Inspection socket

Abstract

To provide an inspection socket having high contact reliability.SOLUTION: An inspection socket includes first, second, third, and fourth probe pins each having a first contact and a second contact at ends in a first direction. In a second direction crossing the first direction, the first probe pin and the second probe pin face each other, and the third probe pin and the fourth probe pin face each other. In a third direction crossing the first direction and the second direction, the first probe pin and the third probe pin are arranged side by side, and the second probe pin and the fourth probe pin are arranged side by side. The second contact of the third probe pin is positioned between the second contact of the first probe pin and the second contact of the second probe pin in the second direction. The second contact of the second probe pin is positioned between the second contact of the third probe pin and the second contact of fourth probe pin in the second direction. In the second direction, the position at which the first contact of the first probe pin contacts with a contact object is different from the position at which the first contact of the third probe pin contacts with the contact object.SELECTED DRAWING: Figure 5

Description

[Technical field]

[0001] The present disclosure relates to a test socket. [Background technology]

[0002] Patent Document 1 describes an inspection tool used for continuity inspection, characteristic measurement, and the like of electronic modules. [Prior art documents] [Patent documents]

[0003] [Patent Document 1] JP 2022-135106 A Summary of the Invention [Problem to be solved by the invention]

[0004] The inspection socket including the inspection jig of Patent Document 1 has a plurality of probe pins. The probe pins are arranged side by side at intervals and are accommodated in a housing in a mutually electrically independent state. However, if the intervals between the terminals of the contact object of the inspection socket (e.g., a connector) are narrow, it is necessary to narrow the intervals between the probe pins that contact the terminals. If the intervals between the probe pins are narrow, poor contact may occur during inspection.

[0005] An object of the present disclosure is to provide a test socket with high contact reliability. [Means for solving the problem]

[0006] According to one aspect of the present disclosure, there is provided a test socket comprising: Housing and a first probe pin, a second probe pin, a third probe pin, and a fourth probe pin each having a first contact provided at one end in a first direction and a second contact provided at the other end in the first direction, and each supported by the housing; the first probe pin and the second probe pin are arranged opposite to each other with a gap in a second direction intersecting the first direction, the third probe pin and the fourth probe pin are arranged opposite to each other with a gap in the second direction, the first probe pin and the third probe pin are arranged side by side in a third direction intersecting the first direction and the second direction; In the third direction, the second probe pin and the fourth probe pin are arranged side by side, a first contact point of each of the first probe pin, the second probe pin, the third probe pin, and the fourth probe pin has an inclined surface capable of coming into contact with a contact object; a second contact point of the first probe pin is located on one side in the second direction with respect to a second contact point of the third probe pin; The second contact point of the second probe pin is located on one side in the second direction with respect to the second contact point of the fourth probe pin. Effect of the Invention

[0007] According to the present disclosure, it is possible to provide an inspection socket with high contact reliability. [Brief description of the drawings]

[0008] [Figure 1] FIG. 2 is a perspective view of a test socket according to one embodiment of the present disclosure; [Diagram 2] FIG. 2 is an exploded perspective view of the test socket of FIG. 1; [Diagram 3] FIG. [Figure 4] FIG. [Diagram 5] 5 is a cross-sectional view taken along line AA in FIG. 4. [Figure 6] FIG. 5 is a cross-sectional view taken along line BB in FIG. 4 . [Figure 7] FIG. 6 is a cross-sectional view showing a first modified example of the probe pin in FIG. 5. [Figure 8] FIG. 7 is a cross-sectional view showing a first modified example of the probe pin in FIG. 6. [Figure 9]6 is a cross-sectional view showing a second modified example of the probe pin in FIG. 5. [Figure 10] 7 is a cross-sectional view showing a second modified example of the probe pin in FIG. 6. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0009] An example of the present disclosure will be described below with reference to the accompanying drawings. The following description is merely illustrative in nature and is not intended to limit the present disclosure, the application of the present disclosure, or the use of the present disclosure. The drawings are schematic, and the ratio of each dimension does not necessarily match the actual one. In addition, in the following description, terms indicating a specific direction or position (e.g., terms including "upper", "lower", "right", "left", "front", and "rear") are used as necessary. However, the use of terms indicating a specific direction or position is intended to facilitate understanding of the present disclosure with reference to the drawings, and the technical scope of the present disclosure is not limited by the meaning of these terms.

[0010] A test socket 1 according to an embodiment of the present disclosure includes housings 2, 3, 4, 5, and 6, and a plurality of plate-shaped probe pins 7 housed inside the housings 2, 3, 4, 5, and 6, as shown in FIGS.

[0011] 2, the housing 2 has through holes 2A, 2B that penetrate the housing 2 in the up-down direction (for example, the Z direction shown in each drawing). The up-down direction and the Z direction are examples of a first direction. In this embodiment, in the up-down direction, the side where the housing 2 is located is the upper side, and the side where the housing 6 is located is the lower side.

[0012] The housing 3 has a base 31 and a protruding portion 32 protruding upward from the base 31. Here, "protruding upward" means "protruding in a direction from the housing 6 to the housing 2 along the first direction". The protruding portion 32 has a recess 3A recessed downward. Here, "recessed downward" means "recessed in a direction from the housing 2 to the housing 6 along the first direction". The protruding portion 32 has a plurality of through holes 3B penetrating the protruding portion 32 in the up-down direction on a bottom surface 31B constituting the recess 31A. Each of the plurality of through holes 3B corresponds to each of the plurality of probe pins 7.

[0013] The housing 4 has through holes 4A and 4B that pass through the housing 4 in the up-down direction.

[0014] The housing 5 holds a plurality of probe pins 7 in an array as shown in FIG.

[0015] The housing 6 has a pin 61 protruding upward and a recess 6A recessed downward from the top surface (in other words, the surface of the outer surface of the housing 6 facing the housing 4). The housing 6 has a plurality of through holes 6B penetrating the housing 6 in the up-down direction in the bottom surface forming the recess 6A. Each of the plurality of through holes 6B corresponds to each of the plurality of probe pins 7.

[0016] The lower portion of the housing 5 that holds the probe pins 7 is accommodated in the recess 6A of the housing 6. The lower portion of the housing 5 is a portion of the housing 5 that is closer to the housing 6 in the first direction. At this time, the second contacts 121, 122, 752, 762 (see FIG. 3) of each probe pin 7 are exposed to the outside of the test socket 1 through the through hole 6B.

[0017] The housings 2, 3, and 4 are assembled above the housing 6 in which the housing 5 is housed. The housings 2, 3, and 4 are assembled to the housing 6 from below in the order of the housings 4, 3, and 2.

[0018] A pin 61 of the housing 6 passes through the through hole 4B of the housing 4 and the through hole 2B of the housing 2. As a result, the housings 2 and 4 are positioned relative to the housing 6.

[0019] The protruding portion 32 of the housing 3 passes through the through hole 2A of the housing 2 from below. As a result, the protruding portion 32 is exposed to the outside of the test socket 1, and the housing 3 is positioned relative to the housing 2.

[0020] A first connection portion 11 (see FIGS. 5 and 6) of each probe pin 7 penetrates from below through a through hole 4A of the housing 4. A first contact 111, 751, 761 (see FIG. 3) of each probe pin 7 is exposed to the outside of the test socket 1 through a through hole 3B of the housing 3.

[0021] The inspection socket 1 is connected to an inspection device (not shown), and a contact object 8 (see FIGS. 4, 5, and 6) is connected to the inspection socket 1. In the above-mentioned connected state, continuity between the contact object 8 and the inspection device is inspected.

[0022] The test socket 1 is placed on a board provided in the test device. As a result, the second contacts 121, 122, 752, 762 (see FIG. 3) of each probe pin 7 exposed to the outside of the test socket 1 through the through hole 6B are electrically connected to the conductive pads formed on the board.

[0023] The contact object 8 shown in Figures 4, 5, and 6 is fitted into the recess 3A of the housing 3. As shown in Figures 5 and 6, the contact object 8 has a plurality of terminals 81. When the contact object 8 is fitted into the recess 3A of the housing 3, each terminal 81 is electrically connected to the first contacts 111, 751, 761 (see Figure 3) of each probe pin 7 exposed to the outside of the inspection socket 1 through the through hole 3B.

[0024] 3 and 4, the probe pin 7 includes a first probe pin 71, a second probe pin 72, a third probe pin 73, a fourth probe pin 74, a fifth probe pin 75, and a sixth probe pin 76. At least one of each of the first probe pin 71, the second probe pin 72, the third probe pin 73, the fourth probe pin 74, the fifth probe pin 75, and the sixth probe pin 76 is provided. In this embodiment, the probe pin 7 includes thirteen first probe pins 71, thirteen second probe pins 72, thirteen third probe pins 73, thirteen fourth probe pins 74, two fifth probe pins 75, and two sixth probe pins 76.

[0025] In this embodiment, the first probe pin 71, the second probe pin 72, the third probe pin 73, and the fourth probe pin 74 are signal terminals, and the fifth probe pin 75 and the sixth probe pin 76 are power supply terminals or ground terminals. However, the type of each probe pin is not limited to this.

[0026] The first probe pins 71, the second probe pins 72, the third probe pins 73, the fourth probe pins 74, the fifth probe pins 75, and the sixth probe pins 76 are arranged at intervals. In other words, the first probe pins 71, the second probe pins 72, the third probe pins 73, the fourth probe pins 74, the fifth probe pins 75, and the sixth probe pins 76 are electrically insulated from each other.

[0027] The first probe pin 71, the third probe pin 73, and the fifth probe pin 75 are arranged at intervals along a front-rear direction (for example, the Y direction shown in each drawing) that intersects (orthogonal in this embodiment) with the up-down direction of the inspection socket 1. The front-rear direction and the Y direction are plate thickness directions of the probe pins 7, and are examples of a third direction. The first probe pins 71 and the third probe pins 73 are arranged alternately in the front-rear direction.

[0028] The two fifth probe pins 75 sandwich the thirteen first probe pins 71 and the thirteen third probe pins 73 in the front-rear direction. In other words, the two fifth probe pins 75 are disposed at the frontmost and rearmost positions among the first probe pins 71, the third probe pins 73, and the fifth probe pins 75.

[0029] The second probe pin 72, the fourth probe pin 74, and the sixth probe pin 76 are arranged at intervals along the front-rear direction of the inspection socket 1. The second probe pins 72 and the fourth probe pins 74 are arranged alternately in the front-rear direction.

[0030] The two sixth probe pins 76 sandwich the thirteen second probe pins 72 and the thirteen fourth probe pins 74 in the front-rear direction. In other words, the two sixth probe pins 76 are disposed at the frontmost and rearmost positions among the second probe pins 72, the fourth probe pins 74, and the sixth probe pins 76.

[0031] 5, the first probe pins 71 and the second probe pins 72 are arranged opposite to each other with a gap in a left-right direction (for example, an X direction shown in each drawing) that intersects with both the up-down direction and the front-rear direction (in this embodiment, perpendicular to both the up-down direction and the front-rear direction). The left-right direction and the X direction are examples of the second direction.

[0032] As shown in FIG. 6, the third probe pins 73 and the fourth probe pins 74 are arranged opposite to each other with a gap therebetween in the left-right direction.

[0033] In this embodiment, the first probe pin 71 and the fourth probe pin 74 have the same configuration (in other words, the same size and shape). The fourth probe pin 74 is the first probe pin 71 arranged in an opposite direction in the left-right direction.

[0034] In this embodiment, the second probe pin 72 and the third probe pin 73 have the same configuration (in other words, the same size and shape). The third probe pin 73 is the second probe pin 72 that is arranged in an opposite direction in the left-right direction.

[0035] As described above, in this embodiment, the test socket 1 includes two types of probe pins 7, instead of four types of probe pins 7 each having a different configuration. One of the two types of probe pins 7 is the probe pins 71 and 74, and the other of the two types of probe pins 7 is the probe pins 72 and 73.

[0036] As shown in FIG. 3, the fifth probe pins 75 and the sixth probe pins 76 are arranged opposite to each other with a gap therebetween in the left-right direction.

[0037] In this embodiment, the fifth probe pin 75 and the sixth probe pin 76 have the same configuration (in other words, the same size and shape). In this embodiment, the fifth probe pin 75 and the sixth probe pin 76 are arranged in opposite directions in the left-right direction. The fifth probe pin 75 and the sixth probe pin 76 are arranged symmetrically with respect to a virtual line L1 that extends in the up-down direction between the fifth probe pin 75 and the sixth probe pin 76.

[0038] The configuration of each probe pin 7 will be described below. In this embodiment, the first probe pins 71, the second probe pins 72, the third probe pins 73, the fourth probe pins 74, the probe pins 75, and the probe pins 76 have roughly the same configuration. Therefore, the configuration of the first probe pin 71 will be described below, and the description of the configuration of the other probe pins will be omitted in principle. In addition, in each figure, the same reference numerals are given to common points of the configuration. However, the configuration of the other probe pins that differs from the first probe pin 71 will be described. In the following description, "left" and "right" in the left-right direction have the following meanings. That is, in the first probe pin 71 and the third probe pin 73, in the left-right direction, the curved portion 133 side is the "left" side, and the opposite side to the curved portion 133 is the "right" side. On the other hand, in the second probe pin 72 and the fourth probe pin 74, the side opposite the curved portion 133 in the left-right direction is the "left" side, and the curved portion 133 side is the "right" side.

[0039] As shown in FIG. 5, the first probe pin 71 includes a first connection portion 11, a second connection portion 12, and an elastic portion 13. The first connection portion 11 is connected to a first end portion 13A, which is one end portion of the elastic portion 13 in the vertical direction (the upper end portion of the elastic portion 13 in this embodiment). In other words, the lower end portion of the first connection portion 11 (the end portion closer to the elastic portion 13 in the vertical direction in this embodiment) is connected to the upper end portion of the elastic portion 13. The second connection portion 12 is connected to a second end portion 13B, which is the other end portion of the elastic portion 13 in the vertical direction (the lower end portion of the elastic portion 13 in this embodiment). In other words, the upper end portion of the second connection portion 12 (the end portion closer to the elastic portion 13 in the vertical direction in this embodiment) is connected to the lower end portion of the elastic portion 13.

[0040] The first connection portion 11 has a first contact 111 provided at an upper end portion of the first connection portion 11 (in this embodiment, the end portion farther from the second connection portion 12 in the vertical direction). The second connection portion 12 has a second contact 121 provided at a lower end portion of the second connection portion 12 (in this embodiment, the end portion farther from the first connection portion 11 in the vertical direction). In other words, the first probe pin 71 has the first contact 111 provided at one end portion in the vertical direction (in this embodiment, the upper end portion) and the second contact 121 provided at the other end portion in the vertical direction (in this embodiment, the lower end portion).

[0041] The elastic portion 13 has a first portion 131 , a second portion 132 , and a curved portion 133 .

[0042] The first portion 131 extends in the left-right direction from the first end 13A. The second portion 132 extends in the left-right direction from the second end 13B. The second portion 132 extends on the same side as the first portion 131 in the left-right direction. In the example shown in Fig. 5, the first portion 131 extends leftward from the first end 13A, and the second portion 132 extends leftward from the second end 13B.

[0043] The curved portion 133 has a curved shape and connects one end of the first portion 131 in the left-right direction that is farther from the first end 13A (for example, the left end in FIG. 5) to one end of the second portion 132 in the left-right direction that is farther from the second end 13B (for example, the left end in FIG. 5).

[0044] The first end 13A and the second end 13B, which are both ends of the elastic part 13, are connected to the first connecting part 11 and the second connecting part 12 from the same side (the left side in this embodiment) in the left-right direction. That is, the elastic part 13 is located on the same side (the left side in this embodiment) of one side surface (the left surface in this embodiment) of the first connecting part 11 in the left-right direction.

[0045] A length L2 along the vertical direction between an end 11A to which the first end 13A of the first connecting portion 11 is connected and an end 12A to which the second end 13B of the second connecting portion 12 is connected is longer than an inner diameter R1 of the curve of the elastic portion 13. In this embodiment, the end 11A is the lower end of the first connecting portion 11, and the end 12A is the upper end of the second connecting portion 12. In this embodiment, the inner diameter R1 of the curve of the elastic portion 13 is the inner diameter R1 of the curved portion 133.

[0046] The elastic portion 13 includes a plurality of long plate portions 134 (three long plate portions 134A, 134B, and 134C in this embodiment). Each of the long plate portions 134A, 134B, and 134C extends across the first portion 131, the second portion 132, and the curved portion 133.

[0047] Each of the long plate portions 134A, 134B, 134C extends along the length direction of the elastic portion 13. The length direction of the elastic portion 13 is the direction in which the elastic portion 13 extends from the first portion 131 through the curved portion 133 to the second portion 132. In other words, the length direction of the elastic portion 13 is the left-right direction in the first portion 131 and the second portion 132, and is the direction along the curved shape in the curved portion 133.

[0048] The long plate portions 134A, 134B, and 134C are arranged side by side at intervals along the width direction of the elastic portion 13. The width direction of the elastic portion 13 is a direction perpendicular to both the front-rear direction (the plate thickness direction of the probe pin 7 in this embodiment) and the length direction of the elastic portion 13.

[0049] The longer the long plate portions 134 are in the width direction, the further outward they are from the curved shape of the curved portion 133. In this embodiment, the long plate portion 134A is longer in the width direction than the long plate portion 134B, which is longer in the width direction than the long plate portion 134C.

[0050] The second portion 132 extends upward toward the right on the page of Fig. 5. That is, the second portion 132 extends so as to approach the first end 13A in the up-down direction as it approaches the second end 13B in the left-right direction. That is, the surface constituting the radial inner edge and the surface constituting the radial outer edge of the second portion 132 are inclined surfaces inclined with respect to the left-right direction.

[0051] The upper edge 12B of the second connection portion 12 extends downward toward the right on the paper surface of FIG. 5. That is, the edge 12B of the second connection portion 12 on the first connection portion 11 side in the vertical direction (the upper side in this embodiment) extends away from the first connection portion 11 in the vertical direction as it moves away from the elastic portion 13 in the horizontal direction. That is, the edge 12B is an inclined surface inclined with respect to the horizontal direction. The edge 12B may extend along the horizontal direction. As shown in FIG. 3, the edge 12B of the fifth probe pin 75 and the sixth probe pin 76 extends along the horizontal direction.

[0052] 5, the first contact 111 has a protrusion shape and protrudes upward (in the present embodiment, in the direction away from the second connection portion 12 in the first direction) from the upper end of the first connection portion 11. The first contact 111 includes an inclined surface 111A and a protrusion 111B.

[0053] The inclined surface 111A is located on one side in the left-right direction of the first contact 111. The inclined surface 111A is inclined in the up-down direction so as to move away from the center line C as it moves away from the elastic portion 13. The center line C is a line that passes through the center of the first connection portion 11 in the left-right direction and extends in the up-down direction.

[0054] The protrusion 111B protrudes upward (in the first direction in this embodiment, in a direction away from the second connection portion 12). The protrusion 111B faces the inclined surface 111A with a gap in between in the left-right direction. The protruding tip (the upper end in this embodiment) of the protrusion 111B is located below the upper end of the inclined surface 111A and above the lower end of the inclined surface 111A. In other words, in the first direction, the protruding tip of the protrusion 111B is located between the end of the inclined surface 111A on the side farther from the elastic portion 13 and the end of the inclined surface 111A on the side closer to the elastic portion 13.

[0055] The inclined surface 111A and the protrusion 111B are capable of contacting the terminal 81 of the contact object 8. When the contact object 8 is fitted into the recess 3A of the housing 3, the terminal 81 has a U-shaped portion in a side view seen along the front-rear direction. In other words, the terminal 81 has a curved portion that convex downward at the tip. The inclined surface 111A comes into contact with the curved portion of the terminal 81 from one side in the left-right direction.

[0056] In this embodiment, the first contact 111 has only one inclined surface that can come into contact with the contact object 8. That is, in this embodiment, the only inclined surface of the first contact 111 that can come into contact with the contact object 8 is the inclined surface 111A.

[0057] The second contact 121 has a protrusion shape and protrudes downward (in the present embodiment, in the direction away from the first connection portion 11 in the first direction) from the lower end of the second connection portion 12. The second contact 121 has a notch 121C. The notch 121C is cut upward (towards the first connection portion 11 in the first direction) from the lower surface of the second contact 121.

[0058] The second connection portion 12 has a notch 12C. The notch 12C is provided between the second contact point 121 and the second portion 132 of the elastic portion 13. The notch 12C is cut out from the left and right ends of the second connection portion 12 along the left and right direction.

[0059] The first probe pin 71, the second probe pin 72, the third probe pin 73, and the fourth probe pin 74 have differences in their arrangement, configuration, etc. These will be described in detail below.

[0060] As shown in Fig. 5, the first probe pin 71 and the second probe pin 72 are arranged opposite to each other in the left-right direction so that the elastic parts 13 face outward in the left-right direction. As shown in Fig. 6, the third probe pin 73 and the fourth probe pin 74 are arranged opposite to each other in the left-right direction so that the elastic parts 13 face outward in the left-right direction.

[0061] 5 and 6, the inclined surface 111A of the first probe pin 71 and the fourth probe pin 74 is located on the curved portion 133 side of the elastic portion 13 at the first contact 111 in the left-right direction. The inclined surface 111A of the first probe pin 71 and the fourth probe pin 74 faces the opposite side to the curved portion 133 of the elastic portion 13 in the left-right direction. The protrusion 111B of the first probe pin 71 and the fourth probe pin 74 is located on the opposite side to the curved portion 133 of the elastic portion 13 with respect to the inclined surface 111A in the left-right direction.

[0062] The inclined surface 111A of the first probe pin 71 is located to the left of the first contact point 111 on the paper of Fig. 5, extends downward toward the right, and faces the upper right. The protrusion 111B of the first probe pin 71 is located to the right of the inclined surface 111A of the first probe pin 71 on the paper of Fig. 5. The inclined surface 111A of the fourth probe pin 74 is located to the right of the first contact point 111 on the paper of Fig. 6, extends downward toward the left, and faces the upper left. The protrusion 111B of the fourth probe pin 74 is located to the left of the inclined surface 111A of the fourth probe pin 74 on the paper of Fig. 6.

[0063] 5 and 6, the inclined surface 111A of the second probe pin 72 and the third probe pin 73 is located on the opposite side of the first contact 111 from the elastic portion 13 in the left-right direction. The inclined surface 111A of the second probe pin 72 and the third probe pin 73 faces the curved portion 133 of the elastic portion 13 in the left-right direction. The protrusion 111B of the second probe pin 72 and the third probe pin 73 is located on the elastic portion 13 side with respect to the inclined surface 111A in the left-right direction.

[0064] The inclined surface 111A of the second probe pin 72 is located to the left of the first contact point 111 on the paper of Fig. 5, extends downward toward the right, and faces the upper right. The protrusion 111B of the second probe pin 72 is located to the right of the inclined surface 111A of the second probe pin 72 on the paper of Fig. 5. The inclined surface 111A of the third probe pin 73 is located to the right of the first contact point 111 on the paper of Fig. 6, extends downward toward the left, and faces the upper left. The protrusion 111B of the third probe pin 73 is located to the left of the inclined surface 111A of the third probe pin 73 on the paper of Fig. 6.

[0065] 5, the inclined surface 111A of the first contact 111 of the first probe pin 71 and the inclined surface 111A of the first contact 111 of the second probe pin 72 face the same side in the left-right direction (the right in this embodiment). As shown in Fig. 6, the inclined surface 111A of the first contact 111 of the third probe pin 73 and the inclined surface 111A of the first contact 111 of the fourth probe pin 74 face the same side in the left-right direction (the left in this embodiment).

[0066] 5 and 6, the inclined surface 111A (see FIG. 5) of the first contact 111 of the first probe pin 71 and the inclined surface 111A (see FIG. 6) of the first contact 111 of the third probe pin 73 face opposite sides in the left-right direction. The inclined surface 111A (see FIG. 5) of the first contact 111 of the second probe pin 72 and the inclined surface 111A (see FIG. 6) of the first contact 111 of the fourth probe pin 74 face opposite sides in the left-right direction.

[0067] Also, when viewed along the front-rear direction, the inclined surface 111A of the first contact 111 of the first probe pin 71 and the inclined surface 111A of the first contact 111 of the third probe pin 73 face each other in the left-right direction. When viewed along the front-rear direction, the inclined surface 111A of the first contact 111 of the second probe pin 72 and the inclined surface 111A of the first contact 111 of the fourth probe pin 74 face each other in the left-right direction.

[0068] The first probe pin 71 and the fourth probe pin 74 have a second contact 121 and a notch 12C. The second probe pin 72 and the third probe pin 73 have a second contact 122 instead of the second contact 121. The second contact 122 does not have the notch 12C. The second contact 122 differs from the second contact 121 in that it does not have the notch 121C.

[0069] In the first probe pin 71 and the fourth probe pin 74, the second contact 121 is located away from the first contact 111 when viewed in the up-down direction. In the first probe pin 71 and the fourth probe pin 74, the second contact 121 is located away from the inclined surface 111A when viewed in the up-down direction. In the first probe pin 71 and the fourth probe pin 74, a portion of the second connection portion 12 including the second contact 121 overlaps with the elastic portion 13 when viewed in the up-down direction. That is, in the first probe pin 71 and the fourth probe pin 74, at least a part of a portion of the second connection portion 12 including the second contact 121 is at the same position as at least a part of the elastic portion 13 in the left-right direction. In addition, in the first probe pin 71 and the fourth probe pin 74, the elastic portion 13 and the second contact 121 are located on the same side in the left-right direction with respect to the first connection portion 11.

[0070] In the second probe pin 72 and the third probe pin 73, the second contact 122 and the first contact 111 are at positions where at least a part of them overlap each other when viewed in the up-down direction. That is, in the second probe pin 72 and the third probe pin 73, at least a part of the second contact 122 is at the same position as at least a part of the first contact 111 in the left-right direction. Also, in the second probe pin 72 and the third probe pin 73, the first contact 111 and the second contact 122 are located on the same side in the left-right direction with respect to the elastic portion 13. In the second probe pin 72 and the third probe pin 73, the second contact 122 and the inclined surface 111A are at positions where at least a part of them overlap each other when viewed in the up-down direction. That is, in the second probe pin 72 and the third probe pin 73, at least a part of the second contact 122 is at the same position as at least a part of the inclined surface 111A in the left-right direction. In the second probe pin 72 and the third probe pin 73, the inclined surface 111A and the second contact point 122 are located on the same side with respect to the elastic portion 13 in the left-right direction.

[0071] As shown in Fig. 5, in the first probe pin 71 and the second probe pin 72, the inclined surface 111A is provided on the left side of the first contact point 111. As shown in Fig. 6, in the third probe pin 73 and the fourth probe pin 74, the inclined surface 111A is provided on the right side of the first contact point 111. The left side in Figs. 5 and 6 (and Figs. 7 to 10 described later) is an example of one side in the left-right direction, and the right side in Figs. 5 and 6 (and Figs. 7 to 10 described later) is an example of the other side in the left-right direction.

[0072] As shown in FIGS. 5 and 6, the second contact 121 of the first probe pin 71 is located to the left of the second contact 122 of the third probe pin 73. That is, when viewed along the front-rear direction, the second contact 121 of the first probe pin 71 does not overlap with the second contact 122 of the third probe pin 73. That is, in the left-right direction, the second contact 121 of the first probe pin 71 is located at a different position from the second contact 122 of the third probe pin 73. Note that, when viewed along the front-rear direction, the second contact 121 of the first probe pin 71 may only partially overlap with the second contact 122 of the third probe pin 73. That is, the second contact 121 of the first probe pin 71 may be located at a partly same position as the second contact 122 of the third probe pin 73 in the left-right direction.

[0073] The second contact 122 of the second probe pin 72 is located to the left of the second contact 121 of the fourth probe pin 74. That is, when viewed along the front-rear direction, the second contact 122 of the second probe pin 72 does not overlap with the second contact 121 of the fourth probe pin 74. That is, in the left-right direction, the second contact 122 of the second probe pin 72 is located at a different position from the second contact 121 of the fourth probe pin 74. Note that, when viewed along the front-rear direction, the second contact 122 of the second probe pin 72 may only partially overlap with the second contact 121 of the fourth probe pin 74. That is, in the left-right direction, the second contact 122 of the second probe pin 72 may be located at a partly same position as the second contact 121 of the fourth probe pin 74.

[0074] As described above, in the first probe pin 71 and the second probe pin 72, the inclined surface 111A is provided on the left part of the first contact 111. In addition, the second contact 121 of the first probe pin 71 is located to the left of the second contact 122 of the third probe pin 73, and the second contact 122 of the second probe pin 72 is located to the left of the second contact 121 of the fourth probe pin 74. In other words, the inclined surface 111A of the first contact 111 of the first probe pin 71 is located on the left side in the left-right direction, which is the side where the second contact 121 of the first probe pin 71 is located with respect to the second contact 122 of the third probe pin 73, among the first contacts 111 of the first probe pin 71. In addition, the inclined surface 111A of the first contact 111 of the second probe pin 72 is arranged on the left side in the left-right direction, which is the side of the first contact 111 of the second probe pin 72 where the second contact 122 of the second probe pin 72 is arranged relative to the second contact 121 of the fourth probe pin 74.

[0075] As described above, in the third probe pin 73 and the fourth probe pin 74, the inclined surface 111A is provided on the right part of the first contact 111. Further, the second contact 122 of the third probe pin 73 is located to the right of the second contact 121 of the first probe pin 71, and the second contact 121 of the fourth probe pin 74 is located to the right of the second contact 122 of the second probe pin 72. In other words, the inclined surface 111A of the first contact 111 of the third probe pin 73 is Of the first contacts 111 of the third probe pin 73, the second contact 122 of the third probe pin 73 is disposed on the right side relative to the second contact 121 of the first probe pin 71. Also, the inclined surface 111A of the first contact 111 of the fourth probe pin 74 is disposed on the right side in the left-right direction, which is the side where the second contact 121 of the fourth probe pin 74 is disposed on the second contact 122 of the second probe pin 72.

[0076] The first probe pin 71, the second probe pin 72, the third probe pin 73, and the fourth probe pin 74 can provide the following effects.

[0077] In the first probe pin 71, the second probe pin 72, the third probe pin 73, and the fourth probe pin 74, the length L2 in the up-down direction between the end 11A and the end 12A is longer than the inner radius R1 of the curve of the elastic portion 13. The edge portion 12B of the second connection portion 12 on the first connection portion 11 side in the up-down direction extends so as to move away from the first connection portion 11 in the up-down direction as it moves away from the elastic portion 13 in the left-right direction. Therefore, in the first probe pin 71, the second probe pin 72, the third probe pin 73, and the fourth probe pin 74, the up-down stroke of the elastic portion 13 can be increased. As a result, the contact reliability of the probe pins 7 can be improved.

[0078] The second portion 132 extends so as to approach the first end 13A in the up-down direction as it approaches the second end 13B in the left-right direction. Therefore, the area of ​​each probe pin 7 occupied by the elastic portion 13 can be made smaller.

[0079] The elastic portion 13 includes a plurality of long plate portions 134. The longer the plurality of long plate portions 134 are in the width direction, the further outward they are positioned from the curved shape of the curved portion 133. This allows the elastic portion 13 to bend easily.

[0080] The first contact 111 has an inclined surface 111A that can come into contact with the contact object 8. For example, if the terminal 81 of the contact object 8 has a curved portion at its tip, the inclined surface 111A comes into contact with the curved portion of the terminal 81 from one side in the left-right direction. If only one side of the curved portion of the terminal 81 is gold-plated and the other side is tin-plated, the inclined surface 111A can be brought into contact with the gold-plated portion.

[0081] The first contact 111 has a protrusion 111B in addition to the inclined surface 111A, so that the first contact 111 can come into contact with the contact object 8 at multiple points.

[0082] The first probe pin 71 and the fourth probe pin 74 can provide the following effects.

[0083] When viewed in the up-down direction, the second contacts 121 of the first probe pin 71 and the fourth probe pin 74 are located at positions that are off the inclined surface 111A. Therefore, in a configuration in which the first probe pin 71 and the third probe pin 73 are arranged side by side in the front-rear direction, the second contacts 121 of the first probe pin 71 and the second contacts 122 of the third probe pin 73 can be located at different positions in the left-right direction. Similarly, in a configuration in which the fourth probe pin 74 and the second probe pin 72 are arranged side by side in the front-rear direction, the second contacts 121 of the fourth probe pin 74 and the second contacts 122 of the second probe pin 72 can be located at different positions in the left-right direction.

[0084] The second connection portions 12 of the first probe pin 71 and the fourth probe pin 74 have a notch 12C, which allows the second contacts 121 to bend in the vertical direction.

[0085] The second probe pin 72 and the third probe pin 73 can provide the following effects.

[0086] When viewed in the up-down direction, at least a part of the second contacts 122 of the second probe pin 72 and the third probe pin 73 overlaps at least a part of the inclined surface 111A. Therefore, in a configuration in which the second probe pin 72 and the fourth probe pin 74 are arranged side by side in the front-rear direction, the second contact 122 of the second probe pin 72 and the second contact 121 of the fourth probe pin 74 can be positioned at different positions in the left-right direction. Similarly, in a configuration in which the third probe pin 73 and the first probe pin 71 are arranged side by side in the front-rear direction, the second contact 122 of the third probe pin 73 and the second contact 121 of the first probe pin 71 can be positioned at different positions in the left-right direction.

[0087] Test socket 1 can provide the following effects:

[0088] The second contact 121 of the first probe pin 71 is located to the left of the second contact 122 of the third probe pin 73, and the second contact 122 of the second probe pin 72 is located to the left of the second contact 121 of the fourth probe pin 74. With this configuration, when the first probe pins 71 and the third probe pins 73 are arranged alternately in the front-rear direction, the pitch between two second contacts adjacent in the front-rear direction can be increased. This will be described in detail below. If the second contact 121 of the first probe pin 71 and the second contact 122 of the third probe pin 73 are located at the same position in the left-right direction, the second contacts 121, 122 of the first probe pins 71 and the third probe pins 73 arranged alternately in the front-rear direction are adjacent in the front-rear direction. On the other hand, when the second contact 121 of the first probe pin 71 is located to the left of the second contact 122 of the third probe pin 73, the second contacts 121, 122 of the first probe pin 71 and the third probe pin 73 arranged alternately in the front-rear direction are not adjacent to each other in the front-rear direction. In this case, the second contacts 121, 121 of the two first probe pins 71 are adjacent to each other in the front-rear direction. In other words, the pitch between the two adjacent second contacts becomes larger by the amount that the third probe pin 73 is not located between the two first probe pins 71. Similarly, when the second probe pins 72 and the fourth probe pins 74 are arranged alternately in the front-rear direction, the pitch between the two adjacent second contacts in the front-rear direction can be increased. As a result, the contact reliability of the inspection socket 1 can be improved.

[0089] If the intervals between the probe pins are narrow, the intervals between the pads on the board on which the test socket is mounted will also be narrow, which may make it difficult to form the pads. As described above, in the test socket 1 of this embodiment, the pitch between two second contacts adjacent in the front-rear direction can be increased. This allows the pad intervals on the board to be increased, making it easier to form the pads.

[0090] When viewed in the up-down direction, the first contact 111 of the first probe pin 71 and the fourth probe pin 74 is located away from the second contact 121. When viewed in the up-down direction, the first contact 111 of the second probe pin 72 and the third probe pin 73 is located at a position where they overlap with each other. This allows the second contact 121 of the first probe pin 71 and the second contact 122 of the third probe pin 73 to be positioned at different positions in the left-right direction when the first probe pin 71 and the third probe pin 73 are alternately arranged in the front-back direction. Also, when the second probe pin 72 and the fourth probe pin 74 are alternately arranged in the front-back direction, the second contact 122 of the second probe pin 72 and the second contact 121 of the fourth probe pin 74 can be positioned at different positions in the left-right direction.

[0091] The third probe pin 73 has the same configuration as the second probe pin 72, and is arranged in the left-right direction opposite to the second probe pin 72. The fourth probe pin 74 has the same configuration as the first probe pin 71, and is arranged in the left-right direction opposite to the first probe pin 71. This makes it possible to reduce the number of types of probe pins provided in the inspection socket 1.

[0092] The inclined surfaces 111A of the first probe pin 71 and the second probe pin 72, which are arranged opposite to each other in the left-right direction, face the same side in the left-right direction. The inclined surfaces 111A of the third probe pin 73 and the fourth probe pin 74, which are arranged opposite to each other in the left-right direction, face the same side in the left-right direction. This allows the inclined surfaces 111A of the two probe pins arranged opposite to each other in the left-right direction to come into contact with the contact object 8 from the same side in the left-right direction.

[0093] The inclined surfaces 111A of the first probe pin 71 and the third probe pin 73, which are arranged side by side in the front-rear direction, face opposite sides in the left-right direction. The inclined surfaces 111A of the second probe pin 72 and the fourth probe pin 74, which are arranged side by side in the front-rear direction, face opposite sides in the left-right direction. This allows the inclined surfaces 111A of the two probe pins arranged side by side in the front-rear direction to come into contact with the contact object 8 from opposite sides in the left-right direction.

[0094] When viewed along the front-rear direction, the inclined surfaces 111A of the first probe pin 71 and the third probe pin 73, which are arranged side by side in the front-rear direction, face each other in the left-right direction. When viewed along the front-rear direction, the inclined surfaces 111A of the second probe pin 72 and the fourth probe pin 74, which are arranged side by side in the front-rear direction, face each other in the left-right direction. This allows the inclined surfaces 111A of the probe pins to come into contact with the contact object 8 from the outside in the left-right direction.

[0095] The first contact 111 of each of the first probe pin 71, the second probe pin 72, the third probe pin 73, and the fourth probe pin 74 has only one inclined surface 111A that can come into contact with the contact object 8. If the first contact 111 had two inclined surfaces that can come into contact with the contact object 8, the contact object 8 would be pressed against one inclined surface, increasing the possibility that the contact object 8 would be separated from the other inclined surface. However, with this configuration, it is possible to reduce the possibility that the inclined surface 111A will not come into contact with a desired position on the contact object 8.

[0096] Test socket 1 can also be configured as follows:

[0097] In the above-described embodiment, a configuration has been described in which the inspection socket 1 is provided with two types of probe pins 7. One of the two types of probe pins 7 is the first probe pin 71 and the fourth probe pin 74, which have the same configuration. The other of the two types of probe pins 7 is the second probe pin 72 and the third probe pin 73, which have the same configuration. However, the types of probe pins 7 provided in the inspection socket 1 are not limited to two.

[0098] 7 and 8 show a configuration in which the inspection socket 1 includes four types of probe pins 7. In FIGS. 7 and 8, the same reference numerals are used for parts having the same configuration as the probe pins shown in FIGS. 5 and 6, and the description thereof will be omitted. In the configuration shown in FIGS. 7 and 8, the first probe pin 71, the second probe pin 72, the third probe pin 73, and the fourth probe pin 74 each include a second contact having a different configuration. That is, the first probe pin 71 includes a second contact 123, the second probe pin 72 includes a second contact 124, the third probe pin 73 includes a second contact 125, and the fourth probe pin 74 includes a second contact 126. The second contacts 123, 124, 125, and 126 include different numbers of notches. Second contact 123 has three notches, second contact 124 has two notches, second contact 125 has no notches, and second contact 126 has one notch.

[0099] In the above embodiment, the configuration has been described in which the first contact 111 has only one inclined surface 111A capable of coming into contact with the contact object 8. However, the first contact 111 may have a plurality of inclined surfaces.

[0100] 9 and 10 show a configuration in which the first contact 111 has two inclined surfaces (inclined surface 111A and second inclined surface 111C). In FIGS. 9 and 10, parts having the same configuration as those of the probe pin shown in FIGS. 5 and 6 are given the same reference numerals, and descriptions thereof will be omitted. In the configuration shown in FIGS. 9 and 10, the first contact 111 of each probe pin 7 has a second inclined surface 111C in addition to the inclined surface 111A. The second inclined surface 111C faces the inclined surface 111A in the left-right direction. The inclined surface 111C is inclined in the opposite direction to the inclined surface 111A facing it in the left-right direction. For example, when the inclined surface 111A is inclined to face upward to the right, the second inclined surface 111C is inclined to face upward to the left. The terminal 81 of the contact object 8 can come into contact with the second inclined surface 111C, as with the inclined surface 111A. The inclined surface 111A comes into contact with the curved portion of the terminal 81 from one side in the left-right direction. On the other hand, the second inclined surface 111C comes into contact with the curved portion of the terminal 81 from the other side in the left-right direction.

[0101] The shape and configuration of the housings 2, 3, 4, 5, and 6 can be changed as desired depending on the design of the inspection socket 1, etc. For example, the shape of the housings 2, 3, 4, 5, and 6 is not limited to a substantially rectangular prism shape, but may be a substantially cylindrical shape or a substantially polygonal shape other than a substantially rectangular prism shape. The housing 10 is not limited to being composed of five members, but may be composed of one member, or may be composed of a number of members other than five.

[0102] The number of probe pins 7 that the inspection socket 1 has can be changed as desired depending on the design of the inspection socket 1 and the like.

[0103] For example, in the configuration shown in FIG. 3 and FIG. 4, the probe pins 7 include 13 first probe pins 71, 13 second probe pins 72, 13 third probe pins 73, 13 fourth probe pins 74, 2 fifth probe pins 75, and 2 sixth probe pins 76. Here, a pair of probe pins 71, 72 facing each other in the left-right direction and a pair of probe pins 73, 74 facing each other in the left-right direction are arranged side by side in the front-rear direction to form one probe tweezers. In this case, in the configuration shown in FIG. 3 and FIG. 4, 13 probe tweezers are arranged side by side in the front-rear direction. By arranging them in this manner, the positions of adjacent second contacts 121, 122 in the left-right direction are different when viewed in the up-down direction. The number of probe tweezers arranged side by side in the front-rear direction may be other than 13.

[0104] Various embodiments of the present disclosure have been described above in detail with reference to the drawings. Finally, various aspects of the present disclosure will be described. In the following description, reference symbols will be used as examples.

[0105] (1) The test socket 1 of the present disclosure is Housing 5; a first probe pin 71, a second probe pin 72, a third probe pin 73, and a fourth probe pin 74 each having a first contact 111 provided at one end in a first direction and second contacts 121, 122 provided at the other end in the first direction, and each supported by the housing 5; The first probe pin 71 and the second probe pin 72 are arranged opposite to each other at an interval in a second direction intersecting the first direction, The third probe pin 73 and the fourth probe pin 74 are arranged opposite to each other with a gap in the second direction, In a third direction intersecting the first direction and the second direction, the first probe pin 71 and the third probe pin 73 are arranged side by side, In the third direction, the second probe pin 72 and the fourth probe pin 74 are arranged side by side, the second contact 122 of the third probe pin 73 is located between the second contact 121 of the first probe pin 71 and the second contact 122 of the second probe pin 72 in the second direction; the second contact 122 of the second probe pin 72 is located between the second contact 122 of the third probe pin 73 and the second contact 121 of the fourth probe pin 74 in the second direction; When a contact object 8 is brought into contact with the first contact 111 of the first probe pin 71 and the first contact 111 of the third probe pin 73 from the first direction, the first contact 111 of the first probe pin 71 comes into contact with the contact object 8 at a first position, and the first contact 111 of the third probe pin 73 comes into contact with the contact object 8 at a second position that is different in the second direction from the first position.

[0106] (2) In the test socket 1 of (1), When the contact object 8 is brought into contact with the first contact 111 of the second probe pin 72 and the first contact 111 of the fourth probe pin 74 from the first direction, the first contact 111 of the second probe pin 72 may come into contact with the contact object 8 at a third position, and the first contact 111 of the fourth probe pin 74 may come into contact with the contact object 8 at a fourth position different from the third position in the second direction.

[0107] (3) The inspection socket 1 of the present disclosure is Housing 5; a first probe pin 71, a second probe pin 72, a third probe pin 73, and a fourth probe pin 74 each having a first contact 111 provided at one end in a first direction and second contacts 121, 122 provided at the other end in the first direction, and each supported by the housing 5; The first probe pin 71 and the second probe pin 72 are arranged opposite to each other at an interval in a second direction intersecting the first direction, The third probe pin 73 and the fourth probe pin 74 are arranged opposite to each other with a gap in the second direction, In a third direction intersecting the first direction and the second direction, the first probe pin 71 and the third probe pin 73 are arranged side by side, In the third direction, the second probe pin 72 and the fourth probe pin 74 are arranged side by side, the second contact 122 of the third probe pin 73 is located between the second contact 121 of the first probe pin 71 and the second contact 122 of the second probe pin 72 in the second direction; the second contact 122 of the second probe pin 72 is located between the second contact 122 of the third probe pin 73 and the second contact 121 of the fourth probe pin 74 in the second direction; When viewed along the third direction, the shape of the first contact 111 of the first probe pin 71 is different from the shape of the first contact 111 of the third probe pin 73 .

[0108] (4) In the test socket 1 of (3), When viewed along the third direction, the shape of the first contact 111 of the second probe pin 72 may be different from the shape of the first contact 111 of the fourth probe pin 74 .

[0109] (5) In any one of the test sockets (1) to (4), The first contact 111 of each of the first probe pin 71, the second probe pin 72, the third probe pin 73, and the fourth probe pin 74 may have an inclined surface 111A.

[0110] (6) In the test socket 1 of (5), The inclined surface 111A of the first probe pin 71 and the inclined surface 111A of the second probe pin 72 may face the same side in the second direction, The inclined surface 111A of the third probe pin 73 and the inclined surface 111A of the fourth probe pin 74 may face the same side in the second direction.

[0111] (7) In inspection socket 1 of (5) or (6), The inclined surface 111A of the first probe pin 71 and the inclined surface 111A of the third probe pin 73 may face opposite sides in the second direction, The inclined surface 111A of the second probe pin 72 and the inclined surface 111A of the fourth probe pin 74 may face opposite directions in the second direction.

[0112] (8) In any one of the test sockets 1 in (5) to (7), The inclined surface 111A of each of the first probe pin 71, the second probe pin 72, the third probe pin 73, and the fourth probe pin 74 may be capable of coming into contact with the contact object 8.

[0113] (9) In any one of the test sockets 1 in (5) to (8), In the second direction, the position of the inclined surface 111A of the first probe pin 71 may be different from the position of the inclined surface 111A of the third probe pin 73.

[0114] (10) In any one of the test sockets 1 in (5) to (9), In the second direction, the position of the inclined surface 111A of the second probe pin 72 may be different from the position of the inclined surface 111A of the fourth probe pin 74.

[0115] (11) In any one of the test sockets 1 in (1) to (10), When viewed along the first direction, the first contact 111 of the first probe pin 71 may be located at a position offset from the second contact 121 of the first probe pin 71, When viewed along the first direction, the first contact 111 of the fourth probe pin 74 may be located at a position offset from the second contact 121 of the fourth probe pin 74 .

[0116] (12) In any one of the test sockets 1 in (1) to (11), When viewed along the first direction, the first contact 111 of the second probe pin 72 and the second contact 122 of the second probe pin 72 may be located at positions where they partially overlap each other, When viewed along the first direction, the first contact 111 of the third probe pin 73 and the second contact 122 of the third probe pin 73 may be located at positions where they partially overlap each other.

[0117] (13) In any one of the test sockets 1 in (1) to (12), The third probe pin 73 may have the same configuration as the second probe pin 72 and be arranged in an opposite direction to the second probe pin 72 in the second direction.

[0118] (14) In any one of the test sockets 1 in (1) to (13), The fourth probe pin 74 may have the same configuration as the first probe pin 71 and be arranged in an opposite direction to the first probe pin 71 in the second direction.

[0119] (15) In any one of the test sockets 1 in (1) to (14), The first probe pin 71 may include an identification portion 121C that enables identification of the second probe pin 72.

[0120] (16) Any one of the test sockets (1) to (15) is There may be a fifth probe pin 75 supported on the housing 5, which may be a power terminal or a ground terminal.

[0121] (17) (16) Inspection socket 1 is Two of the fifth probe pins 75 may be provided, The two fifth probe pins 75 may sandwich the first probe pin 71 and the third probe pin 73 in the third direction.

[0122] (18) In the test socket 1 of (16) or (17), The fifth probe pin 75 may be thicker than the first probe pin 71 .

[0123] (19) In any one of the test sockets 1 of (16) to (18), In the third direction, a gap between the fifth probe pin 75 and the first probe pin 71 may be larger than a gap between the first probe pin 71 and the third probe pin 73 .

[0124] (20) In any one of the test sockets 1 of (16) to (19), Each of the first probe pin 71 and the fifth probe pin 75 may include an elastic portion 13 having a curved portion having a curved shape, When viewed along the third direction, the shape of the elastic portion 13 of the fifth probe pin 75 may be different from the shape of the elastic portion 13 of the first probe pin 71 .

[0125] (21) Any one of the test sockets (16) to (20) is A sixth probe pin 76 may be a power terminal or a ground terminal and supported by the housing 5; The fifth probe pin 75 and the sixth probe pin 76 may be disposed opposite to each other with a gap therebetween in the second direction.

[0126] (22) (21) Inspection socket 1 is Two sixth probe pins 76 may be provided, The two sixth probe pins 76 may sandwich the second probe pin 72 and the fourth probe pin 74 in the third direction.

[0127] (23) In the test socket 1 of (21) or (22), The sixth probe pin 76 may have the same configuration as the fifth probe pin 75 and may be arranged in an opposite direction to the fifth probe pin 75 in the second direction.

[0128] Although the present disclosure has been fully described in connection with the preferred embodiments with reference to the accompanying drawings, various changes and modifications will be apparent to those skilled in the art, and such changes and modifications should be understood to be included within the scope of the present disclosure as defined by the appended claims unless they depart therefrom. [Industrial Applicability]

[0129] The test socket of the present disclosure can be applied to a test device used to test electronic modules such as optical modules, for example. [Explanation of symbols]

[0130] 1 Inspection socket 2, 3, 4, 5, 6 Housing 11 First connection part 11A end 12 Second connection part 12A end 12C Notch 13 Elastic part 131 Part 1 132 Part 2 133 Curved Section 134 Long board section 13A 1st end 13B 2nd end 71 First probe pin 72 Second probe pin 73 3rd probe pin 74 4th probe pin 111 First Contact 111A Slope 111B Protrusion 121, 122 Second contact

Claims

1. Housing and a first probe pin, a second probe pin, a third probe pin, and a fourth probe pin each having a first contact provided at one end in a first direction and a second contact provided at the other end in the first direction, and each supported by the housing; the first probe pin and the second probe pin are arranged opposite to each other with a gap in a second direction intersecting the first direction, the third probe pin and the fourth probe pin are arranged opposite to each other with a gap in the second direction, the first probe pin and the third probe pin are arranged side by side in a third direction intersecting the first direction and the second direction; In the third direction, the second probe pin and the fourth probe pin are arranged side by side, the second contact point of the third probe pin is located between the second contact point of the first probe pin and the second contact point of the second probe pin in the second direction; the second contact point of the second probe pin is located between the second contact point of the third probe pin and the second contact point of the fourth probe pin in the second direction; an inspection socket, wherein when a contact object is brought into contact with the first contact of the first probe pin and the first contact of the third probe pin from the first direction, the first contact of the first probe pin comes into contact with the contact object at a first position, and the first contact of the third probe pin comes into contact with the contact object at a second position different in the second direction from the first position.

2. 2. The inspection socket according to claim 1, wherein when the contact object is brought into contact with the first contact of the second probe pin and the first contact of the fourth probe pin from the first direction, the first contact of the second probe pin comes into contact with the contact object at a third position, and the first contact of the fourth probe pin comes into contact with the contact object at a fourth position different from the third position in the second direction.

3. Housing and a first probe pin, a second probe pin, a third probe pin, and a fourth probe pin each having a first contact provided at one end in a first direction and a second contact provided at the other end in the first direction, and each supported by the housing; the first probe pin and the second probe pin are arranged opposite to each other with a gap in a second direction intersecting the first direction, the third probe pin and the fourth probe pin are arranged opposite to each other with a gap in the second direction, the first probe pin and the third probe pin are arranged side by side in a third direction intersecting the first direction and the second direction; In the third direction, the second probe pin and the fourth probe pin are arranged side by side, the second contact point of the third probe pin is located between the second contact point of the first probe pin and the second contact point of the second probe pin in the second direction; the second contact point of the second probe pin is located between the second contact point of the third probe pin and the second contact point of the fourth probe pin in the second direction; A test socket, wherein a shape of the first contact of the first probe pin is different from a shape of the first contact of the third probe pin when viewed along the third direction.

4. The test socket of claim 3 , wherein a shape of the first contact of the second probe pin is different from a shape of the first contact of the fourth probe pin when viewed along the third direction.

5. 4. The test socket of claim 1, wherein the first contact of each of the first, second, third and fourth probe pins has an inclined surface.

6. the inclined surface of the first probe pin and the inclined surface of the second probe pin face the same side in the second direction; The test socket according to claim 5 , wherein the inclined surface of the third probe pin and the inclined surface of the fourth probe pin face the same side in the second direction.

7. the inclined surface of the first probe pin and the inclined surface of the third probe pin face opposite sides in the second direction; The test socket of claim 5 , wherein the inclined surface of the second probe pin and the inclined surface of the fourth probe pin face in opposite directions in the second direction.

8. 6. The test socket according to claim 5, wherein the inclined surface of each of the first probe pin, the second probe pin, the third probe pin, and the fourth probe pin is capable of contacting a contact object.

9. The test socket of claim 5 , wherein a position of the inclined surface of the first probe pin is different from a position of the inclined surface of the third probe pin in the second direction.

10. The test socket of claim 5 , wherein a position of the inclined surface of the second probe pin is different from a position of the inclined surface of the fourth probe pin in the second direction.

11. When viewed along the first direction, the first contact point of the first probe pin is located at a position offset from the second contact point of the first probe pin; 4. The test socket of claim 1, wherein the first contact of the fourth probe pin is offset from the second contact of the fourth probe pin when viewed along the first direction.

12. When viewed along the first direction, the first contact point of the second probe pin and the second contact point of the second probe pin are located at positions where they partially overlap each other, 4. The test socket according to claim 1, wherein the first contact of the third probe pin and the second contact of the third probe pin are positioned so as to partially overlap each other when viewed in the first direction.

13. 4. The test socket according to claim 1, wherein the third probe pin has the same configuration as the second probe pin and is arranged in an opposite direction to the second probe pin in the second direction.

14. 4. The test socket according to claim 1, wherein the fourth probe pin has the same configuration as the first probe pin and is arranged in an opposite direction to the first probe pin in the second direction.

15. 4. The test socket according to claim 1, wherein the first probe pin includes an identification portion that enables identification of the first probe pin from the second probe pin.

16. 4. The test socket of claim 1, further comprising a fifth probe pin, the fifth probe pin being a power terminal or a ground terminal, supported by the housing.

17. Two of the fifth probe pins are provided, 17. The test socket of claim 16, wherein the two fifth probe pins sandwich the first probe pin and the third probe pin in the third direction.

18. The test socket of claim 16 , wherein the fifth probe pin has a thickness greater than a thickness of the first probe pin.

19. 17. The test socket of claim 16, wherein a gap between the fifth probe pin and the first probe pin in the third direction is larger than a gap between the first probe pin and the third probe pin.

20. Each of the first probe pin and the fifth probe pin includes an elastic portion having a curved portion having a curved shape, The test socket of claim 16 , wherein a shape of the resilient portion of the fifth probe pin is different from a shape of the resilient portion of the first probe pin when viewed along the third direction.

21. a sixth probe pin supported by the housing, the sixth probe pin being a power terminal or a ground terminal; The test socket according to claim 16 , wherein the fifth probe pin and the sixth probe pin are arranged opposite to each other with a gap in between in the second direction.

22. two sixth probe pins; 22. The test socket of claim 21, wherein the two sixth probe pins sandwich the second probe pin and the fourth probe pin in the third direction.

23. 22. The test socket according to claim 21, wherein the sixth probe pin has the same configuration as the fifth probe pin and is arranged in an opposite direction to the fifth probe pin in the second direction.

Images