Information processing device, information processing method for information processing device, measurement system, and program

Abstract

To make it possible to detect with high accuracy thinning that occurs in an object to be measured.SOLUTION: An information processing device for performing detection processing for detecting thinning that has occurred in a measurement object that is a magnetic body includes a control unit that obtains first measurement data, which is measured values obtained by measuring a background magnetic flux density, which is the magnetic flux density of a magnetic field existing around the measurement object in a state where the thinning has not occurred, at a plurality of predetermined positions, obtains second measurement data, which is measured values of the magnetic flux density of the magnetic field existing around the measurement object at the plurality of positions when the detection processing is performed, and detects the presence or absence of the thinning and the depth of the thinning occurring in the measurement object based on the first measurement data and the second measurement data.SELECTED DRAWING: Figure 2

Description

[Technical Field]

[0001] The present disclosure relates to an information processing device, an information processing method for an information processing device, a measurement system, and a program. [Background technology]

[0002] Patent Document 1 describes detecting defects in a measurement object, which is a ferromagnetic material, by sensing a magnetic field around the measurement object. [Prior art documents] [Patent documents]

[0003] [Patent Document 1] Special Publication No. 2017-516111 [Non-patent literature]

[0004] [Non-Patent Document 1] Masayuki Sakata, "Pure Iron-Based Soft Magnetic Materials," R&D Kobe Steel Technical Report, Kobe Steel, Ltd., March 2017, Vol. 66, No. 2, pp. 31-35

[0005] [Non-patent document 2] Tetsuo Kato and Tatsuya Tomioka, "Effect of Carbon Content on Magnetic Properties of Carbon Steel," Electric Steel Manufacturing, May 1965, Vol. 36, No. 3, pp. 107-115 Summary of the Invention [Problem to be solved by the invention]

[0006] When detecting thinning caused by corrosion, wear, or damage to pipes, columns, beams, and other objects in plants, factories, bridges, and other structures using the surrounding magnetic field, it is desirable to be able to detect thinning with high accuracy.

[0007] However, the magnetic flux density of the magnetic field present around a ferromagnetic material with thinning on its surface is affected by the shape of the thinning and the residual magnetization inside the ferromagnetic material. Furthermore, the magnetic properties of a ferromagnetic material are affected by factors such as the grain size and carbon content of the carbon steel, and can vary from pipe to pipe, even if the pipes are of the same standard (Non-Patent Documents 1 and 2). Therefore, the accuracy of detecting thinning in conventional configurations has room for improvement.

[0008] An object of the present disclosure is to provide an information processing device, an information processing method for an information processing device, a measurement system, and a program that are capable of detecting thinning that has occurred in a measurement object with higher accuracy. [Means for solving the problem]

[0009] According to some embodiments, an information processing device performs a detection process to detect thinning of a magnetic object, the information processing device including a control unit that acquires first measurement data, which is a background magnetic flux density measured at a plurality of predetermined positions, the background magnetic flux density being the magnetic field present around the object when the thinning is not occurring, acquires second measurement data, which is a magnetic flux density measured at the plurality of positions, the magnetic field present around the object when the detection process is being performed, and detects the presence or absence of thinning of the object and the depth of the thinning based on the first measurement data and the second measurement data. In this way, the depth of thinning is detected using the measured values ​​of the background magnetic flux density around the object when the thinning is not occurring and the measured values ​​of the background magnetic flux density at the time of detection, thereby enabling more accurate detection of thinning.

[0010] In one embodiment, the control unit calculates third measurement data, which is a measurement value of leakage magnetic flux density from the thinning that has occurred in the object to be measured, by using the difference between the first measurement data and the second measurement data, and detects the presence or absence of thinning that has occurred in the object to be measured and the depth of the thinning based on the first measurement data and the third measurement data. In this way, by using the measurement value of the background magnetic flux density around the object to be measured when no thinning has occurred and the measurement value of the leakage magnetic flux density from the thinning at the time of detection, it is possible to detect the depth of thinning with higher accuracy.

[0011] In one embodiment, the control unit refers to a database stored in a storage unit that contains a plurality of correspondence data indicating a correspondence relationship between the leakage magnetic flux density and the shape of the wall-thinning, including the depth of the wall-thinning, for each of a plurality of groups defined by a range of representative values ​​of the background magnetic flux density, selects a group from the plurality of groups that includes a representative value of the first measurement data, and detects the presence or absence of wall-thinning and the depth of the wall-thinning in the measurement object based on the shape of the wall-thinning associated with the leakage magnetic flux density that matches the third measurement data in any of the correspondence data included in the selected group. In this way, the depth of wall-thinning can be detected with more accuracy and efficiency because the depth of wall-thinning can be detected with reference to the correspondence data classified into groups.

[0012] In one embodiment, the shape of the thinning, for which the correspondence data indicates a correspondence relationship with the leakage magnetic flux density, further includes at least one of the width of the thinning and the shape of the edge of the thinning, and the control unit further detects at least one of the width of the thinning and the shape of the edge of the thinning that has occurred in the measurement object based on the shape of the thinning that is associated with the leakage magnetic flux density that matches the third measurement data in any of the correspondence data included in the selected group. In this way, thinning is detected using correspondence data in which the shape of the thinning, which indicates a correspondence relationship with the leakage magnetic flux density, further includes at least one of the width of the thinning and the shape of the edge of the thinning, so that not only the thinning depth but also at least one of the width of the thinning and the shape of the edge of the thinning can be detected with high accuracy.

[0013] In one embodiment of the information processing device, the control unit receives measurement values ​​measured by a sensor array in which a plurality of sensors capable of measuring magnetic flux density are arranged two-dimensionally and are provided at a fixed position relative to the measurement object, and acquires the first measurement data and the second measurement data. In this way, since the thickness reduction is detected based on the measurement values ​​of magnetic flux density measured by the sensor array provided at a fixed position relative to the measurement object, it is possible to detect the depth of thickness reduction with high accuracy using a simple configuration.

[0014] In one embodiment, the control unit performs the detection process to detect the wall thinning that has occurred in a magnetized carbon steel pipe as the measurement object. Therefore, even if the background magnetic flux density of the magnetic field present around the measurement object varies depending on the carbon content of the measurement object, the depth of the wall thinning can be detected with high accuracy.

[0015] According to some embodiments, an information processing method of an information processing device performs a detection process to detect thinning of a magnetic object, the method comprising: a control unit of the information processing device acquires first measurement data, which is a measurement value of background magnetic flux density, which is a magnetic flux density of a magnetic field present around the object when the object is not thinned, measured at a plurality of predetermined positions; acquires second measurement data, which is a measurement value of magnetic flux density of a magnetic field present around the object when the detection process is performed, measured at the plurality of positions; and detects the presence or absence of thinning of the object and the depth of the thinning based on the first measurement data and the second measurement data. In this way, the depth of thinning is detected using the measurement value of the background magnetic flux density around the object when the object is not thinned and the measurement value of the background magnetic flux density at the time of detection, thereby enabling more accurate detection of thinning.

[0016] According to some embodiments, a measurement system includes a sensor array including a plurality of sensors capable of measuring magnetic flux density arranged two-dimensionally, and an information processing device. The sensor array is fixed relative to the object, and the information processing device includes a control unit that acquires first measurement data, which is a measurement value of the background magnetic flux density around the object when no thinning occurs, measured by the plurality of sensors in the sensor array, and acquires second measurement data, which is a measurement value of the magnetic flux density around the object when the detection process is performed, measured by the plurality of sensors in the sensor array. The control unit detects the presence or absence of thinning and the depth of the thinning based on the first measurement data and the second measurement data. In this way, the depth of thinning can be detected using the measurement value of the background magnetic flux density around the object when no thinning occurs and the measurement value of the background magnetic flux density at the time of detection, thereby enabling more accurate detection of thinning. Furthermore, since thinning is detected based on the measured value of magnetic flux density measured by a sensor array installed at a fixed position relative to the object to be measured, thinning can be detected with higher accuracy using a simple configuration.

[0017] According to some embodiments, a program causes a computer to function as the information processing device. Therefore, the depth of wall thinning is detected using a measured value of the background magnetic flux density around the measurement target when no wall thinning has occurred and a measured value of the background magnetic flux density at the time of detection, thereby enabling more accurate detection of wall thinning. [Effects of the Invention]

[0018] According to the present disclosure, it is possible to detect thinning that has occurred in a measurement object with higher accuracy. [Brief explanation of the drawings]

[0019] [Figure 1] 1 is a block diagram showing a configuration of a measurement system according to an embodiment of the present disclosure. [Figure 2] FIG. 2 is a block diagram showing the configuration of the processing device of FIG. [Figure 3] FIG. 2 is an external view showing an example of a state in which the magnetization device is arranged on a measurement object. [Figure 4] FIG. 1 is an external view showing an example of how a measurement object is magnetized by a magnetizing device. [Figure 5] FIG. 1 is a diagram schematically illustrating an example of a state in which a sensor array is arranged on a measurement object. [Figure 6] FIG. 10 is a diagram schematically illustrating the distribution of magnetic flux density when thinning occurs inside a pipe. [Figure 7] FIG. 10 is a diagram schematically illustrating the distribution of magnetic flux density when thinning occurs on the outside of a pipe. [Figure 8] FIG. 10 is a diagram showing an example of leakage magnetic flux density around a pipe in which no thinning has occurred. [Figure 9] FIG. 10 is a diagram showing an example of leakage magnetic flux density around a pipe in which thinning has occurred. [Figure 10] FIG. 10 is a diagram schematically showing the relationship between background magnetic flux density, leakage magnetic flux density, and thinning depth. [Figure 11] FIG. 10 is a diagram showing an example of group files classified according to the range of background magnetic flux density. [Figure 12] FIG. 10 is a diagram illustrating an example of data included in a group file. [Figure 13] FIG. 2 is a diagram schematically showing the shape of thinning that has occurred in a measurement object. [Figure 14] 10 is a flowchart showing a processing procedure for a wall-thinning detection process performed by the measurement system of FIG. [Figure 15] 1 is a block diagram showing a configuration of a measurement system according to an embodiment of the present disclosure. DETAILED DESCRIPTION OF THE INVENTION

[0020] <<Comparative Example>> A comparative example (Patent Document 1, paragraphs

[0008] -

[0011] ) of a system for detecting defects in a ferromagnetic material includes multiple magnetometers, a mapper, and a pattern matcher. The multiple magnetometers are arranged around the surface of the ferromagnetic material and sense the magnetic field generated by the ferromagnetic material to generate magnetic field data. The mapper generates data points in a two-dimensional map from the magnetic field data. Each data point corresponds to a respective position on the surface of the ferromagnetic material and represents the magnetic field strength sensed in the vicinity of that position. The pattern matcher identifies multiple data points in the two-dimensional map that match a predefined spatial pattern of magnetic field strength, and outputs the location of a defect in the vicinity of the corresponding ferromagnetic material surface. The comparative example also estimates the volume, area, depth, and other characteristics of the defect based on features represented by the data from the multiple data points.

[0021] However, the magnetic flux density of the magnetic field present around a ferromagnetic body with surface thinning is affected by the shape of the thinning and the residual magnetization remaining inside the ferromagnetic body. Therefore, simply measuring the magnetic flux density of the magnetic field present around a ferromagnetic body makes it impossible to distinguish between the effects of the two and to detect thinning with high accuracy. For example, even if the shape of the thinning is the same, if the residual magnetization inside the ferromagnetic body is different, the magnetic flux density of the magnetic field present around the ferromagnetic body, reflecting the shape of the thinning, will be different. Furthermore, the magnetic properties of ferromagnetic bodies are affected by the grain size and carbon content of carbon steel, and may vary from pipe to pipe, even if the pipes are of the same standard (Non-Patent Documents 1 and 2). Therefore, even if pipes of the same standard are magnetized in the same way, the residual magnetization of the pipes may differ. Therefore, the comparative example, which performs pattern matching of measured values ​​of the magnetic field present around a ferromagnetic body, leaves room for improvement in the accuracy of thinning detection.

[0022] <<Embodiment>> Hereinafter, an embodiment of the present disclosure will be described with reference to the drawings. In this embodiment, parts having the same configuration or function are denoted by the same reference numerals, and duplicated descriptions may be omitted or simplified as appropriate.

[0023] [First embodiment] Fig. 1 is a block diagram showing the configuration of a measurement system 1 according to an embodiment of the present disclosure. In Fig. 1, the measurement system 1 includes a processing device 10 and a measurement device 20. In the measurement system 1, the processing device 10 and the measurement device 20 are communicably connected to each other via a communication line. The measurement device 20 measures the magnetic flux density around a measurement object 30 and transmits the measured magnetic flux density value to the processing device 10. Note that the processing device 10 and the measurement device 20 may be integrated into a single device, or at least either the processing device 10 or the measurement device 20 may be configured by multiple devices.

[0024] The processing device 10 as an information processing device according to this embodiment detects the presence or absence of thinning and the shape of the thinning in the measurement object 30 based on the measured value of magnetic flux density received from the measuring device 20. In this embodiment, the processing device 10 is realized by a PC (Personal Computer). Instead of this configuration, the processing device 10 may be realized by any information processing device, such as a general-purpose electronic device such as a WS (Work Station) or a tablet terminal, or another dedicated electronic device. Furthermore, the processing device 10 may be realized by multiple information processing devices that can communicate with each other.

[0025] Fig. 2 is a block diagram showing the configuration of the processing device 10 of Fig. 1. As shown in Fig. 2, the processing device 10 includes a control unit 11, a storage unit 12, a communication unit 13, an input unit 14, and an output unit 15.

[0026] The control unit 11 includes one or more processors. In one embodiment, the "processor" may be, but is not limited to, a general-purpose processor or a dedicated processor specialized for a particular process. The control unit 11 is communicatively connected to each component of the processing device 10 and controls the operation of the processing device 10 as a whole.

[0027] The storage unit 12 includes any storage module including a hard disk drive (HDD), a solid state drive (SSD), a read-only memory (ROM), an electrically erasable programmable read-only memory (EEPROM), and a random access memory (RAM). The storage unit 12 may function as, for example, a main storage device, an auxiliary storage device, or a cache memory. The storage unit 12 stores any information used in the operation of the processing device 10 or obtained as a result of the operation of the processing device 10. For example, the storage unit 12 may store system programs, application programs, and various information received by the communication unit 13. The storage unit 12 is not limited to being built into the processing device 10, but may be an external database or an external storage module connected via a digital input / output port such as a universal serial bus (USB).

[0028] The communication unit 13 includes any communication module that can communicate with other devices such as the measurement device 20 using any communication technology. The communication module enables wired communication such as a wired local area network (LAN) or wireless communication such as a wireless local area network (LAN) or Bluetooth (registered trademark). The communication unit 13 may further include a communication control module for controlling communication with other devices, and a storage module for storing communication data such as identification information required for communication with other devices.

[0029] The input unit 14 includes one or more input interfaces that accept a user's input operation and acquire input information based on the user's operation. For example, the input unit 14 may be, but is not limited to, a physical key, a capacitance key, a pointing device, a touch screen integrated with the display of the output unit 15, or a microphone that accepts voice input.

[0030] The output unit 15 includes one or more output interfaces that output information to the user and notify the user. For example, the output unit 15 is a display that outputs information as an image, or a speaker that outputs information as sound, but is not limited to these. At least one of the input unit 14 and the output unit 15 may be configured integrally with the processing device 10 or may be provided separately.

[0031] The functions of the processing device 10 can be realized by executing a program that can be used to function the measurement system 1 according to this embodiment on a processor included in the control unit 11. That is, the functions of the processing device 10 can be realized by software. The program causes a computer to execute the processing of steps included in the operation of the processing device 10, thereby causing the computer to realize the functions corresponding to the processing of each step. That is, the program is a computer program that causes a computer to function as the processing device 10 according to this embodiment.

[0032] The program can be recorded on a computer-readable recording medium. Examples of the computer-readable recording medium include a magnetic recording device, an optical disc, a magneto-optical recording medium, and a semiconductor memory. The program can be distributed by, for example, selling, transferring, or lending a portable recording medium such as a Blu-ray Disc, a DVD (Digital Versatile Disc), or a CD-ROM (Compact Disc ROM) on which the program is recorded. The program may also be distributed by storing the program on another device, including a server storage, and transferring the program from the other device to another computer via a network. The program may also be provided as a program product.

[0033] A computer temporarily stores a program recorded on a portable recording medium or transferred from a server in its main storage device. The computer then reads the program stored in the main storage device with a processor and executes processing in accordance with the read program. The computer may also read the program directly from a portable recording medium and execute processing in accordance with the program. The computer may also execute processing in accordance with the received program each time a program is transferred from a server to the computer. Such processing may be executed by a so-called ASP (Application Service Provider) type service that realizes its functions simply by issuing execution instructions and obtaining results, without transferring a program from a server to the computer. Programs include information used for processing by a computer that is equivalent to a program. For example, data that does not directly instruct a computer but has properties that define computer processing falls under the category of "equivalent to a program."

[0034] Some or all of the functions of the processing device 10 may be realized by a dedicated circuit included in the control unit 11. That is, some or all of the functions of the processing device 10 may be realized by hardware. Furthermore, the processing device 10 may be realized by a single information processing device, or may be realized by cooperation of multiple information processing devices.

[0035] Returning to the description of Figure 1, the measurement device 20 includes a control unit 22, a communication unit 24, and a sensor array .

[0036] The sensor array 28 includes a plurality of sensors 26. The plurality of sensors 26 are arranged in a two-dimensional array with their positions fixed relative to the measurement object 30. Each sensor 26 may be, for example, a magnetic sensor. The magnetic sensor is, for example, a magnetically sensitive element such as a Hall element, a magnetoresistance effect element, or a magnetoimpedance effect element. If the sensor 26 is a magnetic sensor, it measures the magnetic flux density of the magnetic field present around the measurement object 30. The measurement device 20 outputs measurement data including the measurement values ​​of each sensor 26 to the processing device 10. The measurement data may include data associating each sensor 26 with its measurement value.

[0037] The control unit 22 includes one or more processors. In one embodiment, the processor of the control unit 22 is a dedicated processor specialized for a specific process, but may be implemented by a general-purpose processor or other device. The control unit 22 is communicatively connected to each component of the measurement device 20 and controls the operation of the entire measurement device 20. The control unit 22 acquires measurement values ​​from each sensor 26 and outputs them to the processing device 10. In response to receiving a control instruction from the processing device 10 requesting the measurement values ​​of each sensor 26, the control unit 22 may cause each sensor 26 to start measurement or output the measurement values ​​of each sensor 26 to the processing device 10. The control unit 22 may associate the measurement values ​​of each sensor 26 with each sensor 26 to generate measurement data and output the measurement data to the processing device 10. Note that the measurement device 20 may not include the control unit 22, and each sensor 26 may output its own measurement data to the processing device 10. In addition, the control unit 22 may cause each sensor 26 to start measurement and output the measurement values ​​of each sensor 26 to the processing device 10 not only when it receives a request for measurement values ​​from the processing device 10, but also, for example, periodically at predetermined intervals.

[0038] The communication unit 24 is communicatively connected to the communication unit 13 of the processing device 10 and outputs measurement data including measurement values ​​of each sensor 26 to the processing device 10. If the measuring device 20 does not have the communication unit 24, the control unit 22 or each sensor 26 may output the measurement data to the processing device 10. The communication unit 24 includes any communication module that can communicate with other devices such as the processing device 10 using any communication technology. The communication module enables wired communication such as a wired LAN, or wireless communication such as a wireless LAN or Bluetooth (registered trademark). The communication unit 24 may further include a communication control module for controlling communication with other devices, and a storage module for storing communication data such as identification information required for communication with other devices.

[0039] In one embodiment, the processing device 10 and the measurement device 20 communicate with each other via the same wireless LAN network, but the configuration for communication between the processing device 10 and the measurement device 20 is not limited to this. For example, the communication unit 13 of the processing device 10 and the communication unit 24 of the measurement device 20 may be directly connected by a wired cable such as a LAN cable, and communication between the processing device 10 and the measurement device 20 may be performed via this wired cable. Alternatively, at least one other network such as the Internet may exist between the processing device 10 and the measurement device 20, and communication between the processing device 10 and the measurement device 20 may be performed via such a network.

[0040] The measurement object 30 is a structure such as a pipe, a column, or a beam installed in a plant, a factory, a bridge, or other building. The measurement object 30 is made of a magnetic material. In this embodiment, an example is described in which the measurement object 30 is magnetized by a magnetization device 40 that applies a magnetic field after being installed in the building. Once magnetized, the magnetism of the measurement object 30 remains even after the magnetic field is no longer applied. However, the measurement object 30 may be made of a magnetic material that is inherently magnetic, rather than a magnetic material that generates a magnetic field when magnetized. In the following, an example is described in which the measurement object 30 is a carbon steel pipe 30a, which is a ferromagnetic material. Note that the magnetization of the measurement object 30 and the installation of the sensor array 28 may be performed before the measurement object 30 is installed in the building.

[0041] Fig. 3 is an external view showing an example of a state in which the magnetizing device 40 is disposed on the measurement object 30 (piping 30a). Fig. 4 is an external view showing an example of a state in which the measurement object 30 (piping 30a) is magnetized by the magnetizing device 40.

[0042] As shown in Figures 3 and 4, the magnetization device 40 has a magnet 41. The magnet 41 may be composed of two semi-cylindrical parts that are arranged approximately concentrically with the pipe 30a when the magnet 41 is placed relative to the pipe 30a. Each part of the magnet 41 is partially covered by a part of the case 42. The two parts of the case 42 are rotatable relative to each other via a hinge 43. Therefore, the magnet 41 is an annular magnet that surrounds the pipe 30a in the circumferential direction, which is the direction around the central axis A of the pipe 30a, and can be opened and closed by rotation via the hinge 43.

[0043] As shown in FIGS. 3 and 4, locking mechanisms 44 for holding the magnet 41 in a closed state may be provided at both circumferential ends of the case 42. As shown in FIGS. 3 and 4, the locking mechanism 44 may be configured as a toggle latch. By locking the locking mechanism 44, the magnet 41 is held in a closed state (the state shown in FIG. 4). On the other hand, by releasing the locking mechanism 44, the magnet 41 can be opened (the state shown in FIG. 3). A user can open the magnet 41, place the pipe 30a inside the magnet 41, close the magnet 41 by rotating it in direction D1, and lock the locking mechanism 44 to attach the magnet 41 to the pipe 30a. Handles 45 may be provided on each portion of the case 42. By grasping the handles 45, a user can easily move the magnetizing device 40 in the longitudinal direction D2 along the pipe 30a. The magnet 41 has different polarities in the longitudinal direction D2 of the pipe 30a when the magnet 41 is placed relative to the pipe 30a. For example, magnet 41 has a north pole on one side of pipe 30a in the longitudinal direction D2 and a south pole on the other side. In this way, the user can magnetize an area of ​​pipe 30a that corresponds to the range of movement of magnet 41 by moving magnet 41 along the surface of pipe 30a in the longitudinal direction D2 of pipe 30a and then removing magnet 41 from the surface of pipe 30a. The magnetic field imparted to pipe 30a by magnetization can be considered to remain semi-permanently.

[0044] After magnetization, a sensor array 28 is placed on the magnetized pipe 30a to measure the magnetic flux density of the magnetic field present around the pipe 30a. FIG. 5 is a diagram schematically illustrating an example of how the sensor array 28 is placed on the measurement object 30 (piping 30a). The pipe 30a has a cylindrical wall 38 and a lumen 39. As shown in FIG. 5, the sensor arrays 28 may be placed side by side parallel to the central axis A of the pipe 30a as the measurement object 30. The longitudinal direction of the pipe 30a is represented as the X-axis direction. The circumferential direction of the pipe 30a is represented as the Y-axis direction. The radial direction of the pipe 30a is represented as the Z-axis direction.

[0045] Sensor 26 measures the magnetic field generated by pipe 30a as the magnitude of magnetic flux density. Magnetic flux density is expressed as a vector with a direction in three-dimensional space. Sensor 26 may measure the magnitude of magnetic flux density regardless of the direction of the vector representing the magnetic flux density. Sensor 26 may measure the components of the magnetic flux density in each of the X-axis, Y-axis, and Z-axis directions. The magnitude of the magnetic flux density is calculated as the square root of the sum of the squares of the components of the magnetic flux density in each direction.

[0046] Fig. 6 is a diagram showing a schematic diagram of the distribution of magnetic flux density when thinning 34 occurs on the inner surface 32 of a pipe 30a. Fig. 6 shows a cross-sectional view of the wall 38 of the pipe 30a as the measurement object 30 extending along the X-axis, multiple sensors 26 arranged along the pipe 30a, and the magnetic field inside and outside the pipe 30a. The magnetic flux density measured by each sensor 26 corresponds to the magnetic field present in the vicinity of the sensor 26.

[0047] As described above, the pipe 30a is magnetized before the sensor array 28 is installed, and therefore residual magnetization 53 remains inside the wall 38. A background magnetic flux density 51, which is the magnetic flux of a magnetic field corresponding to the residual magnetization 53, exists around the pipe 30a. The magnetic path of the background magnetic flux density 51, together with the magnetic path of the residual magnetization 53, is distributed in a loop. When no thinning 34 occurs in the pipe 30a, the sensor 26 measures the background magnetic flux density 51. During the time range in which thinning 34 of the pipe 30a is measured, the background magnetic flux density 51 can be considered to remain constant without changing.

[0048] In the example of FIG. 6 , the wall 38 of the pipe 30a has a thinning 34 on the inner surface 32. The thinning 34 corresponds to a thinned portion of the wall 38 of the pipe 30a, i.e., a portion where the volume of the wall 38 of the pipe 30a is reduced. The thinning 34 occurs due to corrosion of the pipe 30a due to aging. When the thinning 34 exists in the wall 38 of the pipe 30a, a leakage magnetic flux density 52, which is a portion of the magnetic flux, leaks into and out of the pipe 30a. The leakage magnetic flux density 52 is the density of the magnetic flux that flows through the inside of the wall 38 of the pipe 30a and flows out to the vicinity of the thinning 34 due to the thinning 34. As a result, the magnetic flux density measured by each sensor 26 changes near the portion where the thinning 34 is located. That is, each sensor 26 measures the magnetic flux density obtained by superimposing the leakage magnetic flux density 52 on the background magnetic flux density 51. The magnetic flux density changes not only in the X-axis direction but also in the Y-axis direction. Here, because the size of the wall 38 of the pipe 30a is sufficiently larger than the wall thinning 34, it can be assumed that the background magnetic flux density 51 does not change from the time of magnetization. Therefore, the measurement system 1 can calculate the leakage magnetic flux density 52 and detect the wall thinning 34 by calculating the difference between the magnetic flux density measured by each sensor 26 at the time of installation and the magnetic flux density measured by each sensor 26 when the wall thinning 34 is detected.

[0049] 7 is a diagram schematically illustrating the distribution of magnetic flux density when thinning 34 occurs on the outer surface 31 of the pipe 30a. Even when thinning 34 occurs on the outer surface 31, magnetic reluctance difference causes magnetic flux disturbance, and leakage magnetic flux density 52, which is a portion of the magnetic flux, leaks into and out of the pipe 30a. As a result, the magnetic flux density measured by each sensor 26 changes near the location of the thinning 34. Therefore, even when thinning 34 occurs on the outer surface 31, the measurement system 1 can calculate the leakage magnetic flux density 52 and detect the thinning 34 by calculating the difference between the magnetic flux density measured by each sensor 26 at the time of installation and the magnetic flux density measured by each sensor 26 when the thinning 34 is detected.

[0050] As described above, the multiple sensors 26 are arranged in a two-dimensional array in the sensor array 28. In this case, the measurement data acquired by the measurement device 20 can be represented as a two-dimensional array of data in which the measurement values ​​of each sensor 26 are arranged according to the position of each sensor 26.

[0051] The control unit 11 of the processing device 10 calculates the difference between the magnetic flux density measured by each sensor 26 at the time of installation and the magnetic flux density measured by each sensor 26 when wall thinning 34 is detected, thereby calculating the leakage magnetic flux density 52 as a two-dimensional array of data. FIG. 8 is a diagram showing an example of the leakage magnetic flux density 52 around a pipe 30a where no wall thinning 34 has occurred. FIG. 9 is a diagram showing an example of the leakage magnetic flux density 52 around a pipe 30a where wall thinning 34 has occurred. FIGS. 8 and 9 show, as maps, two-dimensional arrays of differential data generated for measurement data of each component of the magnetic flux density in the X-axis, Y-axis, and Z-axis directions. The differential data shown in FIG. 8 is based on the determination target data acquired for the pipe 30a where no wall thinning 34 has occurred. The differential data shown in FIG. 9 is based on the determination target data acquired for the pipe 30a where wall thinning 34 has occurred. The display position of each element of the two-dimensional array corresponds to the X-coordinate and Y-coordinate of the sensor 26 that measured the corresponding measurement value. The value of each element of the differential data is represented by grayscale shading. White or gray close to white indicates a large difference data value. In other words, the closer the color representing an element is to white, the larger the difference data value corresponding to that element. Black or gray close to black indicates a small difference data value. In other words, the closer the color representing an element is to black, the larger the difference data value corresponding to that element.

[0052] The control unit 11 of the processing device 10 calculates the square root of the sum of the squares of the difference data of the magnetic flux density components in each direction, i.e., the magnitude of the magnetic flux density, as the judgment index. That is, the control unit 11 converts the format of the difference data from a vector containing the magnetic flux density components in each direction into a scalar judgment index. FIGS. 8 and 9 further show the two-dimensional array of difference data converted from the difference data of the magnetic flux density components in each direction into a scalar judgment index. The value of each element of the difference data converted into a scalar judgment index is represented by grayscale shading, similar to the values ​​of the magnetic flux density components in each direction. The closer the color representing an element is to white, the larger the value of the judgment index corresponding to that element. Furthermore, the closer the color representing an element is to black, the larger the value of the judgment index corresponding to that element. As is clear from comparing the judgment indexes in FIGS. 8 and 9 , the difference data of the judgment index for the pipe 30a without wall thinning 34 shows that the magnetic flux density is generally small (black or gray close to black) and randomly distributed, regardless of the position of the sensor 26. In contrast, the differential data of the judgment index for the pipe 30a having wall thinning 34 shows large values ​​(white or gray close to white) for the sensors 26 near the portion where the wall thinning 34 exists, while the differential data for other portions shows small values. Thus, the distribution of the differential data of the judgment index corresponding to the magnitude of the leakage magnetic flux density 52 varies greatly depending on the presence or absence of wall thinning 34. Therefore, the control unit 11 of the processing device 10 can detect the presence or absence of wall thinning 34 by comparing the differential data of the magnetic flux density of each sensor 26 at the time of installation and when the wall thinning 34 is detected with pre-acquired model data of the magnetic flux density present around the measurement target 30, including the wall thinning 34. The control unit 11 may also detect the presence or absence of wall thinning 34 by analyzing the statistical distribution of the values ​​of the differential data of the judgment index measured by each sensor 26.

[0053] Furthermore, the processing device 10 according to this embodiment detects the wall-thinning 34 with high accuracy by using not only the differential data of the magnetic flux density of each sensor 26 at the time of installation corresponding to the leakage magnetic flux density 52 and at the time of detecting the wall-thinning 34, but also the data of the magnetic flux density at the time of installation corresponding to the background magnetic flux density 51.

[0054] FIG. 10 is a diagram schematically showing the relationship among the background magnetic flux density 51, the leakage magnetic flux density 52, and the depth of metal removal. In FIG. 10, the horizontal axis indicates the magnitude of the background magnetic flux density 51 (μT: microtesla), and the vertical axis indicates the magnitude of the leakage magnetic flux density 52. The graph in FIG. 10 shows the background magnetic flux density 51 and the leakage magnetic flux density 52 measured by the sensor 26 near the metal removal 34 for various measurement objects 30 having different background magnetic flux densities 51, leakage magnetic flux densities 52, and depths of metal removal, for each depth of the metal removal 34. The background magnetic flux density 51 may be, for example, the value of the magnetic flux density measured by the same sensor 26 before the metal removal 34 occurs. On the graph, the circles represent the measured values when the depth of the metal removal 34 is X1 mm (millimeter). The crosses represent the measured values when the depth of the metal removal 34 is X2 mm. The triangles represent the measured values when the depth of the metal removal 34 is X3 mm. The squares represent the measured values when the depth of the metal removal 34 is X4 mm. Here, X1 < X2 < X3 < X4. L1 is a regression curve obtained by linearly approximating the measured values when the depth of the metal removal 34 is X1 mm. L2 is a regression curve obtained by linearly approximating the measured values when the depth of the metal removal 34 is X2 mm. L3 is a regression curve obtained by linearly approximating the measured values when the depth of the metal removal 34 is X3 mm. L4 is a regression curve obtained by linearly approximating (linear curve) the measured values when the depth of the metal removal 34 is X4 mm. In FIG. 10, when the range of the depth of metal removal (X1 to X4) is about 0 to several millimeters and the range of the background magnetic flux density 51 is about several hundred μT, the range of the leakage magnetic flux density 52 is about 0 to one hundred μT.

[0055] As shown in FIG. 10 , for measurement targets 30 with the same depth of wall thinning 34, the leakage magnetic flux density 52 from the wall thinning 34 increases as the background magnetic flux density 51 increases. For measurement targets 30 with the same depth of wall thinning 34, the relationship between the background magnetic flux density 51 and the leakage magnetic flux density 52 can be roughly approximated by a straight line. Therefore, the processing device 10 according to this embodiment prepares in advance a database of wall thinning shapes including difference data (leakage magnetic flux density 52) and wall thinning depth for each group within a range of the background magnetic flux density 51. The processing device 10 then compares data corresponding to the background magnetic flux density 51 and the leakage magnetic flux density 52 measured by each sensor 26 with the data in the database. As a result, according to this embodiment, the depth of the wall thinning 34 can also be detected, enabling highly accurate detection of the wall thinning 34.

[0056] FIG. 11 is a diagram showing an example of group files classified by range of background magnetic flux density 51. In the example of FIG. 11, the magnitude of background magnetic flux density 51 is classified into ranges of 250 to 299 μT, 300 to 349 μT, 350 to 399 μT, and 400 to 449 μT. Group files 1 to 4 are created for each of these ranges of background magnetic flux density 51, each containing data indicating the relationship between leakage magnetic flux density 52 from wall thinning 34 and the shape of the wall thinning. Here, the magnitude of background magnetic flux density 51 is the magnitude of a representative value of background magnetic flux density 51 measured by each sensor 26 of sensor array 28 in a situation where no wall thinning 34 occurs in pipe 30a. Such a representative value of background magnetic flux density 51 may be, for example, a measurement value of a sensor 26 located at the center of sensor array 28 or an average value of measurements of all sensors 26 included in sensor array 28. When the measurement value of the sensor 26 located at the center of the sensor array 28 is used as the representative value of the background magnetic flux density 51, the processing device 10 can select a group file based on the background magnetic flux density 51 at a specific position. On the other hand, when the average value of the measurement values ​​of all the sensors 26 included in the sensor array 28 is used as the representative value, the processing device 10 can select a group file based on a measurement value in which the influence of noise is reduced by canceling out the influence of noise on each sensor 26.

[0057] 11, group files are created in which the magnitude of the background magnetic flux density 51 has a range of 50 μT, but the range of the magnitude of the background magnetic flux density 51 for classifying the group files is not limited to 50 μT. For example, depending on the required measurement accuracy of wall-thinning, the measurement accuracy of wall-thinning depth can be further improved by narrowing the range of the magnitude of the background magnetic flux density 51 for classifying the group files, such as to 30 μT or 10 μT. On the other hand, if high measurement accuracy is not required, the processing load on the processing device 10 can be reduced by widening the range of the magnitude of the background magnetic flux density 51 for classifying the group files.

[0058] FIG. 12 is a diagram showing an example of data included in group files 1 to 4. Group files 1 to 4 store leakage flux data indicating leakage flux density 52 from wall-cut defects 34 and data on wall-cut defect shapes in association with each other. As shown in FIG. 12, each combination of leakage flux data and wall-cut defect shape data may be assigned an ID (identification information) for identifying them. The leakage flux data indicating leakage flux density 52 from wall-cut defects 34 may be the square root of the sum of the squares of the difference data of the components of magnetic flux density in each direction, i.e., a two-dimensional array of the magnitude of magnetic flux density according to the arrangement of sensors 26. The wall-cut defect shape data may be, for example, data indicating the wall-cut defect depth and width of wall-cut defects 34 and the shape of the edge of wall-cut defects 34 formed on the surface of measurement object 30.

[0059] FIG. 13 is a schematic diagram illustrating the shape of a wall thinning 34 occurring on the inner surface 32 of the pipe 30a. In FIG. 13, the wall thinning depth 35 is the distance between the inner surface 32 and the deepest part of the wall thinning 34. The wall thinning width 36 is the width of the edge of the wall thinning 34 formed on the inner surface 32 in the longitudinal direction of the pipe 30a. Considering that the wall thinning 34 is often formed roughly elliptical, the shape of the edge of the wall thinning 34 formed on the surface of the measurement object 30 may be represented by, for example, the major axis and minor axis. Even when the wall thinning 34 occurs on the outer surface 31 of the pipe 30a, the wall thinning depth 35, the wall thinning width 36, and the shape of the edge of the wall thinning 34 can be defined in a similar manner. The data stored in the group files classified by the range of the background magnetic flux density 51 may be previously obtained through experiments, numerical analysis, or the like. The group files classified by the range of the background magnetic flux density 51 are previously stored in a database provided in the memory unit 12.

[0060] The processing device 10 compares the measured values ​​of the background magnetic flux density 51 and leakage magnetic flux density 52 measured by the sensor 26 with the group files thus classified according to the range of the background magnetic flux density 51. This allows the processing device 10 to detect the depth of the wall thinning 34 with high accuracy, and makes it possible to detect the wall thinning 34 with high accuracy.

[0061] Fig. 14 is a flowchart showing the processing procedure of the wall-thinning detection processing by the measurement system 1 of Fig. 1. Of the operations described with reference to Fig. 14, the operations of the processing device 10 correspond to the information processing method according to this embodiment. Of the steps in Fig. 14, the operations of steps S2 to S8 are executed under the control of the control unit 11 of the processing device 10.

[0062] In step S1, the user magnetizes the pipe 30a, which is the measurement target 30. Specifically, the user uses the magnetization device 40 to move the magnet 41 along the surface of the pipe 30a in the longitudinal direction D2 of the pipe 30a, and then removes the magnet 41 from the surface of the pipe 30a. In this way, the user magnetizes an area of ​​the pipe 30a corresponding to the range of movement of the magnet 41. After the magnetization operation, the user fixes the sensor array 28 of the measurement device 20 to a location where the presence and shape of wall thinning 34 in the pipe 30a should be confirmed. The location where the presence and shape of wall thinning 34 should be confirmed may be, for example, a location where the flow of the fluid flowing through the lumen 39 of the pipe 30a changes, or a location where the load applied to the pipe 30a is thought to be large due to the structure of the fluid flow path.

[0063] In step S2, the control unit 11 of the processing device 10 acquires the magnetic flux density distribution around the pipe 30a, which is the measurement object 30, at the time of installation via the measurement device 20. The magnetic flux density distribution is a two-dimensional array of measured values ​​of magnetic flux density measured by each sensor 26 of the sensor array 28. The control unit 11 may, for example, send a command instructing the magnetic flux density to the measurement device 20, cause the measurement device 20 to measure the magnetic flux density using the sensor array 28, and receive the measurement results from the measurement device 20. The magnetic flux density distribution acquired at the time of installation corresponds to the measured value of the background magnetic flux density 51 of the measurement object 30. The control unit 11 stores the magnetic flux density distribution at the time of installation in the memory unit 12.

[0064] In step S3, the control unit 11 acquires the magnetic flux density distribution around the pipe 30a, which is the measurement target 30, via the measurement device 20 during measurement. As in step S2, the control unit 11 may, for example, send a command instructing the magnetic flux density to the measurement device 20, cause the measurement device 20 to measure the magnetic flux density using the sensor array 28, and receive the measurement results from the measurement device 20. The time interval for measuring the magnetic flux density distribution after installation of the measurement device 20 may be, for example, one day to one month, depending on the rate of corrosion of the measurement target 30 estimated depending on the usage environment of the measurement target 30. The magnetic flux density distribution acquired during measurement corresponds to a measurement value obtained by superimposing leakage magnetic flux density 52 from wall thinning 34 on background magnetic flux density 51 of the measurement target 30.

[0065] In step S4, the control unit 11 obtains a magnetic flux density distribution relating to leakage magnetic flux density 52 from the wall-thinning 34 from the magnetic flux density distribution obtained in step S2 and the magnetic flux density distribution obtained in step S3. Specifically, the control unit 11 subtracts, for each sensor 26, the measurement value of each sensor 26 obtained in step S2 from the measurement value of each sensor 26 obtained in step S3, and obtains the calculated magnetic flux density distribution as the leakage magnetic flux density distribution.

[0066] In step S5, the control unit 11 selects a group file of the corresponding background magnetic flux density 51 based on the magnetic flux density distribution at the time of installation acquired in step S2. The magnetic flux density distribution at the time of installation corresponds to the measured value of the background magnetic flux density 51 of the measurement object 30. Therefore, the control unit 11 acquires the measured value of the sensor 26 provided at the center of the sensor array 28 or the average value of the measured values ​​of each sensor 26 as a representative value of the background magnetic flux density 51. The control unit 11 determines to which range of the magnitude of the background magnetic flux density 51 set in advance the representative value of the background magnetic flux density 51 belongs, and selects the corresponding group file.

[0067] In step S6, the control unit 11 compares the leakage magnetic flux distribution acquired in step S4 with each of the leakage magnetic flux density data from the wall-reduced portion 34 included in the group file selected in step S5.

[0068] In step S7, the control unit 11 determines the presence or absence of thinning 34 and the shape of thinning 34 based on thinning shape data associated with leakage magnetic flux density data that matches the leakage magnetic flux distribution acquired in step S4.

[0069] In step S8, the control unit 11 outputs the determination result in step S7 from the output unit 15. Then, the control unit 11 ends the processing of the flowchart.

[0070] As described above, the processing device 10 is an information processing device that performs a detection process to detect wall thinning 34 occurring in the measurement object 30, which is a magnetic body. The processing device 10 acquires first measurement data, which is a measurement value of the background magnetic flux density 51, which is the magnetic flux density of the magnetic field present around the measurement object 30 when no wall thinning 34 occurs, measured at multiple predetermined positions. The processing device 10 acquires second measurement data, which is a measurement value of the magnetic flux density of the magnetic field present around the measurement object 30 when the detection process is performed, measured at multiple positions. The processing device 10 detects the presence or absence of wall thinning 34 occurring in the measurement object 30 and the depth of the wall thinning 34 based on the first measurement data and the second measurement data. In this way, the processing device 10 detects the depth of the wall thinning 34 using the measurement value of the background magnetic flux density 51 around the measurement object 30 when no wall thinning 34 occurs and the measurement value of the background magnetic flux density 51 at the time of detection. Here, the background magnetic flux density 51 around the measurement object 30 when no wall thinning 34 occurs is a value that mainly reflects only the remanent magnetization 53 inside the measurement object 30. The measured value of the background magnetic flux density 51 during detection mainly reflects the residual magnetization 53 inside the measurement object 30 and the leakage magnetic flux density 52 from the wall-reducing portion 34. Therefore, by using these values, the processing device 10 can detect the depth information of the wall-reducing portion 34 with high accuracy, regardless of the value of the residual magnetization 53.

[0071] Furthermore, the processing device 10 calculates third measurement data, which is a measurement value of leakage magnetic flux density 52 from wall thinning 34 that has occurred in the measurement object 30, from the difference between the first measurement data and the second measurement data. The processing device 10 detects the presence or absence of wall thinning 34 that has occurred in the measurement object 30 and the depth of the wall thinning 34, based on the first measurement data and the third measurement data. In this way, the processing device 10 can detect depth information of wall thinning 34 with higher accuracy by using the measurement value of background magnetic flux density 51 in a state where no wall thinning 34 has occurred and the measurement value of leakage magnetic flux density 52 from the wall thinning 34 at the time of detection.

[0072] The processing device 10 also references a database stored in a storage unit that contains multiple pieces of correspondence data indicating the correspondence between the leakage magnetic flux density 52 and the shape of the wall-thinning 34, including the depth of the wall-thinning 34, for each of multiple groups defined by the range of representative values ​​of the background magnetic flux density 51. The processing device 10 selects, from the multiple groups, a group that includes a representative value of the first measurement data. The processing device 10 detects the presence or absence of wall-thinning 34 in the measurement object 30 and the depth of the wall-thinning 34 based on the shape of the wall-thinning 34 that is associated with the leakage magnetic flux density 52 that matches the third measurement data, in any of the correspondence data included in the selected group. In this way, the processing device 10 detects the depth of the wall-thinning 34 by referring to the correspondence data classified into groups, thereby enabling more accurate and efficient detection of the depth of the wall-thinning 34.

[0073] Furthermore, the shape of the wall-thinning 34, for which the correspondence data indicates a correspondence relationship with the leakage magnetic flux density 52, may further include at least one of the width of the wall-thinning 34 and the shape of the edge of the wall-thinning 34. The processing device 10 may further detect at least one of the width and the shape of the edge of the wall-thinning 34 occurring in the measurement object 30 based on the shape of the wall-thinning 34 corresponding to the leakage magnetic flux density 52 that matches the third measurement data, in any of the correspondence data included in the selected group. In this way, the processing device 10 may detect the wall-thinning 34 using correspondence data, for which the shape of the wall-thinning 34, for which the correspondence relationship with the leakage magnetic flux density 52 indicates a correspondence relationship, further includes at least one of the width of the wall-thinning 34 and the shape of the edge of the wall-thinning 34. Therefore, the processing device 10 can detect not only the depth of the wall-thinning 34 but also at least one of the width of the wall-thinning 34 and the shape of the edge of the wall-thinning 34 with high accuracy.

[0074] The processing device 10 also receives measurement values ​​measured by the plurality of sensors 26 from a sensor array 28, which has a plurality of sensors 26 capable of measuring magnetic flux density arranged two-dimensionally and is provided at a fixed position relative to the measurement target 30, and acquires first and second measurement data. In this way, the processing device 10 detects the wall-thinning 34 based on the measurement values ​​of magnetic flux density measured by the sensor array 28, which is provided at a fixed position relative to the measurement target 30, and therefore can detect the depth of the wall-thinning 34 with high accuracy using a simple configuration. Furthermore, since the wall-thinning 34 can be detected based on the magnetic flux density of the magnetic field that is always present around the measurement target 30, the processing device 10 can detect the wall-thinning 34 with high frequency.

[0075] Furthermore, the processing device 10 performs a detection process to detect wall thinning 34 that has occurred in a magnetized carbon steel pipe 30a as the measurement object 30. Therefore, even if the background magnetic flux density 51 of the magnetic field present around the measurement object 30 varies depending on the carbon content of the measurement object 30, the processing device 10 can detect the depth of the wall thinning 34 with high accuracy.

[0076] [Second embodiment] In the first embodiment, an example in which the processing device 10 is realized by one information processing device has been described, but the functions of the processing device 10 may be distributed among multiple information processing devices depending on the application or purpose. In the present embodiment, an example configuration in which the functions of the processing device 10 are distributed among multiple information processing devices will be described. In the present embodiment, parts having the same configuration or function as those in the first embodiment will be assigned the same reference numerals, and duplicated descriptions may be omitted or simplified as appropriate.

[0077] FIG. 15 is a block diagram showing the configuration of a measurement system 1 according to this embodiment. In FIG. 15, the measurement system 1 includes a processing device 1 (61), a processing device 2 (62), a database 63, a processing device 3 (64), a measurement device 20, and a measurement target 30. The processing device 2 (62) is connected to the processing device 1 (61), the database 63, and the processing device 3 (64) via a communication line so that they can communicate with each other. The processing device 1 (61) and the measurement device 20 are connected to each other via a communication line so that they can communicate with each other. Each of the processing device 1 (61), the processing device 2 (62), and the processing device 3 (64) has a configuration similar to that of the processing device 10 according to the first embodiment described with reference to FIG. 2.

[0078] The processing device 1 (61), the measuring device 20, and the measurement target 30 are installed at a site 71, such as a plant, factory, bridge, or other structure where the measurement target 30 is installed. The processing device 2 (62) and the database 63 are installed at a data center facility 72, for example. The processing device 3 (64) is installed at an operation room 73, for example. The site 71, the data center facility 72, and the operation room 73 may each be managed and operated by a separate organization (for example, a company).

[0079] The measuring device 20 measures the magnetic flux density around the measurement object 30 using the sensor array 28 and transmits the measured magnetic flux density to the processing device 1 (61). The processing device 1 (61) transmits the received measured magnetic flux density data to the processing device 2 (62) without performing any special processing on the measured magnetic flux density data. Similar to the processing device 10 according to the first embodiment, the processing device 2 (62) acquires second measurement data, which are the measured value of the background magnetic flux density 51 when no wall thinning 34 occurs and the measured value of the magnetic flux density of the magnetic field present around the measurement object 30 when the detection process is performed. Based on these measurement values, the processing device 2 (62) detects the presence or absence of wall thinning 34 in the measurement object 30 and the depth of the wall thinning 34. The database 63 is a database of wall thinning shapes that includes difference data (leakage magnetic flux density 52) and the wall thinning depth for each group within the range of the background magnetic flux density 51 magnitude. The processing device 2 (62) references the information in the database 63 to detect the presence or absence of wall thinning 34 in the measurement object 30 and the depth of the wall thinning 34. The processing device 2 (62) transmits the detection result to the processing device 3 (64). The processing device 3 (64) outputs the received processing result from the output unit 15.

[0080] As described above, in the measurement system 1 according to this embodiment, the processes of measuring the magnetic flux density of the magnetic field present around the measurement target 30, detecting wall thinning 34 based on the measurement results, and displaying the detection results are each performed by a processing device of a specialized organization. Therefore, the configuration according to this embodiment makes it possible to improve the efficiency of operations.

[0081] The present disclosure is not limited to the above-described embodiments. For example, multiple blocks shown in the block diagrams may be integrated, or one block may be divided. Multiple steps shown in the flowcharts may be executed in parallel or in a different order depending on the processing capabilities of the device executing each step, or as needed, instead of being executed in chronological order as described. Other modifications are possible without departing from the spirit of the present disclosure. [Explanation of symbols]

[0082] 1. Measurement System 10 Processing equipment 11 Control section 12 Storage section 13 Communications Department 14 Input section 15 Output section 20 Measuring Equipment 22 Control Unit 24 Communications Department 26 sensors 28 Sensor Array 30 Measurement Objects 30a piping 31 Outer surface 32 Inner surface 34 Thinning 35 Thinning depth 36 Thickness reduction width 38 Wall 39 Lumen 40 Magnetizer 41 Magnet 42 cases 43 Hinge 44 Locking mechanism 45 Handle 51 Background magnetic flux density 52 Leakage magnetic flux density 53 Residual magnetization

Claims

1. An information processing device that performs detection processing to detect thinning that has occurred in a measurement object that is a magnetic body, a background magnetic flux density, which is a magnetic flux density of a magnetic field present around the measurement object in a state where the thinning does not occur, is measured at a plurality of predetermined positions, and first measurement data is obtained; acquiring second measurement data that is a measurement value of a magnetic flux density of a magnetic field present around the measurement target when performing the detection process, measured at the plurality of positions; detecting the presence or absence of thinning occurring in the measurement object and the depth of the thinning based on the first measurement data and the second measurement data; A control unit is provided, The control unit calculating third measurement data, which is a measurement value of leakage magnetic flux density from the thinning that has occurred in the measurement object, based on a difference between the first measurement data and the second measurement data; by referring to correspondence data indicating a correspondence relationship between the background magnetic flux density and the leakage magnetic flux density and the shape of the wall-thinning including the depth of the wall-thinning, detecting the presence or absence of the wall-thinning occurring in the measurement object and the depth of the wall-thinning based on the shape of the wall-thinning associated with the leakage magnetic flux density that matches the first measurement data and the third measurement data; Information processing device.

2. The control unit a database stored in a storage unit that has a plurality of correspondence data indicating a correspondence relationship between the leakage magnetic flux density and the shape of the wall-thinning including the depth of the wall-thinning for each of a plurality of groups defined by a range of the representative value of the background magnetic flux density, and selecting a group from the plurality of groups that includes a representative value of the first measurement data; Detecting the presence or absence of thinning and the depth of thinning that has occurred in the measurement object based on the shape of thinning that is associated with the leakage magnetic flux density that matches the third measurement data in any of the correspondence data included in the selected group. The information processing device according to claim 1 .

3. The shape of the thinning, which the correspondence data indicates a correspondence relationship with the leakage magnetic flux density, further includes at least one of a width of the thinning and a shape of an edge of the thinning, The control unit further detects at least one of the width of the thinning occurring in the measurement object and the shape of the edge of the thinning, based on the shape of the thinning associated with the leakage magnetic flux density that matches the third measurement data in any of the correspondence data included in the selected group. The information processing device according to claim 2 .

4. 4. The information processing device according to claim 1, wherein the control unit receives measurement values ​​measured by a plurality of sensors from a sensor array in which a plurality of sensors capable of measuring magnetic flux density are arranged two-dimensionally and are provided at a fixed position relative to the measurement object, and acquires the first measurement data and the second measurement data.

5. The information processing device according to claim 1 , wherein the control unit performs the detection process to detect the wall thinning that has occurred in a magnetized carbon steel pipe as the measurement object.

6. An information processing method of an information processing device that performs a detection process to detect thinning that has occurred in a measurement object that is a magnetic body, a control unit of the information processing device, a step of acquiring first measurement data that is a measurement value of background magnetic flux density, which is a magnetic flux density of a magnetic field present around the measurement object in a state where the thinning does not occur, measured at a plurality of predetermined positions; acquiring second measurement data that is a measurement value of the magnetic flux density of the magnetic field present around the measurement object at the plurality of positions when performing the detection process; detecting the presence or absence of thinning and the depth of thinning that has occurred in the measurement object based on the first measurement data and the second measurement data; Including, The control unit calculating third measurement data, which is a measurement value of leakage magnetic flux density from the thinning that has occurred in the measurement object, based on a difference between the first measurement data and the second measurement data; by referring to correspondence data indicating a correspondence relationship between the background magnetic flux density and the leakage magnetic flux density and the shape of the wall-thinning including the depth of the wall-thinning, detecting the presence or absence of the wall-thinning occurring in the measurement object and the depth of the wall-thinning based on the shape of the wall-thinning associated with the leakage magnetic flux density that matches the first measurement data and the third measurement data; An information processing method for an information processing device.

7. A measurement system that performs a detection process to detect thinning that has occurred in a measurement target that is a magnetic body, the measurement system comprising a sensor array in which a plurality of sensors capable of measuring magnetic flux density are arranged two-dimensionally, and an information processing device, the sensor array is provided at a fixed position relative to the measurement object; The information processing device includes: acquiring first measurement data that is a measurement value measured by the plurality of sensors of the sensor array of a background magnetic flux density that is a magnetic flux density of a magnetic field present around the measurement target in a state where the thinning does not occur; acquiring second measurement data that is a measurement value measured by the plurality of sensors of the sensor array regarding the magnetic flux density of the magnetic field present around the measurement target when performing the detection process; detecting the presence or absence of thinning occurring in the measurement object and the depth of the thinning based on the first measurement data and the second measurement data; A control unit is provided, The control unit calculating third measurement data, which is a measurement value of leakage magnetic flux density from the thinning that has occurred in the measurement object, based on a difference between the first measurement data and the second measurement data; by referring to correspondence data indicating a correspondence relationship between the background magnetic flux density and the leakage magnetic flux density and the shape of the wall-thinning including the depth of the wall-thinning, detecting the presence or absence of the wall-thinning occurring in the measurement object and the depth of the wall-thinning based on the shape of the wall-thinning associated with the leakage magnetic flux density that matches the first measurement data and the third measurement data; Measurement system.

8. A program that causes a computer to function as the information processing device according to any one of claims 1 to 5.

Images