Power supply unit and correction method thereof

Abstract

To stably perform connection of a supply voltage.SOLUTION: A power supply device includes: a first voltage source 100 for outputting a first voltage Vsource; source routes 104 and 106 for connecting the first voltage source 100 to a tested device (DUT) 108; and sense routes 114 and 116 connected to the DUT 108. Further, the power supply device includes a circuit for sampling a second voltage Vmeasure of the DUT 108, obtaining a voltage difference between the first voltage and the second voltage, and adjusting the first voltage on the basis of the voltage difference between the first voltage and the second voltage.SELECTED DRAWING: Figure 1

Description

Technical Field

[0001] This disclosure relates to systems and methods related to power supply devices, and particularly to accurately adjusting a power supply device based on the voltage detected in a device under test.

Background Art

[0002] Some power supply devices use four-terminal sensing correction (also called Kelvin sense correction) to detect voltage in or near a device under test (DUT) attached to the power supply device and correct for voltage drops in the paths and connections in the source path connected to the DUT. Kelvin sense correction is useful for ensuring that the supplied voltage accurately reflects the voltage present in the DUT.

Prior Art Documents

Patent Documents

[0003]

Patent Document 1

Non-Patent Documents

[0004]

Non-Patent Document 1

Non-Patent Document 2

Non-Patent Document 3

[0005] Conventional Kelvin sensing can detect voltage at the DUT with great accuracy, but when used to compensate for the power supply voltage, it can be problematic as it may lead to low or even instability in the control loop. Some devices address this problem by using an electrical short circuit in the DUT wiring to compensate for the DUT voltage sensing. A compensation factor can be generated by driving the path with a known current and measuring the voltage drop, and this compensation factor is used when generating the power supply voltage to ensure that the DUT voltage is at the intended voltage level. However, using an electrical short circuit requires updating or verifying the compensation factor and interrupting the test to create the electrical short circuit when necessary to ensure that the electrical short circuit is properly set.

[0006] Examples of the disclosed technology address the shortcomings of these and other prior art. [Means for solving the problem]

[0007] The disclosures of this application, without limitation, relate to improvements in methods using Kelvin sense correction for devices having a power supply function, such as source measure units (SMUs), which alleviate many of the problems of conventional Kelvin sense correction methods and circuit short compensation methods.

[0008] An example of the technology disclosed herein involves maintaining a sense path that enables remote voltage measurement, and using this sense path to determine and correct the voltage drop and error level in the source (signal supply) path without directly using the detected voltage. This allows for the formation of a control loop independent of the source loop, providing the speed and stability advantages associated with local control. Furthermore, the example of the technology disclosed herein enables error checking and limit range checking, thus eliminating the possibility of the source control loop failing to open and damaging the attached load (device under test) if the sense path (sense lead wire) becomes detached, damaged, or otherwise missing. In addition, the voltage drop associated with the source path can be monitored to ensure that the desired error level or source specifications are reliably maintained at the DUT or load.

[0009] The aspects, features, and effects of the embodiments of the disclosed technology will become clear from the attached drawings and the following description of the embodiments. [Brief explanation of the drawing]

[0010] [Figure 1] Figure 1 is a simplified circuit diagram of a power supply device according to an example of the technology disclosed herein. [Figure 2] Figure 2 is a simplified circuit diagram of a power supply according to another example of the technology disclosed herein. [Figure 3] Figure 3 is a flowchart showing the various operations of the power supply unit shown in Figure 1 or 2. [Modes for carrying out the invention]

[0011] Figure 1 is a simplified circuit diagram of a power supply according to an example of the present invention. As will be apparent to those skilled in the art, additional components not shown in Figure 1 may be included in the circuit or power supply (source unit). As will be readily apparent to those skilled in the art, additional hardware, such as comparators, analog-to-digital converters, processors, and other devices, may be present in the power supply and perform some of the functions described with respect to Figure 1.

[0012] As shown in Figure 1, the nominal voltage source 100 is electrically coupled to the regulated voltage source 102. Although Figure 1 shows the nominal voltage source 100 and the regulated voltage source 102 as separate signal sources, as will be apparent to those skilled in the art, the nominal voltage source 100 and the regulated voltage source 102 can also be combined as a single signal source in some examples. Source paths 104 and 106 transmit voltage from the voltage sources 100 and 102 to the DUT 108. Source path 104 may typically be a lead wire, or it may include traces on a printed circuit board, switches, sensors, connectors, or other paths.

[0013] Source paths 104 and 106 have resistance, which is shown as resistances 110 and 112. Resistors 110 and 112 are used to indicate resistance on source paths 104 and 106 and are not necessarily actual resistances on the source paths. The resistance of source paths 104 and 106 is determined by the length of the lead wires, the conductivity of the material, and the geometric shape of the conductors. Furthermore, various circuit components such as sensors, switches, and connectors used to measure the current and other parameters of the load (device under test) may be included in the paths and may be included in the values ​​appearing as resistances 110 and 112. This resistance causes a voltage drop, so the voltage received by DUT 108 will not be the same as the voltage output by signal sources 100 and 102. Sense paths 114 and 116 are also connected to DUT 108, and the sense voltage is V measure It can be expressed as follows. As those skilled in the art will see, the sense paths 114 and 116 may be lead wires and may also include other components. The current sensor is not usually directly included in the sense paths 114 and 116 as used in this application, but as those skilled in the art will see, in some embodiments, the current sensor may be included in what is called the "sense path".

[0014] V measureIt can be used for all measurement needs and may be presented to the user on the display unit of the power supply device, any form of display device, or other output device. In FIG. 1, for the sake of simplicity of the figure and description, the voltage generation circuit 117 is shown. The voltage generation circuit 117 generates a voltage based on the voltage received via the sense paths 114 and 116 at most. That is, although shown as the voltage generation circuit 117, the component 117 may be a buffer or a gain / scaling circuit depending on the embodiment. For this reason, it can generate a copy of the voltage across both ends of the DUT 108 from the sense paths 114 and 116, but does not generate V measure as an arbitrary voltage. The power supply device (source unit: signal source device) may have, for example, a display unit that can output the voltage value of the DUT for display to the user. Although not shown, as would be understood by those skilled in the art, for displaying the voltage across both ends of the DUT 108 on the display unit or sending the voltage of the DUT 108 to other devices, V measure may be sent to an analog-to-digital converter or other devices as needed. The digitized value of V measure may be received by the processor for further processing as needed.

[0015] The amount of correction voltage output by the adjustable voltage source 102 (or the main voltage source if only one voltage source) may be controlled based on the voltage V sample received across both ends of the capacitor 118. At the initial startup of the power supply device (source unit), the adjustable voltage source 102 is set to zero. A simple voltage detection circuit may include the capacitor 118 and the switch 120. The time during which V sample (that is, the capacitor 118) is connected to V measure can be controlled and minimized by the switch 120. That is, instead of constantly monitoring (monitoring) and adjusting the signal source (source) voltage, by introducing the switch 120 as a sample component, V sampleAs part of this, means are provided to perform filtering, limiting, and other correction processing so that the regulated voltage source 102 does not exceed the allowable limit value, and so that the regulated voltage source 102 does not introduce extraneous noise or errors into the signal source control loop. That is, V sample The measurement and monitoring may be performed at discrete or periodic time intervals, rather than continuously, and switch 120 is V sample ga V adj V sample Make it possible to update (V adj Corrections and V sample (Ensure that updates do not occur simultaneously.)

[0016] For example, as shown in Figure 1, in the analog control loop, the adjustment voltage source 102 can be set to zero, and the voltage source 100 is controlled in such a way that a known current flows through the load (device under test). When the known current flows, the voltage detection circuit may close switch 120 to capture the voltage present in the DUT with capacitor 118. This voltage V sample The voltage V supplied by the voltage source 100 source It can be compared with the error caused by the flow of current, and the adjustment voltage V adj It can be used to determine the rules for correction. The voltage sensing circuit includes a comparator and other devices (such as a processor and an analog-to-digital converter), V sample and the voltage V of voltage source 100 source The voltage difference between and can be determined. Assuming that the transient effect has completely settled when the measurement is performed, V adj This can be calculated or determined by the adjustment voltage selector based on the following formula 1.

[0017] V adj =I Load *R comp (1)

[0018] Here, R comp When measuring the characteristics of the circuit described above, Vsource , V sample and known load current I Load_Known Based on the captured value, it is calculated as shown in Equation 2 below.

[0019] R comp =(V source -V sample ) / I Load_Known (2)

[0020] Any V during normal operation source , any load current I Load In this case, we can transform equation 2 and also obtain V source V adj By adding these, we obtain the following equation 3, and ideally, V sample However, V source It can be seen that the circuit operates in such a way that it takes the same value as the value of .

[0021] V sample =V source +V adj -R comp Base I Load (3)

[0022] In some examples, instead of a voltage sensing circuit including a sample-and-hold circuit as shown by capacitor 118 and switch 120, the value of a compensation resistor R is used. comp A multiplying digital-to-analog converter can also be used to store the code representing the load. The multiplying terminal of the multiplying digital-to-analog converter can be used to input a voltage representing the amount of current flowing through the load. This example has the advantage of not having to worry about the limitations of a sample-and-hold circuit, which can affect the circuit's effectiveness over time. Furthermore, R comp The value can be updated by writing a new value to the multiplicative digital-to-analog converter. Updating the multiplicative digital-to-analog converter is done by writing the voltage value V across the load. measureThis can be controlled or restricted so as to be done only when necessary to maintain it within the acceptable range determined by the signal source.

[0023] In situations where sampling or multiplicative digital-to-analog converter updates occur very rapidly, the control loop response of this circuit will begin to approach the performance of conventional Kelvin-source control loops. However, it can still retain advantages such as the limiting correction described below with respect to Figure 3.

[0024] Furthermore, R comp Instead of calculating the value, the adjustment voltage selector may include a processor that determines the digital-to-analog converter (DAC) code (a digital code converted to an analog signal by the DAC) required to obtain the desired adjustment voltage, and the limits can be directly applied as the tolerance range of this DAC code.

[0025] However, examples of the disclosed technology are not limited to analog control loops or combinations of analog and digital control loops, and in some embodiments, digital control loops may be used. Figure 2 shows an exemplary circuit diagram of a digital control loop according to an example of the disclosed technology. However, as those skilled in the art will see, the circuit diagram in Figure 2 may have other components, such as displays, user inputs (knobs, buttons, keyboards, mice, etc.), and various other hardware components, which are not shown, but are not limited to those shown.

[0026] In the illustrative circuit diagram of Figure 2, the same components as those described above in relation to Figure 1 are given the same reference numerals, and no further explanation is given in Figure 2. Instead of a sample-and-hold circuit as shown in Figure 1 as capacitor 118 and switch 120, the sample components may include a digital control loop. The digital control loop may include a voltage sensing circuit, which may have memory 200, an analog-to-digital converter 202, and a processor 204. The voltage sensing circuit is transmitted via the analog-to-digital converter 202. measure After converting the value of to a digital value, V measure The value can be stored in memory 200. measure This may be stored continuously in memory 200, or a switch (not shown) may be provided to store it at discrete time intervals, V measure It may be stored in memory 200.

[0027] The stored V measure The value of is, in processor 204, known current I Load_Known Based on the value, R comp It is used to calculate the value of, and then R comp The value is stored and, during normal operation, the appropriate V adj It may be used to dynamically calculate the value. The processor may also have an adjustable voltage selector, which is the desired V output by the adjustable voltage source 102. adj A value can be output. However, as described above, in some embodiments, it is not necessary to provide an independent adjustment voltage source 102, and the adjustment voltage may be added to the output value of the nominal voltage source 100.

[0028] In all of the above examples, the threshold detection circuit but It is good that it is included, and this is the V that appears between both ends of DUT108 after compensation. measure It has a mechanism to implement a rule that monitors the difference between the value and the value of the desired voltage source. measure Based on the comparison of the difference between this value and the desired voltage source value of DUT108, for example, a warning may be issued to the user, or R compActions such as refreshing (recalculating) the calculation may be performed.

[0029] Furthermore, in some examples, the threshold detection circuit may set a limit range to suppress voltage adjustment operations as needed, in order to prevent conditions from forming that could damage the DUT108 due to conditions such as a broken or missing sense lead.

[0030] Figure 3 shows an example of operation in which a voltage source is controlled based on the detected voltage of the DUT 108 according to an example of the present invention. In step 300, a first voltage is generated and transmitted to the DUT 108 by source paths 104 and 106.

[0031] In step 302, the voltage detection circuit may acquire a sample voltage of the voltage at DUT108. For example, the sample voltage may be determined based on the sample-and-hold circuit shown in Figure 1, or based on the memory and processor shown in Figure 2. In some examples, the sample voltage may be acquired periodically rather than continuously so that the sample adjustment loop operates independently of the source loop. In some examples, the sample voltage may be determined when a known current is used. When a known current is used, as described above, R comp It can be calculated.

[0032] In step 304, the adjustment voltage selector can determine the adjustment voltage based on the sample voltage, as previously described in detail with respect to Figures 1 and 2. For example, in some cases, the adjustment voltage can also be determined by using the determined compensation resistor together with the actual current. However, the adjustment voltage can also be determined by other methods, such as V measure By comparing the voltage with the desired signal source voltage value and periodically applying an adjustment voltage, V measure There are devices that adjust the signal source voltage to approximate the desired value.

[0033] In some examples, the adjustment voltage may be applied directly to the first voltage, as shown in step 308. However, in other examples, a threshold detection circuit may be used to prevent correction limit violations, as shown in step 306. A correction limit violation may occur, for example, when the difference between the first voltage and the sample voltage is greater than an allowable value. If a correction limit violation occurs, the power supply may perform some action to adjust the signal source to automatically prevent the user from using a function to correct the out-of-limit condition, or to generate an output that warns the user of the condition. In some examples, a warning may be generated only if the error exceeds a predetermined amount. For example, if the error is less than a predetermined amount, no adjustment voltage is applied to the signal source, and the user is not warned. However, if the error is greater than a predetermined amount, the user receives a warning about the condition.

[0034] Another example of a compensation limit is a compensation resistor R. comp or adjustment voltage V adj Some systems allow you to select a maximum or minimum value to set limits on the range of values. For example, in some embodiments, R comp Refresh or update the value of R comp A violation of the correction limit may be considered to occur if the calculated value of is less than zero or greater than 2 ohms. In another example, R comp Regardless of whether or not it is used, a correction limit violation may occur if the regulated voltage is greater than 1 volt. The user or equipment manufacturer may set any number of correction limit parameters as needed. For example, in some embodiments, the user may configure a desired correction limit range within the power supply. In another example, the correction limit range is set during the manufacture of the power supply. It is also possible to allow the user to set limits only within a certain range set during the design or manufacture of the signal source.

[0035] Furthermore, although Figure 3 shows that step 306 occurs after step 304, in some embodiments, step 306 may occur before step 304, and the correction limit violation may be checked before the adjustment voltage is determined. If a violation occurs, a warning (alert) is generated, and the adjustment voltage is not determined. If the adjustment voltage is not determined due to a violation, a zero adjustment (i.e., no adjustment) may be applied to the first voltage, and then the process returns to step 302 to check the sample voltage at a new (another) discrete or periodic point in time. This point in time may be set based on a schedule, specified by the user, or set when a specific situation occurs.

[0036] An example of the technology disclosed herein is that the voltage across the DUT108 can be accurately measured, and at the same time, the signal source can be corrected by utilizing information from a sense path to correct the signal source value at periodic or discrete points in time. This can be done so that the source loop operates independently of the sense loop, as described above, thus preventing instability and noise under specific conditions.

[0037] Furthermore, examples of the technology disclosed herein allow for limitations or error checking on the amount of adjustment applied to the signal source. Instead of sending the sensed voltage directly from the DUT108 to the source to be adjusted, error checking can be performed as described above for conventional systems, so that an incorrect voltage is not used to adjust the voltage amount, and the connected DUT108 does not become damaged. This prevents problems that occur when the sense path (e.g., sense lead wires) is not properly connected, such as probe alignment problems, miswiring of terminals, or damage to the path.

[0038] Furthermore, the examples of the disclosed technology allow for easy mode switching between local (2-wire) and remote (4-wire) sensing methods. The error correction limitations of the examples of the disclosed technology can limit signal source errors or other problems or malfunctions (glitches) that occur during the transition between local and remote sensing methods. Also, any remote sense adjustment does not completely transfer control from the local to the remote sense point, but rather uses a unique V adj This is achieved by incorporating the term, so in the case of local sense, simply, V adj or R comp This indicates a special condition where it is fixed or set based on known parameters within the device, and in some cases may be set to zero.

[0039] Embodiments of the disclosed technology can operate on a specially programmed general-purpose computer, including specially created hardware, firmware, digital signal processors, or processors that operate according to programmed instructions. The terms “controller” or “processor” in this application mean microprocessors, microcomputers, ASICs, and dedicated hardware controllers, etc. Embodiments of the disclosed technology can be implemented by one or more computers (including monitoring modules) or other devices, using computer-readable data such as program modules and computer-executable instructions. Generally, program modules include routines, programs, objects, components, data structures, etc., which, when executed by a processor in a computer or other device, perform specific tasks or implement specific abstract data formats. Computer-executable instructions may be stored on computer-readable storage media such as hard disks, optical disks, removable storage media, solid-state memory, RAM, etc. As will be understood by those skilled in the art, the functions of the program modules may be combined or distributed as needed in various embodiments. Furthermore, these functions can be embodied in whole or in part in firmware or hardware equivalents such as integrated circuits or field-programmable gate arrays (FPGAs). One or more aspects of the disclosed technology can be more effectively implemented using specific data structures, such data structures are considered to be within the scope of computer-executable instructions and computer-usable data described herein.

[0040] The disclosed embodiments may, in some cases, be implemented in hardware, firmware, software, or any combination thereof. The disclosed embodiments may also be implemented as instructions carried or stored in one or more computer-readable media that can be read and executed by one or more processors. Such instructions may be referred to as computer program products. The computer-readable media described herein means any medium accessible by a computing device. For example, but not limited to, computer-readable media may include computer storage media and communication media.

[0041] Computer storage media means any medium that can be used to store computer-readable information. Examples of computer storage media include, but are not limited to, random-access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory and other memory technologies, compact disc read-only memory (CD-ROM), DVD (Digital Versatile Disc) and other optical disc storage devices, magnetic cassettes, magnetic tapes, magnetic disk storage devices and other magnetic storage devices, and any other volatile or non-volatile removable or non-removable media implemented by any technology. Computer storage media exclude signals themselves and temporary forms of signal transmission.

[0042] A communication medium refers to any medium that can be used to transmit computer-readable information. Examples of communication mediums, though not limited to them, include coaxial cables, fiber optic cables, air, or any other medium suitable for transmitting electrical, optical, radio frequency (RF), infrared, sound, or other forms of signals. Examples

[0043] The following examples are provided that are useful for understanding the technology disclosed herein. These embodiments may include one or more of the examples described below, or any combination thereof.

[0044] Embodiment 1 is a power supply unit (voltage source unit) comprising a first voltage source configured to output a first voltage, a source path connecting the first voltage source to the device under test, a sense path electrically coupled to the device under test, and a circuit configured to sample a second voltage from the device under test, determine the voltage difference between the first and second voltages, and adjust the first voltage based on the voltage difference between the first and second voltages.

[0045] Embodiment 2 is a power supply device of Embodiment 1, wherein the circuit includes a threshold detection circuit configured to receive the voltage difference and compare this voltage difference with a correction limit value, and an adjustment voltage selector that changes the adjustment voltage based on the voltage difference if the correction limit value is not violated.

[0046] Example 3 is a power supply device of Example 2, in which a violation of the correction limit value occurs when the adjusted voltage exceeds one or more predetermined values.

[0047] Example 4 is a power supply device of Example 3, in which the correction limit value is violated when the adjusted voltage is greater than a predetermined voltage.

[0048] Example 5 is a power supply unit of any of Examples 2 to 4, wherein the adjustment voltage selector is configured to select an adjustment voltage based on the load current, a known current flowing through the device under test, and a resistance compensation value determined from the voltage difference.

[0049] Example 6 is a power supply device of Example 5, in which, when determining whether the above voltage difference violates the correction limit value, it is determined whether the resistance compensation value violates one or more predetermined values.

[0050] Example 7 is a power supply device of any of Examples 1 to 6, wherein the circuit comprises a voltage detection circuit coupled to a sense path for measuring or scaling a detected value of a second voltage, and a sample-and-hold circuit configured to capture and temporarily store the sampled second voltage.

[0051] Example 8 is a power supply device of any of Examples 1 to 7, wherein the circuit is configured to capture and temporarily store the second voltage at discrete time intervals.

[0052] Example 9 is a power supply device of any of Examples 1 to 8, wherein the circuit has a switch configured to electrically couple a capacitor to the second voltage in order to sample the second voltage.

[0053] Example 10 is a power supply device of any of Examples 1 to 9, wherein the circuit comprises an analog-to-digital converter configured to convert a sampled second voltage into a digital signal, a memory configured to store the digital signal representing the second voltage, and a processor.

[0054] Example 11 is a power supply device from any of Examples 1 to 10, wherein the circuit has a multiplicative digital-to-analog converter.

[0055] Embodiment 12 is a method for correcting a power supply (source unit) based on the voltage of a device under test, comprising: a process for generating a first voltage; a process for transmitting the first voltage to the device under test; a process for sampling a second voltage of the device under test; a process for determining the voltage difference between the first voltage and the stored second voltage; a process for determining an adjustment voltage based on the voltage difference; and a process for adjusting the first voltage based on the adjustment voltage.

[0056] Example 13 is the method of Example 12, further comprising a process for determining whether the adjusted voltage violates the correction limit, and a process for adjusting the first voltage based on the adjusted voltage if it does not violate the correction limit.

[0057] Example 14 is the method of Example 13, wherein the process for determining whether the regulated voltage violates the correction limit includes a process for determining whether the regulated voltage exceeds one or more predetermined values ​​(violates).

[0058] Example 15 is the method of Example 14, and is deemed to have violated the correction limit value when the adjustment voltage is greater than a predetermined voltage.

[0059] Example 16 is a method of any of Examples 12 to 15, wherein the adjustment voltage is determined based on the load current and a resistance compensation value obtained from the known current flowing through the device under test and the voltage difference.

[0060] Example 17 is one of the methods from Examples 12 to 16, wherein the process for determining whether the adjustment voltage violates the correction limit includes a process for determining whether the resistance compensation violates one or more predetermined values.

[0061] Example 18 is a method according to any of Examples 12 to 17, wherein the process of sampling the second voltage of the device under test includes the process of operating a switch that electrically couples a capacitor to the second voltage.

[0062] Example 19 is a method according to any of Examples 12 to 18, further comprising: a process of converting a second voltage into a digital signal representing the second voltage; a process of storing the digital signal representing the second voltage; and a process of periodically determining an adjustment voltage based on the stored digital signal representing the second voltage.

[0063] Example 20 is a method according to any of Examples 12 to 19, further comprising a process for temporarily storing a second voltage.

[0064] Embodiment 21 is a computer program that, when executed by one or more processors of a power supply unit (source unit), includes instructions for the power supply unit to perform the following processes: generating a first voltage; sampling a second voltage at the device under test based on the first voltage; determining the voltage difference between the first voltage and the stored second voltage; determining an adjustment voltage based on the voltage difference; and adjusting the first voltage based on the adjustment voltage.

[0065] Example 22 is a computer program of Example 21, which, when executed by one or more processors of a power supply unit, includes instructions for the power supply unit to further perform a process of determining whether the regulated voltage violates a correction limit, and if it does not violate the correction limit, to adjust a first voltage based on the regulated voltage.

[0066] Example 23 is a computer program of Example 21, wherein the process for determining whether the adjusted voltage violates the correction limit includes the process for determining whether the adjusted voltage violates one or more predetermined values.

[0067] Example 24 is a computer program of any of Examples 21 to 23, wherein the adjustment voltage is determined based on the load current and a resistance compensation value obtained from the known current flowing through the device under test and the voltage difference.

[0068] The above-described versions of the disclosed subject matter have many effects that are described or will be obvious to those skilled in the art. Nevertheless, not all of these effects or features are required in all versions of the disclosed apparatus, system, or method.

[0069] In addition, the description of this application refers to specific features. All features disclosed herein, in the claims, abstract and and in the drawings, and all steps in all disclosed methods or processes, may be combined in any way, provided that at least a part of them is not mutually exclusive. Each of the features disclosed herein, in the claims, abstract and and in the drawings may be replaced by alternative features that serve the same, equivalent or similar purpose, unless otherwise specified.

[0070] Furthermore, when this application refers to a method having two or more defined steps or processes, these defined steps or processes may be performed in any order or simultaneously, as long as the circumstances do not rule out such possibilities.

[0071] For the sake of explanation, specific embodiments of the present invention have been illustrated and described, but it should be understood that various modifications are possible without deviating from the gist and scope of the invention. Therefore, the present invention should not be limited to anything other than the appended claims. [Explanation of Symbols]

[0072] 100 Nominal Voltage Source 102 Regulating voltage source 104 Source Path 106 Source Path 108 Load (device under test) 110 resistor 112 resistors 114 Sense Path 116 Sense Path 117 Voltage generation circuit 118 Capacitors 120 switches 200 memory 202 Analog-to-Digital Converter 204 Processors

Claims

1. A first voltage source configured to output a first voltage, A source path connecting the first voltage source to the device under test, A sense path electrically coupled to the device under test using loop control independent of the source path, A circuit configured to sample the second voltage of the device under test at discrete time intervals, determine the voltage difference between the first voltage and the second voltage, and adjust the first voltage based on an adjustment voltage derived from the voltage difference between the first voltage and the second voltage. Equipped with, The above circuit, A threshold detection circuit is configured to receive the above voltage difference and compare the voltage difference with a correction limit value, If the above correction limit value is not violated, the adjustment voltage selector changes the above adjustment voltage based on the above voltage difference. A power supply device having the following features.

2. The power supply device according to claim 1, wherein the adjustment voltage selector is configured to select the adjustment voltage based on the load current, the known current flowing through the device under test, and the resistance compensation value obtained from the voltage difference.

3. The power supply device of claim 2, which determines whether the above voltage difference violates the correction limit value, by determining whether the above resistance compensation value violates one or more predetermined values.

4. A method for correcting a power supply based on the voltage of the device under test, The process of generating the first voltage, A process of transmitting the above first voltage to the device under test using the source path, A process to sample the second voltage of the device under test at discrete time intervals using a sense path with loop control independent of the source path described above, A process to determine the voltage difference between the first voltage and the second voltage, The process of determining the adjustment voltage based on the above voltage difference, A process to adjust the first voltage based on the above adjustment voltage, A process to determine whether the above adjustment voltage violates the correction limit, If the above correction limit is not violated, the process of adjusting the first voltage based on the above adjustment voltage is performed. A method for correcting a power supply device equipped with [a specific feature / function].

5. The correction method for a power supply according to claim 4, wherein the adjustment voltage is determined based on the load current, the known current flowing through the device under test, and the resistance compensation value obtained from the voltage difference.

6. The process of converting the above-mentioned second voltage into a digital signal representing the second voltage, A process for storing the digital signal representing the second voltage mentioned above, A process that periodically determines the adjustment voltage based on the stored digital signal representing the second voltage mentioned above. A method for correcting a power supply device according to claim 4 or 5, further comprising the above.

7. A computer program which, when executed by one or more processors of a power supply unit, includes instructions that cause the power supply unit to perform any of the methods of claims 4 to 6.

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