Autofocus support method, autofocus support device, and autofocus support program

Abstract

An autofocus assistance method according to an embodiment of this invention assists automatic focusing on a semiconductor device D including a substrate and a device pattern formed on one of the major surfaces of the substrate. The method includes: a step for obtaining a first image focused on the substrate; a step for obtaining a spatial frequency image from the first image by Fourier transform and generating mask data for masking linear patterns that are on the substrate and in the same direction on the basis of the spatial frequency image; a step for filtering multiple second images by using the mask data, the second images being captured on another one of the major surfaces of the substrate by using an imaging device while changing the focal position of the imaging device; and a step for focusing the imaging device on the device pattern on the basis of the filtered second images.

Description

[Technical Field]

[0001] One aspect of the embodiment relates to an autofocus support method, an autofocus support device, and an autofocus support program. [Background technology]

[0002] Patent Document 1 discloses a semiconductor device failure analysis device having an automatic wavelength adjustment function that automatically sets the optimal illumination light wavelength by determining the optimal wavelength that maximizes the contrast of the reflected light image captured from the back side of the substrate for semiconductor devices with various impurity concentrations, and an autofocus (automatic focus adjustment) function. [Prior art documents] [Patent documents]

[0003] [Patent Document 1] Japanese Patent Application Laid-Open No. 2003-232749 Summary of the Invention [Problem to be solved by the invention]

[0004] Conventionally, images of semiconductor devices as devices under test (DUTs) have been acquired, and various analyses, such as identifying fault locations, have been performed based on these images. Recently, polishing the surface of the substrate that constitutes the semiconductor device has been studied to thin the semiconductor device substrate and set optimal conditions for image acquisition. When an image of a semiconductor device with a polished substrate surface is acquired using an imaging device with an autofocus function, there has been a problem in that the accuracy of the autofocus for the device pattern within the semiconductor device decreases.

[0005] Therefore, an object of one aspect of the embodiments is to provide an autofocus support method, an autofocus support device, and an autofocus support program that can improve the accuracy of autofocus for a device pattern in a semiconductor device. [Means for solving the problem]

[0006] An autofocus assistance method according to a first aspect of an embodiment is a method for assisting autofocus for a semiconductor device having a substrate and a device pattern formed on one main surface of the substrate, and includes an image acquisition step of acquiring a first image focused on the substrate, a generation step of acquiring a spatial frequency image from the first image by Fourier transform and generating mask data that masks linear patterns in the same direction on the substrate based on the spatial frequency image, a processing step of acquiring a plurality of second images captured using an imaging device on the other main surface of the substrate while changing the focal position of the imaging device and performing filtering on the second images using the mask data, and a focus adjustment step of focusing the imaging device on the device pattern based on the filtered second image.

[0007] Alternatively, an autofocus support device according to a second aspect of the embodiment includes a stage for mounting a semiconductor device having a substrate and a device pattern formed on one main surface of the substrate, an imaging device having a light source for irradiating light onto the semiconductor device and a photodetector for detecting light from the semiconductor device, and a control unit for controlling the relative position of the stage and the imaging device. The control unit includes an image acquisition unit for acquiring a first image focused on the substrate, a generation unit for acquiring a spatial frequency image from the first image by Fourier transform and generating mask data for masking a linear pattern on the substrate in the same direction based on the spatial frequency image, a processing unit for acquiring a plurality of second images captured by the imaging device while changing the focal position of the imaging device on the other main surface of the substrate and filtering the second images using the mask data, and a focus adjustment unit for focusing the imaging device on the device pattern based on the filtered second image.

[0008] Alternatively, an autofocus assistance program relating to a third aspect of the embodiment is an autofocus assistance program for assisting autofocusing for a semiconductor device having a substrate and a device pattern formed on one main surface side of the substrate, and causes a computer to function as an image acquisition unit that acquires a first image focused on the substrate, a generation unit that acquires a spatial frequency image from the first image by Fourier transform and generates mask data that masks linear patterns in the same direction on the substrate based on the spatial frequency image, a processing unit that acquires multiple second images captured using an imaging device on the other main surface side of the substrate while changing the focal position of the imaging device and performs filtering on the second images using the mask data, and a focus adjustment unit that focuses the imaging device on the device pattern based on the second image after filtering.

[0009] According to the first, second, or third aspect, a spatial frequency image is acquired from a first image focused on the substrate, and mask data for masking linear patterns in the same direction on the substrate is generated based on the spatial frequency image. Then, a second image, which is an image captured on the other main surface of the substrate while changing the focal position, is filtered using the mask data and processed to focus on the device pattern formed on one main surface of the substrate. In this case, linear patterns in the same direction in the second image are reduced. By adjusting the focus based on such a second image, the accuracy of autofocusing on the device pattern in the semiconductor device can be improved. [Effects of the Invention]

[0010] According to one aspect of the present disclosure, it is possible to improve the accuracy of autofocusing on a device pattern in a semiconductor device. [Brief explanation of the drawings]

[0011] [Figure 1]1 is a schematic diagram illustrating the configuration of an autofocus support device according to an embodiment. [Figure 2] FIG. 2 is a diagram showing an example of a first image. [Figure 3] FIG. 2 is a diagram showing an example of a first image. [Figure 4] FIG. 2 is a diagram showing an example of a first image. [Figure 5] FIG. 10 is a diagram showing an image for explaining an example of generating a spatial frequency image. [Figure 6] 10A and 10B are diagrams illustrating images for explaining mask data creation processing and inverse Fourier transform processing. [Figure 7] 10 is a graph showing an example of the sum of frequency components for each angle. [Figure 8] 10A and 10B are diagrams illustrating images for explaining a process of calculating a masking width. [Figure 9] 10 is a graph for explaining a process of calculating a masking width. [Figure 10] 10 is a graph for explaining a process of calculating a masking width. [Figure 11] 10A and 10B are diagrams illustrating images for explaining filtering processing for each focus position. [Figure 12] 10A and 10B are diagrams illustrating images for explaining filtering processing for each focus position. [Figure 13] 10A and 10B are diagrams illustrating images for explaining filtering processing for each focus position. [Figure 14] FIG. 10 is a diagram showing an image for explaining a first example of focus adjustment. [Figure 15] FIG. 10 is a diagram showing an image for explaining a second example of focus adjustment. [Figure 16] FIG. 10 is a diagram showing an image for explaining an example of generating a spatial frequency image. [Figure 17] FIG. 10 is a diagram showing an image for explaining an example of calculation of an angle component. [Figure 18] 10 is a graph showing an example of the sum of frequency components for each angle. [Figure 19] FIG. 10 is a diagram showing an image for explaining the distinction between the first spatial frequency region and the second spatial frequency region. [Figure 20] 10 is a graph showing an example of the sum of frequency components for each angle using a moving average. [Figure 21] 10A and 10B are diagrams illustrating an example of a second image and a second image after filtering. [Figure 22] 10A and 10B are diagrams illustrating an example of a second image and a second image after filtering. [Figure 23] 10A and 10B are diagrams illustrating an example of a second image and a second image after filtering. [Figure 24] 10A and 10B are diagrams illustrating an example of a second image and a second image after filtering. [Figure 25] 10A and 10B are diagrams illustrating an example of a second image and a second image after filtering. [Figure 26] 10A and 10B are diagrams illustrating an example of a second image and a second image after filtering. [Figure 27] 10 is a flowchart illustrating an example of an operation procedure of the autofocus support device. [Figure 28] 10A and 10B are diagrams illustrating images for explaining an autofocus function according to a comparative example. [Figure 29] 10 is a graph for explaining an autofocus function according to a comparative example. [Figure 30] 10 is a graph for explaining the influence between two maximum values ​​of the autofocus index value according to the comparative example. [Figure 31] 10 is a graph showing calculation results of a shift amount according to a comparative example. [Figure 32] FIG. 10 is a diagram showing variations of mask data. [Figure 33] FIG. 10 is a diagram showing an image for explaining an example of generating a spatial frequency image. [Figure 34] FIG. 10 is a diagram showing an image for explaining an example of filtering processing. [Figure 35] FIG. 10 is a diagram showing an image for explaining an example of filtering processing. [Figure 36] FIG. 10 is a diagram showing an image for explaining an example of filtering processing. [Figure 37] FIG. 10 is a diagram showing an image for explaining an example of filtering processing. DETAILED DESCRIPTION OF THE INVENTION

[0012] Hereinafter, preferred embodiments of the present disclosure will be described in detail with reference to the drawings. In each drawing, the same or corresponding parts are designated by the same reference numerals, and duplicated explanations will be omitted.

[0013] 1 is a schematic diagram of an autofocus support device 1 according to an embodiment. The autofocus support device 1 is a device for supporting an autofocus function used when acquiring an image of a semiconductor device D. The acquired image is used for analyzing the semiconductor device D. Analysis of the semiconductor device D includes, but is not limited to, identifying the location of a fault in the semiconductor device D. Analysis of the semiconductor device D also includes other analyses and inspections related to the semiconductor device D.

[0014] The semiconductor device D may be a discrete semiconductor element including a diode or a power transistor, an optoelectronic element, a sensor / actuator, a logic LSI (Large Scale Integration) consisting of transistors with a MOS (Metal-Oxide-Semiconductor) structure or a bipolar structure, a memory element, a linear IC (Integrated Circuit), a hybrid device thereof, etc. The semiconductor device D may also be a package including a semiconductor device, a composite substrate, etc.

[0015] The semiconductor device D has a layered structure including a substrate and a metal layer. The substrate of the semiconductor device D may be made of, for example, silicon, SiC (silicon carbide), or GaN (gallium nitride). The substrate of the semiconductor device D of this embodiment is made of silicon and has a thickness (e.g., 200 μm) according to the functional requirements of the device. A device pattern is formed on the front surface D2 (one of the main surfaces) of the substrate. A plurality of linear polishing scratches in the same direction are formed on the back surface D1 (the other main surface) of the substrate by polishing. The semiconductor device D is placed on a sample stage 30.

[0016] The autofocus support device 1 includes an imaging device 10, an XYZ stage 13, a calculator 21, a display unit 22, and an input unit 23. The imaging device 10 includes a light source 11, an optical system 12, and a photodetector 14.

[0017] The light source 11 outputs light for illuminating the semiconductor device D. The light source 11 is, for example, an LED (Light Emitting Diode) or a lamp light source, and is connected to a power source (not shown). The light output from the light source 11 is guided to the optical system 12.

[0018] The optical system 12 irradiates the semiconductor device D with light output from the light source 11 from the substrate side of the semiconductor device D, i.e., the back surface D1 side of the substrate of the semiconductor device D. The optical system 12 has a beam splitter and an objective lens. The objective lens focuses the light output from the light source 11 and guided by the beam splitter onto the semiconductor device D. As the objective lens, for example, a 5x objective lens with a numerical aperture (NA) of 0.14 and a depth of focus (DOF) of 33 μm, a 20x objective lens with an NA of 0.4 and a DOF of 4.1 μm, or a 100x objective lens with an NA of 0.5 and a DOF of 2.6 μm may be used. Note that the DOF is a calculated value when the wavelength of the light is 1.3 μm.

[0019] The optical system 12 is placed on an XYZ stage 13. The XYZ stage 13 moves the optical system 12 in the Z-axis direction, which is the optical axis direction of the objective lens, as well as in the X-axis and Y-axis directions perpendicular to the Z-axis direction. The XYZ stage 13 is controlled by a computer 21 to be movable in the above-mentioned three axis directions. The observation area is determined by the position of the XYZ stage 13.

[0020] In response to the illuminated light, the optical system 12 transmits light reflected by the semiconductor device D (reflected light) to the photodetector 14. As an example, the wavelength of the illuminated light is 1.0 μm or more. In this case, the light passes through the silicon substrate of the semiconductor device D and is reflected by the device pattern. The light reflected by the device pattern then passes through the substrate again and is input to the photodetector 14 via the objective lens and beam splitter of the optical system 12.

[0021] The photodetector 14 captures an image of light from the semiconductor device D and outputs image data (detection signals). For example, the photodetector 14 captures an image of light reflected from the semiconductor device D and outputs image data for creating mask data for masking a linear pattern on a substrate. The photodetector 14 may be an InGaAs camera, a laser microscope, a CCD camera equipped with a CCD (Charge Coupled Device) image sensor, or a CMOS camera equipped with a CMOS image sensor. When the photodetector 14 is an InGaAs camera, it is used together with a light source 11 that emits infrared light with a wavelength of 1.0 μm or more. When the photodetector 14 is a laser microscope, it is used together with a light source 11 that emits a laser with a wavelength of 1.3 μm. When the photodetector 14 is a CCD camera, it is used together with a light source 11 that emits visible light.

[0022] The computer 21 functions as a control unit that controls the operation of the autofocus support device 1. The computer 21 is, for example, a computer such as a personal computer. The computer 21 is connected to the light source 11, the optical system 12, the XYZ stage 13, and the photodetector 14. The computer 21 is also connected to a display unit 22 and an input unit 23. The display unit 22 is a display device such as a monitor. The input unit 23 is an input device such as a keyboard and a mouse that accepts input from a user. For example, the computer 21 controls the relative position between the sample stage 30 and the optical system 12 by moving the XYZ stage 13 in three axial directions. The computer 21 has an image acquisition unit 21a, a generation unit 21b, a processing unit 21c, and a focus adjustment unit 21d.

[0023] The image acquisition unit 21a acquires a first image in focus on the substrate. The first image is an image of the semiconductor device D captured from the back surface D1 side of the substrate. The focus of the first image may be adjusted manually or automatically.

[0024] The generator 21b acquires a spatial frequency image from the first image by Fourier transform, and generates mask data for masking the linear pattern on the substrate based on the spatial frequency image.

[0025] The processing unit 21c acquires a plurality of second images captured by the imaging device 10 on the rear surface D1 side of the substrate while changing the focal position of the imaging device 10, and performs filtering on the second images using mask data.

[0026] The focus adjustment unit 21d focuses the imaging device 10 on the device pattern based on the filtered second image.

[0027] The computer 21 outputs an image (analysis image) of the semiconductor device D captured with the device pattern in focus to the display unit 22. The display unit 22 displays the input analysis image. In this case, the user confirms the location of the fault from the analysis image displayed on the display unit 22, and inputs information indicating the fault location to the input unit 23. The input unit 23 outputs the information indicating the fault location received from the user to the computer 21.

[0028] Each functional unit of the computer 21 is a function realized by an arithmetic processing unit (processor) such as a CPU of the computer 21 executing a computer program (autofocus support program) stored in a storage medium such as an internal memory or hard disk drive of the computer 21. The arithmetic processing unit of the computer 21 executes this computer program to cause the computer 21 to function as each functional unit of FIG. 1 and sequentially execute the autofocus support process described below. Various data required for executing this computer program and various data generated by executing this computer program are stored in a storage medium such as an internal memory of the computer 21, such as RAM (DRAM, SRAM, logic-embedded flash memory, MRAM, etc.), flash memory, SSD, or hard disk drive.

[0029] 2 to 4 are diagrams showing examples of the first image. The first image shown in Fig. 2 to 4 is an image captured with the back surface D1 of the substrate of the semiconductor device D in focus.

[0030] Parts (a), (b), and (c) of Figure 2 show first images P1, P2, and P3, respectively, captured by an InGaAs camera using infrared light illumination with a wavelength of 1.0 μm or longer. First images P1, P2, and P3 were captured using a 5x objective lens, a 20x objective lens, and a 100x objective lens, respectively. First image P1 reveals the device pattern along with the polishing scratches formed on the back surface D1. Light incident on the substrate travels farther due to the refractive index of silicon (=3.5). Therefore, even when the focal position of the imaging device 10 is focused on the back surface D1, the device pattern may appear as in first image P1 depending on conditions such as a DOF of 33 μm and a substrate thickness of 200 μm. On the other hand, first images P2 and P3 barely reveal the device pattern, and only reveal the polishing scratches formed on the back surface D1. The 20x and 100x objective lenses have high NA and shallow DOF, so the device pattern hardly appears in the first image P2 and the first image P3.

[0031] Parts (a), (b), and (c) of Figure 3 show first images P4, P5, and P6, respectively, captured by a laser microscope using a laser beam with a wavelength of 1.3 μm. First images P4, P5, and P6 were captured using a 5x objective lens, a 20x objective lens, and a 100x objective lens, respectively. In first image P4, the device pattern appears along with the polishing scratches formed on the back surface D1 for the same reason as in first image P1 shown in part (a) of Figure 2. In first images P5 and P6, the device pattern is barely visible, and only the polishing scratches formed on the back surface D1 are visible for the same reason as in first images P2 and P3 shown in part (a) of Figure 2.

[0032] Parts (a), (b), and (c) of Figure 4 show first images P7, P8, and P9, respectively, captured by a CCD camera using visible light illumination. First images P7, P8, and P9 were captured using a 5x objective lens, a 20x objective lens, and a 100x objective lens, respectively. Because visible light does not pass through a silicon substrate, first images P7, P8, and P9 do not show the device pattern, but show the polishing scratches formed on the back surface D1.

[0033] Next, an example of the processing of the generation unit 21b will be described. FIG. 5 is a diagram showing an image for explaining an example of generation of a spatial frequency image. Image P10 shown in FIG. 5 is a first image captured by a CCD camera using a 5x objective lens and visible light illumination, with the back surface D1 of the substrate in focus. In image P10, multiple polishing scratches, which are linear patterns in a specific direction (diagonal), appear throughout the image. Image P10 is composed of, for example, 512 x 512 pixels, and has pixel values ​​(brightness) in a two-dimensional coordinate system of the x and y axes. The brightness at coordinates (x, y) can be expressed as f(x, y).

[0034] The generator 21b obtains a spatial frequency image from the first image by Fourier transform. The spatial frequency image indicates the frequency of luminance changes in the first image and has a dimension equal to the inverse of its length. In such a spatial frequency image, features with high luminance change frequency appear in white. For example, the generator 21b obtains a spatial frequency image P101 by Fourier transforming the image P10. The spatial frequency image P101 indicates the frequency F(u,v) of luminance changes in the image P10. The u and v axes, which correspond to the vertical and horizontal axes of the spatial frequency image P101, respectively, have units of Lines / 512 pixels. As an example, the frequency F(10,0) of a point on the spatial frequency image P101 indicates the frequency of 10 luminance changes among 512 pixels in the y-axis direction of the image P10. In the spatial frequency image P101, the spatial frequency region F1 appears as a diagonally extending white line.

[0035] Furthermore, the generation unit 21b generates mask data for masking the linear pattern on the substrate based on the spatial frequency image P101. For example, the generation unit 21b identifies the spatial frequency region F1 on the spatial frequency image P101. Fig. 6 is a diagram showing images for explaining the mask data creation process and the inverse Fourier transform process. Images P102 and P103 shown in Fig. 6 are examples of two images used in the process related to the identification of the spatial frequency region F1.

[0036] A first example of identifying the spatial frequency domain F1 is angle recognition based on a user input. The image P102 is an image displaying a user interface that accepts user input on the spatial frequency image P101. For example, the display unit 22 displays a rectangular box U that passes through the center of the image P102 together with the image P102. The input unit 23 accepts user input such as a mouse operation or an arrow key press, and rotates the box U based on the center of the image P102. For example, the input unit 23 accepts user input that matches the angle of the spatial frequency domain F1 with the angle of the box U on the image P102. Based on such user input, the generation unit 21b identifies the spatial frequency domain F1.

[0037] A second example of identifying the spatial frequency region F1 is recognition by calculating frequency components for each angle. The generation unit 21b calculates the sum of frequency components for each region of a plurality of angles relative to the central axis of the spatial frequency image P101. For example, the generation unit 21b generates an image P103 by masking the peripheral portion of the spatial frequency image P101 so as to leave a circular region CA. The generation unit 21b also calculates the sum of frequency components within the circular region CA within a range of ±0.5° for each angle θ. The generation unit 21b then identifies the spatial frequency region F1 from among the regions of a plurality of angles θ based on the sum of frequency components for each region of a plurality of angles θ. FIG. 7 is a graph showing an example of the sum of frequency components for each angle θ. In graph G1, the horizontal axis represents the angle θ, and the vertical axis represents the sum of frequency components. In graph G1, peaks appear in the sum of frequency components at angles θ=34° and θ=214°, which are other than 0°, 90°, 180°, and 270° and correspond to vertical and horizontal patterns different from polishing scratches. The generator 21b identifies such peaks in the sum of frequency components for each angle θ as spatial frequency region F1.

[0038] Next, the generation unit 21b generates mask data based on the spatial frequency domain F1. The generation unit 21b generates linear mask data based on the angle (tilt) of the spatial frequency domain F1 relative to the central axis of the spatial frequency image P101. The mask data has a predetermined masking width. The masking width may be a predetermined width or may be a width calculated by a masking width calculation process described below.

[0039] 8 is a diagram showing images for explaining the calculation process of the masking width. Image P1011 is an image in which the peripheral portion of the spatial frequency image P101 has been masked so as to leave a circular region. The generation unit 21b rotates the spatial frequency image P101 so that the spatial frequency region F1 of image P1011 is oriented in the vertical axis direction, thereby obtaining image P1012. In image P1012, boxes (Box 1 to Box 10), which are predetermined regions, are allocated in order from the center of the image toward the outside of the image.

[0040] FIG. 9 is a graph for explaining the calculation process of the masking width. Graph G2 is a graph obtained by calculating the profile along the horizontal axis of each box (Box 1 to Box 10) of image P1012 shown in FIG. 8. In graph G2, the horizontal axis represents the spatial frequency along the horizontal axis of image P1012, and the vertical axis represents the projection value (change in brightness). Graph G2 also plots the profile of each box using small circles, and the results of applying a Gaussian distribution to each small circle using the least squares method are shown using lines. The Gaussian distribution widens from Box 1 near the center of image P1012 toward Box 10 on the outside.

[0041] FIG. 10 is a graph for explaining the calculation process of the masking width. Graph G3 shown in FIG. 10 is a graph in which the standard deviation of the Gaussian distribution shown in FIG. 9 is plotted according to the box number. In graph G3, the horizontal axis represents the box number, and the vertical axis represents the standard deviation of the Gaussian distribution. The generation unit 21b calculates a width that is, for example, three times the standard deviation as the masking width. This masking width can include frequency components corresponding to 99.7% of the polishing scratches.

[0042] Returning to FIG. 6, the filtering process will be described. Image P104 is an image in which mask data M generated by the generation unit 21b is superimposed on the spatial frequency image P101. On image P104, the spatial frequency region F1 on the spatial frequency image P101 and the mask data M overlap. When an inverse Fourier transform is performed on image P104, a filtered image P105 is generated. Compared to image P10 shown in FIG. 5, image P105 has reduced polishing scratch patterns.

[0043] 11 to 13 are diagrams showing images for explaining filtering processing for each focal position. The processing unit 21c acquires a plurality of second images captured using the imaging device 10 while changing the focal position of the imaging device 10 on the rear surface D1 side. The processing unit 21c changes the focal position of the imaging device 10 by moving the XYZ stage 13 in a direction approaching the sample stage 30. The processing unit 21c also performs filtering on the second images using mask data. The filtering in FIGS. 11 to 13 uses common mask data.

[0044] Image P11 shown in FIG. 11 is a second image captured with a laser microscope using a 20x objective lens and a laser beam with a wavelength of 1.3 μm, with the focus focused on the back surface D1 of the substrate of semiconductor device D. Image P11 reveals polishing scratches formed on the back surface D1. Processing unit 21c performs a Fourier transform on image P11 to obtain a spatial frequency image P111. Processing unit 21c also performs an inverse Fourier transform on image P112, which is an image P111 overlaid with mask data, to obtain a filtered image P113. Image P113 has a reduced polishing scratch pattern compared to image P11. Furthermore, image P113 has shading, which is a change in brightness across the entire image, removed. This removal of shading serves as background noise cancellation when using a value obtained by normalizing the contrast value by the brightness value of the entire image as the autofocus index value.

[0045] Image P12 shown in FIG. 12 is a second image captured by a laser microscope using a 20x objective lens and laser light having a wavelength of 1.3 μm, with the focus focused between the back surface D1 of the substrate of semiconductor device D and the device pattern. Image P12 shows the device pattern along with polishing scratches formed on the back surface D1. Processing unit 21c performs a Fourier transform on image P12 to obtain a spatial frequency image P121. Processing unit 21c performs an inverse Fourier transform on image P122, in which mask data is superimposed on spatial frequency image P121, to obtain a filtered image P123. Image P123 has a reduced polishing scratch pattern compared to image P12.

[0046] Image P13 shown in FIG. 13 is a second image captured with a laser microscope using a 20x objective lens and a laser beam with a wavelength of 1.3 μm, with the device pattern of semiconductor device D in focus. Image P13 shows slight polishing scratches formed on the back surface D1 along with the device pattern. Processing unit 21c performs a Fourier transform on image P13 to obtain spatial frequency image P131. Processing unit 21c performs an inverse Fourier transform on image P132, in which mask data is superimposed on spatial frequency image P131, to obtain filtered image P133. Image P133 has a reduced polishing scratch pattern compared to image P13.

[0047] The focus adjustment unit 21d adjusts the focus position of the imaging device 10. For example, the focus adjustment unit 21d focuses the imaging device 10 on a device pattern based on an autofocus index value calculated from an image. Examples of the autofocus index value that can be used include a contrast value, a value obtained by normalizing the contrast value by the luminance value of the entire image, the sum of frequency components acquired by Fourier transform, and a value calculated according to a deep learning process. In this embodiment, the autofocus index value will be described as a contrast value.

[0048] 14 is a diagram showing an image for explaining a first example of focus adjustment. In the first example, a laser microscope using a 20x objective lens and a laser beam having a wavelength of 1.3 μm is used. In the first example, mask data is generated while changing the position of the focus, and the focus is adjusted based on a second image filtered using the mask data while further changing the position of the focus.

[0049] The image acquisition unit 21a acquires a first image while changing the focus of the imaging device 10. The generation unit 21b acquires an autofocus index value based on the first image in order to detect a state in which the focal position is focused on the back surface D1 of the substrate. Here, an image captured in a state in which the focal position is focused on the back surface D1 of the substrate may have a local maximum autofocus index value due to the influence of polishing scratches formed on the back surface D1.

[0050] Image P14 is a first image captured with the focus focused on a position in front of the back surface D1 of the substrate. The autofocus index value based on image P14 is unlikely to be a local maximum value. Image P141 is a first image captured with the focal position focused on the back surface D1 of the substrate. The autofocus index value based on image P141 may be a local maximum value. When this local maximum value is detected, generation unit 21b generates mask data based on image P141. Images acquired after the generation of the mask data become second images.

[0051] Image P142 is a second image captured with the focal position focused on a position between the back surface D1 and the front surface D2 of the substrate. Image P143 is a second image after filtering based on image P142. Image P144 is a second image captured with the focal position focused on a device pattern formed on the front surface D2 of the substrate. Image P145 is a second image after filtering based on image P144. Image P146 is a second image captured with the focal position focused on a position far from the device pattern. Image P147 is a second image after filtering based on image P146. The focus adjustment unit 21d obtains an autofocus index value based on each filtered second image and focuses the imaging device 10 on the device pattern. Here, the autofocus index value of image P145 may be a local maximum due to the influence of the device pattern.

[0052] In the first example, the maximum value of the autofocus index value is detected twice. In the first example, the filtering process is performed after the first maximum value is detected, so the processing load related to the filtering process can be reduced.

[0053] 15 is a diagram showing an image for explaining a second example of focus adjustment. In the second example, a laser microscope using a 20x objective lens and a laser beam having a wavelength of 1.3 μm is used, as in the first example. The second example is a process in which filtering is performed using mask data generated in advance, and focus adjustment is performed based on a second image after filtering.

[0054] Image P15 is a second image captured with the focal position focused on a position in front of the back surface D1 of the substrate. Image P151 is a second image after filtering based on image P15. Image P152 is a second image captured with the focal position focused on the back surface D1 of the substrate. Image P153 is a second image after filtering based on image P152. Image P154 is a second image captured with the focal position focused on a position between the back surface D1 and front surface D2 of the substrate. Image P155 is a second image after filtering based on image P154. Image P156 is a second image captured with the focal position focused on a device pattern formed on the front surface D2 side of the substrate. Image P157 is a second image after filtering based on image P156. Image P158 is a second image captured with the focal position focused on a position far from the device pattern. Image P159 is a second image after filtering based on image P158. Focus adjustment unit 21d obtains an autofocus index value based on the second image after filtering, and focuses imaging device 10 on the device pattern. Here, image P157, captured while focused on the device pattern, may have a local maximum autofocus index value due to the influence of the device pattern.

[0055] In the second example, the maximum value of the autofocus index value is detected once. This is because the influence of polishing scratches formed on the back surface D1 on the autofocus index value is suppressed. In the second example, the maximum value of the autofocus index value is detected with high accuracy, thereby improving the accuracy of autofocus for the device pattern.

[0056] Next, an application example of the autofocus support device 1 under adverse conditions will be described with reference to FIGS. 16 to 20. FIG. 16 is a diagram showing an image for explaining an example of generating a spatial frequency image. Image P16 shown in FIG. 16 is a first image captured with a laser microscope using a 5x objective lens and laser light having a wavelength of 1.3 μm, with the back surface D1 of the substrate in focus. The semiconductor device D in image P16 is tilted by 5° from the central axis of the image. This tilt is caused, for example, by the semiconductor device D being tilted on the sample stage 30. In image P16, the device pattern appears along with polishing scratches formed on the back surface D1.

[0057] The generator 21b obtains a spatial frequency image P161 by performing a Fourier transform on the image P16. In the spatial frequency image P161, various white lines appear due to the device pattern and the polishing scratch pattern.

[0058] Based on the spatial frequency image P161, the generation unit 21b distinguishes between a first spatial frequency region corresponding to the polishing scratch pattern and a second spatial frequency region including the device pattern. FIG. 17 is a diagram illustrating an example of calculation of angle components. As shown in FIG. 17, the generation unit 21b generates an image P162 by masking the peripheral portion of the spatial frequency image P161 so as to leave a circular region CB. The generation unit 21b also calculates the sum of frequency components within the circular region CB within a range of ±0.5° for each angle θ. The generation unit 21b then distinguishes between the first spatial frequency region and the second spatial frequency region based on the sum of frequency components for each of the multiple angle regions.

[0059] FIG. 18 is a graph showing an example of the sum of frequency components for each angle. In graph G4, the horizontal axis represents the angle θ, and the vertical axis represents the sum of frequency components. In graph G4, peaks appear in the sum of frequency components with a 180-degree period when the angle θ is 28.5° and when the angle θ is 208.5°. The generation unit 21b identifies these peaks in the sum of frequency components with a 180-degree period as the first spatial frequency region. Also, in graph G4, peaks appear in the sum of frequency components with a 90-degree period when the angle θ is 85°, 175°, 265°, and 355°, which are offset from the uv direction of image P162. This is because the device pattern is formed in the vertical and horizontal directions, which is a characteristic of semiconductor device D. The generation unit 21b identifies these peaks in the sum of frequency components with a 90-degree period as the second spatial frequency region.

[0060] 19 is a diagram showing an image for explaining how to distinguish between the first spatial frequency region and the second spatial frequency region. In image P163, a straight line P1633 indicating the first spatial frequency region appears at a period of 180° on image P163. Straight lines P1631 and P1632 indicating the second spatial frequency region are perpendicular to each other and appear at a period of 90° on image P163.

[0061] Fig. 20 is a graph showing an example of the sum of frequency components for each angle using a moving average. Graph G5 is a graph obtained by calculating a moving average using a convolution operation on graph G4 shown in Fig. 18. In the sum of frequency components for each angle, angles θ = 0° to 180° and angles θ = 180° to 360° are composed of equivalent angle components. Therefore, in graph G5, peaks other than those for angles θ = 0°, 90°, and 180° are clear. In this way, the generation unit 21b may calculate a moving average using a convolution operation based on the sum of frequency components for each angle.

[0062] Next, examples of filtering performed by the autofocus support device 1 under various imaging conditions will be shown. Figures 21 to 26 are diagrams showing examples of second images and second images after filtering.

[0063] FIG. 21 shows a second image captured by an InGaAs camera using a 5x objective lens and a filtered second image. Image P17 is a second image captured with the focal position focused on a position between the back surface D1 and the front surface D2 of the substrate. Image P171 is a filtered second image generated based on image P17. Image P172 is a second image captured with the focal position focused on the device pattern. Image P173 is a filtered second image generated based on image P172. Image P174 is a second image captured with the focal position focused on a position far from the device pattern. Image P175 is a filtered second image generated based on image P174. In each of images P17, P172, and P174, the device pattern appears along with polishing scratches. The images P171, P173, and P175 have reduced patterns of polishing scratches compared to the images P17, P172, and P174 before filtering, respectively.

[0064] FIG. 22 shows a second image captured by an InGaAs camera using a 20x objective lens and a filtered second image. Image P18 is a second image captured with the focal position focused on a position between the back surface D1 and the front surface D2 of the substrate. Image P181 is a filtered second image generated based on image P18. Image P182 is a second image captured with the focal position focused on the device pattern. Image P183 is a filtered second image generated based on image P182. Image P184 is a second image captured with the focal position focused on a position far from the device pattern. Image P185 is a filtered second image generated based on image P184. In each of images P18, P182, and P184, the device pattern appears along with polishing scratches. The images P181, P183, and P185 have reduced patterns of polishing scratches compared to the images P18, P182, and P184 before filtering, respectively.

[0065] FIG. 23 shows a second image captured by an InGaAs camera using a 100x objective lens and a filtered second image. Image P19 is a second image captured with the focal position focused on a position between the back surface D1 and the front surface D2 of the substrate. Image P191 is a filtered second image generated based on image P19. Image P192 is a second image captured with the focal position focused on the device pattern. Image P193 is a filtered second image generated based on image P192. Image P194 is a second image captured with the focal position focused on a position far from the device pattern. Image P195 is a filtered second image generated based on image P194. Images P19, P192, and P194 each show slight polishing scratches, as well as device patterns and black dots (dust, etc.). Compared with pre-filtering image P19, image P192 and image P194, respectively, images P191, P193 and P195 have reduced noise caused by the grinding scratch pattern and the black dot in the center of each image.

[0066] 24 shows a second image captured by a laser microscope using a 5x objective lens and a filtered second image. Image P20 is a second image captured with the focal position focused on a position between the back surface D1 and the front surface D2 of the substrate. Image P201 is a filtered second image generated based on image P20. Image P202 is a second image captured with the focal position focused on the device pattern. Image P203 is a filtered second image generated based on image P202. Image P204 is a second image captured with the focal position focused on a position far from the device pattern. Image P205 is a filtered second image generated based on image P204. In each of images P20, P202, and P204, the device pattern appears along with polishing scratches. The images P201, P203, and P205 have reduced patterns of polishing scratches compared to the images P20, P202, and P204 before filtering, respectively.

[0067] 25 shows a second image captured by a laser microscope using a 20x objective lens and a filtered second image. Image P21 is a second image captured with the focal position focused on a position between the back surface D1 and the front surface D2 of the substrate. Image P211 is a filtered second image generated based on image P21. Image P212 is a second image captured with the focal position focused on the device pattern. Image P213 is a filtered second image generated based on image P212. Image P214 is a second image captured with the focal position focused on a position far from the device pattern. Image P215 is a filtered second image generated based on image P214. In each of images P21, P212, and P214, the device pattern appears along with polishing scratches. The images P211, P213, and P215 have reduced patterns of polishing scratches compared to the images P21, P212, and P214 before filtering, respectively.

[0068] FIG. 26 shows a second image captured by a laser microscope using a 100x objective lens and a filtered second image. Image P22 is a second image captured with the focal position focused on a position between the back surface D1 and the front surface D2 of the substrate. Image P221 is a filtered second image generated based on image P22. Image P222 is a second image captured with the focal position focused on the device pattern. Image P223 is a filtered second image generated based on image P222. Image P224 is a second image captured with the focal position focused on a position far from the device pattern. Image P225 is a filtered second image generated based on image P224. The device pattern appears along with slight polishing scratches in each of images P22, P222, and P224. The images P221, P223, and P225 have reduced patterns of polishing scratches compared to the images P22, P222, and P224 before filtering, respectively.

[0069] The autofocus support method according to this embodiment will be described with reference to Fig. 27. Fig. 27 is a flowchart showing an example of the operation procedure of the autofocus support device 1.

[0070] The image acquisition unit 21a of the autofocus support device 1 acquires a first image in focus on the substrate (step S1; image acquisition step).

[0071] The generation unit 21b of the autofocus support device 1 acquires a spatial frequency image from the first image by Fourier transform, and generates mask data for masking the linear pattern on the substrate based on the spatial frequency image (step S2; generation step).

[0072] The processing unit 21c of the autofocus support device 1 acquires multiple second images captured using the imaging device 10 on the back surface D1 side of the substrate while changing the focal position of the imaging device 10, and performs filtering on the second images using mask data (step S3; processing step).

[0073] The focus adjustment unit 21d of the autofocus support device 1 focuses the imaging device 10 on the device pattern based on the filtered second image (step S4; focus adjustment step).

[0074] In relation to step S1, the image acquisition unit 21a may acquire a first image captured by the imaging device 10, or may acquire the first image from another system, device, or the like.

[0075] The configuration of the imaging device 10 may be modified depending on conditions such as the thickness of the substrate and the objective lens. For example, when focusing a semiconductor device D having a thick substrate using an objective lens with a high NA and a shallow DOF, the imaging device 10 may be configured with an InGaAs camera using infrared light illumination with a wavelength of 1.0 μm or longer, or a laser microscope using laser light with a wavelength of 1.3 μm. The infrared light or laser light passes through the substrate of the semiconductor device D. Because the objective lens has a high NA and a shallow DOF, the first image acquired by the InGaAs camera or laser microscope hardly shows the device pattern, but the polishing scratch pattern formed on the back surface D1 may be clearly visible. In this case, linear patterns on the substrate are more likely to appear in the spatial frequency image. As a result, mask data is generated more appropriately, thereby further reducing linear patterns in the second image.

[0076] When focusing a semiconductor device D having a thin substrate using an objective lens with a low NA and a deep DOF, the imaging device 10 may be configured, for example, by combining a CCD camera using visible light illumination with a laser microscope using laser light with a wavelength of 1.3 μm. A first image may be acquired by the CCD camera, and a second image may be acquired by the laser microscope. Because visible light does not penetrate the substrate of the semiconductor device D, the device pattern does not appear in the first image acquired by the CCD camera, but the pattern of polishing scratches formed on the back surface D1 may be clearly visible. In this case, linear patterns on the substrate are more likely to appear in the spatial frequency image. As a result, mask data is generated more appropriately, thereby further reducing linear patterns in the second image.

[0077] Alternatively, when focusing a semiconductor device D having a thin substrate using an objective lens with a low NA and a deep DOF, the imaging device 10 may be configured with an InGaAs camera using infrared light illumination with a wavelength of 1.0 μm or more, or a laser microscope using laser light with a wavelength of 1.3 μm. The process of step S1 may be performed by switching the objective lens to one with a high NA and a shallow DOF and then acquiring the first image. The infrared light or laser light passes through the substrate of the semiconductor device D. Because the objective lens has a high NA and a shallow DOF, the first image acquired by the InGaAs camera or laser microscope may barely show the device pattern, but may clearly show the pattern of polishing scratches formed on the back surface D1. In this case, the linear pattern on the substrate is more likely to appear in the spatial frequency image, thereby more appropriately generating mask data. The process of step S4 may be performed by switching the objective lens to one with a low NA and a deep DOF. Even when focus adjustment is performed using an objective lens with a low NA and a deep DOF, the mask data is generated appropriately, so that linear patterns in the second image can be further reduced.

[0078] According to the above-described autofocus support method, autofocus support device 1, and autofocus support program, a spatial frequency image is acquired from a first image focused on the substrate, and mask data for masking linear patterns in the same direction on the substrate is generated based on the spatial frequency image. Then, by processing a second image, which is an image captured on the back surface D1 (other main surface) of the substrate while changing the focal position, after filtering with the mask data, the device pattern formed on the front surface D2 (one main surface) of the substrate is brought into focus. In this case, linear patterns in the same direction in the second image are reduced. By adjusting the focus based on such a second image, the accuracy of autofocus for the device pattern in the semiconductor device D can be improved.

[0079] In the autofocus assisting method, the generating step may generate mask data based on a first spatial frequency domain corresponding to a pattern of polishing scratches formed on the back surface D1 of the substrate. In this case, the pattern of polishing scratches in the second image is reduced. By adjusting the focus based on such a second image, the accuracy of autofocus for the device pattern in the semiconductor device D can be further improved.

[0080] In the autofocus assistance method, the generating step may identify a first spatial frequency region and a second spatial frequency region including the device pattern based on the spatial frequency image. In this case, the polishing scratch pattern is more precisely reduced in the second image. By adjusting the focus based on such a second image, the accuracy of autofocus for the device pattern in the semiconductor device D can be further improved.

[0081] In the autofocus assistance method, the generating step may calculate a sum of frequency components for each of a plurality of angle regions relative to the central axis of the spatial frequency image, and identify a first spatial frequency region from among the plurality of angle regions based on the sum of frequency components for each of the plurality of angle regions. In this case, the accuracy of identifying the angle of the mask data is improved, and therefore the pattern of polishing scratches in the second image can be further reduced.

[0082] In the autofocus assist method, the image acquiring step may acquire a first image focused on the back surface D1 of the substrate. In this case, linear patterns on the substrate are more likely to appear in the spatial frequency image. As a result, mask data is more appropriately generated, and linear patterns in the second image can be further reduced.

[0083] An autofocus function according to a comparative example will be described with reference to Figures 28 to 31. The comparative example is an example in which autofocus is performed from the back surface side of the substrate of a semiconductor device using a device having a conventional autofocus function (hereinafter referred to as the "conventional device").

[0084] FIG. 28 is a diagram illustrating images for explaining the autofocus function according to the comparative example. Images E1 to E5 show images captured by the conventional device while changing the focal position of the conventional device. Specifically, image E1 is an image captured with the focal position focused on a position in front of the back surface of the substrate. Image E2 is an image captured with the focal position focused on the back surface of the substrate. Image E3 is an image captured with the focal position focused on a position between the back surface and front surface of the substrate. Image E4 is an image captured with the focal position focused on a device pattern formed on the front surface of the substrate. Image E5 is an image captured with the focal position focused on a position far from the device pattern.

[0085] Fig. 29 is a graph for explaining the autofocus function according to the comparative example. In graph EG1, the horizontal axis represents the height of the objective lens, and the vertical axis represents the autofocus index value (contrast value). In graph EG1, plotted marker C1 represents the autofocus index value calculated based on image E1 shown in Fig. 28. Similarly, markers C2, C3, C4, and C5 represent the autofocus index values ​​calculated based on images E2, E3, E4, and E5 shown in Fig. 28, respectively. In graph EG1, local maximum values ​​of the autofocus index value appear at markers C2 and C4.

[0086] FIG. 30 is a graph illustrating the influence between two maximum values ​​of the autofocus index value according to the comparative example. Graphs EG2 to EG7 show the results of a simulation of the influence of the peak of the autofocus index value (hereinafter referred to as the "back surface peak") due to the pattern of polishing scratches formed on the back surface of the substrate for each substrate thickness on the peak of the autofocus index value on the device surface (hereinafter referred to as the "device surface peak"). In graphs EG2 to EG7, the horizontal axis represents the Z stage coordinate, and the vertical axis represents the autofocus index value. Graphs EG2 to EG7 also show the simulation results for substrate thicknesses of 50 μm, 40 μm, 30 μm, 20 μm, 15 μm, and 10 μm, respectively. The simulation conditions were: NA = 0.4, DOF = 4.1 μm, 20x objective lens, back surface peak / device surface peak = 1.0 (peak heights are the same), signal shape = Gaussian distribution, and substrate refractive index = 3.5. The device surface peak was fixed at the Z stage coordinate = 0.

[0087] For example, as shown in graph EG2, when the substrate is thick, the back surface peak and the device surface peak are separated, so the influence of the back surface pattern on the device surface peak can be ignored. As shown in the changes from graph EG3 to graph EG7, as the substrate becomes thinner, the back surface peak and the device surface peak become mixed. As a result, as the substrate becomes thinner, the influence of the back surface peak on the device surface peak increases, and the device surface peak shifts toward the back surface peak.

[0088] FIG. 31 is a graph showing the calculation results of the shift amount according to the comparative example. Graph EG8 is a graph showing the calculation results of the shift amount based on the simulation results shown in FIG. 30. The shift amount reaches a maximum of 0.65 μm when the substrate is 14 μm thick. Based on the maximum shift amount of 0.65 and a 20x objective lens (NA = 0.4, DOF = 4.1 μm), the deviation ratio relative to the DOF is calculated as "0.65 / 4.1" to be approximately 16%. Performing autofocus using a lens with a higher NA based on a 16% deviation position can hinder the setting of an appropriate focus search initial value. Therefore, with the autofocus function according to the comparative example, the back surface peak affects the device surface peak, which can reduce the autofocus accuracy. In contrast, in this embodiment, the influence of the back surface peak on the device surface peak is suppressed by reducing the linear pattern in the same direction in the second image.

[0089] The above describes various embodiments of the present disclosure, but the present disclosure is not limited to the above embodiments, and may be modified or applied to other things within the scope that does not change the gist of the claims.

[0090] In the above embodiment, an example in which the mask data has a linear shape has been described, but this is not limiting. FIG. 32 illustrates variations of mask data. Parts (a), (b), (c), and (d) of FIG. 32 show mask data M1, M2, M3, and M4, respectively. In mask data M1 to M4, the area close to the center corresponds to the low-frequency components of the image, and the area close to the periphery corresponds to the high-frequency components of the image. As in the above embodiment, mask data M1 extends linearly through the center, and has a shape in which the masking width between the center and the periphery is constant. Mask data M2 has a shape in which the masking width gradually narrows from the periphery to the center. Mask data M3 is mask data M2 plus a ring-shaped mask in the center. The ring-shaped mask surrounds the center. Mask data M4 is mask data M3 plus a ring-shaped mask in the periphery.

[0091] 33 is a diagram showing an example of generating a spatial frequency image. Image P23 is a first image captured with a laser microscope using a 5x objective lens and laser light with a wavelength of 1.3 μm, with the back surface D1 of the substrate in focus. Image P231 is a spatial frequency image generated by performing a Fourier transform on image P23.

[0092] FIG. 34 is a diagram illustrating an example of a filtering process. Image P232 is an image in which mask data M1 is superimposed on image P231 shown in FIG. 33. Image P233 is a filtered image generated by performing an inverse Fourier transform on image P232. In image P233, the pattern of polishing scratches formed on the back surface D1 is reduced and macroscopic changes in brightness are eliminated. Furthermore, since the zeroth-order term is also masked by mask data M1, the brightness offset in image P233 is reduced overall. In other words, image P233 is darker overall than image P23 (see FIG. 33) before filtering.

[0093] FIG. 35 is a diagram illustrating an example of a filtering process. Image P234 is an image in which mask data M2 is superimposed on image P231 shown in FIG. 33. Image P235 is a filtered image generated by performing an inverse Fourier transform on image P234. Compared to image P23 before filtering (see FIG. 33), image P235 has a reduced pattern of polishing scratches formed on back surface D1. Because the filtering process using mask data M2 does not mask low-frequency components, low-frequency components remain in image P235. As a result, the overall brightness is maintained before and after filtering.

[0094] FIG. 36 is a diagram illustrating an example of a filtering process. Image P236 is an image in which mask data M3 is superimposed on image P231 shown in FIG. 33. Image P237 is a filtered image generated by performing an inverse Fourier transform on image P236. Compared to image P23 before filtering (see FIG. 33), image P237 has reduced polishing scratch patterns formed on back surface D1. In addition to the effect of mask data M2, the filtering process using mask data M3 can eliminate macroscopic non-uniform features such as shading or waviness when the image contains such features.

[0095] FIG. 37 is a diagram showing images for explaining an example of filtering processing. Image P238 is an image in which mask data M4 is superimposed on image P231 shown in FIG. 33. Image P239 is a filtered image generated by performing an inverse Fourier transform on image P238. Compared to image P23 before filtering (see FIG. 33), image P239 has reduced polishing scratch patterns formed on back surface D1. In addition to the effect of mask data M3, filtering processing using mask data M4 can eliminate noise with higher frequency components than the device pattern.

[0096] In the above embodiment, the generating step may generate mask data based on a first spatial frequency domain corresponding to a pattern of polishing scratches formed on the other main surface of the substrate. In this case, the pattern of polishing scratches in the second image is reduced. By adjusting the focus based on such a second image, the accuracy of autofocus for the device pattern in the semiconductor device can be further improved.

[0097] In the above embodiment, the generating step may identify a first spatial frequency region and a second spatial frequency region including the device pattern based on the spatial frequency image. In this case, the polishing scratch pattern in the second image is more precisely reduced. By adjusting the focus based on such a second image, the accuracy of autofocusing on the device pattern in the semiconductor device can be further improved.

[0098] In the above embodiment, the generating step may calculate the sum of frequency components for each of a plurality of angle regions relative to the central axis of the spatial frequency image, and identify the first spatial frequency region from among the plurality of angle regions based on the sum of frequency components for each of the plurality of angle regions. In this case, the accuracy of identifying the angle of the mask data is improved, and therefore the pattern of polishing scratches in the second image can be further reduced.

[0099] In the above embodiment, the image acquisition step may acquire a first image focused on the other principal surface of the substrate. In this case, linear patterns on the substrate are more likely to appear in the spatial frequency image. As a result, mask data is more appropriately generated, and linear patterns in the second image can be further reduced. [Explanation of symbols]

[0100] 1...autofocus support device, 10...imaging device, 11...light source, 12...optical system, 13...XYZ stage, 14...photodetector, 21...computer, 21a...image acquisition unit, 21b...generation unit, 21c...processing unit, 21d...focus adjustment unit, 22...display unit, 23...input unit, 30...sample stage, D...semiconductor device, D1...back surface, D2...front surface.

Claims

1. 1. A method for assisting autofocus for a semiconductor device having a substrate and a device pattern formed on one main surface of the substrate, the method comprising: an image acquisition step of acquiring a first image focused on the substrate; a generation step of acquiring a spatial frequency image from the first image by Fourier transform, and generating mask data for masking linear patterns in the same direction on the substrate based on the spatial frequency image; a processing step of acquiring a plurality of second images captured by the imaging device while changing a focal position of the imaging device on the other main surface side of the substrate, and filtering the second images using the mask data; a focus adjustment step of focusing the imaging device on the device pattern based on the filtered second image; An autofocus assistance method comprising:

2. 2. The autofocus assist method according to claim 1, wherein the generating step generates the mask data based on a first spatial frequency domain corresponding to a pattern of polishing scratches formed on the other main surface of the substrate.

3. The autofocus assistance method according to claim 2 , wherein the generating step identifies the first spatial frequency region and a second spatial frequency region including the device pattern based on the spatial frequency image.

4. 4. The autofocus assistance method according to claim 2, wherein the generating step calculates a sum of frequency components for each of a plurality of angle regions relative to a central axis of the spatial frequency image, and identifies the first spatial frequency region from among the plurality of angle regions based on the sum of the frequency components for each of the plurality of angle regions.

5. The autofocus assistance method according to claim 1 , wherein the image acquisition step acquires the first image focused on the other main surface of the substrate.

6. a stage on which a semiconductor device having a substrate and a device pattern formed on one main surface of the substrate is placed; an imaging device having a light source for irradiating the semiconductor device with light and a photodetector for detecting light from the semiconductor device; a control unit that controls a relative position between the stage and the imaging device, The control unit an image acquisition unit that acquires a first image focused on the substrate; a generation unit that acquires a spatial frequency image from the first image by Fourier transform, and generates mask data that masks linear patterns in the same direction on the substrate based on the spatial frequency image; a processing unit that acquires a plurality of second images captured by the imaging device while changing a focal position of the imaging device on the other main surface side of the substrate, and performs filtering on the second images using the mask data; a focus adjustment unit that focuses the imaging device on the device pattern based on the filtered second image; An autofocus assist device having:

7. 1. An autofocus support program for supporting autofocusing on a semiconductor device having a substrate and a device pattern formed on one main surface of the substrate, Computer, an image acquisition unit that acquires a first image focused on the substrate; a generation unit that acquires a spatial frequency image from the first image by Fourier transform, and generates mask data that masks linear patterns in the same direction on the substrate based on the spatial frequency image; a processing unit that acquires a plurality of second images captured by the imaging device while changing a focal position of the imaging device on the other main surface side of the substrate, and performs filtering on the second images using the mask data; and a focus adjustment unit that focuses the imaging device on the device pattern based on the filtered second image; An autofocus assistance program that functions as an

Images