Testing connector

Abstract

A testing connector according to an exemplary embodiment is a testing connector disposed between a device under test and test equipment, and comprises: a conductive part extending in the vertical direction between the device under test and the test equipment, and electrically connecting the device under test and the test equipment to each other; and an insulating housing having a through-hole formed in the vertical direction so that the conductive part is accommodated therein, wherein the through-hole includes a plurality of supports that protrude toward the conductive part and are arranged to be spaced from each other in the circumferential direction of the through-hole.

Description

Inspection connector

[0001] The present disclosure relates to a test connector disposed between a test device and a test equipment and used for testing the test device.

[0002] To inspect devices under test (DUTs), such as semiconductor devices, connectors are used between the inspection equipment and the DUT. These connectors electrically connect the inspection equipment and the DUT. As an example of such connectors, a conductive rubber sheet capable of elastically deforming in response to pressure applied by the DUT is known in the art.

[0003] A conductive rubber sheet has a plurality of conductive portions and an insulating portion that insulates the plurality of conductive portions from each other. A plurality of metal particles are electrically assembled in a vertical direction to form each conductive portion. Each conductive portion transmits a signal between a test device and a device under test. The insulating portion is made of an elastic insulating material and maintains the conductive portions in a vertical direction. The insulating portion has a thickness corresponding to the height of the conductive portions and can be formed integrally with the conductive portions. A pressing force is applied to the conductive portions via the device under test, and the conductive portions are elastically deformed in response to the pressing force.

[0004] In order for the conductive part to exhibit a certain level of conductivity (low resistance), the applied pressure through the device under test must be above a certain level. However, the conductive part is constrained by the insulating part and cannot elastically deform or recover beyond the desired level. Therefore, a strong pressure must be applied to the conductive part through the device under test. This strong pressure can damage the device under test. Repeated testing under a strong pressure can cause damage to the conductive part and reduce the service life of the conductive rubber sheet. Therefore, the conductive part is required to be able to elastically deform smoothly under a low pressure and to have high operability and durability.

[0005] To improve the operability and durability of the conductive part, it may be considered to form a gap along the periphery of the conductive part to separate the conductive part and the insulating part along the periphery of the conductive part. However, if the gap formed along the periphery of the conductive part is narrow, the conductive part receiving a pressing force from the device under test cannot expand smoothly and has poor operability. In addition, the pressing force cannot be distributed through the conductive rubber sheet. If the gap formed along the periphery of the conductive part is wide, the conductive part is more likely to buckle in a direction orthogonal to the direction in which the pressing force is applied rather than expand in response to the pressing force. If the conductive rubber sheet is repeatedly used for testing the device under test, the buckling of the conductive part causes damage to the conductive part and reduces the durability of the conductive part.

[0006] Embodiments of the present disclosure improve or resolve at least some of the problems of conventional insulating components. To this end, a plurality of embodiments provide a test connector having an insulating housing having a plurality of support members protruding within a through hole.

[0007] Embodiments according to one aspect of the present disclosure relate to a test connector. An exemplary embodiment of the test connector is a test connector disposed between a device to be tested and a test equipment, and includes a conductive portion extending vertically between the device to be tested and the test equipment and electrically connecting the device to the test equipment and an insulating housing having a through hole formed vertically to accommodate the conductive portion. The through hole includes a plurality of support members protruding toward the conductive portion and arranged spaced apart from each other in a circumferential direction of the through hole.

[0008] In one embodiment, the number of supports may be three.

[0009] In one embodiment, the through hole may further include a plurality of recesses spaced apart from the outer surface of the conductive member and spaced apart from each other in the circumferential direction of the through hole, each recess being positioned between two adjacent supports among the plurality of supports.

[0010] In one embodiment, at least a portion of the conductive member may be supported by at least one of the plurality of supports.

[0011] In one embodiment, the distance between the plurality of supports and the outer surface of the conductive member may be shorter than the distance between the plurality of recesses of the through hole and the outer surface of the conductive member.

[0012] In one embodiment, each of the plurality of supports can extend vertically within the through hole.

[0013] In one embodiment, the insulating housing may include a first insulating housing and a second insulating housing stacked on at least one of the upper and lower sides of the first insulating housing.

[0014] In one embodiment, the first insulating housing may be formed with a cylindrical through hole, and the second insulating housing may be formed with a through hole having a plurality of supports.

[0015] In one embodiment, a first insulating housing having a cylindrical through hole formed therein and a second insulating housing having a plurality of supports and a through hole formed therein may be alternately laminated in a plurality of layers.

[0016] In one embodiment, the conductive member may include a plurality of conductive members and may further include a support member that supports the plurality of conductive members.

[0017] In one embodiment, the support member can be configured to support the plurality of conductive members on at least one side of the upper and lower sides of the plurality of conductive members.

[0018] In one embodiment, the support member may be formed with a plurality of support through-holes spaced apart from the outer surface of each of the plurality of conductive members. The support member may include a plurality of protrusions that protrude from each of the plurality of support through-holes toward each of the plurality of conductive members, are spaced apart from each other in the circumferential direction of each of the plurality of conductive members, and are in contact with the outer surface of each of the plurality of conductive members.

[0019] In one embodiment, the insulating housing may include a first insulating housing having a first through-hole formed therein with a plurality of supports, and a second insulating housing having a second through-hole formed therein with a plurality of supports. The conductive portion may include a plurality of conductive portions. The inspection connector may further include a support portion that supports the plurality of conductive portions and is positioned between the first insulating housing and the second insulating housing.

[0020] In one embodiment, the support member may be formed with a plurality of support through-holes spaced apart from the outer surface of each of the plurality of conductive members. The support member may include a plurality of protrusions that protrude from each of the plurality of support through-holes toward each of the plurality of conductive members, are spaced apart from each other in the circumferential direction of each of the plurality of support through-holes, and are in contact with the outer surface of each of the plurality of conductive members.

[0021] In one embodiment, the inspection connector may further include a first coupling portion that couples a plurality of conductive portions at an upper portion of the first insulating housing, and a second coupling portion that couples a plurality of conductive portions at a lower portion of the second insulating housing.

[0022] According to an embodiment of a test connector, a plurality of supports are provided such that the through hole protrudes toward the conductive portion and is spaced apart from each other in the circumferential direction of the through hole, so that the conductive portion receiving a pressure from the device to be tested can smoothly expand, while suppressing or preventing the conductive portion from buckling in a direction orthogonal to the direction in which the pressure is applied. Accordingly, not only can good operability of the conductive portion be secured, but also the durability of the conductive portion can be improved.

[0023] FIG. 1 schematically illustrates an example in which a test connector according to one embodiment of the present disclosure is used.

[0024] FIG. 2 is a partial cross-sectional view illustrating a portion of a connector for inspection according to one embodiment of the present disclosure.

[0025] Figure 3 is a partial perspective view showing the conductive part and insulating housing of the inspection connector illustrated in Figure 2.

[0026] Figure 4 is an exploded perspective view showing the conductive part and insulating housing of the inspection connector illustrated in Figure 3.

[0027] FIG. 5 is a plan view showing the upper portion of the conductive part and insulating housing of the inspection connector shown in FIG. 3.

[0028] FIG. 6 is a partial cross-sectional view illustrating a test connector including a plurality of insulating housings according to one embodiment of the present disclosure.

[0029] FIG. 7 is a partial cross-sectional view illustrating a test connector including a plurality of insulating housings according to another embodiment of the present disclosure.

[0030] FIG. 8 is a partial cross-sectional view illustrating a test connector including a plurality of insulating housings according to another embodiment of the present disclosure.

[0031] FIG. 9 is a partial cross-sectional view illustrating a test connector including a support member according to one embodiment of the present disclosure.

[0032] FIG. 10 is a partial cross-sectional view illustrating a test connector including a support member according to another embodiment of the present disclosure.

[0033] FIG. 11 is a partial cross-sectional view illustrating a test connector including a support member according to another embodiment of the present disclosure.

[0034] FIG. 12 is a partial cross-sectional view illustrating a test connector including a support member according to another embodiment of the present disclosure.

[0035] FIG. 13 is a partial cross-sectional view illustrating a test connector including a support member and a coupling member according to one embodiment of the present disclosure.

[0036] The embodiments of this disclosure are provided for the purpose of illustrating the technical concepts of this disclosure. The scope of rights under this disclosure is not limited to the embodiments presented below or the specific descriptions of these embodiments.

[0037] All technical and scientific terms used in this disclosure, unless otherwise defined, have the meanings commonly understood by those of ordinary skill in the art to which this disclosure pertains. All terms used in this disclosure have been selected for the purpose of more clearly explaining this disclosure and are not intended to limit the scope of rights under this disclosure.

[0038] Expressions such as “including,” “comprising,” “having,” and the like used in this disclosure should be understood as open-ended terms that imply the possibility of including other embodiments, unless otherwise stated in the phrase or sentence in which the expression is included.

[0039] The singular forms described in this disclosure may include plural meanings unless otherwise stated, and the same applies to the singular forms described in the claims.

[0040] The expressions “first,” “second,” etc. used in this disclosure are used to distinguish between multiple components, and do not limit the order or importance of the components.

[0041] In this disclosure, when a component is referred to as being "connected" or "connected" to another component, it should be understood that the component can be directly connected or connected to the other component, or can be connected or connected via a new other component.

[0042] The directional terms "upward" and the like used in this disclosure are based on the direction in which the inspection connector is positioned relative to the inspection equipment, and the directional terms "downward" and the like mean the opposite direction of upward. It should be understood that the directional terms "upward and downward" used in this disclosure include the upward and downward directions, but do not mean a specific direction among the upward and downward directions.

[0043] Hereinafter, embodiments of the present disclosure will be described with reference to the attached drawings. In the attached drawings, identical or corresponding components are assigned the same reference numerals. Furthermore, in the description of the embodiments below, redundant descriptions of identical or corresponding components may be omitted. However, even if a description of a component is omitted, it is not intended that such component is not included in any embodiment.

[0044] The embodiments described below and examples illustrated in the attached drawings relate to a test connector used for testing a device under test. The test connector of the embodiments may be placed between the test equipment and the device under test during the test of the device under test, and may be used for testing the device under test. As an example, the test connector of the embodiments may be used for the final test of the semiconductor device in a post-process during the manufacturing process of the semiconductor device. However, the examples of tests to which the test connector of the embodiments is applied are not limited to the tests described above.

[0045] FIG. 1 schematically illustrates an example of using a test connector according to one embodiment of the present disclosure. FIG. 1 schematically illustrates the shapes of a test connector, a component to which the test connector is attached, a test device, and a device to be tested. The shapes illustrated in FIG. 1 are one example selected for understanding the embodiment.

[0046] As illustrated in FIG. 1, the inspection connector (100) is a sheet-shaped structure and is placed between the inspection equipment (20) and the device to be inspected (30). As an example, the inspection connector (100) may form a test socket. The inspection connector (100) is attached to a socket housing (40) and may be positioned on the inspection equipment (20) by the socket housing (40). The socket housing (40) may have a socket guide (41). A receiving hole (42) may be formed in the socket guide (41) in a vertical direction (VD). The socket housing (40) may be removably mounted on the inspection equipment (20) by the socket guide (41). The inspection connector (100) may be removably coupled to the socket guide (41). The device to be inspected (30), which is transported to the inspection equipment (20) manually or by a transport device, is received in the receiving hole (42) of the socket housing (40). The socket housing (40) aligns the device to be tested (30) with respect to the test connector (100). When testing the device to be tested (30), the test connector (100) contacts the test equipment (20) and the device to be tested (30) in the vertical direction (VD), electrically connecting the test equipment (20) and the device to be tested (30) to each other.

[0047] The device to be inspected (30) may be a semiconductor device manufactured by packaging a semiconductor IC chip and a plurality of terminals in a hexahedral shape using a resin material. The device to be inspected (30) may include a flat substrate (31) and a plurality of terminals (32) protruding from the lower surface of the substrate (31). The terminal (32) illustrated in Fig. 1 is of a ball type. The terminal (32) is not limited to the ball type and may be, for example, a land type or a pin type.

[0048] The inspection equipment (20) can inspect various operating characteristics of the device to be inspected (30). The inspection equipment (20) can have a board on which inspection is performed, and the board can be equipped with an inspection circuit (21) for inspecting the device to be inspected (30). In addition, the inspection circuit (21) has a plurality of pads (22) that are electrically connected to terminals of the device to be inspected (30) through an inspection connector (100). The pads (22) can transmit an electrical test signal to the device to be inspected (30) and receive a response signal from the device to be inspected (30).

[0049] The inspection connector (100) includes a conductive portion (110) that transmits a signal between the inspection equipment (20) and the device to be inspected (30). When the inspection connector (100) is placed on the inspection equipment (20), the conductive portion (110) is positioned in the vertical direction (VD). The conductive portion (110) can be in contact with the terminal (32) of the device to be inspected (30) at its upper end, and can be in contact with the pad (22) of the inspection equipment (20) at its lower end. The conductive portion (110) is configured to be conductive in the vertical direction (VD) and may have elasticity. When inspecting the device to be inspected (30), the conductive portion (110) electrically connects the terminal (32) of the device to be inspected (30) and the pad (22) of the inspection equipment corresponding thereto in the vertical direction (VD) to transmit a signal between the inspection equipment (20) and the device to be inspected (30). Accordingly, inspection of the test device (30) is performed by the inspection equipment (20).

[0050] FIG. 2 is a partial cross-sectional view illustrating a portion of a connector for inspection according to one embodiment of the present disclosure.

[0051] As illustrated in FIG. 2, a test connector (100) according to one embodiment of the present disclosure includes a conductive portion (110) and an insulating housing (120).

[0052] The conductive portion (110) extends in the vertical direction (VD) between the device to be tested (30) and the inspection equipment (20) and electrically connects the device to be tested (30) and the inspection equipment (20). The conductive portion (110) is configured to be conductive in the vertical direction (VD). The conductive portion (110) may be formed in a cylindrical shape, but the shape of the conductive portion (110) is not limited to a cylindrical shape. The conductive portion (110) contacts a terminal of the device to be tested (30) corresponding to the conductive portion (110) at its upper end and contacts a pad (22) of the inspection equipment (20) corresponding to the conductive portion (110) at its lower end. A test signal of the inspection equipment (20) and a response signal of the device to be tested (30) are transmitted through the conductive portion (110). The conductive portion (110) has elasticity by including a plurality of conductive particles (111) and an elastic material (112).

[0053] A plurality of conductive particles (111) are gathered in a cylindrical shape so as to be conductive in the vertical direction (VD). Adjacent conductive particles (111) can be conductively contacted in any direction. A plurality of conductive particles (111) gathered in the vertical direction (VD) function as a conductor that transmits a signal between a pad (22) of an inspection equipment (20) and a terminal of a device to be inspected (30). The conductive particles (111) may be formed of a highly conductive metal material. Alternatively, the conductive particles (111) may have a form in which the highly conductive metal material described above is coated on a core formed of an elastic resin material or metal material. Alternatively, the conductive particles (111) may be made of a conductive material such as a carbon nanotube.

[0054] The elastic material (112) is in a hardened state and has elasticity. The elastic material (112) maintains the conductive particles (111) in the vertical direction (VD) so that the conductive particles (111) are gathered in a cylindrical shape. The space between the conductive particles (111) can be filled with the elastic material (112). The conductive particles (111) and the elastic material (112) are integrally formed to form a conductive portion (110). The elastic material (112) can have insulating properties. For example, the elastic material (112) can be hardened silicone rubber, but is not limited thereto.

[0055] A conductive member (110) including an elastic material (112) is elastically deformable in the vertical direction (VD) and the horizontal direction (HD). A pressing force (PF) of a test device (30) presses the conductive member (110) downward. In this pressed state of the conductive member (110), the conductive member (110) can be elastically deformed to be compressed downward while slightly expanding in the horizontal direction (HD). When this pressing force (PF) is removed, the conductive member (110) can be restored to its original shape (unpressured state) from the pressed state. The conductive member (110) can be elastically deformed in the unpressured state and the pressed state.

[0056] Fig. 3 is a partial perspective view showing the conductive part and insulating housing of the inspection connector shown in Fig. 2. Fig. 4 is an exploded perspective view showing the conductive part and insulating housing of the inspection connector shown in Fig. 3.

[0057] As illustrated in FIGS. 3 and 4, a through hole (121) for accommodating a conductive portion (110) is formed in the vertical direction (VD) in the insulating housing (120). The insulating housing (120) is configured to insulate between adjacent conductive portions (110) when the conductive portions (110) are formed in multiple pieces. The insulating housing (120) may be formed of an insulating material such as silicone rubber. Alternatively, the insulating housing (120) may be formed of a polyimide (PI) film. When the insulating housing (120) is formed of silicone rubber, the insulating housing (120) may have a hexahedral shape. When the insulating housing (120) is a polyimide film, a plurality of polyimide films may be laminated to form a hexahedral shape. However, the insulating housing (120) is not limited to the above-described shape or material.

[0058] The through hole (121) has a plurality of supports (121b). The plurality of supports (121b) protrude toward the conductive portion (110). The plurality of supports (121b) may be formed convexly toward the conductive portion (110) and may have a round shape. The plurality of supports (121b) are arranged to be spaced apart from each other in the circumferential direction (CD) of the through hole (121). For example, the plurality of supports (121b) may be spaced apart from each other at equal intervals along the circumferential direction (CD) of the through hole (121). The plurality of supports (121b) may be made of the same material as the insulating housing (120) and may be formed integrally. As an example, the insulating housing (120) may be formed in a hexahedral shape by irradiating a laser so that the plurality of supports (121b) and the through hole (121) are formed. As another example, the insulating housing (120) may be formed by injection molding so that a plurality of supports (121b) and through holes (121) are formed. As another example, the insulating housing (120) may be formed by laminating a plurality of films in which a plurality of supports (121b) and through holes (121) are formed.

[0059] The plurality of supports (121b) are configured to suppress or prevent the conductive portion (110) from buckling when the inspection connector (100) is compressed in the vertical direction (VD). Here, the buckling of the conductive portion (110) may mean that the conductive portion (110) is convexly bent in the horizontal direction (HD). By suppressing or preventing the buckling of the conductive portion (110) by the plurality of supports (121b), the durability of the conductive portion (110) can be improved. In a portion of the through hole (121) where the plurality of supports (121b) are not formed, the conductive portion (110) can sufficiently expand in the horizontal direction (HD). Therefore, good operability of the conductive portion (110) can be secured.

[0060] In one embodiment, the number of the plurality of supports (121b) is three. In another embodiment of the present invention, the number of supports may be four or more and six or less. A person skilled in the art who understands the problem and solution principle of the present invention will be able to select an appropriate number of supports in various ways without departing from the scope of the present invention. Although three supports (121b) are illustrated in FIGS. 2 to 4, the number of supports (121b) may be appropriately selected from three to six depending on the specifications of the inspection connector (100), and more supports may be provided without departing from the scope of the present invention, as described above. However, when the number of the plurality of supports (121b) is less than three, the interval between the plurality of supports (121b) along the circumferential direction (CD) is relatively wide, so that the conductive portion (110) may buckle between the plurality of supports (121b). As a result, the durability of the conductive member (110) may be reduced. When the number of the plurality of supports (121b) exceeds six, the spacing between the plurality of supports (121b) along the circumferential direction (CD) is relatively narrow, so that the conductive member (110) cannot smoothly expand in the horizontal direction (HD). As a result, good operability of the conductive member (110) cannot be secured. Although the present invention does not completely exclude this, it may be preferable not to employ less than three supports or more than six supports unless there is a special reason.

[0061] FIG. 5 is a plan view showing the upper portion of the conductive part and insulating housing of the inspection connector shown in FIG. 3.

[0062] As illustrated in FIG. 5, as a plurality of supports (121b) are formed, a plurality of recesses (121a) having a concave shape are formed between the plurality of supports (121b). That is, in one embodiment, the through hole (121) may further include a plurality of recesses (121a). The plurality of recesses (121a) are spaced apart from the outer circumferential surface (110a) of the conductive portion (110) and are spaced apart from each other in the circumferential direction (CD) of the through hole (121). The plurality of recesses (121a) may be formed to correspond to the imaginary inner circumferential surface (see the dotted line illustrated in FIG. 5) of the through hole (121), but are not limited thereto and may have various shapes. Each of the plurality of recesses (121a) may be arranged between two adjacent supports (121b) among the plurality of supports (121b). Alternatively, each of the plurality of supports (121b) may be arranged between two adjacent recesses (121a) among the plurality of recesses (121a). That is, the plurality of recesses (121a) and the plurality of supports (121b) may be arranged alternately along the circumferential direction (CD).

[0063] In one embodiment, at least a portion of the conductive portion (110) may be supported by at least one of the plurality of supports (121b). The inspection connector (100) according to one embodiment of the present invention may be manufactured by inserting the conductive portion (110) into a through-hole (121) in which a plurality of supports (121b) are formed. In this case, the plurality of supports (121b) of the through-hole (121) and the conductive portion (110) may be press-fitted or brought into close contact. In this embodiment, the plurality of supports (121b) and the conductive portion (110) are firmly in contact, and it is possible to minimize the buckling phenomenon of the conductive portion (110).

[0064] In another embodiment, the plurality of supports (121b) of the through-hole (121) and the conductive portion (110) may be coupled so as to be in contact with each other with a little slack. In this case, when no pressing force is applied to the inspection connector (100), the plurality of supports (121b) may only be in contact with the conductive portion (110) in some portions of the entire section along the vertical direction (VD) of the supports (121b), and may not be in contact with the conductive portion (110) at other points. Alternatively, some of the plurality of supports (121b) may not be in contact with the conductive portion (110). However, when the pressing force is applied, at least some of the portions of the plurality of supports (121b) that were not in contact with the conductive portion (110) (i.e., the above-described points) come into contact with the conductive portion (110), thereby preventing buckling of the conductive portion (110).

[0065] As another embodiment, the plurality of supports (121b) may not have the same profile in the vertical direction (VD) or the circumferential direction (CD) of the through hole (121). For example, the plurality of supports (121b) may include a first profile portion formed to be in contact with the conductive portion (110) in the vertical direction (VD) and a second profile portion formed not to be in contact with the conductive portion (110). As another example, the plurality of supports (121b) may have different shapes or different sizes in the circumferential direction (CD) of the through hole (121).

[0066] The embodiments of the plurality of supports (121b) described above can secure the good operability of the conductive portion (110) intended by the present invention and achieve the effect of improving the durability of the conductive portion (110) by preventing or at least reducing buckling of the conductive portion (110) as a pressing force is applied to the plurality of supports (121b). The appropriate shape of the support (121b), the selection of the point where the support (121b) and the conductive portion (110) come into contact, and the like can be appropriately modified and changed by a person skilled in the art without departing from the scope of the present invention.

[0067] In one embodiment, the distance G1 between the plurality of supports (121b) and the outer surface (110a) of the conductive portion (110) may be shorter than the distance G2 between the plurality of recesses (121a) and the outer surface (110a) of the conductive portion (110). After the conductive portion (110) expands and comes into contact with the plurality of supports (121b), the expansion of the conductive portion (110) is suppressed by the plurality of supports (121b). However, the conductive portion (110) may expand further between two adjacent supports (121b) in the circumferential direction (CD) (i.e., one of the plurality of recesses (121a). Therefore, the durability of the conductive portion (110) can be further improved, while ensuring better operability of the conductive portion (110).

[0068] In one embodiment, each of the plurality of supports (121b) may extend along the vertical direction (VD) within the through hole (121). As an example, each of the plurality of supports (121b) may be formed continuously along the vertical direction (VD). As another example, each of the plurality of supports (121b) may be formed discontinuously along the vertical direction (VD). For example, portions where supports are formed and portions where no supports are formed may be arranged alternately in the vertical direction. In this case, portions where supports are formed and portions where no supports are formed may be arranged at equal intervals from each other. Alternatively, portions where supports are formed may be formed longer than portions where no supports are formed.

[0069] FIG. 6 is a partial cross-sectional view illustrating a test connector including a plurality of insulating housings according to one embodiment of the present disclosure. FIG. 7 is a partial cross-sectional view illustrating a test connector including a plurality of insulating housings according to another embodiment of the present disclosure.

[0070] In one embodiment, the insulating housing (120) may include a first insulating housing (123) and a second insulating housing (124). As illustrated in FIGS. 6 and 7, the second insulating housing (124) is stacked on at least one of the upper and lower sides of the first insulating housing (123). The first insulating housing (123) and the second insulating housing (124) may be configured differently and may be stacked above or below each other. In this way, since the first insulating housing (123) and the second insulating housing (124) have a stacked structure, the overall height of the insulating housing (120) along the vertical direction (VD) can be set in various ways to meet various requirements of the semiconductor package to be inspected. In addition, compared to forming a through hole (121) having a plurality of supports (121b) in an insulating housing (120) having a thick height, the process of manufacturing the entire insulating housing (120) can be facilitated by separately manufacturing the first insulating housing (123) and the second insulating housing (124) and then combining or laminating them.

[0071] In one embodiment, a cylindrical through hole may be formed in the first insulating housing (123), and a through hole having a plurality of recesses and a plurality of supports may be formed in the second insulating housing (124). Here, the cylindrical through hole formed in the first insulating housing (123) is referred to as a first through hole (123a), and the through hole and the plurality of supports formed in the second insulating housing (124) are referred to as a second through hole (124a) and a plurality of second supports (124b). The first insulating housing (123) in which the first through hole (123a) is formed and the second insulating housing (124) in which the second through hole (124b) and the plurality of second supports (124b) are formed may be stacked above or below each other. As an example, as illustrated in FIG. 6, a first insulating housing (123) having a first through-hole (123a) formed therein may be stacked above a second insulating housing (124) having a second through-hole (124a) and a plurality of second supports (124b) formed therein. As another example, as illustrated in FIG. 7, a second insulating housing (124) having a second through-hole (124a) and a plurality of second supports (124b) formed therein may be stacked above the first insulating housing (123) having a first through-hole (123a) formed therein. In this way, depending on the positions of the plurality of supports (121b) formed in the first insulating housing (123) or the second insulating housing (124), it is possible to control the degree of expansion of the conductive portion (110) at a specific position above or below the inspection connector (100).

[0072] FIG. 8 is a partial cross-sectional view illustrating a test connector including a plurality of insulating housings according to another embodiment of the present disclosure.

[0073] In one embodiment, as illustrated in FIG. 8, a first insulating housing (123) having a cylindrical through-hole formed therein and a second insulating housing (124) having a plurality of through-holes formed therein with a plurality of supports may be alternately stacked in a plurality of layers in the vertical direction (VD). Here, the cylindrical through-hole formed in the first insulating housing (123) is referred to as a first through-hole (123a), and the through-hole and the plurality of supports formed in the second insulating housing (124) are referred to as a second through-hole (124a) and a plurality of second supports (124b), respectively. The stacking order of the first insulating housing (123) and the second insulating housing (124) is not limited to the embodiment illustrated in FIG. 8, and the second insulating housing (124) may be arranged at the uppermost side, and the first insulating housing (123) and the second insulating housing (124) may be sequentially stacked below the second insulating housing (124). In this way, by laminating the first insulating housing (123) and the second insulating housing (124) in multiple layers, it is possible to suppress or prevent the conductive portion (110) from buckling, and also to secure a space in which the conductive portion (110) can expand. As a result, the durability of the conductive portion (110) can be improved, and good operability of the conductive portion (110) can be secured.

[0074] FIG. 9 is a partial cross-sectional view illustrating a test connector including a support member according to one embodiment of the present disclosure.

[0075] In one embodiment, as illustrated in FIG. 9, the conductive portion (110) may include a plurality of conductive portions and may further include a support portion (130) that supports the plurality of conductive portions. The support portion (130) maintains and supports the conductive portions (110) so that the conductive portions (110) are positioned in the vertical direction (VD) and insulates between adjacent conductive portions (110). Hereinafter, for convenience of explanation, the plurality of conductive portions are given the same drawing reference numerals as the conductive portions.

[0076] In one embodiment, the support member (130) may be configured to support the plurality of conductive members (110) from at least one of the upper and lower sides of the plurality of conductive members (110). As an example, as illustrated in FIG. 9, the support member (130) may be disposed above and below the conductive members (110). In this way, the support member (130) may be disposed both above and below the conductive members (110), thereby stably maintaining and supporting the plurality of conductive members (110). As another example, the support member (130) may be disposed only above the conductive members (110) or only below the conductive members (110).

[0077] According to one embodiment, the support member (130) may include an upper support member (131) and a lower support member (132) disposed above the conductive member (110). The upper support member (131) has a thin sheet shape having insulating properties. The upper support member (131) may be made of an insulating material such as silicone rubber. Alternatively, the upper support member (131) may be a polyimide film. The upper support member (131) may be formed integrally with the conductive member (110).

[0078] The lower support member (132) may have a thin sheet shape. The lower support member (132) may be made of an insulating material such as FR4 (e.g., a synthetic material composed of glass fiber and epoxy resin). Alternatively, the lower support member (132) may be a polyimide film. Alternatively, the lower support member (132) may be made of a synthetic material of silicone rubber and a polyimide film. Alternatively, the lower support member (132) may be a porous sheet.

[0079] As an example, the upper support part (131) may be formed integrally on the upper side of the conductive part (110), so that after the conductive part (110) is inserted into the through-hole (121) of the insulating housing (120), the lower support part (132) may be configured to be coupled to the lower side of the conductive part (110). As another example, the lower support part (132) may be formed integrally on the lower side of the conductive part (110), so that after the conductive part (110) is inserted into the through-hole (121) of the insulating housing (120), the upper support part (131) may be configured to be coupled to the upper side of the conductive part. As another example, after a plurality of conductive parts (110) are inserted into the through-holes (121b) of the insulating housing (120), the upper support part (131) may be configured to be coupled to the plurality of conductive parts (110) from the upper side, and the lower support part (132) may be configured to be coupled to the plurality of conductive parts (110) from the lower side.

[0080] FIG. 10 is a partial cross-sectional view illustrating a test connector including a support member according to another embodiment of the present disclosure.

[0081] As illustrated in FIG. 10, a test connector (200) according to another embodiment of the present disclosure may include a plurality of conductive portions (110), an insulating housing (120), and a support portion (230). The plurality of conductive portions (110) and the insulating housing (120) of the test connector (200) according to this embodiment may be configured identically or similarly to the conductive portions (110) and the insulating housing (120) of the test connector (100) according to the embodiments illustrated in FIGS. 1 to 9. Therefore, the following description will focus on the configuration of the support portion (230).

[0082] In one embodiment, the support member (230) may be formed with a plurality of support member through-holes (231) spaced apart from the outer circumferential surfaces (110a) of the plurality of conductive members (110). The support member (230) may include a plurality of protrusions (232) that protrude from each of the plurality of support member through-holes (231) toward each of the plurality of conductive members (110), are spaced apart from each other in the circumferential direction of each of the plurality of conductive members (110), and come into contact with the outer circumferential surfaces (110a) of each of the plurality of conductive members (110). As an example, the plurality of protrusions (232) formed on the support member (230) may be arranged to be aligned in the circumferential direction (CD) with respect to a plurality of supports (121b) formed on the insulating housing (120). As another example, a plurality of protrusions (232) formed on the support member (230) in the circumferential direction (CD) may be arranged to be misaligned with respect to a plurality of supports (121b) formed on the insulating housing (120) in the circumferential direction (CD). As illustrated in FIG. 10, when the support member (230) includes an upper support member and a lower support member, a plurality of protrusions (232) formed on at least one of the upper support member and the lower support member are configured to be in contact with the outer peripheral surface (110a) of the conductive member (110). Therefore, the support member (230) can effectively support the conductive member (110).

[0083] FIG. 11 is a partial cross-sectional view illustrating a test connector including a support member according to another embodiment of the present disclosure.

[0084] As illustrated in FIG. 11, a test connector (300) according to another embodiment of the present disclosure may include a plurality of conductive portions (110), an insulating housing (320), and a support portion (330). The plurality of conductive portions (110) of the test connector (300) according to this embodiment may be configured identically or similarly to the conductive portions (110) of the test connector (100) according to the embodiment illustrated in FIGS. 6 and 7. Therefore, the following description will focus on the configuration of the insulating housing (320) and the support portion (330).

[0085] In one embodiment, the insulating housing (320) may include a first insulating housing (321) in which a first through-hole having a plurality of supports is formed, and a second insulating housing (322) in which a second through-hole having a plurality of supports is formed. Here, the first through-hole and the plurality of supports formed in the first insulating housing (321) are referred to as a first through-hole (321a) and a plurality of first supports (321b), respectively, and the second through-hole and the plurality of supports formed in the second insulating housing (322) are referred to as a second through-hole (322a) and a plurality of second supports (322b), respectively. In this embodiment, the conductive portion (110) may include a plurality of conductive portions (110), and the inspection connector (300) may include a support portion (330) that supports the plurality of conductive portions (110) and is disposed between the first insulating housing (321) and the second insulating housing (322). The support member (330) maintains and supports the conductive member (110) so that the conductive member (110) is positioned in the vertical direction (VD) and insulates between adjacent conductive members (110). The support member (330) may be positioned in the middle of the overall height of the inspection connector (300).

[0086] FIG. 12 is a partial cross-sectional view illustrating a test connector including a support member according to another embodiment of the present disclosure.

[0087] In one embodiment, the support member (330) may be formed with a plurality of support member through-holes (331) spaced apart from the outer circumferential surfaces (110a) of the plurality of conductive members (110). The support member (330) may include a plurality of protrusions (332) that protrude from each of the plurality of support member through-holes (331) toward each of the plurality of conductive members (110), are spaced apart from each other in the circumferential direction (CD) of each of the plurality of support member through-holes (331), and come into contact with the outer circumferential surfaces (110a) of each of the plurality of conductive members (110). As an example, as illustrated in FIG. 12, the plurality of protrusions (332) formed in the support member (330) may be arranged to be aligned with a plurality of first supports (321b) formed in the first insulating housing (321) and a plurality of second supports (322b) formed in the second insulating housing (322) in the circumferential direction (CD). As another example, a plurality of protrusions (332) formed on the support member (330) in the circumferential direction (CD) may be arranged to be misaligned with a plurality of first supports (321b) formed on the first insulating housing (321) and a plurality of second supports (322b) formed on the second insulating housing (322) in the circumferential direction (CD). Since the plurality of protrusions (332) formed on the support member (330) are configured to come into contact with the outer surface (110a) of the conductive member (110), the support member (330) can effectively support the conductive member (110).

[0088] FIG. 13 is a partial cross-sectional view illustrating a test connector including a support member and a coupling member according to one embodiment of the present disclosure.

[0089] In one embodiment, the inspection connector (300) may further include a first coupling portion (341) for coupling a plurality of conductive portions (110) from above the first insulating housing (321) and a second coupling portion (342) for coupling a plurality of conductive portions (110) from below the second insulating housing (322). Each of the first coupling portion (341) and the second coupling portion (342) illustrated in FIG. 13 corresponds to each of the upper support portion (131) and the lower support portion (132) described in the embodiment illustrated in FIG. 9, and thus a detailed description thereof will be omitted. Since the plurality of conductive portions (110) are supported from above and below by the first coupling portion (341) and the second coupling portion (342), the plurality of conductive portions (110) can be more stably maintained and supported.

[0090] In one embodiment, when the inspection connector is configured in a sheet shape, the number of supports arranged in the central region of the sheet-shaped inspection connector may be formed to be less than the number of supports arranged in the edge regions of the inspection connector. By configuring the number of supports differently depending on the region in this way, the maximum elastic deformation or the repulsive force according to the elastic deformation can be configured to be different for each region.

[0091] While the technical concept of the present disclosure has been described above with reference to certain embodiments and examples illustrated in the accompanying drawings, it should be understood that various substitutions, modifications, and variations may be made without departing from the technical concept and scope of the present disclosure, which would be understood by those skilled in the art to which the present disclosure pertains. Furthermore, such substitutions, modifications, and variations should be considered to fall within the scope of the appended claims.

Claims

1. A test connector placed between a test device and a test equipment. A conductive part extending vertically between the above-mentioned test device and the above-mentioned test equipment and electrically connecting the above-mentioned test device and the above-mentioned test equipment to each other; An insulating housing having a through hole formed in the upper and lower directions to accommodate the above-mentioned challenge portion. Including, The above through hole includes a plurality of supports that protrude toward the conductive portion and are spaced apart from each other in the circumferential direction of the above through hole. Connector for inspection.

2. In paragraph 1, The above multiple supports are three in number, Connector for inspection.

3. In paragraph 1, The above through hole further includes a plurality of recesses spaced apart from the outer surface of the conductive portion and spaced apart from each other in the circumferential direction of the through hole, and each recess is arranged between two adjacent supports among the plurality of supports. Connector for inspection.

4. In paragraph 3, At least a portion of the above challenge member is supported by at least one of the plurality of supports, Connector for inspection.

5. In paragraph 4, The distance between the plurality of supports and the outer surface of the conductive part is shorter than the distance between the plurality of recesses and the outer surface of the conductive part. Connector for inspection.

6. In paragraph 1, Each of the above plurality of supports extends along the vertical direction within the through hole. Connector for inspection.

7. In paragraph 1, The above insulating housing, A first insulating housing, and Including a second insulating housing laminated on at least one of the upper and lower sides of the first insulating housing, Connector for inspection.

8. In paragraph 7, A cylindrical through hole is formed in the first insulating housing, In the second insulating housing, the through hole having the plurality of supports is formed. Connector for inspection.

9. In paragraph 8, The first insulating housing having the cylindrical through-hole formed therein and the second insulating housing having the through-hole formed therein and having the plurality of supports are alternately laminated in a plurality of layers. Connector for inspection.

10. In paragraph 1, The above-mentioned challenging portion includes a plurality of challenging portions, Further comprising a support member supporting the plurality of challenge members, Connector for inspection.

11. In paragraph 10, The above support member is configured to support the plurality of conductive members on at least one side above and below the plurality of conductive members. Connector for inspection.

12. In paragraph 11, In the above support member, a plurality of support member through-holes are formed spaced apart from the outer surface of each of the plurality of conductive members, The support member includes a plurality of protrusions that protrude from each of the plurality of support member penetration holes toward each of the plurality of conductive members, are spaced apart from each other in the circumferential direction of each of the plurality of conductive members, and come into contact with the outer surface of each of the plurality of conductive members. Connector for inspection.

13. In paragraph 1, The above insulating housing, A first insulating housing having a first through hole formed therein, having a plurality of supports; A second insulating housing having a second through hole formed therein having the plurality of supports Including, The above-mentioned challenging portion includes a plurality of challenging portions, Further comprising a support member supporting the plurality of conductive parts and positioned between the first insulating housing and the second insulating housing. Connector for inspection.

14. In paragraph 13, In the above support member, a plurality of support member through-holes are formed spaced apart from the outer surface of each of the plurality of conductive members, The support member includes a plurality of protrusions that protrude from each of the plurality of support member through-holes toward each of the plurality of conductive members, are spaced apart from each other in the circumferential direction of each of the plurality of support member through-holes, and come into contact with the outer surface of each of the plurality of conductive members. Connector for inspection.

15. In paragraph 13, A first coupling portion that couples the plurality of conductive parts from above the first insulating housing; Further comprising a second coupling member for coupling the plurality of conductive members at the lower portion of the second insulating housing; Connector for inspection.

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