Triboelectric-based sensing for polymer substrate characterization

Abstract

A substrate characterization device including a first roller assembly, a measurement assembly, and a deionizing assembly. A substrate characterization device including a sampling area, a measurement assembly, and a deionizing assembly. A method of characterizing a polymer substrate including maneuvering at least a portion of a polymer substrate to contact a sampling area, removing the at least a portion of the polymer substrate from the sampling area, measuring a surface charge of the sampling area, characterizing the at least a portion of the polymer substrate, informing a deionizing assembly of the characterization of the polymer substrate, and deionizing the sampling area with the deionizing assembly.

Description

TRIBOELECTRIC-BASED SENSING FOR POLYMER SUBSTRATE CHARACTERIZATIONBACKGROUNDField

[0001] Embodiments of the present disclosure generally relate to a method and device for characterizing a polymer substrate.Description of the Related Art

[0002] Polymers are widely used in industry as a substrate for coating a material of interest upon and sometimes as a sacrificial layer to transfer the coated material onto a second substrate of interest. The surface properties of the polymer substrates play a role in determining the feasibility of using the polymer substrate for coating as well as the overall quality of finished or intermediate products.

[0003] The properties of the polymer substrate are important for coating polymer substrates with reactive materials, such as alkali, and alkaline, metals, alloys, or combination thereof. Thus, it is useful to characterize the polymer materials before coating deposition to enable high yields. Current characterization techniques for polymer surface analysis, such as energy dispersive x-ray spectroscopy (EDS), Fourier transform infrared spectroscopy (FTIR), time-of-flight secondary ion mass spectrometry (ToF-SIMS), or x-ray photoelectron spectroscopy (XPS), while offering high accuracy, are batch-based methods, expensive to perform, require highly skilled staff to operate, have large equipment footprints, and test areas measured in square micrometers (pm2).

[0004] Therefore, what is needed in the art is a method and device capable of characterizing a polymer substrate which may be integrated into an active production environment, for example in a roll-to-roll deposition setting.SUMMARY

[0005] A substrate characterization device including a first roller assembly, a measurement assembly, and a deionizing assembly. The first roller assembly including a first cylindrical roller body having a central axis and a cylindrical surface, wherein the first cylindrical roller body includes an outer surface including at least two materials. The at least two materials including at least a one material including an anti-static material forming at least one anti-static area, wherein the at least one anti-static area extends along a first length of the first cylindrical roller body and a first arc length of the first cylindrical roller body, and at least one material forming at least one sampling area, wherein the at least one sampling area extends along a second length of the first cylindrical roller body and a second arc length of the first cylindrical roller body. The at least two materials including an alternating and repeating pattern of the at least two materials around at least a portion of a circumference of the first cylindrical roller body, wherein the at least two materials are electrically isolated. The measurement assembly including a contact element, wherein the contact element is positioned to remain in contact with the outer surface of the first cylindrical roller body and no more than one sampling area simultaneously, and at least one measuring equipment, wherein the at least one measuring equipment is in communication with the contact element. The deionizing assembly, wherein the deionizing assembly is in communication with a deionizer.

[0006] A substrate characterization device including a sampling area configured to accumulate electric charge, a measurement assembly, and a deionizing assembly. The measurement assembly including a contact element positioned to remain in contact with an outer surface of the sampling area, and at least one measuring equipment, wherein the at least one measuring equipment is in communication with the contact element. The deionizing assembly including a deionizing contact positioned to remain in contact with the outer surface of the sampling area, and wherein the deionizing contact is in communication with a deionizer.

[0007] A method of characterizing a polymer substrate including maneuvering a polymer substrate to a sampling area, wherein at least a portion of the polymer substrate contacts the sampling area, removing the at least a portion of the polymer substrate from the sampling area, measuring a surface charge of the sampling area, characterizing the at least a portion of the polymer substrate, informing a deionizing assembly of the characterization of the polymer substrate, and deionizing the sampling area with the deionizing assembly.BRIEF DESCRIPTION OF THE DRAWINGS

[0008] So that the manner in which the above recited features of the present disclosure can be understood in detail, a more particular description of the disclosure,briefly summarized above, may be had by reference to embodiments, some of which are illustrated in the appended drawings. It is to be noted, however, that the appended drawings illustrate exemplary embodiments and are therefore not to be considered limiting of its scope, and may admit to other equally effective embodiments.

[0009] FIG. 1 illustrates a schematic view of a polymer substrate coating apparatus employing a measurement device in accordance with one or more embodiments of the present disclosure.

[0010] FIG. 2 illustrates a flowchart showing selected operations of a method of characterizing a polymer substrate in accordance with one or more embodiments of the present disclosure.

[0011] FIG. 3 illustrates a substrate characterization device according to one embodiment of the present disclosure.

[0012] FIG. 4 illustrates a substrate characterization device according to one embodiment of the present disclosure.

[0013] To facilitate understanding, identical reference numerals have been used, where possible, to designate identical elements that are common to the figures. It is contemplated that elements and features of one embodiment may be beneficially incorporated in other embodiments without further recitation.DETAILED DESCRIPTION

[0014] The disclosure generally relates to a method and device for characterizing a polymer substrate. More specifically, the disclosure relates to a method and device to continuously characterize a polymer substrate in an active production environment to determine if the polymer substrate possesses the correct properties for coating the polymer substrate with a reactive material.

[0015] Polymers are widely used in industry as a substrate for coating a material of interest upon and sometimes as a sacrificial layer to transfer the coated material onto a second substrate of interest. The surface properties of the polymer substrates play a role in determining the feasibility of using the polymer substrate for coating as well as the overall quality of finished or intermediate products.

[0016] The properties of the polymer substrate are important for coating polymer substrates with, reactive materials, such as alkali, and alkaline, metals, alloys, or combination thereof. For example, lithium. Thus, it is useful to characterize the polymer materials before reactive material deposition to enable high yields. Current characterization techniques for polymer surface analysis, such as energy dispersive x-ray spectroscopy (EDS), Fourier transform infrared spectroscopy (FTIR), time-of- flight secondary ion mass spectrometry (ToF-SIMS), or x-ray photoelectron spectroscopy (XPS), while offering high accuracy, are batch-based methods, expensive to perform, require highly skilled staff to operate, have large equipment footprints, and test areas measured in square micrometers (pm2).

[0017] Described herein is a method and device capable of characterizing a polymer substrate which may be integrated into an active production environment, for example in a roll-to-roll deposition setting.

[0018] FIG. 1 illustrates a schematic view of an example polymer substrate coating apparatus 100 employing a measurement device, for example, test equipment 101 , in accordance with one or more embodiments of the present disclosure. The polymer substrate 150 coating apparatus 100 may be a roll-to-roll coating system. The polymer substrate 150 coating apparatus 100 may be used to perform portions of a method 200.

[0019] While not limited to the following example, the polymer substrate 150 coating apparatus 100 may be a SMARTWEB®, manufactured by Applied Materials, adapted for manufacturing lithium anodes, pre-lithiated anodes, or portions of film stacks containing lithium. The polymer substrate 150 coating apparatus 100 is constituted as a roll-to-roll system including an unwinding module 102, a processing module 104 and a winding module 106. In one or more embodiments, the processing module 104 includes a plurality of processing modules or processing chambers 110, 120, 130 and 140 arranged in sequence, each configured to perform one processing operation to the continuous sheet of polymer substrate 150, for example, polyethylene terephthalate (PET), polypropylene (PP), polyethylene (PE), polycarbonate (PC), polyimide (PI), polystyrene (PS), polyurethane (PU), polymethylmethacrylate (PMMA), acrylate, polyvinyl chloride (PVC), or combination thereof. In one or more embodiments, the various components, devices, operations, and / or processes maybe implemented or controlled by at least one internal, or external, controller 160. The processing module 104 includes a frame 105 for assembling, and maintaining the position, of the various subcomponents of the coating apparatus 100.

[0020] The controller 160 includes a programmable central processing unit (CPU) which is operable with a memory (e.g., non-volatile memory) and support circuits. The support circuits are conventionally coupled to the CPU and include cache, clock circuits, input / output subsystems, power supplies, and the like, and combinations thereof coupled to the various components of the coating apparatus 100, to facilitate control thereof. The CPU is one of any form of general purpose computer processor used in an industrial setting, such as a programmable logic controller (PLC), for controlling various components and sub-processors of the processing system. The memory, coupled to the CPU, is non-transitory and is typically one or more of readily available memories such as random access memory (RAM), read-only memory (ROM), floppy disk drive, hard disk, or any other form of digital storage, local or remote.

[0021] Typically, the memory is in the form of a non-transitory computer-readable storage media containing instructions (e.g., non-volatile memory), which when executed by the CPU, facilitates the operation of the coating apparatus 100. The instructions in the memory are in the form of a program product such as a program that implements the methods of the present disclosure. The program code may conform to any one of a number of different programming languages. In one example, the disclosure may be implemented as a program product stored on computer- readable storage media for use with a computer system. The program(s) of the program product define functions of the embodiments (including the methods described herein).

[0022] Illustrative non-transitory computer-readable storage media include, but are not limited to: (i) non-writable storage media (e.g., read-only memory devices within a computer such as CD-ROM disks readable by a CD-ROM drive, flash memory, ROM chips or any type of solid-state non-volatile semiconductor memory devices, e.g., solid state drives (SSD)) on which information may be permanently stored; and (ii) writable storage media (e.g., floppy disks within a diskette drive or hard-disk drive or any type of solid-state random-access semiconductor memory) on which alterable informationis stored. Such computer-readable storage media, when carrying computer-readable instructions that direct the functions of the methods described herein, are embodiments of the present disclosure. In some embodiments, the methods set forth herein, or portions thereof, are performed by one or more application specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), or other types of hardware implementations. In some other embodiments, the substrate processing and / or handling methods set forth herein are performed by a combination of software routines, ASIC(s), FPGAs and, or, other types of hardware implementations. One or more controllers 160 may be used with one or any combination of the various systems described herein.

[0023] In one or more embodiments, as depicted in FIG. 1 , the processing chambers 110-140 are radially disposed about a coating drum 155. Arrangements other than radial are contemplated. For example, in another embodiment, the processing chambers may be positioned in a linear configuration.

[0024] In one embodiment, the processing chambers 110-140 are stand-alone modular processing chambers wherein each modular processing chamber is structurally separated from the other modular processing chambers. Therefore, each of the stand-alone modular processing chambers, can be arranged, rearranged, replaced, or maintained independently without affecting each other. In other embodiments, it should be understood that any number of chambers may be included in the polymer substrate 150 coating apparatus 100.

[0025] The processing chambers 110-140 may include any suitable structure, configuration, arrangement, and / or components that enable the polymer substrate 150 coating apparatus 100 to deposit materials onto polymer substrate 150. For example, but not limited to, the processing chambers may include suitable deposition systems including coating sources, power sources, individual pressure controls, deposition control systems, and temperature control. According to typical embodiments, the chambers are provided with individual gas supplies. The chambers are typically separated from each other for providing a good gas separation. The polymer substrate 150 coating apparatus 100 according to embodiments described herein is not limited in the number of deposition chambers. For example, but notlimited to, polymer substrate 150 coating apparatus 100 may include 3, 6, or 12 processing chambers.

[0026] The processing chambers 110-140 typically include one or more deposition units 112, 122, 132, and 142. Generally, the one or more deposition units as described herein can be selected from the group of a CVD source, an ALD source, a PECVD source, and a PVD source. The one or more deposition units can include an evaporation source, a sputter source, such as, a magnetron sputter source, a DC sputter source, an AC sputter source, a pulsed sputter source, a radio frequency (RF) sputtering source, or a middle frequency (MF) sputtering source. The one or more deposition units can include an evaporation source. In one embodiment, the evaporation source is a thermal evaporation source or an electron beam evaporation source. In one embodiment, the evaporation source is a lithium (Li) source. Further, the evaporation source may also be an alloy of two or more metals. The material to be deposited (e.g., lithium) can be provided in a crucible. The lithium can, for example, be evaporated by thermal evaporation techniques or by electron beam evaporation techniques. In other embodiments, the material to be deposited is a reactive material, such as alkali, and alkaline, metals, alloys, or combination thereof.

[0027] In some embodiments, one or some of the chambers may be configured for performing deposition by other methods, such as, but not limited to, chemical vapor deposition, atomic laser deposition or pulsed laser deposition. In some embodiments, one or some of the chambers may be configured for performing a plasma treatment process, such as a plasma oxidation or plasma nitridation process.

[0028] In one or more embodiments, the processing chambers 110-140 are configured to process both sides of the continuous sheet of polymer substrate 150. Although the polymer substrate 150 coating apparatus 100 is configured to process the continuous sheet of polymer substrate 150, which is horizontally oriented, the polymer substrate 150 coating apparatus 100 may be configured to process substrates positioned in different orientations, for example, the continuous sheet of polymer substrate 150 may be vertically oriented. In one or more embodiments, the continuous sheet of polymer substrate 150 is a flexible support layer. In one or more embodiments, the continuous sheet of polymer substrate 150 includes a PET substrate and an optional coating such as a release layer, a barrier layer, or acombination release-barrier layer. In other embodiments, the continuous sheet of polymer substrate 150 includes PP, PE, PC, PI, PS, Pll, PMMA, acrylate, PVC, or combination thereof.

[0029] In one or more embodiments, the polymer substrate 150 coating apparatus 100 includes a transfer mechanism. The transfer mechanism may include any transfer mechanism capable of moving the continuous sheet of polymer substrate 150 through the processing region of the processing chambers 110-140. The transfer mechanism may include a common transport architecture. The common transport architecture may include a reel-to-reel system with a common take-up reel 154 positioned in the winding module 106, the coating drum 155 positioned in the processing module 104, and a feed reel 156 positioned in the unwinding module 102. The take-up reel 154, the coating drum 155, and the feed reel 156 may be individually heated. The take-up reel 154, the coating drum 155, and the feed reel 156 may be individually heated using an internal heat source positioned within each reel or an external heat source. The common transport architecture may further include one or more auxiliary transfer reels 153a, and 153b positioned between the take-up reel 154, the coating drum 155, and the feed reel 156. Although the polymer substrate 150 coating apparatus 100 is depicted as having a single processing region, in one or more embodiments, it may be advantageous to have separated or discrete processing regions for each individual processing chamber 110-140. For embodiments having discrete processing regions, modules, or chambers, the common transport architecture may be a reel-to-reel system where each chamber or processing region has an individual take-up-reel and feed reel and one or more optional intermediate transfer reels positioned between the take-up reel and the feed reel.

[0030] The polymer substrate 150 coating apparatus 100 may include the feed reel 156 and the take-up reel 154 for moving the continuous sheet of polymer substrate 150 through the different processing chambers 110-140. In one or more embodiments, which can be combined with other embodiments, each of the processing chambers can be configured to deposit portions of the material of interest on the polymer substrate 150. In one embodiment, the first processing chamber 110 and the second processing chamber 120 may be each configured to deposit one or more of protective layers and / or interface layers. In this embodiment, processing chambers 130 and 140 may be configured for depositing a thin film of lithium metalon the continuous sheet of polymer substrate 150. Any suitable lithium deposition process for depositing thin films of lithium metal may be used to deposit the thin film of lithium metal. Deposition of the thin film of lithium metal may be by PVD processes, such as evaporation. The chambers for depositing the thin film of lithium metal may include a PVD system, such as an electron-beam evaporator, a thermal evaporator, or a lamination system. In other embodiments, processing chambers 130 and 140 may be configured for depositing a thin film of reactive materials, such as alkali, and alkaline metals, alloys, or combination thereof.

[0031] In operation, the continuous sheet of polymer substrate 150 is unwound from the feed reel 156 as indicated by the substrate movement direction shown by arrow 152. The continuous sheet of polymer substrate 150 may be guided over, and in contact with, a test equipment 101 via one or more auxiliary transfer reels 153a, 153b. In other embodiments, the test equipment 101 may be located at any location prior to substrate coating. In yet other embodiments, the test equipment 101 may be placed after substrate coating, for example in a substrate independent direct transfer setup (SIDT) in a post-peel section of the SIDT.

[0032] It is also possible that the continuous sheet of polymer substrate 150 is guided by one or more substrate guide control units that shall control the proper run of the polymer substrate 150, for instance, by fine adjusting the orientation of the polymer substrate 150.

[0033] After uncoiling from the feed reel 156 and running over the auxiliary transfer reel 153a, the continuous sheet of polymer substrate 150 is then moved through the deposition areas provided at the coating drum 155 and corresponding to positions of the deposition units 112, 122, 132, and 142. During operation, the coating drum 155 rotates around axis 151 such that the polymer substrate 150 moves in the direction of arrow 152.

[0034] FIG. 3 illustrates a substrate characterization device 300, which test equipment 101 may represent, according to one embodiment of the present disclosure. Substrate characterization device 300 includes a first roller assembly 301 , a measurement assembly 328, and a deionizing assembly 322. The substrate characterization device 300 may be utilized in the method 200.

[0035] In one or more embodiments, a continuous sheet of polymer substrate 150 is unwound from the feed reel 156 in direction shown by arrow 152. The polymer substrate 150 then encounters the substrate characterization device 300 illustrated in FIG. 3. Described in greater detail below, in operation, the continuous sheet of polymer substrate 150 would pass, and contact, the first roller assembly 301. As the polymer substrate separates from the first roller assembly, measurements of the surface charge would be taken of sections of first roller assembly 301. After which, the sections of the first roller assembly 301 would be deionized by the deionizing assembly 322. Based upon the measurements taken by the measurement assembly 328, the properties of the polymer substrate 150 would then be characterized, and action taken if required.

[0036] The first roller assembly 301 includes a first cylindrical roller body 304a having a central axis 305a and a cylindrical surface 308a. The first cylindrical roller body 304a may be formed of any suitable material, such as ferrous and non-ferrous metals, composites, plastics, dielectric material, anti-static material, or any combination thereof. In particular embodiments, the first cylindrical roller body 304a is formed from an anti-static and / or non-magnetic / low-permeability materials.

[0037] The first cylindrical roller body 304a also has an outer surface 318a. In this embodiment, the outer surface 318a is the same distance from the central axis 305a as the cylindrical surface 308a. In other embodiments, the outer surface 318a may be a greater, or lesser, distance from the central axis 305a than the cylindrical surface 308a. The outer surface 318a includes at least two materials.

[0038] At least one of the at least two materials of the outer surface 318a is an anti-static material forming at least one anti-static area 312 which extends along a first length of the first cylindrical roller body 304a and a first arc length of the first cylindrical roller body 304a. Alternatively, the anti-static areas may be formed of the same material as the first cylindrical roller body 304a, or of any suitable material, such as ferrous and non-ferrous metals, composites, plastics, and / or non-magnetic / low- permeability materials. In some embodiments, the at least one anti-static area is electrically isolated from other areas.

[0039] Another material, of the at least two materials of the outer surface 318a, forms at least one sampling area 310 which extends along a second length of the firstcylindrical roller body 304a and a second arc length of the first cylindrical roller body 304a. In particular embodiments, the at least one sampling area 310 is formed of a conductive material, or a conductive material coated with dielectric material. In some embodiments, the at least one sampling area 310 is electrically isolated from other areas. Alternatively, the at least one sampling area 310 may be formed of any material which demonstrates a contact potential (e.g., > 1 pV) between the sampling area and polymer substrate 150 in contact with the sampling area. Example materials may include borosilicate glass, glass, mica (muscovite), vinyl polymers, magnesium (Mg), polyamide polymers, salt (NaCI), wool, fur, silica (SiC>2), polymethyl methacrylate (PMMA), acrylonitrile butadiene styrene (ABS), polycarbonates, aluminum (Al), paper, cotton, zinc (Zn), nickel (Ne), steel (Fe, C + alloying elements), wood, amber, copper (Cu), silver (Ag), platinum (Pt), gold (Au), epoxy resins, natural rubber (polyisoprene), polystyrene, polyethylene, polypropylene, polytetrafluoroethylene (PTFE), fluorspar, siderite, apatite, carbonates, monzanite, olivine, andradite, nepheline, magnesite, allanite, staurolite, beryl, grossularite, eudialyte, titanite, stilbite, wollastonite, diopside cyrtolite, homeblende, stainless steel, titanomagnetite, limenite, monazite, rutile, leucoxene, magnetite / haematite, spinels, chromite, garnet, staurolite, euxenite, scheelite, alteredilmenite, microcline, goethite, albite, zircon, epidote, tremolite, kaolinite, aluminosilicates, quartz, rhodolite, tourmaline, actinolite, pyroxene, tremolite, titanite, glauconite, or combinations thereof.

[0040] As shown in FIG. 3, the at least two materials (which form at least one sampling area 310, and at least one anti-static area 312) of the outer surface 318a, are arranged in an alternating and repeating pattern around at least a portion of a circumference of the first cylindrical roller body 304a. The repeating pattern continues for at least a portion of circumference of the first cylindrical roller body 304a. In other embodiments, there may be one anti-static area 312 and one of the at least one sampling area 310 for the entirety of outer surface 318a. In yet other embodiments, there may be as many anti-static areas 312 and sampling areas 310 as required.

[0041] In this embodiment, the sampling areas 310 and anti-static areas 312 of the outer surface 318a of the first cylindrical roller body 304a shown in FIG. 3 are shown to have an equal first length and second length across the length of the first cylindrical roller body 304a. In other embodiments, the first length and second length may not be equal. In this embodiment, the sampling areas 310 and anti-static areas 312 ofthe outer surface 318a of the first cylindrical roller body 304a shown in FIG. 3 are shown to have an equal first and second arc length about the circumference of the first cylindrical roller body 304a. In other embodiments, the first arc length and second arc length may not be equal.

[0042] The first roller assembly 301 includes a shaft 306a extending along the central axis 305a of the first cylindrical roller body 304a, the shaft 306a being rotatably coupled to the first cylindrical roller body 304a. The shaft 306a may be formed from any suitable material.

[0043] The first roller assembly 301 also includes a bearing assembly 307a. The bearing assembly 307a includes at least one bearing element located within the first cylindrical roller body 304a and facilitates a rotational movement of the first cylindrical roller body 304a around the shaft 306a. In other embodiments, the bearing assembly 307a is positioned to facilitate a rotational movement of the first cylindrical roller body 304a and the shaft 306a around the central axis 305a. The bearing assembly 307a may include a single bearing type, or multiple bearing types, suitable for the purpose, such as ball bearings, roller bearings, needle bearings, tapered roller bearings, spherical roller bearings, thrust bearings, plain bearings, magnetic bearings, or fluid bearings. In other embodiments, there may be no bearing assembly 307a present in the first roller assembly 301 .

[0044] The first roller assembly 301 may also include a sealing mechanism provided on the first cylindrical roller body 304a to prevent ingress of contaminants into the bearing assembly 307a.

[0045] The first roller assembly 301 may also include a mounting structure configured to attach the first roller assembly 301 to a frame 105, for example the frame 105 of the coating apparatus 100, the mounting structure provides means for securing the first roller assembly 301 to the frame 105. The mounting structure may secure the first roller assembly 301 by any suitable attachment means, including bracketry, framing, subframes, fasteners, welding, brazing, adhesives, springs, elastomers, tensioning devices, or any combination thereof.

[0046] Substrate characterization device 300 also includes the measurement assembly 328. The measurement assembly 328 includes a contact element 314 incommunication with at least one measuring equipment 324. The contact element 314 is positioned to remain in contact with the outer surface 318a of the first cylindrical roller body 304a and no more than one sampling area simultaneously. The contact element 314 may be positioned and remain in contact with the outer surface 318a by any suitable attachment means, including bracketry, framing, fasteners, welding, brazing, adhesives, springs, elastomers, tensioning devices, or any combination thereof. In particular embodiments, the contact element 314 is formed from at least one conductive material. The contact element 314 is in communication with the at least one measuring equipment 324. In other embodiments, the contact element 314 may be in communication with the at least one measuring equipment 324, an internal or external controller, such as controller 160, or any combination thereof. The at least one measuring equipment 324 may include a voltmeter, potentiostat, static measurement equipment, or other suitable equipment to measure the characteristic of the polymer substrate 150.

[0047] Substrate characterization device 300 also includes the deionizing assembly 322 for performing portions of method 200. The deionizing assembly 322 includes a second roller assembly 302, a deionizing contact 316, and a deionizer 326. The second cylindrical roller body 304b has a central axis 305b and a cylindrical surface 308b. The second cylindrical roller body 304b may be formed of any suitable material, such as ferrous and non-ferrous metals, composites, plastics and / or non- magnetic / low-permeability materials. The second cylindrical roller 304b has an outer surface 318b. The outer surface 318b is formed from a material 320. The material 320 includes any combination of conductive materials, static dissipative materials, or static elimination materials.

[0048] The outer surface 318b of the second cylindrical roller body 304b is the same distance from the central axis 305b as the cylindrical surface 308b. In other embodiments, the outer surface 318b may be a greater, or lesser, distance from the central axis 305b than the cylindrical surface 308b.

[0049] The deionizing contact 316 is positioned to remain in contact with the outer surface 318b of the second cylindrical roller body 304b. The deionizing contact 316 may be positioned and remain in contact with the outer surface 318b by any suitable attachment means, including bracketry, framing, subframes, fasteners, welding,brazing, adhesives, springs, elastomers, tensioning devices, or any combination thereof. The deionizing contact 316 is in communication with the deionizer 326. In other embodiments, the deionizing contact 316 may be in communication with the at least one measuring equipment 324, an internal or external controller, such as controller 160, or any combination thereof. In some embodiments, the material 320 of the outer surface 318b of the second cylindrical roller body 304b acts to remove any accumulated surface charges thus preparing each sampling area 310 to test a new portion of the polymer substrate 150.

[0050] In other embodiments, the deionizing contact 316 is positioned to contact the outer surface 318a of the first cylindrical roller body 304a, and to be positioned to be out of phase from the contact element 314 such that the deionizing contact 316 and the contact element 314 do not simultaneously contact the same sampling area 310. In yet other embodiments, the contact element 314 and deionizing contact 316 may be combined into a single structure.

[0051] The second roller assembly 302 includes a shaft 306b extending along the central axis 305b of the second cylindrical roller body 304b, the shaft 306b being rotatably coupled to the second cylindrical roller body 304b. The shaft 306b may be formed from any suitable material.

[0052] The second roller assembly 302 also includes a bearing assembly 307b. The bearing assembly includes 307b at least one bearing element located within the second cylindrical roller body 304b and facilitating a rotational movement of the second cylindrical roller body 304b around the shaft 306b. In other embodiments, the bearing assembly 307 is positioned to facilitate a rotational movement of the second cylindrical roller body 304b and the shaft 306b around the central axis 305b. The bearing assembly 307 may include a single bearing type, or multiple bearing types, suitable for the purpose, such as ball bearings, roller bearings, needle bearings, tapered roller bearings, spherical roller bearings, thrust bearings, plain bearings, magnetic bearings, or fluid bearings. In other embodiments, there may be no bearing assembly 307 present in the second roller assembly 302.

[0053] The second roller assembly 302 may also include a sealing mechanism provided on the second cylindrical roller body 304b to prevent ingress of contaminants into the bearing assembly 307.

[0054] The second roller assembly 302 may also include a mounting structure configured to attach the second roller assembly 302 to a frame 105, for example, the frame 105 of the coating apparatus 100, the mounting structure provides means for securing the second roller assembly 302 to the frame 105 and to maintain contact with the first roller assembly 301. This contact causing the second cylindrical roller body 304b to rotate about the shaft 306b. The mounting structure may secure the second roller assembly 302 by any suitable attachment means, including bracketry, framing, subframes, fasteners, welding, brazing, adhesives, springs, elastomers, tensioning devices, or any combination thereof.

[0055] The operation of the substrate characterization device illustrated in FIG. 3 may be understood by reference to method 200, illustrated in FIG. 2. Using the example described in FIG. 1 , in operation, the continuous sheet of polymer substrate 150 is unwound from the feed reel 156 in direction shown by arrow 152. The continuous sheet of polymer substrate 150 would pass, and contact, test equipment 101 , such as the substrate characterization device 300 illustrated in FIG. 3.

[0056] At operation 210 of method 200, the continuous sheet of polymer substrate 150 would pass, in the direction shown by arrow 152, over the first roller assembly 301 , and be in contact with at least the outer surface 318a of the first cylindrical roller body 304a.

[0057] The contact area between the polymer substrate 150 and outer surface 318a causing the first cylindrical roller body 304a to rotate about the shaft 306a at a rotational speed approximating the linear speed of the polymer substrate 150 in the direction shown by arrow 152. As the first cylindrical roller body 304a rotates about the shaft 306a, each of the alternating sampling areas 310 and anti-static areas 312 of the outer surface 318a, will successively come into momentary contact with, and separate from, a different portion of the passing polymer substrate 150.

[0058] As the polymer substrate 150 separates and loses contact from each sampling area 310, some amount of charge will accumulate up at the polymer substrate 150 and each sampling area 310 interface due to contact electrification, for example, the triboelectric effect. As the polymer substrate 150 separates and loses contact from each anti-static area 312, little or no charge accumulation from the polymer substrate 150 to each anti-static area 312 will occur. This leaves each anti-static area 312 with no accumulated electric charge due to contact electrification, or measurably less accumulated electric charge as compared to each sampling area 310.

[0059] As the first cylindrical roller body 304a rotates, and after the polymer substrate 150 loses contact with each sampling area 310, each sampling area 310 or anti-static area 312 will successively come into contact with, and separate from the contact element 314. The contact element 314 is positioned to remain in contact with the outer surface 318a of the first cylindrical roller body 304a. To improve measurement quality, the contact element 314 is sized and positioned so that one sampling area 310 of the at least one sampling area is in contact with the contact element 314 at any one time.

[0060] The contact element 314 is also in communication with the at least one measurement equipment 324. The at least one measurement equipment 324 is configured to measure an accumulation of surface charge of a sampling area 310 of the at least one sampling areas.

[0061] At operation 220 of method 200, the at least one measurement equipment 324 measures the accumulated surface charge of the at least one sampling area 310 currently in contact with the contact element 314.

[0062] Based on the results of operation 220 of method 200, to operation 230 of method 200, the at least one measurement equipment 324 characterizes the section of polymer substrate 150 of the sampling area 310 in contact with the contact element 314. Operation 230 of method 200 allows the characterization of the properties of the polymer substrate 150, such as: chemistry, thickness, roughness, moisture content, or combination thereof.

[0063] By characterizing the polymer substrate 150, quality control of the polymer substrate 150 may be determined and action taken. For instance, if the charge (voltage) measurements vary, either in a particular region, or the entirety of the polymer substrate 150, from a configurable threshold value for a particular process, the process may be stopped and the material rejected. The characterization of the polymer substrate additionally allows for batch-to-batch, and manufacturer-to- manufacture, comparison and quality control.

[0064] At operation 240 of method 200, the deionizing assembly 322 is informed of the characterization of the polymer substrate 150. The measurement equipment 324 is in communication with the deionizing assembly 322. For example, the deionizing contact 316 may be in communication with at least one measuring equipment 324, via an internal or external controller, such as controller 160, or any combination thereof. The communication between the measurement equipment 324 and the deionizing assembly 322 allows for an informed deionization of the polymer substrate 150 during operation 250.

[0065] After operation 240 of method 200, the sampling area 310 or anti-static area 312 has passed the contact element 314 for measurement and characterization. The rotation of the first cylindrical roller body 304a continues bringing each sampling area 310 and each anti-static area 312 in succession into contact with the second cylindrical roller body 304b. As discussed above the outer surface 318b of the second cylindrical roller body 304b includes the material 320 and the outer surface 318b. Outer surface 318b is in contact with the deionizing contact 316 which is in communication with the deionizer 326. As each sampling area 310 and each antistatic area 312 successively contacts with the second cylindrical roller body 304b, at operation 250 of method 200, the deionizer 326 reduces any accumulated surface charges thus preparing each sampling area 310 to test a new portion of the polymer substrate 150.

[0066] The operations of method 200 may continue until reaching the end of the continuous roll of polymer substrate 150, or until halted.

[0067] FIG. 4 illustrates a substrate characterization device 400, which test equipment 101 may represent, according to one embodiment of the present disclosure. The substrate characterization device 400 may be utilized in the method 200.

[0068] Substrate characterization device 400 includes a sampling area 402, a measurement assembly 328, and a deionizing assembly 322. In this embodiment, the sampling area 402 takes the form of a rectangular structure formed of a material 404. In other embodiments, the sampling area 402 may take the form of any suitable geometry.

[0069] The sampling area 402 may also include a mounting structure configured to attach the sampling area 402 to a frame 105. The mounting structure provides means for securing the sampling area 402 to the frame 105. The mounting structure may secure the sampling area 402 by any suitable attachment means, including bracketry, framing, subframes, fasteners, welding, brazing, adhesives, springs, elastomers, tensioning devices, or any combination thereof.

[0070] Substrate characterization device 400 includes the measurement assembly 328. The measurement assembly 328 includes the contact element 314 in communication with at least one measuring equipment 324. The contact element 314 is positioned to remain in contact with an outer surface of the sampling area. The contact element 314 may be positioned and remain in contact with the other sample area 402 by any suitable attachment means, including bracketry, frame 105s, fasteners, welding, brazing, adhesives, springs, elastomers, tensioning devices, or any combination thereof. The contact element 314 is in communication with the at least one measuring equipment 324. The at least one measuring equipment 324 may include a voltmeter, potentiostat, static measurement equipment, or other suitable equipment to measure the characteristics of the polymer substrate 150. In other embodiments, the contact element 314 may be in communication with at least one measuring equipment 324, an internal or external controller, or any combination thereof. The contact element 314 may be formed from at least one conductive material.

[0071] Substrate characterization device 400 also includes the deionizing assembly 322 for performing portions of method 200. The deionizing assembly 322 includes a deionizing contact 316, deionizer 326, and a controller 160. A deionizing contact 316 is positioned to remain in contact with the sampling area 402. The deionizing contact 316 is positioned to remain in contact with sampling area 402 by any suitable attachment means, including bracketry, framing, subframes, fasteners, welding, brazing, adhesives, springs, elastomers, tensioning devices, or any combination thereof. The deionizing contact 316 is in communication with the deionizer 326. In other embodiments, the deionizing contact 316 may be in communication with at least one measuring equipment 324, an internal or external controller, such as controller 160, or any combination thereof.

[0072] The operation of the substrate characterization device illustrated in FIG. 4 may be understood by reference to method 200, illustrated in FIG. 2. Using the example described above in FIG. 1 above, in operation, the continuous sheet of polymer substrate 150 is unwound from the feed reel 156 in direction shown by arrow 152. The continuous sheet of polymer substrate 150 would pass, and contact, test equipment 101 , such as the substrate characterization device 400 illustrated in FIG. 4.

[0073] At operation 210 of method 200, the continuous sheet of polymer substrate 150 would pass, moving in direction of arrow 152, and come into contact with sampling area 402 as the polymer substrate 150 separates and loses contact with sampling area 402, some amount of charge will accumulate at the polymer substrate 150 and sampling area 402 interface due to contact electrification for example, the triboelectric effect.

[0074] At operation 220 of method 200, the at least one measurement equipment 324 measures the accumulated surface charge of the sampling area 402.

[0075] At operation 230 of method 200, the at least one measurement equipment 324 characterizes the section of polymer substrate 150 that had previously been in contact with the sampling area 402.

[0076] Operation 230 of method 200 allows the characterization of the properties of the polymer substrate 150, such as: chemistry, thickness, roughness, moisture content, or combination thereof.

[0077] By characterizing the polymer substrate 150, quality control of the polymer substrate 150 may be determined and action taken. For instance, if the charge (voltage) measurements vary, either in a particular region, or the entirety of the polymer substrate 150, from a configurable threshold value for a particular process, the process may be stopped and the material rejected. The characterization of the polymer substrate additionally allows for batch-to-batch, and manufacturer-to- manufacture, comparison and quality control.

[0078] At operation 240 of method 200, the deionizing assembly 322 is informed of the characterization of the polymer substrate 150. The measurement assembly326, particularly the measurement equipment 324, is in communication with the deionizing assembly 322. For example, the deionizing contact 316 may be in communication with at least one measuring equipment 324, via an internal or external controller, such as controller 160, or any combination thereof. The communication between the measurement equipment 324 and the deionizing assembly 322 allows for an informed deionization of the polymer substrate 150 during operation 250.

[0079] At operation 250 of method 200, the controller periodically activates the deionizer 326, performing operation 250 of method 200, and reducing any accumulated surface charges thus preparing sampling area 402 to test a new portion of the polymer substrate 150. The controller activates the deionizer 326 according to a configurable duty cycle. This allows for testing of different portions of the polymer substrate 150 as the polymer substrate 150, moving in the direction of arrow 152, moves through the substrate characterization device 400. The deionizer 326 performs operation 250 according to the characterization data collected at operation 240 of method 200.

[0080] The operations of method 200 may continue until reaching the end of the continuous roll of polymer substrate 150, or until halted.

[0081] While this specification contains many specific embodiment details, these should not be construed as limitations on the scope of what may be claimed, but rather as descriptions of features that may be specific to particular embodiments. Certain features that are described in this specification in the context of separate embodiments may also be implemented, in combination, in a single embodiment. Conversely, various features that are described in the context of a single embodiment may also be implemented in multiple embodiments, separately, or in any suitable subcombination. Moreover, although previously described features may be described as acting in certain combinations and even initially claimed as such, one or more features from a claimed combination may, in some cases, be excised from the combination, and the claimed combination may be directed to a sub-combination or variation of a sub-combination.

[0082] Particular embodiments of the subject matter have been described. Other embodiments, alterations, and permutations of the described embodiments are within the scope of the following claims as will be apparent to those skilled in the art. Whileoperations are depicted in the drawings or claims in a particular order, this should not be understood as requiring that such operations be performed in the particular order shown or in sequential order, or that all illustrated operations be performed (some operations may be considered optional) to achieve desirable results. In certain circumstances, multitasking or parallel processing (or a combination of multitasking and parallel processing) may be advantageous and performed as deemed appropriate.

[0083] Moreover, the separation or integration of various system modules and components in the previously described embodiments should not be understood as requiring such separation or integration in all embodiments. It should be understood that the described program components and systems may generally be integrated together in a single software product or packaged into multiple software products.

[0084] Accordingly, the previously described example embodiments do not define or constrain the present disclosure. Other changes, substitutions, and alterations are also possible without departing from the spirit and scope of the present disclosure.

[0085] While the various steps in an embodiment method or process are presented and described sequentially, one of ordinary skill in the art will appreciate that some or all of the steps may be executed in different order, may be combined or omitted, and some or all of the steps may be executed in parallel. The steps may be performed actively or passively. The method or process may be repeated or expanded to support multiple components or multiple users within a field environment. Accordingly, the scope should not be considered limited to the specific arrangement of steps shown in a flowchart or diagram.

[0086] Unless defined otherwise, all technical and scientific terms used have the same meaning as commonly understood by one of ordinary skill in the art to which these systems, apparatuses, methods, processes and compositions belong.

[0087] In this disclosure, the terms “top”, “bottom”, “side”, “above”, “below”, “up”, “down”, “upward”, “downward”, “horizontal”, “vertical”, and the like do not refer to absolute directions. Instead, these terms refer to directions relative to a nonspecific plane of reference. This non-specific plane of reference may be vertical, horizontal, or other angular orientation.

[0088] The singular forms “a,” “an,” and “the” include plural referents, unless the context clearly dictates otherwise. Within a claim, reference to an element in the singular is not intended to mean “one and only one” unless specifically so stated, but rather “one or more.” Unless specifically stated otherwise, the term “some” refers to one or more.

[0089] Embodiments of the present disclosure may suitably “comprise”, “consist” or “consist essentially of” the limiting features disclosed, and may be practiced in the absence of a limiting feature not disclosed. As used here and in the appended claims, the words “comprise,” “has,” and “include” and all grammatical variations thereof are each intended to have an open, non-limiting meaning that does not exclude additional elements or steps.

[0090] “Optional” and “optionally” means that the subsequently described material, event, or circumstance may or may not be present or occur. The description includes instances where the material, event, or circumstance occurs and instances where it does not occur.

[0091] As used, the term “determining” encompasses a wide variety of actions. For example, “determining” may include calculating, computing, processing, deriving, investigating, looking up, for example, looking up in a table, a database or another data structure, and ascertaining. Also, “determining” may include receiving, for example, receiving information, and accessing, for example, accessing data in a memory. Also, “determining” may include resolving, selecting, choosing, and establishing.

[0092] As used herein, substrate can be considered to include flexible substrates, for example, among other things, films, foils, webs, strips of plastic material, metal, paper, or other materials. Typically, the terms “web,” “foil,” “strip,” “substrate” and the like are used synonymously.

[0093] When the word “approximately” or “about” are used, this term may mean that there may be a variance in value of up to ±10%, of up to 5%, of up to 2%, of up to 1 %, of up to 0.5%, of up to 0.1 %, or up to 0.01 %.

[0094] Ranges may be expressed as from about one particular value to about another particular value, inclusive. When such a range is expressed, it is to be understood that another embodiment is from the one particular value to the other particular value, along with all particular values and combinations thereof within the range.

[0095] As used, terms such as “first” and “second” are arbitrarily assigned and are merely intended to differentiate between two or more components of a system, an apparatus, or a composition. It is to be understood that the words “first” and “second” serve no other purpose and are not part of the name or description of the component, nor do they necessarily define a relative location or position of the component. Furthermore, it is to be understood that that the mere use of the term “first” and “second” does not require that there be any “third” component, although that possibility is envisioned under the scope of the various embodiments described.

[0096] As used herein, “a CPU,” “a processor,” “at least one processor” or “one or more processors” generally refers to a single processor configured to perform one or multiple operations or multiple processors configured to collectively perform one or more operations. In the case of multiple processors, performance the one or more operations could be divided amongst different processors, though one processor may perform multiple operations, and multiple processors could collectively perform a single operation. Similarly, “a memory,” “at least one memory” or “one or more memories” generally refers to a single memory configured to store data and / or instructions, multiple memories configured to collectively store data and / or instructions.

[0097] Although a few example embodiments have been described in detail, those skilled in the art will readily appreciate that many modifications are possible in the example embodiments without materially departing from the disclosed scope as described. Accordingly, all such modifications are intended to be included within the scope of this disclosure as defined in the following claims. In the claims, means-plus- function clauses are intended to cover the structures described as performing the recited function and not only structural equivalents, but also equivalent structures. For example, although a nail and a screw may not be structural equivalents in that a nail employs a cylindrical surface to secure wooden parts together, whereas a screwemploys a helical surface, in the environment of fastening wooden parts, a nail and a screw may be equivalent structures. It is the express intention of the applicant not to invoke 35 U.S.C. § 112(f), for any limitations of any of the claims, except for those in which the claim expressly uses the words ‘means for’ together with an associated function.

[0098] The following claims are not intended to be limited to the embodiments provided but rather are to be accorded the full scope consistent with the language of the claims.

Claims

What is claimed is:1 . A substrate characterization device comprising: a first roller assembly comprising: a first cylindrical roller body having a central axis and a cylindrical surface, wherein the first cylindrical roller body comprises: an outer surface comprising at least two materials, wherein the at least two materials comprise: at least one material comprising an anti-static material forming at least one anti-static area, wherein the at least one anti-static area extends along a first length of the first cylindrical roller body and a first arc length of the first cylindrical roller body; at least one material forming at least one sampling area, wherein the at least one sampling area extends along a second length of the first cylindrical roller body and a second arc length of the first cylindrical roller body; and an alternating and repeating pattern of the at least two materials around at least a portion of a circumference of the first cylindrical roller body, wherein the at least two materials are electrically isolated; a measurement assembly comprising: a contact element, wherein the contact element is positioned to remain in contact with the outer surface of the first cylindrical roller body and no more than one sampling area simultaneously; and at least one measuring equipment, wherein the at least one measuring equipment is in communication with the contact element; and a deionizing assembly, wherein the deionizing assembly is in communication with the measurement assembly and a deionizer.

2. The substrate characterization device of claim 1 , wherein the first roller assembly further comprises a shaft extending along the central axis of the first cylindrical roller body, the shaft being rotatably coupled to the first cylindrical roller body.

3. The substrate characterization device of claim 2, wherein the first roller assembly further comprises a bearing assembly comprising at least one bearing element located within the first cylindrical roller body and facilitating a rotational movement of the first cylindrical roller body around the shaft.

4. The substrate characterization device of claim 3, wherein the first roller assembly further comprises a sealing mechanism provided on the first cylindrical roller body to prevent ingress of contaminants into the bearing assembly.

5. The substrate characterization device of claim 1 , further comprising a mounting structure configured to attach the first cylindrical roller body to a frame.

6. The substrate characterization device of claim 1 , wherein the deionizing assembly further comprises a second roller assembly, the second roller assembly comprising: a second cylindrical roller body having a central axis and a cylindrical surface, wherein the second cylindrical roller body comprises: an outer surface comprising a conductive material positioned to remain in contact with the outer surface of the first cylindrical roller body; and a deionizing contact positioned to remain in contact with the outer surface of the second cylindrical roller body, wherein the deionizing contact is in communication with a deionizer.

7. The substrate characterization device of claim 6, wherein the second roller assembly further comprises a shaft extending along the central axis of the second cylindrical roller body, the shaft being rotatably coupled to the second cylindrical roller body.

8. The substrate characterization device of claim 7, wherein the second roller assembly further comprises a bearing assembly comprising at least one bearing element located within the second cylindrical roller body and facilitating a rotational movement of the second cylindrical roller body around the shaft.

9. The substrate characterization device of claim 8, wherein the second roller assembly further comprises a mounting structure configured to attach the second cylindrical roller body to a frame.

10. The substrate characterization device of claim 9, wherein the second roller assembly further comprises a sealing mechanism provided on the second cylindrical roller body to prevent ingress of contaminants into the bearing assembly.11 . The substrate characterization device of claim 10, wherein the deionizing assembly, further comprises: a deionizing contact positioned to remain in contact with the outer surface of the first cylindrical roller body, and positioned to be out of phase from the contact element such that the deionizing contact and the contact element do not simultaneously contact the same sampling area, and wherein the deionizing contact is in communication with a deionizer.

12. The substrate characterization device of claim 1 , wherein the deionizing assembly is configured to neutralize any accumulation of electric charge.

13. The substrate characterization device of claim 1 , wherein the at least one measuring equipment is configured to measure an accumulation of electric charge of a sampling area of the at least one of sampling area.

14. The substrate characterization device of claim 1 , wherein at least one material of the at least two alternating materials is a conductive material, or a conductive material coated with dielectric material.

15. The substrate characterization device of claim 1 , wherein at least one of the at least two alternating materials is an anti-static material.

16. A roll-to-roll coating system, comprising: a feed reel for supplying a polymer substrate; a take-up reel for collecting the polymer substrate;a coating drum positioned downstream from the feed reel and upstream from the take-up reel; one or more processing chambers for processing the polymer substrate, the one or more processing chambers radially disposed about the coating drum; and the substrate characterization device of any of claims 1 to 15 for characterizing the polymer substrate.

17. A substrate characterization device comprising: a sampling area configured to accumulate electric charge; a measurement assembly comprising: a contact element positioned to remain in contact with an outer surface of the sampling area; and at least one measuring equipment, wherein the at least one measuring equipment is in communication with the contact element; and a deionizing assembly comprising: a deionizing contact positioned to remain in contact with the outer surface of the sampling area, wherein the deionizing contact is in communication with a deionizer.

18. The substrate characterization device of claim 17, further comprising a controller, in communication with the deionizer, to activate the deionizer according to a configurable duty cycle.

19. A method of characterizing a polymer substrate comprising: maneuvering a polymer substrate to a sampling area, wherein at least a portion of the polymer substrate contacts the sampling area; removing the at least a portion of the polymer substrate from the sampling area; measuring a surface charge of the sampling area; characterizing the at least a portion of the polymer substrate; informing a deionizing assembly of the characterization of the polymer substrate; and deionizing the sampling area with the deionizing assembly.

20. The method of claim 19, wherein characterizing the at least a portion of the polymer substrate further comprises: comparing the measured surface charge of the sampling area against a configurable threshold value, wherein the configurable threshold value is based on a chemistry, a thickness, a roughness, a moisture content, or combination thereof, of the polymer substrate.

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