Test data creation support device and test data creation support method

JP2025180410APending Publication Date: 2025-12-11HITACHI LTD
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Patent Information

Application Number
JP2024087739
Authority / Receiving Office
JP · JP
Patent Type
Applications
Current Assignee / Owner
Filing Date
2024-05-30
Publication Date
2025-12-11

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Abstract

To assist in efficiently increasing the coverage of program tests and creating appropriate test data.SOLUTION: A test data creation support device 30 comprises: a storage device that stores requests received by each unit program and responses sent by each unit program in a program consisting of one or more unit programs; and a calculation device that classifies the respective requests into a plurality of groups and the respective responses corresponding to the respective requests into a plurality of groups according to a data structure of the responses, generates a request-response structure group that is a combination of each request group and each response structure group, and generates, for each generated request-response structure group, a test pattern including requests and responses associated with the request-response structure group.SELECTED DRAWING: Figure 2
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