is calculated by rounding off the calculated O / C ratio to one decimal place.

[0048] In the present invention, the perfluoropolyether chain contained in the functional layer may contain two or more types of perfluoropolyether chains, or may contain a single type of perfluoropolyether chain.

[0049] In the present invention, the functional layer may contain not only perfluoropolyether chains but also fluoroalkyl chains, but in order to obtain sufficient antifouling properties and stability for placing small items on the functional layer, the content is preferably low.

[0050] Characteristics of the placement section Contact angle of simulated dirty water on the surface of the support In the present invention, the antifouling property of the support portion can be quantitatively expressed by using as an index the contact angle, on the surface of the support portion, of simulated polluted water, which is ion-exchanged water containing 2 ppm of sodium stearate and 1 ppm of tristearin. As described in the above-mentioned Patent Documents 2 and 3, the antifouling properties of surface-treated articles are often expressed in terms of water repellency and oil repellency. However, as already explained, the main dirt adhering to the surface of wet-related parts is water stain components and human-derived organic dirt components such as sebum. The inventors have found that, since these components come into contact with the surface of wet-related parts in a mixed state in an environment in which wet-related parts are actually used, it is useful to evaluate the repellency using test water (pseudo-polluted water) that simulates a state in which organic dirt components are mixed in water, rather than evaluating the water repellency and oil repellency separately, in order to accurately evaluate the antifouling properties of wet-related parts in an actual use environment. It has also been confirmed that ion-exchanged water containing 2 ppm sodium stearate and 1 ppm tristearin can be suitably used as the pseudo-polluted water. The mounting part in the present invention is characterized in that the contact angle of simulated wastewater on its surface is 104° or more. The contact angle is the average value of five randomly measured points in an area excluding an area within 1 cm from the outer periphery of the mounting part and an area within 1 cm from the faucet fitting mounting hole. In the present invention, by providing the functional layer containing the specific perfluoropolyether chain described above on the substrate surface, a mounting part capable of exhibiting high antifouling properties in an actual usage environment can be obtained.

[0051] Coefficient of kinetic friction of the surface of the support In the present invention, the stability of the placement of small items on the placement part is measured by a linear sliding measurement method, with a load of 25 g / cm 2 The measurement is performed under the conditions of a moving speed of 500 mm / min, a range of 100%, a moving mode of single mode, a measuring length of 20 mm, and a nonwoven fabric as a slider. The coefficient of dynamic friction of the surface can be quantitatively expressed as an index. In the present invention, the coefficient of dynamic friction of the surface of the mounting part is preferably more than 0.11. The coefficient of dynamic friction is the average value of measurements taken at five random points in an area excluding an area within 1 cm from the outer periphery of the mounting part and an area within 1 cm from the faucet mounting hole. In the present invention, by providing the substrate surface with a functional layer containing the specific perfluoropolyether chain described above, it is possible to impart appropriate friction to the surface of the mounting part, thereby obtaining a mounting part that can exhibit excellent stability for mounting small items.

[0052] Manufacturing of the mounting part In the present invention, a treatment liquid containing a compound containing a perfluoropolyether chain, which will be described later, is applied to the surface of the substrate. The method of applying the treatment liquid containing a compound containing a perfluoropolyether chain can be a known method. For example, the treatment liquid containing a compound containing a perfluoropolyether chain can be applied by dipping, spin coating, wiping, vacuum deposition, spray gun, etc. After applying the treatment liquid containing a compound containing a perfluoropolyether chain to the surface of the substrate, it is dried and cured as necessary, and then, in some cases, preferably, the surface of the substrate is washed with a neutral detergent and a sponge, and then thoroughly rinsed with ultrapure water, to obtain a mounting part in which a functional layer containing a perfluoropolyether chain is formed on the surface of the substrate.

[0053] In the present invention, before applying a treatment liquid containing a compound containing a perfluoropolyether chain to the surface of the substrate, a pretreatment may be performed to remove dirt present on the surface and activate the hydroxyl groups on the surface. As the pretreatment to activate the hydroxyl groups on the surface, ultrasonic cleaning using an alkaline solution or particle polishing using metal fine particles may be used.

[0054] In the present invention, a primer layer may be formed on the surface of the substrate, and after performing pretreatment as necessary, a treatment liquid containing a compound containing a perfluoropolyether chain may be applied. The primer layer may be formed by, for example, a sol-gel method, a physical vapor deposition method (PVD), a chemical vapor deposition method (CVD), or the like.

[0055] As the treatment liquid containing a compound containing a specific perfluoropolyether chain, any liquid can be used as long as it can produce the water-related member of the present invention. Examples of compounds containing specific perfluoropolyether chains include compounds containing linear perfluoropolyether chains in which one or more ether bonds, which are repeating units such as (CF2)-O, (C2F4)-O, (C3F6)-O, and (C4F8)-O, are randomly bonded, and which have both moderate flexibility and friction. Specific examples of compounds containing linear specific perfluoropolyether chains include compounds containing the structure shown in the following formula 1. [ka] Here, p, q, r, and s are the numbers of repeating units, i.e., integers of 0 or more, and the sum of p, q, r, and s is 3 to 200. The repeating units in the formula may be randomly bonded to form a chain, or polymer chains each made of the repeating units may be bonded to each other. f1 represents a fluorine atom or an organic group having one or more carbon atoms that contains a carbon atom to which a fluorine atom is singly bonded, and R f2 represents an organic group having one or more carbon atoms that contains a carbon atom to which a fluorine atom is singly bonded.

[0056] Further specific examples of compounds containing a specific linear perfluoropolyether chain include compounds containing structures shown in the following formulas 2 to 6. [ka] (wherein the average value of l is 22.9), [ka] (wherein the average value of l is 23.2), [ka] (wherein the average value of l is 18), [ka] (wherein the average value of l is 23.4),

[0057] In addition, as a compound containing a specific perfluoropolyether chain, there can be mentioned a compound containing a branched perfluoropolyether chain in which one or more ether bonds, which are repeating units such as (CF2)-O, (C2F4)-O, (C3F6)-O, (C4F8)-O, CF(CF3)CF2-O, etc., are randomly bonded. These compounds containing perfluoropolyether chains have both not too high flexibility and moderate friction. As a compound containing a specific perfluoropolyether chain with a branched chain, there can be mentioned a compound containing the structure shown in the following formula 6. [ka] (wherein the average value of l is 24).

[0058] The compound containing a perfluoropolyether chain is preferably a compound containing a perfluoropolyether chain and at least one Si atom. It is more preferable that the compound is a compound in which a perfluoropolyether chain and at least one reactive silyl group are bonded. This makes it easier for the surface of the substrate to be bonded to the perfluoropolyether chain. The Si atom of the reactive silyl group may be bonded to one end of the perfluoropolyether chain, and the reactive silyl group that may be bonded to both ends is a functional group in which an organic group that does not contain a fluorine atom on the Si atom is bonded to a hydroxyl group or a hydrolyzable group. The hydrolyzable group is specifically an alkoxy group, a halogeno group, etc., more specifically, -OCH3, -OCH2CH3, -OCOCH3, -Cl, etc.

[0059] The solvent used in the treatment liquid may be any solvent that is miscible with the perfluoropolyether chain, and examples thereof include fluorine-based solvents, hexane, chain ether compounds, and cyclic ether compounds.

[0060] Water receiving part In the present invention, the water receiving portion may have a base material and a functional layer formed on the surface of the base material, similar to the mounting portion. The base material and functional layer constituting the water receiving portion may be the same as or different from the base material and functional layer constituting the mounting portion. In the former case, the water receiving portion and the mounting portion are integrally formed, and may be the water-related component of the present invention. In the latter case, the water receiving portion and the mounting portion may be separately constructed and may be used as the water surrounding member of the present invention. For example, the flexibility of the perfluoropolyether chain contained in the functional layer of the water receiving portion may be made higher than the flexibility of the perfluoropolyether chain contained in the functional layer of the mounting portion, thereby improving the stain resistance of the water receiving portion. EXAMPLES

[0061] The present invention will be described in more detail with reference to the following examples, although the present invention is not limited to these examples.

[0062] 1. Preparation of water-related components A test piece of a water-related component having an integrated water receiving portion and a mounting portion was prepared as follows. 1-1. Preparation of substrate As a substrate, a sanitary ware was prepared as follows.

[0063] <Preparation of base material for sanitary ware> A sanitary ware slip prepared from raw materials such as silica sand, feldspar, limestone, and clay was cast into a plaster mold to obtain a molded body. This molded body was then dried. The dried molded body was then fired in the firing process described below to produce the "sanitary ware base material."

[0064] <Preparation of glaze> A number of glaze raw materials having the compositions calculated as oxides and shown in Table 2 below were prepared. 600 g of each glaze raw material, 400 g of water, and 1 kg of alumina balls were placed in a 2-liter earthenware pot and ground in a ball mill for about 65 hours to obtain glazes.

[0065] [Table 2]

[0066] Glaze was applied to the dried molded body by spray coating, and the product was fired at 1100-1200°C to produce a base material for sanitary ware with a glaze layer. The surface of the obtained glaze layer was processed as necessary to produce substrate A with an arithmetic mean roughness Ra of 0.04 μm. The arithmetic mean roughness Ra was measured using a stylus surface roughness measuring device conforming to JIS-B0651 (2001) in accordance with "7. Method and procedure of evaluation using a stylus surface roughness measuring device" of JIS-B0633 (2001). Substrate A was produced by applying a glaze with the composition shown in Table 2 to a base material for sanitary ware, and then applying a glaze with the composition shown in Table 2 excluding ZrO2 and pigment, and firing the product to form a glaze layer.

[0067] 1-2.Pretreatment In order to remove dirt present on the surface of the glaze layer and to activate the hydroxyl groups present on the surface, pretreatment 1 described below was carried out.

[0068] <Pretreatment 1> First, the surface of the glaze layer was washed with a commercially available sponge I soaked in a neutral detergent (product name: Clean Ace, manufactured by AS ONE). Next, a small amount of ceria powder (manufactured by Treibacher Industrie AG) was sprinkled on the surface of the glaze layer, and the surface was washed with a commercially available sponge II. Next, the surface of the glaze layer was washed with ultrapure water while spraying it with running water, and the remaining ceria powder was removed with a commercially available sponge III (sponges I, II, and III were different, and each was used separately). The glaze layer was then immersed in an aqueous solution of alkaline detergent (product name: Semiclean, manufactured by Yokohama Yushi Kogyo Co., Ltd.) whose concentration was adjusted to 5 wt% with ion-exchanged water, and ultrasonically cleaned for 5 minutes. Next, ultrapure water was applied to the surface of the glaze layer to remove the alkaline detergent. The glaze layer was further immersed in ultrapure water and ultrasonically cleaned for 5 minutes. Next, ultrapure water was applied to the surface of the glaze layer again, and moisture was removed with an air duster.

[0069] 1-3. Formation of functional layer containing perfluoropolyether chains <Preparation of Reagents> The following reagents a to h, each containing a compound containing a perfluoropolyether chain, were prepared. In each of the reagents a to h, the partial structure containing a carbon atom to which fluorine is bonded is clearly indicated. In the structural formula of the active ingredient contained in each reagent, X Si means an organic group containing at least one Si atom and not containing a fluorine atom on the Si atom, and a hydroxyl group or a hydrolyzable group bonded to the organic group. The hydrolyzable group means an alkoxy group or a halogeno group. Specifically, it is -OCH3, -OCH2CH3, or -Cl.

[0070] Reagent a A reagent comprising the following components and containing a compound containing a perfluoropolyether chain represented by formula (a) as an active ingredient: [ka] (wherein the average value of l is 22.9. X Si means an organic group containing an average of 2.0 Si atoms, the Si atoms not containing fluorine atoms, and a hydroxyl group or a hydrolyzable group bonded to the organic group. The hydrolyzable group means an alkoxy group or a halogeno group. Specifically, it is -OCH3, -OCH2CH3, or -Cl. These values ​​were determined by liquid analysis of the reagent a using NMR. The number average molecular weight of the perfluoropolyether chain is, 19 From the F-NMR results, Si The existence of 1 H-NMR and 29 This was confirmed by the Si-NMR detection spectrum.)

[0071] (component) Ethyl nonafluorobutyl ether (CAS No. 163702-05-4) 25-35% Ethyl nonafluoroisobutyl ether (CAS No. 163702-06-5) 45-55% 15-25% of a compound containing a perfluoropolyether chain of formula (a) (active ingredient)

[0072] Reagent BA reagent comprising the following components and containing a compound containing a perfluoropolyether chain represented by formula (b) as an active ingredient: [ka] (wherein the average value of l is 23.2. X Si is the same as formula (a) except that it contains an average of 3.7 Si atoms. Si These values ​​were obtained by liquid analysis of the reagent b using NMR. The number average molecular weight of the perfluoropolyether chain is 19 From the F-NMR results, Si The existence of 1 H-NMR and 29 This was confirmed by the Si-NMR detection spectrum.)

[0073] (component) Ethyl nonafluorobutyl ether (CAS No. 163702-05-4) 25-35% Ethyl nonafluoroisobutyl ether (CAS No. 163702-06-5) 45-55% 15-25% of a compound containing a perfluoropolyether chain of formula (b) (active ingredient)

[0074] Reagent C A reagent comprising the following components and containing as an active ingredient a compound containing a perfluoropolyether chain represented by formula (c): [ka] (In the formula, the average value of l is 18, and this value was determined by liquid analysis of reagent c by NMR. The number average molecular weight of the perfluoropolyether chain is 19 This was confirmed by the results of F-NMR. Si X in formula (a) contains an average of 5.0 Si atoms. Si is equivalent to

[0075] (component) 1,1,1,2,2,3,3,4,4,5,5,6,6-Tridecafluorooctane (CAS No. 80793-17-5) Over 99.5% Less than 0.5% of compounds (active ingredients) containing perfluoropolyether chains of formula (c)

[0076] Reagent d A reagent comprising the following components and containing as an active ingredient a compound containing a perfluoropolyether chain represented by formula (d): [ka] (In the formula, the average value of l is 23.4, and this value was determined by liquid analysis of the reagent d by NMR. The number average molecular weight of the perfluoropolyether chain is 19 This was confirmed by the results of F-NMR. Si X in formula (a) contains an average of 3.0 Si atoms. Si is equivalent to

[0077] (component) Ethyl nonafluorobutyl ether (CAS No. 163702-05-4) 25-35% Ethyl nonafluoroisobutyl ether (CAS No. 163702-06-5) 45-55% 15-25% of a compound containing a perfluoropolyether chain of formula (d) (active ingredient)

[0078] Reagent e A reagent comprising the following components and containing as an active ingredient a compound containing a perfluoropolyether chain represented by formula (e): [ka] (wherein the average value of l is 24, and X Si X in formula (a) contains an average of 1.0 Si atom. Si is equivalent to

[0079] (component) Fluoroalkyl ether 80-85% 15-20% of a compound containing a perfluoropolyether chain of formula (e) (active ingredient)

[0080] Reagent FA reagent comprising the following components and containing as an active ingredient a compound containing a perfluoropolyether chain represented by formula (f): [ka] (wherein l:m:n=23.2:22.3:0.4 (average value), and X Si is the same as formula (a) except that it contains an average of 3.0 Si atoms. Si The repeating units in the formula are arranged randomly. These values ​​were determined by liquid analysis of the reagent f using NMR. The number average molecular weight of the perfluoropolyether chain is 19 From the F-NMR results, Si The existence of 1 H-NMR and 29 This was confirmed by the Si-NMR detection spectrum.)

[0081] (component) Fluoroalkyl ether (CAS No. 163702-06-4) 30-40% Fluoroalkyl ether (CAS No. 163702-06-5) 40-50% 10-20% of a compound containing a perfluoropolyether chain of formula (f) (active ingredient)

[0082] Reagent g A reagent comprising the following components and containing as an active ingredient a compound containing a perfluoropolyether chain represented by formula (g): [ka] (In the formula, X Si X in formula (a) contains an average of 1.0 Si atom. Si is equivalent to (component) Fluoroalkyl ether 80-85% 15-20% of a compound containing a perfluoropolyether chain of formula (g) (active ingredient)

[0083] Reagent h : A mixture of reagent f and reagent g in a 1:3 (f:g) ratio.

[0084] <Preparation of processing solution> 206μL of reagent a was dropped into 30g of fluorine solvent (product name: NOVEC7200, 3M) and stirred gently to obtain treatment solution a, in which the concentration of the active ingredient of reagent a was approximately 0.1wt%. Using a similar method, treatment solutions b, d, e, f, g, and h, each containing reagents b, d, e, f, g, and h, were obtained. Because the concentration of the active ingredient in reagent c was 0.1wt%, reagent c was used as is as treatment solution c without diluting it with a fluorine solvent.

[0085] <Application of processing liquid> The treatment liquid a was applied to the surface of the substrate A that had been subjected to pretreatment 1 at a pressure of 0.04 MPa using a spray gun, and the substrate was left to stand for 30 seconds, and then thermally dried for 30 minutes in a drying oven at 120° C. Thereafter, the substrate was cured for 3 hours in a thermo-hygrostat set at a temperature of 80° C. and a humidity of 80%, and then for 17 hours at room temperature and atmospheric pressure, to obtain a test specimen for a water-related component of Example 1. In a similar manner, test pieces of water-related components of Examples 2 to 5 and Comparative Examples 1 to 3 were obtained using the substrate A that had been subjected to the above-mentioned pretreatment 1 and each treatment liquid.

[0086] 2.Analysis and Evaluation The test pieces (Examples 1 to 5 and Comparative Examples 1 to 3) prepared as described above were subjected to the following analyses and evaluations.

[0087] 2-1.XPS analysis X-ray photoelectron spectroscopy (XPS) was used to measure the surface of each of the test pieces in Examples 1 to 5 and Comparative Examples 1 to 3. Prior to the measurement, the surface of each test piece was cleaned with a neutral detergent and a sponge, and then thoroughly rinsed with ultrapure water.

[0088] Using a K-ALPHA (manufactured by Thermo Scientific) as the XPS device, measurements were performed on the surface of each test piece under the following "XPS measurement conditions," and spectra of C1s, F1s, O1s, and Si2p were obtained.

[0089] [XPS measurement conditions] X-ray conditions: Monochromatic AlKα radiation, 30W, 12kV Analysis area: 200μmφ Neutralization gun conditions: 0.1V, 200μA Photoelectron take-off angle: 90° Time Per Step: 50 ms Sweep: 5 times Pass energy: 55 eV Analysis elements (energy range, step size): C1s (278-308eV, 0.01eV), F1s (679-699eV, 0.03eV), O1s (523-543eV, 0.03eV), Si2p (96-100eV, 0.03eV)

[0090] The types of bond states of the carbon atoms contained in the perfluoropolyether chains contained in the surface of each test piece (hereinafter simply referred to as "bond types") are seven types (1) to (7) shown in Table 3 below. The bond energies of C1s for each of the bond types (1) to (7) are shown in Table 3 below. However, the bond energy values ​​of C1s for the bond types marked with * (hereinafter referred to as "bond type *") were corrected as follows to the literature values ​​listed in NIST Standard Reference Database 20, Version 4.1. The bond energy values ​​of C1s listed in the above database were shifted and set up with the bond energy value of C1s of CC bonds set to 284.8 eV. Therefore, in order to match the conditions of this XPS measurement, the bond energy values ​​of C1s of organic compounds containing bond type * were corrected using the bond energy value of Si2p derived from the substrate, which is 103.2 eV, which is the same condition as the XPS measurement conditions.

[0091] [Table 3]

[0092] <Peak separation> For the obtained spectrum, peaks were separated using data analysis software Avantage (Version 5, Thermo Scientific). First, in the obtained Si2p spectrum, the peak positions in the entire binding energy range of the measured C1s, F1s, O1s, and Si2p were corrected so that the Si2p binding energy of the peak derived from the substrate was 103.2 eV. In this state, peak separation was performed on the photoelectron spectra of the bond types (1) to (7) present in the C1s spectrum. The specific method for C1s peak separation is described below. First, the background of the peak was removed by the Shirley method in the range of 278 eV (start point) to 300 eV (end point) in the measurement range of C1s. However, for the start point and end point, the average value of the intensity in the range of ±0.25 eV with each point as the median was used as the background intensity at that point. For example, at the start point of C1s at 278 eV, the average value of the intensity in the range of ±0.25 eV of the median value of 278 eV, that is, the range of 277.75 eV to 278.25 eV, was used as the background intensity at the start point. After that, the peak at 285 eV in the binding energy of C1s was used as the CC bond or CH bond, the peak at 286 eV in the binding energy of C1s was used as the CO bond, the peaks of the binding energies of C1s for the bond types (1) to (7) listed in Table 3 were used as the respective bond types, and the peak at 296.1 ± 1.0 eV in the binding energy of C1s was used as the K2p 1 / 2 The peaks were assigned as follows and added as peaks. Other peaks proposed by the software were also added as necessary. The added peaks were assumed to have a Gauss-Lorentz distribution in peak shape. Then, fitting was performed using the peak fitting conditions below to obtain spectra for each bond type. If the fitting results did not meet the fitting completion criteria below, one peak was added at the position of the C1s binding energy that was the maximum among the positive maxima in the second derivative spectrum displayed on the screen, and fitting was performed again using the peak fitting conditions below. This operation was performed until the fitting completion criteria below were met, and fitting was completed once. Next, K2p in the range of 296.1±1.0 eV 1 / 2When the peak of K2p was confirmed, the influence of the potassium peak was removed by the following procedure. First, 1 / 2 The binding energy, peak height and full width at half maximum (FWHM) of K2p were specified on the software. 3 / 2 The binding energy of K2p 1 / 2 The binding energy of K2p is set to 2.8 eV smaller than the binding energy of 3 / 2 The half-width of K2p 1 / 2 The software specified the value as being equal to K2p 3 / 2 The peak area of ​​K2p 1 / 2 The peak height was adjusted on the software so that it was 1.95 to 2.05 times the peak area of ​​the original sample. In addition, the bond energies of the peaks of bond types (3) and (4) are close to each other, and it may be difficult to distinguish and assign them to each peak. The bond type (3) peak in the perfluoropolyether chain is a peak derived from the end or side chain of the perfluoropolyether chain. The (3) peak derived from the end has a very small presence rate compared to the main chain, so it can be ignored. In the case of the (3) peak derived from the side chain, the (3) peak and the (6) peak theoretically exist in a 1:1 ratio due to the structure of the perfluoropolyether chain. Therefore, when the (6) peak was confirmed, the (3) peak was assigned by the following procedure. First, the values ​​of the bond energy, peak height, and full width at half maximum (FWHM) of the (6) peak determined by the above fitting were specified on the software. At this time, the bond energy of the (3) peak was set to 293.9 eV, and the peak height and full width at half maximum were set to be equal to those of the (6) peak, and the values ​​were specified on the software. After that, fitting was performed again using the following peak fitting conditions, taking into account the potassium peak, and peaks (3) and (4) were accurately distinguished to obtain spectra for each bond type. This completes the XPS peak separation. [Peak fitting conditions] Fitting Algorithm:Powell Maximum Iterations: 500 Convergence:1e-05 Gauss-Lorentz Mix:Product [Fitting completion criteria] Normalised Chi Square≦10.0

[0093] <Calculation of the composition ratio of bond types of carbon atoms contained in the perfluoropolyether chain> From the spectra of bond types (1) to (7) identified by peak separation, the composition ratios of bond types (1) to (7) were calculated using data analysis software Avantage (Version 5, Thermo Scientific). Specifically, the ratio of the peak area intensity of each bond type (1) to (7) to the sum of the peak area intensities of all the spectra of bond types (1) to (7) obtained by XPS measurement and peak separation was defined as the composition ratio of each bond type (1) to (7) in the perfluoropolyether chain, and was calculated in at%. The results are shown in Table 4.

[0094] [Table 4]

[0095] Calculation of O / C ratio From the composition ratios of the bond types (1) to (7) obtained by peak separation, the O / C ratios of the perfluoropolyether chains or fluoroalkyl chains were calculated using the method already described. The results are shown in Table 5 below.

[0096] 2-2. Contact angle of simulated dirty water The simulated wastewater was prepared by dissolving 2 ppm of sodium stearate (manufactured by Fuji Film Wako Pure Chemical Industries, Ltd.) and 1 ppm of tristearin (manufactured by Fuji Film Wako Pure Chemical Industries, Ltd.) in ion-exchanged water. The composition of the simulated wastewater was determined based on the analysis results of the wastewater components when washing hands in a washbowl. A contact angle meter (DMs-301, manufactured by Kyowa Interface Science Co., Ltd.) was used to measure the contact angle when a 2 μL droplet of simulated wastewater was dropped onto the surface of the test piece. The measurement results are shown in Table 5.

[0097] 2-3.Stability of placing small items The test piece was inclined at 4°, and a cylindrical polypropylene block with a diameter of 5 cm, height of 5 cm, and weight of 180 g was placed on the surface. The inclination angle of the test piece and the shape of the polypropylene block were set assuming the manner in which toothpaste is placed on the placement part of a washbasin. 10 seconds after placing the polypropylene block, if the position of the block had not changed by visual inspection, the stability of placing small items was judged to be good (○), and if the position of the block had changed, the stability of placing small items was judged to be poor (×). The judgment results are shown in Table 5.

[0098] 2-4. Antifouling evaluation The test piece was tilted at 4°, and 0.5 mL of simulated sewage was dropped onto its surface. After 5 seconds, it was visually confirmed whether droplets of the simulated sewage remained in an area 3 cm in diameter downward from the drop position. If no droplets remained, the antifouling property was judged to be good (○), and if droplets remained, the antifouling property was judged to be poor (×). The judgment results are shown in Table 5.

[0099] 2-5. Dynamic friction coefficient measurement Using a surface texture measuring instrument (TYPE: 14FW, manufactured by Shinto Scientific Co., Ltd.), the linear sliding measurement method was performed with a load of 25g / cm 2 The dynamic friction coefficient was measured under the following conditions: moving speed: 500 mm / min, RANGE: 100%, moving mode: single mode, measuring length: 20 mm, and using nonwoven fabric (Bencotto, manufactured by Asahi Kasei Corporation) as the slider. The above measurement conditions were set assuming the sliding of a small object. The measurement results are shown in Table 5.

[0100] [Table 5] [Explanation of symbols]

[0101] 1. Water-related materials 11 Water receiving section 12 Placement section

Claims

1. A water-related component having a water receiving portion and a placing portion, The mounting portion includes a base material and a functional layer formed on a surface of the base material, The substrate has a surface having an arithmetic mean roughness Ra of less than 0.1 μm, as measured in accordance with JIS-B0633 (2001) using a stylus-type surface roughness measuring device in accordance with JIS-B0651 (2001); The substrate contains silicon atoms and oxygen atoms on its surface, The functional layer includes a perfluoropolyether chain, the contact angle of the surface of the placement portion with respect to simulated wastewater, which is ion-exchanged water containing 2 ppm sodium stearate and 1 ppm tristearin, is 104° or more; A water-related component characterized in that the ratio of the number of oxygen atoms in the perfluoropolyether chain to the number of carbon atoms constituting the main chain of the perfluoropolyether chain (hereinafter referred to as the "O / C ratio") is less than 0.6, as obtained by peak separation of a spectrum obtained by measuring the surface of the mounting portion by X-ray photoelectron spectroscopy (XPS).

2. The loading section is subjected to a load of 25 g / cm by a linear sliding measurement method. ２ 2. The water-related component according to claim 1, wherein the surface has a dynamic friction coefficient of more than 0.11, measured under conditions of a moving speed of 500 mm / min, a range of 100%, a moving mode of single mode, a measuring length of 20 mm, and using a nonwoven fabric as a slider.

3. The water-related component according to claim 1 , wherein the O / C ratio is greater than 0 and is not greater than 0.

5.

4. The water-related component according to any one of claims 1 to 3, wherein the base material is made of sanitary ware.

5. The water-supply component according to claim 4 , wherein the water receiving portion and the placing portion are integral with each other.

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