Calibration method and apparatus for surface density measuring instrument, and readable storage medium

Abstract

The present application relates to the technical field of instrument calibration, and provides a calibration method and apparatus for a surface density measuring instrument, and a readable storage medium. The method comprises: acquiring a machine-measured surface density of a sample sheet measured by a surface density measuring instrument; correcting the machine-measured surface density of the sample sheet; and calibrating the surface density measuring instrument on the basis of the corrected machine-measured surface density and an actual surface density of the sample sheet. By correcting the machine-measured surface density of the sample sheet, the calibration method provided by the embodiment of the present application can reduce an error between the machine-measured surface density and the actual surface density of the sample sheet. In this way, when calibrating the surface density measuring instrument on the basis of the actual surface density and the corrected machine-measured surface density of the sample sheet, the accuracy of the calibration result can be improved, and then the measurement error of the surface density measuring instrument during measurement can be reduced.

Description

Calibration method, device and readable storage medium for areal density measuring instrument

[0001] This application claims priority to the Chinese patent application filed with the State Intellectual Property Office on October 27, 2023, with application number 202311407918.3 and application name “Calibration method, device and readable storage medium for areal density meter”, the entire contents of which are incorporated by reference into this application. Technical Field

[0002] The present application relates to the technical field of instrument calibration, and in particular to a calibration method, device and readable storage medium for an areal density measuring instrument. Background Art

[0003] An areal density meter is an instrument used to measure surface density and is widely used in the manufacturing of various products. For example, in battery manufacturing, during the coating process, an areal density meter is required to measure the surface density of the electrode to verify whether the electrode density meets the requirements.

[0004] Generally speaking, before using the areal density meter, it is necessary to calibrate the areal density meter to reduce the measurement error of the areal density meter during the measurement process. Technical issues

[0005] Currently, the error in the calibration process is difficult to accurately control, so the accuracy of the calibration result may be low, which may cause the areal density meter to have a large measurement error during the measurement process. Technical Solutions

[0006] The embodiments of the present application provide a calibration method, device, and readable storage medium for an areal density meter, which can improve the accuracy of the areal density meter during calibration and thereby reduce the large measurement errors of the areal density meter during measurement.

[0007] In a first aspect, a calibration method for an areal density measuring instrument is provided, comprising:

[0008] Obtain the machine-measured areal density of the sample obtained by measuring with an areal density measuring instrument;

[0009] Correcting the machine-measured areal density according to the actual areal density of the sample to reduce the error between the machine-measured areal density and the actual areal density;

[0010] The areal density measuring instrument is calibrated according to the actual areal density and the corrected machine-measured areal density.

[0011] In the embodiments of the present application, during the calibration process of an areal density meter, after obtaining the machine-measured areal density of a sample measured by the areal density meter, the machine-measured areal density of the sample is corrected to reduce the error between the machine-measured areal density and the actual areal density. Thus, when the areal density meter is calibrated based on the actual areal density of the sample and the corrected machine-measured areal density, the accuracy of the calibration results can be improved, thereby reducing the measurement error of the areal density meter during the measurement process.

[0012] In some embodiments, there are multiple sample pieces, and the method of correcting the machine-measured surface density according to the actual surface density of the sample pieces includes:

[0013] A first relationship is obtained by fitting a plurality of first areal density combinations of the sample pieces, wherein the first areal density combination of the sample pieces includes the machine-measured areal density and the actual areal density of the sample pieces;

[0014] The machine-measured surface density is corrected using the first relationship.

[0015] In an embodiment of the present application, in the process of correcting the machine-measured surface density of multiple samples, the machine-measured surface density is corrected by fitting the machine-measured surface density of multiple samples and the actual surface density. Since the first relationship can more accurately characterize the error between the machine-measured surface density measured by the surface density measuring instrument and the actual surface density, the error between the machine-measured surface density and the actual surface density can be reduced more accurately through the first relationship.

[0016] In some embodiments, the correcting the machine-measured surface density using the first relationship includes:

[0017] Re-measuring the sample piece using the areal density measuring instrument to obtain a new machine-measured areal density;

[0018] The new machine-measured surface density is corrected according to the first relationship.

[0019] In an embodiment of the present application, in the process of correcting the machine-measured surface density of multiple samples, the machine-measured surface density of the samples can be remeasured to obtain a new machine-measured surface density. By correcting the new machine-measured surface density, the machine-measured surface density of the samples can be corrected, and a corrected machine-measured surface density with a smaller error can be obtained.

[0020] In some embodiments, the first relationship is a quadratic equation or a linear equation.

[0021] In the embodiment of the present application, since the measurement bias of the areal density meter gradually increases with the increase of the areal density of the object being measured, when the first relationship is a quadratic equation, the quadratic equation can accurately characterize the changing relationship between the actual areal density and the machine-measured areal density. Therefore, when the machine-measured areal density is corrected according to the quadratic equation, the error between the machine-measured areal density and the actual areal density can be more accurately reduced. At the same time, by fitting a linear equation to correct the machine-measured areal density of multiple samples, not only can the error between the machine-measured areal density of the samples and the actual areal density be reduced, but also the amount of calculation in the correction process can be reduced, the correction efficiency can be improved, and thus the calibration efficiency can be improved.

[0022] In some embodiments, the method further includes: calibrating another areal density measuring instrument according to the calibration result of the areal density measuring instrument.

[0023] In the embodiment of the present application, during the calibration of an areal density meter, the machine-measured areal density is corrected during the calibration process, reducing the error between the machine-measured areal density and the actual areal density. Therefore, the final calibration result is relatively accurate, making the calibration result applicable to other areal density meters. Thus, in scenarios where multiple areal density meters need to be calibrated simultaneously, only a small number of areal density meters can be calibrated, and then the calibration results can be used to calibrate the other areal density meters, reducing the workload during the calibration process and thereby improving calibration efficiency.

[0024] In some embodiments, there are multiple samples, and calibrating the areal density measuring instrument according to the actual areal density and the corrected machine-measured areal density includes:

[0025] A second relationship is obtained by fitting the second surface density combination of multiple sample pieces, wherein the second surface density combination of the sample pieces includes the actual surface density of the sample pieces and the corrected machine-measured surface density. The second relationship is used to correct the surface density measured by the surface density measuring instrument in subsequent measurement processes.

[0026] In some embodiments, the second relational expression is a quadratic equation or a linear equation.

[0027] In the embodiments of the present application, since a quadratic equation can accurately characterize the relationship between the areal density of the object being measured and the actual areal density as measured by the areal density meter, when the calibration result is a quadratic equation, the error between the measured areal density and the actual areal density can be more accurately reduced during subsequent measurements of the areal density meter. Furthermore, when the calibration result is a linear equation, not only can the error between the measured areal density and the actual areal density be reduced during subsequent measurements of the areal density meter, but the amount of calculations required during the measurement process can also be reduced, thereby improving measurement efficiency.

[0028] In some embodiments, there are a plurality of the sample pieces, and the actual surface densities of the plurality of the sample pieces are different.

[0029] In an embodiment of the present application, multiple samples with different actual surface densities are selected to calibrate the surface density meter. When the actual surface densities of the multiple samples are different, the errors between the actual surface densities of the multiple samples and the machine-measured surface densities can respectively represent the measurement errors of the surface density meter within different measurement ranges, thereby enabling the surface density meter to be calibrated more accurately.

[0030] In a second aspect, a calibration device for an areal density measuring instrument is provided, comprising:

[0031] An acquisition module is used to obtain the machine-measured areal density of the sample obtained by an areal density measuring instrument;

[0032] a correction module, configured to correct the machine-measured areal density according to the actual areal density of the sample, so as to reduce the error between the machine-measured areal density and the actual areal density;

[0033] A calibration module is used to calibrate the areal density measuring instrument according to the actual areal density and the corrected machine-measured areal density.

[0034] In some embodiments, the correction module is specifically used to fit a first relationship based on a first surface density combination of a plurality of the samples, wherein the first surface density combination of the samples includes the machine-measured surface density and the actual surface density of the samples; and the machine-measured surface density is corrected by using the first relationship.

[0035] In some embodiments, the correction module is specifically configured to remeasure the sample piece using the areal density measuring instrument to obtain a new machine-measured areal density; and correct the new machine-measured areal density according to the first relationship.

[0036] In some embodiments, the first relationship is a quadratic equation or a linear equation.

[0037] In some embodiments, the calibration module is further used to calibrate another areal density measuring instrument according to the calibration result of the areal density measuring instrument.

[0038] In some embodiments, there are multiple samples, and the calibration module is specifically used to fit the second surface density combination of the multiple samples to obtain a second relationship. The second surface density combination of the samples includes the actual surface density of the samples and the corrected machine-measured surface density. The second relationship is used to correct the surface density measured by the surface density meter in subsequent measurement processes.

[0039] In some embodiments, the second relational expression is a quadratic equation or a linear equation.

[0040] In some embodiments, there are a plurality of the sample pieces, and the actual surface densities of the plurality of the sample pieces are different.

[0041] In a third aspect, a readable storage medium is provided, on which a computer program is stored. When the computer program is run on a calibration device of an areal density measuring instrument, the calibration device of the areal density measuring instrument executes the calibration method of the areal density measuring instrument provided in the first aspect.

[0042] In a fourth aspect, a calibration device for an areal density measuring instrument is provided, comprising: a processor; a memory; and a computer program, wherein the computer program is stored in the memory, and when the computer program is executed by the processor, the calibration device for the areal density measuring instrument executes the calibration method for the areal density measuring instrument provided in the first aspect.

[0043] In a fifth aspect, a computer program product is provided, comprising: a computer program code, which, when the computer program code runs on a calibration device of an areal density measuring instrument, enables the calibration device of the areal density measuring instrument to execute the calibration method of the areal density measuring instrument provided in the first aspect.

[0044] In a sixth aspect, a chip is provided, comprising: a processor for calling and running a computer program from a memory, so that a calibration device of an areal density meter equipped with the chip executes the calibration method of the areal density meter provided in the aforementioned first aspect.

[0045] It can be understood that the calibration devices of the surface density measuring instrument provided in the second and fourth aspects, the readable storage medium provided in the third aspect, the computer program product provided in the fifth aspect, and the chip provided in the sixth aspect are all used to execute the calibration method of the surface density measuring instrument provided in the first aspect. Therefore, the beneficial effects that can be achieved can refer to the beneficial effects in the corresponding methods provided above, and will not be repeated here. Beneficial effects

[0046] In the embodiments of the present application, during the calibration process of an areal density meter, after obtaining the machine-measured areal density of a sample measured by the areal density meter, the machine-measured areal density of the sample is corrected to reduce the error between the machine-measured areal density and the actual areal density. Thus, when the areal density meter is calibrated based on the actual areal density of the sample and the corrected machine-measured areal density, the accuracy of the calibration results can be improved, thereby reducing the measurement error of the areal density meter during the measurement process. BRIEF DESCRIPTION OF THE DRAWINGS

[0047] FIG1 shows a schematic diagram of the composition of an areal density measuring instrument provided in an embodiment of the present application.

[0048] FIG2 shows a schematic flow chart of a calibration method for an areal density measuring instrument provided in an embodiment of the present application.

[0049] FIG3 shows a flow chart of another calibration method for an areal density measuring instrument provided in an embodiment of the present application.

[0050] FIG4 is a schematic diagram showing calibration results of different areal density measuring instruments provided in an embodiment of the present application.

[0051] FIG5 is a schematic diagram showing calibration results of different areal density measuring instruments provided in an embodiment of the present application.

[0052] FIG6 shows a schematic structural diagram of a calibration device for an areal density measuring instrument provided in an embodiment of the present application.

[0053] FIG7 shows a structural block diagram of a calibration device for an areal density measuring instrument provided in an embodiment of the present application. Modes for Carrying Out the Invention

[0054] The technical solutions of this application will be described below in conjunction with the accompanying drawings. Obviously, the embodiments described are only part of the embodiments of this application, rather than all the embodiments.

[0055] In the following description, specific details such as specific system structures and techniques are provided for purposes of illustration rather than limitation to facilitate a thorough understanding of the embodiments of the present application. However, it will be apparent to those skilled in the art that the present application may be implemented in other embodiments without these specific details. In other cases, detailed descriptions of well-known systems, devices, circuits, and methods are omitted to avoid obscuring the description of the present application with unnecessary detail.

[0056] The term "comprising" herein indicates the presence of the described features, wholes, steps, operations, elements and / or components, but does not exclude the presence or addition of one or more other features, wholes, steps, operations, elements, components and / or collections thereof. The terms "comprising", "including", "having" and their variations all mean "including but not limited to", unless otherwise specifically emphasized. In the following, the terms "first" and "second" are used for descriptive purposes only and are not to be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, the features defined as "first" and "second" may explicitly or implicitly include one or more of the features. In the description of the embodiments of the present application, unless otherwise stated, "multiple" means two or more.

[0057] The term "and / or" in this document simply describes a relationship between related objects, indicating that three possible relationships exist. For example, "A and / or B" can mean: A exists alone, A and B exist simultaneously, or B exists alone. Additionally, the character " / " in this document generally indicates that the related objects are in an "or" relationship.

[0058] Areal density refers to the mass per unit area of ​​a material and is often closely related to product performance. For example, the areal density of a battery electrode is closely related to the battery's energy density, power density, and charge / discharge rate. Therefore, during the battery manufacturing process, the areal density of the electrode must be strictly controlled.

[0059] An areal density meter, also known as a thickness gauge, is an instrument that can measure the surface density of an object. Currently, the main instruments used are those based on the principle of ray attenuation, such as beta rays (β-rays) and X-rays.

[0060] The measurement principle of an areal density meter is as follows: a transmitter (also called a radiation source) is placed on one side of the object being measured, and a receiver (also called a detector) is placed on the opposite side. The transmitter emits radiation toward the object being measured (such as a pole piece), and the radiation penetrates the object and is received by the receiver. The radiation is reflected and scattered as it penetrates the object, and the object also absorbs some of the radiation's energy. Therefore, the intensity of the radiation when it penetrates the object and is received by the receiver is attenuated relative to the intensity when it was emitted from the transmitter. The attenuation ratio is related to the surface density of the object being measured, so the surface density of the object being measured can be inferred from the radiation intensity before and after penetration.

[0061] During the use of an areal density meter, factors such as the temperature and humidity in its external environment constantly change, and the performance of the transmitter and receiver will slowly drift over time. The external environment, the performance of the transmitter and receiver will all affect the intensity of the radiation, which in turn affects the accuracy of the measurement results. Therefore, before starting to use the areal density meter, it is necessary to calibrate the meter. The calibration results can be used to correct the areal density measured by the meter to reduce the measurement error of the meter during the measurement process. The measurement error is the difference between the areal density of the object being measured as measured by the meter and the actual areal density of the object being measured.

[0062] Taking the areal density meter used in the coating process as an example, one calibration method in the related art first cuts multiple samples (also called standard samples) from qualified electrodes and measures the areal density of each sample using electronic weighing (or other methods). This is usually called the actual areal density of the sample. Then, the areal density of the multiple samples is measured using an areal density meter, which is usually called the machine-measured areal density of the sample.

[0063] Afterwards, the machine-measured area density of multiple samples is used as the independent variable and the actual area density of multiple samples is used as the dependent variable. The machine-measured area density and the actual area density of multiple samples are linearly fitted to obtain a linear relationship between the machine-measured area density and the actual area density (i.e., the calibration result), and the linear relationship is stored in the area density measuring instrument to complete the calibration of the area density measuring instrument.

[0064] In the process of formally using the surface density meter to measure the surface density of the electrode, after measuring the surface density of the electrode, the surface density meter substitutes the measured surface density as the independent variable into the linear relationship, determines the corresponding dependent variable through the linear relationship, and uses the dependent variable as the actual surface density of the electrode. The measured surface density can be corrected by the linear relationship to obtain the actual surface density, so as to reduce the measurement error in the measurement process.

[0065] It can be seen that the purpose of calibrating an areal density meter is to reduce the measurement error during the measurement process. However, if there are large errors in the calibration process, the calibration results may be inaccurate. For example, inaccurate calibration results may result in large deviations between the parameters in the linear relationship. If the calibration results are inaccurate, correcting the measured areal density based on the calibration results may not only fail to reduce the measurement error, but may even increase the measurement error.

[0066] Among them, the error in the calibration process mainly comes from the machine-measured areal density of the sample. Since the areal density meter before calibration usually has a large measurement error, there is a high probability that there will be a large error between the machine-measured areal density of the sample measured by the areal density meter and the actual areal density. Therefore, when calibrating the machine-measured areal density and the actual areal density of multiple samples, the large error between the machine-measured areal density and the actual areal density may make the calibration result less accurate, which in turn may cause the areal density meter to have a large measurement error during the actual measurement process.

[0067] To address the above technical issues, embodiments of the present application provide a method for calibrating an areal density meter. During the calibration process, after obtaining the machine-measured areal density of a sample obtained by the areal density meter, the machine-measured areal density of the sample is corrected to reduce the error between the machine-measured areal density and the actual areal density. Thus, when the areal density meter is calibrated based on the actual areal density of the sample and the corrected machine-measured areal density, the accuracy of the calibration results can be improved, thereby reducing the measurement error of the areal density meter during the measurement process.

[0068] The following briefly introduces the application scenarios of the calibration method of the areal density measuring instrument provided in the embodiments of the present application with reference to the accompanying drawings.

[0069] Referring to Figure 1 , a schematic diagram of the composition of an areal density meter 10 provided in an embodiment of the present application is shown. As shown in Figure 1 , the areal density meter 10 mainly includes a transmitter 11, a receiver 12, and a control device 13, and the transmitter 11 and the receiver 12 are respectively connected to the control device 13.

[0070] The transmitter 11 and receiver 12 are typically located on either side of a test station 14, which is used to place the object to be tested (e.g., a pole piece and a sample). The transmitter 11 is used to emit radiation toward the object to be tested. Simultaneously, the transmitter 11 can send the initial intensity value of the radiation emitted from the transmitter (which can be referred to as a first intensity) to the control device 13. After the radiation penetrates the object to be tested placed on the test station 14, it is received by the receiver 12. The receiver 12 can detect the intensity value of the received radiation (which can be referred to as a second intensity) and send the second intensity value to the control device 13.

[0071] The control device 13 can be a computing device such as a host computer, a slave computer, a computer, and an industrial computer, but is not limited thereto. The control device 13 can control the transmitter 11 and the receiver 12 to start or stop running, and receive the first intensity and the second intensity, and infer the surface density of the object under test based on the first intensity and the second intensity. The surface density is calculated as follows: m = (1 / μ) ln (I1 / I2) (1);

[0072] Wherein, I1 is the first intensity, I2 is the second intensity, μ is the absorption coefficient of the object being measured, and m is the mass per unit area of ​​the object being measured, i.e., the surface density.

[0073] In some embodiments, the calibration method of the areal density measuring instrument provided in the embodiments of the present application can be performed by the control device 13. During the calibration process, a sample can be placed on the detection station 14, and the control device 13 can control the transmitter 11 and the receiver 12 to start running, obtain the first intensity and the second intensity, and then calculate the areal density of the sample using formula (1). At the same time, the staff can measure the actual areal density of the sample in advance through electronic weighing or other methods, and upload the actual areal density of the sample to the control device 13.

[0074] After obtaining the machine-measured areal density and the actual areal density of the sample, the control device 13 can correct the machine-measured areal density to obtain the corrected machine-measured areal density. Then, the control device 13 can calibrate the areal density meter based on the actual areal density of the sample and the corrected machine-measured areal density.

[0075] In other embodiments, the calibration method of the areal density measuring instrument provided in the embodiment of the present application may also be performed by other devices other than the control device 13. During the execution of the calibration method provided in the embodiment of the present application, the other devices may obtain the machine-measured areal density of the sample from the control device 13, as well as the actual areal density of the sample uploaded by the staff, and then correct the machine-measured areal density of the sample. Thereafter, the areal density measuring instrument may be calibrated based on the actual areal density of the sample and the corrected machine-measured areal density, and the calibration results may be uploaded to the control device 13.

[0076] The above are merely illustrative examples. It should be understood that application scenarios of the calibration method may include but are not limited to the above examples.

[0077] The following is a detailed introduction to the calibration method of the areal density measuring instrument provided in the embodiment of the present application with reference to the accompanying drawings.

[0078] Referring to FIG. 2 , FIG. 2 shows a schematic flow chart of a calibration method 100 for an areal density meter provided in an embodiment of the present application. The method may be performed by the control device 13 shown in FIG. 1 , or by another device other than the control device. As shown in FIG. 2 , the method includes steps 110 to 130. Taking the control device as an example, steps 110 to 130 are specifically as follows:

[0079] Step 110: Obtain the machine-measured areal density of the sample obtained by measuring it with an areal density measuring instrument.

[0080] Step 120: Correct the machine-measured surface density according to the actual surface density of the sample to reduce the error between the machine-measured surface density and the actual surface density.

[0081] The machine-measured areal density is the uncorrected areal density obtained by an areal density meter, while the actual areal density is the areal density of a sample measured using methods other than the areal density meter (e.g., electronic weighing). It should be understood that compared to pre-calibrated areal density meters, these other methods offer higher accuracy, resulting in a smaller error between the measured and actual areal density of a sample.

[0082] In this embodiment, the purpose of correcting the machine-measured surface density is to reduce the error between the machine-measured surface density and the actual surface density of the sample. Therefore, the error between the corrected machine-measured surface density and the actual surface density is smaller than the error between the machine-measured surface density and the actual surface density before correction.

[0083] In some embodiments, the number of samples used in the calibration process may be multiple, for example, 5 or 6. During the calibration process, the control device may control the surface density measuring instrument to sequentially transfer multiple samples to the detection station. For each sample, after transferring the sample to the detection station, the control device may obtain the first intensity and the second intensity of the ray, and calculate and determine the surface density of the sample using the above formula (1), which is the machine-measured surface density of the sample. At the same time, when there are multiple samples, the actual surface density of the multiple samples may be measured by the staff through electronic weighing and then uploaded to the control device and marked. The control device may determine the actual surface density of each sample through the marking.

[0084] Similarly, when only one sample is used in the calibration process, the control device can also obtain the machine-measured areal density and actual areal density of the sample through the above method.

[0085] It should be noted that, in the process of obtaining the machine-measured areal density of each sample by measurement, the control device directly uses the measured areal density as the machine-measured areal density of the sample after measuring the areal density of the sample. Similarly, when other devices execute the calibration method provided in the embodiments of the present application, the control device does not correct the measured areal density of the sample, but directly uses the measured areal density as the machine-measured areal density of the sample, and sends the machine-measured areal density of the sample to the other devices.

[0086] For example, when there are multiple samples, the control device may correct the machine-measured areal density of one or more of the multiple samples based on the average error of the multiple samples. For example, after obtaining the actual areal density and the machine-measured areal density of the multiple samples, the control device may first calculate the error between the actual areal density and the machine-measured areal density of each sample to obtain multiple errors, and then calculate the average of the multiple errors to obtain the average error.

[0087] Then, for each sample, if the difference between the error between the machine-measured areal density and the actual areal density of the sample and the average error is greater than a preset difference, if the machine-measured areal density is less than the actual areal density, the average error is subtracted from the actual areal density, and the difference obtained by subtraction is used as the corrected machine-measured areal density of the sample. Similarly, if the difference between the error between the machine-measured areal density and the actual areal density of the sample and the average error is greater than a preset difference, if the machine-measured areal density is greater than the actual areal density, the actual areal density and the average error are summed, and the summed result is used as the corrected machine-measured areal density of the sample.

[0088] In practical applications, when the difference between the error between the machine-measured areal density of a sample and the actual areal density and the average error is greater than a preset difference, it indicates that the error between the machine-measured areal density of the sample and the actual areal density is large. When correcting the machine-measured areal density of one or more samples based on the average error of multiple samples, the machine-measured areal density with a large error can be corrected to reduce the error between the machine-measured areal density and the actual areal density.

[0089] Exemplarily, when there are one or more samples, the control device can correct the machine-measured areal density of the sample according to a preset error threshold. For example, after obtaining the machine-measured areal density of the sample, the error between the machine-measured areal density of the sample and the actual areal density can be calculated. If the error is greater than the error threshold, if the machine-measured areal density of the sample is greater than the actual areal density, the actual areal density and the error threshold are summed, and the sum is used as the corrected machine-measured areal density of the sample; if the machine-measured areal density of the sample is less than the actual areal density, the error threshold is subtracted from the actual areal density, and the result is used as the corrected machine-measured areal density of the sample.

[0090] In practical applications, the measurement error of an areal density meter is typically within a certain range. When the error exceeds a threshold, the measured areal density obtained by the densitometry instrument is considered to deviate significantly from the actual areal density. By correcting the sample's measured areal density based on a preset threshold, the error can be corrected for any areas with significant errors, reducing the error between the measured and actual areal density.

[0091] The above are merely illustrative examples, and methods for correcting the machine-measured surface density of a sample may include but are not limited to the above examples.

[0092] Step 130: calibrate the areal density measuring instrument according to the actual areal density and the corrected machine-measured areal density.

[0093] For example, during the calibration of the areal density meter, the relationship between the measured areal density of the object measured by the areal density meter and the actual areal density of the object can be preset as a linear relationship. The linear relationship is as follows:

[0094] y=ax (2);

[0095] Among them, the independent variable x in the linear relationship (2) is the machine-measured surface density of the object being measured obtained by the surface density meter, the dependent variable y is the actual surface density of the object being measured, and a is the linear term coefficient in the linear relationship (2).

[0096] In some embodiments, when the relationship between the surface density of the object to be measured and the actual surface density of the object to be measured is pre-set as the linear relationship (2), the control device can only obtain the machine-measured surface density of one sample during the calibration process, and correct the machine-measured surface density according to the actual surface density of the sample to obtain the corrected machine-measured surface density. Afterwards, the control device can substitute the actual surface density and the corrected machine-measured surface density into the linear relationship (2) to determine the coefficient of the first-order term in the linear relationship, thereby obtaining a complete linear relationship, thereby completing the calibration of the density meter.

[0097] After the areal density meter is calibrated, the linear relationship is stored in the control device. During the formal measurement process using the areal density meter, the control device calculates the areal density of the object being measured using formula (1) each time and substitutes the calculated areal density as the dependent variable into the linear relationship (2) to obtain the corresponding dependent variable, which is the actual areal density of the object being measured.

[0098] In this embodiment, when there are multiple samples, the control device corrects the machine-measured areal density of each sample to obtain the corrected machine-measured areal densities of the multiple samples. The control device then calibrates the areal density meter based on the actual areal densities of the multiple samples and the corrected machine-measured areal densities to obtain calibration results. It should be understood that the number of samples can be one or more, and the number of samples used in the calibration process can be specifically set based on the desired calibration results.

[0099] In the embodiment of the present application, during the calibration process of the areal density meter, the machine-measured areal density of the sample measured by the areal density meter is first obtained, and the machine-measured areal density of the sample is corrected. Then, the areal density meter is calibrated based on the corrected machine-measured areal density and the actual areal density of the sample. By correcting the machine-measured areal density of the sample, the error between the machine-measured areal density of the sample and the actual areal density can be reduced. In this way, when the areal density meter is calibrated based on the actual areal density of the sample and the corrected machine-measured areal density, the accuracy of the calibration result can be improved, thereby reducing the measurement error of the areal density meter during the measurement process.

[0100] For example, when calibrating an areal density meter based on the actual areal density of a sample and the corrected machine-measured areal density, the linear term coefficient in the resulting linear relationship is more accurate because the error between the corrected machine-measured areal density and the actual areal density is lower. This improves the accuracy of the corrected actual areal density when the areal density measured by the areal density meter is corrected based on the linear relationship.

[0101] For example, Table 1 shows the actual areal density and machine-measured areal density of samples 1 to 6 used in the calibration process of one of the areal density measuring instruments, as well as the first corrected areal density and the second corrected areal density of samples 1 to 6. The units of the actual areal density, the machine-measured areal density, the first corrected areal density, and the second corrected areal density are all in milligrams (mg). The first corrected areal density is obtained by re-measuring the areal density of samples 1 to 6 after the calibration result is obtained by calibrating the areal density measuring instrument using the calibration method in the relevant technology, and correcting the measured areal density by the calibration result during the measurement process. The second corrected areal density is obtained by re-measuring the areal density of samples 1 to 6 after the calibration result is obtained by calibrating the areal density measuring instrument using the calibration method provided in the embodiment of the present application, and correcting the measured areal density by the calibration result during the measurement process.

[0102] Table 1

[0103] As shown in Table 1, for each sample, there is a large error between the actual surface density of the sample and the machine-measured surface density. After the surface density meter is calibrated by the calibration method in the relevant technology, the error between the first corrected surface density of the sample measured by the surface density meter and the actual surface density is reduced. Similarly, after the surface density meter is calibrated by the calibration method provided in the embodiment of the present application, the error between the second corrected surface density of the sample measured by the surface density meter and the actual surface density is also reduced. In comparison, the second corrected surface density is closer to the actual surface density of the sample than the first corrected surface density. It can be seen that the calibration method provided in the embodiment of the present application can reduce the measurement error of the surface density meter during the measurement process compared to the calibration method in the relevant technology.

[0104] Referring to FIG3 , FIG3 shows a schematic flow chart of another method 200 for calibrating an areal density meter provided in an embodiment of the present application. The method may be performed by the control device 13 shown in FIG1 , or by another device other than the control device. As shown in FIG3 , the method includes steps 210 to 240. Taking the control device as an example, steps 210 to 240 are specifically as follows:

[0105] Step 210: Obtain the machine-measured areal densities of the plurality of samples measured by an areal density measuring instrument.

[0106] In some embodiments, when the calibration process requires the machine-measured areal density and actual areal density of multiple samples, the machine-measured areal density of the multiple samples measured by the areal density meter can be directly obtained during the process of obtaining the machine-measured areal density. The method for obtaining the machine-measured areal density of multiple samples can be referred to the above example and will not be further described in this embodiment.

[0107] In some embodiments, when there are multiple sample pieces, the actual surface densities of the multiple sample pieces are different. Taking a pole piece as an example, when cutting multiple sample pieces from a pole piece, the staff can cut multiple sample pieces from pole pieces of different surface densities to obtain multiple sample pieces, so that the actual surface densities of the multiple sample pieces are different.

[0108] In some embodiments, the actual surface density of the multiple samples can be distributed in a gradient. For example, when cutting and obtaining multiple samples, a worker can select multiple pole pieces with increasing surface density and cut a sample from each pole piece, so that the surface density of the multiple samples is distributed in a gradient from small to large.

[0109] In an embodiment of the present application, multiple samples with different actual surface densities are selected to calibrate the surface density meter. When the actual surface densities of the multiple samples are different, the errors between the actual surface densities of the multiple samples and the machine-measured surface densities can respectively represent the measurement errors of the surface density meter within different measurement ranges, thereby enabling the surface density meter to be calibrated more accurately.

[0110] Step 220: Obtain a first relationship by combining and fitting the first surface densities of the plurality of samples.

[0111] Step 230: Correct the machine-measured surface density using the first relationship.

[0112] The first areal density combination of the sample includes the machine-measured areal density and the actual areal density of the sample. For example, when obtaining the machine-measured areal density of multiple samples, the control device can mark the machine-measured areal density of each sample, and the mark of the machine-measured areal density of the same sample corresponds to the mark of the actual areal density. After receiving the actual areal densities of multiple samples uploaded by the staff, the control device can determine the actual areal density of each sample from the multiple actual areal densities based on the marks of the actual areal densities of the multiple samples, and the machine-measured areal density and the actual areal density of each sample are combined into a first areal density combination.

[0113] In some embodiments, when there are multiple samples, during the process of correcting the machine-measured areal density of the sample, the machine-measured areal density of the multiple samples and the actual areal density can be fitted using the least squares method to obtain a first relationship, and then the machine-measured areal density of each sample is corrected based on the first relationship. It should be understood that during the process of fitting the machine-measured areal density of the multiple samples and the actual areal density, other methods (such as polynomial fitting) can also be used to fit the machine-measured areal density of the multiple samples and the actual areal density, and the fitting methods may include but are not limited to the above examples.

[0114] For example, the first relational expression may be a quadratic equation, and the first relational expression may be preset as follows: y=ax 2 +bx+c (2);

[0115] Among them, the independent variable x in the first relationship (2) is the machine-measured surface density, the dependent variable y is the actual surface density, a is the coefficient of the quadratic term in the first relationship, b is the coefficient of the linear term in the first relationship, and c is the constant term.

[0116] After obtaining the machine-measured surface density and actual surface density of multiple samples, the control device performs curve fitting on the machine-measured surface density and actual surface density of multiple samples for each sample, using the machine-measured surface density as the independent variable and the actual surface density as the corresponding dependent variable through the least squares method. The various parameters such as the degree of the linear term, the coefficient of the quadratic term and the constant term in the first relationship can be determined, thereby obtaining a complete first relationship.

[0117] After obtaining the complete first relationship, for each sample, the control device can substitute the machine-measured area density of the sample as an independent variable into the first relationship to obtain the corresponding dependent variable, which is the corrected machine-measured area density.

[0118] In some embodiments, the first relational expression may also be a linear equation of one variable, and the first relational expression may be preset as follows: y=ax+b (3);

[0119] Among them, the independent variable x in the first relationship (3) is the machine-measured surface density, the dependent variable y is the actual surface density, a is the coefficient of the first-order term in the first relationship, and b is the constant term in the first relationship.

[0120] After obtaining the machine-measured surface density and actual surface density of multiple samples, the control device performs linear regression fitting on the machine-measured surface density and actual surface density of multiple samples for each sample with the machine-measured surface density as the independent variable and the actual surface density as the corresponding dependent variable through the least squares method. The degree of the first-order term and the constant term in the first relationship can be determined, thereby obtaining the complete first relationship.

[0121] It should be noted that the first relationship may include but is not limited to the linear equation or quadratic equation in the above examples.

[0122] In an embodiment of the present application, in the process of correcting the machine-measured surface density of multiple samples, the machine-measured surface density is corrected by fitting the machine-measured surface density of multiple samples and the actual surface density. Since the first relationship can more accurately characterize the error between the machine-measured surface density measured by the surface density measuring instrument and the actual surface density, the error between the machine-measured surface density and the actual surface density can be reduced more accurately through the first relationship.

[0123] At the same time, since the measurement bias of the surface density meter gradually increases with the increase of the surface density of the object being measured, when the first relationship is a quadratic equation, the quadratic equation can accurately characterize the changing relationship between the actual surface density and the machine-measured surface density. Therefore, when the machine-measured surface density is corrected according to the quadratic equation, the error between the machine-measured surface density and the actual surface density can be reduced more accurately.

[0124] In the embodiment of the present application, the machine-measured surface density of multiple samples is corrected by fitting a linear equation, which not only reduces the error between the machine-measured surface density of the samples and the actual surface density, but also reduces the amount of calculation in the correction process, improves the correction efficiency, and thus improves the calibration efficiency.

[0125] In some embodiments, during the process of correcting the machine-measured areal density using the first relationship, the sample may be remeasured using an areal density meter to obtain a new machine-measured areal density, and then the new machine-measured areal density may be corrected according to the first relationship. The new machine-measured areal density is the uncorrected areal density obtained by re-measuring the areal density meter during the correction process.

[0126] For example, after fitting the first relationship equation based on the machine-measured areal density and the actual areal density of multiple sample pieces, the control device may measure each sample piece again to obtain a new machine-measured areal density for each sample piece. The control device may then input the measured new machine-measured areal density as an independent variable into the first relationship equation to obtain the corresponding dependent variable, i.e., the revised machine-measured areal density.

[0127] In an embodiment of the present application, in the process of correcting the machine-measured surface density of multiple samples, the machine-measured surface density of the samples can be remeasured to obtain a new machine-measured surface density. By correcting the new machine-measured surface density to achieve correction of the machine-measured surface density, a corrected machine-measured surface density with a smaller error can be obtained.

[0128] Step 240: Obtain a second relationship by combining and fitting the second surface densities of the plurality of samples.

[0129] The second relationship, which is the calibration result, is used to correct the areal density measured by the density meter during subsequent measurements. The second areal density combination of the sample includes the sample's actual areal density and the corrected machine-measured areal density. For example, when there are multiple samples, the control device corrects the machine-measured areal density of each sample using the first relationship to obtain a corrected machine-measured areal density. This second areal density combination can then be obtained, consisting of the sample's actual areal density and the corrected machine-measured areal density.

[0130] In some embodiments, when there are multiple samples, during the calibration of the area density meter, the control device can use the corrected machine-measured area density of each sample as the independent variable and the actual area density of the sample as the dependent variable, and perform linear fitting based on the corrected machine-measured area density and actual area density of multiple samples to determine a second relationship, which is a linear equation.

[0131] In other embodiments, when there are multiple samples, during the calibration of the area density meter, the control device can use the corrected machine-measured area density of each sample as the independent variable and the actual area density of the sample as the dependent variable, and perform curve fitting based on the corrected machine-measured area density and actual area density of multiple samples to determine a second relationship, which is a quadratic equation.

[0132] Among them, the method for determining the second relationship by fitting the corrected machine-measured surface density and the actual surface density of multiple samples can refer to the determination process of the first relationship, and this embodiment will not be described in detail here.

[0133] It should be noted that the method of calibrating the areal density meter using the actual areal density of multiple samples and the corrected machine-measured areal density may include but is not limited to the above examples, and the second relationship may include but is not limited to the linear equation or quadratic equation in the above examples.

[0134] In the embodiment of the present application, since a quadratic equation can accurately characterize the relationship between the surface density of the object being measured by the surface density meter and the actual surface density, when the calibration result is a quadratic equation, the error between the measured surface density and the actual surface density can be more accurately reduced in the subsequent measurement process of the surface density meter.

[0135] In the embodiment of the present application, when the calibration result is a linear equation, in the subsequent measurement process of the surface density meter, not only can the error between the measured surface density and the actual surface density be reduced, but also the amount of calculation in the measurement process can be reduced, thereby improving the measurement efficiency.

[0136] In some embodiments, the method may further include:

[0137] Another areal density measuring instrument is calibrated according to the calibration result of the areal density measuring instrument.

[0138] In some embodiments, after calibrating an areal density meter, another areal density meter can be calibrated using the calibration results. For example, after calibrating one areal density meter to obtain the aforementioned second relationship, the second relationship can be uploaded to the other areal density meter to complete the calibration of the other areal density meter.

[0139] In some cases, it is necessary to calibrate multiple areal density meters of the same model at the same time. For example, in the battery manufacturing process, it is usually necessary to start multiple production lines at the same time to manufacture pole pieces, and each production line needs to be equipped with an areal density meter. Before starting the production of pole pieces, multiple areal density meters need to be calibrated. However, due to the low accuracy of the calibration method in the relevant technology, the calibration result of one areal density meter cannot be applied to other areal density meters, resulting in the need to calibrate each areal density meter separately, which in turn leads to a relatively large workload and a long time consumption in the calibration process.

[0140] For example, Table 2 shows the actual areal densities of multiple samples used in the calibration process of three areal density measuring instruments, and the machine-measured areal densities of multiple samples measured by each areal density measuring instrument.

[0141] Table 2

[0142] Among them, the 1# machine-measured areal density is the machine-measured areal density of samples 1 to 6 measured by the first areal density measuring instrument, the 2# machine-measured areal density is the machine-measured areal density of samples 1 to 6 measured by the second areal density measuring instrument, and the 3# machine-measured areal density is the machine-measured areal density of samples 1 to 6 measured by the third areal density measuring instrument. As can be seen from Table 2, for the same sample, different areal density measuring instruments measured different machine-measured areal densities of the electrode during the calibration process.

[0143] Referring to Figure 4 , a schematic diagram illustrating calibration results for different areal density meters provided in embodiments of the present application is shown. As shown in Figure 4 , curves 41, 42, and 43 are the calibration results obtained by calibrating the three areal density meters shown in Table 2 using calibration methods known in the related art. Each calibration result is a quadratic equation.

[0144] As shown in Figure 4, as the areal density of the sample increases, the differences in the calibration results of the three areal density meters increase. This also shows that even when calibrating using the same set of samples, the calibration results of different areal density meters can vary, so the calibration results of one areal density meter cannot be applied to other areal density meters. When calibrating three areal density meters, each needs to be calibrated separately, which is a large workload.

[0145] Referring to Figure 5, Figure 5 shows a schematic diagram illustrating calibration results for different areal density meters provided in accordance with embodiments of the present application. As shown in Figure 5, curve 51 is the calibration result obtained by calibrating the three areal density meters shown in Table 2 using the calibration method provided in accordance with embodiments of the present application. The calibration result is a quadratic equation.

[0146] As shown in Figure 5, the calibration method provided in this embodiment of the present application, by correcting the machine-measured areal densities of multiple samples before calibration, can ensure that the calibration results of the three areal densitometers are nearly identical. This allows for calibration of three areal densitometers to be performed on only one, with the calibration result then directly uploaded to the other two. This significantly reduces the workload compared to calibration methods in related arts.

[0147] In the embodiment of the present application, during the calibration of an areal density meter, the machine-measured areal density is corrected during the calibration process, reducing the error between the machine-measured areal density and the actual areal density. Therefore, the final calibration result is relatively accurate, making the calibration result applicable to other areal density meters. Thus, in scenarios where multiple areal density meters need to be calibrated simultaneously, only a small number of areal density meters can be calibrated, and then the calibration results can be used to calibrate the other areal density meters, reducing the workload during the calibration process and thereby improving calibration efficiency.

[0148] Taking an areal density meter for measuring the areal density of a pole piece as an example, when calibrating M areal density meters using a calibration method known in the related art, each meter needs to be calibrated separately, and if an error occurs during a calibration, recalibration is required. Therefore, the number of calibrations required is no less than M. However, when calibrating M areal density meters using the calibration method provided in the embodiments of the present application, only one or a small number of the meters needs to be calibrated, so the number of calibrations required can be significantly less than M.

[0149] The calibration method for the areal density meter provided in accordance with the present invention is described in detail above with reference to Figures 1 to 5 . The calibration device for the areal density meter provided in accordance with the present invention is described below with reference to Figures 6 and 7 . It should be understood that the control devices shown in Figures 6 and 7 are capable of implementing one or more steps in the method flow shown in Figures 2 or 3 . To avoid repetition, detailed description is omitted here.

[0150] 6 , which shows a schematic structural diagram of a calibration device for an areal density meter according to an embodiment of the present application. As shown in FIG6 , the detection device 60 includes an acquisition module 61 , a correction module 62 , and a calibration module 63 .

[0151] An acquisition module 61 is used to obtain the machine-measured areal density of the sample obtained by an areal density measuring instrument;

[0152] Correction module 62, for correcting the machine-measured areal density according to the actual areal density of the sample, so as to reduce the error between the machine-measured areal density and the actual areal density;

[0153] The calibration module 63 is used to calibrate the areal density measuring instrument according to the actual areal density and the corrected machine-measured areal density.

[0154] In some embodiments, the correction module 62 is specifically used to fit a first relationship based on a first surface density combination of multiple samples, where the first surface density combination of the samples includes the machine-measured surface density and the actual surface density of the samples; and the machine-measured surface density is corrected using the first relationship.

[0155] In some embodiments, the correction module 62 is specifically configured to remeasure the sample piece using an areal density meter to obtain a new machine-measured areal density; and correct the new machine-measured areal density according to the first relationship.

[0156] In some embodiments, the first relational expression is a quadratic equation or a linear equation.

[0157] In some embodiments, the calibration module 63 is further configured to calibrate another areal density measuring instrument according to the calibration result of the areal density measuring instrument.

[0158] In some embodiments, there are multiple samples, and the calibration module 63 is specifically used to fit the second surface density combination of the multiple samples to obtain a second relationship. The second surface density combination of the samples includes the actual surface density of the samples and the corrected machine-measured surface density. The second relationship is used to correct the surface density measured by the surface density meter in the subsequent measurement process.

[0159] In some embodiments, the second relational expression is a quadratic equation or a linear equation.

[0160] In some embodiments, there are multiple samples, and the actual surface densities of the multiple samples are different.

[0161] Figure 7 shows a block diagram of a calibration device for an areal density meter according to an embodiment of the present invention. As shown in Figure 7 , the calibration device 70 for an areal density meter includes a processor 71 and a memory 72 , and the aforementioned components may be connected via one or more buses 74 .

[0162] The calibration device 70 for the areal density meter also includes a computer program 73, which is stored in a memory 72. When the computer program 73 is executed by the processor 71, the calibration device 70 for the areal density meter performs the method shown in Figures 2 and 3. All relevant content of each step involved in the above method embodiment can be referenced in the functional description of the corresponding physical device and will not be repeated here.

[0163] An embodiment of the present application further provides a readable storage medium, which includes a computer program. When the computer program is run on a computer, the computer executes the method provided in the above method embodiment.

[0164] An embodiment of the present application further provides a computer program product comprising instructions, which, when executed on a computer, enables the computer to execute the method provided in the above method embodiment.

[0165] An embodiment of the present application also provides a chip system, including a memory and a processor, wherein the memory is used to store a computer program, and the processor is used to call and run the computer program from the memory, so that the calibration device of the surface density measuring instrument equipped with the chip system executes the method provided in the above method embodiment.

[0166] Among them, the chip system may include an input circuit or interface for sending information or data, and an output circuit or interface for receiving information or data.

[0167] It should be understood that in the embodiments of the present application, the processor may be a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field programmable gate arrays (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. A general-purpose processor may be a microprocessor or any conventional processor.

[0168] It should also be understood that the memory in the embodiments of the present application may be a volatile memory or a non-volatile memory, or may include both volatile and non-volatile memories. Among them, the non-volatile memory may be a read-only memory (ROM), a programmable read-only memory (PROM), an erasable programmable read-only memory (EPROM), an electrically erasable programmable read-only memory (EEPROM), or a flash memory. The volatile memory may be a random access memory (RAM), which is used as an external cache. By way of example and not limitation, many forms of random access memory (RAM) are available, such as static RAM (SRAM), dynamic random access memory (DRAM), synchronous DRAM (SDRAM), double data rate synchronous dynamic random access memory (DDR SDRAM), enhanced synchronous dynamic random access memory (ESDRAM), synchronous link DRAM (SLDRAM), and direct rambus RAM (DR RAM).

[0169] Those skilled in the art will appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.

[0170] Those skilled in the art will clearly understand that, for the convenience and brevity of description, the specific working processes of the systems, devices and units described above can refer to the corresponding processes in the aforementioned method embodiments and will not be repeated here.

[0171] In the several embodiments provided in this application, it should be understood that the disclosed systems, devices and methods can be implemented in other ways. For example, the device embodiments described above are merely schematic. For example, the division of the units is merely a logical function division. In actual implementation, there may be other division methods, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, indirect coupling or communication connection of devices or units, which can be electrical, mechanical or other forms.

[0172] The units described as separate components may or may not be physically separate, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed across multiple network units. Some or all of these units may be selected to achieve the purpose of this embodiment according to actual needs.

[0173] In addition, each functional unit in each embodiment of the present application may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit.

[0174] If the functions are implemented in the form of software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present application, or the part that contributes to the prior art, or the part of the technical solution, can be embodied in the form of a software product. The computer software product is stored in a storage medium and includes several instructions for enabling a computer device (which can be a personal computer, a server, or a network device, etc.) to execute all or part of the steps of the method described in each embodiment of the present application. The aforementioned storage medium includes various media that can store program codes, such as a USB flash drive, a mobile hard disk, a read-only memory (ROM), a random access memory (RAM), a magnetic disk, or an optical disk.

[0175] The above description is merely a specific embodiment of the present application, but the scope of protection of the present application is not limited thereto. Any changes or substitutions that can be easily conceived by a person skilled in the art within the technical scope disclosed in this application should be included in the scope of protection of this application. Therefore, the scope of protection of this application should be based on the scope of protection of the claims.

Claims

1. A method for calibrating an areal density measuring instrument, wherein: The method comprises: Obtain the machine-measured surface density of the sample by measuring with an surface density measuring instrument; Correcting the machine-measured surface density according to the actual surface density of the sample to reduce the error between the machine-measured surface density and the actual surface density; The surface density measuring instrument is calibrated according to the actual surface density and the corrected machine-measured surface density.

2. The method of claim 1, wherein: There are a plurality of sample pieces, and the machine-measured surface density is corrected according to the actual surface density of the sample pieces, including: A first relationship is obtained by fitting a first surface density combination of a plurality of the sample pieces, wherein the first surface density combination of the sample pieces includes the machine-measured surface density and the actual surface density of the sample pieces; The machine-measured surface density is corrected using the first relationship.

3. The method of claim 2, wherein: The correcting the machine-measured surface density by using the first relational expression includes: Re-measuring the sample piece by using the surface density measuring instrument to obtain a new machine-measured surface density of the sample piece; The new machine-measured surface density is corrected according to the first relationship.

4. The method of claim 2, wherein: The first relational expression is a quadratic equation or a linear equation.

5. The method according to any one of claims 1 to 4, wherein: The method further includes: calibrating another areal density measuring instrument according to the calibration result of the areal density measuring instrument.

6. The method according to any one of claims 1 to 5, wherein: There are a plurality of sample sheets, and the surface density measuring instrument is calibrated according to the actual surface density and the corrected machine-measured surface density, including: A second relationship is obtained by fitting the second surface density combinations of the plurality of samples, wherein the second surface density combinations of the samples include the actual surface density of the samples and the corrected machine-measured surface density, and the second relationship is used to correct the surface density measured by the surface density measuring instrument in subsequent measurement processes.

7. The method of claim 6, wherein: The second relational expression is a quadratic equation or a linear equation.

8. The method according to any one of claims 1 to 7, wherein: There are multiple sample pieces, and the actual surface densities of the multiple sample pieces are different.

9. A calibration device for an areal density measuring instrument, wherein: The device comprises: An acquisition module is used to obtain the machine-measured surface density of the sample obtained by the surface density measuring instrument; A correction module is used to correct the machine-measured surface density according to the actual surface density of the sample to reduce the The error between the machine-measured surface density and the actual surface density; A calibration module is used to calibrate the surface density measuring instrument according to the actual surface density and the corrected machine-measured surface density.

10. A readable storage medium, wherein: The readable storage medium stores a computer program, and when the computer program is executed on a calibration device of an areal density measuring instrument, the calibration device of the areal density measuring instrument executes the method according to any one of claims 1 to 8.

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