Apparatus and method for scheduling multiple inspection processes

Abstract

An electronic device according to an embodiment of the present disclosure may identify scheduling information associated with multiple inspection processes, and execute the multiple inspection processes on the basis of the scheduling information, wherein: execution time periods of the multiple inspection processes, which are indicated by the scheduling information, overlap or do not overlap each other; the scheduling information is determined on the basis of inspection data associated with previous execution results of the multiple inspection processes; and the inspection data includes at least one of a failure rate of each of the multiple inspection processes, a required time of each of the multiple inspection processes, and data associated with a point in time when inspection can be started after booting of each of the multiple inspection processes, the failure rate and required time being based on that the time periods in which the multiple inspection processes have been executed overlap.

Description

Device and method for scheduling multiple inspection processes

[0001] The present disclosure relates to a device and method for scheduling a plurality of inspection processes associated with hardware components of an electronic device.

[0002] Electronic devices (e.g., TVs, smart monitors, or display devices such as digital signage) may be manufactured as finished products assembled from various hardware (HW) components and sold to customers. These HW components may be defective during the manufacturing and / or assembly process, and may age or break depending on the customer's usage time or patterns. If a HW component malfunctions and causes a problem in the electronic device, the manufacturer's service network or service application may be utilized to resolve the issue.

[0003] As an example of a service application, a self-diagnosis solution can be used. This self-diagnosis solution can be installed on an electronic device and executed by the user. This self-diagnosis solution can be used to independently check the status of the electronic device without connecting an external device, or to determine whether the electronic device has a problem or requires repair.

[0004] Service applications, such as self-diagnosis solutions, can execute multiple inspection processes simultaneously to quickly complete them. However, when multiple inspection processes are executed simultaneously, problems can arise due to resource conflicts. For example, resource conflicts can occur when multiple inspection processes are executed concurrently and are associated with the same hardware component. If a resource conflict occurs, at least one of the inspection processes that fails to preempt the hardware component may fail.

[0005] To prevent resource conflicts, a method can be used where the user identifies the hardware components associated with each inspection process and then manually adjusts the execution order of inspection processes associated with resource conflicts. Resource conflicts can occur differently depending on the product model of an electronic device. Therefore, even for the same type of electronic device, users may experience the inconvenience of having to manually adjust the execution order for each product model.

[0006] Multiple inspection processes can be performed automatically without user intervention. In this case, if at least one of the multiple inspection processes performed simultaneously fails, the failed inspection process can be individually retried. For example, a failed inspection process can be retried until it succeeds. However, inspection processes associated with genuinely defective hardware components may not succeed even after repeated retries, resulting in unnecessary increases in execution time due to repeated retries.

[0007] One embodiment of the present disclosure may provide a device and method for scheduling a plurality of inspection processes.

[0008] One embodiment of the present disclosure may provide a device and method for scheduling a plurality of inspection processes associated with hardware components of an electronic device.

[0009] One embodiment of the present disclosure may provide a device and method for scheduling a plurality of inspection processes based on inspection data including previous execution results of a plurality of inspection processes.

[0010] One embodiment of the present disclosure may provide a device and method for scheduling a plurality of inspection processes so that the execution time periods of the plurality of inspection processes overlap or do not overlap, taking into account at least one of a failure rate or required time when a plurality of inspection processes are performed simultaneously based on inspection data, or data associated with a possible inspection start time after booting of each inspection process.

[0011] According to one embodiment of the present disclosure, a device comprises: an electronic device, a memory storing at least one program; and at least one processor electrically connected to the memory and executing at least one command of the program stored in the memory; wherein the at least one processor: identifies scheduling information associated with a plurality of inspection processes, and performs the plurality of inspection processes based on the scheduling information; execution time periods of the plurality of inspection processes indicated by the scheduling information may or may not overlap; the scheduling information is determined based on inspection data associated with previous execution results of the plurality of inspection processes; and the inspection data may include at least one of: a failure rate of each of the plurality of inspection processes based on overlapping time periods during which the plurality of inspection processes were performed, a required time of each of the plurality of inspection processes based on overlapping time periods during which the plurality of inspection processes were performed, or data associated with a possible inspection start time point after booting of each of the plurality of inspection processes.

[0012] According to one embodiment, the electronic device further includes a transceiver configured to perform communication with a server; and the at least one processor can control the transceiver to transmit a test list associated with the plurality of test processes to the server and, in response to transmitting the test list, to receive the scheduling information from the server.

[0013] According to one embodiment, the electronic device further includes a transceiver configured to perform communication with a server; wherein the at least one processor controls the transceiver to transmit an inspection list associated with the plurality of inspection processes to the server, and in response to transmitting the inspection list, to receive the inspection data from the server, perform scheduling for the plurality of inspection processes based on the received inspection data, and identify the scheduling information including a result of the scheduling.

[0014] According to one embodiment, the at least one processor may collect inspection data associated with previous execution results of the plurality of inspection processes, perform scheduling for the plurality of inspection processes based on the collected inspection data, and identify the scheduling information including the results of the scheduling.

[0015] According to one embodiment, the scheduling information includes information indicating an execution order of each of the plurality of inspection processes; the execution order of at least one first inspection process among the plurality of inspection processes is determined differently from the execution order of at least one second inspection process among the plurality of inspection processes based on a condition associated with the inspection data; and the condition associated with the inspection data may include at least one of a first condition indicating that a failure rate of the at least one first inspection process or the at least one second inspection process is greater than or equal to a threshold based on an overlap between a time period during which the at least one first inspection process and the at least one second inspection process are performed, a second condition indicating that a required time period of the at least one first inspection process or the at least one second inspection process is greater than or equal to a threshold time period, or a third condition indicating that an inspection start possible time point after booting of the at least one first inspection process is different from an inspection start possible time point after booting of the at least one second inspection process.

[0016] According to one embodiment, the order of performing the at least one first inspection process may be an order before the execution of the at least one second inspection process begins, or an order after the execution of the at least one second inspection process ends.

[0017] In one embodiment, the plurality of inspection processes may be associated with a plurality of hardware components included in the electronic device.

[0018] Another device according to one embodiment of the present disclosure; comprises a memory for storing at least one program in a server; and at least one processor electrically connected to the memory and executing at least one command of the program stored in the memory; wherein the at least one processor: identifies inspection data associated with previous execution results of a plurality of inspection processes, and performs scheduling based on the identified inspection data so that the plurality of inspection processes are performed in overlapping or non-overlapping time periods; and the inspection data may include at least one of data associated with a failure rate of each of the plurality of inspection processes based on whether the time periods during which the plurality of inspection processes were performed overlap, a required time of each of the plurality of inspection processes based on whether the time periods during which the plurality of inspection processes were performed overlap, or a time point at which each of the plurality of inspection processes can start inspection after booting.

[0019] According to one embodiment, the server further includes a transceiver for performing communication with an electronic device, and the at least one processor can control the transceiver to receive a test list associated with the plurality of test processes from the electronic device, and in response to receiving the test list, transmit scheduling information including a result of the scheduling to the electronic device.

[0020] According to one embodiment, based on a result of the scheduling, scheduling information including information indicating an execution order of each of the plurality of inspection processes is generated; the execution order of at least one first inspection process among the plurality of inspection processes is set to be different from the execution order of at least one second inspection process among the plurality of inspection processes, based on a condition associated with the inspection data; and the condition associated with the inspection data may include at least one of a first condition indicating that a failure rate of the at least one first inspection process or the at least one second inspection process is greater than or equal to a threshold based on an overlap between a time period during which the at least one first inspection process and the at least one second inspection process are performed, a second condition indicating that a required time period of the at least one first inspection process or the at least one second inspection process is greater than or equal to a threshold time period, or a third condition indicating that an inspection start possible time point after booting of the at least one first inspection process is different from an inspection start possible time point after booting of the at least one second inspection process.

[0021] According to one embodiment of the present disclosure, a method for performing a plurality of inspection processes by an electronic device comprises: identifying scheduling information associated with the plurality of inspection processes; and performing the plurality of inspection processes based on the scheduling information; wherein execution time periods of the plurality of inspection processes indicated by the scheduling information overlap or do not overlap; wherein the scheduling information is determined based on inspection data associated with previous execution results of the plurality of inspection processes; and wherein the inspection data may include at least one of: a failure rate of each of the plurality of inspection processes based on overlapping execution time periods of the plurality of inspection processes, a required time of each of the plurality of inspection processes based on overlapping execution time periods of the plurality of inspection processes, or data associated with a possible inspection start time point after booting of each of the plurality of inspection processes.

[0022] According to one embodiment, the operation of identifying the scheduling information may include: transmitting a list of inspection processes associated with the plurality of inspection processes to a server; receiving the scheduling information from the server in response to transmitting the list of inspection processes; and identifying the received scheduling information.

[0023] According to one embodiment, the operation of identifying the scheduling information may include: transmitting a test list associated with the plurality of test processes to a server; receiving the test data from the server in response to transmitting the test list; performing scheduling for the plurality of test processes based on the received test data; and identifying the scheduling information including a result of the scheduling.

[0024] According to one embodiment, the operation of identifying the scheduling information may include: collecting inspection data associated with previous execution results of the plurality of inspection processes; performing scheduling for the plurality of inspection processes based on the collected inspection data; and identifying the scheduling information including the results of the scheduling.

[0025] According to one embodiment, the scheduling information includes information indicating an execution order of each of the plurality of inspection processes; the execution order of at least one first inspection process among the plurality of inspection processes is determined differently from the execution order of at least one second inspection process among the plurality of inspection processes based on a condition associated with the inspection data; and the condition associated with the inspection data may include at least one of a first condition indicating that a failure rate of the at least one first inspection process or the at least one second inspection process is greater than or equal to a threshold based on an overlap between a time period during which the at least one first inspection process and the at least one second inspection process are performed, a second condition indicating that a required time period of the at least one first inspection process or the at least one second inspection process is greater than or equal to a threshold time period, or a third condition indicating that an inspection start possible time point after booting of the at least one first inspection process is different from an inspection start possible time point after booting of the at least one second inspection process.

[0026] According to one embodiment, the order of performing the at least one first inspection process may be an order before the execution of the at least one second inspection process begins, or an order after the execution of the at least one second inspection process ends.

[0027] In one embodiment, the plurality of inspection processes may be associated with a plurality of hardware components included in the electronic device.

[0028] Another method according to one embodiment of the present disclosure; a method for scheduling a plurality of inspection processes by a server, comprising: identifying inspection data associated with previous execution results of the plurality of inspection processes; and scheduling the plurality of inspection processes to be performed in overlapping or non-overlapping time periods based on the identified inspection data, wherein the inspection data may include at least one of: a failure rate of each of the plurality of inspection processes based on overlapping time periods during which the plurality of inspection processes were performed; a required time of each of the plurality of inspection processes based on overlapping time periods during which the plurality of inspection processes were performed; or data associated with a possible inspection start time after booting of each of the plurality of inspection processes.

[0029] According to one embodiment, the method may further include receiving a list of inspection processes associated with the plurality of inspection processes from the electronic device; and, in response to receiving the list of inspection processes, transmitting scheduling information including a result of the scheduling to the electronic device.

[0030] According to one embodiment, the method further includes generating scheduling information including information indicating an execution order of each of the plurality of inspection processes based on a result of the scheduling; wherein the execution order of at least one first inspection process among the plurality of inspection processes is set to be different from the execution order of at least one second inspection process among the plurality of inspection processes based on a condition associated with the inspection data; and the condition associated with the inspection data may include at least one of a first condition indicating that a failure rate of the at least one first inspection process or the at least one second inspection process is greater than or equal to a threshold based on an overlap between a time period during which the at least one first inspection process and the at least one second inspection process are performed, a second condition indicating that a required time period of the at least one first inspection process or the at least one second inspection process is greater than or equal to a threshold time period, or a third condition indicating that an inspection start possible time point after booting of the at least one first inspection process is different from an inspection start possible time point after booting of the at least one second inspection process.

[0031] FIG. 1 is a diagram illustrating a system for scheduling multiple inspection processes according to one embodiment.

[0032] FIG. 2 is a signal flow diagram between an electronic device and a server for performing multiple inspection processes according to one embodiment.

[0033] FIG. 3 is another signal flow diagram between an electronic device and a server for performing multiple inspection processes according to one embodiment.

[0034] FIG. 4a is a diagram illustrating data associated with the failure rate of each of the simultaneously performed inspection processes according to one embodiment.

[0035] FIG. 4b is a diagram illustrating data associated with the time required for each of the simultaneously performed inspection processes according to one embodiment.

[0036] FIG. 4c is a diagram illustrating data associated with the start time of each of the simultaneously performed inspection processes after booting according to one embodiment.

[0037] Figure 5 is a flowchart illustrating the operation of an electronic device according to one embodiment.

[0038] FIG. 6 is a flowchart illustrating an operation of an electronic device identifying scheduling information according to one embodiment.

[0039] FIG. 7 is a flowchart illustrating another operation of an electronic device identifying scheduling information according to one embodiment.

[0040] FIG. 8 is a flowchart illustrating another operation for identifying scheduling information by an electronic device according to one embodiment.

[0041] FIG. 9 is a flowchart illustrating an operation of an electronic device or server according to one embodiment to set the execution order of an inspection process.

[0042] Figure 10 is a flowchart illustrating the operation of a server according to one embodiment.

[0043] FIG. 11 is a flowchart illustrating an operation in which a server provides scheduling information to an electronic device according to one embodiment.

[0044] Fig. 12 is a block diagram of an electronic device according to one embodiment.

[0045] Figure 13 is a block diagram of a server according to one embodiment.

[0046] The following description refers to the attached drawings, and specific examples of implementations are illustrated within the drawings. Furthermore, other examples may be utilized and structural changes may be made without departing from the scope of the various examples.

[0047] Hereinafter, embodiments of the present disclosure will be described in detail with reference to the drawings so that those skilled in the art can easily implement the present disclosure. However, the present disclosure may be implemented in various different forms and is not limited to the embodiments described herein. In connection with the description of the drawings, the same or similar reference numerals may be used for identical or similar components. Furthermore, in the drawings and related descriptions, descriptions of well-known functions and configurations may be omitted for clarity and conciseness.

[0048] FIG. 1 is a diagram illustrating a system for scheduling multiple inspection processes according to one embodiment.

[0049] Referring to FIG. 1, a system (100) for scheduling multiple inspection processes may include an electronic device (110) and a server (130).

[0050] For example, the electronic device (110) may be a display device such as a TV, a smart monitor, or a digital signage; a home appliance such as a refrigerator, a washing machine, a dryer, or an air conditioner; or a mobile terminal such as a tablet or a mobile phone. As an example, FIG. 1 illustrates a case where the electronic device (110) is a TV.

[0051] For example, the server (130) may be a server capable of performing various processing, such as collecting, storing, and processing various data. The server (130) may be referred to in various ways by terms other than the server, such as a data server, a network server, a database, a database server, an inspection server, or an inspection data server.

[0052] According to one example, the electronic device (110) and the server (130) may be connected via a network (120) and may communicate based on various wired and wireless communication technologies. For example, the wireless communication technology may include at least one of Wi-Fi (wireless fidelity), Bluetooth, LTE (long term evolution), LTE-A (LTE advance), or NR (new radio) communication technologies.

[0053] According to one example, the electronic device (110) or the server (130) may collect and store various data (e.g., scheduling information and / or inspection data) associated with multiple inspection processes. For example, the electronic device (110) may perform multiple inspection processes and store inspection data associated with the results of performing the multiple inspection processes. For example, the server (130) may receive and store inspection data associated with the results of performing the multiple inspection processes from one or more electronic devices. The one or more electronic devices may include the electronic device (110) and / or at least one other electronic device different from the electronic device (110).

[0054] In one example, the electronic device (110) or server (130) may perform scheduling for multiple inspection processes based on collected inspection data. The electronic device (110) may perform multiple inspection processes based on the scheduling results performed by the electronic device (110) or server (130).

[0055] Referring to FIGS. 2 and 3 below, an operation of an electronic device (110) performing multiple inspection processes based on communication with a server (130) is described.

[0056] FIG. 2 is a signal flow diagram between an electronic device and a server for performing multiple inspection processes according to one embodiment.

[0057] Referring to FIG. 2, in operation 202, the electronic device (110) may transmit an inspection list, and the server (130) may receive the inspection list transmitted by the electronic device (110). According to an example, the inspection list may include identification information or model information of the electronic device (110) (e.g., product model name, model code, or model number information), and / or information on each hardware (HW) component included or connected to the electronic device (110) (e.g., at least one of identification information or model information of each HW component, normal operation status information of each HW component, after service (AS) information of each HW component (e.g., AS availability information or AS history information), or inspection method or inspection type information of each HW component). For example, if the electronic device (110) is a TV, the HW components may include at least some of a speaker, a sensor (e.g., a gyro sensor), a camera, an antenna, a tuner, a communication module (e.g., a Wi-Fi or Bluetooth module), a high-definition multimedia interface (HDMI) or universal serial bus (USB) port, a codec chip, an input / output unit, and a security block.

[0058] In operation 204, the server (130) may identify inspection data based on the received inspection list. For example, the server (130) may identify inspection data corresponding to information included in the inspection list (e.g., identification information or model information of the electronic device (110) and / or identification information or model information of each HW component) from pre-stored inspection data. The identified inspection data may include data associated with the results of previous executions of multiple inspection processes.

[0059] In one example, data associated with previous execution results of multiple inspection processes may include data collected by the server (130). For example, the data collected by the server (130) may include at least one of the start time and end time of each inspection process, data associated with whether each inspection process succeeded or failed, or data associated with the failure rate of each of the simultaneously performed inspection processes, the time required for each of the simultaneously performed inspection processes, or data associated with the point in time at which inspection can begin after booting of each inspection process.

[0060] For example, concurrent execution of inspection processes may mean that the time periods during which the inspection processes are performed overlap, or that the inspection processes are performed together at a specific point in time or period of time. For example, the time periods during which the inspection processes are performed may overlap in whole or in part. For example, if a first inspection process is performed 1 to 10 seconds after booting, a second inspection process is performed 5 to 10 seconds after booting, and a third process is performed 5 to 10 seconds after booting, the time periods during which the first and second inspection processes or the third process are performed may partially overlap, and the time periods during which the second and third processes are performed may completely overlap.

[0061] In operation 206, the server (130) may perform scheduling for multiple inspection processes based on the identified inspection data.

[0062] In operation 208, the server (130) transmits scheduling information including the scheduling execution result, and the electronic device (110) can receive the scheduling information transmitted from the server (130).

[0063] In operation 210, the electronic device (110) can perform multiple inspection processes based on scheduling information received from the server (130).

[0064] In operation 212, the electronic device (110) may perform multiple inspection processes and transmit inspection data after the performance to the server (130).

[0065] In one example, the post-execution inspection data may include at least one of the start time and end time of each inspection process, data associated with whether each inspection process succeeded or failed, or the failure rate of each of the concurrently executed inspection processes, the time required for each of the concurrently executed inspection processes, or data associated with the point in time when each inspection process can start inspection after booting.

[0066] In one example, the post-performance inspection data may be transmitted to the server (130) for inspection data collection operation. The post-performance inspection data may be stored in the server (130) and used for scheduling multiple subsequent inspection processes.

[0067] FIG. 3 is another signal flow diagram between an electronic device and a server for performing multiple inspection processes according to one embodiment.

[0068] Referring to FIG. 3, in operation 302, the electronic device (110) transmits an inspection list, and the server (130) can receive the inspection list transmitted by the electronic device (110).

[0069] In operation 304, the server (130) may identify inspection data based on the received inspection list. In one example, operations 302 and 304 may correspond to operations 202 and 204 of FIG. 2.

[0070] In operation 306, the server (130) transmits the identified inspection data to the electronic device (110), and the electronic device (110) can receive the inspection data transmitted from the server (130). In one example, the server (130) can perform an operation of collecting the inspection data and providing it to the electronic device (110).

[0071] In operation 308, the electronic device (110) may perform scheduling based on inspection data received from the server (130).

[0072] In operation 310, the electronic device (110) can perform multiple inspection processes based on scheduling information including scheduling results.

[0073] In operation 312, the electronic device (110) may perform multiple inspection processes and transmit inspection data after the performance to the server (130). In one example, the inspection data after the performance may be transmitted for a collection operation of the server (130).

[0074] According to one example, unlike FIGS. 2 and 3, the electronic device (110) can perform multiple inspection processes on its own without communicating with the server (130). For example, if the electronic device (110) detects that there is an abnormality in the operation of the electronic device (110) or that a problem has occurred in hardware components, the electronic device (110) can generate an inspection list. The generated inspection list can include information related to hardware components to be inspected. The electronic device (110) can identify inspection data corresponding to the inspection list from pre-stored (or previously collected) inspection data. The electronic device (110) can schedule multiple inspection processes based on the identified inspection data, and can perform multiple inspection processes based on the scheduling results. The electronic device (110) can store the inspection data after performing the inspection and use it to schedule multiple subsequent inspection processes.

[0075] Inspection data according to one embodiment may include at least one of data related to the failure rate of each concurrently performed inspection process, the required time of each concurrently performed inspection process, or the point in time at which each inspection process can start inspection after booting. Data related thereto will be described in detail with reference to FIGS. 4A to 4C.

[0076] FIG. 4a is a diagram illustrating data associated with the failure rate of each of the simultaneously performed inspection processes according to one embodiment.

[0077] Referring to FIG. 4A, the plurality of inspection processes may include inspection A (412), inspection B (422), inspection C (432), and inspection D (442). Inspection A (412), inspection B (422), inspection C (432), and inspection D (442) are each inspection processes, and may include inspection procedures, inspection processes, or inspection operations associated with specific HW.

[0078] At least two of the plurality of inspection processes can be performed concurrently. For example, the time periods during which the at least two inspection processes are performed may overlap in whole or in part. In one example, inspection A (412), inspection B (422), inspection C (432), and inspection D (442) can be performed concurrently. For example, the time periods during which inspection A (412), inspection B (422), inspection C (432), and inspection D (442) are performed may overlap in at least part. For convenience of explanation, in the following, it is described as concurrent execution when the starting points of inspection A (412), inspection B (422), inspection C (432), and inspection D (442) are the same, and inspection A (412), inspection B (422), inspection C (432), and inspection D (442) are performed during a specific time period from the starting point.

[0079] Test A (412), Test B (422), Test C (432), and Test D (442) can be performed by dividing them into set work units (e.g., threads, hereinafter referred to as 'Threads') and can be referred to as unit tests, respectively. For example, Test A (412), Test B (422), Test C (432), and Test D (442) can be assigned to different Threads. According to an example, Test A (412) can be assigned to Thread 1 (410), Test B (422) can be assigned to Thread 2 (420), Test C (432) can be assigned to Thread 3 (430), and Test D (442) can be assigned to Thread 4 (440). Tests A (412), B (422), C (432), and D (442), which are assigned to different threads, can be performed in parallel during overlapping time periods.

[0080] Inspection A (412), Inspection B (422), Inspection C (432), and Inspection D (442) may be performed based on their respective associated HW components (or HW components to be inspected, HW resources, or HW component resources) (e.g., HW 1 (414), HW 2 (424), or HW 3 (434)). For example, Inspection A (412) and Inspection B (422) may be performed in association with HW 1 (414), Inspection C (432) may be performed in association with HW 2 (424), and Inspection D (442) may be performed in association with HW 3 (434).

[0081] In one example, the inspection data collected by the electronic device (110) or the server (130) may include data associated with the failure rate of each of the simultaneously performed inspection processes. For example, the inspection data may include first failure rate data (460) associated with inspection A (412), second failure rate data (470) associated with inspection B (422), third failure rate data (480) associated with inspection C (432), or fourth failure rate data (490) associated with inspection D (442), as failure rate data based on previous performance results.

[0082] For example, when test A (412), test B (422), test C (432), and test D (442) are performed simultaneously, the first failure rate data (460) may include the failure rates of each of test B (422), test C (432), and test D (442). For example, when test B (422) is performed while test A (412) is performed, the failure rate of test B (422) may be 85%, when test C (432) is performed while test A (412) is performed, the failure rate of test C (432) may be 2%, and when test D (442) is performed while test A (412) is performed, the failure rate of test D (442) may be 1%.

[0083] For example, when test B (422) and one of test A (412), test C (432), and test D (442) are performed simultaneously, the second failure rate data (470) may include the failure rates of each of test A (412), test C (432), and test D (442). For example, when test A (412) is performed while test B (422) is performed, the failure rate of test A (412) may be 2%, when test C (432) is performed while test B (422) is performed, the failure rate of test C (432) may be 2%, and when test D (442) is performed while test B (422) is performed, the failure rate of test D (442) may be 1%.

[0084] For example, when test C (432) and one of test A (412), test B (422), and test D (442) are performed simultaneously, the third failure rate data (480) may include the failure rates of each of test A (412), test B (422), and test D (442). For example, when test A (412) is performed while test C (432) is performed, the failure rate of test A (412) may be 1%, when test B (422) is performed while test C (432) is performed, the failure rate of test B (422) may be 2%, and when test D (442) is performed while test C (432) is performed, the failure rate of test D (442) may be 1%.

[0085] For example, when test D (442) and one of test A (412), test B (422), and test C (432) are performed simultaneously, the fourth failure rate data (490) may include the failure rates of each of test A (412), test B (422), and test C (432). For example, when test A (412) is performed while test D (442) is performed, the failure rate of test A (412) may be 1%, when test B (422) is performed while test D (442) is performed, the failure rate of test B (422) may be 2%, and when test C (432) is performed while test D (442) is performed, the failure rate of test C (432) may be 1%.

[0086] In one example, the electronic device (110) or the server (130) may identify a failure rate greater than or equal to a threshold value in the first failure rate data (460), the second failure rate data (470), the third failure rate data (480), or the fourth failure rate data (490). For example, if the threshold value is 40%, the electronic device (110) or the server (130) may identify a failure rate of 85% of test B (422) in the first failure rate data (460) as a failure rate greater than or equal to the threshold value. Based on the failure rate of test B (422) being greater than or equal to the threshold value, the electronic device (110) or the server (130) may schedule test B (422) not to be performed simultaneously with test A (412). For example, the electronic device (110) or server (130) can schedule tests A (412) and B (422) so that they are not performed during the same or overlapping time periods.

[0087] In one example, the electronic device (110) or the server (130) can identify a failure rate that is higher than other failure rates, a failure rate that is different from other failure rates by a set difference or more, or the highest failure rate in the first failure rate data (460), the second failure rate data (470), the third failure rate data (480), or the fourth failure rate data (490). For example, the electronic device (110) or the server (130) can identify a failure rate of 85% of the test B (422) included in the first failure rate data (460) as a failure rate that is lower than other failure rates (e.g., 1% or 2%), a failure rate that is different from other failure rates by a set difference or more (e.g., 20%), or the highest failure rate.

[0088] The electronic device (110) or the server (130) may schedule the test B (422) not to be performed simultaneously with the test A (412) by considering the identified failure rate, for example, the failure rate of the test B (422) included in the first failure rate data (460). For example, the electronic device (110) or the server (130) may schedule the tests A (412) and B (422) to be performed during different time periods or non-overlapping time periods by assigning them to different threads. In one example, the electronic device (110) or the server (130) may schedule the test B (422) or adjust the execution order or test order of the test B (422) so that the test B (422) is performed before the start time or after the end time of the test A (412).

[0089] For example, unlike as illustrated in FIG. 4A, the inspection data may include data associated with the success rate of each of the simultaneously performed inspection processes. For example, the inspection data may include first success rate data associated with inspection A (412), second success rate data associated with inspection B (422), third success rate data associated with inspection C (432), or fourth success rate data associated with inspection D (442), as success rate data based on previous execution results.

[0090] In one example, the electronic device (110) or the server (130) may identify a success rate below a threshold value in the first success rate data, the second success rate data, the third success rate data, or the fourth success rate data. For example, if the threshold value is 80%, the electronic device (110) or the server (130) may identify a 15% success rate of test B (422) in the first success rate data as a success rate below the threshold value. Based on the fact that the success rate of test B (422) is below the threshold value, the electronic device (110) or the server (130) may schedule test B (422) not to be performed simultaneously with test A (412). For example, the electronic device (110) or the server (130) may schedule test A (412) and test B (422) not to be performed during the same time period or overlapping time periods.

[0091] In one example, the electronic device (110) or the server (130) may identify a success rate that is lower than other success rates, a success rate that is greater than or equal to a set difference from other success rates, or the lowest success rate in the first success rate data, the second success rate data, the third success rate data, or the fourth success rate data. For example, the electronic device (110) or the server (130) may identify a success rate of 15% of test B (422) included in the first success rate data as a success rate that is lower than other success rates (e.g., 99% or 98%), a success rate that is greater than or equal to a set difference (e.g., 20%) from other success rates, or the lowest success rate.

[0092] The electronic device (110) or the server (130) may schedule test B (422) not to be performed simultaneously with test A (412) by considering the identified success rate, for example, the success rate of test B (422) included in the first success rate data. For example, the electronic device (110) or the server (130) may schedule test A (412) and test B (422) to be performed during different time periods or non-overlapping time periods by assigning them to different threads. In one example, the electronic device (110) or the server (130) may schedule test B (422) or adjust the execution order or test order of test B (422) so that test B (422) is performed before the start time or after the end time of test A (412).

[0093] FIG. 4b is a diagram illustrating data associated with the time required for each of the simultaneously performed inspection processes according to one embodiment.

[0094] Referring to FIG. 4B, the inspection data collected by the electronic device (110) or the server (130) may include data associated with the time required for each of the simultaneously performed inspection processes. For example, the inspection data may include first time required data (462) associated with inspection A (412), second time required data (472) associated with inspection B (422), third time required data (482) associated with inspection C (432), or fourth time required data (492) associated with inspection D (442), as time required data based on the previous performance results.

[0095] For example, the first required time data (462) associated with test A (412) may include required time information or required time range information (e.g., 100 to 500 ms) when test A (412) is performed (or performed successfully). The first required time data (462) may include required time information when test A (412) is performed simultaneously with at least one of test B (422), test C (432), and test D (442). For example, the first required time data (462) may include required time information (e.g., 100 ms) when test A (412) is performed simultaneously with test C (432) and test D (442), and required time information (e.g., 500 ms) when test A (412) is performed simultaneously with test B (422), test C (432), and test D (442).

[0096] For example, the second time-consuming data (472) associated with test B (422) may include time-consuming information or a time-consuming range (e.g., 100 to 500 ms) when test B (422) is performed (or successfully performed). The second time-consuming data (472) may include time-consuming information when test B (422) is performed simultaneously with at least one of test A (412), test C (432), and test D (442). For example, the second time-consuming data (472) may include time-consuming information (e.g., 100 ms) when test B (422) is performed simultaneously with test C (432) and test D (442), and time-consuming information (e.g., 500 ms) when test B (422) is performed simultaneously with test A (412), test C (432), and test D (442).

[0097] For example, the third test data (482) associated with test C (432) may include time information or a time range (e.g., 100 to 100 ms) when test C (432) is performed (or when the performance is successful). The third time data (482) may include time information when test C (432) is performed simultaneously with at least one of test A (412), test B (422), and test D (442). For example, the third time data (482) may include time information (e.g., 100 ms) when test C (432) is performed simultaneously with test B (422) and test D (442), and time information (e.g., 100 ms) when test C (432) is performed simultaneously with test A (412), test B (422), and test D (442).

[0098] For example, the fourth time-consuming data (492) associated with test D (442) may include time-consuming information or a time-consuming range (e.g., 100 to 100 ms) when test D (442) is performed (or successfully performed). The fourth time-consuming data (492) may include time-consuming information when test D (442) is performed simultaneously with at least one of test A (412), test B (422), and test C (432). For example, the fourth time-consuming data (492) may include time-consuming information (e.g., 100 ms) when test D (442) is performed simultaneously with test B (422) and test C (432), and time-consuming information (e.g., 100 ms) when test D (442) is performed simultaneously with test A (412), test B (422), and test C (432).

[0099] According to an example, the electronic device (110) or the server (130) can identify a time required greater than or equal to a threshold time in the first required time data (462), the second required time data (472), the third required time data (482), or the fourth required time data (492). For example, if the threshold time is 300 ms, the electronic device (110) or the server (130) can identify that a time required (e.g., 500 ms) in the case where test A (412) is performed simultaneously with test B (422), test C (432), and test D (442) in the first required time data (462) is greater than or equal to a threshold time, and a time required (e.g., 500 ms) in the case where test B (422) is performed simultaneously with test A (412), test C (432), and test D (442) in the second required time data (472) is greater than or equal to a threshold time.

[0100] The electronic device (110) or the server (130) can schedule test A (412) not to be performed simultaneously with test B (422), test C (432), and test D (442) based on the identification of a required time greater than a threshold time, and can schedule B (422) not to be performed simultaneously with test A (412), test C (432), and test D (442). For example, the electronic device (110) or the server (130) can assign test A (412), test B (422), test C (432), and test D (442) to different threads, and can assign a time period during which test A (412) is performed and a time period during which test B (422), test C (432), and test D (442) are performed differently. For example, the electronic device (110) or server (130) can differently allocate the time period during which test B (422) is performed and the time periods during which test C (432) and test D (442) are performed. Since the allocation of different time periods can prevent overlapping of time periods, the problem of increasing critical time due to simultaneous execution can be solved.

[0101] In one example, the electronic device (110) or the server (130) can identify a longer time or the longest time compared to other time requirements in the first time requirement data (462), the second time requirement data (472), the third time requirement data (482), or the fourth time requirement data (492). For example, the electronic device (110) or the server (130) can identify a time requirement (e.g., 500 ms) when Test A (412) is performed simultaneously with Test B (422), Test C (432), and Test D (442) in the first time requirement data (462), and a time requirement (e.g., 500 ms) when Test B (422) is performed simultaneously with Test A (412), Test C (432), and Test D (442) in the second time requirement data (472), as a longer time or the longest time compared to other time requirements. The electronic device (110) or server (130) can schedule Test A (412) not to be performed simultaneously with Test B (422), Test C (432), and Test D (442), and can schedule Test B (422) not to be performed simultaneously with Test A (412), Test C (432), and Test D (442), based on the identification of a longest or longest time compared to other data.

[0102] FIG. 4c is a diagram illustrating data associated with the start time of each of the simultaneously performed inspection processes after booting according to one embodiment.

[0103] Referring to FIG. 4c, the inspection data collected by the electronic device (110) or server (130) may include data associated with the possible inspection start time after booting of each of the simultaneously performed inspection processes. For example, the data associated with the possible inspection start time after booting may include start / end time data, which is data associated with the inspection start time and inspection end time.

[0104] According to an example, the first start / end time data (464) associated with test A (412) may include test start time information (e.g., 10 to 15 seconds after booting) and test end time information (e.g., 12 to 17 seconds after booting) when test A (412) is successfully performed, and test start time information (e.g., 1 to 10 seconds after booting) and test end time information (e.g., 1 to 10 seconds after booting) when test A (412) is failed to be performed.

[0105] According to an example, the second start / end time data (474) associated with test B (422) may include test start time information (e.g., 1 to 15 seconds after booting) and test end time information (e.g., 8 to 25 seconds after booting) when test B (422) is successfully performed, and test start time information (e.g., 1 to 15 seconds after booting) and test end time information (e.g., 8 to 25 seconds after booting) when test B (422) is failed to be performed.

[0106] According to an example, the third start / end time data (484) associated with test C (432) may include test start time information (e.g., 1 to 15 seconds after booting) and test end time information (e.g., 8 to 25 seconds after booting) when test C (432) is successfully performed, and test start time information (e.g., 1 to 15 seconds after booting) and test end time information (e.g., 8 to 25 seconds after booting) when test C (432) is failed to be performed.

[0107] According to an example, the fourth start / end time data (484) associated with test D (442) may include test start time information (e.g., 1 to 15 seconds after booting) and test end time information (e.g., 8 to 25 seconds after booting) when test D (442) is successfully performed, and test start time information (e.g., 1 to 15 seconds after booting) and test end time information (e.g., 8 to 25 seconds after booting) when test D (442) is failed to be performed.

[0108] According to one example, the electronic device (110) or the server (130) can identify, based on the first start / end data (464), the second start / end data (474), the third start / end data (484), or the fourth start / end data (494), whether each of Test A (412), Test B (422), Test C (432), and Test D (442) requires time (e.g., time for HW initialization) to perform a post-boot test process, or whether there is a meaningful difference or significant difference between the test start time and / or test end time when each of Test A (412), Test B (422), Test C (432), and Test D (442) succeeds and the test start time and / or test end time when each of Test A (412), Test B (422), Test C (432), and Test D (442) fails.

[0109] For example, the electronic device (110) or the server (130) can identify, based on the first start / end data (464), that the execution of test A (412) fails if it starts 1 to 10 seconds after booting, and that the execution is successful if test A (412) starts 10 to 15 seconds after booting. Taking this into consideration, the electronic device (110) or the server (130) can determine that the possible start time of test A (412) is 10 to 15 seconds after booting.

[0110] The electronic device (110) or the server (130) can identify a possible start time of test B (422), test C (432), or test D (442) based on the second start / end data (474), the third start / end data (484), or the fourth start / end data (494). For example, there may be no difference between the test start time and / or the test end time when each of test B (422), test C (432), or test D (442) succeeds, and the test start time and / or the test end time when each of test B (422), test C (432), or test D (442) fails. Considering this, the electronic device (110) or the server (130) can identify a possible start time of each of test B (422), test C (432), or test D (442) as 1 to 15 seconds after booting. The electronic device (110) or server (130) may schedule Test B (422), Test C (432), or Test D (442) to be performed at a time earlier than Test A (412), based on the fact that the possible start time of each of Test B (422), Test C (432), or Test D (442) is earlier than the possible start time of Test A (412).

[0111] Figure 5 is a flowchart illustrating the operation of an electronic device according to one embodiment.

[0112] Referring to FIG. 5, in operation 502, the electronic device (110) may identify scheduling information associated with a plurality of inspection processes.

[0113] In operation 504, the electronic device (110) may perform multiple inspection processes based on the identified scheduling information. In one example, the execution time periods of the multiple inspection processes indicated by the scheduling information may or may not overlap.

[0114] In one example, scheduling information may be determined based on inspection data associated with previous execution results of multiple inspection processes. For example, the inspection data may include at least one of: a failure rate of each of the multiple inspection processes based on overlapping time periods during which the multiple inspection processes were performed; a required time of each of the multiple inspection processes based on overlapping time periods during which the multiple inspection processes were performed; or data associated with a possible inspection start time after booting of each of the multiple inspection processes.

[0115] According to an example, the operation of identifying scheduling information by the electronic device (110) in operation 502 of FIG. 5 may be performed in various ways. For example, the electronic device (110) may identify scheduling information based on the operations illustrated in any one of FIGS. 6 to 8.

[0116] FIG. 6 is a flowchart illustrating an operation of an electronic device identifying scheduling information according to one embodiment.

[0117] The operations of FIG. 6 may be performed based on the electronic device (110) being able to communicate with the server (130). For example, the operations of FIG. 6 may be performed based on the server (130) performing scheduling for multiple inspection processes on the system (100) of FIG. 1.

[0118] Referring to FIG. 6, in operation 602, the electronic device (110) may transmit an inspection list associated with a plurality of inspection processes to the server (130). According to one example, the inspection list may include identification information or model information of the electronic device (110) and / or information about HW components included in the electronic device (110).

[0119] In operation 604, the electronic device (110) may receive scheduling information associated with a plurality of inspection processes from the server (130) in response to transmitting the inspection list.

[0120] In operation 606, the electronic device (110) may identify the received scheduling information. In one example, the electronic device (110) may determine a time interval (or a start time and / or an end time) for performing each of the plurality of inspection processes or an execution order for each of the plurality of inspection processes based on the scheduling information.

[0121] FIG. 7 is a flowchart illustrating another operation of an electronic device identifying scheduling information according to one embodiment.

[0122] The operations of FIG. 7 may be performed based on the electronic device (110) being able to communicate with the server (130). For example, the operations of FIG. 7 may be performed based on the electronic device (110) performing scheduling for multiple inspection processes on the system (100) of FIG. 1.

[0123] Referring to FIG. 7, in operation 702, the electronic device (110) may transmit a list of inspections associated with multiple inspection processes to the server (130).

[0124] In operation 704, the electronic device (110) may receive inspection data from the server (130) in response to transmitting the inspection list.

[0125] In operation 706, the electronic device (110) may perform scheduling for a plurality of inspection processes based on the received inspection data. In one example, the received inspection data may include data associated with previous execution results of the plurality of inspection processes (e.g., at least one of data associated with a failure rate, a required time, or a time point at which inspection can be started after booting). The data associated with the previous execution results may be collected by the server (130) and may be associated with results of one or more electronic devices, including the electronic device (110), previously performing the plurality of inspection processes.

[0126] In operation 708, the electronic device (110) may identify scheduling information including the results of scheduling. In one example, the electronic device (110) may determine a time interval (or a start time and / or an end time) for performing each of the plurality of inspection processes or an execution order for each of the plurality of inspection processes based on the scheduling information.

[0127] FIG. 8 is a flowchart illustrating another operation for identifying scheduling information by an electronic device according to one embodiment.

[0128] The operations of FIG. 8 can be performed based on the electronic device (110) performing scheduling for multiple inspection processes without performing communication with the server (130).

[0129] Referring to FIG. 8, in operation 802, the electronic device (110) may collect inspection data associated with previous execution results of multiple inspection processes.

[0130] In operation 804, the electronic device (110) may perform scheduling for multiple inspection processes based on the collected inspection data.

[0131] In operation 806, the electronic device (110) may identify scheduling information including the results of scheduling. In one example, the electronic device (110) may determine a time interval (or a start time and / or an end time) for performing each of the plurality of inspection processes or an execution order for each of the plurality of inspection processes based on the scheduling information.

[0132] FIG. 9 is a flowchart illustrating an operation of an electronic device or server according to one embodiment to set the execution order of an inspection process.

[0133] Referring to FIG. 9, in operation 902, the electronic device (110) or the server (130) may identify at least one first inspection process and at least one second inspection process performed during an overlapping time period. In one example, the electronic device (110) or the server (130) may identify at least one first inspection process and at least one second inspection process based on inspection data.

[0134] In operation 904, the electronic device (110) or the server (130) may determine whether a condition associated with the inspection data (e.g., a condition for at least one of data associated with a failure rate, a required time, or a post-boot inspection start time) is satisfied while the time periods overlap. For example, the condition associated with the inspection data may include at least one of a first condition indicating that a failure rate of at least one first inspection process or at least one second inspection process is greater than or equal to a threshold based on overlapping time periods during which at least one first inspection process and at least one second inspection process were performed, a second condition indicating that a required time of at least one first inspection process or at least one second inspection process is greater than or equal to a threshold based on overlapping time periods during which at least one first inspection process and at least one second inspection process were performed, or a third condition indicating that a post-boot inspection start time of at least one first inspection process is different from a post-boot inspection start time of at least one second inspection process.

[0135] In operation 906, the electronic device (110) or server (130) may set the execution order of at least one first inspection process and at least one second inspection process to be the same or different based on the verification result. In one example, the same execution order may indicate an order in which the execution time intervals overlap, and the different execution order may indicate an order in which the execution time intervals do not overlap.

[0136] According to an example, when the execution order of at least one first inspection process and at least one second inspection process are set differently, the execution order of at least one first inspection process may be set to an order before the execution of at least one second inspection process begins, or an order after the execution of at least one second inspection process ends.

[0137] Figure 10 is a flowchart illustrating the operation of a server according to one embodiment.

[0138] In operation 1002, the server (130) may identify inspection data associated with previous execution results of the plurality of inspection processes. In one example, the inspection data may include at least one of: a failure rate of each of the plurality of inspection processes based on overlapping time periods during which the plurality of inspection processes were performed; a time required for each of the plurality of inspection processes based on overlapping time periods during which the plurality of inspection processes were performed; or data associated with a possible inspection start time after booting of each of the plurality of inspection processes.

[0139] In operation 1004, the server (130) may perform scheduling so that multiple inspection processes are performed in overlapping or non-overlapping time periods based on the identified inspection data.

[0140] FIG. 11 is a flowchart illustrating an operation in which a server provides scheduling information to an electronic device according to one embodiment.

[0141] In operation 1102, the server (130) may receive a list of inspections associated with multiple inspection processes from the electronic device (110).

[0142] In operation 1104, in response to receiving the inspection list, the server (130) may transmit scheduling information including the results of scheduling to the electronic device (110).

[0143] Fig. 12 is a block diagram of an electronic device according to one embodiment.

[0144] Referring to FIG. 12, the electronic device (110) may include a transceiver (1202), a memory (1204), and a processor (1206). According to one example, the electronic device (110) may include additional components (e.g., a display) in addition to the illustrated components, or may omit at least one of the illustrated components.

[0145] In one example, the transceiver (1202) can communicate with the server (130). For example, the transceiver (1202) can communicate with the server (130) based on Wi-Fi, Bluetooth, or other communication technologies.

[0146] According to one example, the memory (1204) can store various information or data related to the operation of the electronic device (110) and can store at least one program.

[0147] According to one example, the processor (1206) is electrically or operatively connected to the transceiver (1202) and the memory (1204) and can execute at least one instruction of a program stored in the memory (1204). There may be one or more processors (1206) and can perform operations of the electronic device (110) described above (e.g., operations of the electronic device (110) described in FIGS. 1 to 9).

[0148] For example, the processor (1206) may identify scheduling information associated with multiple inspection processes and perform the multiple inspection processes based on the scheduling information. The execution time periods of the multiple inspection processes indicated by the scheduling information may or may not overlap.

[0149] In one example, scheduling information may be determined based on inspection data associated with previous execution results of multiple inspection processes. For example, the inspection data may include information regarding at least one of: a failure rate of each of the multiple inspection processes based on overlapping time periods during which the multiple inspection processes were performed; a required time of each of the multiple inspection processes based on overlapping time periods during which the multiple inspection processes were performed; or information regarding a possible start time of each of the multiple inspection processes after booting.

[0150] According to one example, the processor (1206) can control the transceiver (1202) to transmit a list of inspection processes associated with a plurality of inspection processes to the server (130) and, in response to transmitting the list of inspection processes, to receive scheduling information from the server (130).

[0151] According to one example, the processor (1206) may control the transceiver (1202) to transmit an inspection list associated with a plurality of inspection processes to the server (130) and, in response to transmitting the inspection list, to receive inspection data from the server (130). The processor (1206) may perform scheduling for the plurality of inspection processes based on the received inspection data and identify scheduling information including the results of the scheduling.

[0152] According to one example, the processor (1206) may collect inspection data associated with previous execution results of a plurality of inspection processes, perform scheduling for the plurality of inspection processes based on the collected inspection data, and identify scheduling information including the results of the scheduling.

[0153] For example, the scheduling information may include information indicating the order in which each of the plurality of inspection processes is to be performed.

[0154] According to one example, the execution order of at least one first inspection process among the plurality of inspection processes may be determined differently from the execution order of at least one second inspection process among the plurality of inspection processes based on a condition associated with the inspection data. For example, the condition associated with the inspection data may include at least one of a first condition indicating that a failure rate of at least one first inspection process or at least one second inspection process is greater than or equal to a threshold based on an overlap in a time period during which at least one first inspection process and at least one second inspection process were performed, a second condition indicating that a required time of at least one first inspection process or at least one second inspection process is greater than or equal to a threshold time based on an overlap in a time period during which at least one first inspection process and at least one second inspection process were performed, or a third condition indicating that a possible inspection start time after booting of at least one first inspection process is different from a possible inspection start time after booting of at least one second inspection process.

[0155] According to an example, the order of performing at least one first inspection process may be an order before the execution of at least one second inspection process begins, or an order after the execution of at least one second inspection process ends.

[0156] In one example, multiple inspection processes may be associated with multiple HW components included in an electronic device (110).

[0157] Figure 13 is a block diagram of a server according to one embodiment.

[0158] Referring to FIG. 13, the server (130) may include a transceiver (1302), a memory (1304), and a processor (1306). According to one example, the server (130) may include additional components (e.g., a communication module for communication with other servers or other electronic devices) in addition to the illustrated components, or may omit at least one of the illustrated components.

[0159] In one example, the transceiver (1302) can communicate with the electronic device (110). For example, the transceiver (1302) can communicate with the electronic device (110) based on Wi-Fi, Bluetooth, or other communication technologies.

[0160] According to one example, the memory (1304) can store various information or data related to the operation of the server (130) and can store at least one program.

[0161] According to one example, the processor (1306) is electrically or operatively connected to the transceiver (1302) and the memory (1304) and can execute at least one instruction of a program stored in the memory (1304). There may be one or more processors (1306) and can perform the operations of the server (130) described above (e.g., the operations of the server (130) described in FIGS. 1 to 4C and FIGS. 9 to 11).

[0162] For example, the processor (1306) may identify inspection data associated with previous execution results of multiple inspection processes, and based on the identified inspection data, perform scheduling so that the multiple inspection processes are performed during overlapping or non-overlapping time periods.

[0163] In one example, the inspection data may include at least one of: a failure rate for each of the plurality of inspection processes based on overlapping time periods during which the plurality of inspection processes were performed; a time required for each of the plurality of inspection processes based on overlapping time periods during which the plurality of inspection processes were performed; or data associated with a point in time at which each of the plurality of inspection processes can start inspection after booting.

[0164] According to one example, the processor (1306) may receive a list of inspection processes associated with a plurality of inspection processes from the electronic device (110), and in response to receiving the list of inspection processes, control the transceiver (1302) to transmit scheduling information including the results of scheduling to the electronic device (110).

[0165] According to one example, the processor (1306) may generate scheduling information including information indicating the execution order of each of the plurality of inspection processes based on the results of scheduling.

[0166] According to one example, the execution order of at least one first inspection process among the plurality of inspection processes may be determined differently from the execution order of at least one second inspection process among the plurality of inspection processes based on a condition associated with the inspection data. For example, the condition associated with the inspection data may include at least one of a first condition indicating that a failure rate of at least one first inspection process or at least one second inspection process is greater than or equal to a threshold based on an overlap in a time period during which at least one first inspection process and at least one second inspection process were performed, a second condition indicating that a required time of at least one first inspection process or at least one second inspection process is greater than or equal to a threshold time based on an overlap in a time period during which at least one first inspection process and at least one second inspection process were performed, or a third condition indicating that a possible inspection start time after booting of at least one first inspection process is different from a possible inspection start time after booting of at least one second inspection process.

[0167] The various embodiments of this document and the terminology used therein are not intended to limit the technical features described in this document to specific embodiments, but should be understood to include various modifications, equivalents, or substitutes of the embodiments. In connection with the description of the drawings, similar reference numerals may be used for similar or related components. The singular form of a noun corresponding to an item may include one or more of the items, unless the context clearly indicates otherwise. In this document, each of the phrases "A or B", "at least one of A and B", "at least one of A or B", "A, B, or C", "at least one of A, B, and C", and "at least one of A, B, or C" can include any one of the items listed together in the corresponding phrase among those phrases, or all possible combinations thereof. Terms such as "first," "second," or "first" or "second" may be used merely to distinguish one component from another, and do not limit the components in any other respect (e.g., importance or order). When a component (e.g., a first component) is referred to as "coupled" or "connected" to another (e.g., a second component), with or without the terms "functionally" or "communicatively," it means that the component can be connected to the other component directly (e.g., wired), wirelessly, or through a third component.

[0168] The term "module" used in various embodiments of this document may include a unit implemented in hardware, software, or firmware, and may be used interchangeably with terms such as logic, logic block, component, or circuit. A module may be an integral component, or a minimum unit or part of such a component that performs one or more functions. For example, according to one embodiment, a module may be implemented in the form of an application-specific integrated circuit (ASIC).

[0169] According to various embodiments, each component (e.g., a module or a program) of the above-described components may include one or more entities, and some of the entities may be separated and placed in other components. According to various embodiments, one or more components or operations of the aforementioned components may be omitted, or one or more other components or operations may be added. Alternatively or additionally, a plurality of components (e.g., a module or a program) may be integrated into a single component. In such a case, the integrated component may perform one or more functions of each of the plurality of components identically or similarly to those performed by the corresponding component among the plurality of components prior to the integration. According to various embodiments, the operations performed by a module, program, or other component may be executed sequentially, in parallel, iteratively, or heuristically, or one or more of the operations may be executed in a different order, omitted, or one or more other operations may be added.

Claims

1. In electronic devices, memory for storing at least one program; and At least one processor electrically connected to said memory and configured to execute at least one instruction of a program stored in said memory; At least one processor of the above: Identify scheduling information associated with multiple inspection processes; Performing the plurality of inspection processes based on the above scheduling information; The execution time intervals of the plurality of inspection processes indicated by the above scheduling information may or may not overlap; The above scheduling information is determined based on inspection data associated with previous execution results of the plurality of inspection processes; The above test data: The failure rate of each of the multiple inspection processes based on the overlapping time periods during which the multiple inspection processes were performed, The time required for each of the multiple inspection processes based on the overlapping time periods during which the multiple inspection processes were performed, or An electronic device comprising at least one of data associated with a time at which each of said plurality of inspection processes can start after booting.

2. In paragraph 1, Further comprising a transceiver unit for performing communication with the server; At least one processor of the above, An electronic device that controls the transceiver to transmit a list of inspections associated with the plurality of inspection processes to the server, and to receive scheduling information from the server in response to transmitting the list of inspections.

3. In paragraph 1, Further comprising a transceiver unit for performing communication with the server; At least one processor of the above, Controlling the transceiver to transmit an inspection list associated with the plurality of inspection processes to the server, and in response to transmitting the inspection list, to receive the inspection data from the server; Scheduling the plurality of inspection processes based on the received inspection data is performed, An electronic device identifying said scheduling information including the result of said scheduling.

4. In paragraph 1, At least one processor of the above, Collect inspection data associated with the results of previous execution of the above multiple inspection processes, Scheduling for the multiple inspection processes is performed based on the collected inspection data, An electronic device identifying said scheduling information including the result of said scheduling.

5. In paragraph 1, The above scheduling information includes information indicating the execution order of each of the plurality of inspection processes; The execution order of at least one first inspection process among the plurality of inspection processes is determined differently from the execution order of at least one second inspection process among the plurality of inspection processes based on a condition associated with the inspection data; The conditions associated with the above inspection data are: A first condition indicating that a failure rate of the at least one first inspection process or the at least one second inspection process is greater than or equal to a threshold value, based on an overlap between a time period during which the at least one first inspection process and the at least one second inspection process are performed; A second condition indicating that the time required for the at least one first inspection process or the at least one second inspection process is greater than or equal to a threshold time, based on the overlapping of the time periods during which the at least one first inspection process and the at least one second inspection process are performed, or An electronic device comprising at least one of a third condition indicating that a post-boot inspection start time of the at least one first inspection process is different from a post-boot inspection start time of the at least one second inspection process.

6. In paragraph 5, The order of performing at least one of the above first inspection processes is: An electronic device, wherein the order is before the performance of at least one of the second inspection processes starts, or the order is after the performance of at least one of the second inspection processes ends.

7. In paragraph 1, An electronic device wherein the above plurality of inspection processes are associated with a plurality of hardware components included in the electronic device.

8. On the server, memory for storing at least one program; and At least one processor electrically connected to said memory and configured to execute at least one instruction of a program stored in said memory; At least one processor of the above: Identify inspection data associated with previous performance results of multiple inspection processes; Based on the above identified inspection data, scheduling is performed so that the plurality of inspection processes are performed during overlapping or non-overlapping time periods; The above test data is, The failure rate of each of the multiple inspection processes based on the overlapping time periods during which the multiple inspection processes were performed, The time required for each of the multiple inspection processes based on the overlapping time periods during which the multiple inspection processes were performed, or A server, comprising at least one of data associated with a time at which each of the plurality of inspection processes can start after booting.

9. In paragraph 8, Further comprising a transceiver unit for performing communication with the electronic device, At least one processor of the above, A server for receiving a list of inspections associated with the plurality of inspection processes from the electronic device, and controlling the transceiver to transmit scheduling information including a result of the scheduling to the electronic device in response to receiving the list of inspections.

10. In paragraph 8, Based on the result of the above scheduling, scheduling information including information indicating the execution order of each of the plurality of inspection processes is generated; The execution order of at least one first inspection process among the plurality of inspection processes is set differently from the execution order of at least one second inspection process among the plurality of inspection processes based on a condition associated with the inspection data; The conditions associated with the above inspection data are: A first condition indicating that a failure rate of the at least one first inspection process or the at least one second inspection process is greater than or equal to a threshold value, based on an overlap between a time period during which the at least one first inspection process and the at least one second inspection process are performed; A second condition indicating that the time required for the at least one first inspection process or the at least one second inspection process is greater than or equal to a threshold time, based on the overlapping of the time periods during which the at least one first inspection process and the at least one second inspection process are performed, or A server comprising at least one of a third condition indicating that a post-boot inspection start time of the at least one first inspection process is different from a post-boot inspection start time of the at least one second inspection process.

11. A method for an electronic device to perform multiple inspection processes, An operation for identifying scheduling information associated with the plurality of inspection processes; and An operation of performing the plurality of inspection processes based on the above scheduling information; The execution time intervals of the plurality of inspection processes indicated by the above scheduling information may or may not overlap; The above scheduling information is determined based on inspection data associated with previous execution results of the plurality of inspection processes; The above test data: The failure rate of each of the multiple inspection processes based on the overlapping time periods during which the multiple inspection processes were performed, The time required for each of the multiple inspection processes based on the overlapping time periods during which the multiple inspection processes were performed, or A method, comprising at least one of data associated with a time at which each of the plurality of inspection processes can start after booting.

12. In paragraph 11, The action of identifying the above scheduling information is: An action of transmitting a list of inspections associated with said plurality of inspection processes to a server; In response to transmitting the above inspection list, an operation of receiving the scheduling information from the server; and A method comprising an action of identifying the received scheduling information.

13. In paragraph 11, The action of identifying the above scheduling information is: An action of transmitting a list of inspections associated with said plurality of inspection processes to a server; In response to transmitting the above inspection list, an action of receiving the inspection data from the server; An operation for performing scheduling for the plurality of inspection processes based on the received inspection data; and A method comprising an action of identifying scheduling information including a result of said scheduling.

14. In a method for a server to schedule multiple inspection processes, An operation for identifying inspection data associated with previous execution results of the above multiple inspection processes; and An operation for scheduling the plurality of inspection processes to be performed in overlapping or non-overlapping time periods based on the identified inspection data, The above test data: The failure rate of each of the multiple inspection processes based on the overlapping time periods during which the multiple inspection processes were performed, The time required for each of the multiple inspection processes based on the overlapping time periods during which the multiple inspection processes were performed, or A method, comprising at least one of data associated with a time at which each of the plurality of inspection processes can start after booting.

15. In paragraph 14, An operation of receiving a list of inspections associated with said plurality of inspection processes from said electronic device; and A method further comprising, in response to receiving said inspection list, transmitting scheduling information including a result of said scheduling to said electronic device.

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