Current determination method, current determination apparatus, storage medium and electric system

Abstract

The present application relates to a current determination method, a current determination apparatus, a storage medium and an electric system. The method comprises: on the basis of temperature distribution data and a preset zero-drift compensation model, determining a zero-drift current compensation value corresponding to the temperature distribution data, wherein the temperature distribution data is used for reflecting the temperature distribution situation of a current sensor in an electric circuit, the temperature distribution data comprises temperature values of the electric circuit at a plurality of sampling parts, at least some of the sampling parts are located on the current sensor, and the zero-drift compensation model represents a correspondence between the temperature distribution data and the zero-drift current compensation value.

Description

Current determination method, current determination device, storage medium and power consumption system

[0001] This application claims priority to the Chinese patent application filed with the China Patent Office on March 28, 2024, with application number 202410384346.X and application name “Current Determination Method, Device, Storage Medium and System”, the entire contents of which are incorporated by reference into this application. Technical Field

[0002] The present application relates to the field of current measurement technology, and more specifically, to a current determination method, a current determination device, a storage medium, and a power consumption system. Background Art

[0003] Current drift refers to the phenomenon in a current measurement system where, in the absence of an external signal, the current value at the input drifts over time, causing the measurement result to deviate from the initial set value. Furthermore, in actual engineering applications, it has been found that when a current sampling system consisting of a controller and a shunt is used as a single component, the current drift phenomenon is particularly severe, seriously affecting the accuracy of current measurement.

[0004] Summary of the Invention

[0005] The purpose of this application is to provide a new current determination solution.

[0006] In a first aspect, the present application discloses a current determination method, the method comprising:

[0007] Based on the temperature distribution data and a preset zero-drift compensation model, a zero-drift current compensation value corresponding to the temperature distribution data is determined; wherein the temperature distribution data is used to reflect the temperature distribution condition of the current sensor in the power circuit, the temperature distribution data includes temperature values ​​of the power circuit at multiple sampling locations, at least some of the sampling locations are located at the current sensor, and the zero-drift compensation model characterizes the correspondence between the temperature distribution data and the zero-drift current compensation value.

[0008] Optionally, the multiple sampling locations include a first sampling location located in the middle of the current sensor, and for the current inflow end and the current outflow end of the first sampling location, a second sampling location adjacent to the current inflow end and a third sampling location adjacent to the current outflow end.

[0009] Optionally, the current sensor includes a sampling resistor corresponding to the first sampling position, and further includes a first connecting member and a second connecting member, wherein the first connecting member is electrically connected to a current inflow end of the sampling resistor, and the second connecting member is connected to a current outflow end of the sampling resistor;

[0010] The multiple sampling locations include a second sampling location corresponding to the first connecting member, or a second sampling location corresponding to the first electrical component; the multiple sampling locations also include a third sampling location corresponding to the second connecting member, or a third sampling location corresponding to the second electrical component; wherein, the first electrical component is an electrical component electrically connected to the first connecting member in the electrical circuit, and the second electrical component is an electrical component electrically connected to the second connecting member in the electrical circuit.

[0011] Optionally, the zero drift compensation model includes a first factor and a second factor for determining the zero drift current compensation value, the first factor is the temperature value of the first sampling location, and the second factor is a first temperature difference between the second sampling location and the third sampling location.

[0012] Optionally, before determining the zero-drift current compensation value corresponding to the temperature distribution data based on the temperature distribution data and a preset zero-drift compensation model, the method further includes:

[0013] Acquire multiple sets of test data; wherein one set of test data corresponds to one sampling moment, and the test data includes temperature distribution data reflecting the temperature distribution condition of the current sensor in the power circuit, and the zero-drift current value of the power circuit output by the current sampling device;

[0014] The zero drift compensation model is constructed according to the multiple groups of test data.

[0015] Optionally, the plurality of sampling locations include a first sampling location located in the middle of the current sensor, and, with respect to a current inflow end and a current outflow end of the first sampling location, a second sampling location adjacent to the current inflow end and a third sampling location adjacent to the current outflow end; the plurality of groups of test data include a plurality of groups of first test data and a plurality of groups of second test data;

[0016] The multiple sets of first test data include: under a first test condition in which the temperature value of the first sampling portion remains unchanged, a second temperature value of the second sampling portion, a third temperature value of the third sampling portion, and a first zero-drift current value output by the current sampling device corresponding to each first sampling moment;

[0017] The multiple sets of second test data include: under the second test condition of keeping the temperature difference between the second sampling position and the third sampling position unchanged, the first temperature value of the first sampling position corresponding to each second sampling moment and the second zero-drift current value output by the current sampling device.

[0018] Optionally, constructing the zero drift compensation model according to the multiple groups of test data includes:

[0019] Constructing a first relational expression based on the multiple sets of first test data; wherein the first relational expression represents the corresponding relationship between the first temperature difference between the second sampling position and the third sampling position and the zero-drift current value;

[0020] Constructing a second relational expression based on the plurality of sets of second test data; wherein the second relational expression represents the corresponding relationship between the temperature value of the first sampling part and the zero-drift current value;

[0021] The zero drift compensation model is constructed according to the first relationship and the second relationship.

[0022] Optionally, the multiple sampling locations include a second sampling location corresponding to the first electrical component and a third sampling location corresponding to the second electrical component. Before determining the zero-drift current compensation value corresponding to the temperature distribution data based on the temperature distribution data and a preset zero-drift compensation model, the method further includes:

[0023] Under the first test condition, further obtaining a fourth temperature value of the first connecting member at each first sampling moment and a fifth temperature value of the second connecting member at each first sampling moment;

[0024] The constructing a first relational expression according to the plurality of sets of first test data includes:

[0025] constructing a third relational expression based on the fourth temperature value, the fifth temperature value, and the first zero-drift current value at each first sampling moment; wherein the third relational expression represents a corresponding relationship between a second temperature difference between the first connector and the second connector and the zero-drift current value;

[0026] constructing a temperature conversion coefficient according to the second temperature difference and the first temperature difference;

[0027] The first relational expression is constructed according to the temperature conversion coefficient and the third relational expression.

[0028] Optionally, before determining the zero-drift current compensation value corresponding to the temperature distribution data based on the temperature distribution data and a preset zero-drift compensation model, the method further includes:

[0029] Acquiring temperature distribution data reflecting the temperature distribution of current sensors in the power circuit;

[0030] After determining the zero-drift current compensation value corresponding to the temperature distribution data based on the temperature distribution data and a preset zero-drift compensation model, the method further includes:

[0031] The current value of the power circuit is determined according to the zero-drift current compensation value and the measured current value output by the current sensor.

[0032] In a second aspect, the present application discloses a current determination device, the device comprising:

[0033] A determination module is used to determine a zero-drift current compensation value corresponding to the temperature distribution data based on the temperature distribution data and a preset zero-drift compensation model; wherein the temperature distribution data is temperature distribution data used to reflect the temperature distribution condition of the current sensor in the power circuit, the temperature distribution data includes temperature values ​​of the power circuit at multiple sampling locations, at least some of the sampling locations are located at the current sensor, and the zero-drift compensation model characterizes the correspondence between the temperature distribution data and the zero-drift current compensation value.

[0034] In a third aspect, the present application discloses a current determination device, which includes: a memory and a processor, the memory storing executable instructions, the instructions being used to control the processor to operate to execute the current determination method according to the first aspect of the present application.

[0035] In a fourth aspect, the present application discloses a readable storage medium storing a computer program, which, when executed by a processor, implements the current determination method as described in the first aspect.

[0036] In a fifth aspect, the present application discloses an electricity system, which includes:

[0037] An electric circuit, the electric circuit having a current sensor, the electric circuit having a plurality of sampling locations, at least some of the plurality of sampling locations being located at the current sensor;

[0038] A current determining device, wherein the current determining device is the current determining device according to the second aspect or the third aspect;

[0039] There are multiple temperature sensors, and one sampling location corresponds to at least one temperature sensor. The temperature sensor collects the temperature value of the corresponding sampling location and inputs the temperature value into the current determination device.

[0040] In conjunction with the above-mentioned technical solution, the present application discloses a current determination method, comprising: determining a zero-drift current compensation value corresponding to temperature distribution data based on temperature distribution data and a preset zero-drift compensation model; wherein the temperature distribution data is used to reflect the temperature distribution condition of a current sensor in an electrical circuit, the temperature distribution data including temperature values ​​of the electrical circuit at multiple sampling locations, at least some of which are located at the current sensor; and the zero-drift compensation model characterizes the correspondence between the temperature distribution data and the zero-drift current compensation value. By determining the zero-drift current compensation value corresponding to the temperature distribution data based on the temperature distribution data and the preset zero-drift compensation model, current zero-drift compensation can be performed based on the temperature distribution data of the electrical circuit, thereby improving the accuracy of current measurement. BRIEF DESCRIPTION OF THE DRAWINGS

[0041] FIG1 is a flow chart of a current determination method according to an embodiment of the present application;

[0042] FIG2 is a schematic structural diagram of an electric circuit according to the present application;

[0043] FIG3 is a flow chart of a current determination method according to another embodiment of the present application;

[0044] FIG4 is a schematic structural diagram of a current determination device according to an embodiment of the present application;

[0045] FIG5 is a schematic structural diagram of a current determination device according to another embodiment of the present application;

[0046] FIG6 is a schematic structural diagram of an electric power system according to an embodiment of the present application. DETAILED DESCRIPTION

[0047] Various exemplary embodiments of the present application will now be described in detail with reference to the accompanying drawings. It should be noted that unless otherwise specifically stated, the relative arrangements of components and steps, numerical expressions and numerical values ​​set forth in these embodiments do not limit the scope of the present application.

[0048] The following description of at least one exemplary embodiment is merely illustrative in nature and is in no way intended to limit the present disclosure, its application, or uses.

[0049] Technologies, methods, and equipment known to ordinary technicians in the relevant art may not be discussed in detail, but where appropriate, the technologies, methods, and equipment should be considered part of the specification.

[0050] In all examples shown and discussed herein, any specific values ​​should be interpreted as merely exemplary and not limiting. Therefore, other examples of the exemplary embodiments may have different values.

[0051] It should be noted that like reference numerals and letters refer to like items in the following figures, and therefore, once an item is defined in one figure, it need not be further discussed in subsequent figures.

[0052] Current sampling systems typically use shunts as current sensors. In actual engineering applications, it has been found that when testing current zero-drift in a current sampling system composed of a controller and shunt, the current zero-drift can fluctuate within a relatively small range. However, if the controller and shunt current sampling system is used as a single component, the current zero-drift will be much greater than when testing the current sampling system alone, resulting in reduced current measurement accuracy.

[0053] Based on this, the inventors analyzed and discovered that when a current sampling system is used as a component, it is connected to a power circuit. Power control devices are connected to both sides of the current sampling system via conductors such as wires or copper busbars, forming an electrical loop. Further testing revealed that current zero drift is related to the temperature of the power circuit. Based on this relationship, a zero drift compensation model was constructed. When measuring current in the power circuit, the temperature distribution data of the shunt is used to compensate for the current drift of the measured value.

[0054] <Method Example>

[0055] FIG1 is a flow chart of a current determination method according to an embodiment of the present application.

[0056] As shown in FIG1 , the current determination method of this embodiment may be specifically executed by a current determination device.

[0057] Specifically, the current determination method of this embodiment may include the following step S1100.

[0058] Step S1100 : determining a zero-drift current compensation value corresponding to the temperature distribution data according to the temperature distribution data and a preset zero-drift compensation model.

[0059] In this embodiment, the temperature distribution data is used to reflect the temperature distribution of the current sensor in the power circuit. The power circuit may be a current path such as a battery charging circuit or a battery discharging circuit. Those skilled in the art will appreciate that the power circuit may also be other types of current paths, such as a lamp power path, which are not listed here.

[0060] A current sensor is provided in the power circuit, and can output the actual current value measured in the power circuit. The current sensor can be, for example, a shunt.

[0061] A plurality of sampling locations are also provided in the power circuit, and at least some of the sampling locations are located at the current sensor to obtain the temperature distribution of the current sensor.

[0062] In one example, the current sensor is a shunt, and three sampling locations are provided in the electrical circuit. The three sampling locations are all located in the shunt, one of which is located at the sampling resistor in the middle of the shunt, and the other two sampling locations are located at the connectors on both sides of the shunt.

[0063] In another example, the current sensor is a shunt, and three sampling locations are provided in the electrical circuit, one of which is located at the sampling resistor in the middle of the shunt, and the other two sampling locations are located at electrical components respectively connected to the connectors on both sides of the shunt.

[0064] It should be understood by those skilled in the art that the number and location of the sampling sites can be flexibly changed according to needs, and are not listed here one by one.

[0065] In this embodiment, the temperature distribution data may include temperature values ​​of the electrical circuit at multiple sampling locations.

[0066] In one example, the temperature values ​​of the power circuit at multiple sampling locations may be acquired through an NTC temperature sensor.

[0067] In some embodiments, the plurality of sampling sites include a first sampling site located in the middle of the current sensor, and a second sampling site adjacent to the current inflow end and the current outflow end of the first sampling site and a third sampling site adjacent to the current outflow end.

[0068] In this embodiment, the second sampling site may be one or more, and the third sampling site may be one or more, which is not limited here.

[0069] In one example, the number of the second sampling site and the number of the third sampling site may be one each, and both the second sampling site and the third sampling site may be located in the current sensor.

[0070] In another example, there may be plural second sampling sites and plural third sampling sites, and the second sampling sites and the third sampling sites may be located in the current sensor, or the second sampling sites and the third sampling sites may be partially located in the current sensor.

[0071] Those skilled in the art should understand that there is no specific limitation on the number and position of the second sampling sites and the third sampling sites.

[0072] In some embodiments, the current sensor includes a sampling resistor corresponding to the first sampling position, and the current sensor also includes a first connector and a second connector, the first connector is electrically connected to the current inflow end of the sampling resistor, and the second connector is connected to the current outflow end of the sampling resistor.

[0073] In one example, as shown in Figure 2, a current divider 200 includes a sampling resistor 1, a first connector 2, and a second connector 3. The sampling resistor 1 may be made of an alloy material, and the first connector 2 and the second connector 3 may be conductors such as copper busbars or wires. When current flows through the sampling resistor 1, the sampling resistor 1 has a current input terminal and a current output terminal. The first connector 2 is connected to the current input terminal, and the second connector 3 is connected to the current output terminal.

[0074] In some embodiments, the second sampling location may be located at the first connection member 2, and the third sampling location may be located at the second connection member 3. In this manner, the accuracy of detecting the temperature distribution of the current sensor may be improved, thereby improving the accuracy of current measurement.

[0075] In other embodiments, the second sampling location can be located on the first electrical component 4, and the third sampling location can be located on the second electrical component 5. The first electrical component 4 is the electrical component electrically connected to the first connector 2 in the power circuit, and the second electrical component 5 is the electrical component electrically connected to the second connector 3 in the power circuit. Electrical components are other components that make up the power circuit. In this way, only the first sampling location is located on the current sensor, improving current measurement accuracy without adding additional sampling locations to the current sensor.

[0076] The zero drift compensation model can characterize the correspondence between temperature distribution data and zero drift current compensation value. When executing step S1100, the temperature distribution data can be input into the zero drift compensation model, and the zero drift current compensation value corresponding to the temperature distribution data can be output.

[0077] In some embodiments, the zero drift compensation model includes a first factor and a second factor for determining the zero drift current compensation value. The first factor is the temperature value of the first sampling location, and the second factor is the first temperature difference between the second sampling location and the third sampling location.

[0078] In this embodiment, the zero-drift compensation model is related to the temperature of the current sensor and its temperature distribution. The current sensor temperature can be characterized by the temperature value of the first sampling location, i.e., the first factor. The temperature distribution of the current sensor can be characterized by the first temperature difference between the second and third sampling locations, i.e., the second factor. The zero-drift current compensation value is determined based on the first and second factors.

[0079] In some embodiments, before determining the zero-drift current compensation value corresponding to the temperature distribution data according to the temperature distribution data and a preset zero-drift compensation model in step S1100 , the method further includes: step S1000 .

[0080] Step S1000: Acquire temperature distribution data reflecting the temperature distribution of a current sensor in an electrical circuit.

[0081] After determining the zero-drift current compensation value corresponding to the temperature distribution data according to the temperature distribution data and a preset zero-drift compensation model in step S1100 , the method further includes: step S1200 .

[0082] Step S1200 , determining the current value of the power circuit according to the zero-drift current compensation value and the actual current value output by the current sensor.

[0083] In this embodiment, the current value of the power circuit is determined by the zero-drift current compensation value and the actual current value output by the current sensor.

[0084] In some embodiments, before step S1000 of acquiring temperature distribution data reflecting the temperature distribution status of the current sensor in the power circuit, the method further includes: steps S2100 to S2200.

[0085] Step S2100: Acquire multiple groups of test data.

[0086] In this embodiment, a test circuit is constructed. The test circuit includes a current sampling device, multiple sampling locations, and a current sensor. The current sampling accuracy of the current sampling device is higher than that of the current sensor. Multiple sets of test data are acquired through the test circuit, each set corresponding to a sampling moment. The test data includes temperature distribution data reflecting the temperature distribution of the current sensor in the power circuit, as well as the zero-drift current value of the power circuit output by the current sampling device.

[0087] In some embodiments, the plurality of sampling locations include a first sampling location located in the middle of the current sensor, and a second sampling location adjacent to the current inflow end and the current outflow end of the first sampling location, and a third sampling location adjacent to the current outflow end. The plurality of sets of test data include a plurality of sets of first test data and a plurality of sets of second test data.

[0088] In this embodiment, the multiple sets of first test data include: the second temperature value of the second sampling site, the third temperature value of the third sampling site, and the first zero-drift current value output by the current sampling device at each first sampling moment, under a first test condition in which the temperature value of the first sampling site is maintained constant. The multiple sets of second test data include: the first temperature value of the first sampling site, and the second zero-drift current value output by the current sampling device at each second sampling moment, under a second test condition in which the temperature difference between the second sampling site and the third sampling site is maintained constant.

[0089] In some examples, the multiple sampling locations of the test circuit can be located at the middle portion 1 of the current sensor, the first connector 2 of the current sensor, and the second connector 3 of the current sensor, respectively. In these examples, the multiple sets of first test data include the second temperature value T2 of the first connector 2, the third temperature value T3 of the second connector 3, and the first zero-drift current value output by the current sampling device, corresponding to each first sampling moment.

[0090] Step S2200: constructing a zero drift compensation model according to multiple groups of test data.

[0091] In some embodiments, constructing a zero drift compensation model according to multiple sets of test data in step S2200 includes: steps S3100 to S3300.

[0092] Step S3100: construct a first relationship expression according to multiple sets of first test data.

[0093] In this embodiment, through multiple sets of first test data, it is found that the larger the first temperature difference between the second sampling location and the third sampling location, the larger the first zero-drift current value. The first relationship can represent the corresponding relationship between the first temperature difference between the second sampling location and the third sampling location and the zero-drift current value.

[0094] Continuing with the above example, according to the second temperature value being T2, the third temperature value being T3 and the first zero-drift current value, the constructed first relational expression can be expressed as: f(T2-T3).

[0095] Step S3200: construct a second relationship expression according to multiple sets of second test data.

[0096] In this embodiment, a curve fitting can be performed on the temperature value of the first sampling location and the second zero-drift current value in the second test data to obtain a second relationship expression that can represent the corresponding relationship between the temperature value of the first sampling location and the zero-drift current value.

[0097] In some examples, the second relationship can be expressed as f(T1)=A*T1+B.

[0098] Step S3300: construct a zero drift compensation model according to the first relationship and the second relationship.

[0099] In one example, the zero-drift compensation model can be expressed as: Ioffset=f(T2-T3)*A*T1+B.

[0100] In some embodiments, the multiple sampling locations include a second sampling location corresponding to the first electrical component and a third sampling location corresponding to the second electrical component. Before step S1000 obtains temperature distribution data reflecting the temperature distribution condition of the current sensor in the electrical circuit, the method also includes: step S4100.

[0101] Step S4100 : Under the first test condition, a fourth temperature value of the first connection component at each first sampling moment and a fifth temperature value of the second connection component at each first sampling moment are also obtained.

[0102] In this embodiment, the multiple sampling locations of the test circuit include a first sampling location located in the middle portion 1 of the current sensor, a second sampling location located in the first electrical component 4, and a third sampling location located in the second electrical component 5. Correspondingly, multiple sets of first test data include the second temperature value T2 of the first electrical component 4, the third temperature value T3 of the second electrical component 5, and the second zero-drift current value corresponding to each first sampling moment. The first temperature difference is the temperature difference between the second temperature value T2 of the first electrical component 4 and the third temperature value T3 of the second electrical component. In this embodiment, under the first test condition, while acquiring these multiple sets of first test data, the fourth temperature value T4 of the first connector 2 at each first sampling moment and the fifth temperature value T5 of the second connector 3 at each first sampling moment are also acquired.

[0103] In these embodiments, constructing the first relationship according to the multiple sets of first test data in step S3100 includes: steps S5100 to S5300.

[0104] Step S5100 : constructing a third relationship expression according to the fourth temperature value, the fifth temperature value, and the first zero-drift current value at each first sampling moment.

[0105] In this embodiment, the second temperature difference is the temperature difference between the fourth temperature value of the first connecting member 2 and the fifth temperature value of the second connecting member 3. The third relationship can characterize the correspondence between the second temperature difference between the first connecting member and the second connecting member and the zero-drift current value. The third relationship can be expressed as f(T4-T5).

[0106] Step S5200: constructing a temperature conversion coefficient according to the second temperature difference and the first temperature difference.

[0107] In this embodiment, the test circuit can be regarded as a heat conduction model, in which the cross-sectional areas of the sampling resistor of the current sensor, the first connector, and the second connector are approximately equal, so the three are equivalent to a heat conductor for analysis. According to the heat conduction formula, Q = K*A*ΔT / L, where K is the thermal conductivity coefficient of the material, A is the cross-sectional area, L is the heat conduction distance, and ΔT is the temperature difference between the head and tail. It can be seen that there is a linear relationship between the second temperature difference between the first connector 2 and the second connector 3 and the first temperature difference between the first electrical component 4 and the second electrical component 5. This linear relationship can be expressed as T4-T5=k(T2-T3). Wherein, k is the temperature conversion coefficient. Therefore, the temperature conversion coefficient k can be obtained based on the first temperature difference and the second temperature difference.

[0108] Step S5300: construct a first relational expression based on the temperature conversion coefficient and the third relational expression.

[0109] In this embodiment, the first relationship can be expressed as: kf(T2-T3).

[0110] In these examples, the zero-drift compensation model can be expressed as: Ioffset=kf(T2-T3)*A*T1+B.

[0111] According to an embodiment of the present application, a zero-drift current compensation value corresponding to temperature distribution data is determined based on the temperature distribution data and a preset zero-drift compensation model. The temperature distribution data is used to reflect the temperature distribution of a current sensor in an electrical circuit, and includes temperature values ​​of the electrical circuit at multiple sampling locations, at least some of which are located at the current sensor. The zero-drift compensation model characterizes the correspondence between the temperature distribution data and the zero-drift current compensation value. This allows the zero-drift current compensation value to be determined based on the temperature distribution of the current sensor, improving the accuracy of current measurement.

[0112] <Example>

[0113] FIG3 shows a current determination method according to another embodiment of the present application, which specifically includes steps S1 to S10 .

[0114] Step S1, obtaining, under a first test condition in which the temperature value of the first sampling portion remains unchanged, a second temperature value of the second sampling portion, a third temperature value of the third sampling portion, a fourth temperature value of the fourth sampling portion, and a fifth temperature value of the fifth sampling portion corresponding to each first sampling moment, as well as a first zero-drift current value output by a current sampling device.

[0115] In this example, the first sampling location is located at sampling resistor 1 in the middle of the shunt, the second sampling location is located at the first connector 2 of the shunt, and the third sampling location is located at the second connector 3 of the shunt. The fourth sampling location is located at the first electrical component 4, and the fifth sampling location is located at the second electrical component 5. The first temperature value is T1, the second temperature value is T2, the third temperature value is T3, the fourth temperature value is T4, and the fifth temperature value is T5.

[0116] Step S2: constructing a third relationship according to the second temperature value, the third temperature value, and the first zero-drift current value at each first sampling moment.

[0117] In this example, the third relational expression can represent the corresponding relationship between the second temperature difference between the first connector 2 and the second connector 3 and the zero-drift current value. The third relational expression can be expressed as: f(T2-T3)

[0118] Step S3 : constructing a temperature conversion coefficient according to the second temperature difference between the first connector and the second connector, and the first temperature difference between the first electrical component and the second electrical component.

[0119] In this example, there is a linear relationship between the second temperature difference and the first temperature difference, and the linear relationship can be expressed as: T2-T3=k(T4-T5), where k is a temperature conversion coefficient.

[0120] Step S4: constructing a first relational expression based on the temperature conversion coefficient and the third relational expression.

[0121] In this example, the first relational expression can be expressed as kf(T4-T5).

[0122] Step S5 , obtaining a first temperature value of the first sampling location and a second zero-drift current value output by the current sampling device corresponding to each second sampling moment under a second test condition in which the temperature difference between the second sampling location and the third sampling location remains unchanged.

[0123] Step S6 , constructing a second relationship expression according to the first temperature value of the first sampling position corresponding to each second sampling moment and the second zero-drift current value output by the current sampling device.

[0124] In this example, the second relational expression represents the corresponding relationship between the temperature value of the first sampling location and the zero-drift current value.

[0125] Step S7: constructing a zero drift compensation model according to the first relational expression and the second relational expression.

[0126] Step S8: Acquire temperature distribution data reflecting the temperature distribution of the current sensor in the power circuit.

[0127] In this example, the temperature distribution data includes temperature values ​​of the electrical circuit at a plurality of sampling locations, at least some of which are located at the current sensor.

[0128] In some examples, the current sensor includes a sampling resistor corresponding to a first sampling portion, the current sensor also includes a first connector and a second connector, the first connector is electrically connected to a current inflow end of the sampling resistor, the second connector is connected to a current outflow end of the sampling resistor, the multiple sampling portions include a second sampling portion corresponding to the first connector, and the multiple sampling portions also include a third sampling portion corresponding to the second connector.

[0129] In other examples, the second sampling location may correspond to a first electrical component, and the third sampling location may correspond to a second electrical component, wherein the first electrical component is an electrical component electrically connected to the first connector in the electrical circuit, and the second electrical component is an electrical component electrically connected to the second connector in the electrical circuit.

[0130] Step S9 : determining a zero-drift current compensation value corresponding to the temperature distribution data according to the temperature distribution data and a preset zero-drift compensation model.

[0131] In this example, the zero-drift compensation model represents the corresponding relationship between temperature distribution data and the zero-drift current compensation value.

[0132] Step S10 , determining the current value of the power circuit according to the zero-drift current compensation value and the measured current value output by the current sensor.

[0133] <Device Example>

[0134] In some embodiments, as shown in FIG4 , a current determination device 5000 is further provided. The current determination device 4000 includes a determination module 4100 .

[0135] The determination module 4100 is used to determine a zero-drift current compensation value corresponding to the temperature distribution data based on the temperature distribution data and a preset zero-drift compensation model; wherein the temperature distribution data is used to reflect the temperature distribution condition of the current sensor in the power circuit, and the temperature distribution data includes the temperature values ​​of the power circuit at multiple sampling locations, at least some of the sampling locations are located at the current sensor, and the zero-drift compensation model characterizes the correspondence between the temperature distribution data and the zero-drift current compensation value.

[0136] In some embodiments, the plurality of sampling sites include a first sampling site located in the middle of the current sensor, and, for a current inflow end and a current outflow end of the first sampling site, a second sampling site adjacent to the current inflow end and a third sampling site adjacent to the current outflow end.

[0137] In some embodiments, the current sensor includes a sampling resistor corresponding to the first sampling position, and the current sensor also includes a first connector and a second connector, the first connector is electrically connected to the current inflow end of the sampling resistor, and the second connector is connected to the current outflow end of the sampling resistor; the multiple sampling positions include a second sampling position corresponding to the first connector, or a second sampling position corresponding to a first electrical component; the multiple sampling positions also include a third sampling position corresponding to the second connector, or a third sampling position corresponding to a second electrical component; wherein the first electrical component is an electrical component electrically connected to the first connector in the electrical circuit, and the second electrical component is an electrical component electrically connected to the second connector in the electrical circuit.

[0138] In some embodiments, the zero drift compensation model includes a first factor and a second factor for determining the zero drift current compensation value, the first factor being the temperature value of the first sampling location, and the second factor being a first temperature difference between the second sampling location and the third sampling location.

[0139] In some embodiments, the current determination apparatus 4000 further includes a construction module 4200. Construction module 4200 is configured to acquire multiple sets of test data, wherein each set of test data corresponds to a sampling moment, and the test data includes temperature distribution data reflecting the temperature distribution of a current sensor in the power circuit, and a zero-drift current value of the power circuit output by a current sampling device; and construct the zero-drift compensation model based on the multiple sets of test data.

[0140] In some embodiments, the plurality of sampling locations include a first sampling location located in the middle of the current sensor, and, with respect to a current inflow end and a current outflow end of the first sampling location, a second sampling location adjacent to the current inflow end and a third sampling location adjacent to the current outflow end; the plurality of sets of test data include a plurality of sets of first test data and a plurality of sets of second test data;

[0141] The multiple sets of first test data include: under a first test condition in which the temperature value of the first sampling portion remains unchanged, a second temperature value of the second sampling portion, a third temperature value of the third sampling portion, and a first zero-drift current value output by the current sampling device corresponding to each first sampling moment;

[0142] The multiple sets of second test data include: under the second test condition of keeping the temperature difference between the second sampling position and the third sampling position unchanged, the first temperature value of the first sampling position corresponding to each second sampling moment and the second zero-drift current value output by the current sampling device.

[0143] In some embodiments, the construction module 4200 is used to construct a first relationship based on the multiple sets of first test data; wherein the first relationship represents the correspondence between the first temperature difference between the second sampling position and the third sampling position and the zero-drift current value; construct a second relationship based on the multiple sets of second test data; wherein the second relationship represents the correspondence between the temperature value of the first sampling position and the zero-drift current value; and construct the zero-drift compensation model based on the first relationship and the second relationship.

[0144] In some embodiments, the multiple sampling locations include a second sampling location corresponding to the first electrical component and a third sampling location corresponding to the second electrical component. The construction module 4200 is used to obtain, under the first test condition, a fourth temperature value of the first connector at each first sampling moment and a fifth temperature value of the second connector at each first sampling moment; construct a third relationship based on the fourth temperature value, the fifth temperature value and the first zero-drift current value at each first sampling moment; wherein the third relationship represents the correspondence between the second temperature difference between the first connector and the second connector and the zero-drift current value; construct a temperature conversion coefficient based on the second temperature difference and the first temperature difference; and construct the first relationship based on the temperature conversion coefficient and the third relationship.

[0145] In some embodiments, the current determination device 4000 also includes an acquisition module 4300, which is used to obtain temperature distribution data reflecting the temperature distribution condition of the current sensor in the power circuit; the determination module 4100 is used to determine the current value of the power circuit based on the zero-drift current compensation value and the measured current value output by the current sensor.

[0146] In other embodiments, as shown in Figure 5, the current determination device 5000 may include a processor 5100 and a memory 5200, wherein the memory 5200 is used to store executable instructions; the processor 5100 is used to control the operation of the electronic device 5000 according to the instructions to execute the current determination method according to the embodiment described in Figure 1 or Figure 3 above.

[0147] <Medium Example>

[0148] An embodiment of the present application provides a readable storage medium storing a computer program. When the computer program is executed by a processor, the computer program implements the current determination method as described in any of the above embodiments.

[0149] <System Example>

[0150] An embodiment of the present application provides a power consumption system 6000 , as shown in FIG6 . The system 6000 includes a power consumption circuit 6100 , a current determination device 6200 , and a plurality of temperature sensors 6300 .

[0151] The power-consuming circuit 6100 has a current sensor 60 , and the power-consuming circuit has a plurality of sampling locations, at least some of which are located at the current sensor 60 .

[0152] In one example, the current sensor is a shunt.

[0153] In another example, the power circuit 6100 further includes a first electrical component and a second electrical component, where the first electrical component and the second electrical component are respectively electrical components connected to the current sensor 60 in the power circuit.

[0154] The current determining device 6200 may be the current determining device shown in FIG. 4 or FIG. 5 .

[0155] Multiple temperature sensors 6300 are provided, with at least one temperature sensor corresponding to each sampling location. The dotted lines in FIG6 indicate the corresponding temperature sampling relationship. For example, temperature sensor 6300 is used to collect the temperature value of the first electrical component. Temperature sensor 6300 collects the temperature value of the corresponding sampling location and inputs the temperature value into current determination device 6200.

[0156] In some examples, temperature sensor 6300 is an NTC temperature sensor.

[0157] The present application may be a system, method and / or computer program product. The computer program product may include a computer-readable storage medium carrying computer-readable program instructions for causing a processor to implement various aspects of the present application.

[0158] A computer-readable storage medium can be a tangible device that can hold and store instructions for use by an instruction execution device. A computer-readable storage medium can be, for example, but not limited to, an electrical storage device, a magnetic storage device, an optical storage device, an electromagnetic storage device, a semiconductor storage device, or any suitable combination thereof. More specific examples (a non-exhaustive list) of computer-readable storage media include: a portable computer disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), a static random access memory (SRAM), a portable compact disc read-only memory (CD-ROM), a digital versatile disk (DVD), a memory stick, a floppy disk, a mechanical encoding device, such as a punch card or a raised structure in a groove on which instructions are stored, and any suitable combination thereof. As used herein, a computer-readable storage medium is not to be construed as a transient signal per se, such as a radio wave or other freely propagating electromagnetic wave, an electromagnetic wave propagating through a waveguide or other transmission medium (e.g., a light pulse through a fiber optic cable), or an electrical signal transmitted through an electrical wire.

[0159] The computer-readable program instructions described herein can be downloaded from a computer-readable storage medium to each computing / processing device, or downloaded to an external computer or external storage device via a network, such as the Internet, a local area network, a wide area network, and / or a wireless network. The network can include copper transmission cables, fiber optic transmission, wireless transmission, routers, firewalls, switches, gateway computers, and / or edge servers. The network adapter card or network interface in each computing / processing device receives the computer-readable program instructions from the network and forwards the computer-readable program instructions to be stored in the computer-readable storage medium in each computing / processing device.

[0160] The computer program instructions for performing the operation of the present application can be assembly instructions, instruction set architecture (ISA) instructions, machine instructions, machine-related instructions, microcode, firmware instructions, state setting data or source code or object code written in any combination of one or more programming languages, wherein the programming language includes object-oriented programming languages ​​such as Smalltalk, C++, and conventional procedural programming languages ​​such as "C" language or similar programming languages. Computer-readable program instructions can be executed completely on the user's computer, partially on the user's computer, executed as an independent software package, partially on the user's computer and partially on a remote computer, or executed completely on a remote computer or server. In the case of a remote computer, the remote computer can be connected to the user's computer by any type of network including a local area network (LAN) or a wide area network (WAN), or can be connected to an external computer (such as by using an Internet service provider to connect to the Internet). In certain embodiments, by utilizing the state information of computer-readable program instructions to personalize electronic circuits, such as programmable logic circuits, field programmable gate arrays (FPGAs) or programmable logic arrays (PLAs), the electronic circuits can execute computer-readable program instructions, thereby realizing various aspects of the present application.

[0161] Various aspects of the present application are described herein with reference to flowcharts and / or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of the present application. It should be understood that each block of the flowcharts and / or block diagrams, and combinations of blocks in the flowcharts and / or block diagrams, can be implemented by computer-readable program instructions.

[0162] These computer-readable program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, or other programmable data processing device, thereby producing a machine, so that when these instructions are executed by the processor of the computer or other programmable data processing device, a device is generated that implements the functions / actions specified in one or more blocks in the flowchart and / or block diagram. These computer-readable program instructions can also be stored in a computer-readable storage medium, where these instructions cause the computer, programmable data processing device, and / or other device to operate in a specific manner. Thus, the computer-readable medium storing the instructions comprises an article of manufacture that includes instructions for implementing various aspects of the functions / actions specified in one or more blocks in the flowchart and / or block diagram.

[0163] Computer-readable program instructions may also be loaded onto a computer, other programmable data processing apparatus, or other device so that a series of operational steps are performed on the computer, other programmable data processing apparatus, or other device to produce a computer-implemented process, thereby causing the instructions executed on the computer, other programmable data processing apparatus, or other device to implement the functions / actions specified in one or more blocks in the flowchart and / or block diagram.

[0164] The flowcharts and block diagrams in the accompanying drawings show the possible architecture, functions and operations of the systems, methods and computer program products according to multiple embodiments of the present application. In this regard, each box in the flowchart or block diagram can represent a part of a module, program segment or instruction, and the part of the module, program segment or instruction contains one or more executable instructions for realizing the specified logical function. In some alternative implementations, the functions marked in the box can also occur in an order different from that marked in the accompanying drawings. For example, two consecutive boxes can actually be executed substantially in parallel, and they can sometimes be executed in the opposite order, depending on the functions involved. It should also be noted that each box in the block diagram and / or flowchart, and the combination of the boxes in the block diagram and / or flowchart, can be implemented by a dedicated hardware-based system that performs the specified function or action, or can be implemented by a combination of dedicated hardware and computer instructions. It is well known to those skilled in the art that implementation by hardware, implementation by software, and implementation by a combination of software and hardware are all equivalent.

[0165] The embodiments of the present application have been described above. The above description is exemplary, not exhaustive, and is not limited to the disclosed embodiments. Many modifications and variations will be apparent to those skilled in the art without departing from the scope and spirit of the described embodiments. The terms used herein are selected to best explain the principles of the embodiments, practical applications, or technical improvements to technologies in the market, or to enable other persons skilled in the art to understand the embodiments disclosed herein. The scope of this application is defined by the appended claims.

Claims

1. A method for determining current, wherein: The method comprises: Based on the temperature distribution data and a preset zero-drift compensation model, a zero-drift current compensation value corresponding to the temperature distribution data is determined; wherein the temperature distribution data is used to reflect the temperature distribution condition of the current sensor in the power circuit, the temperature distribution data includes temperature values ​​of the power circuit at multiple sampling locations, at least some of the sampling locations are located at the current sensor, and the zero-drift compensation model characterizes the correspondence between the temperature distribution data and the zero-drift current compensation value.

2. The method according to claim 1, wherein The plurality of sampling locations include a first sampling location located in the middle of the current sensor, and a second sampling location adjacent to the current inflow end and the current outflow end of the first sampling location and a third sampling location adjacent to the current outflow end.

3. The method according to claim 2, wherein: The current sensor includes a sampling resistor corresponding to the first sampling position, and further includes a first connecting member and a second connecting member, wherein the first connecting member is electrically connected to a current inflow end of the sampling resistor, and the second connecting member is connected to a current outflow end of the sampling resistor; The multiple sampling locations include a second sampling location corresponding to the first connecting member, or a second sampling location corresponding to the first electrical component; the multiple sampling locations also include a third sampling location corresponding to the second connecting member, or a third sampling location corresponding to the second electrical component; wherein, the first electrical component is an electrical component electrically connected to the first connecting member in the electrical circuit, and the second electrical component is an electrical component electrically connected to the second connecting member in the electrical circuit.

4. The method according to claim 2 or 3, wherein: The zero drift compensation model includes a first factor and a second factor for determining a zero drift current compensation value. The first factor is a temperature value of the first sampling location, and the second factor is a first temperature difference between the second sampling location and the third sampling location.

5. The method according to any one of claims 1 to 4, wherein Before determining the zero-drift current compensation value corresponding to the temperature distribution data based on the temperature distribution data and a preset zero-drift compensation model, the method further includes: Acquire multiple sets of test data; wherein one set of test data corresponds to one sampling moment, and the test data includes temperature distribution data reflecting the temperature distribution condition of the current sensor in the power circuit, and the zero-drift current value of the power circuit output by the current sampling device; The zero drift compensation model is constructed according to the multiple groups of test data.

6. The method according to claim 5, wherein: The plurality of sampling locations include a first sampling location located in the middle of the current sensor, and a second sampling location adjacent to a current inflow end and a current outflow end of the first sampling location, and a third sampling location adjacent to the current outflow end; The multiple groups of test data include multiple groups of first test data and multiple groups of second test data; The multiple sets of first test data include: under a first test condition in which the temperature value of the first sampling portion remains unchanged, a second temperature value of the second sampling portion, a third temperature value of the third sampling portion, and a first zero-drift current value output by the current sampling device corresponding to each first sampling moment; The plurality of sets of second test data include: under the second test condition of keeping the temperature difference between the second sampling position and the third sampling position unchanged, the first temperature of the first sampling position corresponding to each second sampling moment The current sampling device outputs a second zero-drift current value.

7. The method according to claim 6, wherein: The constructing the zero drift compensation model according to the multiple groups of test data includes: Constructing a first relational expression based on the multiple sets of first test data; wherein the first relational expression represents the corresponding relationship between the first temperature difference between the second sampling position and the third sampling position and the zero-drift current value; Constructing a second relational expression based on the plurality of sets of second test data; wherein the second relational expression represents the corresponding relationship between the temperature value of the first sampling part and the zero-drift current value; The zero drift compensation model is constructed according to the first relationship and the second relationship.

8. The method according to claim 7, wherein: The plurality of sampling locations include a second sampling location corresponding to the first electrical component and a third sampling location corresponding to the second electrical component. Before determining the zero-drift current compensation value corresponding to the temperature distribution data based on the temperature distribution data and a preset zero-drift compensation model, the method further includes: Under the first test condition, further obtaining a fourth temperature value of the first connecting member at each first sampling moment and a fifth temperature value of the second connecting member at each first sampling moment; The constructing a first relational expression according to the plurality of sets of first test data includes: constructing a third relational expression based on the fourth temperature value, the fifth temperature value, and the first zero-drift current value at each first sampling moment; wherein the third relational expression represents a corresponding relationship between a second temperature difference between the first connector and the second connector and the zero-drift current value; constructing a temperature conversion coefficient according to the second temperature difference and the first temperature difference; The first relational expression is constructed according to the temperature conversion coefficient and the third relational expression.

9. The method according to claim 1, wherein Before determining the zero-drift current compensation value corresponding to the temperature distribution data based on the temperature distribution data and a preset zero-drift compensation model, the method further includes: Acquiring temperature distribution data reflecting the temperature distribution of current sensors in the power circuit; After determining the zero-drift current compensation value corresponding to the temperature distribution data based on the temperature distribution data and a preset zero-drift compensation model, the method further includes: The current value of the power circuit is determined according to the zero-drift current compensation value and the measured current value output by the current sensor.

10. A current determination device, wherein: include: A determination module (4100) is used to determine a zero-drift current compensation value corresponding to the temperature distribution data based on the temperature distribution data and a preset zero-drift compensation model; wherein the temperature distribution data is used to reflect the temperature distribution condition of the current sensor in the power circuit (6100), the temperature distribution data includes temperature values ​​of the power circuit (6100) at multiple sampling locations, at least some of the sampling locations are located at the current sensor, and the zero-drift compensation model characterizes the corresponding relationship between the temperature distribution data and the zero-drift current compensation value.

11. A current determination device, wherein: The invention comprises a memory (5200) and a processor (5100), wherein the memory (5200) stores executable instructions, and the instructions are used to control the processor (5100) to operate so as to execute the current determination method according to any one of claims 1 to 9.

12. A readable storage medium, wherein: A computer program is stored, which, when executed by a processor, implements the current determination method according to any one of claims 1 to 9.

13. An electricity system, wherein: include: An electric circuit (6100), the electric circuit (6100) having a current sensor (60), the electric circuit (6100) having a plurality of sampling locations, at least some of the plurality of sampling locations being located at the current sensor (60); A current determining device (6200), wherein the current determining device (6200) is the current determining device (6200) according to claim 10 or 11; A plurality of temperature sensors (6300), one sampling location corresponds to at least one temperature sensor (6300), the temperature sensor (6300) collects the temperature value of the corresponding sampling location and inputs the temperature value into the current determination device (6200).

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