Copper foil, electrodes containing the same, a secondary battery containing the same, and a method for manufacturing the same.

A copper foil with controlled crystal grain orientation is developed to prevent curling, wrinkling, and cracking, enhancing the manufacturing process and performance of secondary batteries and flexible printed circuit boards.

JP2026116698APending Publication Date: 2026-07-10SK NEXILIS CO LTD

Patent Information

Authority / Receiving Office
JP · JP
Patent Type
Applications
Current Assignee / Owner
SK NEXILIS CO LTD
Filing Date
2025-12-04
Publication Date
2026-07-10

AI Technical Summary

Technical Problem

The production of thin copper foils for secondary batteries is hindered by curling, wrinkling, and cracking issues during manufacturing, which affect the productivity and performance of intermediate components and final products like flexible printed circuit boards and secondary batteries.

Method used

A copper foil with a specific crystal grain orientation distribution, characterized by an area ratio of 45% to 93% of crystal grains with a high-temperature GOS value between 0° to less than 2°, is manufactured using a copper film with a matte and shiny surface and a protective layer, preventing curling, wrinkling, and cracking during the manufacturing process.

Benefits of technology

The solution enhances the productivity and performance of copper foil-based products by preventing defects during manufacturing, allowing for the production of high-capacity secondary batteries with improved flexibility and durability.

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Abstract

The present invention provides copper foil, an electrode containing the same, a secondary battery containing the same, and a method for manufacturing the same. [Solution] One embodiment of the present invention provides a copper foil comprising a copper film having a matte surface and a shiny surface, and a protective layer on the copper film, wherein when boundaries with an orientation difference of 5° or more between adjacent pixels are considered as grain boundaries, the area ratio of crystal grains (including twins) with a high-temperature GOS value in the range of 0° or more and less than 2° is 45% to 93% of the total cross-sectional area. The high-temperature GOS value is measured using an electron backscatter diffraction pattern analyzer (EBSD) on the cross-section of the copper foil after heat treatment at 190°C for 1 hour.
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