Specimen testing equipment

Abstract

To provide a highly versatile sample testing device which is easy to maintain.SOLUTION: A sample testing device 1 of the present invention comprises a conveying mechanism unit 2 for a sample to be mounted, and a device body 1H accommodating the conveying mechanism unit 2, where the conveying mechanism unit 2 is configured to be removably inserted into the device body 1H.SELECTED DRAWING: Figure 1B

Description

Technical Field

[0001] The present invention relates to a specimen inspection device.

Background Art

[0002] A specimen inspection device is used as a means for automating the pretreatment process, inspection process, and post-treatment process of specimen inspection. In the pretreatment process, specimen inspection devices such as a stopper opening device, a dispensing device, and a centrifugal separator are used, and in the post-treatment process, specimen inspection devices such as a stopper closing device and a refrigerated storage device are used. FIG. 21A shows a centrifugal separator as an example of the specimen inspection device K10. FIG. 21B is a diagram showing a state in which the exterior cover 100 is removed from FIG. 21A for convenience of explanation. As shown in FIG. 21B, the operation mechanism part of the centrifugal separator (K10) is composed of a transport mechanism part 102, a centrifugal separator 103, and a transfer mechanism part 104. A manipulator 105 for gripping a test tube into which a specimen is placed is attached to the transfer mechanism part 104 of the centrifugal separator (K10).

[0003] Since JIS C 1010-1 is applied to the specimen inspection device K10, in some cases, a protective barrier or cover that can be removed only with tools is required as a protection measure against mechanical hazards to the body part. In the centrifugal separator (K10), as shown in FIG. 21A, it has a full-cover structure in which the entire operation mechanism part (102, 103, 104) is covered with an exterior cover 100. Only the front door 101a and the rear door 102b of the exterior cover 100 can be opened and closed by the user, and an interlock is provided to stop the operation of the transfer mechanism part 104 when it is opened. The opening 106 is a transfer port for the rack to an adjacent device when a plurality of specimen inspection devices K10 are connected, and is blocked by the adjacent device. While the full-cover structure reduces the risk of mechanical hazards, there are problems in that the visibility and accessibility of the mechanism parts (102, 103, 104) are reduced, and maintenance becomes difficult.

Prior Art Documents

Patent Documents

[0004] [Patent Document 1] Japanese Patent Publication No. 2010-145112 [Patent Document 2] WO2019 / 003789 publication [Overview of the project] [Problems that the invention aims to solve]

[0005] Figure 22 shows a perspective view of the maintenance procedure for the conventional sample testing device K10. If the specimen testing device K10 has a fully covered structure, maintenance work is performed by worker p1 leaning into the inside of the device. Therefore, with the current structure, it is difficult for worker p1 to visually inspect and access maintenance areas, resulting in poor work efficiency. Consequently, for some maintenance areas, worker p1 has to remove exterior covers and other parts to perform the work.

[0006] Patent Document 1 attempts to improve maintainability by making the exterior cover and parts easy to remove. However, it has not fundamentally resolved the difficulty of maintenance work. Patent document 2 describes methods for handling different rack types. However, it does not mention how to facilitate maintenance work.

[0007] This invention was conceived in view of the above circumstances, and aims to provide a specimen testing device that is easy to maintain and highly versatile. [Means for solving the problem]

[0008] To solve the above problems, the specimen testing apparatus of the present invention comprises a transport mechanism on which specimens are loaded and a device body in which the transport mechanism is housed, wherein the transport mechanism is configured to be removable from the device body. The mechanism mounting section of the device body has a pair of caster guides and a positioning pin positioned between the pair of caster guides, the transport mechanism section has a pair of casters guided by the pair of caster guides, and a positioning guide positioned between the pair of casters and in contact with the positioning pin in the accommodating direction to position the casters in the accommodating direction, the caster guide has an inlet / outlet slope that slopes downward to guide the casters, a horizontal guide that is formed continuously below the inlet / outlet slope and is positioned substantially horizontally, and a clearance slope that slopes downward and is continuous with the horizontal guide and guides the casters back to the horizontal guide, the distance from the contact surface of the transport mechanism section to the mechanism mounting section to the lower end of the casters is shorter than the distance from the contact surface of the mechanism mounting section to the main body side on which the transport mechanism section is installed to the horizontal guide , The transport mechanism is positioned at a predetermined height when the caster is located above the horizontal guide. It is. [Effects of the Invention]

[0009] According to the present invention, it is possible to provide a specimen inspection apparatus that is easy to perform maintenance work and has high versatility.

Brief Description of the Drawings

[0010] [Figure 1A] Perspective view of the specimen inspection apparatus according to an embodiment of the present invention. [Figure 1B] Perspective view of the state during maintenance work of the specimen inspection apparatus according to an embodiment of the present invention. [Figure 2] Perspective view of the transport mechanism unit seen from the front lower side. [Figure 3A] Enlarged view of the pin caster mounting bracket, caster, and positioning pin guide in the direction of the arrow I in FIG. 2. [Figure 3B] View in the direction of the arrow II in FIG. 3A. [Figure 3C] View in the direction of the arrow III in FIG. 3A. [Figure 3D] View in the direction of the arrow IV in FIG. 3B. [Figure 4] Perspective view of the frame inside the opening of the apparatus main body of the specimen inspection apparatus seen from the right front. [Figure 5A] Front view including a partial cross section of the first and second positioning pins. [Figure 5B] Top view of the first and second positioning pins. [Figure 6A] Top view of the caster guide. [Figure 6B] View in the direction of the arrow V in FIG. 6A. [Figure 7] Front view of the main part in a state where the transport mechanism unit is positioned and housed in the apparatus main body of the specimen inspection apparatus. [Figure 8A] View showing a five-tube rack on which five test tubes containing specimens are placed. [Figure 8B] Top view showing the transport mechanism unit corresponding to the five-tube rack. [Figure 9A] View showing a ten-tube rack on which ten test tubes containing specimens are placed. [Figure 9B] View showing the transport mechanism unit corresponding to the ten-tube rack. [Figure 10A]Cross-sectional top view of the state where the transport mechanism for 5 racks is housed inside the specimen inspection device, seen from above. [Figure 10B] Cross-sectional top view of the state where the transport mechanism for 10 racks is housed inside the specimen inspection device, seen from above. [Figure 11] Schematic diagram of an example using multiple transport mechanism parts in the specimen inspection device of the embodiment. [Figure 12] Schematic front view of the state where the transport mechanism for 5 racks starts to enter through the opening on the right side of the specimen inspection device. [Figure 13] Schematic rear upper perspective view of the state where the transport mechanism for 5 racks starts to enter through the opening on the right side of the specimen inspection device. [Figure 14] Schematic front view of the transport mechanism part inserted through the opening on the right side of the specimen inspection device. [Figure 15] Schematic perspective view of the positioning pin guide around the rear part of the transport mechanism part inserted through the opening of the specimen inspection device, seen from the upper left front obliquely. [Figure 16] Schematic enlarged perspective view of the state where the U-shaped notch of the positioning pin guide of the transport mechanism part inserted into the specimen inspection device abuts against the positioning pin on the frame, seen from the upper left front obliquely. [Figure 17] Schematic enlarged perspective view of the transport mechanism part in the state where the U-shaped notch of the positioning pin guide of the transport mechanism part inserted into the specimen inspection device abuts against the positioning pin on the frame, seen from the upper left front obliquely. [Figure 18] Figure showing the perspective view of the specimen inspection device of the modification example. [Figure 19A] Figure showing the slide rail used for the transport mechanism part of the modification example. [Figure 19B] Figure showing the slide rail used for the transport mechanism part of the modification example. [Figure 20A] Figure showing the LM guide used for the transport mechanism part of the modification example. [Figure 20B] Perspective view of another modification example of the specimen inspection device. [Figure 21A] Perspective view of the conventional specimen inspection device with a full cover structure. [Figure 21B] Figure showing the state where the exterior cover is removed from the specimen inspection device. [Figure 22] A perspective view of the maintenance work for conventional specimen testing equipment. [Modes for carrying out the invention]

[0011] Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings as appropriate. Figure 1A shows a perspective view of a specimen testing apparatus 1 according to an embodiment of the present invention. Figure 1B shows a perspective view of the specimen testing apparatus 1 according to an embodiment of the present invention during maintenance work.

[0012] Figure 2 shows a perspective view of the transport mechanism 2 as seen from the lower right front. The specimen testing apparatus 1 of this embodiment comprises a main apparatus body 1H and a transport mechanism 2. The specimen testing device 1 has a structure in which the transport mechanism 2 is positioned and housed inside the main body 1H of the device. The transport mechanism 2 is composed of densely packed mechanisms. The transport mechanism 2 is a mechanism that transports and buffers multiple sample containers (test tubes) in rack units.

[0013] As shown in Figure 1B, the specimen testing device 1 has an outer casing formed by the housing 3 and the outer cover 4. An opening 3s1 is provided in the right-side panel 3s of the housing 3 for inserting and removing the transport mechanism 2. The opening 3s1 also serves as a transfer point for racks to adjacent devices (1) when the specimen testing device 1 is connected. Since the opening 3s1 is covered by the adjacent device (1), the function of a full-cover structure is maintained.

[0014] As shown in Figure 2, a pair of casters 4a and 4b are installed protruding downwards from the lower left side of the transport mechanism 2. The casters 4a and 4b rotate to allow the transport mechanism 2 to move smoothly in the left-right direction. The casters 4a and 4b roll when the transport mechanism 2 is inserted into or removed from the sample testing device 1. When performing maintenance on the transport mechanism 2, the worker pulls the transport mechanism 2 out through the opening 3s1 of the housing 3 (arrow α11 in Figure 1).

[0015] When maintenance is complete, as shown by arrow α12 in Figure 1, the worker pushes the transport mechanism 2 through the opening 3s1 onto the frame 1f inside the specimen testing device 1, and moves the specimen testing device 1 to its designated position using the lower casters 4a and 4b (see Figure 2).

[0016] A positioning pin guide 5 is provided at the left end of the lower surface of the transport mechanism 2 shown in Figure 2, between the casters 4a and 4b. The positioning pin guide 5 is used to position the transport mechanism 2 in a predetermined location within the specimen testing apparatus 1.

[0017] <Caster 4a, 4b> Figure 3A shows an enlarged view of the mounting bracket 16, casters 4a and 4b, and positioning pin guide 5 as seen by arrow I in Figure 2. Figure 3B shows the view as seen by arrow II in Figure 3A. Figure 3C shows the view as seen by arrow III in Figure 3A. Figure 3D shows the view as seen by arrow IV in Figure 3B. The casters 4a and 4b and the positioning pin guide 5 are fixed to the mounting bracket 16.

[0018] The caster 4a is rotatably mounted on the caster bracket 4a1. The caster bracket 4a1 is screwed n1 to the mounting bracket 16. The caster 4b is rotatably mounted on the caster bracket 4b1. The caster bracket 4b1 is screwed n1 to the mounting bracket 16. The positioning pin guide 5 is a sheet metal component. The positioning pin guide 5 is formed by continuously connecting a mounting plate portion 5a, a positioning plate portion 5b, and another mounting plate portion 5a. The positioning pin guide 5 is fixed to the mounting bracket 6 by welding 5y.

[0019] As shown in Figures 3B and 3C, the positioning plate portion 5b is formed lower than the mounting plate portions 5a on both sides, as it is into which the vertically extending positioning pin 7 (see Figure 4) or positioning pin 8 (see Figure 4), described later, is fitted. The positioning plate portion 5b has a U-shaped notch portion 5b1 into which the positioning pin 7 (see Figure 4) or positioning pin 8 (see Figure 4), described later, is fitted, and a guide notch portion 5b2 that guides the positioning pin 7 or positioning pin 8 (see Figure 4). The guide notch portion 5b2 is formed as a roughly V-shaped notch that widens towards the outside in order to guide the positioning pin 7 into the U-shaped notch portion 5b1. In other words, the guide notch portion 5b2 is formed in a shape that narrows towards the U-shaped notch portion 5b1.

[0020] <First positioning pin 7 and second positioning pin 8> Figure 4 shows a perspective view of the frame 1f inside the opening 3s1 of the main body 1H of the specimen testing device 1, viewed from the front right. Note that Figure 4 shows the main body 1H with the housing 3 removed. In Figure 4, the first positioning pin 7 is assumed to be in use, and the second positioning pin 8 is indicated by a dashed line. The frame 1f is provided with a pair of caster guides 6, a first positioning pin 7, and a second positioning pin 8.

[0021] The first positioning pin 7 is a component for positioning the transport mechanism 2 at a first predetermined position within the specimen testing device 1 (see Figure 1). The second positioning pin 8 is a component for positioning a separate transport mechanism 2, which has a different shape from the transport mechanism 2, within the specimen testing device 1 (see Figure 1). Depending on the shape in which the transport mechanism 2 is housed within the device body 1H, it is also possible to position the separate transport mechanism 2 with the first positioning pin 7. Alternatively, by making the separate transport mechanism 2 almost the same shape as the transport mechanism 2, it is also possible to position it with the first positioning pin 7.

[0022] Figure 5A shows a front view including a partial cross-section of the first and second positioning pins 7 and 8. Figure 5B shows a top view of the first and second positioning pins 7 and 8. The first positioning pin 7 has a disc-shaped flange portion 7a and a cylindrical positioning portion 7b. The first positioning pin 7 has a female thread n3 threaded into its central portion from below. Similarly, the second positioning pin 8 has a disc-shaped flange portion 8a and a cylindrical positioning portion 8b. The second positioning pin 8 has a female thread n3 threaded into its central portion from below.

[0023] Drill holes are provided at the positions of the first positioning pin 7 and the second positioning pin 8 on frame 1f. Then, a male screw is inserted from the bottom side of frame 1f and connected to the female screw n3 of the first positioning pin 7 or the female screw n3 of the second positioning pin 8. In this way, depending on the transport mechanism 2 being used, either the first positioning pin 7 or the second positioning pin 8 is fixed to the frame 1f.

[0024] <Caster Guide 6> Figure 6A shows a top view of the caster guide 6, and Figure 6B shows a view in the direction of arrow V in Figure 6A. The frame 1f is provided with rectangular mounting holes 1f1 and 1f2 (see Figure 4) for attaching each of the pair of caster guides 6.

[0025] As shown in Figure 6B, the caster guide 6 has a first mounting portion 6a, an entry / exit slope 6b, a horizontal guide 6c positioned approximately horizontally below, a clearance slope 6d, and a second mounting portion 6e. The first mounting portion 6a and the second mounting portion 6e have a shape that extends in a substantially horizontal direction from left to right. The first mounting portion 6a and the second mounting portion 6e are arranged substantially horizontally. The first mounting portion 6a and the second mounting portion 6e serve to fix the caster guide 6 to the frame 1f. The first mounting portion 6a and the second mounting portion 6e are provided with through holes 6a1 and 6e1, respectively, through which rivets for fixing to the frame 1f are inserted.

[0026] As a result, the caster guide 6 is fixed below the frame 1f by rivets securing the first mounting portion 6a and the second mounting portion 6e from below the frame 1f inside the specimen inspection device 1 (see Figure 4). The entrance / exit ramp 6b slopes downward from right to left, guiding casters 4a and 4b. The horizontal guide 6c is positioned approximately horizontally downwards.

[0027] The sloping ramp 6d inclines upward from the right to the left, guiding the casters 4a and 4b back to the horizontal guide 6c. The presence of the caster guide 6 allows the casters 4a and 4b to be positioned in predetermined locations on the main body 1H of the device. Furthermore, the lower position of the horizontal guide 6c allows the transport mechanism 2 to be positioned at a predetermined height within the specimen testing device 1. The structure is designed so that the contact surfaces 2t1, 2t2, and 2t3 on the bottom surface 2t (see Figure 2) of the conveying mechanism 2 and the contact surfaces 1fa, 1fb, and 1fc on the main body side of the top surface 1f1 (see Figure 4) of the frame 1f are in contact. This ensures that the levelness of the conveying mechanism 2 is maintained. The main body side contact surface 1fa is placed on the bent portion 3s2 of the right side plate 3s. The main body side contact surfaces 1fb and 1fc are formed by riveting sheet metal to the upper surface of the frame 1f.

[0028] <Storage of the transport mechanism 2> Figure 7 shows a front view of the main parts of the specimen testing device 1, in which the transport mechanism 2 is positioned and housed within the main body 1H of the device. The outline of housing the transport mechanism 2, configured as described above, into the main body 1H of the device will now be explained. For example, as shown by the arrow α12 in FIGS. 1 and 7, the operator inserts the removed transport mechanism unit 2 into the opening 3s1 on the right side of the apparatus main body 1H. Then, as shown by the arrow α13 in FIG. 7, the casters 4a and 4b of the transport mechanism unit 2 roll forward and descend on the entry / exit slope 6b of the caster guide 6. When the casters 4a and 4b of the transport mechanism unit 2 reach the horizontal guide 6c of the caster guide 6, the positioning pin guide 5 fixed to the lower surface of the transport mechanism unit 2 engages with the first positioning pin 7 or the second positioning pin 8 erected on the frame 1f. As a result, the transport mechanism unit 2 is positioned at a predetermined position within the apparatus main body 1H of the specimen inspection apparatus 1. At this time, by making the dimension s1 from the grounding surfaces 2t1, 2t2, 2t3 (see FIG. 2) of the transport mechanism unit 2 to the lower ends of the casters 4a and 4b shorter than the dimension s2 from the main body side grounding surfaces 1fa, 1fb, 1fc of the frame 1f to the horizontal guide 6c of the caster guide 6 (s1 < s2), the grounding surfaces 2t1, 2t2, 2t3 of the bottom surface 2t of the transport mechanism unit 2 and the main body side grounding surfaces 1fa, 1fb, 1fc of the upper surface 1f3 of the frame 1f can be aligned. That is, the transport mechanism unit 2 can be set to a predetermined height within the specimen inspection apparatus 1.

[0029] <Various transport mechanism units 2> FIG. 8A shows a five-tube rack 11a on which five test tubes containing specimens are placed, and FIG. 8B shows a transport mechanism unit 2A for transporting the five-tube rack 11a.

[0030] FIG. 9A shows a ten-tube rack 11b on which ten test tubes containing specimens are placed, and FIG. 9B shows a transport mechanism unit 2B for transporting the ten-tube rack 11b. There are various types of transport mechanism units 2 in the transport mechanism unit 2. For example, there is a transport mechanism unit 2A (see FIG. 8B) for transporting a five-tube rack 11a on which five test tubes 10 containing specimens as shown in FIG. 8A are placed. Furthermore, there is a transport mechanism 2B (see Figure 9B) for transporting the 10-tube rack 11b on which the 10 test tubes 10 containing the samples shown in Figure 9A are placed. The transport mechanism 2A for the 5-tube rack 11a and the transport mechanism 2B for the 10-tube rack 11b have different external shapes, with the transport mechanism 2A for the 5-tube rack 11a being larger than the transport mechanism 2B for the 10-tube rack 11b. For example, the left-right dimension of the transport mechanism 2A for the 5-tube rack 11a shown in Figure 10A is approximately 674 mm, and the left-right dimension of the transport mechanism 2B for the 10-tube rack 11b shown in Figure 10B is approximately 599 mm.

[0031] Therefore, if an attempt is made to position the transport mechanism 2A for the 5-rack 11a and the transport mechanism 2B for the 10-rack 11b, which have different external shapes, on the specimen testing device 1 using a single positioning pin (7 or 8), there is a risk that the transport mechanism 2A for the 5-rack 11a, which has a larger external shape, may protrude outside the specimen testing device 1. Therefore, the first positioning pin 7 of the transport mechanism 2A for the 5 racks 11a is positioned at the back so that the transport mechanism 2A fits completely inside the specimen testing device 1 (see Figure 10A).

[0032] Figure 10A shows a top cross-sectional view of the transport mechanism 2A for the five racks 11a, housed inside the specimen testing device 1. Figure 10B shows a top cross-sectional view of the transport mechanism 2B for the 10 racks 11b, housed inside the specimen testing device 1.

[0033] As shown in Figure 4, the second positioning pin 8 for the transport mechanism 2B for the 10-rack is located in front of (to the right of) the first positioning pin 7. On the other hand, since the transport mechanism 2B for the 10-rack 11b is smaller than the transport mechanism 2A for the 5-rack 11a, it can be completely housed inside the specimen testing device 1 without protruding outside it (see Figure 10B).

[0034] Figure 11 shows a schematic diagram of an example in which multiple transport mechanisms 2A and 2B are used in the specimen testing apparatus 1 of the embodiment. As shown in Figure 11, the configuration of the sample testing device 1 described above allows for the use of two different types of transport mechanisms 2 for a single sample testing device 1: a transport mechanism 2A for a 5-rack 11a and a transport mechanism 2B for a 10-rack 11b. In other words, by sharing the housing 3 of the specimen testing device 1 shown in Figure 1A, it becomes possible to accommodate various types of racks, such as a 5-rack 11a and a 10-rack 11b.

[0035] Furthermore, as mentioned above, by making the transport mechanisms 2A and 2B of the 5-rack and 10-rack units substantially the same shape, they can be positioned using the same positioning pins (7 and 8). Therefore, the housing 3 can be shared with the transport mechanism 2, resulting in significant economies of scale. Furthermore, design man-hours can be reduced.

[0036] <Insertion and removal of the transport mechanism 2 into the specimen testing device 1> To remove the transport mechanism 2 from the specimen testing device 1 shown in Figure 1A for maintenance, the worker grasps the base plate 2m of the transport mechanism 2 and pulls it out through the opening 3s1 on the right side of the housing 3 of the specimen testing device 1, as shown by arrow α11 in Figure 1B. Next, the process of storing the transport mechanism 2 into the specimen testing device 1 will be explained using the transport mechanism 2A for the 5-rack 11a as an example.

[0037] To store the removed transport mechanism 2 inside the specimen testing device 1 after maintenance, insert the left side 2h of the transport mechanism 2 into the opening 3s1 on the right side of the housing 3 of the specimen testing device 1, as shown by arrow α12 in Figure 1B.

[0038] Figure 12 shows a schematic front view of the sample testing device 1 with the transport mechanism 2A for the five racks 11a beginning to enter through the opening 3s1 on the right side. Figure 13 shows a schematic view from the upper left front arrow of the sample testing device 1 with the transport mechanism 2A for the five racks 11a beginning to enter through the opening 3s1 on the right side. Then, the casters 4a and 4b of the transport mechanism 2A roll over the frame 1f inside the specimen testing device 1 (arrow β11 in Figure 12), and the transport mechanism 2A moves into the inside of the specimen testing device 1 (arrow α12 in Figures 12 and 13).

[0039] Figure 14 shows a schematic front view of the transport mechanism 2A inserted through the opening 3s1 on the right side of the specimen testing device 1. As the transport mechanism 2A moves forward, the casters 4a and 4b are stored in the caster guides 6 of the device body 1H, as shown in Figure 14.

[0040] Figure 15 shows a schematic perspective view of the positioning pin guide 5 at the rear of the transport mechanism 2A, which is inserted through the opening 3s1 of the specimen testing device 1, viewed from an oblique left front upper position. Then, the positioning pin guide 5 (see Figure 2) at the rear lower part of the transport mechanism 2 engages with the positioning pin 7 (see Figure 4) on the frame 1f inside the specimen testing device 1 (arrow α13 in Figure 15).

[0041] Figure 16 shows a schematic perspective view enlarged from an oblique angle above and to the left, showing the state in which the U-shaped notch 5b1 of the positioning pin guide 5 of the transport mechanism 2A placed in the specimen testing device 1 is in contact with the positioning pin 7 on the frame 1f.

[0042] Figure 17 shows a schematic perspective view of the transport mechanism 2A, which is placed inside the specimen testing device 1, with the U-shaped notch 5b1 of the positioning pin guide 5 of the transport mechanism 2A in contact with the positioning pin 7 on the frame 1f, viewed from the upper left front.

[0043] As shown in Figures 16 and 17, the U-shaped notch 5b1 (see Figure 3B) of the positioning pin guide 5 (see Figure 2) at the rear lower part of the transport mechanism 2A contacts the positioning pin 7 on the frame 1f inside the specimen testing device 1 shown in Figure 4. This positions the transport mechanism 2A at a predetermined location on the specimen testing device 1. According to the configuration of the specimen testing device 1 described above, the transport mechanism 2 can be inserted into and removed from the opening 3s1 on the side of the housing 3 of the specimen testing device 1.

[0044] Since the transport mechanism 2 can be pulled out from the main body 1H of the device, the visibility of the transport mechanism 2 or accessibility to the transport mechanism 2 is improved. Therefore, the maintainability of the transport mechanism 2 is improved. Consequently, the working time can be reduced. Since the transport mechanism 2 can be pulled out, the transport mechanism 2 may be prepared in advance as a maintenance stock and replaced with the one being maintained. Furthermore, positioning accuracy can be improved by using positioning pins (7, 8) and positioning pin guide 5 (see Figure 2). As a result, the position repeatability is high when the transport mechanism 2 is reinstalled. Therefore, by minimizing the positional difference between the transport mechanism 2 before it is pulled out and when it is reinstalled, the time required to re-register the positional coordinates for gripping the test tube 10 with the manipulator can be reduced.

[0045] <<Variation>> Figure 18 shows a perspective view of a modified specimen testing device 21. Figure 19A shows the slide rail 23 used in the modified transport mechanism 22 in an extended state. Figure 19B shows the slide rail 23 used in the modified transport mechanism 22 in a retracted state.

[0046] Figure 20A shows the LM guide 24 used in the modified transport mechanism 25. Figure 20B shows a perspective view of another modified example of the specimen testing device 21A. The modified specimen testing devices 21 and 21A shown in Figures 18 and 20B have transport mechanisms 22 and 25 that can be moved in and out of the main device body 21H and 21H1, respectively, using slide rails 23 and LM guides 24.

[0047] As shown in Figure 18, the modified specimen testing device 21 comprises a device body 21H and a transport mechanism 22. The slide rail 23 shown in Figures 19A and 19B has an outer rail 23a, a first inner rail 23b, and a second inner rail 23c. The outer rail 23a, the first inner rail 23b, and the second inner rail 23c move relative to each other in the extending direction and expand and contract via rollers or balls and retainers. As shown in Figure 18, an outer rail 23a is attached to the frame 21f of the main body 21H of the device. A second inner rail 23c is attached to the lower surface of the transport mechanism 22.

[0048] As shown in Figures 19A and 19B, the transport mechanism 22 can be moved in and out of the device body 21H via the slide rail 23 by extending and retracting the slide rail 23.

[0049] The Linear Motion Guide (LM) 24 shown in Figure 20A has a rail 24a and a block 24b. The rail 24a and the block 24b move relative to each other in the direction of extension of the rail 25a, with the interposition of a ball and a retainer. In another example shown in Figure 20B, a drawer plate 26 is slidably mounted on the frame 21f1 of the main body 21H1 of the device via an LM guide 24. A rail 24a is attached to the drawer plate 26. A block 24b is attached to the lower surface of the transport mechanism 25. This configuration allows the transport mechanism 25 to be moved in and out of the device body 21H1 via the pull-out plate 26 and LM guide 24.

[0050] The modified form also produces the same effects and benefits as the embodiment. In the modified example, it is preferable to set the height of the transport mechanism section 22, 25 within the specimen testing device 21, 21A to a predetermined height.

[0051] <<Other Embodiments>> 1. The present invention is not limited to the embodiments and modified configurations described above, and various modified and specific forms are possible within the scope of the appended claims. [Explanation of Symbols]

[0052] 1.21 Specimen testing equipment 1f Frame (mechanism mounting section) 1H Main unit of the device 11a 5-rack (rack) 11b 10-pack rack (rack) 2, 2A, 2B Transport mechanism section 4a, 4b Casters (means of transport) 5. Positioning pin guide (positioning guide) 6. Caster guide (guiding mechanism) 6c Horizontal guide (caster holding part) 7, 8 Positioning pins 23 Slide rails 23a, 24a The lower surface of the outer rail (guide means) transport mechanism section 22 23b, 24b Inner rail (means of transport) 25 LM Guide 25a Rail (guide means) 25b Block (means of transport)

Claims

1. The transport mechanism unit on which the specimen is loaded, The device comprises a main body that houses the aforementioned transport mechanism, The transport mechanism is configured to be removable from the main body of the device. The mechanism mounting section of the device body has a pair of caster guides and a positioning pin positioned between the pair of caster guides. The transport mechanism includes a pair of casters guided by the pair of caster guides, and a positioning guide positioned between the pair of casters and in contact with the positioning pin in the housing direction to position the position in the housing direction. The caster guide has an entry / exit slope that slopes downward to guide the caster, a horizontal guide that is formed continuously below the entry / exit slope and is positioned substantially horizontally, and a buffer slope that slopes downward and is continuous with the horizontal guide and guides the caster back to the horizontal guide. The distance from the contact surface of the transport mechanism to the mechanism mounting section to the lower end of the caster is shorter than the distance from the contact surface on the main body side where the transport mechanism is installed to the horizontal guide. The aforementioned transport mechanism is When the caster is located above the horizontal guide, it is located at a predetermined height. A specimen testing device characterized by the following features.

2. In the specimen testing apparatus according to claim 1, Multiple transport mechanisms with different sample counts are used with respect to the main body of the device. The positioning pins are located at different distances from the horizontal guide for each of the multiple transport mechanism sections. A specimen testing device characterized by the following features.

Images