Antenna tuning method, electronic device, and readable storage medium

Abstract

The present application relates to the technical field of antennas, and provides an antenna tuning method, an electronic device, and a readable storage medium. In the antenna tuning method provided by the present application, an electronic device can acquire a plurality of reflection coefficients and a plurality of true reflection coefficients of an impedance matching network under a plurality of loads, calculate calibration parameters on the basis of the plurality of reflection coefficients and the plurality of true reflection coefficients, calibrate, by means of the calibration parameters, the reflection coefficients measured by the electronic device so as to obtain calibration results, and then tuning an antenna on the basis of the calibration results. In the process of calibration, no additional calibration devices are added to the electronic device for calibration, but the electronic device reuses the original impedance matching network for self-calibration, so that the efficiency of calibration can be improved, and the hardware costs of calibration can also be saved.

Description

Antenna tuning method, electronic device and readable storage medium

[0001] This application claims priority to the Chinese patent application filed with the China Patent Office on February 5, 2024, with application number 202410167143.5 and application name “Antenna tuning method, electronic device and readable storage medium”. The entire contents of the above application are incorporated into this application by reference. Technical Field

[0002] The present application relates to the field of antenna technology, and in particular to an antenna tuning method, an electronic device, and a readable storage medium. Background Art

[0003] The antenna performance of electronic devices is easily affected by external environmental factors. When an external object (for example, a human hand, a human face, etc.) approaches the antenna, the impedance of the antenna will change, causing the impedance of the antenna to not match the impedance of the RF front-end to which it is connected. In the case where the impedance of the antenna does not match the impedance of the RF front-end, when the RF front-end transmits the signal to the antenna through the impedance matching network, the antenna will produce a certain reflection effect on the signal transmitted by the RF front-end, resulting in a certain reflection loss of the signal, thereby affecting the performance of the antenna. For example, referring to Figure 1, when the user holds the mobile phone 10 in contact with the antenna of the mobile phone 10, the impedance of the antenna of the mobile phone 10 will change, causing the impedance of the antenna to not match that of the RF front-end, resulting in a degradation of the antenna performance.

[0004] Therefore, in order to reduce the impact of the external environment on the performance of the antenna, the electronic device needs to tune the antenna in real time according to changes in the external environment.

[0005] Summary of the Invention

[0006] Some embodiments of the present application provide an antenna tuning method, an electronic device, and a readable storage medium. The present application is introduced below from multiple aspects, and the embodiments and beneficial effects of the following aspects can be referenced to each other.

[0007] In a first aspect, an embodiment of the present application provides an antenna tuning method for a first electronic device, the method comprising: detecting that an antenna tuning condition is met; calibrating a current first reflection coefficient of an impedance matching network of the electronic device based on a parameter-containing calibration model comprising multiple calibration parameters to obtain a second reflection coefficient; tuning the antenna based on the second reflection coefficient; wherein the multiple calibration parameters of the parameter-containing calibration model are determined in the following manner: obtaining multiple reflection coefficients of the impedance matching network of the electronic device under multiple load states; and determining multiple calibration parameters of the parameter-containing calibration model based on the multiple reflection coefficients.

[0008] The first reflection coefficient may be the measured reflection coefficient mentioned in this application, and the second reflection coefficient may be the true reflection coefficient mentioned in this application. The calibration model with parameters may be the calibration model with parameters S1 or the calibration model with parameters S2 mentioned in this application.

[0009] The multiple calibration parameters of the parameter-containing calibration model are pre-determined through the impedance matching network of the electronic device itself. In this way, when the electronic device tunes the antenna, it can directly use the multiple parameters of the parameter-containing calibration model to calibrate the reflection coefficient of the impedance matching network to obtain a more accurate reflection coefficient, and then tune the antenna with the more accurate reflection coefficient.

[0010] Because when determining the various calibration parameters in the parameter-inclusive calibration model, the electronic equipment reuses the original impedance matching network in the circuit without adding additional calibration devices, which saves hardware costs. In addition, the measurement process does not require human participation and is highly efficient.

[0011] In some embodiments, obtaining multiple reflection coefficients of an impedance matching network of an electronic device under multiple load states includes: when the impedance matching network is in the multiple load states, detecting multiple third reflection coefficients of the impedance matching network through a radio frequency integrated circuit (RFIC) of the electronic device.

[0012] For example, the RF integrated circuit of an electronic device can measure the reflection coefficient Γ of the impedance matching network in the load state of state1, state2 and state3. measure1 , Γ measure2 and Γ measure3 .

[0013] In some embodiments, multiple calibration parameters of the parameter-containing calibration model are determined based on multiple reflection coefficients, including: calculating multiple calibration parameters of the parameter-containing calibration model based on multiple third reflection coefficients, multiple fourth reflection coefficients corresponding to the multiple third reflection coefficients, and the parameter-containing calibration model.

[0014] In some embodiments, the plurality of fourth reflection coefficients are reflection coefficients detected by the measuring instrument when the impedance matching network is in a plurality of load states.

[0015] The electronic device can pre-store multiple real reflection coefficients of the impedance matching network under multiple load conditions. Then, when measuring the calibration parameters in the parameter-based calibration model, the electronic device's radio frequency integrated circuit can detect the multiple reflection coefficients of the impedance matching network under multiple load conditions and calculate the values ​​of the calibration parameters in the parameter-based calibration model based on the multiple reflection coefficients, the multiple real reflection data corresponding to the multiple reflection coefficients, and the parameter-based calibration model. The real reflection coefficients of the impedance matching network under multiple load conditions can be measured using a measuring instrument, such as a vector network analyzer.

[0016] In some embodiments, the antenna is tuned based on the second reflection coefficient, including: corresponding to the second reflection coefficient being greater than a preset reflection coefficient, adjusting the current first load state of the impedance matching network to a second load state; wherein the fifth reflection coefficient of the antenna when the impedance matching network is in the second load state is less than or equal to the preset reflection coefficient; the fifth reflection coefficient is obtained by calibrating the sixth reflection coefficient of the antenna through a parameter-containing calibration model, and the sixth reflection coefficient is obtained after the radio frequency integrated circuit of the electronic device detects the impedance matching network when the impedance matching network is in the second load state.

[0017] In some embodiments, the antenna tuning condition includes: the current system time of the electronic device reaches a preset time; and the reflection coefficient of the impedance matching network in a loaded state is greater than a preset reflection coefficient.

[0018] When the electronic device detects that the current system time reaches the preset tuning time, it can be determined that the electronic device meets the antenna tuning condition.

[0019] When the electronic device detects that the corresponding real reflection coefficient under the current load state of the impedance matching network is greater than the preset reflection coefficient, it can be determined that the electronic device meets the antenna tuning condition.

[0020] In a second aspect, embodiments of the present application provide an electronic device, comprising: a memory for storing instructions executed by one or more processors of the electronic device; and a processor, which, when executing the instructions in the memory, causes the electronic device to perform the method described in the first aspect of the present application and any embodiment of the first aspect. The beneficial effects achievable in the second aspect can be referenced to the beneficial effects of the method provided in any embodiment of the first aspect and will not be further elaborated here.

[0021] In a third aspect, embodiments of the present application provide a computer-readable storage medium having instructions stored thereon. When executed on a computer, the instructions cause the computer to perform the method described in any embodiment of the first aspect. The beneficial effects achieved in the third aspect can be referenced to the beneficial effects of the method described in any embodiment of the first aspect and are not further elaborated here.

[0022] In a fourth aspect, embodiments of the present application provide a computer program product, including a computer program / instructions. When executed, the computer program / instructions cause a computer to perform the method described in any embodiment of the first aspect. The beneficial effects achieved in the fourth aspect can be referenced to the beneficial effects of the method provided in any embodiment of the first aspect and are not further elaborated here. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] FIG1 shows an exemplary application scenario of the present application;

[0024] FIG2A is a circuit diagram 1 of an electronic device provided in an embodiment of the present application;

[0025] FIG2B is a second circuit diagram of an electronic device provided in an embodiment of the present application;

[0026] FIG3A is a circuit diagram 1 of a calibration circuit provided in an embodiment of the present application;

[0027] FIG3B is a second circuit diagram of a calibration circuit provided in an embodiment of the present application;

[0028] FIG4 is a schematic diagram of a method for detecting a true reflection coefficient of an impedance matching network according to an embodiment of the present application;

[0029] FIG5 is a circuit diagram 1 of an impedance matching network provided in an embodiment of the present application;

[0030] FIG6 is a second circuit diagram of an impedance matching network provided in an embodiment of the present application;

[0031] FIG7 is a third circuit diagram of an electronic device provided in an embodiment of the present application;

[0032] FIG8 is a flowchart of an antenna tuning method according to an embodiment of the present application;

[0033] 9A to 9E are circuit diagrams of electronic devices provided in embodiments of the present application;

[0034] FIG10 is a second flow chart illustrating an example of the antenna tuning method provided in an embodiment of the present application. DETAILED DESCRIPTION

[0035] The present application provides an antenna tuning method. The antenna tuning method of the present application is described below with reference to specific embodiments.

[0036] This application does not limit the specific form of the electronic device. For example, the electronic device can be a mobile phone, a tablet, a large-screen device, a wearable device (for example, a watch, smart glasses, a helmet), a desktop computer, an augmented reality (AR) / virtual reality (VR) device, a personal digital assistant (PDA), and other terminal devices with an antenna.

[0037] To facilitate understanding, the circuit structure of the electronic device is first introduced below.

[0038] FIG2A is a circuit diagram of the electronic device provided in this application.

[0039] Referring to Figure 2A , electronic device 100 includes a baseband processing system 20, an RFIC 21, a radio frequency front end (RFFE) 22, an impedance matching network 23, and an antenna 24. The baseband processing system 20, RFIC 21, RFFE 22, impedance matching network 23, and antenna 24 are sequentially connected. RFIC 21 is also connected to RFFE 22 and impedance matching network 23, respectively. Baseband processing system 20 is responsible for data processing and storage. RFIC 21 is used to convert input digital signals into analog signals, or vice versa, and perform the digital signal processing required for reflection coefficient detection.

[0040] RFIC 21 includes a transmitting channel, a receiving channel, and a measurement channel. The transmitting channel is used to transmit signals. The receiving channel is used to receive signals. The test channel is used to detect the reflection coefficient of the impedance matching network 23. When the electronic device 100 transmits a signal, the RFIC 21 can open the transmitting channel and transmit the signal through the transmitting channel. When the electronic device 100 receives a signal, the RFIC 21 can open the receiving channel and receive the signal through the receiving channel. When the electronic device 100 detects the reflection coefficient of the impedance matching network 23, the RFIC 21 can open the measurement channel and detect the reflection coefficient of the impedance matching network 23 through the measurement channel.

[0041] The impedance matching network 23 can be any of a T-type, π-type, and L-type impedance matching circuit. The impedance matching network 23 can include electronic components such as switches, capacitors, and inductors. The impedance matching network 23 can adjust its load state by adjusting the state of each switch in its circuit (e.g., open or closed) to match the impedance of the antenna 24 with the impedance of the RFFE 22.

[0042] RFFE 22 is used to amplify and couple the input signal. In some embodiments, referring to FIG2B , RFFE 22 includes a power amplifier 2201 and a coupler 2202. The input end of the power amplifier 2201 is connected to the output end of the RFIC 21. The output end of the power amplifier 2201 is connected to the input end of the coupler 2202. The output end of the coupler 2202 is connected to the impedance matching network 23. The coupling port of the coupler 2202 is connected to the RFIC 21. The coupler 2202 is a dual-directional coupler that can complete the forward (FWD) (direction from RFIC 21 to antenna 24) signal coupling and reverse (REV) (direction from antenna 24 to RFIC 21) signal coupling in the reflection coefficient detection by switching the state. The power amplifier 2201 is used to amplify the input signal.

[0043] As mentioned above, in order to reduce the impact of changes in the external environment on the performance of the antenna 24 of the electronic device 100, the electronic device 100 needs to detect the reflection coefficient of the impedance matching network 23 in real time to tune the antenna 24 according to the reflection coefficient so that the impedance of the antenna 24 matches the impedance of the RFFE 22, thereby reducing the reflection loss of the port of the antenna 24 to the input signal.

[0044] The tuning principle of the antenna is described below with reference to FIG. 2B .

[0045] Referring to Figure 2B, when the electronic device 100 tunes the antenna 24, it is necessary to measure the reflection coefficient. When measuring the reflection coefficient, the RFIC 21 of the electronic device 100 can first open the transmission channel and transmit the signal A1 through the transmission channel. After the signal A1 is amplified by the power amplifier 2201, the signal A2 is obtained and transmitted to the coupler 2202. The coupler 2202 transmits the signal A2 to the antenna 24 through the impedance matching network 23. Then the RFIC 21 can open the measurement channel and receive the signal A3 forward-coupled by the coupler 2202 through the measurement channel. In the process of signal A2 being transmitted to the antenna 24 through the impedance matching network 23, a part of the signal will be reflected back, such as the signal B1. At this time, the signal B1 is input into the coupler 2202 through the impedance matching network 23, and the signal B2 is obtained after reverse coupling by the coupler 2202 and transmitted to the RFIC 21. Then, the electronic device 100 can estimate the reflection coefficient of the impedance matching network 23 based on the signal B2 and the signal A3, and tune the antenna 24 based on the reflection coefficient. For example, by adjusting the state of each switch in the circuit of the impedance matching network 23, the load state of the impedance matching network 23 can be adjusted so that the impedance of the antenna 24 matches the impedance of the RFFE 22.

[0046] It can be understood that since the input signal of impedance matching network 23 is signal A2 and the reflected signal is signal B1, the true reflection coefficient of impedance matching network 23 should be the ratio of signal B1 to signal A2, while the reflection coefficient detected by RFIC 21 is the ratio of signal B2 to signal A3. Therefore, there is a certain error between the reflection coefficient of impedance matching network 23 detected by RFIC 21 and the true reflection coefficient of impedance matching network 23. The reflection coefficient of impedance matching network 23 detected by RFIC 21 needs to be calibrated to obtain the true reflection coefficient of impedance matching network 23.

[0047] In some embodiments, a parameter-based calibration model can be established based on a mapping relationship between the reflection coefficient of the impedance matching network detected by the RFIC and the actual reflection coefficient of the impedance matching network. The parameter-based calibration model includes at least one calibration parameter, and the calibration parameter indicates the corresponding relationship between the reflection coefficient of the impedance matching network and the actual reflection coefficient.

[0048] For example, the parameter-containing calibration model may be a parameter-containing calibration model represented by the following formula (1) (referred to as “parameter-containing calibration model S1 ”).

[0049] Among them, Γ in is the true reflection coefficient of the impedance matching network, Γ measure The reflection coefficient of the impedance matching network measured for RFIC. a, b, and c are calibration parameters.

[0050] For another example, the parameter-containing calibration model may also be the parameter-containing calibration model shown in the following formula (2) (recorded as "parameter-containing calibration model S2").

[0051] Among them, Γ in is the true reflection coefficient of the impedance matching network, Γ measure This is the reflection coefficient of the impedance matching network measured for RFIC. A, B, and C are calibration parameters.

[0052] It should be noted that the parameter calibration model of the present application may also be other types of models, and this is not limited.

[0053] It is understood that for any electronic device, the corresponding calibration parameter values ​​can be obtained through experiments or other methods. Then, after the RFIC detects the reflection coefficient of the impedance matching network, the reflection coefficient of the impedance matching network can be calibrated based on the parameter-containing calibration model and the values ​​of the calibration parameters, obtaining a more accurate calibration result (the true reflection coefficient of the impedance matching network). Based on this calibration result, the antenna is tuned to match the impedance of the antenna with that of the RFFE.

[0054] The following takes the parameter-containing calibration model S1 shown in formula (1) as an example to illustrate the process of determining the values ​​of each calibration parameter in the parameter-containing calibration model S1.

[0055] In some embodiments, the values ​​of the calibration parameters a, b, and c in the parameter-containing calibration model S1 may be determined in advance by a calibration circuit of the electronic device 100 .

[0056] For example, Figure 3A is a circuit diagram of the calibration circuit L1 provided in an embodiment of the present application. Referring to Figure 3A, the calibration circuit L1 includes a circuit board 30 and a load meter 32. An RFIC 21', an RFFE 22' and an RF connector 31 are provided on the circuit board 30. The RFFE 22' includes a power amplifier 2201' and a coupler 2202'. The RFIC 21', the power amplifier 2201', the coupler 2202' and the RF connector 31 are connected in sequence. The RFIC 21' is also connected to the coupling port of the coupler 2202'. The load meter 32 is connected to the RF connector 31. The load meter 32 is used to simulate the load state of the antenna 24, and the load meter 32 can set its input port to different reflection coefficients by setting different load states. The load meter 32 includes at least three load states, such as load1, load2 and load3. When the load of the load meter 32 is load1, the real reflection coefficient of its input port is Γ in1 When the load of the load meter 32 is load2, the reflection coefficient of its input port is Γ in2 When the load of load meter 32 is load3, the reflection coefficient of its input port is Γ in3 .

[0057] When the calibration circuit L1 is used to determine the values ​​of the calibration parameters a, b, and c in the parameter-containing calibration model S1, the RFIC 21' can detect the corresponding reflection coefficients of the input port of the load meter 32 under the load states of load1, load2, and load3, respectively: Γ measure1 , Γ measure2 and Γ measure3 In this way, three sets of data can be obtained: {Γ measure1 , Γ in1}, {Γ measure2 , Γ in2} and {Γ measure3 , Γ in3}, then the three sets of data can be substituted into the above formula (1) to calculate the calibration parameters a, b, c.

[0058] As another example, Figure 3B is a circuit diagram of calibration circuit L2 provided in an embodiment of the present application. Referring to Figure 3B , calibration circuit L2 differs from calibration circuit L1 described above in that load meter 32 is replaced with tuner 33 including calibration load circuit 3301. Furthermore, calibration load circuit 3301 of tuner 33 is connected to the output of coupler 2202' of RFFE 22'. Calibration load circuit 3301 includes at least three load states. Tuner 33 can set the input port to different reflection coefficients by adjusting the load state of standard load circuit 3301, and its functionality is consistent with that of load meter 32. It should be understood that the principles of calibration circuit L2 are consistent with those of calibration circuit L1 and will not be further elaborated here.

[0059] It should be noted that the specifications of the calibration circuit of an electronic device are consistent with those of the same electronic components in the circuit. For example, the specifications of RFIC 21' are consistent with those of RFIC 21, the specifications of power amplifier 2201' are consistent with those of power amplifier 2201, and the specifications of coupler 2202' are consistent with those of coupler 2202. It should be understood that the specifications mentioned in this application include, but are not limited to, model numbers and performance parameters (e.g., resistance parameters, capacitance parameters, inductance parameters, etc.).

[0060] It is understandable that for electronic devices using similar or identical circuits, such as electronic devices of the same model or the same batch, there may be certain differences in the manufacturing processes of the various electronic components (e.g., switches, couplers, impedance matching networks, etc.) and circuit traces (e.g., printed circuit board (PCB) trace deviation and flexible printed circuit board (FPC) trace, etc.) in the circuits. As a result, even if the circuits of the electronic devices use the same electronic components and circuit traces, there may still be certain differences in their impedances. As a result, the correspondence between the reflection coefficient of the impedance matching network detected by the RFIC of the electronic device and the actual reflection coefficient of the impedance matching network is different, which in turn leads to differences in the calibration parameters of the electronic device. Based on this, if a set of calibration parameters is reused for all electronic devices using similar or identical circuits, and the reflection coefficient of the impedance matching network detected by the RFIC is calibrated, a certain deviation will occur in the calibration result, making it difficult to ensure the accuracy of the calibration. Therefore, the calibration parameters corresponding to each electronic device should be determined to ensure the accuracy of the calibration.

[0061] In some embodiments, the calibration parameters corresponding to each electronic device can be determined using the method described in FIG3A or FIG3B above. However, the method described in FIG3A or FIG3B above requires the addition of additional calibration devices, such as a load meter or tuner, to the circuitry of each electronic device. The calibration parameters of the parameter-containing calibration model are then determined using the additional calibration devices. The need for additional calibration devices results in high hardware costs and requires manual intervention, resulting in low efficiency.

[0062] To address the above technical issues, embodiments of the present application provide an antenna tuning method. In the antenna tuning method provided in embodiments of the present application, each electronic device can use its own impedance matching network to measure its own calibration parameters and then apply its own calibration parameters to tune its own antenna, rather than using a single calibration circuit to measure a fixed set of calibration parameters and then using that set of calibration parameters to tune all electronic devices that use similar or identical calibration circuits.

[0063] Specifically, before the electronic device tunes the antenna, it can reuse the existing impedance matching network in the circuit to measure (or determine) the calibration parameters in the aforementioned calibration model. Then, when the electronic device tunes the antenna, the electronic device (e.g., the RFIC of the electronic device) can detect the reflection coefficient of the impedance matching network and, based on the obtained calibration parameters and the aforementioned calibration model, calibrate the reflection coefficient of the impedance matching network to obtain the true reflection coefficient of the impedance matching network. The antenna is then tuned based on the true reflection coefficient of the impedance matching network, so that the antenna impedance matches the impedance of the RFFE, thereby reducing interference with the antenna performance caused by the external environment.

[0064] It can be understood that the reflection coefficient of the impedance matching network is the reflection coefficient of the antenna.

[0065] It can be understood that when measuring the various calibration parameters in the parameter calibration model, the electronic equipment reuses the original impedance matching network in the circuit without adding additional calibration devices, saving hardware costs. Moreover, the measurement process does not require human participation and is more efficient.

[0066] Specifically, the electronic device can pre-store multiple real reflection coefficients of the impedance matching network under multiple load conditions. Then, when measuring each calibration parameter in the parameter-containing calibration model, the RFIC of the electronic device can detect the multiple reflection coefficients of the impedance matching network under the aforementioned multiple load conditions and calculate the values ​​of each calibration parameter in the parameter-containing calibration model based on the multiple reflection coefficients, the multiple real reflection data corresponding to the multiple reflection coefficients, and the parameter-containing calibration model.

[0067] For example, the electronic device pre-stores the real reflection coefficient Γ of the impedance matching network in the load state state1, state2 and state3. in_state1 , Γ in_state2 and Γ in_state3 When measuring the calibration parameters in the calibration model S1, the electronic device can obtain the real reflection coefficient Γ of the impedance matching network stored in advance. in_state1 , Γ in_state2 and Γ in_state3 , and detect the reflection coefficient Γ of the impedance matching network in the load state state1, state2 and state3 measure_state2 , Γ measure_state2 and Γ measure_state3 , and then the obtained data {Γ measure_state1 , Γ in_state1}, {Γ measure_state2 , Γ in_state2} and {Γ measure_state3 , Γ in_state3}, and substitute it into the above formula (1) to calculate the values ​​of calibration parameters a, b, and c in the parameter calibration model S1.

[0068] In some embodiments, a vector network analyzer or other measuring instrument for measuring reflection coefficient can be used in advance to detect the reflection coefficients of the impedance matching network under the above-mentioned multiple load states as the actual reflection coefficients of the impedance matching network under the multiple load states.

[0069] For example, Figure 4 shows a circuit diagram for detecting the true reflection coefficient of an impedance matching network. Referring to Figure 4 , the detection circuit includes a vector network analyzer 40, an RF connector 41, and an impedance matching network 23, wherein the vector network analyzer 40, the RF connector 41, and the impedance matching network 23 are connected in sequence. The vector network analyzer 40 internally includes a transmitter and a receiver. The transmitter is used to transmit signals, and the receiver is used to receive reflected signals. When the impedance matching network 23 is in a load state, state 1, the vector network analyzer 40 can transmit a transmission signal a1 through the transmitter, and then receive a reflection signal b1 reflected from the impedance matching network 23 by the receiver. The ratio of the reflection signal b1 to the transmission signal a1 is calculated as the true reflection coefficient (or "calibrated reflection coefficient") of the impedance matching network 23. In this way, the true reflection coefficient of the impedance matching network 23 under multiple load states (e.g., state 1, state 2, and state 3) can be obtained.

[0070] The calibration parameter determination scheme of the present application is described in detail below using the above-mentioned calibration model S1 as an example.

[0071] For example, referring to FIG. 2B above, the RFIC 21 of the electronic device 100 can send a mobile industry processor interface (MIPI) instruction P1 to the impedance matching network 23 to instruct the impedance matching network 23 to set the current load state to the load state of state1, and send an instruction M1 to the coupler 2202 of the RFFE 22 to instruct the coupler 2202 to set the coupling port to forward coupling. Then, the RFIC 21 can open the transmission channel and transmit signal A1 through the transmission channel. Signal A1 is amplified by the power amplifier 2201 to obtain signal A2, and then signal A2 is forward coupled by the coupler 2202 to obtain signal A3. Then, the RFIC 21 can open the measurement channel, receive signal A3 through the measurement channel, and detect the parameter of signal A3 (such as voltage parameter) as fwd_value. Then, the RFIC 21 can send an instruction M2 to the coupler 2202 to instruct the coupler 2202 to set the coupling port to reverse coupling. After the coupler 2202 sets the coupling port to reverse coupling, the RFIC 21 can receive the signal B2 through the measurement channel. Then, the reflection coefficient Γ of the impedance matching network 23 is calculated based on the signal parameter rev_value (such as a voltage parameter) of the signal B2 and the signal parameter fwd_value (such as a voltage parameter) of the signal A3. measure_state1 For example, Γ measure_state1 =rev_value / fwd_value. In this way, the RFIC 21 can also calculate the reflection coefficient Γ of the antenna 24 when the impedance matching network 23 is in the load state of state2. measure_state2 , and the reflection coefficient Γ of the antenna 24 when the impedance matching network 23 is in the load state of state3 measure_state3 Then, the electronic device 100 can query the real reflection coefficient of the antenna 24 corresponding to the load states of the impedance matching network 23 in state1, state2 and state3 from the storage medium storing the real reflection coefficient of the impedance matching network 23: Γ in_state1 , Γ in_state2 and Γ in_state3 In this way, the electronic device 100 can obtain the following three sets of data: measure_state1 , Γ in_state1}, {Γ measure_state2 , Γ in_state2} and {Γ measure_state3 , Γ in_state3}.

[0072] In some embodiments, the electronic device 100 obtains the above three sets of data {Γ measure_state1 , Γ in_state1}, {Γmeasure_state2 , Γ in_state2} and {Γ measure_state3 , Γ in_state3}, the values ​​of the calibration parameters a, b, and c corresponding to the electronic device 100 can be calculated using the above formula (1).

[0073] In other embodiments, the electronic device 100 obtains the above three sets of data {Γ measure_state1 , Γ in_state1}, {Γ measure_state2 , Γ in_state2} and {Γ measure_state3 , Γ in_state3}, we can also use the least squares method, ridge regression, minimum absolute error regression and other methods to calculate the three sets of data: {Γ measure_state1 , Γ in_state1}, {Γ measure_state2 , Γ in_state2} and {Γ measure_state3 , Γ in_state3 A linear fit is performed, and calibration parameters a, b, and c are determined based on the fit results. To improve the accuracy of the fit, the reflection coefficient and true reflection coefficient of antenna 24 under other load conditions of impedance matching network 23 can also be obtained to obtain more data for linear fitting and obtain more accurate calibration parameters a, b, and c.

[0074] In some embodiments, after the electronic device 100 calculates the calibration parameters a, b, and c, the RFIC 21 of the electronic device 100 can send a MIPI instruction P0 to the impedance matching network 23, instructing the impedance matching network 23 to switch the current load state to the default load state state0. Then, the RFIC 21 can detect the reflection coefficient Γ' of the impedance matching network 23 in real time. measure , and calculate the real reflection coefficient Γ' of the impedance matching network 23 based on the detected reflection coefficient and calibration parameters a, b, c in , and according to the real reflection coefficient Γ' of the impedance matching network 23 in , adjust the load state of the impedance matching network 23 so that the impedance of the antenna 24 matches the impedance of the RFFE 22, thereby reducing the impact of external environmental changes on the performance of the antenna 24.

[0075] In some embodiments, if the real reflection coefficient Γ' of the impedance matching network 23 is in If the actual reflection coefficient Γ' of the impedance matching network 23 is less than a preset reflection coefficient (e.g., 0.05, 0.1, etc., which is not limited to this), it can be considered that the impedance of the antenna 24 matches the impedance of the RFFE 22, and there is no need to adjust the load state of the impedance matching network 23. inIf the reflection coefficient is greater than or equal to the preset reflection coefficient, it can be considered that the impedance of the antenna 24 does not match the impedance of the RFFE 22. At this time, it is necessary to continue to adjust the load state of the impedance matching network 23 so that the impedance of the antenna 24 matches the impedance of the RFFE 22 to reduce the impact of the external environment changes on the performance of the antenna 24.

[0076] FIG5 is a circuit diagram of the impedance matching network 23 provided in an embodiment of the present application.

[0077] Referring to Figure 5, the impedance matching network 23 includes a control circuit K1. The control circuit K1 includes three capacitor control circuits R1 and one inductor control circuit R2. The three capacitor control circuits R1 and the inductor control circuit R2 are connected in parallel. The capacitor control circuit R1 includes a capacitor and a switch, wherein the capacitor and the switch are connected in series and grounded. The inductor control circuit R2 includes an inductor and a switch, wherein the inductor and the switch are connected in series and grounded. The four switches of the impedance matching network 23 can form 16 load states. In some embodiments, any three of these load states can be selected for calibration to determine the calibration parameters a, b, and c.

[0078] In some embodiments, after the calibration parameters a, b, and c are determined, the determined calibration parameters a, b, and c can be verified by other load states of the impedance matching network 23 .

[0079] For example, after the calibration coefficients a, b, and c are determined through the three load states of state1, state2, and state3 of the impedance matching network 23, the load state of the impedance matching network 23 can be adjusted to state4, and the reflection coefficient Γ of the impedance matching network 23 can be detected by the RFIC 21 under the load state of state4. measure_state4 , then Γ can be measure_state4 Substitute the calibration coefficients a, b, and c into the above formula (1) to calculate the true reflection coefficient Γ of the impedance matching network 23 in_state4 , can then be calculated based on the real reflection coefficient Γ of the impedance matching network 23 in_state4 and the calibration reflection coefficient Γ' in_state4 The difference between them determines whether the calibration coefficients a, b, and c are accurate.

[0080] It can be understood that the calibration reflection coefficient Γ' in_state4 The reflection coefficient of the impedance matching network 23 may be detected by the vector network analyzer 40 when the impedance matching network 23 is in the state 4 load state in the manner described in FIG. 4 .

[0081] In some embodiments, the Euclidean distance estimation method can be used to calculate the true reflection coefficient Γ in_state4 and the calibration reflection coefficient Γ' in_state4Euclidean distance between: Euclidean_Error=|Γ in_state4 -Γ' in_state4 If Euclidean_Error is less than or equal to the preset Euclidean distance (for example, 0.1, 0.2, etc., which is not limited to this), then it can be considered that the true reflection coefficient Γ in_state4 and the calibration reflection coefficient Γ' in_state4 The error between them is small, and the values ​​of calibration coefficients a, b, and c are more accurate; on the contrary, if Euclidean_Error is greater than the preset Euclidean distance, it can be considered that the true reflection coefficient Γ in_state4 and the calibration reflection coefficient Γ' in_state4 The error between them is large, and the values ​​of the calibration coefficients a, b, and c are inaccurate. It is necessary to re-determine the values ​​of the calibration parameters a, b, and c.

[0082] In other embodiments, the true reflection coefficient Γ can be calculated by formula (3) and formula (4) respectively: in_state4 and the calibration reflection coefficient Γ' in_state4 The amplitude difference and phase difference between them are then used to determine whether the values ​​of the calibration parameters a, b, and c are accurate. in_state4 )-Re(Γ' in_state4 )| (3)

[0083] Where Amp_Err is the true reflection coefficient Γ in_state4 and the calibration reflection coefficient Γ' in_state4 The amplitude difference between in_state4 ) is the true reflection coefficient Γ in_state4 The real part, Re(Γ' in_state4 ) is the calibration reflection coefficient Γ' in_state4 Phase_Err=|lm(Γ in_state4 )-lm(Γ' in_state4 )| (4)

[0084] Where Phase_Err is the true reflection coefficient Γ in_state4 and the calibration reflection coefficient Γ' in_state4 The phase difference between them, lm(Γ in_state4 ) is the true reflection coefficient Γ in_state4 The imaginary part, lm(Γ' in_state4 ) is the calibration reflection coefficient Γ' in_state4 The imaginary part of .

[0085] In some embodiments, the true reflection coefficient Γ can be determined in_state4 and the calibration reflection coefficient Γ' in_state4Whether the amplitude difference and phase difference between them are both less than or equal to the preset difference (for example, 0.5, 0.6, 0.7, etc., which is not limited to this). If so, it can be considered that the values ​​of calibration parameters a, b, and c are relatively accurate; if not, it can be considered that the values ​​of calibration parameters a, b, and c are inaccurate, and the values ​​of calibration parameters a, b, and c need to be reconfirmed.

[0086] FIG6 is a circuit diagram of an impedance matching network 23 ′ provided in an embodiment of the present application.

[0087] Referring to Figure 6 , impedance matching network 23' incorporates a tuner 33, which is connected to control circuit K1. The load of impedance matching network 23' is determined by both control circuit K1 and tuner 33. Both control circuit K1 and tuner 33 have multiple load states. Adding tuner 33 increases the load states of impedance matching network 23', improving the degree of freedom of impedance matching network 23' and thus enhancing the tuning accuracy of antenna 24.

[0088] It should be noted that the mapping relationship between the real reflection coefficient and the reflection coefficient of the impedance matching network represented by the above formula (1) is only used as an example and is not intended to limit the present application.

[0089] In some embodiments, the electronic device 100 can obtain multiple reflection coefficients and multiple true reflection coefficients of the impedance matching network 23' under multiple load states, and then use least squares method, ridge regression, minimum absolute error regression and other methods to fit these data to determine the mapping relationship between the true reflection coefficient and the reflection coefficient of the impedance matching network, and determine the corresponding mapping parameters, that is, the curve parameters of the fitting curve.

[0090] In some embodiments, referring to FIG7 , based on the electronic device 100 shown in FIG2B , the RFFE 22 may include, in addition to the power amplifier 2201 and coupler 2202, a filter 2203 and a single-pole double-throw switch 2204. The power amplifier 2201, filter 2203, single-pole double-throw switch 2204, and coupler 2202 are connected in sequence. The single-pole double-throw switch 2204 is used to switch the signal transmission channel. The filter 2203 is used to filter the signal amplified by the power amplifier 2201 to reduce signal noise, thereby preventing noise from interfering with the reflection coefficient detection.

[0091] FIG8 is a flowchart illustrating an example of an antenna tuning method according to an embodiment of the present application.

[0092] Referring to FIG8 , the antenna tuning method includes the following steps:

[0093] S101: The RFIC of the electronic device detects N reflection coefficients of the impedance matching network under N load states, where N is a positive integer.

[0094] It should be noted that the value of N matches the number of calibration parameters of the parameter-containing calibration model (e.g., the value of N is greater than or equal to the number of calibration parameters of the parameter-containing calibration model). For example, when the parameter-containing calibration model is the parameter-containing calibration model S1 described above that includes three calibration parameters, the value of N can be greater than or equal to 3.

[0095] The following describes the embodiment of the present application by taking the parameter-containing calibration model S1 as an example.

[0096] For example, referring to FIG. 7 , the internal circuit of the impedance matching network 23 includes four switches: t1, t2, t3, and t4. By adjusting the states of switches t1, t2, t3, and t4, the load state of the impedance matching network 23 can be adjusted. For example, referring to FIG. 9A , the electronic device 100 can adjust the impedance matching network 23 to load state 1 by turning off switch t1 of the impedance matching network 23 and disconnecting switches t2, t3, and t4 of the impedance matching network 23. Referring to FIG. 9B , the electronic device 100 can adjust the impedance matching network 23 to load state 2 by turning off switches t1 and t2 of the impedance matching network 23 and disconnecting switches t3 and t4 of the impedance matching network 23. Referring to FIG. 9C , the electronic device 100 can adjust the impedance matching network 23 to load state 3 by turning off switches t1, t2, and t3 of the impedance matching network 23 and disconnecting switch t4 of the impedance matching network 23.

[0097] 9A, the electronic device 100 can control the impedance matching network 23 through the RFIC 21 to set the current load state to the load state state1, and then detect the reflection coefficient Γ of the impedance matching network 23 in the load state state1 through the RFIC 21. measure_state1 In this way, the electronic device 100 can also detect the reflection coefficient Γ of the impedance matching network 23 in the load state of state2 (as shown in FIG9B ). measure_state2 , and detect the reflection coefficient Γ of the impedance matching network 23 in the load state of state3 (as shown in FIG9C ) measure_state3 , the three reflection coefficients Γ of the impedance matching network 23 under the three load states state1, state2 and state3 are obtained measure_state1 , Γ measure_state2 , Γ measure_state3 .

[0098] S102: The electronic device determines N calibration parameters in the parameter-containing calibration model according to the N reflection coefficients, the N real reflection coefficients corresponding to the N reflection coefficients, and the parameter-containing calibration model.

[0099] In some embodiments, a vector network analyzer or other instrument for measuring reflection coefficients can be used to pre-detect the reflection coefficients of the impedance matching network under N load conditions, which serve as the true reflection coefficients of the impedance matching network. The N true reflection coefficients of the impedance matching network under the N load conditions are then stored in a storage medium or server of the electronic device for subsequent use in calculating calibration parameters of the electronic device.

[0100] For example, referring to FIG. 4 above, a vector network analyzer 40 can be used to detect the true reflection coefficient Γ of the impedance matching network 23 in the load states of state1, state2 and state3. in_state1 , Γ in_state2 and Γ in_state3 , and the true reflection coefficient Γ in_state1 , Γ in_state2 and Γ in_state3 Stored in the storage medium of the electronic device 100 or in a server.

[0101] In some embodiments, after the electronic device obtains N reflection coefficients under N load states of the impedance matching network, it can obtain N real reflection coefficients corresponding to the N reflection coefficients from a storage medium or server that stores the real reflection coefficients of the impedance matching network, and determine N calibration parameters in the parameter-containing calibration model based on the N reflection coefficients, the N real reflection coefficients corresponding to the N reflection coefficients, and the parameter-containing calibration model.

[0102] For example, the three reflection coefficients of the three load states of the impedance matching network 23: state1, state2 and state3: Γ measure_state1 , Γ measure_state2 , Γ measure_state3 and three real reflection coefficients: Γ in_state1 , Γ in_state2 , Γ in_state3 , substituted into the parameter-containing calibration model S1 shown in the above formula (1) to calculate the calibration parameters a, b, c.

[0103] S103: The RFIC of the electronic device detects the reflection coefficient of the impedance matching network under the initial load state.

[0104] In some embodiments, after determining the calibration parameters of the parameter-based calibration model, the electronic device may adjust the load state of the impedance matching network to an initial load state. The initial load state is the load state of the impedance matching network when the antenna of the electronic device is not subject to interference from the external environment and the impedance of the antenna matches the impedance of the RFFE. Subsequently, when the antenna of the electronic device is subject to interference from the external environment and requires tuning, the RFIC of the electronic device may detect the reflection coefficient of the antenna in the initial load state of the impedance matching network as the measured reflection coefficient.

[0105] For example, referring to FIG9D , the initial load state state 0 of the impedance matching network 23 is a load state when switches t1 and t3 of the impedance matching network 23 are closed and switches t2 and t4 are open. After the electronic device 100 determines the calibration parameters a, b, and c of the parameter-containing calibration model S1, while the electronic device 100 is tuning the antenna 24, the RFIC 21 of the electronic device 100 can open a measurement channel to detect the reflection coefficient Γ in the initial load state state 0 of the impedance matching network 23. measure_state0 .

[0106] S104: The electronic device calibrates the reflection coefficient detected by the RFIC according to the parameter-containing calibration model and the determined values ​​of the N calibration parameters of the parameter-containing calibration model to obtain a calibration result.

[0107] In some embodiments, during the tuning process of the electronic device, after the reflection coefficient of the impedance matching network under the initial load state is detected by RFIC, the reflection coefficient and the values ​​of N calibration parameters of the parameter-containing calibration model can be substituted into the formula of the parameter-containing calibration model to calculate the true reflection coefficient of the impedance matching network as the calibration result.

[0108] For example, referring to FIG. 9D , the RFIC 21 of the electronic device 100 detects the reflection coefficient Γ of the impedance matching network 23 under the initial load state state0. measure_state0 Afterwards, the reflection coefficient Γ can be measure_state0 The values ​​of the calibration parameters a, b, and c are substituted into the formula of the calibration model S1 (the above formula (1)) to calculate the true reflection coefficient Γ of the impedance matching network 23 in_state0 .

[0109] S105: The electronic device tunes the antenna based on the calibration result.

[0110] In some embodiments, after determining the true reflection coefficient of the impedance matching network, the electronic device may determine whether the true reflection coefficient is less than a preset reflection coefficient. When the true reflection coefficient is greater than or equal to the preset reflection coefficient (e.g., 0.05, 0.1, etc., without limitation), the electronic device may adjust the load state of the impedance matching network so that the true reflection coefficient under the adjusted load state of the impedance matching network is less than the preset reflection coefficient, thereby matching the impedance of the antenna with the impedance of the RFFE. It will be understood that when the true reflection coefficient of the impedance matching network is less than the preset reflection coefficient, the impedance of the antenna matches the impedance of the RFFE. When the true reflection coefficient of the impedance matching network is greater than or equal to the preset reflection coefficient, the impedance of the antenna does not match the impedance of the RFFE.

[0111] For example, referring to FIG. 9D , in the process of tuning the antenna 24 by the electronic device 100 , the electronic device 100 determines the true reflection coefficient Γ of the impedance matching network 23 . measure_state0 After that, the true reflection coefficient Γ can be determined measure_state0 Is the reflection coefficient less than the preset reflection coefficient? If so, the impedance of antenna 24 matches the impedance of RFFE 22, and no tuning of antenna 24 is required. If not, the impedance of antenna 24 does not match the impedance of RFFE 22, and tuning of antenna 24 is required. At this point, RFIC 21 of electronic device 100 can adjust the load state of impedance matching network 23 so that the actual reflection coefficient under the adjusted load state of impedance matching network 23 is less than the preset reflection coefficient, thereby matching the impedance of antenna 24 with the impedance of RFFE 21.

[0112] For example, referring to FIG. 9E , in the process of tuning the antenna 24 by the electronic device 100 , when the electronic device 100 determines the true reflection coefficient Γ of the impedance matching network 23 , measure_state0 When the reflection coefficient is less than the preset value, the impedance matching network 23 can be adjusted to the load state state4, and the real reflection coefficient Γ when the impedance matching network 23 is in the load state state4 is detected. measure_state4 The load state state4 is a load state when the switches t1 and t4 of the impedance matching network 23 are closed and the switches t2 and t3 are open. When the electronic device 100 determines that the impedance matching network 23 is in the load state state4, the real reflection coefficient Γ measure_state4 When it is less than the preset reflection coefficient, it can be determined that the impedance of the antenna 24 matches the impedance of the RFFE 21, and the tuning is ended.

[0113] It should be noted that the present application does not limit the circuit structure of the impedance matching network, and the above is only an exemplary description. In other embodiments, the circuit of the impedance matching network may also be of other structures. For example, the control circuits connected in parallel in the circuit of the impedance matching network (for example, the control circuits R1 and R2 shown in FIG5 above) may be 2, 3, 5, 6 or 7, etc. Specifically, for example, it includes 1 control circuit R1 and 1 control circuit R2, or 2 control circuits R1 and 1 control circuit R2, or 4 control circuits R1 and 1 control circuit R2, or 5 control circuits R1 and 1 control circuit R2, or 6 control circuits R1 and 1 control circuit R2. In an embodiment of the present application, the electronic device can reuse the original impedance matching network for self-calibration to determine the calibration parameters without the need to add additional calibration devices. In this way, not only is manual participation not required, the measurement efficiency of the calibration parameters is improved, but also the hardware cost can be reduced. Then, the electronic device can calibrate the detected reflection coefficient of the impedance matching network according to its own calibration parameters through a parameter-containing calibration model to obtain the true reflection coefficient of the impedance matching network. Then, based on the true reflection coefficient of the impedance matching network, the antenna is tuned so that the performance of the antenna is not affected by external environmental factors.

[0114] FIG10 is a flowchart illustrating an example of an antenna tuning method according to an embodiment of the present application.

[0115] Referring to FIG10 , the antenna tuning method includes the following steps:

[0116] S201: The electronic device detects that an antenna tuning condition is met.

[0117] In some embodiments, when the electronic device detects that the current system time reaches a preset tuning time, the electronic device may determine that the antenna tuning condition is met.

[0118] In other implementations, when the electronic device detects that the real reflection coefficient (the reflection coefficient after calibration of the reflection coefficient detected by the RFIC) of the impedance matching network under the current load state is greater than the preset reflection coefficient, it can be determined that the electronic device meets the antenna tuning condition.

[0119] S202: The electronic device calibrates a current first reflection coefficient of an impedance matching network of the electronic device based on a parameter-containing calibration model including a plurality of calibration parameters to obtain a second reflection coefficient.

[0120] In some embodiments, after the electronic device detects that the antenna tuning conditions are met, the electronic device can detect the current first reflection coefficient of the impedance matching network through RFIC, and then calibrate the first reflection coefficient of the impedance matching network according to a parameter-containing calibration model containing multiple calibration parameters, such as the above-mentioned parameter-containing calibration parameter S1 and the above-mentioned parameter-containing calibration parameter S2, etc., to obtain the second reflection coefficient.

[0121] In some embodiments, multiple calibration parameters of the parameter-containing calibration model are determined in the following manner: the electronic device obtains multiple reflection coefficients of the impedance matching network of the electronic device under multiple load states, and then determines multiple calibration parameters of the parameter-containing calibration model based on the multiple reflection coefficients.

[0122] For example, when the impedance matching network is in multiple load states, multiple third reflection coefficients of the impedance matching network are detected by the radio frequency integrated circuit of the electronic device, and multiple calibration parameters of the parameter-containing calibration model are calculated based on the multiple third reflection coefficients, the multiple fourth reflection coefficients corresponding to the multiple third reflection coefficients, and the parameter-containing calibration model.

[0123] In some embodiments, the plurality of fourth reflection coefficients are obtained by a measuring instrument (eg, a vector network analyzer) after detecting the impedance matching network when the impedance matching network is in a plurality of load states.

[0124] S203: The electronic device tunes the antenna based on the second reflection coefficient.

[0125] In some embodiments, after the electronic device calibrates the first reflection coefficient of the impedance matching network to obtain a second reflection coefficient, it can tune the antenna based on the second reflection coefficient to match the impedance of the antenna with the impedance of the RFFE. For example, if the second reflection coefficient is greater than or equal to a preset reflection coefficient, the impedance matching network's current first load state is adjusted to a second load state. The fifth reflection coefficient of the impedance matching network in the second load state is less than or equal to the preset reflection coefficient. The fifth reflection coefficient is obtained by calibrating the sixth reflection coefficient of the impedance matching network using a parameter-containing calibration model. The sixth reflection coefficient is obtained by testing the impedance matching network by the RFIC of the electronic device when the impedance matching network is in the second load state.

[0126] In an embodiment of the present application, an electronic device can reuse the existing impedance matching network to measure its own calibration parameters without the need for additional calibration devices. This not only eliminates the need for manual parameters, improves the efficiency of calibration parameter measurement, but also reduces hardware costs. The electronic device can then calibrate the detected reflection coefficient of the impedance matching network using a parameter-based calibration model based on its own calibration parameters to obtain the true reflection coefficient of the impedance matching network. The antenna can then be tuned based on the true reflection coefficient of the impedance matching network, ensuring that the antenna's performance is not affected by external environmental factors.

[0127] It should be understood that in the various embodiments of the present application, the size of the serial numbers of the above-mentioned processes does not mean the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of the present application.

[0128] Those skilled in the art will appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.

[0129] Those skilled in the art will clearly understand that, for the convenience and brevity of description, the specific working processes of the systems, devices and units described above can refer to the corresponding processes in the aforementioned method embodiments and will not be repeated here.

[0130] In the several embodiments provided in this application, it should be understood that the disclosed systems, devices and methods can be implemented in other ways. For example, the device embodiments described above are merely schematic. For example, the division of the units is merely a logical function division. In actual implementation, there may be other division methods, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, indirect coupling or communication connection of devices or units, which can be electrical, mechanical or other forms.

[0131] The units described as separate components may or may not be physically separate, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed across multiple network units. Some or all of these units may be selected to achieve the purpose of this embodiment according to actual needs.

[0132] In addition, each functional unit in each embodiment of the present application may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit.

[0133] In the above embodiments, all or part of the embodiments may be implemented by software, hardware, firmware, or any combination thereof. When implemented using a software program, all or part of the embodiments may be implemented in the form of a computer program product. The computer program product includes one or more computer instructions. When the computer program instructions are loaded and executed on a computer, all or part of the processes or functions described in the embodiments of the present application are generated. The computer may be a general-purpose computer, a special-purpose computer, a computer network, or other programmable device. The computer instructions may be stored in a computer-readable storage medium or transmitted from one computer-readable storage medium to another computer-readable storage medium. For example, the computer instructions may be transmitted from one website, computer, database server, or data center to another website, computer, database server, or data center via a wired (e.g., coaxial cable, optical fiber, digital subscriber line (DSL)) or wireless (e.g., infrared, wireless, microwave, etc.) method. The computer-readable storage medium may be any available medium that can be accessed by a computer or a data storage device such as a database server or data center that includes one or more media integrated therein. The available medium may be a magnetic medium (eg, a floppy disk, a hard disk, a magnetic tape), an optical medium, or a semiconductor medium (eg, a solid state disk (SSD)).

[0134] The above description is merely a specific embodiment of the present application, but the scope of protection of the present application is not limited thereto. Any changes or substitutions that can be easily conceived by a person skilled in the art within the technical scope disclosed in this application should be included in the scope of protection of this application. Therefore, the scope of protection of this application should be based on the scope of protection of the claims.

Claims

1. An antenna tuning method for an electronic device, characterized in that: The method comprises: It is detected that the antenna tuning condition is met; Calibrate a current first reflection coefficient of an impedance matching network of the electronic device based on a parameter-containing calibration model including a plurality of calibration parameters to obtain a second reflection coefficient; performing a tuning process on the antenna based on the second reflection coefficient; The multiple calibration parameters of the calibration model are determined by: Obtaining multiple reflection coefficients of an impedance matching network of the electronic device under multiple load states; A plurality of calibration parameters of the parameter-containing calibration model are determined based on the plurality of reflection coefficients.

2. The method according to claim 1, characterized in that The obtaining of multiple reflection coefficients of the impedance matching network of the electronic device under multiple load states includes: When the impedance matching network is in the multiple load states, multiple third reflection coefficients of the impedance matching network are detected by the radio frequency integrated circuit of the electronic device.

3. The method according to claim 2, characterized in that Determining a plurality of calibration parameters of the parameter-containing calibration model according to the plurality of reflection coefficients includes: The multiple calibration parameters of the calibration model with parameters are calculated based on the multiple third reflection coefficients, the multiple fourth reflection coefficients corresponding to the multiple third reflection coefficients, and the calibration model with parameters.

4. The method according to claim 3, characterized in that The plurality of fourth reflection coefficients are obtained by a measuring instrument after detecting the impedance matching network when the impedance matching network is in the plurality of load states.

5. The method according to claim 4, characterized in that The measuring instrument includes a vector network analyzer.

6. The method according to claim 1, characterized in that The first reflection coefficient is obtained after the radio frequency integrated circuit of the electronic device detects the impedance matching network when the impedance matching network is in a current first load state.

7. The method according to claim 1, characterized in that The tuning process of the antenna based on the second reflection coefficient includes: corresponding to the second reflection coefficient being greater than the preset reflection coefficient, adjusting the current first load state of the impedance matching network to a second load state; In which, the fifth reflection coefficient of the impedance matching network when it is in the second load state is less than or equal to the preset reflection coefficient; the fifth reflection coefficient is obtained by calibrating the sixth reflection coefficient of the impedance matching network through the parameter-containing calibration model, and the sixth reflection coefficient is obtained by the radio frequency integrated circuit of the electronic device after detecting the impedance matching network when the impedance matching network is in the second load state.

8. The method according to claim 1, characterized in that The antenna tuning conditions include: the current system time of the electronic device reaches a preset time; and the reflection coefficient of the impedance matching network in a load state is greater than a preset reflection coefficient.

9. An electronic device, characterized in that: include: a memory for storing instructions to be executed by one or more processors of the electronic device; The processor, when executing the instructions in the memory, can enable the electronic device to perform the antenna tuning method according to any one of claims 1 to 8.

10. A computer-readable storage medium, characterized in that The computer-readable storage medium stores instructions, which, when executed on a computer, enable the computer to perform the antenna tuning method according to any one of claims 1 to 8.

11. A computer program product, characterized in that The invention comprises a computer program / instruction, which, when executed, causes a computer to perform the antenna tuning method according to any one of claims 1 to 8.

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