Terahertz measuring device and method for calibrating a terahertz measuring device

Abstract

The invention relates to a terahertz measuring device for measuring the wall thickness of an object, wherein the terahertz measuring device has a terahertz transmitter which can be rotated with a rotating ring or along a rotating ring about a measuring region which accommodates the object during measurement, and a terahertz receiver which can be rotated with the rotating ring or along the rotating ring about the measuring region and which receives terahertz irradiation emitted by the terahertz transmitter onto the object after reflection by an object arranged in the measuring region, and wherein the terahertz measuring device furthermore comprises an evaluation apparatus which is designed to determine a wall thickness of the object from the measuring data of the terahertz receiver. The invention also relates to a method for calibrating such a terahertz measuring device.

Description

[0001] Terahertz measuring device and method for calibrating a terahertz measuring device

[0002] The invention relates to a terahertz measuring device for measuring the wall thickness of an object, wherein the terahertz measuring device has a terahertz transmitter which can be rotated with a rotating ring or along a rotating ring around a measuring range which accommodates the object during a measurement, and a terahertz receiver which can be rotated with the rotating ring or along the rotating ring around the measuring range, which receives terahertz radiation emitted by the terahertz transmitter onto the object after reflection by an object arranged in the measuring range, and wherein the terahertz measuring device further comprises an evaluation device which is designed to determine a wall thickness of the object from the measurement data of the terahertz receiver.

[0003] The invention also relates to a method for calibrating a terahertz measuring device for measuring the wall thickness of an object, wherein the terahertz measuring device has a terahertz transmitter which can be rotated by means of a rotating ring or along a rotating ring around a measuring range which accommodates the object during a measurement, and a terahertz receiver which can be rotated by means of the rotating ring or along the rotating ring around the measuring range, which receives terahertz radiation emitted by the terahertz transmitter onto the object after reflection by an object arranged in the measuring range, and wherein the terahertz measuring device further comprises an evaluation device which is designed to determine a wall thickness of the object from the measurement data of the terahertz receiver.

[0004] Terahertz measuring devices can be used to measure geometric parameters, such as wall thickness, of objects that are at least partially transparent to terahertz radiation, such as plastic pipes, with high accuracy, even in difficult measurement environments. For this purpose, the terahertz transmitter emits terahertz radiation onto the object, which is reflected by the object's interfaces. The reflected terahertz radiation is received by the terahertz receiver. An evaluation device determines the object's wall thickness, for example, based on an evaluation of the travel times of the different radiation components.

[0005] Such terahertz measuring devices are used to measure objects extruded in extrusion devices, such as plastic pipes. This allows the measurement of the object's geometric parameters shortly after it emerges from the extrusion device. It is also known from WO 2016 / 139155 A1 to determine the refractive index of the object's material from the received terahertz radiation. For comprehensive measurement of the object, for example, a pipe around its circumference, the terahertz transmitter and the terahertz receiver can be rotated synchronously with a rotating ring or along a rotating ring of the terahertz measuring device around the object, for example, the pipe. For example, the wall thickness and / or the outer diameter and / or the inner diameter of the pipe can be measured repeatedly around the circumference, either continuously or at intervals.This also allows for the detection of ovality or deviations in the wall thickness around the circumference, for example, caused by sagging, i.e., the gravity-induced sagging of still-meltable parts of the pipe during the solidification process. If necessary, the extrusion device can be controlled accordingly.

[0006] Such terahertz measuring devices must be calibrated before commencing operation, and usually also at regular intervals during operation, for example, according to the ISO 9001 standard. To date, cylindrical or tubular calibration objects have been manufactured for this purpose and measured by a certification office prior to calibration, for example, with regard to their wall thickness. Such a tubular calibration object is inserted as centrally as possible into the measuring range of the terahertz measuring device, which is limited by the rotating ring. The terahertz measuring device measures the wall thickness of the calibration object in the manner described above. The measurement results can be compared with the previously certified wall thickness values, and the terahertz measuring device can be calibrated based on these values.

[0007] This type of calibration presents several problems. First of all, it is difficult to manufacture corresponding calibration tubes, for example, made of a dimensionally stable glass material, with a sufficiently precise and uniform wall thickness, neither circumferentially nor longitudinally. In this regard, it should be noted that the terahertz measuring devices discussed above achieve measurement accuracy with a tolerance in the range of a few micrometers, in particular less than 5 pm. Since the manufacture of calibration tubes with consistently high accuracy within this tolerance range is practically impossible, minor positioning deviations of the calibration tube in the terahertz measuring device, be it a slight twist or displacement in the longitudinal direction, lead to corresponding deviations in the wall thickness measured by the terahertz measuring device. This makes the calibration process extremely difficult and complex.For example, for customers who use such terahertz measuring devices during operation to measure geometric parameters of, for example, extruded pipes, it is practically impossible to perform the calibration themselves. This increases the workload for customers, who are usually required to submit calibration certificates at regular intervals, for example, according to the ISO 9001 standard. For this, they often have to rely on the manufacturer of the corresponding terahertz measuring device.

[0008] In addition, due to the large manufacturing tolerances of such calibration tubes, certification offices only certify measurement results with tolerances in the range of + / - 50 pm. Given the at least tenfold improvement in the measurement accuracy of the terahertz measuring device, such tolerances are

[0009] ,.. / 4 are unsuitable. Rather, certified measurement data with tolerances within a range of + / - 1 pm would be required or desirable.

[0010] Based on the prior art explained above, the object of the invention is therefore to provide a terahertz measuring device and a method of the type mentioned at the outset, with which the calibration of a terahertz measuring device is possible in a more precise and simpler manner, in particular also for customers using the terahertz measuring device in ongoing operation.

[0011] The invention solves the problem by the independent claims 1 and 18. Advantageous embodiments can be found in the dependent claims, the description and the figures.

[0012] For a terahertz measuring device, the invention solves the problem by

[0013] • that a plate-shaped calibration object with a known wall thickness that is at least partially transparent to the terahertz radiation emitted by the terahertz transmitter is arranged within the rotating ring,

[0014] • that the terahertz transmitter can be rotated so that the

[0015] Terahertz transmitter Terahertz radiation along a vertical

[0016] Main beam direction towards the calibration object,

[0017] • that the terahertz receiver can be brought into a rotational position so that the terahertz receiver receives terahertz radiation reflected from the boundary surfaces of the calibration object and / or radiating through the calibration object,

[0018] • that the evaluation device is designed to determine the wall thickness of the calibration object from the measurement data of the terahertz receiver and to calibrate the terahertz measuring device based on a comparison of the determined wall thickness with the known wall thickness of the calibration object.

[0019] ...15 For a method of the type mentioned above, the invention solves the problem by the following steps:

[0020] • a plate-shaped calibration object with a known wall thickness that is at least partially transparent to the terahertz radiation emitted by the terahertz transmitter is placed inside the rotating ring,

[0021] • the terahertz transmitter is placed in a rotational position so that the terahertz transmitter emits terahertz radiation along a vertical main beam direction onto the calibration object,

[0022] • the terahertz receiver is brought into a rotational position so that the terahertz receiver receives terahertz radiation reflected from the boundary surfaces of the calibration object and / or radiating through the calibration object,

[0023] • the evaluation device determines the wall thickness of the calibration object from the measurement data of the terahertz receiver, and the terahertz measuring device is calibrated by comparing the wall thickness determined by the evaluation device with the known wall thickness of the calibration object.

[0024] The terahertz measuring device according to the invention operates as described above with regard to the prior art. Terahertz radiation is emitted from the terahertz transmitter, which can be rotated with or along the rotating ring, onto an object arranged in the measuring area, for example, a plastic tube extruded in an extrusion device. The terahertz radiation penetrates the object, which is at least partially transparent to the radiation, and is reflected at its boundary surfaces. It can also pass through the object. The reflected radiation components and / or those passing through the object are received by the terahertz receiver, which rotates synchronously with the terahertz transmitter.

[0025] ...16 and the measurement data is fed to the evaluation device. On this basis, the evaluation device determines the wall thickness and, if necessary, other geometric parameters, such as the outer and / or inner diameter or ovality of the object, for example the pipe. The terahertz transmitter and the terahertz receiver can be rotated around the object during the measurement, in particular around the circumference of a pipe to be measured. The terahertz transmitter can emit terahertz radiation onto the object continuously or several times in succession. This radiation is received by the terahertz receiver after reflection at the boundary surfaces of the object and / or after radiating through the object and is evaluated by the evaluation device in the manner explained. In this way, the geometric parameters can be determined over the circumference of the object, for example the pipe.The terahertz radiation emitted by the terahertz transmitter, for example, can have a frequency in the range of 1 GHz to 10 THz. This is the fundamental frequency around which terahertz radiation typically exhibits a certain bandwidth.

[0026] According to the invention, a plate-shaped calibration object that is at least partially transparent to terahertz radiation is or will be arranged within the rotating ring. As explained in more detail below, the calibration object can be arranged in the rotating ring for a calibration process. It can be detachably arranged in the rotating ring. However, it is also possible for it to be permanently or firmly arranged in the rotating ring. The calibration object can be arranged, for example, on the inside of the rotating ring or on the inside or within a housing of the rotating ring. The calibration object can, for example, have a round shape, in particular be circular, or, for example, have a rectangular, in particular square shape. The wall thickness of the calibration object is known. It can, for example, have been determined in advance by a certification office.The terahertz transmitter is brought into a rotational position, in particular by rotating the rotating ring or the.

[0027] ...a terahertz transmitter along the rotating ring, emitting terahertz radiation along a vertical main beam direction onto the calibration object, for example, vertically from top to bottom or vice versa. If the terahertz radiation emitted by the terahertz transmitter has an aperture angle, the main beam direction corresponds to the center or central beam or the center direction of the emitted radiation angle or radiation cone. The terahertz receiver is placed in a rotating position in which it receives the terahertz radiation emitted by the terahertz transmitter as measurement data after it has been reflected at the interfaces of the calibration object and / or after it has passed through the calibration object.The terahertz transmitter and terahertz receiver can, for example, be arranged opposite each other on the rotating ring and rotate synchronously by rotating the rotating ring, so that the terahertz receiver faces the terahertz transmitter in any rotational position. The terahertz receiver receives the terahertz radiation emitted by the terahertz transmitter onto the object after it has passed through the calibration object. It is also conceivable for the terahertz transmitter and the terahertz receiver to be arranged essentially at the same location, as explained in more detail below. In this case, the terahertz receiver receives the terahertz radiation emitted by the terahertz transmitter after reflection at the interfaces of the calibration object.Furthermore, in this case, as will also be explained in more detail below, a reflector for the terahertz radiation emitted by the terahertz transmitter can be arranged at a location on the rotating ring opposite the terahertz transmitter and the terahertz receiver arranged at the same location, which reflects the radiation, after possibly multiple reflections at boundary surfaces of the object, back to the terahertz receiver arranged at the same location as the terahertz transmitter.

[0028] The evaluation device determines the wall thickness of the calibration object from the measurement data of the terahertz receiver in the manner explained above. In particular

[0029] ,.. / 8, the evaluation device can evaluate the propagation times of the terahertz radiation reflected at the object's boundary surfaces. If the terahertz transmitter is located at a location on the rotating ring opposite the terahertz receiver, the evaluation device can evaluate a change in propagation time caused by the calibration object being positioned in the beam path compared to a calibration object not being positioned in the beam path. If the refractive index is known or determined, the wall thickness can also be determined from this. The evaluation device compares the wall thickness thus determined with the known wall thickness of the calibration object, for example, determined and provided by a certification office. On this basis, the evaluation device calibrates the terahertz measuring device.

[0030] According to the invention, the evaluation device thus forms an evaluation and calibration device. It can be constructed in one or more parts. For example, the calibration of the terahertz measuring device can be performed by a different part of the evaluation device than the wall thickness determination. The evaluation device can be located at the location of the terahertz measuring device or at a location separate from it. If it is constructed in several parts, one part, for example the part that performs the wall thickness determination, can be located at the location of the terahertz measuring device, and another part, for example the part that performs the calibration, can be located at a location separate from the terahertz measuring device.

[0031] The calibration object used according to the invention is plate-shaped, in particular flat and level. The boundary surfaces of the calibration object that delimit the wall to be measured are in particular plane-parallel. As explained, the wall thickness of the calibration object can be known from an external measurement, for example, carried out by a certification office in accordance with the ISO 9001 standard. The calibration according to the invention also meets the requirements

[0032] ...19 requirements of ISO 9001. A corresponding calibration certificate according to ISO 9001 can be issued.

[0033] The plate-shaped calibration object can be inserted into the rotating ring, for example, in the lower region of the rotating ring, which is determined, for example, by its rotational position, in particular at the lowest point of the rotating ring. The rotating ring can have a stationary housing into or onto which the calibration object can be inserted. This enables simple arrangement and storage based on gravity. As already explained, the terahertz transmitter and, if applicable, the terahertz receiver arranged at the same location can emit terahertz radiation vertically from top to bottom onto the calibration object from an upper region of the rotating ring, which is determined, for example, by its rotational position, in particular at the highest point of the rotating ring.A reversed arrangement is also possible, in which the terahertz transmitter and, if applicable, the terahertz receiver arranged at the same location emit terahertz radiation vertically from bottom to top onto the calibration object from a lower area of ​​the rotating ring, in particular the lowest point of the rotating ring. As will be explained in more detail, a reflector for the terahertz radiation can be arranged at the opposite location on the rotating ring. An advantage of this arrangement is that in the area of ​​the terahertz transmitter or the terahertz transceiver, the radiation angle is essentially limited to its near field. The calibration object(s) can therefore have significantly smaller dimensions than in the reversed arrangement. For example, calibration objects with a diameter of 100 mm for a circular design or 100 mm x 100 mm for a square design are conceivable.

[0034] The use of a plate-shaped calibration object according to the invention offers several advantages. A plate-shaped calibration object is

[0035] ... / IO Compared to cylindrical or tubular calibration objects, they can also be manufactured with significantly higher accuracy and uniformity of wall thickness. The wall thickness tolerance explained above in the range of + / - 1 pm can be reliably achieved with a plate-shaped calibration object, for example made of glass, in contrast to a cylindrical or tubular calibration object. This means that a certification office can also provide the known wall thickness used for the calibration in the comparison according to the invention with sufficiently high accuracy. Any positional deviations, for example in the longitudinal direction in the measuring range of the calibration object, do not have a relevant effect on the measurement result and thus the calibration, in contrast to cylindrical or tubular calibration objects.The alignment of the terahertz measuring device, in particular the terahertz transmitter and the terahertz receiver, with respect to the calibration object inserted into the rotating ring can be reliably and easily adjusted thanks to the inventive rotatability of the terahertz transmitter and terahertz receiver, so that the terahertz radiation impinges on the object along a vertical main beam direction. As explained in more detail below, the positioning accuracy of the calibration object within the rotating ring can be precisely specified, for example, by markings or mechanical mounts or holding devices.

[0036] Combined, these features of the inventive terahertz measuring device enable simple and precise calibration, particularly for customers who use the terahertz measuring device during operation to measure geometric parameters of objects. This also facilitates regular calibration certificates in accordance with ISO 9001.

[0037] This is especially true in contrast to terahertz measuring devices, which have a plurality of stationary terahertz transmitters and terahertz receivers across the measuring range. Calibration, in particular of the A terahertz transmitter that does not transmit along the vertical axis is then subject to the problems explained above.

[0038] The method steps claimed in the independent method claim do not necessarily have to be performed in the order specified therein. For example, the terahertz transmitter and / or the terahertz receiver can be moved into their respective rotational positions for the calibration measurement before or simultaneously with the placement of the calibration object in the rotating ring.

[0039] According to one embodiment, the calibration object can be made of glass. A calibration object made of ceramic would also be possible. The use of a glass or ceramic material is preferred over a plastic material, since plastics generally do not have sufficient dimensional stability. Although a glass or ceramic material behaves differently in terms of its refractive index than conventional plastics, which, for example, have an average refractive index of approximately 1.5, while a glass material, for example, can have a refractive index of approximately 2.1, the measurement accuracy and repeatability of the terahertz measuring device can nevertheless be reliably determined using a calibration object made of glass or ceramic. A plastic could also be a conceivable material, provided it has sufficient dimensional stability. Pertinax is one example.

[0040] According to a particularly practical embodiment, the terahertz transmitter and the terahertz receiver can be formed by a terahertz transceiver. A terahertz transceiver integrates a terahertz transmitter and a terahertz receiver into a single component, so that the terahertz transmitter and the terahertz receiver are located at the same location. The terahertz transceiver can then be rotated with or along the rotating ring. Furthermore, a reflector for terahertz radiation can be provided opposite the terahertz transmitter, which reflects terahertz radiation emitted by the terahertz transmitter back to the terahertz receiver. The reflector can be rotatable with the rotating ring or along the rotating ring around the measuring range. The reflector can in particular be arranged on the rotating ring opposite a terahertz transceiver. The reflector reflects the terahertz radiation emitted by the terahertz transmitter, in particular the terahertz radiation radiating through the object, possibly after multiple reflections at the boundary surfaces of the object, at least partially back to the object and, after radiating through the object again, possibly after further multiple reflections at the boundary surfaces, at least partially back to the terahertz receiver. The reflector can be synchronized with the terahertz transmitter and the terahertz receiver orRotate the terahertz transceiver with or on the rotating ring so that it is opposite the terahertz transmitter and the terahertz receiver or the terahertz transceiver in every rotational position and reflects radiation emitted by the terahertz transmitter back to the receiver.

[0041] With the aforementioned embodiment, it is also possible to determine the refractive index of an object arranged in the measuring area or of the calibration object. In this way, a reliable relationship can be established between the material of the calibration object and the regularly different material of an object to be measured later with the terahertz measuring device, for example, an extruded plastic object such as a pipe. For example, the refractive index can be determined from a comparison of the travel time of the terahertz radiation emitted by the terahertz transmitter through the measuring area with the object or calibration object arranged in the measuring area with the travel time of the terahertz radiation through the measuring area without the object or calibration object arranged therein, as described, for example, in WO 2016 / 139155 A1. According to a further embodiment, the reflector can serve as the calibration object. The reflector is then at least partially transparent to the terahertz radiation. Its wall thickness is also known or can be measured by a certification office if necessary. At the same time, the plate-shaped reflector offers sufficient reflective properties for the terahertz radiation, allowing it to fulfill the reflective function explained above. The reflector can, for example, be made of a glass material, as explained for the calibration object. This embodiment is particularly advantageous in that a calibrated wall thickness is now always available for measurement. Even if the terahertz transmitter and terahertz receiver or terahertz transceiver rotate, this wall thickness value will ensure that all recorded measurements are of the highest precision.Of course, it is also conceivable for the reflector to be combined with another calibration object, as explained in more detail below. The reflector can be either permanently installed in the terahertz measuring device or detachably mounted within it. A permanently installed reflector as a calibration object has the advantage of continuously ensuring measurement accuracy. Alternatively, the reflector can be replaceable thanks to a detachable arrangement, allowing the operator of the terahertz measuring device to have its dimensions confirmed by a certification office at desired intervals. This could fulfill the ISO 9001 standard.

[0042] According to a further embodiment, a marking for holding the calibration object can be provided on the rotating ring. The marking can be arranged on a fixed housing of the rotating ring. It indicates how an operator must insert the calibration object into the terahertz measuring device so that it is correctly positioned and aligned for the calibration measurement. This simplifies use even for less experienced operators. According to a further embodiment, a holder, in particular a mechanical holder, for holding the calibration object can be provided on the rotating ring. This holder can in turn be arranged on a housing of the rotating ring. The holder further simplifies the positioning of the calibration object. The holder can, for example, have one or more projections that limit a defined position of the calibration object, so that the latter can be easily inserted between the projection(s). For example, the projection can have lateral limits for the calibration object to be inserted. This ensures the correct positioning of the calibration object in a reliable and unalterable manner.

[0043] Another possible holder is to insert a holding tube or holding cylinder, e.g. made of plastic, into the rotating ring and place the calibration object on this holding tube or holding cylinder. The holding tube or holding cylinder can be aligned vertically with its longitudinal axis. It is particularly advantageous if the inner diameter of a holding tube corresponds approximately to the width of a window or reflector arranged on the underside of the rotating ring. The holding tube can then be pushed onto the window or reflector. This aligns and centers the holding tube, and a calibration object placed on the holding tube is also precisely aligned at a right angle to the main beam direction of the terahertz radiation.

[0044] The holder may also have a base for receiving the calibration object, so that the holder simultaneously forms a spacer with respect to the terahertz transmitter and / or terahertz receiver or the terahertz transceiver or the reflector.

[0045] In a particularly practical design, the holder can be made of foam. Such foam can be easily inserted without Risk of damage to components of the terahertz measuring device and does not affect the measurement because it is transparent to terahertz radiation.

[0046] According to a further embodiment, a second plate-shaped calibration object with a known wall thickness, which is at least partially transparent to the terahertz radiation emitted by the terahertz transmitter, can be arranged within the rotating ring parallel to and at a distance from the (first) calibration object. In this way, the measurement of two wall thicknesses of a pipe, which is usually carried out by the terahertz measuring device, can be simulated. The evaluation software of the evaluation device then does not need to be adapted for the calibration measurement in a simple manner. The second calibration object can be designed identically to the (first) calibration object. However, a different design is also conceivable, for example, different wall thicknesses of the (first) and second calibration objects.In this case, a distance measurement can also be carried out using terahertz radiation on parallel interfaces between the two calibration objects, for example on outer interfaces facing away from each other, corresponding to a diameter measurement of a pipe.

[0047] The holder can include a spacer between the (first) calibration object and the second calibration object. The spacer can be frame-shaped, for example. It can leave a gap between the calibration objects so that the terahertz radiation can pass through the gap without the risk of the spacer distorting the measurement result. This gap serves to ensure a clear, separate measurement of the wall thicknesses of the two calibration objects. In a particularly practical manner, the holder can also accommodate the second calibration object.

[0048] It is also possible that a holding device arranged outside the rotating ring and / or on a non-rotating part of the terahertz measuring device is provided, which holds the calibration object within the rotating ring. This can also be combined with the holder, so that the holding device holds the holder for holding the calibration object. The holding device can, for example, comprise a stand that can be placed on the floor next to the terahertz measuring device. This design eliminates the need to intervene in the rotating ring itself. It is also particularly suitable for retrofitting existing terahertz measuring devices.

[0049] According to a further embodiment, the calibration object can be arranged within the rotating ring in such a way that the boundary surfaces of the wall of the calibration object to be measured are aligned perpendicular to the vertical. This makes the wall thickness measurement and the evaluation of the received measurement data particularly simple. The marking, holder, or holding device according to the aforementioned embodiments can be designed accordingly, in particular, to ensure the aforementioned arrangement of the calibration object with the boundary surfaces of the wall aligned perpendicular to the vertical.

[0050] According to a further embodiment, the terahertz transmitter and / or the terahertz receiver can be arranged outside the rotating ring, wherein the rotating ring has a window that is at least partially transparent to the terahertz radiation and through which the terahertz radiation enters and / or exits the measuring range. Such a window serves to protect the sensor components, in particular the terahertz transmitter and terahertz receiver or the terahertz transceiver. It is designed in such a way that it generates as little as possible a reflection signal of the terahertz radiation that could interfere with the measurement evaluation. The window can, for example, comprise a thin film, for example a plastic film, such as a PTFE film, in which reflection echoes on the front and back of the film cancel each other out, for example because a reflection without phase shift occurs upon entry of the terahertz radiation and upon exit from the denser medium, a 180° phase shift occurs. The film can be located in a holder, for example a flange. The terahertz transmitter or terahertz receiver can in particular be arranged slightly outside the rotating ring. They can be mounted on the rotating ring via a connecting holder so that they can rotate with the rotating ring. The reflector can also be arranged (slightly) outside the rotating ring and accordingly mounted on the rotating ring via a connecting holder. The rotating ring can also have a window in the area of ​​the reflector that is at least partially transparent to the terahertz radiation and can be designed as explained above. Of course, the terahertz transmitter and / or the terahertz receiver and / or the reflector can also be mounted directly on the rotating ring and rotate with it. In this case, it is possible, for example, to protect the terahertz transmitter and terahertz receiver orReflector, an annular window that is at least partially transparent to the terahertz radiation can be arranged within the rotating ring. The annular window can also be designed such that it generates as little as possible a reflection signal of the terahertz radiation that could interfere with the measurement evaluation. In particular, it can be constructed as explained above with regard to the window. In a particularly practical manner, the annular window can simultaneously form a support for the calibration object. The rotating ring carrying the terahertz transmitter and terahertz receiver or terahertz transceiver and, if applicable, the reflector can have a U-shaped profile so that it rests on the annular window with the free ends of the legs of the U-shaped profile and / or holds the annular window.

[0051] The terahertz measuring device can preferably have a ring-shaped housing in which the rotating ring and the other components are arranged. The housing serves to protect the components arranged within the housing, in particular the terahertz transmitter and terahertz receiver or the terahertz transceiver, and optionally the reflector. As explained, the calibration object can, for example, be made of glass. In particular, it can be made of quartz glass or borosilicate glass. Such glass materials can be manufactured with particularly precise dimensions, exhibit particularly high dimensional stability, and can therefore be certified to very high standards. A conceivable example is a borosilicate glass of the MPAbor type made from Borofloat SG. The calibration object exhibits the greatest possible surface flatness. The dimensions of the calibration object can generally be flexibly selected according to the dimensions of the terahertz measuring device, in particular the rotating ring. For example, dimensions in the range of a diameter of up to 250 mm for a circular design, or a width of up to 250 mm for a rectangular design, or for a square design with dimensions of up to 250 x 250 mm 2Depending on the arrangement of the terahertz transmitter, smaller dimensions with a diameter or width of, for example, 100 mm or, in the case of a square version, 100 x 100 mm are also possible. 2 , is possible. The thickness of the calibration object can be selected depending on the specific application.

[0052] The results of the calibration according to the invention can be logged or documented. This allows a history of the calibration measurements to be created and evaluated over a longer period of time. For example, long-term deviations in measurement components can be identified.

[0053] The method according to the invention can be carried out using a terahertz measuring device according to the invention. Accordingly, the terahertz measuring device according to the invention can be designed to carry out the method according to the invention. Embodiments of the invention are explained in more detail below with reference to the figures. They show schematically:

[0054] Fig. 1 shows a terahertz measuring device for illustrating a calibration process according to the prior art in a vertical sectional view,

[0055] Fig. 2 shows a terahertz measuring device according to the invention for illustrating a calibration method according to the invention in a vertical sectional view according to a first embodiment,

[0056] Fig. 3 shows a terahertz measuring device according to the invention for illustrating a calibration method according to the invention in a vertical sectional view according to a second embodiment,

[0057] Fig. 4 shows a terahertz measuring device according to the invention for illustrating a calibration method according to the invention in a vertical sectional view according to a third embodiment,

[0058] Fig. 5 shows a terahertz measuring device according to the invention for illustrating a calibration method according to the invention in a vertical sectional view according to a fourth embodiment,

[0059] Fig. 6 shows a terahertz measuring device according to the invention for illustrating a calibration method according to the invention in a vertical sectional view according to a fifth embodiment, and

[0060] Fig. 7 shows the terahertz measuring device according to Figure 6 in a sectional view rotated by 90° compared to Figure 6. Unless otherwise stated, the same reference symbols in the figures refer to the same objects.

[0061] The terahertz measuring device shown in Figure 1 comprises a terahertz transceiver 10, which is arranged via a connection (not shown in detail) on a rotating ring 12, which is circular in the example, and is mounted therewith for rotation through 360°. The terahertz transceiver 10 comprises a terahertz transmitter and a terahertz receiver arranged at the same location. In the area of ​​the terahertz transceiver 10, a window 14 is arranged in the rotating ring 12 that is at least partially transparent to the terahertz radiation emitted by the terahertz transmitter. The window 14 can be configured as explained above. The terahertz radiation emitted by the terahertz transmitter of the terahertz transceiver 10 can pass through the window 14 into the interior of the rotating ring 12, which forms a measuring area 16 of the terahertz measuring device, and out again.

[0062] On a side of the rotating ring 12 opposite the terahertz transceiver 10, a reflector 18 for terahertz radiation is arranged, which reflects the terahertz radiation emitted by the terahertz transmitter back to the terahertz transceiver 10 and thus to the terahertz receiver, as illustrated in Fig. 1 by the arrow 20. The measurement data from the terahertz receiver are applied to an evaluation device 22 of the terahertz measuring device. During operation, an object to be measured, for example, a plastic pipe, is arranged in the measuring area 16, with the longitudinal axis of the plastic pipe extending into the plane of the drawing in Fig. 1. Terahertz radiation emitted by the terahertz transmitter of the terahertz transceiver 10 is repeatedly reflected by the boundary surfaces of the plastic pipe, whereby the repeatedly reflected radiation components are reflected by the reflector 18 after passing through the plastic pipe and after renewed Radiation through the object and further multiple reflections at the interfaces of the plastic pipe through the window 14 back to the terahertz transceiver 10. Based, for example, on an evaluation of the transit times of the terahertz radiation reflected at the various interfaces, the evaluation device 22 determines geometric parameters, in particular the wall thickness of the plastic pipe.

[0063] Figure 1 illustrates a conventional calibration method for such a terahertz measuring device. For this purpose, a tubular calibration object 24 made of glass is arranged in the measuring area 16. The wall thicknesses of the tubular calibration object 24 are determined in advance, for example, by a certification office. Based on the functionality explained above, the terahertz measuring device determines the wall thicknesses of the tubular calibration object 24. The terahertz measuring device is calibrated by comparing the determined wall thicknesses with the wall thicknesses previously determined, for example, by the certification office.

[0064] A disadvantage of this known method is, on the one hand, that the tubular calibration object 24 cannot be manufactured with an accuracy in terms of its wall thickness that corresponds to the accuracy of the terahertz measuring device. Accordingly, the wall thicknesses cannot be certified by a certification office with the corresponding accuracy. For this reason alone, a precise calibration with the tubular calibration object 24 is not possible. In addition, the tubular calibration object 24 must be positioned very precisely centrally in the measuring area 16 in a complex manner. Even small bearing deviations falsify the measurement result, since, on the one hand, a lateral displacement of the tubular calibration object 24 in Figure 1 changes the wall thicknesses measured by the terahertz measuring device and, on the other hand, since, as explained, the tubular calibration object 24 cannot be manufactured with a sufficiently A constant wall thickness cannot be produced, neither along the circumference nor in the longitudinal direction. Even a change in position in the longitudinal direction, i.e., into the plane of the drawing in Fig. 1, leads to a corresponding falsification of the measurement result.

[0065] Figure 2 shows a terahertz measuring device according to the invention for carrying out the calibration method according to the invention according to a first exemplary embodiment. It differs from the terahertz measuring device shown in Fig. 1 with regard to the calibration object. In the exemplary embodiment according to Fig. 2, a plate-shaped calibration object 26 made of glass is arranged within the rotating ring 12. The calibration object has plane-parallel, highly flat boundary surfaces that border the wall to be measured. In the exemplary embodiment shown in Fig. 2, a holder 28 comprising a circumferential projection 27 and a base 29 is arranged on the rotating ring 12, which precisely defines the position and orientation of the calibration object 26 on the underside of the rotating ring 12. The calibration object 26 is thus arranged precisely and in a fixed position, whereby the arrangement is simple and can be carried out without any problems even by less experienced operators.

[0066] As can be seen in Figure 2, the calibration object 26 is arranged within the rotating ring 12 such that the boundary surfaces 30, 32 of the wall to be measured are aligned perpendicular to the vertical. Furthermore, it can be seen that the terahertz transmitter of the terahertz transceiver 10 is in a rotating position such that the emitted terahertz radiation is emitted along a vertical main beam direction from top to bottom onto the calibration object 26. While the terahertz transceiver 10 is thus located at the highest point of the rotating ring 12, the reflector 18 is correspondingly arranged at the lowest point of the rotating ring 12. This ensures that the terahertz radiation falls perpendicularly onto the boundary surfaces 30, 32 of the calibration object 26. This simplifies measurement and evaluation. The calibration object 26 can be made of quartz glass or borosilicate glass, for example, as explained above. It is also conceivable for the calibration object 26 to be made of a ceramic. The holder can be made of a foam, for example. Instead of the holder 28, (optical) markings could also be provided on the inside of the rotating ring 12, which specify a position of the calibration object 26.

[0067] Figure 3 shows a further embodiment of a terahertz measuring device according to the invention, which largely corresponds to the terahertz measuring device shown in Fig. 2. It differs from the terahertz measuring device shown in Fig. 2 with regard to the mounting of the plate-shaped calibration object 26 within the rotating ring 12. In the initial example according to Fig. 3, a holding device 34 arranged outside the rotating ring 12 is provided for this purpose, which holds the calibration object 26 within the rotating ring 12. The holding device 34 is designed in the manner of a stand and can rest on a surface in the space of the terahertz measuring device by means of a stand base 36. It is also conceivable that the holding device 34 is attached to a non-rotating part of the terahertz measuring device.

[0068] Figure 4 shows a further embodiment which differs from the embodiment shown in Figure 2 in that the terahertz transceiver 10 is arranged on the underside of the rotating ring 12 and the reflector 18 is arranged opposite one another on the upper side of the rotating ring 12. The window 14 is accordingly also located on the underside of the rotating ring 12, so that the terahertz radiation emitted by the terahertz transceiver 10 is emitted vertically from bottom to top. Furthermore, the embodiment shown in Figure 4 differs from the embodiment shown in Figure 2 with regard to the mounting of the calibration object 26. Thus, in Figure 4, a holding tube 38, for example made of plastic, with its longitudinal axis vertically aligned, is shown as the mounting on the lowest position of the rotating ring 12. The holding tube 38 forms a support for the calibration object 26. The inner diameter of the holding tube 38 corresponds approximately to the width of the window 14 or a flange receiving the window 14, so that the holding tube 38 can be placed with its longitudinal axis vertically onto the window 14 or the flange, whereby the window 14 or the flange simultaneously centers and aligns the holding tube 38. In addition, the calibration object 26 is advantageously aligned reliably and precisely at a right angle to the terahertz radiation in this way. The holding tube 38 also ensures a distance between the calibration object 26 and the window 14 required for the measurement.

[0069] The embodiment shown in Figure 5 has the same measurement setup with terahertz transceiver 10, window 14, and reflector 18 as the embodiment shown in Figure 4. In the embodiment shown in Figure 5, in addition to the first calibration object 26, a second plate-shaped calibration object 40 is provided, which is at least partially transparent to the terahertz radiation of the terahertz transmitter and is arranged parallel to and spaced from the first calibration object 26. The second calibration object 40 can be identical to the first calibration object 26. However, the calibration objects 26 and 40 could also have different thicknesses, for example. A frame-shaped spacer 42, which can be made of foam, for example, is arranged between the calibration objects 26, 40.It leaves a free space centrally between the calibration objects 26, 40, allowing the terahertz radiation to pass through the free space without the risk of distorting the measurement result due to the spacer 42. In this way, the measurement of two adjacent wall thicknesses can be simulated during calibration. For example, based on an evaluation of the terahertz radiation, a distance measurement can be performed to the opposing, outer boundary surfaces of the wall thicknesses. Calibration items 26 and 40, corresponding to a diameter measurement of a pipe.

[0070] A further advantage of the arrangement of terahertz transceiver 10, window 14, and reflector 18 according to Figures 4 and 5 is that, in the area of ​​terahertz transceiver 10, the antenna's radiation angle is essentially limited to its near field. The calibration object(s) can therefore have significantly smaller dimensions than in the arrangement according to Figures 1 to 3. For example, calibration objects with a width of 100 mm, or 100 mm x 100 mm in a square design, are conceivable.

[0071] Figures 6 and 7 illustrate a further embodiment, which differs from the embodiments explained above in that the rotating ring 12 and the other components are arranged in a housing 46 of the terahertz measuring device. Such a housing 46 can also be provided in the embodiments according to Figures 1 to 5. Furthermore, in the embodiment according to Figures 6 and 7, the transceiver 10 is arranged directly on the rotating ring 12. Instead of the window 14, an annular window 44 is provided within the rotating ring 12 and is at least partially transparent to the terahertz radiation, which protects the transceiver 10 and the reflector 18. The calibration object 26 is inserted into the underside of the annular window 44, which thus simultaneously forms a support for the calibration object 26.Figure 7 shows that the rotating ring 12 has a U-shaped profile, with the annular window 44 resting on the free ends of the legs 48 of the U-shaped profile and thus being held in a defined manner within the rotating ring 12. The design with the annular window 44 could also be provided in the embodiments according to Figures 3 to 5. The arrangement of the transceiver 10 and the reflector can be chosen arbitrarily in the various embodiments. For example, in the embodiment according to Figures 1 to 3 and 6, 7, by appropriately rotating the rotating ring 12, the terahertz transceiver 10 could be arranged at the lowest point of the rotating ring 12 and the reflector 18 at the highest point. Similarly, in the embodiment according to Figures 4 and 5, by appropriately rotating the rotating ring 12, the terahertz transceiver 10 could be arranged at the highest point of the rotating ring 12 and the reflector 18 at the lowest point.

[0072] As explained above, the reflector 18 can also form the calibration object or a calibration object. In this case, the reflector 18 can be provided instead of the calibration object 26 shown in the figures and / or the calibration object 40 shown in Figure 5, or in addition thereto. The reflector 18 can then be made of a glass material, for example, the glass material explained for the calibration objects 26 and 40, respectively. The reflector 18 can be arranged fixedly or detachably in the terahertz measuring device. List of reference symbols

[0073] 10 terahertz transceiver

[0074] 12 rotating ring

[0075] 14 windows

[0076] 16 measuring range

[0077] 18 Reflector

[0078] 20 Arrow

[0079] 22 Evaluation device

[0080] 24 Tubular calibration object

[0081] 26 Plate-shaped calibration object

[0082] 27 lead

[0083] 28 Bracket

[0084] 29 Floor

[0085] 30, 32 interfaces

[0086] 34 Holding device

[0087] 36 Stand base

[0088] 38 Holding tube

[0089] 40 Second calibration item

[0090] 42 spacers

[0091] 44 ring windows

[0092] 46 housings

[0093] 48 legs

Claims

Claims:

1. Terahertz measuring device for measuring the wall thickness of an object, wherein the terahertz measuring device has a terahertz transmitter (10) which is rotatable with a rotating ring (12) or along a rotating ring (12) around a measuring area (16) which accommodates the object during a measurement, and a terahertz receiver (10) which is rotatable with the rotating ring (12) or along the rotating ring (12) around the measuring area (16), which receives terahertz radiation emitted by the terahertz transmitter (10) onto the object after reflection by an object arranged in the measuring area (16), and wherein the terahertz measuring device further comprises an evaluation device (22) which is designed to determine a wall thickness of the object from the measurement data of the terahertz receiver (10), characterized • that a plate-shaped calibration object (26) with a known wall thickness, which is at least partially transparent to the terahertz radiation emitted by the terahertz transmitter (10), is arranged within the rotating ring (12), • that the terahertz transmitter (10) can be brought into a rotational position so that the terahertz transmitter (10) emits terahertz radiation along a vertical main beam direction onto the calibration object (26), • that the terahertz receiver (10) can be brought into a rotational position so that the terahertz receiver (10) receives terahertz radiation reflected from boundary surfaces (30, 32) of the calibration object (26) and / or radiating through the calibration object (26), • that the evaluation device (22) is designed to determine the wall thickness of the calibration object (26) from the measurement data of the terahertz receiver (10) and to calibrate the terahertz measuring device based on a comparison of the determined wall thickness with the known wall thickness of the calibration object (26).

2. Terahertz measuring device according to claim 1, characterized in that the terahertz transmitter (10) and the terahertz receiver (10) are formed by a terahertz transceiver (10).

3. Terahertz measuring device according to one of the preceding claims, characterized in that a reflector (18) for terahertz radiation is provided opposite the terahertz transmitter (10), which reflects terahertz radiation emitted by the terahertz transmitter (10) back to the terahertz receiver (10).

4. Terahertz measuring device according to claim 3, characterized in that the reflector (18) is rotatable with the rotating ring (12) or along the rotating ring (12) around the measuring area (16).

5. Terahertz measuring device according to one of claims 3 or 4, characterized in that the reflector (18) forms the calibration object.

6. Terahertz measuring device according to one of the preceding claims, characterized in that a marking for receiving the calibration object (26) is provided on the rotating ring (12).

7. Terahertz measuring device according to one of the preceding claims, characterized in that a holder (28, 38) for receiving the calibration object (26) is provided on the rotating ring (12).

8. Terahertz measuring device according to claim 7, characterized in that the holder (28) has a base (29) for receiving the calibration object (26) 9. Terahertz measuring device according to one of claims 7 or 8, characterized in that the holder (28) consists of a foam.

10. Terahertz measuring device according to one of the preceding claims, characterized in that a second plate-shaped calibration object (40) with a known wall thickness and at least partially transparent to the terahertz radiation emitted by the terahertz transmitter (10) is arranged within the rotating ring (12) parallel to and at a distance from the calibration object (26).

11. Terahertz measuring device according to claim 10 and one of claims 7 to 9, characterized in that the holder comprises a spacer (42) between the calibration object (26) and the second calibration object (40).

12. Terahertz measuring device according to claim 11, characterized in that the holder also accommodates the second calibration object (40).

13. Terahertz measuring device according to one of the preceding claims, characterized in that a holding device (34) arranged outside the rotating ring (12) and / or on a non-rotating part of the terahertz measuring device is provided, which holds the calibration object (26) within the rotating ring (12).

14. Terahertz measuring device according to one of the preceding claims, characterized in that the calibration object (26) is arranged within the rotating ring (12) in such a way that the boundary surfaces (30, 32) of the wall of the calibration object (26) to be measured are aligned perpendicular to the vertical.

15. Terahertz measuring device according to one of the preceding claims, characterized in that the terahertz transmitter (10) and / or the terahertz receiver (10) are arranged outside the rotating ring (12), wherein the Rotating ring (12) has a window (14) which is at least partially transparent to the terahertz radiation and through which the terahertz radiation enters the measuring area (16) and / or leaves the measuring area (16).

16. Terahertz measuring device according to one of the preceding claims, characterized in that the calibration object (26) consists of a glass or a ceramic.

17. Terahertz measuring device according to claim 16, characterized in that the calibration object (26) consists of a quartz glass or a borosilicate glass.

18. A method for calibrating a terahertz measuring device for measuring the wall thickness of an object, wherein the terahertz measuring device has a terahertz transmitter (10) rotatable with a rotating ring (12) or along a rotating ring (12) around a measuring area (16) accommodating the object during a measurement, and a terahertz receiver (10) rotatable with the rotating ring (12) or along the rotating ring (12) around the measuring area (16), which receives terahertz radiation emitted by the terahertz transmitter (10) onto the object after reflection by an object arranged in the measuring area (16), and wherein the terahertz measuring device further comprises an evaluation device (22) designed to determine a wall thickness of the object from the measurement data of the terahertz receiver (10), characterized in that the method comprises the following steps: • a plate-shaped calibration object (26) with a known wall thickness, which is at least partially transparent to the terahertz radiation emitted by the terahertz transmitter (10), is arranged within the rotating ring (12), • the terahertz transmitter (10) is brought into a rotational position so that the terahertz transmitter (10) emits terahertz radiation along a vertical main beam direction onto the calibration object (26), • the terahertz receiver (10) is brought into a rotational position so that the terahertz receiver (10) receives terahertz radiation reflected from boundary surfaces (30, 32) of the calibration object (26) and / or radiating through the calibration object (26), • the wall thickness of the calibration object (26) is determined from the measurement data of the terahertz receiver (10) by the evaluation device (22), and the terahertz measuring device is calibrated by comparing the wall thickness determined by the evaluation device (22) with the known wall thickness of the calibration object (26).

19. Method according to claim 18, characterized in that it is carried out with a terahertz measuring device according to one of claims 1 to 17.

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