Apparatus and method for determining surface properties

Abstract

The invention relates to a fluorescence measuring device (1) for examining optical properties of surfaces, comprising: a housing (10); a first radiation device (2a, 2b, 2c) disposed within the housing (10) and suitable and intended for outputting radiation and in particular light onto a surface to be examined; a first radiation detection device (4) disposed within the housing (10) and suitable and intended for sensing radiation radiated at the surface to be examined and reflected and / or scattered and / or diffusely reflected by the surface, said first radiation detection device being suitable and intended for analyzing the radiation incident on it with respect to the wavelength of said radiation, and the housing (10) having an opening (22) through which the first radiation device (2a) outputs radiation onto the surface, characterized in that the fluorescence measuring device (1) has a second radiation detection device suitable and intended for analyzing the radiation incident on it with respect to the wavelength of said radiation, said second radiation detection device being able to be disposed outside the housing such that, from the first radiation device (2a, 2b, 2c), radiation reaches said second radiation detection device.

Description

[0001]HANNKE BITTNER & PARTNERPATENTANWÄLTE RECHTSANWÄLTE Prüfeninger Straße 1 93049 Regensburg BYK-Gardner GmbH December 11, 2024 Lausitzer Str.8 BKG01-046-WOPT 82538 Geretsried BI / fa / gu Device and method for determining surface properties Description The present invention relates to a device and a method for determining surface properties and in particular fluorescence properties and in particular for calibrating a device for determining such properties. Such devices and methods have been known for a long time. In particular, the present invention relates to a device for measuring the fluorescence of surfaces and a method for calibrating such a device. Corresponding fluorescence measuring devices are known from the prior art. A surface to be examined is irradiated with light and the fluorescence orthe fluorescent radiation is determined. To calculate the fluorescence component of a sample, the ratio between the excitation, i.e., the energy of the exciting light, and the spontaneous emission of the remitted light must be determined. This is typically done using illumination with monochrome or filtered light, for example, from an LED. For fluorescence measurements (particularly in c2v (color2view)), light-emitting diodes or light sources in the ultraviolet spectral range, for example, 310 nm, 320 nm, 340 nm, are used. The problem here is that common spectrometers, which are components of such fluorescence measuring devices, "do not see" this light because their spectral range only begins to be used at a HANNKE BITTNER & PARTNER BKG01-046-WOPT. - 2 -longer wavelength such as 340 nm or 350 nm. In addition, there is also the problem that temperature-related changes in LED brightness must be taken into account. The present invention is therefore based on the object of providing a device and a method which enable the evaluation of a measuring device such as a spectrometer despite its insufficient spectral range. This is achieved according to the invention by the subject matter of the independent patent claims. Advantageous embodiments and further developments are the subject matter of the dependent claims. A fluorescence measuring device according to the invention for examining optical properties of surfaces and in particular fluorescence properties has a housing, a first radiation device arranged within the housing, which is suitable and intended to emit radiation, and in particular light, onto a surface to be examined.Furthermore, a first radiation detector device is provided within the housing, which is suitable for receiving radiation irradiated onto the surface to be examined and reflected and / or scattered and / or remitted by the surface. This first radiation detector device is suitable and intended for analyzing and / or detecting the wavelength of the radiation impinging on it. Furthermore, the housing has an opening through which the first radiation device emits radiation onto the surface. According to the invention, the fluorescence measuring device has a second radiation detector device, which is suitable and intended for analyzing the wavelength of the radiation impinging on it and / or for outputting a signal that depends on the wavelength of the radiation impinging on the radiation detector device.In this case, this second radiation detector device can preferably be arranged and / or provided outside the housing, but in particular in such a way that radiation emitted by the first radiation device and / or radiation resulting therefrom, such asHANNKE BITTNER & PARTNER BKG01-046-WOPT. - 3 -For example, remitted radiation (in particular through the opening) reaches this second radiation detector device. In particular, radiation that reaches a surface, and in particular a measurement sample, from the first radiation device and is scattered and / or reflected and / or remitted by the measurement sample (and / or from which the measurement sample emits fluorescent radiation) reaches this radiation detector device. Therefore, within the scope of the invention, it is proposed to equip the fluorescence measuring device with an external spectral analysis device in addition to the internal spectral analysis device. With the aid of this second radiation detector device, calibration of the device can take place, as described in more detail below. However, this second radiation detector device is preferably no longer used during measurement operation (i.e., in particular outside of calibration operation).Particularly preferably, the second radiation detector device is separable from the housing. Particularly preferably, this second radiation detector device serves in particular for calibrating the fluorescence measuring device. In a preferred embodiment, this second radiation detector device is arranged or can be arranged outside the housing in such a way that radiation emanating from the first radiation device and / or resulting from this radiation and / or passing through the opening reaches the second radiation detector device (at least) indirectly. By indirectly is meant that preferably not this radiation itself arrives at the second radiation detector device, but rather radiation resulting from this radiation (for example remitted, scattered or reflected). Particularly preferably, no radiation reaches the second radiation detector device directly from the radiation device.Preferably, the radiation first exits the housing through the opening, then onto a measurement sample, and radiation resulting from the exiting radiation from this measurement sample, such as reflected, scattered, and / or remitted radiation, reaches the second radiation detector device.HANNKE BITTNER & PARTNER BKG01-046-WOPT. - 4 -Particularly preferably, no radiation passes directly from the first radiation device to the first radiation detector device. In a further advantageous embodiment, the fluorescence measuring device has a sample holder that can be arranged outside the housing and that positions a measurement sample such that radiation from the first radiation device can be directed (through the opening) onto the measurement sample, and the secondary radiation caused by this radiation through the measurement sample, in particular scattered, reflected, or remitted radiation, can be directed onto the second radiation detector device. In particular, this is remitted radiation. However, it would also be conceivable for a further opening to be provided in the housing to carry out this measurement, which is in particular a calibration measurement.It would also be possible, for example, for radiation to be coupled out of the housing via a light guide or the like specifically for calibration measurements. In a further advantageous embodiment, the (measurement) sample is a white standard body or a fluorescent standard body. The sample is preferably used for calibration measurements. In a preferred embodiment, the sample holder arrangement is designed such that the sample is held in an orientation that is oblique or perpendicular to the surface to be examined (in a working mode). Particularly preferably, the sample holder is designed such that it can be placed on the opening of the device and / or arranged on it without any light other than the light originating from the first radiation device entering this housing. Preferably, radiation, and in particular light from the radiation device, reaches the sample and the radiation resulting therefrom, i.e.In particular, reflected, scattered or re-mitted radiation reaches the second radiation detector device. Particularly preferably, a measuring range and in particular aHANNKE BITTNER & PARTNER BKG01-046-WOPT. - 5 -Wavelength measurement range of the first radiation detector device and a measurement range of the second radiation detector device from each other. Preferably, the second radiation detector device has a larger measurement range than the first radiation detector device. Particularly preferably, the second radiation detector device has a larger measurement range, particularly towards smaller wavelengths, than the first radiation detector device. Particularly preferably, the second radiation detector device is suitable and intended to detect radiation in a wavelength range between 300 nm and 900 nm, preferably between 310 nm and 700 nm. Particularly preferably, the second radiation detector device, and in particular the radiation detector device located in the housing, is suitable and intended to detect radiation in a wavelength range from 320 nm, preferably from 330 nm, and particularly preferably from 340 nm.The present invention is further directed to a sample holder arrangement for performing calibration measurements, in particular for fluorescence measuring devices. This sample holder arrangement comprises a sample carrier with a housing, a sample holder device arranged within the housing, to which a flat sample is releasably attached, and a first opening through which radiation can be directed onto the sample. Furthermore, the sample holder arrangement has a second opening, which is in particular spaced apart from the first opening and through which radiation emitted and / or scattered and / or remitted by the sample can exit the housing. This second opening forms an interface for connecting a radiation detector device. In particular, the radiation detector device is a spectrometer.According to the invention, the cross sections of the first opening and the second opening extend at an angle other than 0° and, in particular, perpendicular to one another. This ensures that radiation introduced into the housing through the first opening never reaches the radiation detector device directly. Particularly preferably, the sample holder arrangement has a base surface which is configured in such a way that it can be used. - 6 -can be applied to an opening of a fluorescence device such that radiation emerging from the opening of the fluorescence measuring device through the opening of the sample holder device enters exclusively the housing. Thus, the sample holder arrangement can particularly preferably be optically insulated from the housing of the fluorescence measuring device such that no extraneous light, which could falsify a measurement and in particular a calibration measurement, can enter the housing through the first opening. Particularly preferably, the sample holder arrangement has fixing means which enable rotation of the sample holder arrangement relative to an opening of the fluorescence measuring device with respect to a fixed axis of rotation. This rotation with respect to the fixed axis of rotation is understood in particular to mean that only rotation of the housing or the sample holder arrangement in a specific state is possible, but not displacement relative to the housing.Particularly preferably, the sample holder arrangement comprises engagement means which ensure that, when the sample holder arrangement is arranged at the opening, no displacement of the sample holder arrangement is possible in the plane of the opening, but only in a direction perpendicular thereto (e.g., for removing the sample holder arrangement). Particularly preferably, the sample holder arrangement comprises display means which indicate the position of the sample. In this way, the sample holder arrangement can be aligned with different radiation devices inside the fluorescence measuring device. However, the sample holder arrangement or a rotation of the sample holder arrangement preferably also changes a position of the second radiation detector device and / or a position of the second opening. Particularly preferably, the sample holder arrangement comprises an output coupling device for outputting light from the housing.In this case, for example, an optical light guide can be provided, which can be arranged in the second opening or at the second opening, so that light originating from the sample can be guided via this second opening, for example, towards a spectrometer. The present invention is further directed to a method for calibrating a HANNKE BITTNER & PARTNER BKG01-046-WOPT. - 7 -A fluorescence measuring device for examining the optical properties of surfaces, wherein the following steps are carried out: A first sample body is illuminated with a first radiation device arranged inside a housing of the fluorescence measuring device. In a further step, the radiation emitted by the first sample body in reaction to and / or as a result of the illumination is recorded with a first radiation detector device, wherein this first radiation detector device is suitable and intended to analyze the radiation incident on it with regard to its wavelength. In a further method step, a second sample body is illuminated with the first radiation device (which is arranged inside the housing of the fluorescence measuring device).In a further method step, the radiation emitted by the second sample body in response to the illumination is recorded by a second radiation detector device, which is also suitable and intended to analyze the radiation impinging on it with regard to its wavelength. The steps specified here can also be carried out in a different order. Particularly preferably, the first radiation detector device and / or the second radiation detector device outputs at least one value or signal that is also characteristic of at least one wavelength of the radiation impinging on it. In a preferred method, the first sample body is a standard sample body and in particular a fluorescent standard sample body.This means that the sample body, in response to the radiation impinging on it, remits radiation again, and in particular remits radiation at a displaced and, in particular, higher wavelength. In a further preferred method, a first value is output that is characteristic of the radiation impinging on the first radiation detector device. In a HANNKE BITTNER & PARTNER BKG01-046-WOPT. - 8 -In another preferred method, a second value is output which is characteristic of the radiation incident on the second radiation detector device. Preferably, a value characteristic of the radiation device or the radiation emitted by the radiation device is output based on the first and second values. Particularly preferably, the first value is a UV excitation energy of the radiation device. Particularly preferably, the first radiation device is or has at least one LED. In another preferred method, another sample body is illuminated with the first radiation device, which is arranged inside the housing of the fluorescence measuring device.In a further preferred method, the radiation emitted by the further sample body in response to the illumination, for example, the radiation scattered, reflected, and / or remitted by the further sample body, is recorded using the second radiation detector device, which, as mentioned above, is suitable and intended to analyze the incident radiation with regard to its wavelength. Preferably, a third value is output that is characteristic of the radiation incident on the second radiation detector device. Preferably, the second sample body is also a standard or reference body. Particularly preferably, the second sample body is a white standard. The white standard is a neutral standard whose remission spectrum from 300 nm to 700 nm is preferably approximately constant and lies at almost 100%.It serves as a reference standard for recording the total energy emitted by the light sources, especially the UV LEDs. The fluorescent reference standard must emit the light absorbed by the UV LEDs (especially with a wavelength shift). This means that the excitation wavelength range of the standard must include the UV LED spectra (at least partially and preferably completely). Preferably, the spontaneous emission lies within the spectral range. - 9 -Range of the device spectrometer. In a further preferred method, the second radiation detector device is an external radiation detector device. External means that this radiation detector device is arranged on the fluorescence measuring device, particularly for calibration measurements, or is brought into (an optical) connection with it (for example, via a light guide). In a further preferred method, the value characteristic of the radiation device or the radiation emitted by the radiation device is output, also taking the third value into account. In a preferred method, a correction is further performed, which occurs due to a temperature-related energy change of the radiation sources, in particular the LEDs.Particularly preferably, a radiation detector device, and in particular a photoelement, is used for this purpose, which is arranged at a shallow angle, for example an angle between 10° and 30°, preferably between 15° and 25°, and particularly preferably between 28° and 32°. Particularly preferably, a filter device, in particular an illuminant C filter device, is removed to carry out this measurement. A correction polynomial, which is preferably derived from measurements with a gloss sensor, is preferably used for the correction. In a further preferred method, anode voltages of the fluorescence LEDs are determined. The (wavelength-dependent) correction value is preferably determined as follows: HANKE BITTNER & PARTNER BKG01-046-WOPT. - 10 - Where k denotes adapta wavelength-dependent adaptation factor. The values ​​ai, bi, ci are coefficients for calculating the temperature-dependent intensity change of the LED spectrum. AV denotes the anode voltage of the LED (this is indirectly proportional to the temperature of the LED). Ec2v denotes the wavelength-dependent sensitivity of the spectrometer. The value ITec5 denotes the wavelength-dependent intensity of the LED measured on the white reference standard with an external spectrometer. Sc2v,white is the integral of the measurement with the device spectrometer and on the white reference standard. STec5,white is the integral of the measurement with the external spectrometer and on the white reference standard. This results in: where: ^^,^^^(^) = ^^^^^^(^) ∗ ^^HANNKE BITTNER & PARTNER BKG01-046-WOPT - 11 - Further advantages and embodiments emerge from the attached figures. Therein: Fig. 1a, b show two schematic representations to explain the principle of the invention; Fig. 2 shows a view into the interior of the device through the measuring openings; Fig. 3 shows an interior view of a device according to the invention; Fig. 4 shows a further interior view of a device according to the invention; Figs. 5a-c show three representations of intensity curves; Fig. 6 shows a derivation for determining the intensity curves; and Fig. 7 shows a view of a sample holder arrangement. Fig. 1a shows a representation to explain the invention. A fluorescence measuring device 1 with a housing 10 is provided. This fluorescence measuring device has an opening 22 (here, however, concealed) through which radiation can exit the housing 10 but also enter the housing. A first radiation detector device is provided inside the housing.Reference numeral 8 denotes a second radiation detector device, which, as mentioned above, can be arranged outside the housing. Reference numeral 15 denotes a light source. This is preferably an external (reference) light source. This light source preferably has a continuous spectrum between 340 nm and 150 nm. - 12 -760nm. This light source is preferably used to determine the c2v spectrometer sensitivity. Fig. 1b shows an advantageous embodiment of the invention. In this case, a sample holder, designated as a whole by 14, is provided, which serves to hold a measurement sample 16. This measurement sample 16 is held such that it extends perpendicular to the opening of the housing 10. Radiation reaching the measurement sample 16 causes fluorescence radiation, which in turn reaches the second radiation detector device 8. The reference numeral 17 denotes an output device via which radiation is output from the sample holder device 14 and / or guided to the second radiation detector device 8. The second radiation detector device can be, in particular but not exclusively, a Tec5 spectrometer. It is particularly preferably an absolutely calibrated spectrometer. Fig.2 shows a view into the interior of the housing through the opening 22. In particular, this is a vertical view through the measuring opening 22, for example from above. The optical block of the device can be seen here, which has a quantitative fluorescence measuring device and preferably also a gloss measuring device. In addition, the device can preferably also be used as a color measuring device. For this purpose, a plurality, more precisely ten, radiation devices or light sources 2a, 2b, 2c are provided. These are each white light LEDs, which serve as illumination for an optional color measurement. These light sources 2a, 2b, 2c are particularly preferably arranged such that they enable illumination of the surface, i.e., the surface to be examined, at an angle of 45°.Reference numerals 2d, 2e, and 2f refer to a plurality of light sources, which apply colored light (in particular for the purpose of the fluorescence measurement under consideration here) to the surface. This can be achieved by using colored light LEDs. However, it would also be possible and preferred to provide white light LEDs at this location, albeit with narrow-band filtering. As HANKE BITTNER & PARTNER BKG01-046-WOPT. - 13 -Another possible illumination option is monochrome LEDs, which are additionally equipped with narrowband filters whose bandwidth is narrower than the natural bandwidth of the monochrome LEDs. Particularly preferably, these light sources 2d, 2e, 2f emit light at different wavelengths, in particular in a wavelength range of 300–660 nm. Reference numeral 4 denotes a second radiation detector device, and in particular a spectrometer. This is suitable and intended to record light from irradiation devices 2a–2f or the light reflected from the surface (not shown), and in particular also the fluorescent light or the radiation remitted by the surface. This radiation detector device has a smaller measuring range, particularly at shorter wavelengths, than the second radiation detector device 8 described above.Reference numeral 12 denotes a preferably provided second radiation device, which also serves to radiate light onto the surface to be examined (not shown). This light is reflected by the surface and can thus reach the second radiation detector device 13. Preferably, the second radiation device and the second radiation detector device 13 form a gloss measuring device. Fig. 3 shows an internal view of the device described here. A preferably provided internal calibration body 6 is shown, which is arranged on a holder 62 and can be pivoted with respect to a pivot axis S, on the one hand, into a position in which it is not in the beam path (shown in Fig. 3) and, on the other hand, into a position in which it is applied to the opening 22 from the inside (Fig. 4).Reference numeral 41 denotes a tubular body through which radiation can be directed onto the radiation detector device (not shown). Reference numeral 45 denotes an optical means, such as a lens, which serves to focus the radiation impinging on the radiation detector device. Reference numeral 52 denotes a housing part that adjoins the opening 22. This housing part is, in particular, radiation-absorbing and, in particular, in HANKE BITTNER & PARTNER BKG01-046-WOPT. - 14 -Black. Reference numeral 32 schematically denotes a processor device which, among other things, serves to control the device 1. In addition, this processor device serves the purpose of determining the functions for calculating the temperature-dependent UV-LED spectra and also of determining or changing calibration factors. Reference numeral 34 denotes a memory device which serves in particular for storing calibration factors. Fig. 4 shows a representation of the device according to the invention, wherein the first calibration body 6, i.e. the inner standard (or the first sample body), is pivoted into a position in which a calibration can be carried out. Reference numeral 27 denotes an optics block in which the individual radiation devices 2a-2c and also 2d-2f are arranged. Figs. 5a-5c illustrate, with reference to the embodiment of Fig.1 Calculations for determining the spectrometer's sensitivity. Fig. 5a shows a spectrum of a given light source, recorded with the second radiation detector device 8. Fig. 5b shows a spectrum of the given light source, recorded with the first radiation detector device 4. Fig. 5c shows the standardized spectral sensitivity of the color2view spectrometer. Fig. 6 illustrates a preferred method. In this preferred method, the light emitted by the first radiation device, which may be, for example, an ultraviolet LED, is directed onto a first sample body, in particular a white standard sample body, and the HANNKE BITTNER & PARTNER BKG01-046-WOPT - 15 -The light remitted from this is measured with a radiation detector device, and in particular an external radiation detector device and in particular an external spectrometer (TEC5). The following relationship (I) applies: STec5white denotes the integral of the measurement with the TEC5 spectrometer and the white sample standard. Figure 6 shows the intensity profile in the wavelength range from 260 nm to 700 nm, with the peak in the range between 300 nm and 350 nm being particularly visible. The integration is performed over the recorded intensity over a wavelength range of + / - 20 nm with respect to a wavelength of maximum intensity. In a further step, the light emitted by one or more radiation devices, for example, one or more UV LEDs, is directed onto a fluorescent sample body, and in particular a fluorescent standard (e.g., RAL 1026). The remitted light is also measured with the aforementioned radiation device, i.e., with an external spectrometer (e.g., TEC5).In the intensity curve shown on the right in Figure 6, one can again see the peak that also appears in the intensity curve shown above, but also the range in which the fluorescence radiation occurs, ie, in the wavelength range between 460 nm and 600 nm. The following relationship (II) applies to this measurement: HANKE BITTNER & PARTNER BKG01-046-WOPT. - 16 - ^^^ ^^^Here, too, the recorded intensity is integrated over the entire wavelength range from 450 nm to 700 nm. Measurement is also performed here using the TEC5 spectrometer, but, as mentioned, using the fluorescent standard RAL 1026. In a further process step, the light emitted by one or more radiation devices, for example UV LEDs, is again directed onto a fluorescent standard body, and in particular the above-mentioned fluorescent standard body (RAL 1026), and the remitted light is detected and / or measured with the first radiation detector device, in particular with the spectrometer device arranged within the housing of the fluorescence measuring device. Here, too, the intensity curve is shown. The area in which fluorescence occurs can be seen here. The peak at approx.320nm is not visible here, since this wavelength range is outside the measuring range of the (internal) radiation detector device. The following relationship applies: (III)^^^ ^^^^,^^^^^^^ = ^ ^^^^,^^^^^^^^ (^) ^^^^^ The desired calibration value (which cannot be determined directly with the internal fluorescence measuring device) is obtained from the above values ​​as follows:. HANNKE BITTNER & PARTNER BKG01-046-WOPT - 17 -It should be noted that although the steps mentioned here are preferably carried out in the specified order, execution in other orders may also be possible and preferred. Particularly preferably, one value or a plurality of values ​​is output for each of these measurements. The output values ​​can, for example, be wavelength-dependent values, i.e., for each of the measurements, a plurality of values ​​are given which, in particular, extend and / or are located in a predetermined wavelength range. Thus, for example, it is possible to carry out the first measurement specified above with the white test body only in a specific wavelength range, for example in a wavelength range around a maximum wavelength, namely the wavelength of the respective illumination device + / - 20 nm.This is preferably a wavelength range that can be detected by only one of the two radiation detector devices, and in particular the external radiation detector device. Particularly preferably, it is a range that cannot be detected by the first or the other radiation detector device, and in particular by the radiation detector device located inside the housing. In particular, this value is an integral and / or an integrated value. Preferably, the second of the above-mentioned measurements is measured in a predetermined wavelength range, for example, from 450 nm to 700 nm, and the corresponding measured values ​​are integrated. Preferably, the third measurement described above also records wavelength ranges from approximately 450 nm to 700 nm, but in particular in the visible range, and an integral is output and / or measured for this as well.For calibration, a value is output that takes the three values ​​mentioned above into account. This can be expressed, for example, using the formula given above under III. HANKE BITTNER & PARTNER BKG01-046-WOPT. - 18 -In general, a wavelength range that lies within the measurement range of both radiation detector devices is preferably selected for integration. Overall, the excitation energy of the UV LED or UV light source can be determined using the above calculations. Fig. 7 shows a view of a sample holder arrangement for performing the calibration measurements described above and / or for performing fluorescence measurements. Reference numeral 142 refers to a rotating device that enables the sample to be aligned with the differently arranged light sources 2d, 2e, 2f. Reference numeral 144 denotes a measurement sample that is held on a carrier that is essentially cylindrical in this case. A fastening mechanism 146 can be used to release a specific sample and replace it, for example, with another (measurement) sample.Reference numeral 150 designates an optional device for locking the sample holder after alignment with the light source 2d, 2e, 2f... The applicant reserves the right to claim all features disclosed in the application documents as essential to the invention, provided that they are novel, individually or in combination, compared to the prior art. It is further noted that the individual figures also describe features that may be advantageous in themselves. Those skilled in the art will immediately recognize that a specific feature described in a figure may be advantageous even without adopting further features from that figure. Furthermore, those skilled in the art will recognize that advantages may also result from a combination of several features shown in individual or different figures.

Claims

HANNKE BITTNER & PARTNER BKG01-046-WOPT - 19 - Device and method for determining surface properties Patent claims 1. Fluoreszenzmesseinrichtung (1) zum Untersuchen von optischen Eigenschaften von Oberflächen mit einem Gehäuse (10), mit einer ersten innerhalb des Gehäuses (10) angeordneten ersten Strahlungseinrichtung (2d, 2e, 2f), welche dazu geeignet und is intended to emit radiation and in particular light onto a surface to be examined, with a first radiation detector device (4) arranged within the housing (10), which is suitable and intended to emit radiation irradiated onto the surface to be examined and reflected from the surface and / or estreute und / oder remittierte Strahlung aufzunehmen, wobei diese erste Strahlungs- detector device is suitable and intended to measure the radiation incident on it h insichtlich ihrer Wellenlänge zu analysieren wobei das Gehäuse (10) eine Öffnung (22) aufweist, durch welche hindurch die erste Strahlungseinrichtung (2d) Strahlung onto the surface, characterized in that the fluorescence measuring device (1) has a second radiation detector device (8) which is suitable and intended to analyze the radiation incident on it with regard to its wavelength, said second radiation detector oreinrichtung derart außerhalb des Gehäuses anordenbar ist, dass von der erstenRadiation device (2a, 2b, 2c) radiation reaches this second radiation detector device.

2. Fluoreszenzmesseinrichtung (1) nach Anspruch 1, characterized in that this second radiation detector device (8) can be arranged outside the housing in such a way that radiation emanating from the first radiation device (2a, 2b, 2c) and / or radiation resulting therefrom and passing through the opening reaches this second radiation detector device (8).

3. Fluoreszenzmesseinrichtung (1) nach wenigstens einem der vorangegangenen An- sayings, HANNKE BITTNER & PARTNER BKG01-046-WOPT - 20 - characterized in that the fluorescence measuring device comprises a sample h which can be arranged outside the housing. alteeinrichtung (14) aufweist, welche eine Messprobe (16) derart anordnet, dass von the first radiation device can direct radiation onto the measuring sample (16) and secondary radiation caused by this radiation through the measuring sample (16) can be directed onto the second radiation measuring device (8).

4. Fluoreszenzmesseinrichtung (1) nach wenigstens einem der vorangegangenen An- claims, characterized in that the sample is a white standard body or a fluorescent standard body.

5. Fluoreszenzmesseinrichtung (1) nach wenigstens einem der vorangegangenen An-claims, characterized in that the sample holder arrangement (50) is designed such that the sample is held in an orientation which is oblique or perpendicular to the surface to be examined.

6. Fluoreszenzmesseinrichtung (1) nach wenigstens einem der vorangegangenen An- claims, characterized in that a measuring range of the first radiation detector device differs from a measuring range of the second radiation detector device.

7. Probenhalteranordnung (14) zur Durchführung von Kalibriermessungen insbesonderefor fluorescence measuring devices (1) with a sample carrier with a housing (148), a sample holder device arranged within the housing to which a flat sample (16) is detachably fastened and with a first opening through which radiation can be directed onto the sample (16) and with a second opening (17) through which radiation emitted and / or scattered by the sample can exit the housing, said second opening (17) forming an interface for a radiation detector device and in particular for a spectrometer, characterized in that HANNKE BITTNER & PARTNER BKG01-046-WOPT - 21 - the cross sections of the first opening (58) and the second opening (62) extend at an angle different from 0° and are in particular perpendicular to one another.

8. Probenhalteranordnung (50) nach Anspruch 7,characterized in that the sample holder arrangement has a bottom surface which can be placed against an opening of a fluorescence device in such a way that radiation emerging from the opening of the fluorescence measuring device through the opening enters exclusively into the housing (52).

9. Probenhalteranordnung (50) nach wenigstens einem der vorangegangen Ansprüche, characterized in that the sample holder arrangement has fixing means which enable rotation of the sample holder arrangement relative to an opening of a fluorescence measuring device with respect to a fixed axis of rotation.

10. Verfahren zum Kalibrieren einer Fluoreszenzmesseinrichtung (1) zum Untersuchenof optical properties with the steps: Illuminating a first sample body (16) with a first radiation device (2a, 2b, 2c) which is arranged inside a housing of the fluorescence measuring device (1) Recording the radiation which was emitted by the first sample body in response to the illumination with a first radiation detector device which is suitable and intended to analyze the radiation impinging on it with regard to its wavelength Illuminating a second sample body (16) with the first radiation device (2a, 2b, 2c) which is arranged inside a housing of the fluorescence measuring device (1) Recording the radiation which was emitted by the second sample body in response to the illumination with a second radiation detector device which is suitable and intended to analyze the radiation impinging on it with regard to its wavelength. HANNKE BITTNER & PARTNER BKG01-046-WOPT - 22 - 11. Verfahren nach Anspruch 10,characterized in that a first value is output which is characteristic of the radiation impinging on the first radiation detector device and a second value is output which is characteristic of the radiation impinging on the second radiation detector device and preferably on the basis of the first and the second value a value characteristic of the radiation device or the radiation output by the radiation device is output.

12. Verfahren nach wenigstens einem der vorangegangenen Ansprüche, characterized in that a further sample body is illuminated with the first radiation device which is arranged in the interior of a housing of the fluorescence measuring device (1).

13. Verfahren nach Anspruch 12,characterized by the step of: recording the radiation emitted by the further sample body in response to the illumination with a second radiation detector device which is suitable and intended to analyze the radiation incident on it with regard to its wavelength and preferably a third value is output which is characteristic of the radiation incident on the second radiation detector device.

14. Verfahren nach wenigstens einem der vorangegangenen Ansprüche, characterized in that the second radiation detector device (8) is an external radiation detector device.

15. Verfahren nach Anspruch 12, characterized in that the value characteristic of the radiation device or the radiation emitted by the radiation device is output, also taking into account the third value.

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