Method for obtaining parameters of modulator, and photoelectric system, device and program product

Abstract

The present invention relates to a method for obtaining parameters of a modulator, and a photoelectric system, a device and a program product. The method comprises: applying an input electrical signal to a calibration section of a modulator, so as to control the phase of an optical path corresponding to the calibration section; performing photoelectric conversion on an optical signal, which is output by the modulator, so as to obtain a first electrical signal; performing comparison on the electrical signal, which comprises: comparing the first electrical signal with a reference value by using an electrical-signal comparison circuit, wherein an output from the electrical-signal comparison circuit comprises a first state or a second state depending on a comparison result; changing the reference value, and with regard to a plurality of different reference values, respectively executing the step of performing comparison on the electrical signal, so as to obtain a corresponding output from the electrical-signal comparison circuit; obtaining a reference value when the output from the electrical-signal comparison circuit has changed from the first state to the second state; using the reference value when the first state changes to the second state as a value corresponding to the first electrical signal; and on the basis of the value of the first electrical signal, obtaining an optical-signal intensity, which is output by the modulator.

Description

Method, optoelectronic system, device and program product for obtaining modulator parameters

[0001] This application claims priority and other benefits to Chinese invention patent application No. 202410371033.0, filed on March 28, 2024, entitled “Method, optoelectronic system, device and program product for obtaining modulator parameters,” the entire contents of which are hereby incorporated by reference. Technical Field

[0002] The present application relates to the field of optoelectronic signal processing, and more particularly, to a method for obtaining modulator parameters, and an optoelectronic system, device, and program product. Background Art

[0003] In an optoelectronic signal transmission system, a modulator may be included. The modulator may be used to modulate an optical signal according to an electrical signal, so that information is transmitted in the form of an optical signal. Summary of the Invention

[0004] In one aspect, embodiments of the present invention relate to a method of obtaining parameters of a modulator, wherein the modulator includes a calibration section, the method comprising:

[0005] applying an input electrical signal to the calibration segment to control the phase of the optical path corresponding to the calibration segment;

[0006] Performing photoelectric conversion on the optical signal output by the modulator to obtain a first electrical signal;

[0007] an electrical signal comparison step, comprising comparing the first electrical signal with a reference value using an electrical signal comparison circuit, wherein an output of the electrical signal comparison circuit comprises a first state or a second state according to a comparison result;

[0008] changing the reference value, and performing the electrical signal comparison step for a plurality of different reference values ​​respectively to obtain corresponding outputs of the electrical signal comparison circuit;

[0009] Obtaining, according to the multiple different reference values ​​and the corresponding outputs of the electrical signal comparison circuit, the reference value of the output of the electrical signal comparison circuit when the first state and the second state change;

[0010] correspond the reference value when the first state and the second state transition to each other as the value of the first electrical signal;

[0011] The intensity of the optical signal output by the modulator is obtained according to the value of the first electrical signal.

[0012] In some embodiments of the present invention, the method further comprises:

[0013] changing the input electrical signal applied to the calibration section, and obtaining, for different input electrical signals applied to the calibration section, the intensity of the optical signal output by the modulator under the corresponding input electrical signal;

[0014] The mapping relationship between different input electrical signals and corresponding optical signal intensities output by the modulator is recorded.

[0015] In some embodiments of the present invention, the method further comprises:

[0016] According to the mapping relationship, the input electrical signal of the calibration section when the light signal intensity is the target light intensity is read.

[0017] In some embodiments of the present invention, the target light intensity is a maximum light intensity.

[0018] In some embodiments of the present invention, the electrical signal comparison circuit includes a transimpedance amplifier and a limiter circuit. The transimpedance amplifier has a first input terminal, a second input terminal, and an output terminal, the output terminal being coupled to the input terminal of the limiter circuit. The reference value is input as a bias current to the first input terminal of the transimpedance amplifier, and the first electrical signal is input to the second input terminal of the transimpedance amplifier.

[0019] In some embodiments of the present invention, the modulator includes an MZI (Mach-Zehnder interferometer) modulator, which includes a first arm and a second arm, the first arm includes a first calibration segment, and the second arm includes a second calibration segment; wherein applying an input electrical signal to the calibration segment includes: applying an electrical signal to at least one of the first calibration segment and the second calibration segment.

[0020] In some embodiments of the present invention, multiple modulators are calibrated simultaneously by parallel processing, that is, the method for obtaining modulator parameters is performed on multiple modulators at the same time, wherein the multiple modulators are respectively located in multiple information transmission channels, and the modulator of each channel independently applies an input electrical signal, and the comparison and recording are performed by an independent electrical signal comparison circuit, and finally a mapping relationship between the modulator output optical signal intensity and the input electrical signal of each channel is generated.

[0021] In some embodiments of the present invention, when changing the reference value, a non-fixed step size scanning method is adopted to change the reference value.

[0022] In another aspect, embodiments of the present invention relate to an optoelectronic system comprising an optoelectronic signal transmission system, the optoelectronic signal transmission system including a modulator, a photodetector, and an electrical signal comparison circuit. The optoelectronic system further comprises a processor and a memory, the memory storing a computer program, and the processor executing the computer program to implement the steps of any of the above-described methods.

[0023] Furthermore, embodiments of the present invention relate to a computer device comprising a processor, a memory, and a computer program stored on the memory, wherein the processor executes the computer program to implement the steps of the method of any of the above-described embodiments. Accordingly, embodiments of the present invention also relate to a computer program product comprising a computer program, wherein when the computer program is executed by the processor, the computer program implements the steps of the method of any of the above-described embodiments. It should be understood that the computer program may be stored on a computer-readable storage medium. Therefore, embodiments of the present invention also relate to a computer-readable storage medium having a computer program stored thereon, wherein when the computer program is executed by the processor, the computer program implements the steps of the method of any of the above-described embodiments.

[0024] According to the method for obtaining modulator parameters, as well as the optoelectronic system, device, and program product involved in the embodiments of the present invention, the electrical signal corresponding to the optical signal output by the modulator (the electrical signal is obtained by photoelectric conversion) is compared with different preset reference values, and the reference value when the state of the comparison circuit output changes is used as the value of the electrical signal output by the modulator after photoelectric conversion. The intensity of the optical signal output by the modulator is indirectly obtained from this value, thereby enabling the modulator parameters to be accurately obtained.

[0025] Furthermore, by varying the input electrical signal in the modulator calibration section, the modulator's output optical signal intensity corresponding to different input electrical signals can be obtained using the aforementioned method. This allows for an accurate correspondence between the modulator's output optical signal intensity and the input electrical signal. For example, a graph of the modulator's output optical signal intensity versus the input electrical signal can be plotted, revealing other relevant information, including the input electrical signal corresponding to the maximum optical intensity. This facilitates subsequent optical path research (e.g., phase difference calibration).

[0026] Various aspects, features, advantages, etc. of the embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings. According to the following detailed description in conjunction with the accompanying drawings, the above aspects, features, advantages, etc. of the present invention will become more clear. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] FIG1 shows an example of a modulator according to an embodiment of the present invention.

[0028] FIG. 2 shows an example of a partial configuration of an optoelectronic signal transmission system according to an embodiment of the present invention.

[0029] FIG3 is a flow chart illustrating an example of a method for obtaining modulator parameters according to an embodiment of the present invention.

[0030] FIG. 4 is an exemplary graph illustrating the relationship between the equivalent light intensity output by the modulator and the equivalent current applied by the calibration section. DETAILED DESCRIPTION

[0031] Hereinafter, exemplary embodiments of the present invention will be described in detail with reference to the accompanying drawings. It should be understood that the present invention can be embodied in various forms and should not be construed as limited to the embodiments shown herein.

[0032] The terms used herein are for the purpose of describing specific embodiments and are not intended to limit the present invention. As used herein, the terms "a" and "an" are intended to include the plural form, unless the context clearly excludes this. It should be understood that the terms "comprising," "including," and "having" when used herein specify the presence of stated features, wholes, steps, operations, elements, and / or parts, but do not exclude the presence or addition of one or more other features, wholes, steps, operations, elements, parts, and / or collections thereof.

[0033] The terms "substantially," "about," and similar terms are used as terms of approximation rather than terms of degree, and are intended to take into account the inherent variations in measurements or calculations that those skilled in the art would recognize.

[0034] Unless otherwise specified, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art to which the present invention belongs. Furthermore, it should be understood that the terms (such as those defined in commonly used dictionaries) should be interpreted as having the same or similar meaning as they have in the context of the relevant art and / or this specification, and should not be rigidly and inflexibly interpreted in their literal meanings.

[0035] The optoelectronic part of the optoelectronic signal transmission system can include a transmitting part (BTX: broadcast transmitter) and a receiving part (BRX: broadcast transceiver) according to the transmitting and receiving functions.

[0036] The transmitter primarily includes a modulator. The inventors discovered that modulators are often imperfect due to manufacturing and other factors, or may deviate from their design. For example, a particular optical path (such as a waveguide) may deviate from the ideal. The inventors attempted to adjust for such deviations by providing a calibration segment in the modulator. Furthermore, when using the modulator to transmit information or data, the calibration segment can also be used to ensure that a particular optical path has a desired specific phase change, thereby ensuring that the modulator operates in a suitable state.

[0037] As shown in FIG1 , an example modulator is an MZI modulator. The modulator includes two arms, each of which has two segments: one is a data segment 11, which is used to apply an electrical signal carrying transmission information and modulate the optical signal to transmit information or data; the other is a calibration segment 12, which can be used to calibrate unwanted deviations in the optical path of the modulator, or to make the modulator have a phase change specific to a certain optical path.

[0038] The inventors recognized that in order for the calibration segment to perform its aforementioned functions, it is first necessary to obtain the characteristic parameters of the calibration segment, for example, how applying an electrical signal to the calibration segment affects the modulator output. The inventors also recognized that in some cases, in practical systems, the modulator typically does not exist in isolation but is integrated with other components and functional circuits. The optical signal output by the modulator typically undergoes subsequent processing such as photoelectric conversion. Under objective conditions, it is necessary to read the system's electrical signal output to indirectly analyze the characteristics of the calibration segment in the modulator.

[0039] Embodiments of the present invention relate to methods for obtaining modulator parameters. In exemplary embodiments, the present invention provides methods for obtaining modulator parameters in an optoelectronic signal transmission system. For example, calibration characteristic parameters of the modulator can be obtained. As shown in FIG2 , in exemplary embodiments, the optoelectronic signal transmission system includes a modulator 100, a photodetector 200, and an electrical signal comparison circuit 300. In some embodiments of the present invention, the modulator comprises an MZI modulator, which includes a first arm (upper arm) 110 and a second arm (lower arm) 120. Each arm is provided with a data segment 101 and a calibration segment 102. The first arm includes a first calibration segment, and the second arm includes a second calibration segment. The data segment is used to convert information-carrying electrical signals in the circuit into optical signals for data transmission. The calibration segment can be used to calibrate the phase of a particular optical path in the modulator. For example, if the modulator generates an unwanted inherent phase difference in that arm due to manufacturing processes, the calibration segment can be adjusted to reduce the phase difference to zero. The calibration segment can also be used to adjust a particular arm to a desired specific phase. The electrical signal comparison circuit 300 includes a transimpedance amplifier (TIA) 301 and a limiter circuit 302. The transimpedance amplifier 301 has a first input terminal 310, a second input terminal 320, and an output terminal 330. A preset reference value is input as a bias current to the first input terminal 310 of the transimpedance amplifier 301, and the first electrical signal output by the photodetector 200 is input to the second input terminal 320 of the transimpedance amplifier 301. The output terminal 330 of the transimpedance amplifier 301 is coupled to the input terminal of the limiter circuit 202. The output of the limiter circuit 202, as the output of the electrical signal comparison circuit 300, includes a first state (e.g., a binary signal "0") or a second state (e.g., a binary signal "1").

[0040] In some embodiments of the present invention, the optoelectronic signal transmission system includes a transmitter and a receiver. The transmitter is equipped with the modulator 100, and the receiver is equipped with the photodetector 200 and the electrical signal comparison circuit 300. The transmitter and receiver are connected via an optical path, such as an optical waveguide.

[0041] In an exemplary embodiment, further in conjunction with FIG3 , a method for obtaining parameters of the modulator 100 includes the following steps:

[0042] S01, applying an input electrical signal to the calibration segment 102 to control the phase of the optical path corresponding to the calibration segment 102;

[0043] S02, performing photoelectric conversion on the optical signal output by the modulator 100 to obtain a first electrical signal; illustratively, the photoelectric conversion includes performing photoelectric conversion using a photodetector 200;

[0044] S03, an electrical signal comparison step, comprising using the electrical signal comparison circuit 300 to compare the first electrical signal with a preset reference value. Specifically, the preset reference value is input as a bias current to a first input terminal of the transimpedance amplifier 301, the first electrical signal is input to a second input terminal of the transimpedance amplifier 301, and the output of the limiter circuit 202 includes a first state (e.g., a binary signal "0") or a second state (e.g., a binary signal "1");

[0045] S04, changing the reference value, and for a plurality of different reference values, respectively performing the electrical signal comparison step S03 to obtain corresponding outputs of the electrical signal comparison circuit 300;

[0046] S05, obtaining, based on the multiple different reference values ​​and the corresponding outputs of the electrical signal comparison circuit 300, the reference value of the output of the electrical signal comparison circuit 300 when the first state and the second state change;

[0047] S06, corresponding the reference value when the first state and the second state transition to each other as the value of the first electrical signal;

[0048] S07: Obtain the intensity of the optical signal output by the modulator according to the value of the first electrical signal.

[0049] In some embodiments of the present invention, for an optoelectronic signal transmission system having multiple transmitting units and multiple receiving units, the modulator parameters of the corresponding transmitting unit may be obtained from each receiving unit according to the above method.

[0050] Exemplarily, in step S01, an input electrical signal is applied to the calibration segment 102 to control the phase of the optical path corresponding to the calibration segment 102. Exemplarily, the input electrical signal can be a current signal or a voltage signal. For example, for a current signal, the input electrical signal can be a value in the current range of -7.5mA to 7.5mA. For convenience of representation, the corresponding equivalent current value is -255 to 255, where 0 to -255 represents applying current to the modulator lower arm 120; and 0 to 255 represents applying current to the upper arm 110. For example, -7.5mA (equivalent current -255) means that a current value of 7.5mA is input into the calibration segment of the lower arm.

[0051] In step S02, illustratively, the photoelectric conversion includes performing photoelectric conversion using a photodetector 200. In some exemplary embodiments, other suitable circuits or devices may also be used in the photoelectric conversion process.

[0052] In step S03, the transimpedance amplifier 301 receives two input signals, one of which is the photocurrent converted by the photodetector 200, and the other is the bias current input to the transimpedance amplifier, i.e., the reference value. The bias current is actually generated by a current source in the analog circuit.

[0053] In step S04, the bias current is adjusted (i.e., the reference value is changed), for example, to a value between 0 and 46 uA. The transimpedance amplifier 301 outputs a voltage signal, the voltage of which is controlled by the input current difference and the transimpedance gain. To obtain the calibration characteristic parameters of the modulator, in step S04, an electrical signal is applied to the calibration section to change the phase of the optical path in which the calibration section is located, thereby causing the modulator output to have a certain light intensity. This generates a first electrical signal after passing through the photodetector 200. The modulator's output light intensity can be indirectly obtained based on the value of this first electrical signal. This first electrical signal is input to the second input terminal 320 of the transimpedance amplifier, i.e., the second input terminal of the transimpedance amplifier remains unchanged. When the reference value input to the first input terminal 310 of the transimpedance amplifier is changed (i.e., the bias current is changed), the output of the transimpedance amplifier will also change accordingly due to the change in the input value of the first input terminal of the transimpedance amplifier. The voltage signal output by the transimpedance amplifier 301 is input to the limiter circuit 302. By setting the voltage bias point of the limiter circuit 302 at an appropriate position, when the voltage signal output by the transimpedance amplifier 301 to the limiter circuit 302 is higher than the bias point, the output signal of the limiter circuit 302 corresponds to binary "1" (first state); when it is lower than the bias point, the output signal corresponds to binary "0" (first state), that is, the electrical signal comparison circuit outputs the first state or the second state. For multiple different reference values, the corresponding electrical signal comparison circuit output can be recorded.

[0054] Thus, in step S05, the reference value of the output of the limiter circuit 302 when the "0" and "1" signals change can be obtained based on the multiple different reference values ​​of step S04 and the output of the corresponding electrical signal comparison circuit 300, that is, the reference value when the first state and the second state change. It can be understood as the reference value of the first input terminal 310 input before or after the change. This change in the output state of the electrical signal comparison circuit can be considered to occur when the inputs of the first input terminal 310 and the second input terminal 320 are almost equal. Therefore, the reference value of the first input terminal 310 at this time can be corresponded to the first electrical signal (value) inputted at the second input terminal 320. Thus, it is equivalent to indirectly obtaining the first electrical signal (i.e., the output of the photodetector 200) based on the output state of the electrical signal comparison circuit.

[0055] In steps S06 and S07, the reference value when the "0" and "1" signals are transformed corresponds to the value of the first electrical signal. Since the first electrical signal is a photoelectric conversion of the intensity of the optical signal output by the modulator 100, the intensity of the optical signal output by the modulator 100 can be obtained based on this value.

[0056] In some embodiments of the present invention, the method further includes: changing the input electrical signal applied to the calibration segment 102, and performing the operations or processing of steps S01-S07 for different input electrical signals applied to the calibration segment 102 to obtain the optical signal intensity output by the modulator under the corresponding input electrical signal; and recording the mapping relationship between different input electrical signals and the corresponding optical signal intensity output by the modulator. For example, the input electrical signal applied to the calibration segment 102 is changed within a current range of -7.5mA to 7.5mA (equivalent current of -255 to 255), and the corresponding optical signal intensity is obtained. Specifically, as shown in Figure 4, a graph of equivalent light intensity values ​​and equivalent current values ​​applied to the calibration segment is obtained.

[0057] In some embodiments of the present invention, the method further includes: reading, based on the mapping relationship, the input electrical signal of the calibration segment when the optical signal intensity is at the target light intensity. For example, the equivalent current value applied by the calibration segment at the operating point light intensity can be obtained based on the graph in FIG4 or a corresponding data relationship.

[0058] In some embodiments, the target light intensity is a maximum light intensity.

[0059] In some embodiments, applying an input electrical signal to the calibration segment includes applying an electrical signal to at least one of the first calibration segment and the second calibration segment.

[0060] In one embodiment of the present invention, the method of obtaining parameters of the modulator 100 of the present invention includes:

[0061] S1: Initialize the current transmitter settings. Initialize the calibration segment 102 of the modulator 100 to 0 and fix the transmitted signal of the data segment 101 to 0. This means that an input signal with a current of zero is applied to both the calibration and data segments. The voltage signal strength at the output of the transimpedance amplifier 301 is determined by the difference between the bias current (i.e., the reference value) and the current output by the photodetector 200.

[0062] S2: Initialize the settings of the receiving unit connected to the current transmitting unit. For example, initializing the receiving unit mainly includes initializing the bias current, the transimpedance gain of the transimpedance amplifier 301, setting the voltage bias point of the limiter circuit 302 to a suitable position, etc.

[0063] S3: The input electrical signal of the calibration section is initially set to 0, and the initial bias current equivalent value (reference value) of the transimpedance amplifier 301 is set to 255.

[0064] S4: Change the bias current downward (i.e., change the reference value). The bias current setting starts from an equivalent current of 255 and gradually decreases by 1 until the output signal of the limiter circuit 302 changes from a "0" to a "1" signal. Record the input electrical signal and bias current of the current calibration segment, and calculate the intensity of the output optical signal of the modulator 100 (i.e., the equivalent light intensity value) based on the bias current.

[0065] S5: Expand the input electrical signal of calibration segment 101 in both directions (i.e., modify the input electrical signal). For example, the equivalent current is gradually increased by 1 until it reaches an upper limit of 255 and gradually decreased by 1 until it reaches a lower limit of -255. Repeat step S4 for each value (i.e., each input electrical signal) input to calibration segment 101 until the optical signal intensity corresponding to each input electrical signal (equivalent current value) is obtained for all input electrical signals to be input. For example, a graph of the equivalent optical intensity values ​​and the equivalent current values ​​applied by the calibration segment is plotted as shown in FIG4 .

[0066] Therefore, the graph in Figure 4 can be used to determine the equivalent current applied by the calibration section when the equivalent light intensity equals the preset light signal intensity (e.g., the operating point light intensity). It should be noted that the values ​​of the abscissa and ordinate in Figure 4 have independent meanings; identical values ​​do not necessarily imply the same physical meaning. Furthermore, the graph of equivalent light intensity versus equivalent current applied by the calibration section shown in Figure 4 is equivalent to the modulator's response curve to the input electrical signal of the calibration section.

[0067] In step S4, the bias current is changed downward (the reference value is changed downward). When the output signal of the limiter circuit 302 changes from, for example, "0" to "1", the input of the reference value can be stopped and the reference value at this time is recorded. In step S5, due to the continuity of the entire image, when the input electrical signal of the calibration segment changes continuously, the change of the bias current is also continuous and slow. Therefore, each time the input electrical signal of the calibration segment is changed and the reference value is re-entered, the bias current of the transimpedance amplifier 301 does not need to be gradually reduced from 255 to 1. It is only necessary to add a predetermined value (for example, 10 equivalent values) to the reference value recorded last time, and gradually input the reference value downward until the output signal of the limiter circuit changes from "1" to "0". This can further reduce the reference value input range and improve the operating efficiency of the system.

[0068] In some embodiments of the present invention, the transimpedance gain of the transimpedance amplifier can be dynamically adjusted according to the output current range of the photodetector. For example, during initialization in step S2, the gain of the transimpedance amplifier is dynamically adjusted to ensure that the output voltage of the transimpedance amplifier is within the input range of the limiter circuit.

[0069] In some embodiments, an optoelectronic transmission system may have multiple information transmission channels, each including a transmitter and a receiver. Multiple modulators can be calibrated simultaneously through parallel processing (i.e., the steps, operations, or processes described in any of the aforementioned embodiments for obtaining modulator parameters are performed on multiple modulators simultaneously), thereby improving overall system efficiency. Specifically, an input electrical signal can be independently applied to the modulator of each channel, and compared and recorded using an independent electrical signal comparison circuit, ultimately generating a mapping between the modulator output optical signal intensity and the input electrical signal for each channel.

[0070] In some embodiments, when adjusting the bias current of the transimpedance amplifier (ie, changing the reference value), a non-fixed step size is used for scanning, and the amount of change each time does not need to remain consistent, making the adjustment of the reference value more dynamic.

[0071] In addition, embodiments of the present invention further relate to an optoelectronic system comprising the optoelectronic signal transmission system described in any of the aforementioned embodiments. In some embodiments of the present invention, the optoelectronic system further comprises a processor and a memory, wherein the memory stores a computer program, and the processor executes the computer program to implement the steps of the method described in any of the aforementioned embodiments.

[0072] In addition, embodiments of the present invention further relate to a computer device comprising a processor, a memory, and a computer program stored on the memory, wherein the processor executes the computer program to implement the steps of the method of any of the above-described embodiments. Accordingly, embodiments of the present invention further relate to a computer program product comprising a computer program, wherein when the computer program is executed by the processor, the computer program implements the steps of the method of any of the above-described embodiments. It should be understood that the computer program can be stored on a computer-readable storage medium. Therefore, embodiments of the present invention further relate to a computer-readable storage medium having a computer program stored thereon, wherein when the computer program is executed by the processor, the computer program implements the steps of the method of any of the above-described embodiments.

[0073] Those skilled in the art should understand that what is disclosed above is merely an embodiment of the present invention, and the scope of the rights for patent protection requested based on the present invention is not limited thereto. Equivalent changes made based on the embodiment of the present invention are still within the scope covered by the claims of the present invention.

Claims

1. A method for obtaining modulator parameters, wherein the modulator includes a calibration section, the method comprising: applying an input electrical signal to the calibration segment to control the phase of the optical path corresponding to the calibration segment; Performing photoelectric conversion on the optical signal output by the modulator to obtain a first electrical signal; an electrical signal comparison step, comprising comparing the first electrical signal with a reference value using an electrical signal comparison circuit, wherein an output of the electrical signal comparison circuit comprises a first state or a second state according to a comparison result; changing the reference value, and performing the electrical signal comparison step for a plurality of different reference values ​​respectively to obtain corresponding outputs of the electrical signal comparison circuit; Obtaining, according to the multiple different reference values ​​and the corresponding outputs of the electrical signal comparison circuit, the reference value of the output of the electrical signal comparison circuit when the first state and the second state change; correspond the reference value when the first state and the second state transition to each other as the value of the first electrical signal; The intensity of the optical signal output by the modulator is obtained according to the value of the first electrical signal.

2. The method according to claim 1, wherein Also includes: changing the input electrical signal applied to the calibration section, and obtaining, for different input electrical signals applied to the calibration section, the intensity of the optical signal output by the modulator under the corresponding input electrical signal; The mapping relationship between different input electrical signals and corresponding optical signal intensities output by the modulator is recorded.

3. The method according to claim 2, wherein Also includes: According to the mapping relationship, the input electrical signal of the calibration section when the light signal intensity is the target light intensity is read.

4. The method according to claim 3, wherein The target light intensity is a maximum light intensity value.

5. The method according to any one of claims 1 to 4, characterized in that The electrical signal comparison circuit includes a transimpedance amplifier and a limiter circuit; The transimpedance amplifier has a first input terminal, a second input terminal and an output terminal, and the output terminal is coupled to the input terminal of the limiter circuit; The reference value is input as a bias current into the first input terminal of the transimpedance amplifier, and the first electrical signal is input into the second input terminal of the transimpedance amplifier.

6. The method according to claim 1, wherein The modulator comprises an MZI modulator, the MZI modulator comprising a first arm and a second arm, the first arm comprising a first calibration segment, and the second arm comprising a second calibration segment; The applying of the input electrical signal to the calibration segment includes applying an electrical signal to at least one of the first calibration segment and the second calibration segment.

7. The method according to claim 1, wherein The method for obtaining modulator parameters is simultaneously performed on multiple modulators in a parallel processing manner, wherein the multiple modulators are respectively located in multiple information transmission channels, an input electrical signal is independently applied to the modulator of each channel, and the independent electrical signal comparison circuit compares and records the signals, ultimately generating a mapping relationship between the modulator output optical signal intensity and the input electrical signal of each channel.

8. The method according to claim 1, wherein When changing the reference value, a non-fixed step size scanning method is adopted to change the reference value.

9. An optoelectronic system comprising an optoelectronic signal transmission system, the optoelectronic signal transmission system comprising a modulator, a photodetector, and an electrical signal comparison circuit; The optoelectronic system further includes a processor and a memory, wherein: A computer program is stored in the memory, and the processor executes the computer program to implement the steps of the method according to any one of claims 1 to 8.

10. A computer device comprising a processor, a memory, and a computer program stored in the memory, characterized in that: The processor executes the computer program to implement the steps of the method according to any one of claims 1 to 8.

11. A computer program product comprising a computer program, characterized in that When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 8 are implemented.

12. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 8 are implemented.

Images