Assemblies comprising multiple ion guides, and extraction tools therefor

Abstract

Disclosed are methods, systems, apparatus, devices, and other implementations, that include a mass spectrometry (MS) system including a casing defining a cavity, a removable ion guide sub-assembly configured to be disposed within the cavity and including at least two mechanically coupled ion guides each defining a separate chamber at different pressures when engaged with the casing, with the removable ion guide sub-assembly including one or more insertion alignment elements to rotationally and / or angularly align the ion guide assembly for insertion into the cavity, and one or more receiving alignment elements disposed in the cavity and configured to receive a corresponding one of the one or more insertion alignment elements. The ion guide sub-assembly is configured to be axially removable from the casing with the at least two ion guides remaining mechanically coupled to each other and retaining the casing upon removal of the ion-guide sub-assembly from the casing.

Description

ASSEMBLIES COMPRISING MULTIPLE ION GUIDES, AND EXTRACTION TOOLS THEREFORRelated Applications

[0001] This application claims priority to U.S. Provisional Application No. 63 / 655,463 filed on June 3, 2024 and U.S. Provisional Application No. 63 / 656,421 filed on June 5, 2024, the contents of both of which are incorporated herein by reference in their entireties.Technical Field

[0002] The present disclosure relates generally to systems and methods for servicing and maintaining mass spectrometry systems, and more particularly to a removable (extractable) modular front end ion guide sub-assembly comprising one or more ion guides (e.g., an ion guide sub-assembly) and configured for blind insertion into a mass spectrometry system, and an extraction tool therefor.Background

[0003] The present disclosure relates generally to systems and methods that facilitate improved service and maintenance of mass spectrometry systems.

[0004] In conventional mass spectrometers, some internal ion guide components (sections), often at the front end of the mass spectrometer (i.e., upstream portion of the ion path), can become contaminated as part of regular instrument use. The operators / users of contaminated mass spectrometers have to call specialized servicing companies (or call the servicing departments of the manufacturers) for cleaning, inspection and possible replacement of contaminated parts. This requires a scheduled approach that is based on service / parts availability. It is generally impractical for most users / operators to resort to self-help solutions due to the complex wiring and attachments that are used for assembling the mass spectrometer’s components to achieve stable and reliable operation of the mass spectrometer. Furthermore, it is also generally impractical for the users to preemptively inspect the instrument to identify developing problems, which may result in the mass spectrometer operating for an extended period of time at sub-par performance level prior to an operational failure of the instrument.

[0005] During the period that the instrument awaits servicing, the instrument may be inoperable. Moreover, since the users often cannot themselves inspect the internal components of the mass spectrometer, and so a preliminary diagnosis of the problem cannot be determined ahead of the visit by the servicing technician, even when the servicing technician arrives the instrument may remain inoperable if the technician does not have the correct equipment or replacement parts.

[0006] Thus, there is a need for a new instrument assembly approach that allows an improved ability of the users to troubleshoot and possibly resolve common mass spectrometer performance problems.Summary

[0007] In one aspect, a mass spectrometry (MS) system is disclosed that includes a casing defining a cavity, a removable ion guide sub-assembly configured to be disposed within the cavity and including at least two mechanically coupled ion guides each defining a separate chamber at different pressures when engaged with the casing, with the removable ion guide subassembly including one or more insertion alignment elements to rotationally and / or angularly align the ion guide assembly for insertion into the cavity, and one or more receiving alignment elements disposed in the cavity and configured to receive a corresponding one of the one or more insertion alignment elements. The ion guide sub-assembly is configured to be axially removable from the casing with the at least two ion guides remaining mechanically coupled to each other and retaining the casing upon removal of the ion-guide sub-assembly from the casing.

[0008] In various embodiments, upon removal of cavity port components located, approximately at an opening of the cavity, and the ion guide sub-assembly, structural integrity of all remaining MS system components and structures located inside the cavity can remain intact and undisturbed.

[0009] In various embodiments, the cavity port components can include a curtain plate and an orifice plate located upstream of the ion guide sub-assembly when the ion guide sub-assembly is inside the cavity.

[0010] In various embodiments, the at least two ion guides can include a first ion guide, positioned upstream of a second ion guide, with the first ion guide maintained at a first pressure that is less than 10 Torr and comprises a first plurality of electrodes, and with the second ion guide maintained at a second pressure of less than 4 Torr and comprises a second plurality of electrodes.

[0011] In various embodiments, the first plurality of electrodes of the first ion guide can include a first multipole arrangement of electrodes, and the second plurality of electrodes of the second ion guide can include a second multipole arrangement of electrodes.

[0012] In various embodiments, the first ion guide can include a first frame supporting the first plurality of electrodes, and the second ion guide can include a second frame supporting the second plurality of electrodes.

[0013] In various embodiments, the first frame can include a first collar including at least one alignment element and the second frame can include a second collar including at least one alignment opening for removably engaging with the at least one axial alignment element of the first frame so as to rotationally and / or angularly align the first and the second ion guides.

[0014] In various embodiments, the at least one alignment element can include an insertion key unit configured to engage and displace an axial displaceable bar, disposed on a circumferential wall of the cavity defining the opening of the cavity, or to be received in a channel defined on a circumferential wall of the cavity to facilitate blind insertion of the ion guide sub-assembly into the cavity.

[0015] In various embodiments, the MS system can further include an electrically insulating plate to support and locate an ion lens relative to the first and second ion guides.

[0016] In various embodiments, the electrically insulating plate can include at least one opening through which an alignment element of the first frame can pass to be received by an opening on the second collar of the second frame.

[0017] In various embodiments, the ion lens assembly can be fixedly attached to the insulating plate such that when assembled the orifice of the ion lens is aligned with the ion guides.

[0018] In various embodiments, the first frame of the first ion guide and the second frame of the second ion guide can be coupled to each other at an interfacing ion lens assembly comprising at least one electrode forming an electrode lens.

[0019] In various embodiments, the second frame of the second ion guide can enclose the second plurality of electrodes, and the second frame can be releasably fastened to the first frame with a fastening mechanism such that upon release of the fastening mechanism the second ion guide is removed from the sub-assembly to allow access to the electrode lens assembly

[0020] In various embodiments, the first frame and the second frame can sandwich the interfacing ion lens assembly to provide mechanical connectivity between the first frame and the second frame and electrical connectivity between the interfacing ion lens assembly and the first frame.

[0021] In various embodiments, the first frame and the second frame can mechanically connect to sandwich the interfacing ion lens between the first frame and the second frame, while maintaining electrical separation between the first plurality of electrodes and the second plurality of electrodes.

[0022] In various embodiments, the interfacing ion lens assembly can further include an insulating plate to fixedly support the interfacing ion lens.

[0023] In various embodiments, the insulating plate can be implemented as a printed circuit board (PCB) with an opening to receive the multiple electrodes of the ion lens, the insulating plate can further include conductive traces circuitry disposed on one or more sides of the PCB, with the conductive traces configured to deliver electrical current to electrodes of at least one ion guide arranged in the ion guide sub-assembly

[0024] In various embodiments, the MS system can further include at least one gasket axially positioned near the ion lens, and configured to form two vacuum chambers with different pressure levels on either side of the ion lens. The at least one gasket can be further used to facilitate alignment of the ion guide sub-assembly and components of the MS system housed within the casing.

[0025] In various embodiments, the MS system can further include conductive pins inserted through holes in the insulating plate located around a perimeter of an opening in the PCB toreceive a downstream end of the first ion guide, each of the pins configured to electrically connect to a respective one of the first plurality of electrodes of the first ion guide.

[0026] In various embodiments, one or more of the first frame enclosing the first plurality of electrodes and the second frame enclosing the second plurality of electrodes can further include at least one alignment PCB pin fittable through at least one complementary alignment hole defined on the PCB to implement radial alignment between one of the first ion guide or the second ion guide and the PCB, at least one ion guide alignment pin fittable through a complementary alignment hole defined on one of the first frame and the second frame to implement radial alignment between the first ion guide and the second ion guide, and at least one locator pin extending from one or more of the first frame or the second frame, the at least one locator pin configured to be received in a recess defined in a component disposed in the cavity to facilitate alignment of the ion guide sub-assembly within the cavity.

[0027] In various embodiments, the first frame enclosing the first plurality of electrodes can further include at least one locator pin fittable into a receiving slot provided in the cavity of the casing, the at least one locator pin configured to facilitate blind insertion of the sub-assembly into a locked position within the receiving slot to implement radial alignment between the subassembly and the casing.

[0028] In various embodiments, the sub-assembly can be axially removable from the cavity using an extraction tool that is fitted over an upstream portion of the first ion guide.

[0029] In various embodiments, the extraction tool can include an elongated hollow shaft with an interior space to receive an upstream frame portion of the first ion guide, the extraction tool being configured to grasp the upstream frame portion of the first ion guide while avoiding contact with the first plurality of electrodes.

[0030] In various embodiments, the MS system can further include a wire-free electrical interface between the second ion guide and the cavity, the wire-free electrical interface being electrically connectable via rigid electrical connectors to the second plurality of electrodes.

[0031] In various embodiments, the rigid electrical connectors can include conductive pins. The electrical interface can include a printed circuit board (PCB) in electrical communication with at least a radio frequency voltage source, and the conductive pins inserted through holes inthe PCB located around a perimeter of an opening in the PCB to receive the downstream end of the second ion guide, the pins configured to electrically connect to respective ones of the second plurality of electrodes of the second ion guide.

[0032] In another aspect, a method for servicing a mass spectrometry (MS) system is disclosed. The method includes accessing a removable ion guide sub-assembly disposed within a cavity defined by a casing of the MS system, the ion guide sub-assembly including at least two mechanically coupled ion guides each defining a separate chamber at different pressures when engaged with the casing, wherein the removable ion guide sub-assembly includes one or more insertion alignment elements to rotationally and / or angularly align the ion guide assembly for insertion into the cavity, and wherein the cavity includes one or more receiving alignment elements disposed in the cavity and configured to receive a corresponding one of the one or more insertion alignment elements. The method further includes grasping a frame of an upstream ion guide of the ion guide sub-assembly, with the frame enclosing a first plurality of electrodes of the upstream ion guide of the ion guide sub-assembly, and axially extracting the ion guide subassembly from the casing with the at least two ion guides of the ion guide sub-assembly remaining mechanically coupled to each other, and retaining the casing upon removal of the subassembly from the casing.

[0033] In various embodiments, grasping the frame of the upstream ion guide can include attaching an extraction tool to the frame of the upstream ion guide of the ion guide sub-assembly. Axially extracting the ion guide sub-assembly can include axially actuating the extraction tool to axially remove the ion guide sub-assembly from the casing.

[0034] In various embodiments, axially extracting the ion guide sub-assembly from the casing can include axially extracting the ion guide sub-assembly from the casing such that upon removal of the ion guide sub-assembly, structural integrity of all remaining MS system components and structures located in the casing remain intact and undisturbed.

[0035] In various embodiments, accessing the removable ion guide sub-assembly disposed within a cavity can include removing cavity port components located approximately at an opening of the cavity.

[0036] In various embodiments, the cavity port components can include a curtain plate and an orifice plate located upstream of the ion guide sub-assembly when engaging the casing.

[0037] In various embodiments, the method can further include servicing one or more of, for example, the removed ion guide sub-assembly and / or or components and structures of the MS system accessible through the cavity after removal of the ion guide sub-assembly.

[0038] In various embodiments, servicing the removed ion guide sub-assembly can include separating at least one ion guide of the ion guide sub-assembly to expose an ion lens assembly attached to another ion guide of the ion guide sub-assembly, the ions lens assembly comprising an insulating plate and ion lens electrodes held by the insulating plate, and cleaning the ion lens electrodes held by an insulating plate.

[0039] In various embodiments, the method can further include aligning alignment elements provided on the ion guide sub-assembly with corresponding receiving alignment structures within the cavity, and blindly inserting the removed ion guide sub-assembly back into the cavity upon aligning the alignment elements with the corresponding receiving alignment structures.

[0040] In another aspect, a modular ion guide sub-assembly insertable into a mass spectrometry (MS) system is provided. The modular ion guide sub-assembly includes a first ion guide comprising a first frame and a first plurality of electrodes supported by said first frame, a second ion guide comprising a second frame and a second plurality of electrodes supported by the second frame, and an alignment mechanism coupled to the first and the second frame, with the alignment mechanism including one or more insertion alignment elements to rotationally and / or angularly align the ion guide assembly for insertion into the cavity, the one or more insertion elements configured to be received by one or more receiving alignment elements disposed in a cavity defined in a casing of the MS system. The first and the second ion guides can be removably coupled to one another to define a single unit when mechanically coupled to each other, and the alignment mechanism facilitates blind insertion, and subsequent removal, of the mechanically coupled first ion guide and the second ion guide into and out of a cavity defined in a casing of the MS system.

[0041] In various embodiments, the first ion guide can be positioned upstream of the second ion guide. When the modular ion guide sub-assembly is inserted into the cavity the first ion guide can be maintained at a first pressure that is less than 10 Torr, and the second ion guide can be maintained at a second pressure of less than 4 Torr.

[0042] In various embodiments, the first plurality of electrodes of the first ion guide can include a first multipole arrangement of electrodes, and the second plurality of electrodes of the second ion guide can include a second multipole arrangement of electrodes.

[0043] In various embodiments, the first frame can include a first collar including at least one alignment element and the second frame can include a second collar including at least one alignment opening for removably engaging with the at least one alignment element of the first frame so as to align the first and the second ion guides.

[0044] In various embodiments, the first ion guide can include an insertion key unit configured to be received in a channel defined on a circumferential wall of the cavity to facilitate blind insertion of the modular ion guide sub-assembly into the cavity.

[0045] In various embodiments, the sub-assembly can further include an electrically insulating plate to support and locate an ion lens relative to the first and second ion guides.

[0046] In various embodiments, the electrically insulating plate can include at least one opening through which an alignment element of the first frame can pass to be received by an opening on the second collar of the second frame.

[0047] In various embodiments, the insulating plate can be implemented as a printed circuit board (PCB) with an opening to receive the multiple electrodes of the ion lens. The insulating plate can further include conductive traces circuitry disposed on one or more sides of the PCB, the conductive traces configured to deliver electrical current to electrodes of at least one ion guide of the modular ion guide sub-assembly.

[0048] In various embodiments, the alignment mechanism can include at least one of, for example, an axial alignment mechanism and / or a radial alignment mechanism.

[0049] In yet another aspect, an extraction tool to remove one or more ion guides positioned within a casing containing a mass spectrometry (MS) system is disclosed. The tool includes a grasping instrument configured to grasp at least a portion of a removable ion guide sub-assembly disposed within a cavity defined in a casing containing components of the MS system, with the removable ion guide sub-assembly including at least two mechanically coupled ion guides each defining a separate chamber at different pressures when engaged with the casing. The tool further includes a handle attached to the grasping instrument to allow axial removal of the ionguide sub-assembly from the casing with the at least two ion guides remaining mechanically coupled to each other, and retaining the casing upon removal of the ion-guide sub-assembly from the casing.

[0050] In various embodiments, the grasping instrument can include a socket with an open end, the socket configured to be fitted, at the open end of the socket, on a frame of an upstream ion guide of the ion guide sub-assembly that encloses electrodes of the upstream ion guide.

[0051] In various embodiments, the socket can include a base section with a continuous wall extending along the circumference of the socket, with the base section defining continuous circular top opening, and a top section comprising multiple separated arched wall sections extending from the circular top opening of the base section of the socket to the open end of the socket.

[0052] In various embodiments, each of the arched wall sections of the socket can include a top arched padded rim member attached to the respective arched wall section at an end portion of the arched wall section that defines, with the end portions of the other arched wall sections, the opening of the socket.

[0053] In various embodiments, interior walls of the socket can define an interior space, and when the socket is fitted over the frame, a plurality of electrodes of the upstream ion guide enclosed by the frame are received within the interior space of the socket.

[0054] In various embodiments, the plurality of electrodes are received within the interior space of the socket without touching the interior walls of the socket.

[0055] In various embodiments, the extraction tool can further include an auxiliary leverage tool to apply leverage force to the extraction tool.

[0056] In various embodiments, the handle of the extraction tool can include a hollow shaft structured to stow the auxiliary leverage tool.

[0057] In various embodiments, the auxiliary leverage tool can include a handle section with an actuating tip, and a stationary member pivotally attached to the handle section at one end of the handle section.

[0058] In various embodiments, the stationary member can include a base section pivotally attached to the handle section at one end area of the base section, one or more cylindricalelements extending from another end area of the base section, and an insertion tip extending from the one or more cylindrical elements. The insertion tip is configured to be received in one or more receiving holes disposed near the cavity defined in the casing of the MS system to maintain the stationary member stationary during pivotal rotation of the handle section.

[0059] In various embodiments, the actuating tip can be configured to engage a circular disc surrounding a particular axial location on the handle of the extraction tool, and to apply a force on the circular disc in an axial direction based on the rotational direction of the actuating tip.

[0060] In an additional aspect, a method for servicing a mass spectrometry (MS) system is disclosed. The method includes accessing a removable ion guide sub-assembly disposed within a cavity defined by a casing of the MS system, the ion guide sub-assembly including at least two mechanically coupled ion guides each defining a separate chamber at different pressures when engaged with the casing. The method additionally includes attaching an extraction tool to a frame of an upstream ion guide of the ion guide sub-assembly, the frame enclosing a first plurality of electrodes of the upstream ion guide of the ion guide sub-assembly, and axially actuating the extraction tool to axially remove the ion guide sub-assembly from the casing with the at least two ion guides remaining mechanically coupled to each other, and retaining the casing upon removal of the sub-assembly from the casing.

[0061] In various embodiments, axially actuating the extraction tool to axially remove the ion guide sub-assembly, and retaining the casing, may include axially actuating the extraction tool to axially remove the ion guide sub-assembly such that upon removal of the ion guide subassembly, structural integrity of all remaining MS system components and structures remain intact and undisturbed.

[0062] In various embodiments, accessing the removable ion guide sub-assembly can include removing cavity port components located approximately at an opening of the cavity.

[0063] In various embodiments, the cavity port components can include a curtain plate and an orifice plate located upstream of the ion guide sub-assembly when engaging the casing.

[0064] In various embodiments, the extraction tool can include socket with an open end, and a handle attached to a base of the socket, and attaching the extraction tool to the upstream frame of the ion guide sub-assembly can include fitting the socket, through the open end of the socket,on a frame of the upstream ion guide of the ion guide sub-assembly that encloses electrodes of the upstream ion guide.

[0065] In various embodiments, interior walls of the socket can define an interior space, and fitting the socket on the frame of the upstream ion guide can include receiving a plurality of electrodes of the upstream ion guide, with the plurality of electrodes enclosed by the frame, within the interior space of the socket without the plurality of electrodes touching the interior walls of the socket

[0066] In various embodiments, axially actuating the extraction tool to axially remove the ion guide sub-assembly from the casing can include applying, by an auxiliary leverage tool, axial leverage force to the extraction tool.

[0067] In various embodiments, applying the axial leverage force can include pivotally rotating a handle section of the auxiliary leverage tool to cause an actuating tip at one end of the handle section to engage a circular disc located at a particular axial location on a handle section of the extraction tool.

[0068] In various embodiments, the method may further include servicing one or more of, for example, the removed ion guide sub-assembly and / or or components and structures of the MS system accessible through the cavity after removal of the ion guide sub-assembly.

[0069] In various embodiments, servicing the removed ion guide sub-assembly can include separating at least one of the ion guide of the ion guide sub-assembly to expose an ion lens assembly attached to another ion guide of the sub-assembly, the ions lens assembly comprising an insulating plate and ion lens electrodes held by the insulating plate, and cleaning the ion lens electrodes held by an insulating plate.

[0070] In various embodiments, the method can further include aligning alignment elements provided on the ion guide sub-assembly with corresponding receiving alignment structures within the cavity, and blindly inserting the removed ion guide sub-assembly back into the cavity upon aligning the alignment elements with the corresponding receiving alignment structures.

[0071] In various embodiments, aligning the alignment elements with the corresponding receiving alignment structures can include aligning a key insertion unit positioned on a frame of the upstream ion guide with one of, for example, a displaceable bar positioned in a channeldefined in the interior walls of the cavity and / or the channel defined in the interior walls of the cavity.

[0072] In an additional aspect, a kit for servicing and maintaining a mass spectrometry (MS) system is disclosed. The kit includes the MS system, which includes a casing defining a cavity, and a removable ion guide sub-assembly configured to be disposed within the cavity and including at least two mechanically coupled ion guides each defining a separate chamber at different pressures when engaged with the casing, with the ion guide sub-assembly being configured to be axially removed from the casing with the at least two ion guides remaining mechanically coupled to each other, and retaining the casing upon removal of the ion-guide subassembly from the casing. The kit further includes an extraction tool to remove the ion-guide sub-assembly disposed within the cavity.

[0073] In various embodiments, the extraction tool can include a grasping instrument configured to grasp at least a portion of the removable ion guide sub-assembly disposed within the cavity, and a handle attached to the grasping instrument to allow axial removal of the ion guide sub-assembly from the cavity with the at least two ion guides remaining mechanically coupled to each other, and retaining the casing upon removal of the ion-guide sub-assembly from the casing.

[0074] In various embodiments, the grasping instrument can include a socket with an open end, the socket configured to be fitted, at the open end of the socket, on a frame of an upstream ion guide of the ion guide sub-assembly that encloses electrodes of the upstream ion guide.

[0075] In various embodiments, the socket can include a base section with a continuous wall extending along the circumference of the socket, with the base section defining continuous circular top opening, and a top section comprising multiple separated arched wall sections extending from the circular top opening of the base section of the socket to the open end of the socket.

[0076] In various embodiments, interior walls of the socket can define an interior space, and, when the socket is fitted over the frame, a plurality of electrodes of the upstream ion guide enclosed by the frame can be received within the interior space of the socket.

[0077] In various embodiments, the extraction tool can further include an auxiliary leverage tool to apply leverage force to the extraction tool.

[0078] In various embodiments, the auxiliary leverage tool can include a handle section with an actuating tip configured to engage a circular disc located at a particular axial location on the handle attached to the grasping instrument of the extraction tool, and a stationary member pivotally attached to the handle section at one end of the handle section.

[0079] In various embodiments, a first plurality of electrodes of a first ion guide of the ion guide sub-assembly can include a first multipole arrangement of electrodes, and a second plurality of electrodes of a second ion guide of the ion guide sub-assembly can include a second multipole arrangement of electrodes.

[0080] In various embodiments, the first ion guide can include a first frame supporting the first plurality of electrodes, and the second ion guide can include a second frame supporting the second plurality of electrodes.

[0081] Further understanding of various aspects of the present teachings can be obtained by reference to the following detailed description in conjunction with the associated drawings, which are described briefly below.Brief Description of the Drawings

[0082] FIG. 1 is a schematic diagram of an example of a mass spectrometer implementation with a removable ion guide sub-assembly.

[0083] FIG. 2A is a diagram of a front perspective view of an extracted Djet Qjet subassembly.

[0084] FIG. 2B is a diagram of a front view of the cavity in the casing of the mass spectrometer into which the ion guide sub-assembly is fitted.

[0085] FIG. 2C is a diagram of a front view of the sub-assembly partially inserted within the cavity of the mass spectrometer.

[0086] FIG. 3 is a diagram of a front perspective view of a First ion guide attached to an interfacing ion lens, but separated from the Second ion guide.

[0087] FIG. 4 is a diagram of a perspective view of a separated interfacing insulating plate that supports an ion lens.

[0088] FIG. 5A-B are diagrams of perspective views of the front and back sides, respectively, of another insulating plate.

[0089] FIG. 5C is a diagram with a partial perspective view of a part of the sub-assembly shown in FIG. 2.

[0090] FIG. 5D is a diagram of a magnified perspective view of an intermediary insulating plate (e.g., a PCB).

[0091] FIG. 5E is a cut-away diagram of a portion of a downstream ion guide, of the ion guide sub-assembly, placed inside the cavity.

[0092] FIG. 6 is a flowchart of an example procedure for servicing a mass spectrometry (MS) system.

[0093] FIG. 7A is a front perspective view diagram of an example extraction tool fitted over a frame enclosing the electrodes of a First ion guide.

[0094] FIG. 7B is a magnified diagram of the example socket of the extraction tool of FIG. 7A.

[0095] FIG. 7C is a top view photo of the extraction tool of FIG. 7A, arranged next to an auxiliary leverage tool removed from the interior stow space of a shaft of the extraction tool.

[0096] FIG. 7D is a photograph showing the extraction tool alongside the auxiliary leverage tool, with the handle of the auxiliary leverage tool having pivoted to a perpendicular position with the longitudinal axis of the actuator of the auxiliary leverage tool.

[0097] FIG. 7E is a photograph of a user using an extractor tool and an auxiliary leverage tool.

[0098] FIGS. 8A-I include diagrams illustrating the extraction and reinstallation processes for the ion guide sub-assembly.

[0099] FIG. 9 is a flowchart of a procedure for servicing a mass spectrometry (MS) system.

[0100] Like reference symbols in the various drawings indicate like elements.Detailed Description

[0101] It will be appreciated that for clarity, the following discussion will explicate various aspects of embodiments of the applicant’s teachings, while omitting certain specific details wherever convenient or appropriate to do so. For example, discussion of like or analogous features in alternative embodiments may be somewhat abbreviated. Well-known ideas or concepts may also, for brevity, not be discussed in any great detail. The skilled person will recognize that some embodiments of the applicant’s teachings may not require certain of the specifically described details in every implementation, which are set forth herein only to provide a thorough understanding of the embodiments. Similarly, it will be apparent that the described embodiments may be susceptible to alteration or variation according to common general knowledge without departing from the scope of the disclosure. The following detailed description of embodiments is not to be regarded as limiting the scope of the applicant’s teachings in any manner.

[0102] As used herein, the terms "about" and "substantially equal" refer to variations in a numerical quantity that can occur, for example, through measuring or handling procedures in the real world; through inadvertent error in these procedures; through differences in the manufacture, source, or purity of compositions or reagents; and the like. Typically, the terms "about" and "substantially" as used herein means 10% greater or less than the value or range of values stated or the complete condition or state. For instance, a concentration value of about 30% or substantially equal to 30% can mean a concentration between 27% and 33%. The terms also refer to variations that would be recognized by one skilled in the art as being equivalent so long as such variations do not encompass known values practiced by the prior art.

[0103] As used herein the term "and / or" includes any and all combinations of one or more of the associated listed items and may be abbreviated asAlthough some aspects have been described in the context of an apparatus, it is clear that these aspects also represent a description of the corresponding method, where a block or device corresponds to a method step or a feature of a method step. Analogously, aspects described in the context of a method step also represent description of a corresponding block or item or feature of a corresponding apparatus. Some or all of the method steps may be executed by (or using) a hardware apparatus, like forexample, a processor, a microprocessor, a programmable computer or an electronic circuit. In some embodiments, some one or more of the most important method steps may be executed by such an apparatus.

[0104] The term “component of a mass spectrometer” refers to a device, unit, section, and / or sub-assembly associated with the mass spectrometer. Some examples of a component of a mass spectrometer can include, without limitation, an ion guide, a mass filter, a mass analyzer, etc.

[0105] The present disclosure is generally related to systems, methods, assemblies, tools and other implementations, that allow for improved servicing and maintenance of mass spectrometers through use of a removable ion guide sub-assembly that does not require, with the exception of the interfacing port at the exterior surface of the mass spectrometer’s casing (housing) that include the curtain plate and the orifice plate, any preceding disassembly, unwiring, or any preliminary handling of the internal or external structures of the mass spectrometer. The proposed assemblies allow for removal of one or more ion guide components (e.g., an assembly comprising Djet and Qjet components) as a single, but separable sub-assembly unit (i.e., when there are multiple ion guides constituting the sub-assembly unit), while keeping the remainder of the mass spectrometer system intact. That modular removable sub-assembly can subsequently be blindly inserted into the cavity, using various alignment elements disposed on the assembly and within the mass spectrometer (e.g., in the cavity into which the modular assembly is being inserted)_to guide and align the modular sub-assembly with other components within the mass spectrometer, while requiring minimal effort from the user / operator to properly place the subassembly inside the mass spectrometer. In some embodiments, front end ion path segments are combined in container (cartridge) type sub-assemblies and constructed as a separate, removable, front loading assembly. In some embodiments, all electrical connections are grouped into two major locations using a wire-free, quick connect-disconnect approach. Pressure chambers of the removable sub-assembly are divided using customized, reusable insulators (gaskets), constructed and adjusted for each location. With this removable sub-assembly, users do not need to open a front instrument servicing door (panel) or any other panel (i.e., users do not need to open panels of the mass spectrometer’s casing in order to access the interior ion path components), to perform servicing tasks. It is noted, however, that in some embodiments, an inlet port comprising a front end curtain plate and an orifice plate would need to be removed in order toaccess the upstream portion of the Djet Qjet sub-assembly. In some examples, a specialized extractor tool (that can be provided to the user in a toolkit that accompanies the mass spectrometer) can be used to extract the removable, multi-chamber (corresponding to multiple ion guide sections) sub-assembly from the casing defining the mass spectrometer. Advantageously, the users / operators of the mass spectrometer are able to perform inspection, service and cleaning of the components of the sub-assembly, and also inspect (and possibly service) portions of the mass spectrometer system that become visible upon removal of the subassembly. The users / operators can perform these operations in full or in part on their own schedule, and can purchase spare parts, clean them in advance, replace the contaminated parts, and reduce the instrument down time.Ion guide sub-assembly

[0106] Before discussing in more detail the structures and operations of various embodiments, an overview of the configuration of an example mass spectrometer 100, which includes a removable ion guide sub-assembly 110 is provided in FIG. 1. It should be noted that implementations of the proposed framework are not restricted to the MS system of FIG. 1 but may be implemented with any type of mass spectrometer. As depicted in FIG. 1, the MS system 100 includes an ion source 102 for generating a plurality of ions 103. A variety of ion sources can be employed in the practice of the present teachings. Some examples of suitable ion sources can include, without limitation, an electrospray ionization device, a nebulizer assisted electrospray device, a chemical ionization device, a nebulizer assisted atomization device, a chemical ionization device, an atmospheric pressure chemical ionization (APCI) device, a heated nebulizer device, a thermal desorption ion source, a matrix-assisted laser desorption / ionization (MALDI) ion source, a photoionization device, a laser ionization device, a thermospray ionization device, an inductively coupled plasma (ICP) ion source, a sonic spray ionization device, a glow discharge ion source, and an electron impact ion source, among others. The operation of the ion source 102 can be controlled (e.g., via a processor-based controller) to adjust, for example, the types of compounds (molecules) formed, the charge of those compounds, etc.

[0107] The generated ions 103 pass through an aperture 104a of a curtain plate 104 and through an orifice 106a defined by an orifice plate 106 which is positioned immediately adjacent to, and downstream of, the curtain plate 104. The curtain plate 104 and the orifice plate 106 are separated from each other and form a gas curtain chamber between the orifice plate and the curtain plate. A curtain gas supply (not shown) can provide a curtain gas flow (e.g., of N2) between the curtain plate 104 and the orifice plate 106 to help keep the downstream sections of the mass spectrometer clean by declustering and repelling large neutral particles. The curtain chamber can be maintained at an elevated pressure (e.g., a pressure greater than the atmospheric pressure) while the downstream sections of the mass spectrometer can be maintained at one or more selected pressures via evacuation through one or more vacuum pumps 142a-d. The ions 103 pass through the orifice defined by the orifice plate 106 and are received by the removable ion guide sub-assembly 110, which in this example includes a multipole ion guide 120 (referred to as a Djet section) and a downstream adjacent Qjet section 130. The sub-assembly may include additional or fewer ion guides than the Djet section 120 and the Qjet section 130.

[0108] The ions 103 travel, along a general direction indicated by the arrow 103 a, toward a vacuum chamber 122 in which a multipole ion guide 120 is housed. The ions 103 enter the vacuum chamber 122 via an inlet 108 thereof. In the example embodiment illustrated in FIG. 1, the curtain plate 104 and an orifice plate 106 are positioned in front of the inlet 108. In this embodiment, the orifices 104a and 106a are sufficiently large to allow the incoming ions to enter the chamber 122. By way of example, the orifices 104a and 106a can be substantially circular with a diameter in a range of about 0.6 mm to about 10 mm.

[0109] The multipole ion guide 120 can have a variety of different configurations. In some embodiments, the ion guide 120 can be in the form of a quadrupole rod set while in other embodiments, the ion guide 120 can be in the form of a hexapole rod set (8 rods arranged around a central longitudinal axis) or a dodecapole rod set (12 rods arranged around a central longitudinal axis). More generally, the multipole ion guide 120 can include any number of rods. In some embodiments, the ion guide can be formed by using a series of stacked rings. In the example implementation described herein (as will further be described below) the multipole ion guide 120 includes a dodecapole rod set that are tilted in a direction towards the central axis, such that the twelve (12) electrode rods define a truncated cone (a conical frustum). The Djet section is configured to quickly and efficiently capture and focus the ions 103 that enteredthrough the orifice plate 106 into a narrow beam. Because the First ion guide 120 operates at relatively high pressure conditions (e.g., the vacuum chamber 122 housing the multipole electrode rods is typically maintained at 4-15 Torr) it requires a large number of electrodes to generate a high-order multipole field. The First ion guide 120 is also configured to constrain the gas flow and pressure so as to minimize shock waves at the boundary with the Second ion guide 130, that would lead to poor transmission efficiency. To constrain gas flow within the First ion guide, the electrode surfaces gradually narrow and tilt inward to provide a smaller radius at the exit. In addition, each of the plurality of electrodes gradually becomes thicker toward the narrower exit end of the ion guide 120. A vacuum pump 142a can apply a negative pressure to the chamber 122 to maintain the pressure in the chamber within a desired range (the pressure within the chamber 122 can be in a range of about 4 Torr to about 15 Torr). A power supply 140 (herein also referred to as an RF voltage source) applies radiofrequency (RF) voltage(s) to the rods of the ion guide 120 to radially confine and focus the ions 103 as they pass through the ion guide 120. An aperture 124 defined in an ion lens IQ00 that is positioned downstream of the First ion guide 120 allows the passage of ions from the chamber 122 into a downstream chamber 132 in which another multipole ion guide 130 is positioned (herein also referred to as QJET region).

[0110] As shown in FIG. 1, a vacuum pump 142b can apply a negative pressure to the chamber 130 such that in some embodiments the pressure within the chamber 132 is maintained, for example, in a range of about 1 Torr to about 4 Torr. The Second ion guide 130 includes, in the particular example of FIG. 1, four rods (two of which are shown in FIG. 1) arranged in a quadrupole configuration to which RF voltages (supplied by the RF voltage source 140) can be controllably applied to generate a quadrupolar electric field in the space between the rods. The Qjet optic can capture and focus the ions using a combination of gas dynamics and radio frequency fields.

[0111] As noted, and as will be discussed in greater detail below, in the implementations described herein, the ion guide 120 (e.g., a Djet section) and the ion guide 130 (e.g., a Qjet section) are physically attached to each other and are structured to be axially extracted (removed) from a cavity in the casing (housing) of the mass spectrometer so as to allow easy access to the users or operators of the system 100 to service and maintain the front end ion guide subassembly comprising the ion guides 120 and 130. The two ion guides of the axially removablesub-assembly (in some embodiments, additional ion guides may be included in the subassembly) remain mechanically coupled to each other, while retaining the casing (i.e., the casing’s integrity remains otherwise unaffected). Upon removal of the ion guide sub-assembly, the cavity that receives the sub-assembly is generally visible and accessible to perform maintenance and servicing on the interior of the cavity and on any component that is directly accessible from the cavity (e.g., an IQO optical lens disposed between the Second ion guide and the adjacent downstream ion guide). Typically, to remove the sub-assembly 110, the curtain plate 104 and the orifice plate 106 would need to also be physically removed (the ion source is generally a modular attachable component that is not disposed within the casing / housing of the mass spectrometer), but the integrity of the rest of the casing and the components arranged in it are otherwise not affected by the removal of the sub-assembly (e.g., no other component or wiring within the casing needs to be removed or disturbed in any way).

[0112] With continued reference to FIG. 1 , at least a portion of the ions that travel through the Second ion guide 130 are then transmitted via the ion lens IQO into an ion guide Q0 (marked as ion guide 160), which may include four rods (two of which are visible in this figure) arranged in a quadrupole configuration to form an ion beam for transmission to downstream components of the mass spectrometer. Here too, the RF voltage source 140, or another voltage source, can controllab ly apply RF voltage(s) to rods of the ion guide 130 to radially confine and focus a portion of the ions 103 as they pass through the Second ion guide 130. The ion lens IQO separates the chamber 132 from a vacuum chamber 162 within which the ion guide 160 is disposed. An aperture 134 defined by the ion lens IQO allows the passage of at least some the ions that travelled through the ion guide 130 into the chamber 162. A vacuum pump 142c may be included to apply a negative pressure to the chamber 162 so as to maintain the pressure within that chamber in a range of, for example, about 3 to about 8 mTorr.

[0113] Located downstream of the Q0 ion guide is, in the example embodiments of FIG. 1, a quadrupole mass analyzer QI (marked as mass analyzer 170) that is disposed in a chamber that is positioned downstream of the chamber 162. A vacuum pump 142d applies a negative pressure to the chamber 172 so as to maintain the chamber 172at a pressure of less than 5e-5 Torr. In the example embodiment, stubby rods 174 are also positioned within the chamber 172. In other embodiments, the mass analyzer can be implemented according to other configurations, such as time of flight (ToF) configuration. An ion lens IQ1 is disposed between the chambers 162 and172 to focus the ions as they pass from the chamber 162 into 172. The ion lens IQ1 (and similarly the other ion lenses used in embodiments of the system 100) can be formed as a metal plate in which an orifice is provided to allow passage of the ions therethrough. Generally, located downstream of the IQ1 chamber is an ion detector and analysis module (not shown in FIG. 1) to detect and analyze those ions that exit the ion guide formed by the rods 170.

[0114] As illustrated in FIG. 1 , in various examples, a DC voltage source 150 (e.g., a tunable DC voltage source) applies a DC voltage differential between the ion lens IQ0 and the rods of the Q0 ion guide so as to accelerate the ions as they pass through the orifice associated with the IQ0 lens to enter the Q0 region. The acceleration of the ions can increase their axial kinetic energy and hence cause declustering of at least some of the adduct ions, if any, present in the flux of ions and / or fragmentation of at least some of the ions, as they pass through the gas expansion into the subsequent lower pressure region. In the examples of FIG. 1 , the Q0 ion guide can be maintained at a float voltage in a range of about -100 V to about +100 V. Thus, the DC voltage source 150 provides an additional DC offset potential above the electric potential applied to the Q0 electrodes. In various examples, the DC source 150 can also be applied to the rods and electrodes of any of the other ion guides (and / or any auxiliary rods used therewith) to further control the behavior of various ions passing through the respective chambers. For example, a controllable voltage level can be applied to the rods 170 of the ion guide QI to radially focus the ions and / or select ions having a target m / z ratio.

[0115] It is noted that the mass spectrometer 100 may include additional sections, not shown in FIG. 1, to perform additional ion selection and control functionality. For example, prior to arriving at the mass analyzer section QI, the ions exiting the Q0 ion guide section (via the IQ1 lens), may undergo further ion filtering and control using a mass filter section, followed by a collision cell section (these two section are generally located downstream of the ion guide section Q0). A mass filter includes a multipole arrangement of rods, such as, for example, a four-rod quadrupole configuration, a six electrode rods arrangement in a hexapole configuration, an eight electrode rods arrangement in an octupole configuration, etc. RF voltages (provided by the RF voltage source 140) as well as a DC resolving voltages (e.g., provided by the DC voltage source 150) can be applied to the electrode rods arrangement used in the mass filter to radially focus the ions and to select ions having a target m / z ratio (e.g., precursor ions) as they pass through the mass filter. The multipole rod set of the mass filter can be provided with RF / DCvoltages controllably selected so that the mass filter establishes a transmission window of chosen m / z ratios, such that these ions can traverse the mass filter largely unperturbed. Ions having m / z ratios falling outside the window, however, do not attain stable ion trajectories within the multipole rods of the mass filter and can thus be prevented from traversing the mass filter and continuing to the downstream sections.

[0116] A collision cell includes a multipole arrangement of rods (e.g., four rods arranged in a quadrupole configuration) to which RF voltages are applied (e.g., from the RF voltage source 140 or from a dedicated RF voltage source) to provide radial confinement of the ions. The rods of the collision cells are generally disposed in an enclosure in which the pressure within the collision cell can be increased relative to the other stages, e.g., via introduction of a gas (e.g., nitrogen or an inert gas) into the enclosure. The collision cell can be employed to cause fragmentation of the ions received by the collision cell, or alternatively can be used to perform collisional cooling of the ions. At least some of the ions introduced into the collision cell can proceed to another downstream ion guide section, or to the mass analyzer section QI depicted in FIG. 1. It is noted that the various ion guide sections (configured for particular functionality) can be arranged in a different order, e.g., with the mass filter positioned downstream to the collision cell.

[0117] With reference to FIG. 2A, a perspective view of an extracted sub-assembly 200 (which may be similar to the sub-assembly guide 110 of FIG. 1) is shown. A First ion guide 220 (which may be similar to the ion guide 120 of FIG. 1) is attached to a downstream Second ion guide 230 via an interfacing ion lens assembly 228 (which may be similar to the IQ00 ion lens 128 depicted in FIG. 1) to which both the downstream end portion of the ion guide 220 and the upstream end portion of the ion guide 230 are fixedly fastened (e.g., via locking screws or pins). The interfacing ion lens assembly 228, that is sandwiched between the ion guides 220 and 230, can be an electrically insulated interfacing structure such as, for example, a printed circuit board (PCB) with holes and cavities defined on the board to create electrical connections to the electrodes that allow wire-free control of the received electrode (additional details regarding the interfacing ion lens assembly 228 are provided below). The interfacing ion lens assembly 228 may also include alignment pins and alignment holes to align the First ion guide 220, Second ion guide 230, and interfacing ion lens for secured attachment of these components, and to allow proper operation of the sub-assembly comprising these components.

[0118] The ion guide sub-assembly 200 includes two separate support frames 222 and 232 in which the rod arrangements of each of the ion guides 220 and 230 are disposed and supported. The support frames 222 and 232 are mechanically attached to each other using fasteners such as screws and pins inserted into complementary holes defined at frame collars (contacting end structures) 224 and 234. At various locations on the end contacting surfaces of the contacting structures the support frames are also attached to the interfacing ion lens assembly 228 to more securely attach the various structures of the sub-assembly 200 to enhance the robustness of the sub-assembly 200 as it is removed from the cavity defined by the casing of the mass spectrometer system. As can further be seen, in this embodiment both collars 224 and 234 are enlarged circular structures compared to the remainder portions of the supporting frames 222 and 232, and in this embodiment both collars are irregularly shaped. The two enlarged circular collars achieve at least two objectives. The first is to improve on the robustness of the subassembly when the frames and electrodes are mechanically attached (so as to avoid potential breakage of the sub-assembly if less robust end structures were used). The second objective is to be able to securely fit the enlarged collars (which, when attached, form a radially enlarged middle section whose radial size surpasses the radial size at any other point on the assembled ion guide sub-assembly) into complementary radial grooves defined in the cavity that receives the sub-assembly (after the latter has been serviced and maintained). The radially enlarged middle section formed through attachment of the collars structures 224 and 234 will thus have, after attachments of the two collars to each other (and to the electrically insulating interfacing ions lens assembly 228) a uniquely-shaped structure that can be fitted into complementary uniquely- shaped openings of the cavity to allow for blind insertion of the middle structure into the right positions in the cavity’s opening. As the sub-assembly advances within the cavity, it will eventually reach a complementary recess or pocket defined within the guide, allowing an end structure 236 of the second collar 234 to be fitted (and possibly lock) into the complementary recess or pocket defined on the interior walls defining cavity. Once fitted into the complementary recess or pocket, the walls of the recess or cavity will prevent / inhibit further axial movement of the sub-assembly 200 down the cavity and locates the center of the ion path at the that point in the cavity.

[0119] The collars 224 and 234 can include, at their end attachment surfaces (i.e., the surfaces that contact the interfacing ion lens assembly 228 or the opposing frame), alignmentelements, such as alignment pins, that fit into complementary holes in either the interfacing ion lens assembly 228 or in the attachment surface of the opposing collar. When re-assembling the ion guide sub-assembly 200 (after servicing the components of the sub-assembly 200), the two collars (and thus the two frames) are aligned to fit the alignment elements to attach one ion guide (e.g., the First ion guide) to the other ion guide (e.g., the Second ion guide).

[0120] The sub-assembly 200 also includes an alignment / locator pin 229 which facilitates placement of the sub-assembly back into the cavity. The alignment pins extend, in the example of FIG. 1, from the downstream side of the interfacing ions lens assembly 228, and are configured to be received in a matching recess, or receiving channel inside the cavity, for a locking engagement of the alignment pin 229 and the complementary recess or receiving channel. With reference to FIG. 2B, a front view of the cavity 240 in the casing of the mass spectrometer into which the ion guide sub-assembly is fitted (e.g., after the ion guide subassembly 200 has been serviced) is shown. An insulating plate 270 is disposed within the cavity 240. The insulating plate can be implemented as a printed circuit board (PCB), or some other insulating plate, on which electrical contacts and connections are disposed (as will be discussed in greater detail with respect to FIG. 4, below) to implement the electrical connectivity between the power sources (such as the RF voltage source 140 and / or the DC voltage source 150) required to operate the various sections of the mass spectrometer and to control the behavior of the ion stream propagating through the ion path defined by the various sections of the mass spectrometer during its operation. As shown in FIG. 2B, the insulating plate 270 is shaped to define a recess 272. During insertion of the ion guide sub-assembly 200, the alignment / locator pin 229 needs to be received within the recess in order for the ion guide sub-assembly to be radially (e.g., rotationally and angularly), and axially aligned with the downstream sections of the mass spectrometer. The implementation of the ion guide sub-assembly 200 and the cavity 240 is such that in various embodiments there is about 0.2 mm - 0.3 mm misalignment tolerance built into the configuration of the ion guide sub-assembly 200, the cavity 240, and the downstream sections of the mass spectrometer. This tolerance nevertheless requires accurate alignment of the ion guide sub-assembly within the cavity 240 which is achieved, in part, by having the alignment pin 229 received in the recess 272. The ion guide sub-assembly includes additional alignment elements that facilitate blind insertion of the ion guide sub-assembly 200 inside the cavity 240.

[0121] The various alignment elements include insertion alignment elements disposed on the sub-assembly structure, and receiving alignments elements disposed within the cavity (e.g., along the walls of the cavity, or in the downstream assemblies that need to be aligned with the sub-assembly 200). The alignment elements are used to facilitate axial and / or radial alignment. The axial alignment elements include those elements that constrain the axial advancement of the sub-assembly within the cavity so that the sub-assembly does not advance in the cavity past the target point at which the sub-assembly is required to be placed for proper operation. Axial alignment elements can be used to avoid damage to any downstream components (e.g., another ion guide) farther downstream in the cavity. For example, the locator pin is configured to act, in part, as an axial element, in that once it is received by the corresponding receiving alignment element in the cavity, further advancement of the sub-assembly 200 will be inhibited. In another example (discussed in greater detail below) an insertion key 225, disposed on the collar 224, can be used, in part to guide the sub-assembly in a groove defined in a wall of the cavity. Once the key insertion unit reaches the end of the channel, the sub-assembly cannot advance axially anymore. In some embodiments, the collars 224 and 234 can server as axial alignment elements in that the cavity may be structured to allow the downstream portion of the sub-assembly to advance down the cavity, but once the larger diameter collars reach protrusions in the walls of the cavity that inhibit further movements, the sub-assembly will no longer be able to advance down the cavity.

[0122] The radial alignment elements are configured to rotationally and / or angularly align the sub-assembly with downstream components. Rotational alignment refers to aligning the relative orientation of the longitudinal axis of the sub-assembly to the longitudinal axis of the downstream components so that the apertures of the sub-assemblies and the ion guides’ apertures of the downstream components are collinearly aligned. Angular alignment refers to the angular position of components of the sub-assembly relative to the longitudinal axis of the sub-assembly. In various embodiments, some of the alignment elements that were used to axially align the subassembly can also be used to radially (rotationally and / or angularly) align the sub-assembly within the cavity. For example, the sub-assembly needs to be inserted with a particular angular orientation for the locator pin 229 to mate with a corresponding receiving structure within the cavity, thus providing an angular alignment mechanism to ensure proper angular alignment of the sub-assembly. Similarly, the key insertion unit 225 needs to be fitted into a particular grooveI channel defined in an interior wall of the cavity (a groove that is otherwise vacant, or that has a displaceable bar in it), thus providing the proper angular and rotational orientation of the subassembly for connection with downstream components. In some embodiments, the radial alignment elements can be dedicated angular or rotational insertion alignment elements. For example, the downstream end surface of the frame 232 of the Qjet ion guide may include multiple axial pins or rods (not shown in FIG. 2) at various angular positions on that end surface. Those insertion alignment elements are aligned with, and are fitted into, corresponding receiving alignment elements on an upstream end surface of the upstream component (e.g., an ion guide) disposed mass spectrometer, thus ensuring rotational and angular alignment.

[0123] Turning back to FIG. 2A, the multipole ion guides 220 and 230 are implemented as arrangements of multipole electrode rods. In the example of FIG. 2A, the First ion guide 220 includes twelve (12) rods with working surfaces that converge towards the central axis of the ion path (FIG. 2A includes an example of a working surface 226 of one of the electrodes forming the 12 rod dodecapole configuration of the First ion guide 220). The tilted configuration of the converging rods defines a conic interior that tapers towards the interfacing ion lens assembly 228, and can be controlled (through application of RF and / DC voltages controllably applied to the various rods) to focus the stream of ions travelling through the ion guide 220 to the ion lens. On the other hand, the electrode rods of the Second ion guide 230 can have a uniform width of their working surfaces, which may be configured to guide ions to the ion lens of the IQ0 interface.

[0124] As also illustrated in FIG. 2 A, and with further reference to FIGS. 2B and 2C (showing a front view of the sub-assembly partially inserted within the cavity in the casing of the mass spectrometer), a sub-assembly insertion key unit 225 abuts the top portion of the frame collar 224. The insertion key unit 225 extends radially above the top surface of the frame collar 224 (i.e., the insertion key 225 stands proud of the outer surface of the frame collar 224). The insertion key unit 225 is configured to engage a sliding bar that is located along the walls defining the outside circumference of the cavity’s opening in the casing, through which the ion guide sub-assembly is inserted, which in turn allows the key insertion unit 225 to advance through a channel that is formed as the sliding bar is displaced inwardly (see FIG. 2B). Alternatively, the channel can be formed without including a sliding bar that occupies the channel, in which case, the insertion key unit 225 is fitted inside the channel 260. Thus, in orderto insert and advance the ion guide sub-assembly into the cavity of the mass spectrometer system, the insertion key unit 225 and the sliding bar (or the channel) need to be aligned so that when the insertion key unit 225 engages with the sliding bar, the sliding bar will be displaced inwardly and allow the ion guide sub-assembly 200 to advance through the cavity. If the insertion key unit 225 is not aligned with the sliding bar, the insertion key unit 225 will contact one of the fixed wall sections, such as the section 262 (shown in FIG. 2B), positioned next to the sliding bar or the channel 262 around a circumference ring 250 of the cavity’s opening (with the circumference ring 250 surrounding the interior wall sections of the cavity), and thus the ion guide sub-assembly 200 would not be able to advance within the cavity.

[0125] The wall sections lining the circumference of the cavity’s opening may include additional sliding bars (or vacated channels) that are configured to receive other alignment elements of the ion guide sub-assembly 225. For example, the wall sections lining the opening of the cavity 240 may include another sliding bar 264 (shown in FIGS. 2B and 2C) at the bottom part of the cavity’s opening. To displace the sliding bar 264, another insertion key unit, such as key insertion unit 227 (shown in FIGS. 2A and 2C) needs to be accurately aligned across from the sliding bar 264 (or a channel). When so aligned, advancing the ion guide sub-assembly will cause the sliding bar 264 to be displaced, and would allow the sub-assembly to continue advancing inside the cavity. It is noted that in the example of FIG. 2A, the insertion key unit 227 is located upstream of the insertion key unit 225, and therefore the insertion key unit 225 will need to be aligned with the sliding bar occupying the channel 260 (or alternatively with the opening of an unoccupied channel 260) before the insertion key unit 227 reaches the opening of the cavity 240. The additional alignment elements, such as the insertion key unit 227, ensure that the sub-assembly 200 is indeed properly aligned (axially and radially) since misalignment of the key insertion units with their respective channels or sliding bar will impede the advancement of the ion guide sub-assembly unit within the cavity, thus necessitating withdrawal of the subassembly 200, and re-start of the insertion process. When all alignment elements are properly aligned with their corresponding receiving elements, the user can blindly insert the sub-assembly until it locks in place with all the alignment elements having arrived at their respective receiving targets.

[0126] With reference next to FIG. 3, a diagram 300 of a front perspective view of a First ion guide 310 attached to an interfacing ion lens 330, but separated from the Second ion guide 230depicted in FIG. 2A), is shown. After removing the ion guide sub-assembly (e.g., the assembly 200 that includes two ion guides and their respective support frames), the two ion guides can be detached from each other by removing the fasteners mechanically fixing the first frame of the first ion guide 220 and the second frame of the second ion guide 230 together and separating the two frames to separate the respective alignment elements of one ion guide from the mating alignment openings of the other ion guide. For example. FIG. 3 includes three alignment elements 324a-c (in this case the alignment elements are pins) that extend from the contact surface 323 of the collar 322 of the frame 320 in which the electrode set of the ion guide 310 is disposed. When being re-assembled (following servicing and maintenance) the alignment elements 324a-c fit into alignment openings (holes) that are defined on the contact surface of the frame collar of the frame supporting the other ion guide (the Second ion guide; not shown in FIG. 3). The openings on the frame collar of the Second ion guide are similar to alignment openings 326a-c that are defined on the contact surface 323 of the frame collar 322. These alignment holes are configured to receive the alignment elements extending from the contact surface of the Second ion guide 230. Thus, when assembled, the alignment elements extending from the contact surface of one frame collar are received in respective alignment openings defined in the contact surface of the other frame collar, thus aligning the two frame collars and respective ion guides for fixation in the correct alignment with fasteners.

[0127] It is noted that during re-assembly of the ion guide sub-assembly, the axial alignment of the different components, namely the First ion guide 220, the Second ion guide 230, the interfacing ion lens (comprising an insulating plate supporting the electrodes forming the electrode lens), needs to be nearly perfect to maintain the ion path. The various components of the sub-assembly 200 of FIG. 2A, typically have a radial alignment tolerance of about 0.2-0.3 mm. That is, in the axial attachment of the various components, any radial misalignment of the different parts can be no larger about 0.2 mm. A misalignment of less than about 0.2 mm should still allow the alignment pins and openings (on the contact surfaces of the frame collars) to engage, and for the subassembly to be safely attached.

[0128] As further shown in FIG. 3, the alignment elements 324a-c also pass through alignment openings defined on the electrical insulator layer 330 (which will be discussed in greater detail below) to thus ensure that the insulating plate 330 has also been properly positioned in the re-assembled sub-assembly. For example, the alignment element 324a passesthrough an alignment opening 336 defined on the insulating plate 330. The insulating plate 330 (which may be implemented as a printed circuit board, or PCB) supports an ion lens 332, which may be similar to the IQ00 ion lens disposed between the First ion guide and the Second ion guide. The example ion lens 332 includes two semi-circular electrodes that are positioned adjacent to each other, and define a lens aperture 334. The ion lens 332 is configured to be electrically controlled to focus ions arriving via the upstream ion guide (in this case the First ion guide 310).

[0129] The assembly of FIG. 3 (from which the Second ion guide has been separated) includes, in some embodiments, a retaining ring 340 (also referred to as a brace) that is fixedly attached to the interfacing insulating plate 330 via fasteners such as spring loaded captive screws (screws that when they are untightened will not pop out completely out of the receiving screw hole), such as captive screw 342 fitted into a hole on one of the three projections (such as projection 343) of the retaining ring 340. The retaining ring 340 is configured to prevent, when attaching the Second ion guide sub-assembly to the First ion guide sub-assembly, the frame collar of the Second ion guide from accidentally damaging the ion lens, or the other components of the insulating plate 330 or the First ion guide, or the First ion guide’s frame. Thus, when the Second ion guide sub-assembly approaches the First ion guide and insulating plate assembly during axial alignment of the two ion guides, if the two ion guides are misaligned the separator ring will prevent (or at least reduce the chances) the misaligned Second ion guide sub-assembly from coming in contact with the ion lens assembly or the First ion guide sub-assembly. As also shown in FIG. 3, the First ion guide and insulating plate include a locator pin 329 extending from the contact surface 323 of the frame collar 322. The locator pin 329, similar to the locator pin 229 of FIG. 2A, is an alignment element that can facilitate the axial alignment of a reconstructed sub-assembly (with the First ion guide, insulating plate and the Second ion guide re-attached to each other) in the cavity, as well as radial, e.g., rotational and / or angular) alignment. When the reconstructed sub-assembly is inserted into the cavity, the locator pin 329 engages a receiving alignment element (e.g., a channel, e.g., a tube, defined in the inner walls of the cavity from which the ion guide sub-assembly was extracted, a structure with a receiving slot to receive and mate with the locator pin, etc.).

[0130] The separation of the Second ion guide from the sub-assembly leaves the First ion guide sub-assembly connected to the insulating plate supporting the ion lens and the retainingring atached to the insulating plate. In this state, a user can access the now exposed and accessible ion lens 332 (e.g., to clean the lens’ electrodes, and to otherwise service and maintain the visible / accessible parts and components of the detached First ion guide section and the exposed surface of the insulating plate sub-assembly). If cleaning the exposed (downstream) surface of the insulating plate 330 and ion lens 332 is not enough to resolve performance issues associated with the ion lens 330 and the First ion guide, the other (non- visible) side of the insulating plate and the ion lens 330 lens needs to be accessed for servicing and maintenance. The fastening elements (e.g., the captive screws that include the screw 342) that fasten the retaining ring 340 to insulating plate 330 are loosened (using a matching screw-driver), and the protector ring 330 is thus removed.

[0131] FIG. 4 is a diagram of a perspective view of a separated interfacing insulating plate 400 that supports an ion lens 420. The First ion guide sub-assembly (that includes the frame supporting it) with a separated protector ring. As noted, if the inaccessible surface of the insulating plate needs to be accessed while the insulating plate 400 (or the plate 330 of FIG. 3) is fixedly atached to the frame supporting the First ion guide (e.g., the frame 320 supporting the First ion guide 310 in FIG. 3), the insulating plate 400 needs to be detached from the frame. This is achieved by loosening the captive screws (FIG. 3 shows an example of a captive screw 342) with an appropriate tool. As the screws are loosened they will eventually be retracted from their corresponding screws holes defined on the contacting surface of the frame collar for the frame supporting the Djet’s set of rods. The separator ring can now be removed from the holes on the contact surface of frame collar (e.g., the frame collar 322 shown in FIG. 3), and then removed from the holes defined on the insulating plate supporting the ion lens. The insulating plate 400 holding the ion lens 420 is then gently pulled away from the collar frame for the frame supporting the First ion guide.

[0132] With the insulating plate 400 now separated and released from the various components it was atached to, users or operators can service, clean, and otherwise maintain it. The insulating plate 400 is constructed from an insulating (dielectric) material with electrical conductive connections disposed on both of the plates surfaces. In some embodiments, the insulating plate may be a printed circuit board (PCB) that includes an insulating substrate 402 (e.g., fiberglass, phenolic paper, etc.) on which conductive traces for delivering electrical currents are disposed. Electrical current is delivered through rigid electrical connectors (e.g.,pogo pins) such as the connectors 412a-c and 410a-b, which are typically securely affixed to the insulating plate 400 through soldering. As will be discussed in greater detail below, the electrical connections 412a-c can each include a conductive top (such as a conductive top 414 extending from the electrical connector 412a) that engages an electrical receptor within an electrical box that comprises multiple receptors that can be mated / engaged to corresponding rigid electrical connections such as the conductive top 414. The electrical box can be electrically and mechanically attached to another electrical box (or as series of boxes) that eventually are connected to an upstream voltage source(s) (an RF voltage source and / or DC voltage source). The electrical connectivity implemented by the rigid electrical connectors and the use of electrical boxes that use rigid connections for current transmission can thus avoid the use of wires which are more susceptible to become disconnected during repeated extraction and insertion of the ion guide sub-assembly (such as the assembly 110 of FIG. 1, or the ion guide sub-assembly 200 of FIG. 2A). This type of electrical implementation is referred to as a wire- free implementation. When the ion guide sub-assembly is installed in the cavity defined in the mass spectrometer’s casing, the rigid electrical connectors, which are shown to be radially positioned close to the outer perimeter of the insulating plate 400, will engage corresponding electrical receptors provided in a receiving electrical box that is positioned within the cavity to receive and engage the rigid electrical connections. The use of rigid electrical connectors also facilitates the alignment process in that the sub-assembly inserted to the cavity will advance down the cavity until the various alignment elements (such as the locator pin 229 of FIG. 2A) and the rigid electrical connectors engage their corresponding receiving structures.

[0133] The example of FIG. 4 shows three pogo pins that electrically attach to three corresponding electrical connection points (e.g., within an electrical box located within the cavity). The pogo pins 412a and 412c are electrically connected, via the conductive traces 426a and 426c, to receiving electrical connectors 410a and 410b, respectively. The electrical connections 410a and 410b are pogo pins whose base portions are disposed on a front surface of the insulating plate shown in FIG. 4, and whose top portions (structured similarly to the top portion 414 of the electrical connection 412a) extend from the back surface (not visible in FIG. 4) for engagement with the electrodes of the First ion guide (as will become apparent below). When the ion guide sub-assembly is installed in the cavity with all the different alignment elements properly engaged with their corresponding receiving elements, the two electricalconnectors 412a and 412c are connected, via an electrical path that is implemented through a series of electrical connection units (e.g., PCB based connection units) that use rigid electrical connectors, to an RF voltage source (e.g., such as the RF voltage source 140 depicted schematically in FIG. 1). Thus, controlled RF voltages are applied to the electrode set of the First ion guide through the receiving electrical connectors 410a and 410b, which are electrically connected, via the conductive paths 426a and 426c, to the electrical connectors 412a and 412c. In these example embodiments, one group of electrodes from the electrode set of the Djet receives one controlled RF voltage from one of the electrical connectors 412a or 412c, and the other group of electrodes receives another RF current from the other one of the electrical connectors 412a or 412c. For example, a first group of electrodes receiving one RF signal could include a designated electrode, and then every other electrode, while the other group could include the remaining electrodes (i.e., one group would be the even numbered electrodes, and the other group would include the odd numbered electrodes).

[0134] The electrical voltage characteristics may be controlled by the RF voltage source to regulate the currents / voltages for the different groups of electrodes of the First ion guide to achieve some determined behavior of the electrode set that in turn would control the ion stream passing through the First ion guide. Additionally, or alternatively, in some embodiments, more electrical connectors may be disposed on the insulating plate (and attachable to corresponding receiving electrical connectors, and ultimately to the RF voltage source) to increase the number of electrode groups that are independently controlled and receive different controllable currents from the RF source. In some embodiments, the two RF currents delivered to the First ion guide may be regulated at a dedicated controller of the First ion guide (i.e., a controller that receives RF currents from the electrical connectors 410a and 410b, and regulates the currents to control the behavior of the different electrodes of the ion guide).

[0135] FIG. 5 A and FIG. 5B are diagrams of perspective views of the front and back sides, respectively, of another insulating plate 500 with electrical circuitry to operate an ion guide section. Specifically, the insulating plate shown is a part of the interface between the Second ion guide (e.g., ion guide section 230 of FIG. 1) and the downstream ion guide section following the Second ion guide (in the example of FIG. 1, the Q0 ion guide section 160 is the next immediate ion guide section that follows Second ion guide). Like the insulating plate 400 of FIG. 4, in some embodiments the insulating plate 500 may be implemented as a PCB with a non-conductivesubstrate, and conductive traces on the front and / or back surfaces of the insulating plate 500. Similar to the insulating plate 400 of FIG. 4, the insulating plate 500 depicted in FIGS. 5A-B includes an opening 540 extending from the back surface to the front surface, into which an ion lens (not shown) corresponding to the IQ0 ion lens with the aperture 134, shown in FIG. 1) is fitted to focus and control the ion beam that has passed through the Qjet section (e.g., the section 230 of FIG. 1). It is noted that in some embodiments, the insulating plating 500 does not necessarily need to be mounted on the ion guide sub-assembly 200. That is, the insulating plate 500 does not necessarily have to be a removable plate, like the insulating plate 400, but instead can be positioned within the cavity and engage the Second ion guide section when the subassembly (e.g., the sub-assembly 200) is inserted into the cavity. In some embodiments, the interfacing insulating plate 500 (or some parts thereof) may be fixedly attached to the subassembly 200, and, in such embodiments, the interfacing plate 500 would be removed with the rest of the sub-assembly when a user or an operator seeks to service or maintain the ion guide sub-assembly 200.

[0136] Disposed on a circumference surface 541 of the opening 540 are electrical contacts, including, for example, the electrical contact 542. When an ion lens (e.g., the IQ0 lens) is fitted and secured into the opening 540, the electrical contacts on the circumference of the opening engage electrical contacts of electrodes of the ion lens (e.g., the IQ0 lens). A controller (e.g., a dedicated local controller, or a central controller that controls the operation of the various components) regulates the voltage applied to the electrodes of the ion lens to control the operation of the ion lens (e.g., focusing some of the ions, filtering out some of the other ions, etc.), and thus the behavior of the ions arriving at the ion lens is also controlled. The electrical contact 542 is electrically connected to a receiving electrical connector 502 via a conductive trace 544. The electrical connector 502 has a hole in which a rigid conductive pin 503 is embedded and secured to the insulating plate (generally through soldering). As can be seen in FIG. 5A, the conductive traces from the electrical connector 502 include not only the trace 544, but also three additional conductive traces that lead to the other three electrical contacts arranged along the circumference surface 541 (at 90° angles from each other). In some embodiments, the voltage applied to the contacts along the circumference surface 541 may be a DC voltage that is used to control the electrodes of the ion lens fitted through the opening 540 and secured to the circumference surface 541 through one or more several securing means (tension forces, magnets,adhesives, etc.) The ion lens may have a voltage controller to regulate the DC voltage applied at the electrical contact to achieve a particular ion lens behavior (in terms of focusing the ion stream arriving at the ion lens, applying acceleration force to the ions, etc.) The ion lens fitted through the opening 540 may have a similar configuration to the ion lens 420 of FIG. 4 (although the ion lens used with the interfacing insulating plate 500 may have more electrodes).

[0137] FIG. 5C shows a diagram of a perspective view of part of the sub-assembly 200 of FIG. 2, with the sub-assembly 200 fixedly connected to the insulating plate 500 is provided. As can be seen in FIGS. 5A-5C, connecting the insulating plate 500 to the ion guide sub-assembly 200 can be achieved by passing a fastening element 507 (e.g., a screw or a bolt) through a hole506 defined on the insulating plate 500. In the embodiments of FIGS. 5A-C the insulating plate 500 includes five (5) securing holes (such as the hole 506). FIG. 5C shows a fastening member507 inserted through the hole 506. It is noted that the fastening member(s) may be used not only to fasten the insulating plate 500 to the removable ion guide sub-assembly 200 (e.g., fastening the insulating plate to part of the frame encompassing the Second ion guide), but also for axial alignment of the insulating plate with the rest of the sub-assembly 200.

[0138] Also shown in FIG. 5C is a seal ring 516 that, when the ion guide sub-assembly is installed within the cavity, is usually disposed in a seal groove surrounding the cavity within the casing. The seal ring 516 facilitates the creation of low pressure (high vacuum) chambers, such as the chambers 122 and 132 discussed in relation to FIG. 1. The seal ring is constructed from an elastic material that pushes against other surfaces that come in contact with it. The ion guide sub-assembly is implemented to form a sealing fit between corresponding sealing surfaces of the assembly and the walls of the vacuum chamber that define the cavity, but without the hard surfaces of the assembly elements and the walls touching each other in a way that interferes with installing the assembly within the cavity. The seal rings that are used to create the pressure chambers when the sub-assembly is installed in the cavity can further act to seal down on corresponding sealing surfaces of the assembly, and preferably maintain a sufficient gap between other portions of the assembly to allow the distal end of the assembly to be inserted through the cavity until the distal end is located and captured within a receptor within the cavity.

[0139] To further illustrate, consider FIG. 5E showing a cut-away diagram of a portion of the downstream ion guide (e.g., the Second ion guide) of the sub-assembly placed inside the cavity.As shown, the downstream ion guide includes electrodes 530 that are disposed within the space defined by a frame portion 532 that supports the electrodes retained by annular collars. The frame portion 532 (which may be the downstream portion of the frame 232 supporting the electrodes of the ion guide 230 in FIG. 2 A) is part of the assembly that advances through the cavity. As can be seen, a narrow gap 534 separates the outer surfaces of the frame portion 532 from the interior walls of the cavity (the narrow separation is what allows the sub-assembly to advance through the cavity). An elastic seal ring 536 (which may be similar to the seal ring 516 in FIG. 5C) is placed within a seal groove 538 (formed in the walls of the cavity) that radially surrounds the sub-assembly at a particular axial position. The seal ring 536 may be an O-ring, or some other resilient structure (a hollow tube or collar, such as one made from Teflon- type materials, with a metal spring that pushes against inner walls of the hollow structure) that then presses on the surfaces with which the seal ring comes in contact with. Thus, the seal ring 536 presses on the walls of the groove 538 and on a corresponding outer sealing surface of the frame portion 532 that is located radially below the seal ring, thus ensuring that a minimum gap space is maintained between the cavity surfaces and the assembly surfaces. The use of a seal ring, such as the seal ring 536, has been found to improve the axial alignment between the ion guide subassembly and the surfaces within the cavity (be it the inner walls of the cavity or other elements disposed inside the cavity).

[0140] With continued reference to FIG. 5C, when the insulating plate 500 is securely fastened to the assembly 200, the rigid electrical connectors (such as the connector 503 shown in FIG. 5A), mounted vertically within the receiving electrical connectors (such as the receiving connector 502), are inserted into a connector box 560 that has electrical sockets configured to receive and hold the rigid electrical pins from the insulating plate 500. As noted, the insulating plate 500 may be implemented as a PCB, that includes conductive traces and jumpers (such as a jumper 520 shown in FIG. 5A) that electrically connect conductive traces disposed on the PCB surface.

[0141] The connector box 560 illustrated in FIG. 5C is mounted on an insulating plate 562, which in the embodiments of FIG. 5C is implemented as a PCB. As shown in FIG. 5C, the connector box 560 has its large surface placed in parallel to the surface of the insulating plate 562. The insulating plate is secured to the assembly 200 through a mounting structure 564. The connector box also includes conductive traces that electrically connect the connector box 500 toanother connector box 570 also mounted on the insulating plate 562. The connector box has its large surface placed perpendicularly to the surface of the insulating plate 562, and as a result the connector box 570 extends away from the ion guide sub-assembly 200. With further reference to FIG. 5D, a diagram 590 of a magnified perspective view of the intermediary insulating plate 562 is provided. The diagram 590 shows the layout of the connector boxes 560 and 570 on the insulating plate 562.

[0142] Rigid electrical connections (e.g., pins) extend from sockets formed along the narrow surface of the connector box 570 and are in turn fitted into yet another connector box (not visible in FIG. 5C) mounted on an insulating plate 580 (which in FIG. 5C is also implemented as a PCB). The connector box 580 includes electrical connectors (such as connector 582) that may connect to an RF and / or a DC voltage source. Alternatively, the insulating plate 580 may include additional connector boxes similar to the connector boxes 560, 570, or 580 of FIG. 5C, and may form electrical paths extending farther away from the ion guide sub-assembly 200, until the cascade of connected electrical boxes reaches the RF voltage source and the DC voltage source. The use of connector boxes mounted on insulating plates (PCB’s) to construct an electric path from the ion guide sub-assembly 200 to the RF and DC voltage sources avoids the use of electric wires, thus making the electrical framework for the ion guide sub-assembly 200 wire free.

[0143] Turning back to FIG. 5A, and with reference again to FIG. 2A, electrical connectivity with the electrode rods of the ion guides (such as the First ion guide 220 or the Second ion guide 230) is established using pogo pins such as pogo pins 512a and 512b, which are electrically connected, via conductive traces to pins 504a-b and 505a-b. The pogo pins are electrically connected to conductive rings that, in turn, are each electrically connected to one of several electrode rods groups. Consider, with reference again to FIG. 2A, conductive rings 210 and 212 (in this example, the insulating plate 208, corresponding to the IQ00 ion lens, includes pogo pins that form an electrical connections with the electrodes of the First ion guide, whereas the pogo pins 512a and 512b establish an electrical connection with the electrode rods of the Second ion guide 230). Each of the conductive rings 210 and 212 receives RF electrical current from, for example, a respective one of the pogo pins 412a and 412c shown in FIG. 4. The conductive rings 210 and 212 distribute the respective RF currents received to one of two groups of non- adjacent electrode rods (e.g., the even numbered rods, or the odd numbered rods).

[0144] Next, with reference to FIG. 6, showing a flowchart for an example procedure 600 for servicing a mass spectrometry (MS) system is provided. The procedure 600 includes accessing 610 a removable ion guide sub-assembly disposed within a cavity defined by a casing of the MS system, with the ion guide sub-assembly including at least two mechanically coupled ion guides each defining a separate chamber at different pressures when engaged with the casing. In some embodiments, accessing the removable ion guide sub-assembly disposed within a cavity may include removing cavity port components located approximately at an opening of the cavity. The cavity port components may include a curtain plate and an orifice plate located upstream of the ion guide sub-assembly (when the assembly engages the casing).

[0145] The procedure 600 further includes grasping 620 a frame of an upstream ion guide of the ion guide sub-assembly, with the frame enclosing a first plurality of electrodes of the upstream ion guide (e.g., the First ion guide) of the ion guide sub-assembly, and axially extracting 630 the ion guide sub-assembly from the casing with the at least two ion guides of the ion guide sub-assembly remaining mechanically coupled to each other, and retaining the casing upon removal of the assembly from the casing. In some example embodiments, the grasping of the frame may include attaching an extraction tool to the frame of the upstream ion guide of the ion guide sub-assembly. Details of the extraction tool are provided below in relation to FIGS. 7A-E. In such embodiments, axially extracting the ion guide sub-assembly may include axially actuating the extraction tool to axially remove the ion guide sub-assembly from the casing. Note that in some embodiments the extraction of the ion guide sub-assembly may be performed with a specialized extraction tool, discussed in greater below. Rather, other available tools may be used to extract the ion guide sub-assembly, or the ion guide sub-assembly may even be extracted (removed) by hand. Whether extracted with non-specialized tools or by hand, care should be taken not to touch any of the electrodes of the upstream ion guide (which may be a First ion guide), or of any ion guide electrodes. If the ion guide sub-assembly is removed by hand, protective equipment (e.g., specialized gloves) may be used to grasp the frame of the upstream ion guide.

[0146] In some examples, axially extracting the ion guide sub-assembly from the casing may include axially extracting the ion guide sub-assembly from the casing such that upon removal of the ion guide sub-assembly, structural integrity of all remaining MS system components andstructures located downstream of the ion guide sub-assembly, when the ion guide sub-assembly engages the casing, remain intact and undisturbed.

[0147] In various examples, the procedure 600 may further include servicing one or more of, for example, the removed ion guide sub-assembly and / or components and structures of the MS system accessible through the cavity after removal of the ion guide sub-assembly. Servicing the removed ion guide sub-assembly may include separating at least one ion guide of the ion guide sub-assembly to expose an ion lens assembly attached to another ion guide of the ion guide subassembly (with the ions lens assembly comprising an insulating plate and ion lens electrodes held by the insulating plate) and cleaning the ion lens electrodes held by an insulating plate.

[0148] In some embodiments, the procedure 600 may further include aligning alignment elements provided on the ion guide sub-assembly with corresponding receiving alignment structures within the cavity, and blindly inserting the removed ion guide sub-assembly back into the cavity upon aligning the alignment elements with the corresponding receiving alignment structures.Extraction tool

[0149] The removable ion guide sub-assembly (such as the one illustrated in FIG. 2A) needs to be firmly engaged and locked within the cavity into which the ion guide sub-assembly is inserted (e.g., after service and maintenance). Consequently, axial removal and insertion of the sub-assembly requires application of enough force to release aligning elements of the ion guide sub-assembly and of the respective components within the cavity from their mated positions (e.g., releasing the locator pin 229 shown in FIG. 2A from its engaged position in the recess 272 shown in FIG. 2B). Because, as depicted in FIG. 2A, the upstream end portion 202 of the first ion guide comprises the narrow circular arrangement of the Djet electrodes, that upstream end portion is a prominent grasping target for a user / operator looking to remove the sub-assembly from the cavity. However, due to the vulnerability of ion guides’ electrodes to damage, the application of an excessive extraction force to the electrodes can damage the electrodes (whether the force is an axial extracting force, radial torque, or a combination thereof). Even when an appropriate level of force is applied to the electrodes (or more particularly to the narrowupstream end portion 202 thereof), holding or touching the upstream end potion 202 of the electrodes in the user’s hand(s) can cause contamination of the Djet’s electrodes, which in turn can significantly impact the performance level of the First ion guide as well as of the mass spectrometer as a whole.

[0150] Accordingly, an extraction tool configured to grasp the First ion guide at its frame (e.g., the ion guide frame 222), or to grasp the ion guide at some other location that avoids contact (accidental or otherwise) with any part of the electrodes of the First ion guide is provided. With reference to FIG. 7A, a front perspective view diagram 700 of an example extraction tool 710 fitted over the frame 222 enclosing the electrodes 220 of the First ion guide is shown. The extraction tool 710 may be provided with the mass spectrometer in a tool kit that includes any other tool needed for regular operation and maintenance of the mass spectrometer system. As shown, the extraction tool 710 includes a grasping instruments such as a socket 712 with walls defining an opening that is fitted over the frame 222. The opening has a diameter that is slightly larger than the maximum diameter of the frame 222 enclosing the electrodes of the First ion guide 220 (so that the socket can be fitted and then grasp the frame of the ion guide subassembly). The interior space of the socket is dimensioned and shaped to receive the end portion 202 of the Djet electrodes that extends past the upstream end of the frame 222, and to fixedly maintain the end portion 202 of the Djet electrodes without the interior walls of the socket 712 making physical contact with the electrodes. In other words, when nestled inside the hollow interior of the socket 712, the end portions of the electrodes of the First ion guide are shrouded (or engulfed) by the socket, but without any part of the electrodes making physical contact with any part of the socket 712.

[0151] With continued reference to FIG. 7A, an engagement disc (circular plate) 714 is coupled to the base (bottom part) of the socket 712, and is configured to be engaged and actuated by an auxiliary tool to either push the extraction tool outwardly to help extract the ion guide subassembly, or, when the ion guide sub-assembly is reinstalled, to push the ion guide sub-assembly inwardly into the cavity to be locked into place along the ion path of the mass spectrometry system. In some embodiments, the engagement disc 714 can also be used to prevent excessive insertion of the extraction tool 710 into the cavity into which the ion guide sub-assembly is inserted (during extraction or insertion of the sub-assembly from or into the cavity). Thediameter of the engagement disc 714 is large enough that the actuating tip of the handle 744 can contact and actuate the circular disc when the handle 744 of the auxiliary leverage tool is pivotally rotated. The circular disc’s diameter may be at least as large as the diameter of the opening of the cavity (e.g., the opening 240 shown in FIG. 2B). In some embodiments, the engagement disc 714 may also be used as the base of the socket to close the bottom end of socket 712. Extending from the back end of the disc 714 (i.e., the surface not attached to bottom part of the socket) is a shaft-shaped handle 718 with a length L that is sufficient to allow a user to firmly grab the shaft and exert axial or radial force onto the socket 712. The extraction tool 710 is typically constructed from a durable materials that can withstand the forces exerted on it by a user / operator. Non- exhaustive examples of such materials include Polyamide-imide (PAI), Polycarbonate (PC), or some other durable polymer, as well durable alloys such as an aluminum- based alloy, etc.

[0152] As additionally shown in FIG. 7A, in various embodiments, the shaft 718 can be hollow and configured to hold an auxiliary leverage tool 740. As will be discussed in greater detail below, the auxiliary leverage tool is configured to apply leverage force on the extraction tool so as to increase adjust the leverage force that is applied to the extraction tool (and thus the frame 222) during the extraction process, thereby making it easier for the user / operator to remove the ion guide sub-assembly. As illustrated in the example of FIG. 7A, the auxiliary leverage tool 740 is stowed within the interior space of the shaft 718, with the auxiliary leverage tool’s circular tip 742 extending from outside the opening of the hollow shaft 718. The circular tip 742 is sized and dimensioned to allow the user to easily grasp and remove the auxiliary tool from its stowed space and deploy it to facilitate extraction of the sub-assembly. Stowing the auxiliary tool 740 within a space defined in the extraction tool allows keeping the two tools together so that both are immediately available when needed to adjust the extraction leverage (thereby avoiding misplacing the auxiliary tool). The auxiliary tool 740 may also be constructed from an appropriate durable material such as a durable polymer, a durable metal alloy, some other durable material, or any combination thereof.

[0153] Turning next to FIG. 7B, a magnified diagram of the example socket 712 of the extraction tool 710 is shown. The socket includes multiple arched sections 730a-c, with each section including an arched rim portion, such as arched rim portions 732a-c attached to the edgesof the interior walls of the arched section 730a-c. Each of the arched rim portion includes a padded layer, such as the padded layer 734 attached to the inner surface of the arched rim portion 732a that faces the opening of the socket 712. The arched padded portions are configured to firmly grasp the outside surfaces of the frame 222, but without causing any physical damage to the frame 222. In various embodiments, some portion, or all of the inner walls defining the inner hollow part of the socket may be covered by padding to reduce the likelihood of damage to the parts of frame 222 that get inserted into the interior hollow space defined by the interior walls of the socket. Similarly, the arched sections 730a-c may be covered, at least in part, with padding material to reduce the likelihood of damage

[0154] With reference next to FIG. 7C, a top view photo of the extraction tool 710 arranged next to the auxiliary leverage tool 740 removed from the interior stow space of the shaft 719 of the extraction tool 710 is shown. As discussed in relation to FIG. 7A, the auxiliary leverage tool includes a circular tip 742 that allows a user to grasp the round tip 742 and pull it out from the interior stow space of the shaft 718 of the extraction tool. Extending from the circular tip 742 is a handle 744 with a substantially flat rectangular shape. While FIG. 7C shows the handle 744 extending integrally from the circular tip 742, in some embodiments the handle 744 and the circular tip 742 may be implemented as separate parts that have been attached to one another. The handle 744 is configured to allow the user to firmly and securely hold the handle 744 during operation of the auxiliary leverage tool 740.

[0155] Pivotably attached to the handle 744 is a stationary member 750 that includes an insertion tip 758 that is configured to be inserted and received in one or more holes disposed on the surface of the casing of the mass spectrometer on which the cavity (that receives the ion guide sub-assembly 200 discussed herein) is located. Upon insertion of the insertion tip 758 within the receiving hole(s) on the casing’s panel, the stationary member 750 remains stationary while the handle 744 of the auxiliary tool 740 pivots (in response to force exerted on the handle by a user) about a pivot pin 762 that secures the handle 744 to the stationary member 760. The pivoting action results in an actuating tip (shown in FIG. 7D) extending from another end of the handle 744 to rotate and engage a surface of the circular disc 714, thus exerting leverage force on the circular disc 714 to increase the leverage force applied to the ion guide sub-assembly (whichat that point is secured within the cavity), thus facilitating the user to remove the ion guide subassembly from within the cavity housing it.

[0156] As further shown in FIG. 7C, the insertion tip 758 extends axially from a cylindrical part 756, which in turn extends from a larger cylindrical part 754. The cylindrical parts 754 and 756 form a telescopic structure. In some embodiments, the cylindrical part 754 may be hollow and configured to receive cylindrical part 756. For example, the larger cylindrical part 756 may stow the smaller cylindrical part 756 when the auxiliary leverage tool 740 is stowed within the interior space of the shaft 718 of the extraction tool 710. In some embodiments, the stationary member 750 may include a further cylindrical part 752 that extends from the cylindrical part 754. The cylindrical parts 754 and 752 may be separated parts that are attached at a ring 753, or the two parts may be two portions of a single integral piece.

[0157] As noted above, the stationary member 750 is pivotably attached to the handle 744. In some embodiments, the cylindrical part 752 extends from a base part 760 of the stationary member 750. The base part 760 may be formed as two parallel plates (not shown in FIG. 7C) with a gap or slot defined between the two plates of the base part 760. Each of the base plates includes a pin hole extending throughout the thickness of each of the plates. The holes of the parallel plates are aligned so that a pivot pin 762 can pass through the two holes. The handle 744 also includes a pin hole at the end of the handle 744 (i.e., the end opposite the circular tip 742). The end portion of the handle 744 is dimensioned and shaped to fit within the gap or slot formed between the two plates of the base part 762. When so fitted, the pin hole at the end of the handle 744 is aligned with the two pin holes and thus the pivot pin 762 can pass through the three holes (namely the pin hole in each of the parallel plates, and the pin hole in the end part of the handle 744 that is fitted in the gap / slot between the two plates). The tightness at which the pivot pin is fastened to the three holes can be adjusted (a nut can be fitted to the other end of the pivot pin to controllab ly adjust the tightness of the pivot pin) so that the handle 744 can pivot about the axis of the pin, and about the longitudinal axis of the stationary member 750, without being too loose.

[0158] FIG. 7D is another photograph showing the extraction tool 710 alongside the auxiliary leverage tool 740, but with the handle 744 of the auxiliary leverage tool 740 havingpivoted to a position in which the longitudinal axis of the handle 744 is perpendicular to the longitudinal axis of the stationary member 750 of the auxiliary leverage tool 740. As further shown in FIG. 7D, the auxiliary leverage tool 740 includes an actuating tip 746 extending from the end of the handle 744 that is opposite the end from which the circular tip 742 extends. The actuating tip 746 is dimensioned and structures such that as the actuating tip 746 is pivotally rotated towards the circular disc 714, when the extraction tool 710 is placed over ion guide subassembly, and the insertion tip 758 of the stationary member 760 is inserted into a receiving hole near the opening of the cavity. The actuating tip 746 engages (contacts) the surface of the circular disc closest to the casing of the MS system. The continued pivotal rotation of the actuating tip 746 exerts an outward force on the extraction tool (i.e., in a direction away from the casing of the MS system), thus providing the leverage needed to supplement the user’s pulling force exerted on the handle of the extraction tool 710. The use of the actuating tip to apply force to the circular disc 714 can increase the magnitude of the outward forces applied to the extraction tool 710 by, for example, a factor of 6 (or more, depending on the dimensions of the auxiliary leverage tool).

[0159] Conversely, after servicing the extracted ion guide sub-assembly, or other parts of the MS system accessible through the vacant cavity of the casing, the auxiliary leverage tool 710 can be used to facilitate re-installation of the ion guide sub-assembly within the cavity. As will be discussed in greater detail below, the extraction tool 710 is placed over the frame of the upstream ion guide of the sub-assembly, and the covered sub-assembly is guided through the cavity (using the various alignment elements to properly align the sub-assembly for axial insertion). If the user is having trouble forcing the sub-assembly all the way down the cavity (into a locking position), the auxiliary leverage tool can be used to exert inward force towards the cavity. The insertion tip 758 of the stationary member 750 is placed into one of several receiving holes near the opening of the cavity. The handle 744 of the auxiliary leverage tool 740 is actuated (before or after the insertion of the insertion pin into a receiving hole) so that the actuating tip 746 is axially located farther than the axial position (relative to the opening of the cavity) of the circular disc 714. The handle 744 can now be pivotally rotated in an inward direction, thus causing the actuating tip 746 to engage the outer surface of the circular disc 714 (i.e., the surface of the disc 714 that is farther away from the opening of the cavity). As a result of contacting the outer surface of the disc 714, inward force is applied to the tool to cause the ion guide sub-assembly tobe pushed farther into the cavity, thus facilitating the advancement of the extraction tool 710 and the ion guide sub-assembly into the cavity (e.g., the cavity 240 shown in FIG. 2B).

[0160] With reference next to FIG. 7E, a photograph of a user using an extractor tool (e.g., the tool 710 depicted in FIGS. 7A-D) with an auxiliary leverage tool (e.g., the tool 740 shown in FIGS. 7C-D) is provided. As shown, the extractor tool 710 is fitted over the frame of the First ion guide (the frame, such as the frame 222 of FIG. 2A, and the electrodes of the First ion guide 220, also of FIG. 2 A, are hidden from view in FIG. 7E). The socket 712 of the extractor tool 710 is dimensioned and shaped so that the walls of the socket (including the arched sections 730a-c and the arched rim portions 732a-c) fit in the space defined between the walls of the cavity holding the ion guide sub-assembly and outer reaches of the frame of the First ion guide can engulf the frame of the First ion guide and grasp the frame structure (the padded materials lining the inside of the socket and / or the arched rim portions can generally prevent any physical damages to the frame. The sensitive upstream end portions of the electrodes of the First ion guide are generally nestled within the interior space of the socket, and do not come into physical contact with the interior walls of the socket.

[0161] In some embodiments, the socket may be in snug contact with the walls of the cavity and the outer reaches of the frame of the first ion guide, in which case the user may be able to extract the ion guide sub-assembly without needing to increase the leverage applied to the extraction tool . However, it may happen that not enough leverage is being exerted on the ion guide sub-assembly, causing the extractor tool to, for example, not being able to remove the ion guide sub-assembly. In that situation, the auxiliary leverage tool 740 may be used to increase the leverage being applied to the extraction tool 710 and the ion guide sub-assembly that is attached to the extraction tool 710.

[0162] The area of the casing of the mass spectrometer near the cavity may include multiple receiving holes that receive the insertion tip 758 to provide a stationary rod-like structure (namely, the stationary member 750 of the auxiliary leverage tool 740) relative to which the handle 744, and the actuating tip 746 extending from the handle, can pivotally rotate. For example, with reference back to the front view diagram of FIG. 2C, showing the ion guide subassembly partially inserted within the cavity of the mass spectrometer, as can be seen, the areanear the cavity includes two receiving holes 290 and 292 that can receive the insertion tip 258 of the auxiliary leverage tool 740.Extraction and re-installation processes

[0163] FIGS. 8A-I illustrate the extraction and reinstallation processes during which the ion guide sub-assembly are removed from the cavity (namely, the cavity 240 illustrated in FIG. 2B) in which they are housed during normal operation of the mass spectrometer system. Thus, with reference to FIG. 8A, a front view diagram of an assembled operation mass spectrometer system 810 is shown. In the figure, an ion source 812 is attached to the mass spectrometer via the curtain plate assembly (not visible in FIG. 8A, but which may be similar to the curtain plate assembly 104 of FIG. 1), followed by an orifice plate (not visible in FIG. 8 A, but which may be similar to the orifice plate assembly 106 of FIG. 1), which is then followed by the securely installed ion guide sub-assembly (also not visible in FIG. 8A) of the MS system 810. As noted above, many different types of ion sources may be used with the MS system 810, so long that the ion source 812 used can be physically coupled to the MS system. In some embodiments, an adapter configured to be attached to the ion source and to be coupled to the upstream entry point to the ion path of the MS system may be required.

[0164] When a user or operator decides that servicing of the MS system is needed (e.g., when it has been observed that performance of the MS has degraded to unacceptable levels), the user, as a first step of the MS system servicing process, shuts down the operation of ion source (possibly letting any on-going processes complete so as to avoid further damage and contamination to the MS system) and removes the ion source 812 from the entry point to the MS system 810’s ion path of the MS system 810, e.g., by unlatching any locks and / or by gently pulling the ion source 812 from the curtain plate to decouple the ion source from any coupling mechanism (including from an adapter, if needed, allowing connection of the ion source to the MS system). FIG. 8B is a diagram of a perspective view of the ion source 812 separated from a casing 811 of the MS system 810. As shown, once the ion source 812 has been separated (decoupled) from the MS system 810, the interface panel 830 that includes the cavity, the curtain plate 834, and an orifice plate (the orifice is not visible in FIG. 8B) covering the opening of the cavity, is exposed. Other than the cavity (in which the ion guide sub-assembly is currently held),the interface panel 830 further includes various ports, including the ports that facilitate the coupling of the ion source to the MS system 810, inlet gas ports to pump gas into needed locations of the ion guide sub-assembly, the receiving holes 290 and 292 (depicted in FIG. 2C) configured to receive the insertion tip 758 of the auxiliary leverage tool 740, etc..

[0165] Having removed (decoupled the ion source), the next step in the process of servicing the ion guide sub-assembly (currently securely held within the cavity) is to remove the curtain plate 834 (which may correspond to the curtain plate 104) shown in FIG. 8B. The curtain plate, which defines the boundary between the atmospheric pressure and the vacuum chambers along the ion path of the MS system 810, can be removed by gently prying the curtain plate 834 from the interface panel 830 to which the curtain plate may be secured. The curtain plate may also be attached, through s separate attachment mechanism(s) to the orifice plate. FIG. 8C is a diagram of a perspective view of the ion source 812 separated from a casing 811 of the MS system 810, and of the orifice plate 836 that has now been exposed (and is accessible to the user / operator) after the removal of the curtain plate 834.

[0166] Next, the orifice plate 836 depicted in FIG. 8C is removed. Here too, removal of the orifice plate 836 can be achieved, for example, by gently prying the orifice plate off the interface panel 830. In some embodiments, the orifice plate 836 may be secured to the interface panel 830 using a circular support structure 838 that mechanically supports and holds the orifice plate 836 in place. The circular support structure 838 may be fitted into depression defined in the interface panel that helps hold the circular support structure (and thus the orifice plate 836) in place. Once the orifice plate 836 has been removed (and the circular support structure 838, if one was used), the ion guide sub-assembly 840 to be extracted is exposed. With reference to FIG. 8D, a diagram of a perspective view of the ion source 812 separated from a casing 811 of the MS system 810, and with an ion guide sub-assembly 840 now exposed (following removal of the orifice plate 836) is shown. FIG. 8D shows the depression 839 in which the support structure 839, holding (in part) the orifice plate 838, was placed. Also shown in FIG. 8D are the upstream end portion of the electrodes of the ion guide sub-assembly 840 that are fitted within the cavity housing the ion guide sub-assembly. It is noted that at this point the electrodes of the upstream ion guide (e.g.„ the First ion guide) are exposed and are at heightened risk of being damaged. Consequently, it is advisable for the user or operator to have the extraction tool ready to be deployed and cover the frame of the upstream ion guide so as to shorten the exposure of theelectrodes to any damage risk. The cavity is bounded by a circumference ring 850 (similar to the circumference ring 250 of FIG. 2C). Situated near the circumference ring 850, on opposite sides of the circumference, are receiving holes 890 and 892 (which are similar to the receiving holes 290 and 292) that are configured to receive the insertion tip 758 of the auxiliary leverage tool 740 (discussed in relation to FIGS. 7C-D).

[0167] With reference next to FIG. 8E, a diagram of a perspective view of the extraction tool 710 (discussed in relation to FIGS. 7A-B) deployed to grasp the ion guide sub-assembly and remove it from the cavity within the casing 811, is shown. With the ion guide sub-assembly 840, currently securely housed within the cavity of the casing 811, and now accessible by the user, the user fits the socket 712 over the frame of the First ion guide of the sub-assembly in the spacing between the walls of the cavity and the upstream portion of the First ion guide of the subassembly. In some embodiments, the diameter of the interior of the extraction tool’s socket 712 may be adjusted to achieve a tighter fit with the frame of the First ion guide. As noted, the socket’s interior space is dimensioned and shaped so that the upstream end portion of the electrodes of the First ion guide are held inside the socket’s interior spacing, but without physically contacting the interior wall of the socket 712 of the extraction tool 710.

[0168] The user may next attempt to pull on the tool 710 (e.g., by grabbing the handle 718) and gently twisting the extraction tool 710 to try and release the ion guide sub-assembly from its secured / locked position within the cavity. If this application of force by the user is sufficient to release the ion guide sub-assembly, the user carefully retracts the ion guide sub-assembly, holding the Second ion guide in his / her hand once the Qjet assembly emerges from within the cavity. If the sub-assembly cannot be withdrawn from the cavity using only the user’s exerted force (e.g., the user / operator cannot overcome tension forces keeping the sub-assembly within the cavity), the leverage applied to the extraction tool 710 or to the ion guide sub-assembly can be increased by, for example, applying leveraging force to the circular disc 714 at the base of the socket 712 of the extraction tool 710 using the auxiliary leverage tool 740 (that is generally stowed within the interior space of the shaft 718 of the tool 710). In FIG. 8E the round tip 742 of the auxiliary leverage tool 710 is shown.

[0169] Accordingly, FIG. 8F is a diagram showing a portion of the interior of the MS system with the casing (such as the casing 811 of FIGS. 8A-E) removed, and further showing theinterface panel 830 that includes the opening of the cavity, with the extraction tool and auxiliary leverage tool deployed to extract the ion guide sub-assembly. As illustrated, the extraction tool has been fitted over the frame 222 of the First ion guide so that the upstream portion of the electrodes of the First ion guide are nestled inside the socket 712 without contacting the interior walls of the socket, or otherwise touching anything else. The auxiliary leverage tool 740 is anchored into the appropriate receiving holes near the opening of the cavity. In the illustrated example of FIG. 8F, the insertion tip 758 of the stationary member 750 is inserted into receiving hole 890 which is generally used to access the attachment mechanism used for holding, or releasing, the orifice plate (such as the orifice plate 836 shown in FIG. 8C). However, other receiving holes such as the hole 892, could have been used instead. With the stationary member 750 now firmly secured to the interfacing panel 830 through the insertion tip 758, and the extraction tool 710 attached to the upstream frame of the ion guide sub-assembly still inside the cavity, the handle 744 of the auxiliary leverage tool is pivotally rotated (counter-clockwise in the example of FIG. 8F) about the axis defined by the pivot pin 762 of the auxiliary leverage tool 740. As the handle 744 is pivotally rotated in a counter-clockwise direction, causing the actuating tip 746 on the handle 744 to engage the interior surface of the circular disc 714 of the extraction tool 710. As a result of the contact between the actuating tip 746 and the interior surface of the circular disc 714, leverage force is exerted on the extraction tool to push the extraction tool outwards from the cavity. This leverage force may be used concomitantly with pulling force applied by the user to the shaft-shaped handle 718 of the extraction tool (as noted, the leverage force may be 6 times, or more, stronger than the pulling force applied by the user to the handle 718).

[0170] FIG. 8G illustrates the axial removal of the ion guide sub-assembly 840 from the cavity (marked as cavity 802) of the casing 811 by the extraction tool 710. The ion guide subassembly 840 includes at least two ion guides (in this example, the Djet and the Second ion guides) remaining mechanically coupled to each other (at the interfacing ion lens IQ00), and retaining the casing 811 intact with all the MS system components located downstream of the ion guide sub-assembly 840 (i.e., prior to its removal) being undisturbed (e.g., without requiring unwiring of electrical wires / cables, or otherwise removing any component within the interior of the casing 811).

[0171] With reference next to FIG. 8G, a diagram of a perspective view of the ion guide 840 removed from the casing 811 is shown. Having removed the ion guide 840, the extraction tool 710 can be removed (e.g., by holding the frame of the Second ion guide with protective equipment such as specialized gloves that will not create static electricity, and pulling gently on shaft 718 of the tool 710 to remove the socket 712). The Second ion guide (marked as 230 in FIG. 2A) is separated (in the manner discussed in relation to FIG. 2A) from the interfacing ion lens assembly 228 and the First ion guide sub-assembly (that includes the Djet electrodes and the frame 222). With the Second ion guide sub-assembly separated, one side of the ion lens electrodes are now accessible to the user, who can proceed to clean the electrodes, or to otherwise perform maintenance and servicing operation on any accessible part of the Djet and Qjet assemblies, the interfacing ions lens assembly, or other components accessible through the cavity 802. If the other side of the ion lens electrodes needs to be serviced, the interfacing ion lens assembly is separated from the First ion guide sub-assembly (as described in relation to FIG. 2A) to expose the side of the ion lens electrode that was facing the frame of the First ion guide sub-assembly.

[0172] After completing the servicing and maintenance of the ion guide sub-assembly or of other components accessible through the cavity 802, the various sections / components of the ion guide sub-assembly are attached to each other using the various alignment elements discussed above in relation to FIGS. 2A-C, 3, 4, and 5. With the ion guide sub-assembly now assembled as a single unit, the sub-assembly can be fitted into the cavity 802. Due to the high risk of damage to the electrodes of the upstream ion guide of the sub-assembly (e.g., the First ion guide), in some embodiments, the extraction tool 710 can be used to also hold the sub-assembly (fitting the socket over the upstream section of the frame of the First ion guide sub-assembly). To facilitate alignment of the sub-assembly with components disposed within the casing 811, the ion guide sub-assembly can be radially rotated (before commencing its advancement within the cavity, or even after the downstream section have been placed inside the cavity and started advancing down the cavity) to align the insertion key unit 225 shown in FIG. 2A with a sliding bar section of the walls of the cavity (or alternatively with a groove / channel defined in the interior walls of the cavity). When the insertion key unit 225 reaches the sliding bar placed in an interior wall section of the cavity and starts displacing it (or alternatively, reaches a channel defined in the interior walls of the cavity, and fits through it), the sub-assembly has achieved rough alignmentwith the cavity, and the insertion of the sub-assembly can be performed as a blind insertion, with occasional minor adjustments in the radial orientation of the sub-assembly as necessitated to align other alignment members with their receiving members (e.g., aligning the locator pin 229 with the recess 272 defined on the insulating plate 270).

[0173] If the user inserting the sub-assembly back into the cavity is having difficulties advancing or locking the sub-assembly into place (to mate some of the various insertion alignment elements with corresponding receiving elements), the auxiliary leverage tool 740 that was used to facilitate extraction of the ion guide sub-assembly (as discussed in relation to FIG. 8F) can be used to facilitate insertion of the sub-assembly into a placement / locking position within the cavity. FIG. 81 is a diagram showing a portion of the interior of the MS system with the casing removed, and further showing the extraction tool and auxiliary leverage tool deployed to insert the ion guide sub-assembly. As illustrated, the extraction tool has been fitted over the frame 222 (not shown in the figure) of the First ion guide so that the upstream portion of the electrodes of the First ion guide are nestled inside the socket 712 without contacting the interior walls of the socket. Similar to the configuration in FIG. 8F, the auxiliary leverage tool 740 is anchored into the appropriate receiving holes near the opening of the cavity (in the illustrated example of FIG. 81, the insertion tip 758 of the stationary member 750 is inserted into receiving hole 890, but another receiving hole, such as the hole 892, shown in FIG. 8D, could have been used instead). With the stationary member 750 now firmly secured to the interfacing panel 830 through the insertion tip 758, and the extraction tool 710 attached to the upstream frame of the ion guide sub-assembly partly placed into the cavity, the handle 744 of the auxiliary leverage tool is pivotally rotated (clockwise in the example of FIG. 81) about the axis defined by the pivot pin 762 of the auxiliary leverage tool 740. As the handle 744 is pivotally rotated in a clockwise direction, it causes the actuating tip 746 on the handle 744 to engage the exterior surface 715 of the circular disc 714 of the extraction tool. Note that the handle 744 of the auxiliary leverage tool 740 may need to be rotated, prior to the insertion of the insertion tip 758 into the receiving hole, into a radial position in which the actuating tip 746 is axially located farther out than the circular disc 714 (similar to the configuration shown in FIG. 81). Otherwise, if the handle 744 is not rotated a priori, the circular disc 714 may hinder the movement of the handle to a radial position where the actuating tip 746 can engage the outer surface 715 of the circular disc 714.

[0174] As a result of the contact between the actuating tip 746 and the exterior surface 715 of the circular disc 714, leverage force is exerted on the extraction tool to axially push the extraction tool inwards into the cavity. This leverage force may be used concomitantly with pushing force applied by the user to the shaft-shaped handle 718 of the extraction tool. As noted, the leverage force may be six (6) times, or more, stronger than the pushing force applied by the user to the handle 718 of the extraction tool 710.

[0175] Further details regarding the extraction, servicing, and re-installation processes are next discussed with reference to FIG. 9, providing a flowchart of a procedure 900 for servicing a mass spectrometry (MS) system. The procedure 900 includes accessing 910 a removable ion guide sub-assembly disposed within a cavity defined by a casing (e.g., the casing 811 shown in FIGS. 8A-G) of the MS system, the ion guide sub-assembly including at least two mechanically coupled ion guides each defining a separate chamber at different pressures when engaged with the casing. In some embodiments, accessing the removable ion guide sub-assembly may include removing cavity port components located approximately at an opening of the cavity. The cavity port components may include a curtain plate (such as the curtain plate 834 illustrated in FIG. 8B) and an orifice plate (such as the orifice plate 836 of FIG. 8C) located upstream of the ion guide sub-assembly when engaging the casing.

[0176] With continued reference to FIG. 9, the procedure 900 further includes attaching 920 an extraction tool to a frame of an upstream ion guide of the ion guide sub-assembly, with the frame enclosing a first plurality of electrodes of the upstream ion guide of the ion guide subassembly, and axially actuating 930 the extraction tool to axially remove the ion guide subassembly from the casing with the at least two ion guides remaining mechanically coupled to each other, and retaining the casing upon removal of the sub-assembly from the casing.

[0177] In various examples, axially actuating the extraction tool to axially remove the ion guide sub-assembly, and retaining the casing, may include axially actuating the extraction tool to axially remove the ion guide sub-assembly such that upon removal of the ion guide subassembly, structural integrity of all remaining MS system components and structures located downstream of the ion guide sub-assembly remain intact and undisturbed. The extraction tool may include a socket with an open end, and a handle attached to a base of the socket, which attaches the extraction tool to the upstream frame of the ion guide sub-assembly including fittingthe socket, through the open end of the socket, on a frame of the upstream ion guide of the ion guide sub-assembly that encloses electrodes of the upstream ion guide. Interior walls of the socket may define an interior space, and fitting the socket on the frame of the upstream ion guide may include receiving a plurality of electrodes of the upstream ion guide, with the plurality of electrodes being enclosed by the frame, within the interior space of the socket without the plurality of electrodes touching the interior walls of the socket.

[0178] In some embodiments, axially actuating the extraction tool to axially remove the ion guide sub-assembly from the casing may include axially actuating the extraction tool to axially remove the ion guide sub-assembly from the casing may include applying, by an auxiliary leverage tool, axial leverage force to the extraction tool In some examples, applying the axial leverage force may include pivotally rotating a handle section of the auxiliary leverage tool to cause an actuating tip at one end of the handle section to engage a circular disc located at a particular axial location on a handle section of the extraction tool. In various examples, applying the leverage may include inserting an insertion tip of a stationary member of the auxiliary leverage tool to make one part of the auxiliary leverage tool stationary to allow the other part of the tool (namely, the handle and its actuating tip) to pivot about a non-moving point.

[0179] In various examples, the procedure 900 may further include servicing one or more of, for example, the removed ion guide sub-assembly and / or components and structures of the MS system accessible through the cavity after removal of the ion guide sub-assembly. Servicing the removed ion guide sub-assembly may include separating at least one of the ion guide of the ion guide sub-assembly to expose an ion lens assembly attached to another ion guide of the subassembly, the ions lens assembly comprising an insulating plate and ion lens electrodes held by the insulating plate, and cleaning the ion lens electrodes held by an insulating plate. In some embodiments, the procedure 900 may further include aligning alignment elements provided on the ion guide sub-assembly with corresponding receiving alignment structures within the cavity, and blindly inserting the removed ion guide sub-assembly back into the cavity upon aligning the alignment elements with the corresponding receiving alignment structures. Aligning the alignment elements with the corresponding receiving alignment structures may include aligning a key insertion unit positioned on a frame of the upstream ion guide with one of, for example a displaceable bar positioned in a channel defined in the interior walls of the cavity, or the channel defined in the interior walls of the cavity.

[0180] While various embodiments have been illustrated and described in detail in the drawings and foregoing description, such illustration and description are to be considered illustrative or exemplary and not restrictive; embodiments of the present disclosure are not limited to the disclosed embodiments. Other variations to the disclosed embodiments can be understood and effected by those skilled in the art in practicing embodiments of the present disclosure, from a study of the drawings, the disclosure, and the appended claims.

[0181] In the claims, the word “comprising” does not exclude other elements or steps, and the indefinite article “a” or “an” does not exclude a plurality. A single processor or other processing unit may fulfill the functions of several items recited in the claims. The mere fact that certain measures are recited in mutually different dependent claims does not indicate that a combination of these measured cannot be used to advantage. Any reference signs in the claims should not be construed as limiting the scope.

[0182] Those having ordinary skill in the art will appreciate that various changes can be made to the above embodiments without departing from the scope of the present teachings.

Claims

WHAT IS CLAIMED IS:

1. A mass spectrometry (MS) system comprising: a casing defining a cavity; a removable ion guide sub-assembly configured to be disposed within the cavity and including at least two mechanically coupled ion guides each defining a separate chamber at different pressures when engaged with the casing, wherein the removable ion guide subassembly includes one or more insertion alignment elements to rotationally and / or angularly align the ion guide assembly for insertion into the cavity; and one or more receiving alignment elements disposed in the cavity and configured to receive a corresponding one of the one or more insertion alignment elements; wherein the ion guide sub-assembly is configured to be axially removable from the casing with the at least two ion guides remaining mechanically coupled to each other and retaining the casing upon removal of the ion-guide sub-assembly from the casing.

2. The mass spectrometry of Claim 1 , wherein upon removal of cavity port components located, approximately at an opening of the cavity, and the ion guide sub-assembly, structural integrity of all remaining MS system components and structures located inside the cavity remain intact and undisturbed.

3. The MS system of Claim 1, wherein the cavity port components include a curtain plate and an orifice plate located upstream of the ion guide sub-assembly when the ion guide subassembly is inside the cavity.

4. The MS system of any one of Claims 1 to 3, wherein the at least two ion guides include a first ion guide, positioned upstream of a second ion guide, with the first ion guide maintained at a first pressure that is less than 10 Torr and comprises a first plurality of electrodes, and wherein the second ion guide is maintained at a second pressure of less than 4 Torr and comprises a second plurality of electrodes.

5. The MS system of Claim 4, wherein the first plurality of electrodes of the first ion guide comprises a first multipole arrangement of electrodes, and the second plurality of electrodes of the second ion guide comprises a second multipole arrangement of electrodes.

6. The MS system of Claim 4, wherein the first ion guide comprises a first frame supporting the first plurality of electrodes, and the second ion guide comprises a second frame supporting the second plurality of electrodes.

7. The MS system of Claim 6, wherein the first frame comprises a first collar including at least one alignment element and the second frame comprises a second collar including at least one alignment opening for removably engaging with the at least one alignment element of the first frame so as to rotationally and / or angularly align the first and the second ion guides.

8. The MS system of Claim 7 where the at least one alignment element includes an insertion key unit configured to engage and displace a displaceable bar disposed on a circumferential wall of the cavity defining the opening of the cavity or to be received in a channel defined in the circumferential wall, to facilitate blind insertion of the ion guide subassembly into the cavity.

9. The MS system of Claim 7, further comprising an electrically insulating plate to support and locate an ion lens relative to the first and second ion guides.

10. The MS system of Claim 9, wherein said electrically insulating plate includes at least one opening through which an alignment element of the first frame can pass to be received by an opening on the second collar of the second frame.

11. The MS system of Claim 10, wherein the ion lens assembly is fixedly attached to the insulating plate such that when assembled the orifice of the ion lens is aligned with the ion guides.

12. The MS system of Claim 6, wherein the first frame of the first ion guide and the second frame of the second ion guide are coupled to each other at an interfacing ion lens assembly comprising at least one electrode forming an electrode lens.

13. The MS system of Claim 12, wherein the second frame of the second ion guide encloses the second plurality of electrodes, and wherein the second frame is releasably fastened to the first frame with a fastening mechanism such that upon release of the fastening mechanism the second ion guide is removed from the sub-assembly to allow access to the electrode lens assembly14. The MS system of Claim 12, wherein the first frame and the second frame sandwich the interfacing ion lens assembly to provide mechanical connectivity between the first frame and the second frame and electrical connectivity between the interfacing ion lens assembly and the first frame.

15. The MS system of Claim 12, wherein the interfacing ion lens assembly further comprises an insulating plate to fixedly support the interfacing ion lens.

16. The MS system of claim 15, wherein the insulating plate is implemented as a printed circuit board (PCB) with an opening to receive the multiple electrodes of the ion lens, the insulating plate further comprises conductive traces circuitry disposed on one or more sides of the PCB, the conductive traces configured to deliver electrical current to electrodes of at least one ion guide arranged in the ion guide sub-assembly17. The MS system of claim 16, further comprising: at least one gasket axially positioned near the ion lens, and configured to form two vacuum chambers with different pressure levels on either side of the ion lens; wherein the at least one gasket is further used to facilitate alignment of the ion guide subassembly and components of the MS system housed within the casing.

18. The MS system of Claim 17, further comprising conductive pins inserted through holes in the insulating plate located around a perimeter of an opening in the PCB to receive downstream end of the first ion guide, each of the pins configured to electrically connect to a respective one of the first plurality of electrodes of the first ion guide.

19. The MS system of Claim 17, wherein one or more of the first frame enclosing the first plurality of electrodes and the second frame enclosing the second plurality of electrodes further comprise: at least one alignment PCB pin fittable through at least one complementary alignment hole defined on the PCB to implement radial alignment between one of the first ion guide or the second ion guide and the PCB; at least one ion guide alignment pin fittable through a complementary alignment hole defined on one of the first frame and the second frame to implement radial alignment between the first ion guide and the second ion guide; and at least one locator pin extending from one or more of the first frame or the second frame, the at least one locator pin configured to be received in a recess defined in a component disposed in the cavity to facilitate alignment of the ion guide sub-assembly within the cavity.

20. The MS system of claim 19, wherein the first frame enclosing the first plurality of electrodes further comprises: at least one locator pin fittable into a receiving slot provided in the cavity of the casing, the at least one locator pin configured to facilitate blind insertion of the sub-assembly into a locked position within the receiving slot to implement radial alignment between the subassembly and the casing.

21. The MS system of Claim 4, wherein the sub-assembly is axially removable from the cavity using an extraction tool that is fitted over an upstream portion of the first ion guide.

22. The MS system of Claim 21, wherein the extraction tool comprises an elongated hollow shaft with an interior space to receive an upstream frame portion of the first ion guide, theextraction tool being configured to grasp the upstream frame portion of the first ion guide while avoiding contact with the first plurality of electrodes.

23. The MS system of Claim 4, further comprising a wire-free electrical interface between the second ion guide and the cavity, the wire-free electrical interface being electrically connectable via rigid electrical connectors to the second plurality of electrodes.

24. The MS system of Claim 22, wherein the rigid electrical connectors comprise conductive pins, wherein the electrical interface comprises: a printed circuit board (PCB) in electrical communication with at least a radio frequency voltage source, and the conductive pins inserted through holes in the PCB located around a perimeter of an opening in the PCB to receive the downstream end of the second ion guide, the pins configured to electrically connect to respective ones of the second plurality of electrodes of the second ion guide.

25. A method for servicing a mass spectrometry (MS) system, the method comprising: accessing a removable ion guide sub-assembly disposed within a cavity defined by a casing of the MS system, the ion guide sub-assembly including at least two mechanically coupled ion guides each defining a separate chamber at different pressures when engaged with the casing, wherein the removable ion guide sub-assembly includes one or more insertion alignment elements to rotationally and / or angularly align the ion guide assembly for insertion into the cavity, and wherein the cavity includes one or more receiving alignment elements disposed in the cavity and configured to receive a corresponding one of the one or more insertion alignment elements; grasping a frame of an upstream ion guide of the ion guide sub-assembly, the frame enclosing a first plurality of electrodes of the upstream ion guide of the ion guide sub-assembly; and axially extracting the ion guide sub-assembly from the casing with the at least two ion guides of the ion guide sub-assembly remaining mechanically coupled to each other, and retaining the casing upon removal of the sub-assembly from the casing.

26. The method of Claim 25, wherein grasping the frame of the upstream ion guide comprises attaching an extraction tool to the frame of the upstream ion guide of the ion guide sub-assembly; and wherein axially extracting the ion guide sub-assembly comprises axially actuating the extraction tool to axially remove the ion guide sub-assembly from the casing.

27. The method of Claim 25, wherein axially extracting the ion guide sub-assembly from the casing comprises: axially extracting the ion guide sub-assembly from the casing such that upon removal of the ion guide sub-assembly, structural integrity of all remaining MS system components and structures located in the casing remain intact and undisturbed.

28. The method of Claim 25, wherein accessing the removable ion guide sub-assembly disposed within a cavity comprises: removing cavity port components located approximately at an opening of the cavity.

29. The method of Claim 28, wherein the cavity port components include a curtain plate and an orifice plate located upstream of the ion guide sub-assembly when engaging the casing.

30. The method of Claim 25, further comprising: servicing one or more of: the removed ion guide sub-assembly, or components and structures of the MS system accessible through the cavity after removal of the ion guide subassembly.

31. The method of Claim 30, wherein servicing the removed ion guide sub-assembly comprises: separating at least one ion guide of the ion guide sub-assembly to expose an ion lens assembly attached to another ion guide of the ion guide sub-assembly, the ions lens assembly comprising an insulating plate and ion lens electrodes held by the insulating plate; and cleaning the ion lens electrodes held by an insulating plate.

32. The method of any one of Claims 25 to 31, further comprising: aligning alignment elements provided on the ion guide sub-assembly with corresponding receiving alignment structures within the cavity; and blindly inserting the removed ion guide sub-assembly back into the cavity upon aligning the alignment elements with the corresponding receiving alignment structures.

33. A modular ion guide sub-assembly insertable into a mass spectrometry (MS) system, the modular ion guide sub-assembly comprising: a first ion guide comprising a first frame and a first plurality of electrodes supported by said first frame; a second ion guide comprising a second frame and a second plurality of electrodes supported by the second frame; and an alignment mechanism coupled to the first and the second frame, the alignment mechanism including one or more insertion alignment elements to rotationally and / or angularly align the ion guide assembly for insertion into the cavity, the one or more insertion elements configured to be received by one or more receiving alignment elements disposed in a cavity defined in a casing of the MS system; wherein said first and said second ion guides are removably coupled to one another to define a single unit when mechanically coupled to each other, and wherein said alignment mechanism facilitates blind insertion, and subsequent removal, of the mechanically coupled first ion guide and the second ion guide into and out of a cavity.

34. The modular ion guide sub-assembly of Claim 33, wherein the first ion guide is positioned upstream of the second ion guide, wherein when the modular ion guide sub-assembly is inserted into the cavity the first ion guide is maintained at a first pressure that is less than 10 Torr, and the second ion guide is maintained at a second pressure of less than 4 Torr.

35. The modular ion guide sub-assembly of Claim 34, wherein the first plurality of electrodes of the first ion guide comprises a first multipole arrangement of electrodes, and thesecond plurality of electrodes of the second ion guide comprises a second multipole arrangement of electrodes.

36. The modular ion guide sub-assembly of any one of Claims 33 to 35, wherein the first frame comprises a first collar including at least one alignment element and the second frame comprises a second collar including at least one alignment opening for removably engaging with the at least one alignment element of the first frame so as to align the first and the second ion guides.

37. The modular ion guide sub-assembly of any one of Claims 33 to 35, wherein the first ion guide comprises an insertion key unit configured to be received in a channel defined on a circumferential wall of the cavity to facilitate blind insertion of the modular ion guide subassembly into the cavity.

38. The modular ion guide sub-assembly of any one of Claims 33 to 35, further comprising an electrically insulating plate to support and locate an ion lens relative to the first and second ion guides.

39. The modular ion guide sub-assembly of Claim 38, wherein said electrically insulating plate includes at least one opening through which an alignment element of the first frame can pass to be received by an opening on the second collar of the second frame.

40. The modular ion guide sub-assembly of Claim 38, wherein the insulating plate is implemented as a printed circuit board (PCB) with an opening to receive the multiple electrodes of the ion lens, the insulating plate further comprises conductive traces circuitry disposed on one or more sides of the PCB, the conductive traces configured to deliver electrical current to electrodes of at least one ion guide of the modular ion guide sub-assembly.

41. The modular ion guide sub-assembly of any one of Claims 33 to 35, wherein the alignment mechanism includes at least one of: an axial alignment mechanism, and a radial alignment mechanism.

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