A test mechanism for OTA testing of an angle test device using a carrier structure having an opening

Abstract

The present invention relates to a test mechanism for OTA testing of an angle test device, and the test mechanism includes a carrier structure and a device under test socket coupled to the carrier structure. The device under test socket is configured to make electrical contact with the inner surface of the device under test or a connector provided on the inner surface of the device under test. The carrier structure has an opening that extends away from the device under test socket in the direction of the normal to the outer surface of the first outer surface of the angle test device.

Description

Technical Field

[0001] Embodiments according to the present invention relate to a test mechanism for OTA (Over the Air) testing, particularly using a carrier structure having an opening.

[0002] Embodiments according to the present invention relate to a socket for OTA testing of an L-shaped antenna in a package module with an automatic test device.

Background Art

[0003] Background of the Invention A test mechanism can be used to test a device under test (e.g., a device of antenna-in-package) that can receive and / or emit electromagnetic radiation. Generally, the device under test has a flat shape with two opposing surfaces such that, for example, one surface faces the device under test socket and the other surface faces away from the device under test socket. For example, the device under test can be oriented such that the surface of the device under test with the antenna faces away from the device under test socket.

Summary of the Invention

Problems to be Solved by the Invention

[0004] However, the shape of the device under test does not have to be planar. For example, the device under test may have an angular shape such as an L-shape. Further, a device with an angular shape may be configured to emit and / or receive electromagnetic radiation on at least one outer surface. For example, a device under test with an angular shape may have one or more antenna arrays (or other antennas) on one or two outer surfaces. As a result, there may be a reduction in flexibility regarding the available directions of the outer surfaces of the device under test. For example, when an angled device under test is provided in a socket, a specific orientation may be required to accommodate its shape. Further, when one outer surface faces away from the carrier structure supporting the socket, another outer surface may have to face at an angle to the carrier structure. However, the carrier structure may cause interference with the electromagnetic radiation received by and / or emitted from the outer surface. Such interference may increase when the outer surface is oriented at an angle to the carrier structure.

[0005] The angled device under test presents challenges regarding the orientation of the device under test and interference with the carrier structure, and may affect test efficiency, accuracy, and reproducibility.

[0006] Therefore, a test mechanism is needed that improves the trade-off between test efficiency, accuracy, and reproducibility.

Means for Solving the Problems

[0007] Summary of the Invention One embodiment of the present invention is directed to a test mechanism for OTA testing an angled (e.g., L-shaped) device under test (e.g., an L-shaped antenna-in-package device under test). The test mechanism includes a carrier structure (e.g., a PCB test apparatus or a load board), and the test mechanism includes a device-under-test socket coupled to the carrier structure (e.g., a PCB test apparatus or a load board). The test mechanism includes a device-under-test test socket coupled to the carrier structure (such as a PCB test apparatus or a load board) (e.g., directly or via an extender assembly and / or a PCB interposer between the carrier structure and the device-under-test socket). The device-under-test socket is configured to make electrical contact with the inner surface of the angled (e.g., L-shaped) device under test (e.g., the inner surface of the angled device under test opposite the second outer surface of the angled device under test) or to establish electrical contact with a connector provided on the inner surface of the angled (e.g., L-shaped) device under test. The carrier structure (e.g., a test apparatus PCB or a load board) has an opening (e.g., a hole or a cutout). The carrier structure (e.g., a test apparatus PCB or a load board) has an opening (e.g., a hole or a cutout) that extends away from the device-under-test socket in the direction of the normal to the outer surface of the first outer surface of the angled device under test (e.g., away from the device-under-test socket in the main radiation direction of the antenna structure on the first outer surface of the device under test).

[0008] The device-under-test socket enables coupling of the angled device under test to the test mechanism. Further, electrical contact enables transmission of at least one of power, one or more control signals, one or more measurement signals, or generally one or more electrical or optical signals between the test mechanism and the device under test coupled to the device-under-test socket.

[0009] The opening of the carrier structure reduces the interference of the electromagnetic field radiated or received by the device under test when coupled to the device under test socket. Since the opening extends away in the direction of the surface normal of the outer surface of the first outer surface of the angled device under test, the interference with the electromagnetic field emitted or received by the first outer surface of the angled device under test is reduced. As a result, the degree of freedom in selecting the orientation of the first outer surface increases. Further, the opening can be configured to receive at least a portion of at least one of the device under test socket, the device under test, and the antenna structure for testing the first outer surface. Therefore, at least a portion of the transmission of electromagnetic waves between the first outer surface and the antenna structure can occur within the opening (thus reducing interference). Further, it should be noted that such an arrangement enables the implementation of a test mechanism having a small structure height. For example, by providing an opening in the carrier structure, it is not necessary to provide a large gap between the device under test and the carrier structure. Rather, the device under test can be placed near the plane of the carrier structure or even reach the plane of the carrier structure. Therefore, this design is particularly advantageous in situations where the gap between the carrier structure and the handler is very limited. Further, this arrangement is suitable for testing a device under test having two antennas on two sides. This is because, compared to the conventional socket arrangement, an antenna substantially parallel to the carrier structure can be placed near the carrier structure, thereby leaving more space between the antenna of the device under test and the associated test antenna without increasing the required height of the entire mechanism including the test antenna. Other antennas that may be substantially perpendicular to the carrier structure may still be sufficiently testable because the opening of the carrier structure, which may be provided adjacent to the main radiation direction of the additional antenna or adjacent to the main radiation direction of the additional antenna, reduces the falsification of the measurement results.

[0010] In conclusion, this test mechanism enables the OTA test of the angled device under test using a relatively small space while providing good accuracy by reducing the influence of the carrier structure.

[0011] This test mechanism can be used, for example, for the near-field test of an antenna in a package device. The test mechanism can be used for electromagnetic wave tests in the 5G frequency band.

[0012] According to one embodiment, the device under test socket is configured to position the angled (e.g., L-shaped) device under test such that the normal to the first outer surface of the angled device under test is parallel within a tolerance of ±15 degrees with respect to the surface (e.g., the main surface) of the carrier structure (e.g., the load board).

[0013] Thus, the first outer surface can receive and / or emit electromagnetic radiation in a direction mainly parallel to the surface of the carrier structure. As a result, the interference of the carrier structure is reduced by the opening of the carrier structure, and the change along the transmission path of the electromagnetic wave is reduced. Further, due to such a direction, the second outer surface can face away from the carrier structure, and thus the interference of the second outer surface is also reduced.

[0014] According to one embodiment, the device under test socket is configured to position the angled (e.g., L-shaped) device under test such that the second outer surface (e.g., the surface having a radiation structure) of the angled device under test faces away from the carrier structure (e.g., the load board), and the normal to the second outer surface of the angled (e.g., L-shaped) device under test is perpendicular within a tolerance of ±15 degrees with respect to the surface of the carrier structure (e.g., the load board).

[0015] Since the second outer surface is basically away from the carrier structure, the interference with the carrier structure is reduced. Further, the test antenna can be arranged and aligned opposite to the second outer surface in an efficient manner.

[0016] According to one embodiment, the opening is a hole extending through the entire thickness of the carrier structure.

[0017] Accordingly, the opening realizes a through-hole and further reduces interference. For example, by using a hole that extends through the entire thickness of the carrier structure, the device under test can be arranged such that radiation from the first outer surface (or even the important lobe of the antenna located on the first outer surface of the device under test) extends within the plane of the carrier structure (at least within the region of the carrier structure where the opening is located). Accordingly, the device under test may extend up to the opening of the carrier structure in some cases. This enables a very compact test mechanism. On the other hand, accurate measurement results can be obtained even when an important lobe (e.g., the main lobe or a strong side lobe) or an important near-field component of the antenna located on the first outer surface of the device under test extends within the plane of the carrier structure.

[0018] Furthermore, the opening may provide access (e.g., in the form of the possibility of routing one or more electrical cables) to devices (e.g., signal sources and / or signal receivers) on the side of the carrier structure facing away from the device under test socket.

[0019] According to one embodiment, the extension of the opening in the direction of the surface normal of the outer surface outside the first outer surface of the angled device under test (e.g., in the main radiation direction of the antenna structure on the first outer surface of the device under test, in the direction away from the device under test socket) is at least 2 wavelengths, or at least 3 wavelengths, or at least 4 wavelengths (e.g., free-space wavelength or wavelength in the medium between the first outer surface of the device under test and the carrier structure) at the lowest operating frequency of the device under test (e.g., at the lowest operating frequency of the module of the antenna-in-package (AiP) that constitutes or is included in the device under test).

[0020] Interference with the carrier structure has been found to be significantly reduced by the openings of the defined dimensions above. The propagation of electromagnetic waves within the openings may be improved. For example, the opening can cover the entire near-field region (or at least 60% or at least 80% of the near-field region) of the antenna provided on the first outer surface of the device under test, and / or a part of the far-field region of the antenna provided on the first outer surface of the device under test (for example, the distance from the antenna is greater than 2D 2 / λ (D is the longitude or diameter of the antenna)). Therefore, the distortion of the antenna characteristics of the antenna provided on the first outer surface of the device under test due to the carrier structure can be reduced due to the presence of the opening.

[0021] According to one embodiment, the extension of the opening in a direction perpendicular to the surface normal outside the first outer surface of the angled device under test (for example, the width of the opening in a direction parallel to the first outer surface) is greater than the extension of the radiation structure on the first outer surface of the device under test (or even greater than twice the extension of the radiation structure, or even greater than three times the extension of the radiation structure), or the extension of the opening in a direction perpendicular to the surface normal outside the first outer surface of the angled device under test (for example, the width of the opening in a direction parallel to the surface normal outside the first outer surface) is greater than the extension of the radiation structure on the first outer surface of the device under test (or even greater than twice the extension of the radiation structure, or even greater than three times the extension of the radiation structure).

[0022] Since the extension of the opening (for example, the lateral extension or "width") is greater than the radiation structure or the device under test, interference from the walls of the opening at the ends of the extension can be reduced. For example, by selecting an appropriate size extension of the opening, it can be achieved that the opening covers the entire near-field region (or at least 60% or at least 80% of the near-field region) of the antenna provided on the first outer surface of the device under test. Therefore, even if the distance between the device under test and the plane of the carrier structure is small, or even if the device under test reaches the plane of the carrier structure, the impact of the carrier structure can be minimized.

[0023] According to one embodiment, the extension of the opening is such that the distance between the end of the angle under test device or the end of the device of the antenna-in-package and the carrier structure is at least one wavelength at the lowest operating frequency of the angle under test device (e.g., the lowest operating frequency of the module of the antenna-in-package (AiP) that constitutes or is included in the device under test) (e.g., the free space wavelength or the wavelength in the medium between the first outer surface of the angle under test device and the carrier structure), while there is no material of the carrier structure within a distance of one wavelength from the end of the angle under test device or the end of the device of the antenna-in-package).

[0024] It is recognized that the influence (e.g., beamforming, reflection, standing wave formation, and interference) of one or more antennas that may be caused by the carrier structure on the radiation and / or reception on the first outer surface is significantly reduced at such a distance. Further, such a distance can be easily provided by providing an opening in the carrier structure while keeping the size of the test mechanism moderately small.

[0025] According to one embodiment, the device under test socket is configured such that at least a part of the device under test is located within the opening when the device under test is inserted into the device under test socket (e.g., the device under test position of the test socket extends within the opening).

[0026] With such an arrangement, the device under test is provided in a region where the interference with the carrier structure is sufficiently small, while the size of the test mechanism can be kept moderately small.

[0027] According to one embodiment, the device under test socket is configured such that the device under test socket extends within the opening (e.g., the device under test position of the device under test socket extends within the opening).

[0028] Therefore, the device under test socket can insert the device under test relatively deeply into the opening. Thus, the device under test socket has high compatibility with different sizes of the device under test and provides many options for positioning the device under test within the opening. Also, with this method, a relatively small structure height can be achieved, and the test mechanism can be used without degrading performance even in a situation where the distance between the handler and the device under test socket is narrow.

[0029] According to one embodiment, the test mechanism comprises a first antenna or a first antenna structure (e.g., a single aperture antenna (e.g., of dual linear polarization or circular polarization)) configured to receive a signal radiated from a first outer surface of the device under test and / or configured to emit a signal received at the first outer surface of the device under test.

[0030] The first antenna or the first antenna device enables an OTA connection to be established with the device under test within the device under test socket. Thus, the first antenna or the first antenna structure enables testing of the device under test. The device under test socket enables the device under test to be oriented in a defined manner such that the first antenna or the first antenna structure is oriented in an accurate direction with respect to the device under test. The opening of the carrier structure enables a relatively distortion-free wireless connection between the antenna on the first outer surface of the device under test and the first antenna or the first antenna structure.

[0031] According to one embodiment, the test mechanism comprises a first antenna or a first antenna structure (e.g., a single aperture antenna (e.g., of dual linear polarization or circular polarization)), and the aperture plane (or aperture or opening) of the first antenna or the first antenna structure is spaced apart from the first outer surface of the angled device under test such that the surface normal of the first outer surface of the angled device under test extends through the aperture plane of the first antenna or the first antenna structure (at least when the second antenna or the second antenna structure is in the operating position).

[0032] It is recognized that a preferred design of the device under test socket may enable supporting the device under test such that the surface normal of the first outer surface of the device under test extends through the aperture plane of the first antenna or the first antenna structure. The first outer surface (or the antenna structure on the first outer surface of the device under test) may be configured to transmit and / or receive such that the main lobe is in a direction perpendicular to the first outer surface (e.g., by beamforming). Thus, by providing the device under test socket and the first antenna such that the surface normal of the first outer surface of the device under test extends through the aperture plane of the first antenna or the first antenna structure, wireless communication between the device under test and the first antenna or the first antenna structure, or generally, the wireless testing of the device under test using the first antenna or the first antenna structure, may be improved.

[0033] According to one embodiment, the first antenna or the first antenna structure is at least partially provided in an opening (e.g., an opening surrounded by a carrier structure (e.g., within the plane of the carrier structure)).

[0034] The opening expands the range within which the first antenna structure can be disposed in a direction perpendicular to the surface of the carrier structure. Thus, the carrier structure is compatible with a plurality of different first antenna structures. Further, when the device under test is at least partially disposed within the opening, a transmission path between the first antenna structure and the device under test can be at least partially provided within the opening. As a result, the height of the structure of the test mechanism can be reduced without significantly degrading the test results.

[0035] According to one embodiment, the radiation aperture plane of the first antenna or the first antenna structure is at least partially provided within the opening (e.g., within an opening surrounded by a carrier structure (e.g., within the plane of the carrier structure)).

[0036] With such an arrangement of the radiation opening surface, electromagnetic waves radiated and / or received at the radiation opening surface can at least partially travel within the opening. As a result, the distance between the carrier structure and the handler can be kept small, and for example, distortion caused by the handler (which may be movable at a position away from the carrier structure) can be kept within the tolerance.

[0037] According to one embodiment, the first antenna or the first antenna structure is attached at a fixed position with respect to the device under test socket.

[0038] Such a fixed position enables repeated coupling and testing of a plurality of devices under test so that the plurality of devices under test have equal or similar geometric relationships with respect to the first antenna or the first antenna structure. As a result, the accuracy and reproducibility of the test are improved.

[0039] According to one embodiment, the first antenna or the first antenna structure is mechanically attached to the arm of a handler (configured to insert the device under test into the device under test socket) such that the first antenna or the first antenna structure is movable (wherein when the handler pushes the device under test into the device under test socket, the first antenna or the first antenna structure is at least partially provided in the opening).

[0040] The arm enables the first antenna or the first antenna structure to be movable, thereby enabling removal or readjustment of the first antenna or the first antenna structure (for example, to facilitate coupling of the angle test device to the test device socket). When the handler is configured to insert the test device into the test device socket, the handler facilitates coupling and positioning of the first antenna or the first antenna structure during coupling of the test device to the test device socket. For example, the first antenna or the first antenna structure may be in a fixed positional relationship with a pusher that pushes the test device into the test device socket. As an example, the pusher may be directly connected to the first antenna or the first antenna device. Accordingly, therewith, alignment between the first antenna or the first antenna structure and the test device can be achieved very stably and reproducibly.

[0041] According to one embodiment, the first antenna or the first antenna structure is configured to be connected to a signal source and / or a signal receiver via a blind mating microwave connection (for example, via a blind mating (hollow) waveguide connection) when the handler positions the first antenna or the first antenna structure in the operating position (or equivalently, when the handler inserts the test device into the test socket, or when the handler pushes the test device into the test socket).

[0042] The signal source enables the first antenna or the first antenna structure to emit a signal (e.g., received by the antenna array of the device under test), and / or the signal receiver enables the evaluation of a received signal (e.g., radiated by the antenna or antenna array of the device under test and received by the first antenna or the first antenna structure). Thus, both the signal source and the signal receiver facilitate the testing of the device under test. The blind mating microwave connection facilitates the (e.g., manual and / or automatic) coupling between the signal source and / or the signal receiver and the first antenna or the first antenna structure. Thus, an efficient test is possible even if the first antenna or the first antenna structure is in a movable configuration (as described above).

[0043] According to one embodiment, the test mechanism includes a second antenna or a second antenna structure (e.g., a single aperture antenna (e.g., of dual linear polarization or circular polarization)) configured to receive a signal radiated from a second outer surface of the angled device under test and / or to emit a signal received at the second outer surface of the angled device under test (at least when the second antenna or the second antenna structure is disposed in an operating position) (or equivalently, when the handler inserts the angled device under test into the test socket or when the handler presses the device under test into the test socket).

[0044] The second antenna or the second antenna structure enables the testing of the antenna structure on the second outer surface of the device under test. The second antenna or the second antenna structure benefits from the direction of the second outer surface defined by the device under test socket. The first and second antennas or the first and second antenna structures can perform the testing of the device under test (e.g., simultaneously or sequentially) using the signals emitted by and / or received by the antennas or antenna structures on the first and second outer surfaces of the device under test without having to reconnect the angled device under test in different orientations (e.g., or in different device under test sockets). Thus, a high test throughput can be achieved.

[0045] According to one embodiment, the test mechanism includes a second antenna or a second antenna structure (e.g., a single aperture antenna (e.g., with dual linear polarization or circular polarization)). The aperture of the second antenna or the second antenna structure is spaced from the second outer surface of the angle test device such that the normal to the second outer surface of the angle test device extends through the aperture of the second antenna or the second antenna structure (at least when the second antenna or the second antenna structure is disposed in the operating position) (or equivalently, when the handler inserts the angled device under test into the test socket, or when the handler pushes the device under test into the test socket).

[0046] It is recognized that a preferred design of the device under test socket enables supporting the device under test such that the normal to the second outer surface of the device under test extends through the aperture of the second antenna or the second antenna structure. The second outer surface (or an antenna structure on the second outer surface of the device under test) may be configured to transmit and / or receive such that the main lobe is in a direction perpendicular to the second outer surface (e.g., by beamforming). Thus, by providing the device under test socket and the second antenna or the second antenna structure such that the normal to the second outer surface of the device under test extends through the aperture of the second antenna or the second antenna structure, wireless communication between the device under test and the second antenna or the second antenna structure, or generally, wireless testing of the device under test using the second antenna or the second antenna structure, can be improved.

[0047] According to one embodiment, the second antenna or the second antenna structure is mechanically attached to the arm of a handler (configured to insert and / or push the device under test into the device under test socket) such that the second antenna or the second antenna structure is movable. The first and second antennas or the first and second antenna structures may be attached to, for example, the same / common handler or each may be attached to an individual handler.

[0048] The arm enables movement of the second antenna or the second antenna structure, thereby allowing removal or readjustment of the second antenna or the second antenna structure (e.g., to facilitate coupling of the angle test device to the test device socket). When the handler is configured to insert the test device into the test device socket, the handler facilitates coupling and positioning of the first antenna or the first antenna structure during coupling of the test device to the test device socket. In the case of a common handler, the first and second antenna structures may be arranged in a predetermined direction to facilitate orienting the first and second antenna structures with respect to the first and second outer surfaces. In the case of separate arms, it is possible to customize the orientation of the first and second antenna structures. Further, it should be noted that the second antenna or the second antenna structure and the pusher for pushing the test device into the test device socket may be in a fixed positional relationship. Thus, the relative position between the test device and the second antenna or the second antenna structure is very accurate and highly reproducible, and the reproducibility of the test can be improved. For example, the pusher for pushing the test device into the test device socket may be directly (mechanically) connected to the second antenna or the second antenna structure, resulting in improved accuracy in particular.

[0049] According to one embodiment, the second antenna or the second antenna structure is part of a pusher for pushing the device under test into the device-under-test socket, or the second antenna or the second antenna structure is configured to be movable together with a pusher for pushing the device under test into the device-under-test socket (for example, the pusher is provided such that when the device under test is inserted into the device-under-test socket, the pusher or a part of the pusher is between the second antenna or the second antenna structure and the second surface of the angled device under test) (and, for example, the pusher is provided such that when the device under test is inserted into the device-under-test socket, the pusher or a part of the pusher is between the first antenna or the first antenna structure and the first outer surface of the angled device under test).

[0050] Thus, the second antenna or the second antenna structure is movable together with the pusher, and thus can be moved (for example, to facilitate the coupling of the angled device under test to the device-under-test socket) or repositioned (for example, its orientation). Since the pusher is configured to push the device under test into the device-under-test socket, the pusher facilitates the coupling and positioning of the second antenna or the second antenna structure when coupling the device under test to the device-under-test socket. Such an arrangement can achieve good position accuracy. Furthermore, mechanical collisions between the pusher and the second antenna or the second antenna structure can be reliably avoided.

[0051] According to one embodiment, the second antenna or the second antenna structure is configured to be connected to a signal source and / or a signal receiver via a blind-mate microwave connection (for example, via a blind-mate (hollow) waveguide connection) when the handler positions the second antenna or the second antenna structure in the operating position (or equivalently, when the handler inserts the angled device under test into the test socket, or when the handler pushes the device under test into the test socket).

[0052] The signal source enables the second antenna or the second antenna structure to emit a signal (e.g., received by the antenna array of the device under test), and / or the signal receiver enables the evaluation of a received signal (e.g., radiated by the antenna or antenna array of the device under test and received by the second antenna or the second antenna structure). Thus, both the signal source and the signal receiver facilitate the testing of the angular device under test. The blind mating microwave connection can facilitate the coupling (e.g., manually and / or automatically) between the signal source and / or the signal receiver and the second antenna or the second antenna structure. Thus, an efficient test is possible even in a configuration where the second antenna or the second antenna structure is movable (as described above).

[0053] According to one embodiment, the device under test socket includes an angular recess or an angular relief configured to support and / or align the angular device under test. The angular recess or the angular relief may have sidewalls at one or both of its ends.

[0054] The angular recess or the angular relief has two (or more) (e.g., angled) abutment surfaces that may respectively abut against the first and second outer surfaces of the device under test. Such a support table surface can achieve a predetermined orientation and / or position of the angular device under test (at least partially). The predetermined orientation and / or position of the device under test can facilitate the establishment of electrical connections and improve the reproducibility and accuracy of the test. The optional one or more sidewalls can further limit the lateral movement of the device under test, while typically allowing for a smooth insertion of the device under test into the device under test socket.

[0055] According to one embodiment, the device under test socket includes one or more coaxial pogo pins (e.g., extending from the lower surface of the device under test socket that contacts the PCB test apparatus or load board to the upper surface of the device under test socket that contacts the second inner surface of the angled device under test) to establish an electrical connection between the PCB test apparatus or load board and the device under test (e.g., the first end of the coaxial pogo pin may contact a pad on the PCB test apparatus or load board, and the second end of the coaxial pogo pin may contact a pad on the device under test or a connector of the device under test).

[0056] The pogo pins are generally pressable and enable the device under test socket to establish a reliable electrical contact with the device under test when the device under test is coupled to the device under test socket (e.g., when being pushed into the device under test socket by a handler / pusher). For example, a coaxial spring (or spring-loaded pin) enables a high-frequency interconnect to the device under test socket.

[0057] According to one embodiment, the test mechanism includes at least two device under test sockets configured to support respective angled devices under test (e.g., two equal devices under test), and the at least two device under test sockets are provided to position respective angled devices under test (e.g., back-to-back) such that respective first outer surfaces of respective angled devices under test are aligned in opposite (facing away) directions.

[0058] The test mechanism including at least two device under test sockets enables testing of multiple devices under test at once (e.g., simultaneously or sequentially, e.g., within one cycle when a handler places the devices under test into the device under test sockets). Further, by aligning respective first outer surfaces of respective angled devices under test in opposite (facing away) directions, interference between signals emitted by respective first outer surfaces and / or signals received at respective first outer surfaces is reduced.

[0059] According to one embodiment, the test mechanism includes at least two rows (e.g., parallel rows) of device-under-test sockets, and the device-under-test sockets are each configured to support a respective angled device-under-test. The at least two rows of device-under-test sockets are provided to position respective angled devices-under-test such that respective first outer surfaces of the respective angled devices-under-test are aligned in opposite (facing away) directions (e.g., back-to-back, with the sides of the device-under-test sockets on which the first outer surfaces of the devices-under-test are located facing away from each other).

[0060] Such an arrangement improves the trade-off between arranging a plurality of devices-under-test at high density and reducing interference between signals emitted by respective first outer surfaces and / or signals received at respective first outer surfaces.

[0061] According to one embodiment, the carrier structure has at least two openings and a solid intermediate portion (e.g., a solid bar) therebetween, and two or more device-under-test sockets are provided on the solid intermediate portion between the openings, and one or more device-under-test positions of the device-under-test sockets are aligned toward a first opening of the at least two openings and one or more device-under-test positions of the device-under-test sockets are aligned toward a second opening of the at least two openings (such that device-under-test inserted into two device-under-test sockets on the solid intermediate portion provided back-to-back are aligned toward different openings).

[0062] Such an arrangement improves the trade-off between arranging a plurality of devices under test at high density and reducing interference between signals emitted by and / or received at respective first outer surfaces. Further, the first opening and / or the second opening can form a common opening for the plurality of devices under test, which can reduce interference more than providing a plurality of openings for each device under test. In other words, the opening may be extended so as to be associated with the plurality of devices under test. Accordingly, the lobes of the antennas or antenna structures of the plurality of devices under test can reach the common opening. However, if the side lobe levels of adjacent devices under test sharing the common opening are low enough, or if adjacent devices under test are tested at sufficiently different frequencies, simultaneous testing of the plurality of devices under test is possible. Further, since there is no conductive or dielectric material in the (common) opening, crosstalk between adjacent devices under test can be reduced.

[0063] One embodiment of the present invention is directed to a test mechanism for OTA testing an angled (e.g., L-shaped) device under test (e.g., an L-shaped antenna-in-package device under test). The test mechanism comprises a carrier structure (e.g., a PCB test fixture or a load board). The test mechanism comprises a device under test socket coupled to the carrier structure (e.g., directly or using an extender assembly and / or a PCB interposer between the carrier structure and the device under test socket). The device under test socket is configured to establish electrical contact with the inner surface of the angled (e.g., L-shaped) device under test (e.g., the inner surface of the angled device under test opposite the second outer surface of the angled device under test) or a connector provided on the inner surface of the angled device under test (e.g., L-shaped). The device under test socket is configured to position the angled device under test such that the surface normal of the first outer surface of the angled (e.g., L-shaped) device under test is parallel within a tolerance of ±15° with respect to the surface (e.g., the main surface) of the load board, and the second outer surface (e.g., the surface having a radiation structure) of the angled (e.g., L-shaped) device under test faces away from the load board, and the surface normal of the second outer surface of the angled (e.g., L-shaped) device under test is perpendicular within a tolerance of ±15° with respect to the main surface of the load board. The carrier structure (e.g., the test fixture PCB or the load board) has an opening (e.g., a hole or a cutout). The carrier structure (e.g., the test fixture PCB or the load board) has an opening (e.g., a hole or a cutout) extending in a direction away from the device under test socket in the direction of the surface normal of the outer side of the first outer surface of the angled device under test (e.g., in the main radiation direction of the antenna structure on the first outer surface of the device under test away from the device under test socket).

[0064] Such a test mechanism has the above-mentioned advantages.

Brief Description of the Drawings

[0065] The drawings are not necessarily to scale and instead generally focus on explaining the principles of the present invention. In the following description, various embodiments of the present invention are described with reference to the following drawings.

Figure 1

Figure 2A

Figure 2B

Figure 3

Figure 4

Figure 5

Figure 6

Figure 7A

Figure 7B

Figure 8

Figure 9

Figure 10

Figure 11A

Figure 11B

Figure 12

Figure 13

[0066] **Detailed Description of Embodiments** In the following description, elements that are equivalent or have equivalent functions, even if they appear in different figures, are denoted by equivalent or identical reference numerals.

[0067] In the following description, a plurality of details are set forth in order to provide a more thorough description of embodiments of the present invention. However, it will be apparent to those skilled in the art that embodiments of the present invention may be practiced without these specific details. In other instances, well-known structures and devices are shown in block diagram form rather than in detail in order to avoid obscuring embodiments of the present invention. Further, features of different embodiments described hereinafter can be arbitrarily combined with each other unless otherwise specified.

[0068] FIG. 1 shows a schematic cross-section of an example of a test mechanism 100 for OTA testing of an angle device under test 140.

[0069] The test mechanism includes a carrier structure 110 and a device under test socket 130 coupled to the carrier structure 110. The device under test socket 130 is configured to establish electrical contact with the inner surface 142 of the angle device under test 140 or a connector (not shown in FIG. 1) provided on the inner surface 142 of the angle device under test 140. The carrier structure has an opening 120 that extends away from the device under test socket 130 in the direction of the surface normal 143a outside the first outer surface 141a of the angle device under test 140.

[0070] The carrier structure 110 may be (or may be configured as) a printed circuit board (PCB) test apparatus or a load board. The carrier structure 110 may have, for example, a region with a flat surface. The device-under-test socket 130 may be provided on the carrier structure 110 (e.g., on the flat surface) and may be coupled to the carrier structure 110 via one or more intermediate devices or structures.

[0071] The test mechanism 100 shown in FIG. 1 can be used, for example, to test the angled device-under-test 140 itself (e.g., without an antenna structure to detect electromagnetic radiation emitted by the angled device-under-test) or to test the device-under-test 140 in combination with one or more additional antennas. For example, the test mechanism 100 may be used to test the power consumption of the device-under-test 140 or the interference between the antennas of the device-under-test 140. Alternatively, the test mechanism 100 may be configured to wirelessly test one or more antenna structures of the device-under-test.

[0072] The device-under-test socket 130 is configured to contact the inner surface 142 of the device-under-test, and the outer surface of the device-under-test 140 faces away from the device-under-test socket 130 and the carrier structure 110 completely (or at least mostly). Thus, the influence of the device-under-test socket 130 and / or the carrier structure 110 on the radiation emitted (and / or received) by the outer surface of the device-under-test 140 (and the influence on its test) is reduced. Also, the opening 120 reduces the influence of the carrier structure 110 on the device-under-test and thus on the test results.

[0073] The angle test device 140 may be, for example, a device of an antenna-in-package (AiP) (or may be composed of a device of an antenna-in-package (AiP)). For example, the test device 140 may have an L shape (as abstractly shown in FIG. 1). For example, the test device may be a device having a first plate 141a connected to a second plate 141b. The first plate 141a and the second plate 141b may be angled with respect to each other at, for example, at least essentially 90 degrees (for example, within a tolerance of ±15 degrees). The angle test device 140 may have a first outer surface 144a (for example, of the first plate 141a) and a second outer surface 144b (for example, of the second plate 141b). For example, the first and second outer surfaces 144a, b may be angled with respect to each other at at least substantially 270 degrees (for example, within a tolerance of ±15 degrees). The inner surface 142 of the angle test device 140 may have a first inner surface 142a (for example, of the first plate 141a) and a second inner surface 142b (for example, of the second plate 141b). For example, the first and second inner surfaces 142a, b may be angled with respect to each other at at least substantially 90 degrees (for example, within a tolerance of ±15 degrees). The first inner surface 142a and the first outer surface 144a may be provided parallel to each other, for example. The second inner surface 142b and the second outer surface 144b may be provided parallel to each other, for example.

[0074] The test device socket 130 may be configured to position the angle test device 140 such that the second outer surface 144b of the angle test device 140 faces away from the carrier structure 110. The test device socket 130 may be configured to position the angle test device 140 such that the surface normal 143b of the second outer surface 144b of the angle test device is perpendicular to the surface 112 of the carrier structure 110 within a tolerance of ±15 degrees. The second outer surface 144b may be provided parallel to the surface 112 of the carrier structure 110.

[0075] FIG. 2A shows a schematic cross-section of a first example of an angle test device 240 that can replace the angle test device 140.

[0076] The test device 240 has a first plate 241a and a second plate 241b that are angled with respect to each other at an angle of 90 degrees (e.g., within a tolerance of ±15 degrees). The first plate 241a includes a first outer surface 244a and a first inner surface 242a, and the second plate 241b includes a second outer surface 244b and a second inner surface 242b.

[0077] In the example shown in FIG. 2A, the first outer surface 244a has a first antenna array 246a that includes four antenna elements. However, the first outer surface 244a may (additionally or alternatively) have any other form of antenna (e.g., a single antenna and / or a circularly polarized antenna) and any other number of antenna elements or antenna arrays. Alternatively, the second outer surface 244b may have the first antenna array 246a. The first antenna array 246a may be configured to receive and / or transmit electromagnetic radiation.

[0078] The device under test 240 may further have a connector 248, for example, an array connector. In the example shown in FIG. 2A, the (array) connector 248 is provided on the second inner surface 242b. Alternatively, the (array) connector 248 may be provided on the first inner surface 242a, or (for example, in the case of a plurality of (array) connectors 248) on the first and second inner surfaces 242a,b, and the (array) connector 248 is electrically connected to at least one (for example, all) antenna elements of the first antenna array 246a. Thus, the electrical signal applied by the (array) connector 248 can cause the first antenna array 246a to emit electromagnetic radiation. Alternatively or additionally, the electromagnetic radiation received by the first antenna array 246a may result in an electrical signal at the (array) connector 248. The (array) connector 248 may be or include one or more solder balls. The (array) connector 248 may be configured to connect the device under test 140 (for example, an antenna within a package module) to a system (for example, a mobile phone or a device under test socket 130), enabling the transmission of signals such as power signals, digital signals, and radio frequency (RF) signals at intermediate frequency (IF).

[0079] The first antenna array 246a may be directly electrically connected to the (array) connector 248, or may be indirectly coupled to the (array) connector 248, for example, with additional electrical components in between. For example, the additional electrical components may include at least one of an amplifier, a filter, a switch, a resistor, a capacitor, and an integrated circuit. In the example shown in FIG. 2A, the additional electrical components include an antenna circuit 249 (for example, a silicon die). The antenna circuit 249 may be configured to convert an intermediate frequency (IF) signal into a millimeter wave signal (such as in the range of 24 GHz to 53 GHz for a 5G bandwidth), and / or vice versa. Alternatively or additionally, the antenna circuit 249 may be configured to (at least partially) control the beamforming of the first antenna array 246a.

[0080] Figure 2B shows a schematic cross-section of a second example of an angle test device 240a that can replace the angle test device 140.

[0081] The second example of the angle test device 240a basically corresponds to the first example of the angle test device 240 as shown in FIG. 2A, such that the same elements are designated by the same reference numerals, but further has a second antenna array 246b on the second outer surface 244b. The second antenna array 246b may have similar characteristics to the first antenna array 246a. Also, the second antenna array 246b may be electrically connected to at least one of the (array) connector 248 and the antenna circuit 249. Alternatively, the second antenna array 246b may be electrically connected to a separate array connector and / or a separate antenna circuit.

[0082] The device under test socket 130 may be configured to position the angle test device 140 (e.g., the angle test device 240 or the angle test device 240a) such that the first outer surface 144a of the angle test device 140 (e.g., the first outer surface 244a) is spaced from the surface 112 of the carrier structure 110. The device under test socket 120 may be configured to position the angle test device 140 such that the normal 143a to the surface of the first outer surface 144a of the angle test device 140 is parallel to the surface 112 of the carrier structure 110 (as illustratively depicted in FIG. 1) (e.g., within a tolerance of ±15 degrees). The first outer surface 144a may be provided perpendicular to the surface 112 of the carrier structure 110.

[0083] The test device socket 120 is configured to position the angle test device 140 such that the distance (e.g., the first distance 114) between the first outer surface 144a of the angle test device 140 and the carrier structure 110 (e.g., its surface 112) is at least two wavelengths (or at least 10 mm, or at least 30 mm, or at least 45 mm) at the minimum operating frequency of the angle test device. The angle test device 140 can operate within a frequency band of the 5G standard, e.g., in the range from 24 GHz to 53 GHz (e.g., frequency band 2). In such a case, the minimum operating frequency may be 24 GHz with a wavelength of 12.5 mm. The space between the first outer surface 144a and the surface 112 of the carrier structure 110 may be, for example, 25 mm or more (i.e., twice 12.5 mm).

[0084] Figure 3 shows a perspective view of an angle test device 340 that can replace the angle test device 140. The test device 340 includes a first outer surface 344a having a first antenna array including four antenna elements, and a second outer surface 344b having a second antenna array including four antenna elements. At least one antenna element may include at least one parasitic patch. In the example shown in Figure 3, each antenna element includes four parasitic patches surrounding a central antenna structure. The first outer surface 344a has two central antenna arrays 345a, b. There is no metallized surface in the vicinity of the test device 340.

[0085] FIG. 4 shows the results of a simulation of the far field radiated by an antenna element (e.g., antenna element 345a or 345b) of the first antenna array on the first outer surface 344a of the device under test 340 depicted in FIG. 3. For simplicity, note that the far field simulation depicted in FIG. 3 originates from the center of the antenna array on the first outer surface 344a (e.g., between the central antenna elements 345a, b). However, the far field simulation may have at least substantially the same shape if it originates from the center of one of the central antenna elements 345a, b. The far field shows a prominent lobe directed in a direction perpendicular to the two central antenna elements 345a, b on the first outer surface 344a (however, when the device under test 340 is applied to a system, e.g., a system providing a metallized backplane, the radiation in the rear direction may be reduced or suppressed).

[0086] FIG. 5 shows a perspective view of an angle device under test 540 that can replace the angle device under test 140. The device under test 540 includes a first outer surface 544a having a first antenna array including four antenna elements, and a second outer surface 544b having a second antenna array including four antenna elements. The first antenna array on the first outer surface 544a includes two central antenna elements 545a, b, and there is a metal (e.g., copper) surface 550 at a distance of 2 mm from the first outer surface 544a.

[0087] FIG. 6 shows the results of a simulation of the far field emitted by an antenna element (e.g., antenna element 545a or 545b) of the first outer surface antenna array 544a of the device under test 530 depicted in FIG. 5 (preferably taking into account the metal surface 550). Compared to the results depicted in FIG. 4, the far field shows that the radiation directed perpendicular to the two central antenna elements of the first outer surface 544a is less prominent. Instead, the intensity of the far field is more evenly distributed around the device under test 540, with separate main lobes in two directions different from the direction of the surface normal on the first outer surface 544a. This result indicates that a nearby metallized surface can affect the far field emitted by the device under test 540 and thus potentially reduce the accuracy and / or reproducibility of the test. For example, the metallized surface can reduce the spatial selectivity of a beamforming antenna array and / or change the direction of the main lobe.

[0088] Therefore, the openings of the carrier structure, optionally with the spacing as described above (e.g., at least two wavelengths, or at least 10 mm, or at least 30 mm, or at least 45 mm), can improve the accuracy and / or reproducibility of the test.

[0089] FIG. 7A shows a perspective view of an example of a device under test 740. The device under test 740 has a first inner surface 742a and a second inner surface 742b. In the example shown in FIG. 7A, the device under test has a first plate 741a including the first inner surface 742a and a second plate 741b including the second inner surface 742b. The first and second plates 741a, b are mechanically (and optionally electrically) connected by a flexible conductive structure such as three flexible printed circuits 747a, b, c. The first and second plates 741a, b may be movable (e.g., rotatable or foldable) relative to each other (e.g., to facilitate manufacturing or assembly in a system). However, plate mobility may in some cases facilitate coupling to a device under test socket, but in other cases may complicate testing. Alternatively, the first and second plates 741a, b may be fixedly provided relative to each other.

[0090] The device under test 740 has a connector or array connector 748 and a silicon die 749 (or other antenna circuit) on the second inner surface 742b. The silicon die 749 may be in electrical contact indirectly via the array connector 748 or directly via an electrical contact (not shown in FIG. 7A) of the silicon die 749 itself. The device under test socket described herein is configured to establish electrical contact with the array connector 748 on the inner surface (e.g., the second inner surface 742b) of the device under test 740.

[0091] Figure 7B shows a different perspective view of the device under test 740 depicted in Figure 7A. The device under test 740 has a first outer surface 744a (on the first plate 741a) and a second outer surface 744b (on the second plate 741b). The first and second outer surfaces 744a, b (or, for example, respective antennas or antenna structures formed or provided on the first and second outer surfaces) are configured to emit and / or receive electromagnetic radiation. For this purpose, antenna elements (e.g., an antenna array) may be provided at least partially on the first and / or second outer surfaces 744a, b, or may be provided at least partially within the first and / or second plates 741a, b. In the example shown in Figure 7B, the first and second outer surfaces 744a, b are configured to emit and / or receive electromagnetic radiation. Alternatively, only the first or second outer surface 744a, b may be configured to emit and / or receive electromagnetic radiation.

[0092] In the example shown in Figure 1, the device under test socket 130 is configured to position an angled device under test 140 (or the first outer surface 741a of, for example, an angled (e.g., L-shaped) device under test 140) such that the surface normal 143a of the first outer surface 141a of the angled device under test 140 is parallel within a tolerance of ±15 degrees with respect to the surface (e.g., the main surface) of the carrier structure (e.g., a load board). Alternatively, the device under test socket 130 may be configured to position the angled device under test 140 (or the angled device under test 740) at other angles.

[0093] In the example shown in FIG. 1, the device under test socket 130 is configured to position the angled (e.g., L-shaped) device under test 140 such that the second outer surface 144b (e.g., a surface having a radial structure) (or the second outer surface 744b) of the angled (e.g., L-shaped) device under test 140 faces away from the carrier structure 110 (e.g., a load board), and the surface normal 143b of the second outer surface 144b (or the second outer surface 744b) of the angled device under test 140 is perpendicular within a tolerance of ±15 degrees with respect to the surface of the carrier structure (e.g., a load board).

[0094] In the example shown in FIG. 1, the opening 110 forms a blind hole that does not extend through the entire thickness of the carrier structure 110. The blind hole can reduce the risk of components falling through (e.g., during attachment). Alternatively, the opening 110 may be a through hole that extends through the entire thickness of the carrier structure 110. The through hole can reduce interference caused by the carrier structure 110 and facilitate guiding an electrical connection to a side surface of the carrier structure (e.g., a signal source and / or a signal receiver) opposite the device under test socket 130.

[0095] The extension 121 of the opening in the direction of the normal 143a of the outer surface of the first outer surface 144a of the angle test device 140 (for example, the direction away from the test device socket 130 in the main radiation direction of the antenna structure on the first outer surface of the test device, parallel to the x-axis in the example of FIG. 1, for example, the negative x-direction) is at least 2 wavelengths, or at least 3 wavelengths, or at least 4 wavelengths (for example, free space wavelength, or wavelength in the medium between the first outer surface of the angle test device and the carrier structure) at the lowest operating frequency of the angle test device (for example, the lowest operating frequency of the module of the antenna-in-package (AiP) that constitutes or is included in the test device). For example, the angle test device 140 can operate in the frequency band of the 5G standard, for example, the frequency band of 24 GHz to 53 GHz (for example, frequency band 2). In such a case, the lowest operating frequency may be 24 GHz at which the (free space) wavelength is (about) 12.5 mm. The extension 121 of the opening in the direction of the normal 143a of the outer surface of the first outer surface 144a may be, for example, 25 mm or more (i.e., twice 12.5 mm).

[0096] FIG. 8 shows a schematic top view of an example of the test mechanism 800. When viewed from above, the test mechanism 100 depicted in FIG. 1 may appear at least similar to the drawing of FIG. 8. In other words, any of the features, functionality, and details described with respect to the test mechanism 800 may be optionally used (or implemented) in the test mechanism 100, and vice versa.

[0097] The test mechanism 800 includes a carrier structure 810 having an opening 820 and a test device socket 830 in which a test device 840 can be disposed. The opening 820 has a rectangular shape. However, the opening 820 may have other shapes such as circular, elliptical, polygonal, etc. The opening 820 may have one or more rounded corners.

[0098] The opening has an extension 821 in the direction of the surface normal 843a of the outer surface of the first outer surface 844a of the angle test device 840 (the direction of the x-axis in FIG. 8B), or equivalently, in the direction of the surface normal of the surface of the test socket configured to substantially coincide with the first inner surface of the angle test device 840. The extension 821 may be greater than two wavelengths, or greater than three wavelengths, or greater than four wavelengths (e.g., free space wavelength) at, for example, the lowest operating frequency of the antenna of the device under test.

[0099] The extension 822 of the opening 820 in the direction perpendicular to the surface normal 843a of the first outer surface 844a of the angle test device 840 (e.g., the width of the opening 820 in the direction parallel to the first outer surface 844a, e.g., the direction parallel to the y-axis in FIG. 8) is greater than, for example, the extension 823 of the device under test 840 (or greater than the extension 823 of the radiation structure on the first outer surface 844a of the device under test). The extension 822 may be greater than two wavelengths, or greater than three wavelengths, or greater than four wavelengths (e.g., free space wavelength) at, for example, the lowest operating frequency of the antenna of the device under test.

[0100] By using such extensions 821, 822 of the opening, it is possible to have good electromagnetic characteristics for the wireless testing of the device under test (e.g., when the antenna or antenna structure of the device under test radiates in the direction of the surface normal 823, or when the device under test receives radiation along the direction of the surface normal 823).

[0101] FIG. 9 shows a schematic cross-section of an example of a test mechanism 900 including a carrier structure 910 and a device-under-test socket 930 that may be configured to support a device-under-test 940. The carrier structure 910 has an opening 920 that extends away from the device-under-test socket 930 in the direction of the surface normal 843a of the outer surface of the first outer surface 944a of the angled device-under-test 940 (or equivalently, the direction of the surface normal of the outer surface of the first surface of the device-under-test socket adapted for the first inner surface of the angled device-under-test 940). In the example shown in FIG. 9, the opening 920 is a hole that extends through the entire thickness of the carrier structure 910. Alternatively, the opening 930 may be a blind hole.

[0102] The device-under-test socket 930 is configured such that at least a portion of the device-under-test 940 is positioned within the opening 920 when the device-under-test 940 is inserted into the device-under-test socket 930. In the example shown in FIG. 9, the device-under-test socket 930 is configured to extend within the opening 920 (e.g., partially or entirely through the opening 920). As a result, a portion of the device-under-test 940 inserted into the device-under-test socket 930 may extend into the opening 920. Alternatively, the device-under-test socket 930 may be provided entirely above the opening 920 (i.e., does not extend into the opening 920), and the device-under-test 940 is sized such that it extends into the opening 920 when inserted into the device-under-test socket 930. However, in other embodiments, the device-under-test may not extend into the opening 920.

[0103] According to one embodiment, the test mechanism includes a first antenna or first antenna structure (e.g., a single aperture antenna (e.g., of dual linear polarization or circular polarization)) configured to receive a signal radiated from the first outer surface of the device-under-test and / or configured to emit a signal received by the first outer surface of the device-under-test.

[0104] The extension of the opening 920 is such that the distance 924 between the end of the angle test device (e.g., the first outer surface 944a of FIG. 9) or the end of the device of the antenna-in-package and the carrier structure 910 (e.g., the distance between the end of the angle test device or the end of the antenna-in-package device and the closest end of the opening) is at least one wavelength (e.g., free space wavelength, or wavelength in the medium between the first outer surface of the angle test device and the carrier structure) at the lowest operating frequency of the angle test device 940 (e.g., the lowest operating frequency of the module of the antenna-in-package (AiP) that constitutes or is included in the test device 940). Thus, the extension of the opening 920 can be selected (while there is no material of the carrier structure 910 within a distance of one wavelength from the end of the test device 940 or from the end of the device of the antenna-in-package).

[0105] The test device socket 930 has one or more coaxial pogo pins 932 to establish an electrical connection between the carrier structure 910 (e.g., the PCB test device or load board of the carrier structure 910) and the angle test device 940. The pogo pin 932 may extend, for example, from the lower surface of the test device socket 930 (which may contact the PCB test device or load board of the carrier structure 910) to the upper surface of the test device socket 930 (which may contact the second inner surface 942b of the angle test device 940). For example, the first end of the coaxial pogo pin 932 may contact a pad on the PCB test device or load board (e.g., of the carrier structure 930). The second end of the coaxial pogo pin may contact a pad on the angle test device 940 or a connector of the angle test device 940. The pogo pin 932 may extend, for example, beyond the upper surface of the test device socket 930 and is configured to shorten when the test device 940 is inserted into the test device socket 940.

[0106] In the example shown in FIG. 9, the test mechanism 900 includes a first antenna or first antenna structure 950 and a second antenna or second antenna structure 952. However, the test mechanism 900 may include only one of the first and second antennas or first and second antenna structures 950, 952.

[0107] The first antenna or first antenna structure 950 (e.g., a single aperture antenna (e.g., of dual linear polarization or circular polarization)) is configured to receive signals radiated from (or more precisely, from an antenna or antenna structure provided within or on) the first outer surface 944a of the angle test device 940, and / or to emit signals received (or more precisely, by an antenna or antenna structure provided within or on) at the first outer surface 944a of the angle test device 940. For this purpose, the first antenna or first antenna structure 950 may be provided away from the first outer surface 944a of the angle test device 940 such that the normal to the plane of the first outer surface 944a of the angle test device 940 (or equivalently, the normal to the first surface of the test device socket in contact with the first inner surface of the test device) extends through the aperture plane of the first antenna or first antenna structure 950. Alternatively, the first antenna or first antenna structure 940 may be provided at different positions and / or orientations.

[0108] The first antenna or first antenna structure 940 is provided at least in part in an opening (e.g., an opening within the plane of the carrier structure 910, e.g., an opening surrounded by the carrier structure 910). In the example shown in FIG. 9, the first outer surface 944a and the aperture plane of the first antenna or first antenna structure 950 are provided such that the transmission path therebetween is offset with respect to the central plane of the carrier structure 910 (in a direction perpendicular to the surface of the carrier structure 910). Alternatively, the transmission path between the first outer surface 944a and the aperture plane of the first antenna or first antenna structure 950 may be provided within the central plane of the carrier structure 910.

[0109] In the example shown in FIG. 9, the radiation aperture surface 951a of the first antenna or the first antenna structure 950 is provided outside the opening 920. Alternatively, the radiation aperture surface 951a of the first antenna or the first antenna structure 950 may be provided at least partially within the opening 920 (e.g., within the plane of the carrier structure 910), for example, within the opening surrounded by the carrier structure 910).

[0110] The first antenna or the first antenna structure 950 may be attached so as to have a fixed position with respect to the device under test socket 930. Alternatively, the first antenna or the first antenna structure 950 may be configured to be movable with respect to the device under test socket 930. The movable first antenna or the first antenna device 952 can enhance the accessibility to the device under test socket 930 (e.g., for inserting the device under test 940).

[0111] For example, the first antenna or the first antenna structure 950 may be mechanically attached to the arm of the handler such that the first antenna or the first antenna structure 950 is movable. The handler may be configured to insert the device under test 940 into the device under test socket 930. For example, the first antenna or the first antenna structure 950 may be provided at least partially within the opening 920 when the handler pushes the angle device under test 950 into the test socket 930).

[0112] In the example shown in FIG. 9, the first antenna or first antenna structure 950 includes (or is connected to) a first coaxial cable 953a connected to (or connectable to) a first signal source and / or a first signal receiver 956a. However, any other form of electrical signal transmission (such as, for example, a hollow waveguide structure) may be used instead. Alternatively or additionally, the first antenna or first antenna structure 950 may be connected to any other device (such as, for example, a device that may be configured to perform or support testing of the device under test). The first coaxial cable 953a may extend through, for example, the aperture 920. Alternatively, the coaxial cable 953a may extend through an aperture different from the aperture 920 or may extend without passing through an aperture (such as, for example, extending on the same side of the carrier structure as the device under test socket 940 and / or the first antenna or first antenna structure 950).

[0113] Alternatively, the first antenna or first antenna structure 950 may be configured to be connected to the signal source and / or the first signal receiver 956a via a blind mating microwave connection (such as, for example, via a blind mating (hollow) waveguide connection) when the handler positions the first antenna or first antenna structure 950 in the operating position (or equivalently, when the handler inserts the angled device under test 940 into the test socket 930 or when the handler pushes the device under test 940 into the test socket 930).

[0114] The second antenna or second antenna structure 952 (e.g., a single aperture antenna (e.g., of dual linear polarization or circular polarization)) is configured to receive signals radiated from the second outer surface 944b of the angle test device 940 (more precisely, from an antenna or antenna structure provided on or within the second outer surface) and / or to emit signals received by the second outer surface 944b of the device under test 940 (more precisely, by an antenna or antenna structure disposed on or within the second outer surface), at least when the second antenna or second antenna structure 952 is disposed in the operating position (or equivalently, when the handler inserts the angle test device 940 into the test socket 930 or pushes the device under test 940 into the test socket 930).

[0115] The aperture 951b of the second antenna or second antenna structure 952 is provided away from the second outer surface 944b of the angle test device 940 such that the normal to the surface of the second outer surface 944b of the angle test device 940 extends through the aperture 951b of the second antenna or second antenna structure 952, at least when the second antenna or second antenna structure 952 is disposed in the operating position (or equivalently, when the handler inserts the device under test 940 into the test socket 930 or pushes the device under test 940 into the test socket 930).

[0116] The second antenna or second antenna structure 952 is mechanically attached to the arm of a handler (which may be configured to insert and / or push the device under test 940 into the device under test socket 930) such that the second antenna or second antenna structure 952 is movable.

[0117] Note that FIG. 9 shows an example of an antenna structure that can be used regardless of the presence or absence of a handler. Alternatively, both the first and second antenna structures 950, 952 may be coupled / attached to the handler, or neither may be coupled / attached to the handler. The first and second antennas or the first and second antenna structures 950, 952 may be attached to the same / common handler, or each may be attached to an individual handler.

[0118] The second antenna or the second antenna structure 952 may be coupled to a pusher for pushing the angled device under test 940 into the device under test socket 930, or the second antenna or the second antenna structure 952 may be configured to be movable, for example, together with a pusher for pushing the angled device under test 940 into the device under test socket 930 (where, for example, the pusher is provided such that when the device under test 940 is inserted into the device under test socket 930, the pusher or a part of the pusher is between the second antenna or the second antenna structure 952 and the second outer surface 944b of the angled device under test 940).) (and / or, for example, the pusher is provided such that when the angled device under test 940 is inserted into the device under test socket 930, the pusher or a part of the pusher is between the first antenna or the first antenna structure 950 and the first outer surface 944a of the angled device under test 940).).

[0119] The second antenna or the second antenna structure 952 is configured to be connected to a second signal source and / or a second signal receiver 956b via a blind mating microwave connection (e.g., via a blind mating (hollow) waveguide connection) when the handler positions the second antenna or the second antenna structure 952 in the operating position (or equivalently, when the handler inserts the device under test 940 into the test socket 930, or when the handler pushes the device under test 940 into the test socket 930).

[0120] In the example shown in FIG. 9, the second antenna or second antenna structure 952 includes (or is connected to) a second coaxial cable 953b connected to (or connectable to) the second signal source and / or signal receiver 956b. However, any other form of electrical signal transmission may be used instead. Alternatively or additionally, the second antenna or second antenna structure 952 may be connected to any other device. The second coaxial cable 953b may extend through the opening 920. Alternatively, the second coaxial cable 953b may extend through an opening different from the opening 920 (as depicted in FIG. 9), or may not extend through an opening (for example, extending on the same side as the device under test socket 940 and / or the first antenna or first antenna structure 950).

[0121] Note that the test mechanism 900 shown in FIG. 9 has two separate signal sources and / or signal receivers 956a, b. However, the test mechanism 900 may have a common (for example, single) signal source and / or signal receiver, and this signal source and / or signal receiver may be connected to the first and second antennas or first and second antenna structures 950, 952 by separate or common electrical connections (such as coaxial cables).

[0122] In conclusion, the test mechanism according to FIG. 9 enables an efficient test of the device under test, and partially arranging the device under test socket and the first antenna 950 within the opening 920 helps reduce the height of the structure. However, even if the device under test socket and / or the first antenna or first antenna structure are not partially provided within the opening, the test mechanism can still be implemented with a relatively small structure height because the opening allows the device under test socket and the first antenna or first antenna structure to be arranged near the plane of the carrier structure.

[0123] FIG. 10 is a perspective view showing an example of a device under test socket 1030, which can be used, for example, in any of the embodiments disclosed herein. The device under test socket 1030 can receive any device under test described herein and be configured to be part of any test mechanism described herein. The device under test socket 1030 has an angle recess or angle removal portion 1060 configured to support and / or align an angled device under test. The angle recess or angle removal portion 1060 has a first support table surface 1062a configured to abut against a first inner surface (e.g., first inner surfaces 142a, 242a) of the device under test and a second support table surface 1062b configured to abut against a second inner surface (e.g., second inner surfaces 142b, 242b, or 942b) of the device under test. The first support table surface 1062a and the second support table surface 1062b may be provided at an angle of the support table surface such that the sum of the angle of the support table surface (e.g., 270 degrees) and the angle between the first inner surface and the second inner surface of the device under test (e.g., 90 degrees) is at least substantially 360 degrees. For example, if the first inner surface and the second inner surface of the device under test can be provided at an angle of 90 degrees, the angle of the support table surface may be 270 degrees (the sum of 90 degrees and 270 degrees is 360 degrees).

[0124] Any surface of the device under test socket 1030 may be configured to establish electrical contact with the inner surface of the device under test. For example, the first and / or second support surfaces 1062a, b may be configured to establish electrical contact with the inner surface of the device under test and / or to provide a ground plane for the antenna structure of the device under test. For this purpose, the first and / or second support surfaces 1062a, b may have a conductive material (e.g., at least one of gold, copper, iron, and nickel) and may be formed of a conductive material. Alternatively, the first and / or second support surfaces may have a dielectric (non-conductive) material (e.g., a wear-resistant material) or may be formed of a dielectric material. Optionally, the first and / or second support surfaces 1062a, b may have one or more (local) socket connectors 1065 (or other contact structures for contacting the device under test, such as conductive pads, pogo pins, spring contacts, etc.). The socket connector 1065 is provided such that when the device under test is provided in the device under test socket 1060, the connector 1065 establishes an electrical connection with the inner surface of the device under test or its connector (e.g., array connectors 248, 748).

[0125] The test device socket 1030 has a support 1064 including a main socket structure 1064a and a leg socket structure 1064b. The main socket structure 1064a and the leg socket structure 1064b both have a rectangular cubic outer shape (optionally including rounded ends), and at least two ends of the leg socket structure 1064b are smaller (shorter) than two ends (e.g., corresponding ends) of the main socket structure 1064a. The main socket structure 1064a and the leg socket structure 1064b may, for example, have the same height. The side surface 1061 of the leg socket structure 1064b is provided in the same plane as the side surface of the main socket structure 1064a, and the other three side surfaces of the leg socket structure 1064b are recessed with respect to the other three (corresponding) side surfaces of the main socket structure 1064a. Thus, the leg socket structure 1064b can be received by an opening of a carrier structure (or another structure therebetween) such that, for example, lateral movement of the test device socket 1030 is restricted by the side surfaces of the leg socket structure 1064b.

[0126] The test device socket 1030 may further or alternatively include one or more protrusions 1066 extending in a direction from the support 1064 (e.g., from the main socket structure 1064a) toward the carrier structure. The protrusion 1066 may be a shaft (e.g., having a cylindrical shape) or may have a shaft. The protrusion 1066 may be received by a recess of the carrier structure (or another structure therebetween). Alternatively or additionally, the test device socket 1030 may include one or more through holes configured to receive attachment elements such as pins or screws.

[0127] In the example shown in FIG. 10, the angle recess or angle relief 1060 extends into the main socket structure 1064a and the leg socket structure 1064b. Alternatively, the angle recess or angle relief 1060 may extend only into the main socket structure 1064a.

[0128] The angle recess or angle removal portion 1060 may have respective side walls 1068a, b at both of its ends (only one of which is directly visible in FIG. 10). The side walls 1068a, b face each other and are provided at least substantially parallel to each other (any taper is ignored). In the example shown in FIG. 10, the side walls 1068a, b are oriented in a direction perpendicular or at least substantially perpendicular to the first and second support surfaces 1062a, b. The side walls 1068a, b can limit the lateral movement of the device under test within the angle recess or angle removal portion 1060, while on the other hand allowing for a smooth and well-guided insertion of the device under test into the angle recess or angle removal portion 860 and also allowing for a smooth extraction of the device under test. Alternatively, the angle recess or angle removal portion 1060 may have only one side wall, for example, to increase flexibility with respect to positioning.

[0129] The angle recess or angle removal portion 1060 may have at least one taper, for example, such that the cross-section (for example, parallel to the first or second support surfaces 1062a, b) decreases in the direction from the outside towards the first or second support surface 1062b. In the example shown in FIG. 10, the angle recess or angle removal portion 1060 has a first and a second taper. According to the first taper, the distance between the side walls 1068a, b decreases towards the first support surface 1062a. According to the second taper, the three side walls of the main socket structure 1064a surrounding the second support surface 1062b have a decreasing cross-section towards the second support surface 1062b. This taper has a self-centering function and can facilitate the insertion of the device under test into the angle recess or angle removal portion 1060.

[0130] The device-under-test socket 1030 may have an opening 1069 that intersects and is adjacent to the angled recess or angled removal portion 1060. In the example shown in FIG. 10, the device-under-test socket 1030 has four adjacent openings 1069 provided adjacent to the corner of the second support table surface 1062b. Alternatively, the device-under-test socket 1030 may have any other number of adjacent openings 1069 at any other arbitrary position arranged adjacent to the second support table surface 1062b (and / or the first support table surface 1062a). For example, the adjacent openings may be adapted to prevent the device under test from tilting when the device under test is inserted into the socket 830. However, the adjacent openings are also useful when removing the device under test from the socket 830.

[0131] The angled recess or angled removal portion 1060 may have additional recesses or heights, for example, to conform to the shape of the device under test. For example, the angled recess or angled removal portion 1060 shown in FIG. 10 has a step 1067 on the first support table surface 1062a. The step 1067 can provide a support surface for the device under test, for example, to conform to the structural features of the first inner surface or to form a space (for example, for gripping the device under test) downward.

[0132] The device-under-test socket 1030 may have a blind mating interface. In the example shown in FIG. 10, the main socket structure 1064a includes two (for example, blind) mating recesses 1061a, b. The mating recesses 1061a, b are configured to receive (for example, blind) mating protrusions of a pusher or handler (for example, handler 754). Alternatively or additionally, the main socket structure 1064a may have one or more (for example, blind) mating protrusions configured to be received in (for example, blind) mating recesses of a pusher or handler (for example, handler 754).

[0133] As a conclusion, socket 1030 may receive the device under test and establish electrical contact with the angled device under test. The device under test may be positioned (aligned) within the angled recess or angled removal portion 1060, and the OTA test of the device under test may be possible using the antenna structure or antennas on both outer surfaces of the angled device under test. The device under test is well-aligned within the socket, thereby facilitating the compact placement of the device under test. Further, the distortion of the radiation characteristics of the antenna or antenna structure of the device under test by the socket can be moderately reduced. The socket can be easily attached to the carrier structure and can be used in any of the embodiments disclosed herein.

[0134] FIG. 11A shows a schematic cross-section of an example of a test mechanism 1100 including a device under test socket 1130 having a carrier structure 1110 (e.g., a printed circuit board test apparatus or a load board) and a device under test 1140 (e.g., an L-shaped device under test). The carrier structure 1110 has an opening 1120 extending away from the device under test socket 1030 in the direction of the surface normal 1143a outside the first outer surface 1144a of the angled device under test 1140 (or equivalently, in the direction of the surface normal outside the first surface of the device under test socket in contact with the first inner surface of the device under test). The test mechanism 1100 is configured to receive a signal radiated from the first outer surface 1144a of the angled device under test 1140 (or more precisely, from an antenna or antenna structure provided on or within the first outer surface 1144a) and / or to emit a signal received at the first outer surface 1144a of the angled device under test 1140 (or more precisely, by an antenna or antenna structure provided on or within the first outer surface 1144a), and includes a first antenna or first antenna structure 1150. The device under test socket 1130 is configured such that the device under test socket 1130 extends into the opening 1120.

[0135] FIG. 11B shows a perspective view of the test mechanism 1100 shown in FIG. 11A. The first antenna or first antenna structure 1150 is partially provided within the opening 1120 (one or more electrical connections of the first antenna or first antenna structure are provided, for example, below the carrier structure 1110).

[0136] The extension 1122 (e.g., width) of the opening 1120 in a direction perpendicular to the outer surface normal 1143a of the first outer surface 1144a of the angle under - test device 1140 (or equivalently, in a direction perpendicular to the outer surface normal of the test - device socket that contacts the first inner surface of the device under test) is greater than the extension 1123 (e.g., in the same direction) of the device under test 1140.

[0137] The opening 1120 has a larger dimension on the side opposite the device - under - test socket 1130 (in other words, the portion surrounding the first antenna or first antenna structure 1150). Thus, the opening 1120 provides sufficient space for the first antenna or first antenna structure 1150. In particular, the opening 1120 has a rectangular - base shape (optionally with rounded corners) with a wider portion on the side opposite the device - under - test socket 1130. For example, the opening widens (e.g., step - by - step) in the direction from the device - under - test socket towards the first antenna or first antenna structure.

[0138] As can be seen in the example shown in FIG. 11B, the carrier structure 1110 may include additional openings in addition to the opening 1120.

[0139] FIG. 12 shows a schematic top view of another example of a test mechanism 1200 including a plurality of devices under test 1240a, b, c, d. The test mechanism 1200 includes a carrier structure 1210 (e.g., a printed circuit board test apparatus or a load board, which may have any carrier structure described herein) and four device under test sockets 1230a, b, c, d (e.g., any device under test socket described herein). However, the test mechanism 1200 may include any other quantity (e.g., two, three, five, six, or more) of device under test sockets.

[0140] The carrier structure 1210 has an opening 1220 that extends in a direction outside the normal to the first outer surface of the angled device under test 1240 from the device under test sockets 1230a - d (or, equivalently, in a direction outside the normal to the first surface of the device under test socket that contacts the first inner surface of the device under test). Thus, the plurality of devices 1240a - d share a common opening. The common opening can reduce interference caused by the carrier structure 1210 (e.g., as compared to a plurality of openings each having respective boundaries that may cause interference) and can also reduce crosstalk between different devices under test.

[0141] The device under test sockets 1230 are provided along the edge of the opening 1220. The device under test sockets 1230 may be provided in the same plane as the opening 1220, spaced apart from the opening 1220, or overlapping the opening 1220 (e.g., when viewed from above).

[0142] A plurality of DUTs (Devices Under Test) 1240a to 1240d may be provided in column 1215a as depicted in FIG. 12. Further, columns 1215b of respective first antennas 1250a to 1250d may be provided facing the DUTs (facing respective DUTs). The test mechanism 1200 enables testing a plurality of DUTs 1240a to 1240d and thus can improve test efficiency. The tests may be performed simultaneously, for example, to enhance time efficiency. Alternatively, the tests may be performed one after another to reduce crosstalk between DUTs 1240a to 1240d.

[0143] The DUT sockets 1230a to 1230d are provided to position respective angled DUTs 1240a to 1240d such that respective first outer surfaces of the respective angled DUTs 1240a to 1240d (in FIG. 12, the first outer surface 1244a of the first DUT 1240a is shown as an example) are aligned in the same direction (for example, the positive x direction in FIG. 12). By aligning in the same direction, the DUT sockets 1230a to 1230d can be provided at high density while keeping crosstalk between adjacent DUTs moderately small.

[0144] The test mechanism 1200 includes four first antennas or first antenna structures 1250a, b, c, d (which may be any of the first antennas or first antenna structures described herein, for example, side measurement antennas). However, the test mechanism 1200 may include any other number (for example, the same number as the device under test sockets 1230a - d) of first antennas or first antenna structures 1250a - d. In the example shown in FIG. 12, each one of the device under test sockets 1230a - d is assigned to one of each of the first antennas or first antenna structures 1250a - d (or vice versa). Each one of the first antennas or first antenna structures 1250a - d is configured to receive a signal radiated from (or more precisely, from an antenna or antenna structure provided on or within each of the first outer surfaces of) the first outer surface of the assigned angular device under test 1240a - d, and / or to emit a signal received at (or more precisely, by an antenna or antenna structure disposed on or within each of the first outer surfaces of) the first outer surface of the assigned angular device under test 1240a - d.

[0145] The opening surface of at least one of the first antennas or first antenna structures 1250a - d may be provided away from each one of the first outer surfaces of the devices under test 1240a - d such that the normal to the surface of each of the first outer surfaces of the devices under test (or equivalently, the normal to the first surface of each of the device under test sockets in contact with the first inner surface of each of the devices under test) extends through the opening surface of each one of the first antennas or first antenna structures 1250a - d.

[0146] In the example shown in FIG. 12, in order not to obscure the devices under test 1240a - d, the test mechanism 1200 does not include a second antenna or a second antenna structure. However, the test mechanism 1200 may include only the first antenna or the first antenna structure (i.e., without the second antenna or the second antenna structure), only the second antenna or the second antenna structure (i.e., without the first antenna or the first antenna structure), or both the first and second antennas or the first and second antenna structures.

[0147] The carrier structure 1210 may define a substrate limit 1213 (e.g., handler docking plate limit), and this substrate limit defines an area (e.g., a rectangular frame) that surrounds the area supporting the attachment device - under - test sockets 1230a - d.

[0148] In conclusion, by having a common opening for a plurality of device - under - test sockets, the test mechanism 1200 can support efficient testing (e.g., simultaneous testing) of a plurality of angled devices under test, achieve a small structure height, and keep crosstalk between different devices under test moderately low. The presence of an opening in the carrier structure facilitates achieving these goals.

[0149] FIG. 13 shows a schematic top view of another example of a test mechanism 1300 with a plurality of devices under test 1340. The test mechanism 1300 includes a carrier structure 1310 (e.g., a printed circuit board test apparatus or a load board, which may have any carrier structure described herein) and eight (e.g., eight equal) device - under - test sockets 1330 (which may be any device - under - test socket described herein). However, the test mechanism 1300 may include any other quantity (e.g., two, three, five, six, or more) of device - under - test sockets.

[0150] At least two device under test sockets 1330 are provided to position respective angle devices under test 1340 such that the respective first outer surfaces 1344a of the respective angle devices under test are aligned in opposite (facing away) directions (or equivalently, such that the respective first surfaces of two adjacent device under test sockets that contact the respective first inner surfaces of the respective devices under test are aligned in opposite directions), for example, back to back.

[0151] For clarity, in FIG. 13 only the leftmost device under test socket 1330 is taken up and thus reference numerals 1330a, b are attached, but the same principle applies to the remaining device under test sockets 1330. The first device under test socket 1330a is configured to provide respective devices under test 1340 such that the respective first outer surfaces 1344a face a first direction (for example, the negative x direction in FIG. 13). The second device under test socket 1330b is configured to provide respective devices under test 1340 such that the respective first outer surfaces 1344a face a second direction that is opposite (for example, anti-parallel) to the first direction (for example, the positive x direction in FIG. 13). As a result, the respective first outer surfaces 1344a, 1344b of the devices under test 1340a, 1340b provided in the first and second device under test sockets 1330a, b face opposite directions. Accordingly, the first antennas or first antenna structures 1350a, 1350b assigned to the respective first and second device under test sockets 1330a, b may be provided in opposite orientations (for example, in separate openings of a carrier structure). Further, the first antennas or first antenna structures 1350a, 1350b assigned to the respective first and second device under test sockets 1330a, b may be provided such that the first and second device under test sockets 1330a, b are provided between the assigned first antennas or first antenna structures 1350a, 1350b (for example, sandwiched therebetween with a distance therebetween). Such an arrangement reduces the risk of crosstalk between the devices under test 1340a, 1340b coupled to the first and second device under test sockets 1330a, b.

[0152] The test mechanism 1300 includes two columns (e.g., parallel columns) 1315a, b of the device-under-test sockets 1330, and the device-under-test sockets 1330 are configured to support respective angled devices-under-test 1340. At least two columns 1315a, b of the device-under-test sockets 1340 are arranged such that (e.g., back-to-back, e.g., the sides of the device-under-test sockets 1330 where the first outer surface 1344a of the device-under-test 1340 is located are facing away from each other), the first outer surfaces 1344a of the respective angled devices-under-test 1340 are aligned in opposite (facing away) directions, thereby positioning the respective angled devices-under-test 1340. Further, there are two columns 1316a, 1316b of the first antenna, and the two columns 1315a, 1315b are provided between the two columns 1316a, 1316b of the first antenna or the first antenna structure. For example, the first (common) opening 1320a is provided in the region between the first column 1315a of the device-under-test socket and the first column 1316a of the first antenna, and the second (common) opening 1320b is provided in the region between the second column 1315b of the device-under-test socket and the second column 1316b of the first antenna. Such an arrangement improves the compromise between crosstalk reduction and increased packing density.

[0153] The carrier structure 1310 has two openings 1320a, b, and there is a solid intermediate portion 1325 (e.g., a solid rod) therebetween. For example, eight device-under-test sockets 1330 are provided on the solid intermediate portion 1325 between the openings 1320a, b. For example, the positions of four devices-under-test of the device-under-test socket 1330 are aligned toward the first opening 1320a of the two openings 1320a, b. For example, the positions of the other four devices-under-test of the device-under-test socket 1330 are aligned toward the second opening 1320b of the two openings 1320a, b. In the example shown in FIG. 13, the devices-under-test 1340 inserted into the device-under-test sockets 1330 on the solid intermediate portion 1325 provided back-to-back are aligned toward different openings 1320a, b.

[0154] For example, at least two distances between the test device sockets 1330 may be at least substantially the same. For example, the distances may be equal for all the test device sockets 1330 (for example, the pitch between the sockets may be regular). As a result, the insertion of the test device 1340 becomes easier. In some cases, it may be necessary to rotate the test device 180° before insertion.

[0155] In conclusion, the test mechanism 1300 is suitable for achieving high test efficiency by having two parallel openings.

[0156] Implementation options Although several aspects have been described in the context of an apparatus, it is clear that these aspects also correspond to a description of the corresponding method, and that a block or apparatus corresponds to a method step or a feature of a method step. Similarly, aspects described in the context of a method step also represent a description of the corresponding block or item or feature of the corresponding apparatus.

[0157] The above embodiments merely illustrate the principles of the present invention. It will be understood that modifications and variations of the arrangements and details described herein will be apparent to those skilled in the art. Accordingly, it is intended to be limited only by the following claims and not by the specific details presented in the description and explanation of the embodiments herein.

Claims

1. A test mechanism for performing an Over-The-Air (OTA) test on an angle test device, comprising: The test mechanism includes a carrier structure, The test mechanism includes a device under test socket coupled to the carrier structure, The device under test socket is configured to establish electrical contact with the inner surface of the angle test device or a connector provided on the inner surface of the angle test device, The carrier structure includes an opening extending away from the device under test socket in the direction of the normal to the outer surface of the first outer surface of the angle test device, Test mechanism.

2. The device under test socket is configured to position the angle test device such that the normal to the first outer surface of the angle test device is parallel within a tolerance of ±15 degrees with respect to the surface of the carrier structure, The test mechanism according to claim 1.

3. The device under test socket is configured to: - Orient the second outer surface of the angle test device away from the carrier structure, and - Position the angle test device such that the normal to the second outer surface of the angle test device is perpendicular within a tolerance of ±15 degrees with respect to the surface of the carrier structure, The test mechanism according to claim 1 or 2.

4. The opening is a hole extending through the entire thickness of the carrier structure, The test mechanism according to any one of claims 1 to 3.

5. The extension of the opening in the direction of the normal to the outer surface of the first outer surface of the angle test device is at least 2 wavelengths, or at least 3 wavelengths, or at least 4 wavelengths at the minimum operating frequency of the angle test device, The test mechanism according to any one of claims 1 to 4.

6. The extension of the opening in a direction perpendicular to the normal to the outer surface of the first outer surface of the angle test device is greater than the extension of the radiation structure on the first outer surface of the angle test device, or The extension of the opening in a direction perpendicular to the normal to the outer surface of the first outer surface of the angle test device is greater than the extension of the angle test device, The test mechanism according to any one of claims 1 to 5.

7. ​ The extension of the opening is selected such that the distance between the end of the angle test device or the end of the device of the antenna-in-package and the carrier structure is at least one wavelength at the lowest operating frequency of the angle test device. The test mechanism according to any one of claims 1 to 6.

8. The device under test socket is configured such that at least a part of the angle test device is located in the opening when the angle test device is inserted into the device under test socket. The test mechanism according to any one of claims 1 to 7.

9. The device under test socket is configured to extend inside the opening. The test mechanism according to any one of claims 1 to 8.

10. The test mechanism is configured to receive a signal radiated from the first outer surface of the angle test device and / or is provided with a first antenna or a first antenna structure configured to emit a signal received at the first outer surface of the angle test device. The test mechanism according to any one of claims 1 to 9.

11. The test mechanism is provided with a first antenna or a first antenna structure. The opening surface of the first antenna or the first antenna structure is provided away from the first outer surface of the angle test device such that the surface normal of the first outer surface of the angle test device extends through the opening surface of the first antenna or the first antenna structure. The test mechanism according to any one of claims 1 to 10.

12. The first antenna or the first antenna structure is at least partially provided inside the opening. The test mechanism according to any one of claims 1 to 11.

13. The radiation opening surface of the first antenna or the first antenna structure is at least partially provided inside the opening. The test mechanism according to any one of claims 9 to 12.

14. The first antenna or the first antenna structure is attached so as to have a fixed position with respect to the device under test socket. The test mechanism according to any one of claims 9 to 13.

15. The first antenna or the first antenna structure is mechanically attached to the arm of a handler such that the first antenna or the first antenna structure is movable. The test mechanism according to any one of claims 9 to 13.

16. The first antenna or the first antenna structure is configured to be connected to a signal source and / or a signal receiver via a blind mating microwave connection when the handler places the first antenna or the first antenna structure in an operating position. The test mechanism according to any one of claims 9 to 15.

17. The test mechanism includes a second antenna or a second antenna structure configured to receive a signal radiated from the second outer surface of the angle device under test and / or to emit a signal received at the second outer surface of the angle device under test. The test mechanism according to any one of claims 1 to 16.

18. The test mechanism includes a second antenna or a second antenna structure. The opening surface of the second antenna or the second antenna structure is provided away from the second outer surface of the angle device under test such that the normal to the second outer surface of the angle device under test extends through the opening surface of the second antenna or the second antenna structure. The test mechanism according to any one of claims 1 to 17.

19. The second antenna or the second antenna structure is mechanically attached to the arm of the handler such that the second antenna or the second antenna structure is movable. The test mechanism according to claim 17 or 18.

20. The second antenna or the second antenna structure is part of a pusher for pushing the angle device under test into the device under test socket, or The second antenna or the second antenna structure is configured to move together with a pusher for pushing the angle device under test into the device under test socket. The test mechanism according to claim 18 or 19.

21. The second antenna or the second antenna structure is configured to be connected to a signal source and / or a signal receiver via a blind mating microwave connection when the handler places the second antenna or the second antenna structure in an operating position. The test mechanism according to any one of claims 17 to 20.

22. The device under test socket has an angle recess or an angle removal portion configured to support and / or align the angle device under test. The test mechanism according to any one of claims 1 to 20.

23. The test device socket has one or more coaxial pogo pins to establish an electrical connection between the PCB test device or load board and the angled test device. The test mechanism according to any one of claims 1 to 22.

24. The test mechanism includes at least two test device sockets configured to support respective angled test devices. The at least two test device sockets are provided to position respective angled test devices such that respective first outer surfaces of the respective angled test devices are aligned in opposite directions. The test mechanism according to any one of claims 1 to 23.

25. The test mechanism includes at least two rows of test device sockets. The test device sockets are configured to support respective angled test devices. The at least two rows of test device sockets are provided to position respective angled test devices such that respective first outer surfaces of the respective angled test devices are aligned in opposite directions. The test mechanism according to any one of claims 1 to 24.

26. The carrier structure has at least two openings with a solid intermediate portion therebetween. The two or more test device sockets are provided on the solid intermediate portion between the openings, and One or more test device positions of the test device sockets are aligned toward a first opening of the at least two openings, and One or more test device positions of the test device sockets are aligned toward a second opening of the at least two openings. The test mechanism according to any one of claims 1 to 25.

27. A test mechanism for performing an OTA test on an angled test device, The test mechanism includes a carrier structure. The test mechanism includes a test device socket coupled to the carrier structure. The test device socket is configured to establish electrical contact with an inner surface of the angled test device or a connector provided on the inner surface of the angled test device, and The test device socket is - such that a surface normal of the first outer surface of the angled test device is parallel within a tolerance of ±15 degrees with respect to the surface of the load board, and - such that the second outer surface of the angle test device faces away from the load board and - such that the surface normal of the second outer surface of the angle test device is perpendicular within a tolerance of ±15 degrees with respect to the surface of the load board, configured to position the angle test device, the carrier structure having an opening extending away from the test device socket in the direction of the surface normal outside the first outer surface of the angle test device, a test mechanism.

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