Diagnostic device and operating method thereof

Abstract

A diagnostic device according to one embodiment of the present document comprises: a comparator for generating an output value on the basis of the results of comparing values input into an inverting terminal and a non-inverting terminal; a first resistor having a first end connected to a relay and a second end connected to the inverting terminal of the comparator; a second resistor having a first end connected to the relay and a second end connected to the non-inverting terminal of the comparator, and having a resistance value such that, when the relay is short-circuited, the value of the voltage applied to the non-inverting terminal becomes greater than that of the voltage applied to the inverting terminal; and one or more processors for controlling a relay operation through a control signal that controls the relay operation, and diagnosing the state of the relay on the basis of the output value generated by the comparator according to the relay operation.

Description

Diagnostic device and its operating method

[0001] Cross-citation with related applications

[0002] This invention claims the benefit of priority from Korean Patent Application No. 10-2024-0070060, filed on May 29, 2024, and all contents of the document in that Korean Patent Application are incorporated herein by reference.

[0003] Technology field

[0004] The embodiments disclosed in this document relate to a diagnostic device and a method of operating the same.

[0005] Recently, research and development on secondary batteries has been actively underway. Here, secondary batteries are defined as rechargeable and dischargeable batteries, encompassing both conventional Ni / Cd and Ni / MH batteries, as well as more recent lithium-ion batteries. Recently, their use has expanded to include power sources for electric vehicles, attracting attention as a next-generation energy storage medium.

[0006] Electric vehicles receive electricity from an external source, charge the battery pack, and then discharge it to drive the motor, generating power. The electrical connections between components within the battery pack (e.g., battery cells and the BMS) can be controlled via relays. If the relay malfunctions during battery pack use, the battery pack may malfunction.

[0007] Relay testing can be performed for various purposes, including relay condition diagnosis and analysis. For example, relay failure can be diagnosed based on the voltage across the relay terminals. However, this method involves a sensor that senses the voltage across the relay terminals and a processor that stores and processes the values ​​obtained from the sensor, making diagnosis difficult. Therefore, a technology that can diagnose relay condition more simply and accurately is needed.

[0008] One purpose of the embodiments disclosed in this document is to provide a diagnostic device capable of diagnosing the operating status of a relay and an operating method thereof.

[0009] One purpose of the embodiments disclosed in this document is to provide a diagnostic device and an operating method thereof that can diagnose the status of a relay through a comparator and whether the relay is faulty through a logic gate.

[0010] The technical problems of the embodiments disclosed in this document are not limited to the technical problems mentioned above, and other technical problems not mentioned will be clearly understood by those skilled in the art from the descriptions below.

[0011] A diagnostic device according to one embodiment of the present document may include a comparator circuit unit including a comparator that generates an output value based on a result of comparing values ​​input to an inverting terminal and a non-inverting terminal; a first resistor having a first end connected to a relay and a second end connected to the inverting terminal of the comparator; and a second resistor having a first end connected to the relay and a second end connected to the non-inverting terminal of the comparator, the second resistor having a resistance value such that when the relay is short-circuited, a voltage applied to the non-inverting terminal becomes a value greater than a voltage applied to the inverting terminal; and one or more processors that control the operation of the relay through a control signal that controls the operation of the relay and diagnose a state of the relay based on an output value of the comparator circuit unit according to the operation of the relay.

[0012] According to an embodiment, the first end of the first resistor and the relay may be connected to a first node, and when the relay is short-circuited, the first end of the second resistor may be configured to be connected to the first node, and power may be applied to the first node.

[0013] According to an embodiment, the comparator can output a logic low value when a value input to the inverting terminal is greater than a value input to the non-inverting terminal, and can output a logic high value when a value input to the inverting terminal is less than a value input to the non-inverting terminal.

[0014] According to an embodiment, the one or more processors may determine that the relay is in a short-circuited state when the output value of the comparator is the logic high value, and may determine that the relay is in an open state when the output value of the comparator is the logic low value.

[0015] According to an embodiment, the circuit further includes a logic gate circuit that performs a logic operation on the output value of the comparator and the control signal, and the logic gate circuit may include a first NOR gate that receives the output value of the comparator and the control signal and outputs a first value; an AND gate that receives the output value of the comparator and the control signal and outputs a second value; and a second NOR gate that receives the first value and the second value and outputs an output value of the logic gate circuit.

[0016] According to an embodiment, the one or more processors can diagnose whether the relay is faulty based on an output value of the logic gate circuit unit.

[0017] According to an embodiment, the one or more processors can diagnose the relay as being in a normal state if the output value of the logic gate circuit unit is logic low, and can diagnose the relay as being in a fault state if the output value of the logic gate circuit unit is logic high.

[0018] A method of operating a diagnostic device according to one embodiment of the present document includes the steps of applying a control signal for controlling the operation of a relay to the relay; and the step of diagnosing a state of the relay based on an output value of a comparator circuit according to the operation of the relay in response to the control signal, wherein the comparator circuit may include: a comparator generating an output value based on a result of comparing values ​​input to an inverting terminal and a non-inverting terminal; a first resistor having a first end connected to the relay and a second end connected to the inverting terminal of the comparator; and a second resistor having a first end connected to the relay and a second end connected to the non-inverting terminal of the comparator, the second resistor having a resistance value such that when the relay is short-circuited, a voltage applied to the non-inverting terminal becomes a value greater than a voltage applied to the inverting terminal.

[0019] According to an embodiment, the first end of the first resistor and the relay may be connected to a first node, and when the relay is short-circuited, the first end of the second resistor may be configured to be connected to the first node, and power may be applied to the first node.

[0020] According to an embodiment, the comparator can output a logic low value when a value input to the inverting terminal is greater than a value input to the non-inverting terminal, and can output a logic high value when a value input to the inverting terminal is less than a value input to the non-inverting terminal.

[0021] According to an embodiment, the step of diagnosing the state of the relay may include the step of determining that the relay is in a short-circuit state when the output value of the comparator is the logic high value; and the step of determining that the relay is in an open state when the output value of the comparator is the logic low value.

[0022] According to an embodiment, the circuit further includes a logic gate circuit that performs a logic operation on the output value of the comparator circuit and the control signal, and the logic gate circuit may include: a first NOR gate that receives the output value of the comparator and the control signal and outputs a first value; an AND gate that receives the output value of the comparator and the control signal and outputs a second value; and a second NOR gate that receives the first value and the second value and outputs the output value of the logic gate circuit.

[0023] According to an embodiment, the step of diagnosing the status of the relay may include a step of diagnosing whether the relay is faulty based on an output value of the logic gate circuit unit.

[0024] According to an embodiment, the step of diagnosing whether the relay is faulty may include the step of diagnosing the relay as being in a normal state if the output value of the logic gate circuit unit is logic low; and the step of diagnosing the relay as being in a fault state if the output value of the logic gate circuit unit is logic high.

[0025] The diagnostic device and its operating method disclosed in this document can diagnose the operating status of a relay.

[0026] The diagnostic device and its operating method disclosed in this document can diagnose the status of a relay through a comparator and whether the relay is faulty through a logic gate.

[0027] In addition, various effects may be provided, either directly or indirectly, through this document.

[0028] FIG. 1 is a block diagram showing a battery pack according to one embodiment disclosed in this document.

[0029] FIG. 2 is a block diagram showing a diagnostic device according to one embodiment disclosed in this document.

[0030] FIG. 3 is a block diagram showing a diagnostic circuit according to one embodiment disclosed in this document.

[0031] Fig. 4 is a circuit diagram of a diagnostic circuit unit when a relay according to an embodiment disclosed in this document is in an open state.

[0032] Fig. 5 is a circuit diagram of a diagnostic circuit when a relay according to an embodiment disclosed in this document is in a short-circuit state.

[0033] Figure 6 is a truth table showing the operation method of the diagnostic device according to the embodiment disclosed in this document.

[0034] FIG. 7 is a flowchart showing the operation of a diagnostic device according to one embodiment disclosed in this document.

[0035] FIG. 8 is a block diagram showing the hardware configuration of a computing system for performing an operating method of a diagnostic device according to one embodiment disclosed in this document.

[0036] Hereinafter, various embodiments of the present invention will be described with reference to the accompanying drawings. However, this is not intended to limit the present invention to specific embodiments, and it should be understood that the present invention encompasses various modifications, equivalents, and / or alternatives of the embodiments.

[0037] It should be understood that the various embodiments and terms used in this document are not intended to limit the technical features described in this document to specific embodiments, but rather to include various modifications, equivalents, or substitutes of the embodiments.

[0038] In connection with the description, similar reference numerals may be used for similar or related components. The singular form of the noun corresponding to an item may include one or more of said items, unless the relevant context clearly indicates otherwise.

[0039] In this document, the phrases "A or B", "at least one of A and B", "at least one of A or B", "A, B, or C", "at least one of A, B, and C", and "at least one of A, B, or C" can each include any one of the items listed together in that phrase, or all possible combinations thereof. Terms such as "first", "second", "first", "second", "A", "B", "(a)", or "(b)" may be used merely to distinguish the corresponding element from other corresponding elements, and do not limit the corresponding elements in any other respect (e.g., importance or order) unless specifically stated otherwise.

[0040] In this document, whenever a component (e.g., a first component) is referred to as being “connected,” “coupled,” or “connected,” with or without the terms “functionally” or “communicatively,” or “coupled” or “connected,” it means that the component can be connected to the other component directly (e.g., wired), wirelessly, or via a third component.

[0041] According to one embodiment, the method according to various embodiments disclosed in this document may be provided as a computer program product. The computer program product may be traded as a commodity between a seller and a buyer. The computer program product may be distributed in the form of a machine-readable storage medium (e.g., compact disc read-only memory (CD-ROM)), or may be distributed online (e.g., downloaded or uploaded) through an application store or directly between two user devices. In the case of online distribution, at least a portion of the computer program product may be temporarily stored or temporarily generated in a machine-readable storage medium, such as the memory of a manufacturer's server, an application store's server, or an intermediary server.

[0042] According to various embodiments, each component (e.g., a module or a program) of the above-described components may include one or more entities, and some of the entities may be separated and placed in other components. According to various embodiments, one or more components or operations of the aforementioned components may be omitted, or one or more other components or operations may be added. Alternatively or additionally, a plurality of components (e.g., a module or a program) may be integrated into a single component. In such a case, the integrated component may perform one or more functions of each of the plurality of components identically or similarly to those performed by the corresponding component among the plurality of components prior to the integration. According to various embodiments, the operations performed by a module, program, or other component may be executed sequentially, in parallel, iteratively, or heuristically, or one or more of the operations may be executed in a different order, omitted, or one or more other operations may be added.

[0043] FIG. 1 is a block diagram showing a battery pack according to one embodiment disclosed in this document.

[0044] Referring to FIG. 1, a battery pack (1) may include a battery unit (12), a sensor unit (14), a switching unit (16), and a battery management system (BMS) (20). At this time, the battery pack (1) may be equipped with a plurality of battery units (12), sensor units (14), switching units (16), and battery management systems (20).

[0045] According to an embodiment, the battery unit (12) can supply power to a target device (not shown). To this end, the battery unit (12) can be electrically connected to the target device. Here, the target device can include an electrical, electronic, or mechanical device that operates by receiving power from the battery pack (1). For example, the target device can be, but is not limited to, an electric vehicle (EV).

[0046] According to an embodiment, the battery unit (12) may include at least one rechargeable battery cell (10). Here, the battery cell (10) may be a basic unit of a battery cell that can charge and discharge electric energy. For example, the battery cell (10) may be a lithium-ion (Li-ion) battery, a lithium-ion polymer (Li-ion polymer) battery, a nickel-cadmium (Ni-Cd) battery, a nickel-metal hydride (Ni-MH) battery, etc., but is not limited thereto. A detailed structure of the battery cell (10) may be described with reference to FIG. 3.

[0047] According to an embodiment, a plurality of battery units (12) may be connected in series or parallel. For example, the battery unit (12) may be a battery module, a battery bank, or a collection of battery cells (cell-to-pack structure).

[0048] According to an embodiment, the sensor unit (14) can obtain information related to the battery unit (12). According to an embodiment, the sensor unit (14) can obtain values ​​(or information) related to the status of each battery unit (12). In one embodiment, the values ​​related to the status may include one or more values ​​for voltage, current, resistance, state of charge (SOC), state of health (SOH), or temperature of the battery cell, or a combination thereof.

[0049] According to an embodiment, the sensor unit (14) can provide information on each of a plurality of battery units (12) to the battery management system (20).

[0050] According to an embodiment, the switching unit (16) may include a device for controlling the current flow for charging or discharging the battery unit (12). For example, the switching unit (16) may include at least one relay and / or magnetic contactor, etc., depending on the specifications of the battery pack (1).

[0051] According to an embodiment, a battery management system (BMS (Battery Management System) (20) can control or manage the battery pack (1) to prevent overcharge, overdischarge, etc. by monitoring the voltage, current, temperature, etc. of the battery pack (1). For example, the battery management system (20) may include a plurality of terminals as an interface for receiving values ​​measured from the various parameters described above, and a circuit connected to these terminals to process the input values. In addition, the battery management system (20) may control the sensor unit (14) and / or the switching unit (16). For example, the battery management system (20) may be connected to a plurality of battery units (12) to monitor the status of each of the plurality of battery units (12) and control ON / OFF of a relay or a contactor, etc.

[0052] According to an embodiment, the operation of the battery management system (20) may be performed by a BMS (Battery Management System) in the vehicle, as well as by various devices such as a server, cloud, charger, or charger / discharger.

[0053] The upper controller (2) can transmit control signals for multiple battery units (12) to the battery management system (20). Accordingly, the battery management system (20) can be controlled for operation based on signals received from the upper controller (2).

[0054] According to an embodiment, the battery management system (20) may include the diagnostic device (100) of FIG. 2. According to another embodiment, the battery management system (20) may be a different system from the diagnostic device (100) of FIG. 2. That is, the diagnostic device (100) of FIG. 2 may be included in the battery pack (1) or may be configured as another device external to the battery pack (1). Hereinafter, for convenience of explanation, it is assumed that the diagnostic device (100) is configured as another device external to the battery pack (1). In addition, the operation of the diagnostic device (100) below may be performed by a BMS (Battery Management System) in a vehicle, as well as by various devices such as a server, a cloud, a charger, or a charger / discharger.

[0055] Fig. 2 is a block diagram showing a diagnostic device according to one embodiment disclosed in the present document. Fig. 3 is a block diagram showing a diagnostic circuit according to one embodiment disclosed in the present document. Fig. 4 is a circuit diagram of a diagnostic circuit according to an embodiment disclosed in the present document when a relay is in an open state, and Fig. 5 is a circuit diagram of a diagnostic circuit according to an embodiment disclosed in the present document when a relay is in a short state. Fig. 6 is a truth table showing an operating method of a diagnostic device according to an embodiment disclosed in the present document. The operation of the diagnostic device illustrated in Fig. 2 may be described in detail with reference to Figs. 3 and 6 below.

[0056] First, referring to FIG. 2, a diagnostic device (100) according to one embodiment disclosed in this document may include a diagnostic circuit (110) and one or more processors (120). However, the present invention is not limited thereto, and other components may be further included in the diagnostic device (100), two or more components may be integrated into one, or one component may be divided into two or more components.

[0057] According to an embodiment, the diagnostic device (100) can diagnose the status of the relay (L). For example, a defect may occur in the relay (L) due to various causes, such as a defect during the production stage, a failure during the use stage, or an external impact. The diagnostic device (100) according to the embodiment can diagnose an abnormality in the relay (L) using a diagnostic circuit unit (110) configured to be electrically connected to both ends of the relay (L).

[0058] According to an embodiment, the diagnostic circuit (110) may output a signal related to the state of the relay (L) based on the voltage of the relay (L). For example, the diagnostic circuit (110) may output a signal related to the operating state of the relay (L) and / or a signal related to whether there is a fault. Here, the operating state may include an open state in which the relay (L) is open and a short state in which the relay (L) is short-circuited. In addition, whether there is a fault may mean whether the relay (L) operates in response to a control signal (S1) that controls the operation of the relay (L). For example, if the control signal (S1) and the operation of the relay (L) correspond, the relay (L) may be in a normal state, and if the control signal (S1) and the operation of the relay (L) do not correspond, the relay (L) may be in a fault state.

[0059] Referring to FIG. 3, the diagnostic circuit unit (110) may include a comparator circuit unit (111) and a logic gate circuit unit (112). According to an embodiment, the comparator circuit unit (111) may input a voltage across the relay and output a signal (S2) related to the operating state of the relay (L). In addition, according to an embodiment, the logic gate circuit unit (112) may input a control signal (S1) and an output value (S2) of the comparator circuit unit (111) and output a signal (S3) related to whether the relay (L) is faulty. The configuration of the comparator circuit unit (111) and the logic gate circuit unit (112) according to one embodiment may be described with reference to FIGS. 4 and 5.

[0060] Referring to FIG. 4, the relay (L) can operate in response to a control signal (S1). In an embodiment, the control signal (S1) can be a logic low or a logic high. Here, the logic value of the control signal (S1) can be determined by one or more processors (120, see FIG. 2). In an embodiment, one or more processors (120) can output the control signal (S1) to the first switch (SW1).

[0061] For example, when the control signal (S1) is logic low, the first switch (SW1) to which the control signal (S1) is applied may be in an open state, and no magnetic force may be induced in the relay (L). Here, the first switch (SW1) may be configured as a field effect transistor (FET). Therefore, when the control signal (S1) is logic low, the relay (L) may be in an open state.

[0062] In contrast, when the control signal (S1) is logic high, the first switch (SW1) to which the control signal (S1) is applied becomes short-circuited, and an induced electromotive force for driving the relay (L) can be applied to the relay. Therefore, the relay (L) can become short-circuited by the induced electromotive force. Here, the induced electromotive force is a voltage source (V SW1 ) can mean the electromotive force induced by the voltage source (V SW1 ) may be a 12V or 24V voltage source, but is not limited thereto.

[0063] According to an embodiment, the comparator circuit unit (111) may include a comparator (A) configured to be connected to a relay (L). For example, the comparator (A) may generate an output value (S2) based on a result of comparing a value (V-) input to an inverting terminal (-) and a value (V+) input to a non-inverting terminal (+). According to an embodiment, the comparator (A) may compare a value (V-) input to the inverting terminal and a value (V+) input to the non-inverting terminal, and output a logic low value when the value (V-) input to the inverting terminal is greater than the value (V+) input to the non-inverting terminal. In addition, the comparator (A) may output a logic high value when the value (V-) input to the inverting terminal is less than the value (V+) input to the non-inverting terminal.

[0064] According to an embodiment, the inverting terminal (-) of the comparator (A) can be connected to one end of the relay (L), and the non-inverting terminal (+) can be connected to the other end of the relay (L). Therefore, since each of the two input terminals of the comparator (A) is connected to one end and the other end of the relay (L), the comparator circuit unit (111) can compare the voltages across the relay (L) through the comparator (A). Through this, the comparator circuit unit (111) can compare the voltages across the relay (L) through the comparator (A) without a sensor that senses the voltage of the relay (L) and a separate processor (or MCU) that compares the voltage values. In addition, such a comparator circuit unit (111) can increase the integration degree of the circuit and can reduce the cost because it does not require a separate processor.

[0065] According to an embodiment, the comparator circuit (111) may be configured so that the magnitudes of the voltages applied to the input terminals (inverting terminals and non-inverting terminals) of the comparator (A) are different in the short-circuited and open states of the relay (L), respectively. For example, when the relay (L) is in the short-circuited state, the comparator circuit (111) may be configured so that the voltage (V+) applied to the non-inverting terminal (+) of the comparator (A) is greater than the voltage (V-) applied to the inverting terminal (-). On the other hand, when the relay (L) is in the open state, the comparator circuit (111) may be configured so that the voltage (V+) applied to the non-inverting terminal (+) is less than the voltage (V-) applied to the inverting terminal (-).

[0066] According to an embodiment, the comparator circuit unit (111) may include one or more resistors (R1 to R5) configured so that the magnitude of the voltage applied to the input terminal of the comparator (A) is different in each operating state of the relay (L). Through this, the diagnostic device (100) can compare the voltage across the relay (L) through the comparator (A) without a sensor that senses the voltage of the relay (L) and a separate processor (or MCU) that compares the voltage value. In addition, the diagnostic device (100) can increase the integration degree of the comparator circuit unit (111) and reduce the cost.

[0067] According to an embodiment, the comparator circuit (111) may include a first resistor (R1) connected to the inverting terminal (-) of the comparator (A) and a second resistor (R2) connected to the non-inverting terminal (+). For example, a first end of the first resistor (R1) may be connected to a relay (L), and a second end may be connected to the inverting terminal (-) of the comparator (A). In addition, a first end of the second resistor (R2) may be connected to the relay (L), and a second end may be connected to the non-inverting terminal (+) of the comparator (A).

[0068] According to an embodiment, the second resistor (R2) may have a resistance value such that when the relay (L) is short-circuited, the voltage (V+) applied to the non-inverting terminal becomes greater than the voltage (V-) applied to the inverting terminal. Accordingly, other resistors (e.g., R3 to R5) other than the first resistor (R1) and the second resistor (R2) may be appropriately changed depending on the resistance value of the first resistor (R1) and the resistance value of the second resistor (R2).

[0069] According to an embodiment, the relay (L) may be connected to a power source (Vg). Here, the power source (Vg) may refer to a power source configured to apply current through the relay (L) when the relay (L) switches from an open state to a short-circuit state, or a signal source configured to apply a signal. In the embodiment of FIG. 4, the power source (Vg) is exemplified as a voltage source, but is not limited thereto. For example, the power source may be a battery cell (10) or a battery unit (12), or may be any electronic element such as a sensor or a controller.

[0070] According to an embodiment, the first terminal of the relay (L) and the first resistor (R1) may be connected to the first node (N1). In addition, the first node (N1) may be configured to be supplied with a power source (Vg). For example, referring to FIG. 4, regardless of the operating state (open state and short-circuit state) of the relay (L), the current or signal of the power source (Vg) may be supplied to the first node (N1). Accordingly, regardless of the operating state of the relay (L), the current or signal of the power source (Vg) may be supplied to the inverting terminal (-) of the comparator (A) connected to the first node (N1). In another aspect, when the relay (L) is in the open state, the current or signal of the power source (Vg) may not be supplied to the non-inverting terminal (+). Therefore, when the relay (L) is in the open state, the voltage (V+) applied to the non-inverting terminal of the comparator (A) may be less than the voltage (V-) applied to the inverting terminal. Then, the comparator (A) may output a logic low as the output value (S2).

[0071] In contrast, referring to FIG. 5, when the relay (L) is short-circuited, the first end of the second resistor (R2) can be configured to be connected to the first node (N1). Therefore, when the relay (L) is short-circuited, the current or signal of the power source (Vg) can be applied to both the non-inverting terminal (+) and the inverting terminal (-). In addition, the voltage (V+) applied to the non-inverting terminal of the comparator (A) by the first to fifth resistors (R1) to (R5) can be greater than the voltage (V-) applied to the inverting terminal. Therefore, when the relay (L) is short-circuited, the comparator (A) can output a logic high as the output value (S2).

[0072] According to an embodiment, the logic gate circuit unit (112) may include a logic gate. Here, the logic gate may mean a logic circuit such as an AND gate, an OR gate, a NOT gate, a NAND gate, a NOR gate, an XNOR gate, or an XOR gate. For example, the logic gate circuit unit (112) may include one or more logic gates.

[0073] According to an embodiment, the logic gate circuit unit (112) can logically determine whether the relay (L) is faulty based on the output value (S2) of the comparator circuit unit (111). For example, the logic gate circuit unit (112) can perform a logical operation on whether the output value (S2) of the comparator (A) corresponds to the control signal (S1). Here, the control signal (S1) that is an input of the logic gate circuit unit (112) can be the same as the control signal (S1) applied to the first switch (SW1) to control the operation of the relay (L).

[0074] According to an embodiment, the control signal (S1) may be a logic low or a logic high. Here, the logic value of the control signal (S1) may be determined by one or more processors (120, see FIG. 2). According to an embodiment, one or more processors (120) may output the control signal (S1) to an input terminal of the logic gate circuit (112).

[0075] According to an embodiment, the logic gate circuit unit (112) can determine whether the control signal (S1) and the output value (S2) of the comparator (A) correspond. According to an embodiment, the logic gate can perform a logic operation on the control signal (S1) and the output value (S2) of the comparator (A), and output a logic low as the output value (S3) of the logic gate when the output value (S2) of the comparator (A) and the control signal (S1) correspond. Here, the case where the output value (S2) of the comparator (A) and the control signal (S1) correspond may include a case where both the output value (S2) and the control signal (S1) are logic low or a case where both the output value (S2) and the control signal (S1) are logic high.

[0076] According to an embodiment, the logic gate can output a logic high as an output value (S3) of the logic gate when the output value (S2) of the comparator (A) and the control signal (S1) do not correspond. Here, the case where the output value (S2) of the comparator (A) and the control signal (S1) do not correspond may include a case where the output value (S2) is logic low and the control signal (S1) is logic high or a case where the output value (S2) is logic high and the control signal (S1) is logic low.

[0077] Through this, the logic gate circuit unit (112) can increase the integration of the circuit through logic gates that do not require a separate memory device. In addition, the logic gate circuit unit (112) can reduce costs because it does not require a separate processor for logic operations.

[0078] According to an embodiment, the logic gate circuit (112) may include, but is not limited to, two NOR gates and an AND gate. For example, the logic gate circuit (112) may include any combination of logic gates configured to calculate whether the logic value of the control signal (S1) corresponds to the logic value of the output value (S2) of the comparator (A).

[0079] According to an embodiment, the logic gate may include a first NOR gate (B), a second NOR gate (D), and an AND gate (C). Here, the first NOR gate (B) may receive an output value (S2) of a comparator (A) and a control signal (S1) and output a first value. In addition, the AND gate (C) may receive an output value (S2) of the comparator (A) and a control signal (S1) and output a second value. In addition, the second NOR gate (D) may receive the first value and the second value and output an output value (S3) of the logic gate circuit unit (112). Therefore, the outputs of the first NOR gate (B), the second NOR gate (D), and the AND gate (C) according to the output value (S2) of the comparator (A) and the control signal (S1) may be understood with reference to the truth table illustrated in FIG. 6.

[0080] Referring again to FIG. 2, the diagnostic device (100) may include one or more processors (120) electrically connected to the diagnostic circuitry (110). According to an embodiment, the one or more processors (120) may perform operations of the diagnostic device (100).

[0081] Referring to FIGS. 4 and 6 together, one or more processors (120) can control the operation of the relay (L) via a control signal (S1) that controls the operation of the relay (L). For example, one or more processors (120) can output a logic high (e.g., 1) signal that closes the relay (L) or a logic low (e.g., 0) signal that opens the relay (L) as the control signal (S1).

[0082] According to an embodiment, one or more processors (120) can diagnose and / or display the state of the relay (L) based on the output of the diagnostic circuit (110). For example, one or more processors (120) can diagnose and display the operating state of the relay (L) based on the output value (S2) of the comparator (A) according to the operation of the relay (L). Here, the operating state of the relay (L) may include an open state and a short state. For example, one or more processors (120) can determine that the relay (L) is in a short state when the output value (S2) of the comparator (A) is a logic high (1) value. Additionally, one or more processors (120) can determine that the relay (L) is in an open state when the output value (S2) of the comparator (A) is a logic low (0) value.

[0083] According to an embodiment, one or more processors (120) can diagnose and display whether the relay (L) is faulty based on the output value (S3) of the logic gate. Here, whether the relay (L) is faulty may include a fault state and a normal state of the relay (L). For example, one or more processors (120) can diagnose the relay (L) as being in a normal state if the output value (S3) of the logic gate is a logic low (0). In addition, one or more processors (120) can diagnose the relay (L) as being in a fault state if the output value (S3) of the logic gate is a logic high (1).

[0084] According to an embodiment, one or more processors (120) may display the status of the determined relay (L) to the user or, if necessary, generate a warning signal to notify that the relay (L) requires replacement or maintenance. For example, one or more processors (120) may transmit a signal regarding the operating status and / or failure of the relay (L) to a separate controller. In addition, one or more processors (120) may display the operating status and / or failure of the relay (L) through a diode (E), an LED, or a display.

[0085] FIG. 7 is a flowchart showing the operation of a diagnostic device according to one embodiment disclosed in this document.

[0086] Referring to FIG. 7, the diagnostic device (100) can apply a control signal that controls the operation of the relay to the relay (S101), and diagnose the state of the relay based on the output value of the comparator according to the operation of the relay in response to the control signal (S102).

[0087] At step S101, one or more processors (120) of the diagnostic device (100) can apply a control signal (S1) that controls the operation of the relay (L) to the relay (L) (S101).

[0088] At step S102, one or more processors (120) of the diagnostic device (100) can diagnose the state of the relay (L) based on the output value (S2) of the comparator (A) according to the operation of the relay (L) in response to the control signal (S1) (S102). Here, the state of the relay (L) may mean the operating state of the relay (L) including the open state and the short state of the relay. In addition, one or more processors (120) can diagnose whether the relay is faulty based on the output value (S3) of the logic gate.

[0089] FIG. 8 is a block diagram showing the hardware configuration of a computing system for performing an operating method of a diagnostic device according to one embodiment disclosed in this document.

[0090] Referring to FIG. 8, a computing system (200) according to one embodiment disclosed in this document may include an MCU (210), a memory (220), an input / output I / F (230), and a communication I / F (240).

[0091] The MCU (210) may be a processor that executes various programs (e.g., data collection programs, data analysis programs, and diagnostic programs, etc.) stored in the memory (220), processes various information including diagnostic data through these programs, and performs the functions of the diagnostic device (100) shown in the aforementioned FIGS. 1 to 7.

[0092] The memory (220) can store various programs such as a data collection program, a data analysis program, and a diagnostic program.

[0093] Such memories (220) may be provided in multiple numbers as needed. The memories (220) may be volatile memories or non-volatile memories. As volatile memories (220), RAM, DRAM, SRAM, etc. may be used. As non-volatile memories (220), ROM, PROM, EAROM, EPROM, EEPROM, flash memories, etc. may be used. The examples of the memories (220) listed above are merely examples and are not limited to these examples.

[0094] The input / output I / F (230) can provide an interface that enables data transmission and reception between an input device (not shown) such as a keyboard, mouse, or touch panel, and an output device (not shown) such as a display and the MCU (210).

[0095] The communication I / F (240) is a component capable of transmitting and receiving various data with the server, and may be any device capable of supporting wired or wireless communication. For example, the diagnostic device (100) can transmit and receive various information, including data for diagnosis, from a separately provided external server via the communication I / F (240).

[0096] In this way, a computer program according to one embodiment disclosed in this document may be implemented as a module that performs each function illustrated in FIG. 2, for example, by being recorded in a memory (220) and processed by an MCU (210).

[0097] Although all components constituting the embodiments disclosed in this document have been described as being combined or operating in combination as one, the embodiments disclosed in this document are not necessarily limited to such embodiments. That is, within the scope of the purpose of the embodiments disclosed in this document, all of the components may be selectively combined and operated one or more times.

[0098] In addition, terms such as "include," "comprise," or "have" described above, unless specifically stated otherwise, mean that the corresponding component can be included, and therefore should be interpreted to include other components rather than excluding other components. All terms, including technical or scientific terms, have the same meaning as commonly understood by a person of ordinary skill in the art to which the embodiments disclosed in this document belong, unless otherwise defined. Commonly used terms, such as terms defined in a dictionary, should be interpreted to be consistent with the contextual meaning of the relevant technology, and shall not be interpreted in an idealized or overly formal sense, unless explicitly defined in this document.

[0099] The foregoing disclosure outlines features of several embodiments to enable those skilled in the art to better understand the aspects of the present disclosure. Those skilled in the art will readily appreciate that the present disclosure can be readily used as a basis for designing or modifying other structures to achieve the same purposes or advantages of the embodiments introduced herein. Furthermore, those skilled in the art will recognize that such equivalent structures do not depart from the scope of the present disclosure, and that various changes, substitutions, and modifications can be made herein without departing from the scope of the present disclosure.

Claims

1. A comparator that generates an output value based on the result of comparing the values ​​input to the inverting terminal and the non-inverting terminal; A first resistor having a first end connected to a relay and a second end connected to the inverting terminal of the comparator; and A comparator circuit comprising a first end connected to the relay, a second end connected to the non-inverting terminal of the comparator, and a second resistor having a resistance value such that when the relay is short-circuited, a voltage applied to the non-inverting terminal becomes a value greater than a voltage applied to the inverting terminal; and A diagnostic device comprising one or more processors that control the operation of the relay through a control signal that controls the operation of the relay, and diagnose the state of the relay based on an output value of the comparator circuit according to the operation of the relay.

2. In claim 1, A diagnostic device wherein the first end of the first resistor and the relay are connected to a first node, and the first end of the second resistor is configured to be connected to the first node when the relay is short-circuited, and power is applied to the first node.

3. In claim 1, The above comparator is, If the value input to the above inverting terminal is greater than the value input to the above non-inverting terminal, a logic low value is output, A diagnostic device that outputs a logic high value when the value input to the above-mentioned inverting terminal is less than the value input to the above-mentioned non-inverting terminal.

4. In claim 3, One or more of the above processors, If the output value of the above comparator is the above logic high value, the relay is judged to be in a short-circuit state, A diagnostic device that determines that the relay is in an open state when the output value of the comparator is the logic low value.

5. In claim 1, It further includes a logic gate circuit section that performs a logic operation on the output value of the comparator and the control signal, and the logic gate circuit section, A first NOR gate that receives the output value of the comparator and the control signal and outputs a first value; An AND gate that receives the output value of the comparator and the control signal and outputs a second value; and A second NOR gate that receives the first value and the second value and outputs the output value of the logic gate circuit. A diagnostic device comprising:

6. In claim 5, One or more of the above processors, A diagnostic device that diagnoses whether the relay is faulty based on the output value of the logic gate circuit.

7. In claim 6, One or more of the above processors, If the output value of the above logic gate circuit is logic low, the relay is diagnosed as normal, A diagnostic device that diagnoses the relay as being in a fault state when the output value of the above logic gate circuit is logic high.

8. A step of applying a control signal that controls the operation of the relay to the relay; and A step of diagnosing the state of the relay based on the output value of the comparator circuit according to the operation of the relay in response to the control signal, The above comparator circuit part, A comparator that generates an output value based on the result of comparing the values ​​input to the inverting terminal and the non-inverting terminal; A first resistor having a first end connected to a relay and a second end connected to the inverting terminal of the comparator; and A method of operating a diagnostic device comprising a first end connected to the relay, a second end connected to the non-inverting terminal of the comparator, and a second resistor having a resistance value such that when the relay is short-circuited, a voltage applied to the non-inverting terminal becomes a value greater than a voltage applied to the inverting terminal.

9. In claim 8, A method of operating a diagnostic device, wherein the first end of the first resistor and the relay are connected to a first node, and when the relay is short-circuited, the first end of the second resistor is configured to be connected to the first node, and power is applied to the first node.

10. In claim 8, The above comparator is, If the value input to the above inverting terminal is greater than the value input to the above non-inverting terminal, a logic low value is output, An operating method of a diagnostic device that outputs a logic high value when a value input to the inverting terminal is smaller than a value input to the non-inverting terminal.

11. In claim 10, The step of diagnosing the status of the above relay is: A step of determining that the relay is in a short-circuit state when the output value of the comparator is the logic high value; and A method of operating a diagnostic device, comprising a step of determining that the relay is in an open state when the output value of the comparator is the logic low value.

12. In claim 8, It further includes a logic gate circuit section that performs a logical operation on the output value of the above comparator circuit section and the above control signal, and the logic gate circuit section, A first NOR gate that receives the output value of the comparator and the control signal and outputs a first value; An AND gate that receives the output value of the comparator and the control signal and outputs a second value; and A second NOR gate that receives the first value and the second value and outputs the output value of the logic gate circuit. A method of operating a diagnostic device comprising:

13. In claim 12, The step of diagnosing the status of the above relay is: A method of operating a diagnostic device, comprising a step of diagnosing whether the relay is faulty based on an output value of the logic gate circuit unit.

14. In claim 13, The steps for diagnosing whether the above relay is faulty are: A step of diagnosing the relay as being in a normal state when the output value of the logic gate circuit is logic low; and A method of operating a diagnostic device, comprising a step of diagnosing the relay as being in a fault state when the output value of the logic gate circuit section is logic high.

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