Phase modulator calibration method, balanced photodetector calibration method, and phase modulator calibration system

Abstract

To provide a highly accurate calibration method for a quantum key delivery of a phase modulator and balance type optical detector.SOLUTION: A calibration method 1 of a phase modulator according to the present invention includes: preparing a first delay interferometer 10 serving as a calibration reference of a phase, and a second delay interferometer 20 having the phase modulator 30 of a calibration object installed in an optical path; measuring a delay time at time intervals between pulses divided from a single pulse to be input as to each of the first and second delay interferometers 10 and 20; synchronizing the delay time with a cycle of a transmission clock; adjusting, for the first delay interferometer, a phase difference so that continuous wave laser light to be input becomes constructive interference upon outputting; assembling a cascade-connected calibration circuit 100 with the first delay interferometer 10 as a front stage and the second delay interferometer 20 as a latter stage to determine a control signal.SELECTED DRAWING: Figure 6

Description

[Technical Field]

[0001] The present invention relates to a method for calibrating a phase modulator in quantum key distribution, a method for calibrating a balanced photodetector, and a system for calibrating a phase modulator. [Background technology]

[0002] Quantum key distribution is a technology that enables the sharing of information-theoretically secure cryptographic keys (random number sequences) over long distances. Its security is theoretically guaranteed by the laws of physics. However, this is premised on the fact that the operation of actual communication devices does not deviate significantly from the theoretical operation. In quantum key distribution, research is underway to increase speed and bandwidth by using a method that uses the phase state of light. In this method, the phase state of light is associated with the bit value of information, and the optical signal is phase-modulated and transmitted. Phase modulation is a technology used in high-speed optical communications, but the phase accuracy required for quantum key distribution and optical communications differs significantly. For example, Non-Patent Document 1 points out the importance of phase accuracy in the components that make up quantum key distribution devices. [Prior art documents] [Non-patent literature]

[0003] [Non-Patent Document 1] “Quantum key distribution with flared and leaky source,” M. Pereira, M. Curtty, and K.Tamaki, npj Quantum Information volume 5, Article number: 62 (2019) Summary of the Invention [Problem to be solved by the invention]

[0004] Optical communications can be digitally processed, so communication is possible even if there is an error of around 10-20 degrees in the phase of the optical signal. On the other hand, quantum key distribution requires that the phase of a light wave, with less than one photon per pulse, be determined with an accuracy of a few degrees. Simply controlling the phase to match the state measured by a photodetector does not guarantee the absolute phase accuracy required for quantum key distribution. Therefore, quantum key distribution requires technology that can guarantee that the measured phase has absolute phase accuracy. The present invention has been made to solve the above problems, and an object of the present invention is to provide a highly accurate method for calibrating a phase modulator, a method for calibrating a balanced photodetector, and a system for calibrating a phase modulator, which ensure quantum state control with the precision required for quantum key distribution. [Means for solving the problem]

[0005] In order to solve the above problem, a method for calibrating a phase modulator according to the present invention is a method for calibrating a phase modulator in which the amount of phase modulation is controlled by a control signal, and includes the steps of: preparing a first delay interferometer as a phase calibration reference and a second delay interferometer in which a phase modulator to be calibrated is installed in an optical path; measuring a delay time for each of the first and second delay interferometers based on a time interval between pulses divided from an input pulse; synchronizing the delay time with a period of a transmission clock; adjusting a phase difference for the first delay interferometer so that input continuous wave laser light exhibits constructive interference at the output; and assembling a calibration circuit in which the first delay interferometer is cascaded as a front stage and the second delay interferometer as a rear stage to determine the control signal.

[0006] Furthermore, a calibration system for a phase modulator according to the present invention is a calibration system for a phase modulator in which the amount of phase modulation is controlled by a control signal, and comprises a calibration circuit, a light source that inputs light to the calibration circuit, a photodetector connected to the output of the calibration circuit, and a control signal generator that generates the control signal, and the calibration circuit is cascaded in such a way that a first delay interferometer, whose delay time is synchronized with the period of a transmission clock and whose phase difference is adjusted to result in constructive interference, is connected in a preceding stage to a second delay interferometer, whose delay time is synchronized with the period of the transmission clock and whose optical path includes the phase modulator to be calibrated. [Effects of the Invention]

[0007] According to the present invention, it is possible to calibrate a phase modulator and a balanced photodetector with high precision, thereby ensuring the quantum state control with the precision required for quantum key distribution, and it is possible to provide a calibration system for a phase modulator that can perform high-precision calibration. [Brief explanation of the drawings]

[0008] [Figure 1] FIG. 1 is a schematic diagram illustrating an example of a quantum key distribution device. [Figure 2A] 10 is a flowchart illustrating an example of a method for calibrating a phase modulator according to an embodiment. [Figure 2B] 1 is a flowchart illustrating an example of a method for calibrating a balanced photodetector according to an embodiment. [Figure 3A] FIG. 2 is a schematic diagram of a first delay interferometer. [Figure 3B] FIG. 10 is a schematic diagram of a second delay interferometer in which a phase modulator to be calibrated is installed. [Figure 4] FIG. 1 is a schematic diagram illustrating an example of a circuit for measuring the delay time of a delay interferometer. [Figure 5] FIG. 10 is a schematic diagram illustrating an example of a circuit for measuring a phase difference of a delay interferometer. [Figure 6] FIG. 2 is a schematic diagram illustrating an example of a calibration circuit according to an embodiment. [Figure 7] FIG. 1 is a schematic diagram illustrating an example of a calibration circuit for a balanced photodetector. [Figure 8] FIG. 2 is a schematic diagram illustrating an example of a calibration system for a phase modulator according to an embodiment. DETAILED DESCRIPTION OF THE INVENTION

[0009] [Phase modulator calibration method] A method for calibrating a phase modulator according to the present invention will be described with reference to the drawings. The phase modulator to be calibrated in the present invention is used in a quantum key distribution device, as shown in an example in Figure 1. The phase modulator is installed in delay interferometers on both the transmitting and receiving sides. The phase modulator may be any one whose phase modulation amount is controlled by a control signal. For example, it may be an LN phase modulator that performs phase modulation using an electrical signal, utilizing the phenomenon in which the refractive index of LiNbO3 crystal changes with an electric field. As shown in FIG. 2A, the method 1 for calibrating a phase modulator according to the present invention includes preparing a delay interferometer S1, synchronizing a delay time S2, adjusting a phase difference S3, and determining a control signal S4.

[0010] (Preparation of delay interferometer) Preparation of delay interferometer S1 is a procedure for preparing a first delay interferometer 10 and a second delay interferometer 20. A delay interferometer is a device that splits input light into two at a 1:1 ratio, and then superimposes the light that has traveled a long optical path and the light that has traveled a short optical path again to cause interference. The delay interferometer is, for example, a Mach-Zehnder interferometer, and has a means for adjusting the optical path length. It is preferable that the delay interferometer has a small fluctuation in the phase difference between the light that has passed through the long optical path and the light that has passed through the short optical path, even when the phase of the input light is changed in a short period. For this reason, an example of an implementation method is to use an asymmetric interferometer using a planar lightwave circuit (hereinafter abbreviated as PLC) with quartz as the optical path, and to use a temperature adjustment means for adjusting the optical path length.

[0011] 3A, the first delay interferometer 10 has a short optical path 13A and a long optical path 13B, and has coarse adjustment means 14A and fine adjustment means 14B as means for adjusting the optical path length. The coarse adjustment means 14A is a mechanical adjustment using, for example, a screw. The fine adjustment means 14B is an adjustment using, for example, a piezoelectric element or the like, or an adjustment utilizing expansion and contraction due to temperature changes of the material forming the optical path.

[0012] The first delay interferometer 10 has input terminals 11A and 11B and output terminals 12A and 12B. In phase modulator calibration method 1, one of the input terminals, for example, 11A, is used. One of the output terminals, for example, 12A, is also used, but both may be used. Regarding the outputs from the two output terminals 12A and 12B, for example, if the phase difference between the light that has passed through the short optical path 13A and the light that has passed through the long optical path 13B is 0 degrees, the output is from output terminal 12A, and if the phase difference is 180 degrees, the output is from output terminal 12B. The first delay interferometer 10 serves as a phase calibration reference in the phase modulator calibration method 1. For this reason, it is preferable that the optical path length can be finely adjusted and that the optical path length after adjustment is stable.

[0013] 3B, the second delay interferometer 20 has a phase modulator 30 to be calibrated installed in a short optical path 23A. The phase modulator 30 has a control signal input terminal 31, and the amount of phase modulation can be controlled from outside the second delay interferometer 20. The second delay interferometer 20 has at least a coarse adjustment means 24A, and may also have a fine adjustment means. The coarse adjustment means, fine adjustment means and control input terminals may be omitted from the drawing.

[0014] (Delay time synchronization) The delay time synchronization S2 is a procedure for synchronizing the delay times of the first and second delay interferometers 10 and 20 with the period of the transmission clock. In the quantum key distribution according to the present invention, a phase state is set for each period of the transmission clock. By synchronizing the delay time of the delay interferometer with the period of the transmission clock, it is possible to measure the optical interference between adjacent time slots.

[0015] The delay time synchronization S2 is achieved by measuring the delay time of the delay interferometer and adjusting the optical path length. The delay time is measured by inputting pulsed laser light into the delay interferometer and measuring the time interval between pulses divided from the single input pulse. To measure the delay time of the first delay interferometer 10, for example, as shown in Figure 4, a pulsed laser PL is connected to one input terminal of the first delay interferometer 10, a photodetector PD is connected to one output terminal, and the waveform is measured with an oscilloscope OSC. If an input pulse P01 is divided into two pulses P02 and P03 and then output, the time interval Δt between the pulses P02 and P03 is measured, and the difference in optical path length between the short and long optical paths of the first delay interferometer 10 is adjusted so that the time interval Δt matches the period of the transmission clock.

[0016] In the delay time synchronization S2, the optical path length can be adjusted by a coarse adjustment means. For example, if the transmission clock frequency is 1 GHz and a delay interferometer with a preset delay time of 1 ns is available, the adjustment range is expected to be about 0.1 mm to 10 mm. The same procedure is carried out for the second delay interferometer 20, and the subsequent procedure is carried out using the first and second interferometers 10 and 20 that have undergone the delay time synchronization S2.

[0017] (Adjusting the phase difference) The phase difference adjustment S3 is a procedure for adjusting the phase difference of the first delay interferometer 10, which serves as the phase calibration standard, so that the input light exhibits constructive interference at the output. The wavelength of the input light in the phase difference adjustment S3 is the wavelength of the signal light used in an optical communication path such as an optical fiber connecting the transmitting side and the receiving side, and is, for example, 1.55 μm.

[0018] The phase difference in the phase difference adjustment S3 is the phase difference between the output light that has passed through the short optical path and the output light that has passed through the long optical path, and varies depending on the optical path length difference between the short and long optical paths. Furthermore, when the input light undergoes constructive interference at the output, the intensity of the output light is maximized. Therefore, the phase difference adjustment S3 is performed by adjusting the optical path length so that the intensity of the light at the output of the delay interferometer is maximized. For example, as shown in FIG. 5, the phase difference adjustment S3 is performed by connecting a continuous wave laser CW to one input terminal of the first delay interferometer 10, connecting a power meter M1 to one output terminal, and adjusting the optical path length to the maximum value.

[0019] Furthermore, when the maximum value of the output of the power meter M1 is Vmax and the minimum value is Vmin, the interference clarity given by (Vmax-Vmin) / (Vmax+Vmin) is an index of whether sufficient interference is occurring. If the interference clarity is used, for example, if a certain level of interference clarity cannot be ensured, it is possible to take measures such as inspecting the calibration system. The extinction ratio can be measured near the maximum value Vmax. By adjusting the extinction ratio to maximize it, the optical path length can be adjusted more accurately. The extinction ratio is given by 10·log(Vmax / Vmin).

[0020] In the phase difference adjustment S3, the optical path length is adjusted using a fine adjustment means. For example, if the wavelength of the signal light is 1.55 μm and the refractive index of the optical path of the delay interferometer is 1.5, the optical path length corresponding to a phase difference of 360 degrees is approximately 1 μm. Therefore, to control the phase with an accuracy of 4 degrees or less, an adjustment of about 10 nm is required, which can be adjusted using, for example, a piezoelectric element or temperature. Temperature adjustment is particularly preferable because it allows for fine adjustment. The subsequent procedures are carried out using the first delay interferometer 10 that has undergone the phase difference adjustment S3 as the reference for phase calibration.

[0021] (Control signal confirmation) The control signal determination step S4 is a procedure for determining the value of the control signal corresponding to the phase modulation amount for the phase modulator to be calibrated. The exact correspondence between the phase modulation amount and the control signal differs depending on the individual phase modulator. By determining the value of the control signal corresponding to the phase modulation amount for each phase modulator, the phase modulator can be calibrated. The phase modulation amount can be observed by interfering with light. 6, determination of the control signal S4 is performed using a calibration circuit 100 in which a first delay interferometer 10 that has undergone phase difference adjustment S3 is cascaded in the preceding stage and a second delay interferometer 20 that has undergone delay time synchronization S2 is cascaded in the succeeding stage. A phase modulator 30 is installed in the short optical path of the second delay interferometer 20. If the second delay interferometer 20 is a PLC or the like and polarization dependency is an issue, the calibration circuit 100 preferably has a polarization filter 50 located before the input terminal of the second delay interferometer 20.

[0022] In control signal determination S4, a pulsed laser PL is connected to the input terminal of the front stage 10 of the calibration circuit 100, a photodetector PD is connected to the output terminal of the back stage 20, and the waveform is measured with an oscilloscope OSC. A control signal generator 40 is connected to the phase modulator 30. The control signal generator 40 is a device that generates a voltage signal or the like for controlling the phase modulator 30. As shown in an example in Figure 6, an input pulse P11 is divided into two pulses P12 and P13 by the front stage 10, and each of the two pulses P12 and P13 is divided into two pulses by the rear stage 20. Because the delay time of both the front stage 10 and the rear stage 20 is Δt, three pulses P14, P15, and P16 with a time interval of Δt are output from the rear stage 20. The center pulse P15 is located in the middle between the leading pulse P14 and the trailing pulse P16. The intensity of the center pulse P15 corresponds to the amount of phase modulation by the phase modulator 30.

[0023] Quantum key distribution requires control signal values ​​that result in phase modulation amounts of 0 degrees and 180 degrees. For this reason, the center pulse P15 is measured while adjusting the control signal using the control signal generator 40. The intensity of the center pulse P15 is maximized due to constructive interference when the phase modulation amount is 0 degrees, and minimized due to destructive interference when the phase modulation amount is 180 degrees. For this reason, the control signal that maximizes the intensity of the center pulse P15 can be defined as the 0-degree control signal, and the control signal that minimizes it can be defined as the 180-degree control signal. After the control signal determination step S4, the values ​​of the control signal corresponding to the phase modulation amounts of 0 degrees and 180 degrees are determined, and the calibration of the phase modulator is completed.

[0024] [Balanced Photodetector Calibration Method] Next, a method for calibrating a balanced photodetector according to the present invention will be described. The balanced photodetector to be calibrated in the present invention has a pair of input terminals. As shown in FIG. 1, for example, the balanced photodetector 60 is connected to a delay interferometer on the receiving side of a quantum key distribution device, and converts the difference in light intensity between the two input terminals into an electrical signal and outputs it. The output electrical signal is input to, for example, an AD converter of a signal processing device. 2B, the calibration method 2 of the balanced photodetector according to the present invention includes S1 preparation of the delay interferometer, S2 synchronization of the delay time, S3 adjustment of the phase difference, S4 determination of the control signal, and S5 adjustment of the photodetector. The procedures from S1 preparation of the delay interferometer to S4 determination of the control signal are the same as those in the already explained calibration method 1 of the phase modulator, and therefore the explanation will be omitted.

[0025] (Photodetector adjustment) Photodetector adjustment S5 is a procedure for adjusting the balanced photodetector so that it operates without bias. A balanced photodetector can output the difference in intensity between a pair of input light beams as an electrical signal. Therefore, for example, adjustment is performed so that the intensity of the electrical signal generated in response to light beams of the same intensity is not biased between the input terminals. Photodetector adjustment S5 is performed based on the optical signal phase-modulated by the calibrated phase modulator 30. 7, the balanced photodetector 60 includes a pair of photodiodes 62A and 62B, optical attenuators 61A and 61B, and an amplifier 65. A pair of input light beams is irradiated onto the pair of photodiodes 62A and 62B via the optical attenuators 61A and 61B. The photocurrent of the pair of photodiodes 62A and 62B is input to an amplifier 65 that converts the current into a voltage, and a voltage corresponding to the difference between the photocurrents is output from an output terminal 66.

[0026] The photodetector adjustment S5 is performed by connecting a continuous wave laser CW to the input terminal of the front stage 10 of the calibration circuit 100 and connecting a balanced photodetector 60 to the output terminal of the rear stage 20. The wavelength of the input continuous wave laser light is the same as the wavelength of the continuous wave laser light in the phase difference adjustment S3. The output of the balanced photodetector 60 can be measured as a voltage waveform using, for example, an oscilloscope. A control signal generator 40 is connected to the phase modulator 30. The control signal generator 40 is set to alternately repeat the 0-degree control signal and the 180-degree control signal determined in the phase modulator calibration method 1. The repeating frequency is, for example, the frequency of the transmission clock. When the 0-degree control signal is received, one of the two outputs from the latter stage 20 constructs the other and the other destructively interacts with each other. Conversely, when the 180-degree control signal is received, one destructively interacts with the other and the other constructively interacts with each other. In this way, the two outputs from the latter stage 20 output light of opposite phases that change within the same intensity range.

[0027] The balanced photodetector 60 is adjusted to operate without bias with respect to this output light. When the balanced photodetector 60 operates without bias, the amplitude of the output voltage is maximized. Therefore, the gain of the balanced photodetector 60 is adjusted for each of the pair of input terminals so that the amplitude of the output voltage is maximized. Furthermore, it is preferable to measure the extinction ratio and adjust the gain of the balanced photodetector 60 so that the extinction ratio at the output of the subsequent stage 20 is maximized. The gain can be adjusted, for example, by the attenuation amount of the optical attenuators 61A and 61B or the internal resistance element of the amplifier 65. The phase modulator 30 and the balanced photodetector 60 are used in a quantum key distribution device, and may change from their calibrated states. For this reason, it is preferable to periodically perform calibration using calibration method 1 for the phase modulator and calibration method 2 for the balanced photodetector, for example, at set intervals such as a number of days.

[0028] [Phase modulator calibration system] Next, a calibration system for a phase modulator according to the present invention will be described. The calibration system 3 for a phase modulator calibrates a phase modulator whose phase modulation amount is controlled by a control signal. The phase modulator is, for example, an LN phase modulator. As shown in Fig. 8, the calibration system 3 for a phase modulator includes a calibration circuit 100, a light source 70, a photodetector 80, and a control signal generator 40. The calibration circuit 100 is cascaded with a first delay interferometer 10 as a preceding stage and a second delay interferometer 20 as a succeeding stage. The delay time of the first delay interferometer 10 is synchronized with the period of a transmission clock, and the phase difference is adjusted to cause constructive interference. The delay time of the second delay interferometer 20 is synchronized with the period of the transmission clock, and the phase modulator 30 to be calibrated is installed in the optical path. If the polarization dependency of the succeeding stage 20 is a problem, the calibration circuit 100 preferably includes a polarization filter 50 before the succeeding stage 20.

[0029] The first and second delay interferometers 10 and 20, the phase modulator 30, and the control signal generator 40 are as already described. The light source 70 is, for example, a pulsed laser or a continuous wave laser. The photodetector 80 outputs a current or voltage corresponding to the intensity of the light, and may be connected to both or only one of the two outputs of the subsequent stage 20.

[0030] A method 1 for calibrating a phase modulator according to the present invention is a method for calibrating a phase modulator in which the amount of phase modulation is controlled by a control signal, and includes the steps of: preparing a first delay interferometer 10 as a phase calibration reference and a second delay interferometer 20 in which a phase modulator 30 to be calibrated is installed in an optical path (S1); measuring the delay time for each of the first and second delay interferometers 10, 20 based on the time interval between pulses divided from an input pulse; synchronizing the delay time with the period of a transmission clock (S2); adjusting the phase difference for the first delay interferometer 10 so that the input continuous wave laser light exhibits constructive interference at the output (S3); and assembling a calibration circuit 100 in which the first delay interferometer 10 is cascaded in the front stage and the second delay interferometer 20 in the rear stage, to determine a control signal (S4).

[0031] With this configuration, the phase modulator calibration method 1 uses the first delay interferometer 10, which has been adjusted so that the phase difference caused by the optical path difference is 0 degrees (including an integer multiple of 360 degrees), as a calibration reference. This ensures that the amount of phase modulation by the calibrated phase modulator 30 is a correct value as an absolute phase. Furthermore, the phase difference of the first delay interferometer 10 is adjusted using continuous light. This allows the first delay interferometer 10, which serves as the phase calibration reference, to be accurately adjusted in a simple manner. Phase modulator calibration method 1 can be performed using strong unattenuated optical pulses or continuous light, rather than the weak light typically required for quantum key distribution. This improves the accuracy of the calibration, enabling highly accurate calibration of the absolute phase even when the transmission clock frequency is high. Furthermore, providing an accurately calibrated phase modulator to both the transmitter and receiver of the quantum key distribution system can improve the implementation security of the quantum key distribution device.

[0032] The adjustment S3 of the phase difference of the first delay interferometer 10 is preferably performed by adjusting the temperature of the first delay interferometer 10. With this configuration, the method 1 for calibrating a phase modulator can accurately adjust the phase difference of the first delay interferometer 10.

[0033] The adjustment S3 of the phase difference of the first delay interferometer 10 is preferably performed by measuring the extinction ratio at the output and adjusting it so that the extinction ratio is maximized. With this configuration, the method 1 for calibrating a phase modulator can adjust the phase difference of the first delay interferometer 10 more accurately.

[0034] In determining the control signal S4, it is preferable to input pulsed laser light to the input of the front stage 10, divide one pulse, and adjust the control signal while measuring the strength of the central pulse located in the middle of the first and last pulses output from the rear stage 20, and determine the control signal with the maximum central pulse strength as the 0-degree control signal, and the control signal with the minimum central pulse strength as the 180-degree control signal. With this configuration, the phase modulator calibration method 1 can perform accurate calibration in a clear and easy-to-understand manner.

[0035] A calibration method 2 for a balanced photodetector according to the present invention includes, in a calibration circuit 100 in which a phase modulator 30 is calibrated by the calibration method 1 for a phase modulator, inputting continuous wave laser light to the input of the front stage 10, controlling the phase modulator 30 by alternately repeating a 0-degree control signal and a 180-degree control signal, and adjusting the gain of the balanced photodetector 60 connected to the output of the rear stage 20 so that the extinction ratio measured by the balanced photodetector 60 is maximized. With this configuration, the balanced photodetector calibration method 2 can further calibrate the balanced photodetector 60 with high precision using the calibrated first delay interferometer 10 and phase modulator 30 as calibration standards, thereby further improving the security of the quantum key distribution implementation. By using a phase modulator and a balanced photodetector calibrated by phase modulator calibration method 1 and balanced photodetector calibration method 2, it is possible to ensure the security of the quantum key distribution implementation and to determine whether the quantum key distribution device is implemented correctly.

[0036] The calibration system for a phase modulator according to the present invention is a system for calibrating a phase modulator in which the amount of phase modulation is controlled by a control signal, and comprises a calibration circuit 100, a light source 70 that inputs light to the calibration circuit 100, a photodetector 80 connected to the output of the calibration circuit 100, and a control signal generator 40 that generates a control signal. The calibration circuit 100 is cascaded in such a manner that a first delay interferometer 10, whose delay time is synchronized with the period of a transmission clock and whose phase difference is adjusted to result in constructive interference, is connected to a second delay interferometer 20, whose delay time is synchronized with the period of the transmission clock and whose optical path includes a phase modulator 30 to be calibrated.

[0037] With this configuration, the phase modulator calibration system 3 can calibrate the phase modulator 30 with high precision using the first delay interferometer 10 as a phase calibration standard. Furthermore, the phase modulator calibration system 3 can verify the operation of the phase modulator. This makes it possible to determine whether the quantum key distribution device has been implemented correctly.

[0038] In addition to the PLC, the delay interferometer may be an optical system in which the optical path is space or an optical fiber, and a half mirror or the like is used. In the second delay interferometer 20, the phase modulator 30 may be installed in the long optical path 23B instead of the short optical path 23A. Furthermore, the phase modulator 30 may be installed in the second delay interferometer 20 after the delay time synchronization S2. The phase difference adjustment S3 of the first delay interferometer 10 may be performed by inserting a dielectric near the optical path and varying the voltage applied to the dielectric. Alternatively, the light intensity may be measured by connecting power meters M1 and M2 to the two output terminals. Instead of using a power meter, a photodetector PD and an oscilloscope OSC may be connected for measurement, as shown in FIG. 4. In the phase modulator calibration system 3, if the light source 70 is a continuous wave laser that emits light of a wavelength that adjusts the phase difference of the first delay interferometer 10, and the photodetector 80 is the balanced photodetector 60 to be calibrated, then the balanced photodetector 60 can be calibrated with high precision as a calibration system for a balanced photodetector. [Explanation of symbols]

[0039] 1. Calibration method (phase modulator) 2. Calibration method (balanced photodetector) 3 Calibration system (phase modulator) 10 First delay interferometer 20 Second Delay Interferometer 30 Phase Modulator 31 Control signal input terminal 40 Control Signal Generator 50 Polarizing Filter 60 Balanced Photodetector 70 light source 80 Photodetector 100 calibration circuits

Claims

1. A method for calibrating a phase modulator in which a phase modulation amount is controlled by a control signal, comprising: preparing a first delay interferometer as a phase calibration reference and a second delay interferometer in which a phase modulator to be calibrated is installed in an optical path; measuring a delay time of each of the first and second delay interferometers based on a time interval between pulses divided from one input pulse, and synchronizing the delay time with a period of a transmission clock; adjusting a phase difference of the first delay interferometer so that input continuous wave laser light exhibits constructive interference at the output; The control signal is determined by forming a calibration circuit in which the first delay interferometer is connected in cascade to the second delay interferometer in the front stage and the second delay interferometer in the rear stage. A method for calibrating a phase modulator, comprising:

2. 2. The method for calibrating a phase modulator according to claim 1, wherein the phase difference of the first delay interferometer is adjusted by adjusting the temperature of the first delay interferometer.

3. 3. The method for calibrating a phase modulator according to claim 1, wherein the adjustment of the phase difference of the first delay interferometer is performed by measuring an extinction ratio at an output and adjusting the extinction ratio to maximize the extinction ratio.

4. 4. A method for calibrating a phase modulator according to claim 1, wherein the control signal is determined by inputting pulsed laser light to the input of a previous stage, measuring the strength of a central pulse located in the middle of the first and last pulses that are divided from one pulse and output from a subsequent stage, adjusting the control signal, and determining the control signal with the maximum strength of the central pulse as the 0-degree control signal, and the control signal with the minimum strength as the 180-degree control signal.

5. In the calibration circuit in which the phase modulator is calibrated by the phase modulator calibration method according to claim 4, a balanced photodetector connected to an output of the subsequent stage, the balanced photodetector being connected to the input of the subsequent stage; a gain of the balanced photodetector being adjusted so that an extinction ratio measured by the balanced photodetector is maximized; and a continuous wave laser beam being input to the input of the subsequent stage, the 0 degree control signal and the 180 degree control signal being alternately repeated to control the phase modulator.

6. A calibration system for a phase modulator in which a phase modulation amount is controlled by a control signal, comprising: a calibration circuit; a light source for inputting light into the calibration circuit; a photodetector connected to the output of the calibration circuit; a control signal generator that generates the control signal; Equipped with The calibration circuit is a phase modulator calibration system in which a first delay interferometer, whose delay time is synchronized with the period of a transmission clock and whose phase difference is adjusted to result in constructive interference, is connected in cascade to a second delay interferometer, whose delay time is synchronized with the period of the transmission clock and whose optical path includes the phase modulator to be calibrated.

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