Method and apparatus for determining focal spot size of x-ray source, and electronic device and storage medium

Abstract

A method and apparatus for determining the focal spot size of an X-ray source, and an electronic device and a storage medium. The method comprises: acquiring a test profile curve graph corresponding to a line pair phantom test image (S110); acquiring an ideal profile curve graph corresponding to a line pair phantom image (S120); on the basis of the test profile curve graph corresponding to the line pair phantom test image and the ideal profile curve graph corresponding to the line pair phantom image, performing deconvolution processing to obtain a target convolution kernel function curve (S130); and on the basis of the target convolution kernel function curve, determining the focal spot size of an X-ray source (S140).

Description

Method and device for determining X-ray source focal point size, electronic equipment and storage medium

[0001] The present application claims priority to the Chinese patent application No. 202410890515.7, filed on July 4, 2024, with the Chinese Patent Office, the content of which is incorporated herein by reference in its entirety. TECHNICAL FIELD

[0002] The present application relates to the technical field of resolution testing, for example, to a method and device for determining X-ray source focal point size, electronic equipment and storage medium. BACKGROUND

[0003] Currently, a line pair card is often used to test the focal point or resolution of an X-ray source.

[0004] In the line pair card testing method of the related art, the focal point size is mainly determined according to the observation of the tester on the pattern, which has subjectivity and contingency. SUMMARY

[0005] The present application provides a method and device for determining X-ray source focal point size, electronic equipment and storage medium to improve the accuracy of the focal point size.

[0006] According to an aspect of the present application, a method for determining X-ray source focal point size is provided, comprising:

[0007] obtaining a test profile curve corresponding to a line pair card test image;

[0008] obtaining an ideal profile curve corresponding to a line pair card image;

[0009] performing deconvolution processing based on the test profile curve corresponding to the line pair card test image and the ideal profile curve corresponding to the line pair card image to obtain a target convolution kernel function curve;

[0010] determining the X-ray source focal point size based on the target convolution kernel function curve.

[0011] According to another aspect of the present application, a device for determining X-ray source focal point size is provided, comprising:

[0012] a test profile curve obtaining module configured to obtain a test profile curve corresponding to a line pair card test image;

[0013] an ideal profile curve obtaining module configured to obtain an ideal profile curve corresponding to a line pair card image;

[0014] a curve deconvolution processing module configured to perform deconvolution processing based on the test profile curve corresponding to the line pair card test image and the ideal profile curve corresponding to the line pair card image to obtain a target convolution kernel function curve.

[0015] an X-ray source focal spot size determination module configured to determine an X-ray source focal spot size based on the target kernel function curve.

[0016] According to another aspect of the present application, an electronic device is provided, the electronic device comprising:

[0017] at least one processor;

[0018] and a memory connected to the at least one processor in communication;

[0019] wherein the memory stores a computer program executable by the at least one processor, and the computer program is executed by the at least one processor to enable the at least one processor to perform the X-ray source focal spot size determination method according to any one of the embodiments of the present application.

[0020] According to another aspect of the present application, a computer readable storage medium is provided, the computer readable storage medium stores computer instructions for enabling a processor to perform the X-ray source focal spot size determination method according to any one of the embodiments of the present application when the processor executes the computer instructions. BRIEF DESCRIPTION OF DRAWINGS

[0021] The drawings needed to be used in the following embodiment description will be introduced as follows, the drawings in the following description are the drawings of some related embodiments of the present application, and other drawings can also be obtained by those drawings without paying creative labor for those skilled in the art.

[0022] FIG. 1 is a flow chart of an X-ray source focal spot size determination method according to an embodiment of the present application;

[0023] FIG. 2 is a schematic diagram of a line pair card test image according to an embodiment of the present application;

[0024] FIG. 3 is a schematic diagram of a test profile curve according to an embodiment of the present application;

[0025] FIG. 4 is a schematic diagram of a line pair card image according to an embodiment of the present application;

[0026] FIG. 5 is a schematic diagram of an ideal profile curve according to an embodiment of the present application;

[0027] FIG. 6 is a schematic diagram of a line pair pattern convolution according to an embodiment of the present application;

[0028] FIG. 7 is a flow chart of an X-ray source focal spot size determination method according to another embodiment of the present application;

[0029] FIG. 8 is a structural schematic diagram of an X-ray source focal point size determination device according to an embodiment of the present application;

[0030] FIG. 9 is a structural schematic diagram of an electronic device implementing an X-ray source focal point size determination method according to an embodiment of the present application. DETAILED DESCRIPTION

[0031] The embodiments of the present application will be described below with reference to the drawings. The embodiments described are some of the embodiments of the present application. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present application without creative work shall fall within the scope of the present application.

[0032] The terms "first", "second", etc. in the specification and claims of the present application and the above-described drawings are used to distinguish similar objects, and do not necessarily indicate a specific order or sequence. It should be understood that the data thus used can be interchanged under appropriate circumstances, so that the embodiments of the present application described herein can be implemented in an order other than that illustrated or described herein. In addition, the terms "include" and "have" and any variations thereof are intended to cover non-exclusive inclusion, for example, a process, method, system, product or device that includes a series of steps or units shown in the embodiments of the present application can also include other processes, methods, systems, products and devices that are not clearly listed or other steps or units inherent to these processes, methods, systems, products or devices. The acquisition, storage, use, processing, etc. of data in the technical solutions of the present application comply with the relevant provisions of national laws and regulations.

[0033] Embodiment One

[0034] FIG. 1 is a flowchart of an X-ray source focal point size determination method according to an embodiment of the present application. The embodiment can be applicable to automatic determination of the X-ray source focal point size. The method can be executed by an X-ray source focal point size determination device, which can be implemented in the form of hardware and / or software, and can be configured in a computer terminal. As shown in FIG. 1, the method comprises:

[0035] S110, acquiring a test profile curve corresponding to the line pair card test image.

[0036] In this embodiment, the line pair card test image refers to an image collected by a focus test device. The focus test device can include an X-ray source, a line pair card, and a detector, etc. The X-ray source, the line pair card, and the detector are sequentially and parallelly arranged and installed, that is, the X-ray emitted by the X-ray source can form a line pair card test image on the detector after being irradiated to the line pair card. The test profile curve refers to a curve representing the change of the gray value in the line pair card test image with the distance or the pixel, which can be simulated according to the gray values of all pixels in the line pair card test image. For example, FIG. 2 is a schematic diagram of a line pair card test image provided by an embodiment of the present application; and FIG. 3 is a schematic diagram of a test profile curve provided by an embodiment of the present application.

[0037] Optionally, the test profile curve corresponding to the line pair card test image is obtained, including: obtaining the gray values of all pixels in the line pair card test image; and generating the test profile curve corresponding to the line pair card test image based on the gray values of all pixels in the line pair card test image.

[0038] For example, the gray values of each row of pixels in the line pair card test image are determined; the multi-row average is performed based on the gray values of each row of pixels in the line pair card test image, and the test profile curve corresponding to the line pair card test image is generated based on the multi-row average result, where the horizontal axis of the test profile curve is the pixel, and the vertical axis of the test profile curve is the gray value. For example, FIG. 2 is a schematic diagram of a line pair card test image provided by an embodiment of the present application; and FIG. 3 is a schematic diagram of a test profile curve provided by an embodiment of the present application, where Distance / pixels represents the distance / pixel, and Gray Value represents the gray value.

[0039] In S120, an ideal profile curve corresponding to the line pair card image is obtained.

[0040] The line pair card image refers to an ideal line pair image of the line pair card on the detector. The ideal profile curve refers to a curve representing the change of the gray value in the line pair card image with the distance or the pixel, which can be simulated according to the pixel size of the detector, the number of line pairs, the line width, and the line spacing, etc.

[0041] Optionally, the ideal profile curve corresponding to the line pair card image is obtained, including: obtaining a pixel size of the detector, a number of line pairs, a line width, and a line spacing; and generating the ideal profile curve corresponding to the line pair card image based on the pixel size of the detector, the number of line pairs, the line width, and the line spacing, where a horizontal axis of the ideal profile curve is a pixel, and a vertical axis of the ideal profile curve is a gray value. For example, FIG. 4 is a schematic diagram of a line pair card image according to an embodiment of the present application; and FIG. 5 is a schematic diagram of an ideal profile curve according to an embodiment of the present application, where the pixel size can be used to determine a scaling ratio of the ideal profile curve, the number of line pairs can be used to determine a number of peaks in the ideal profile curve, the line width can be used to determine a width of the peaks, and the line spacing can be used to determine a distance between the peaks.

[0042] In S130, deconvolution processing is performed based on the test profile curve corresponding to the line pair card test image and the ideal profile curve corresponding to the line pair card image, to obtain a target kernel function curve.

[0043] The target kernel function curve refers to an optimal kernel function curve representing a focal point image.

[0044] For example, FIG. 6 is a schematic diagram of line pair pattern convolution according to an embodiment of the present application. In X-ray detection imaging, there is a relationship that convolution of a line pair card image and a focal point image is equal to a line pair card test image. Based on the above relationship, it can be known that convolution of the ideal profile curve and the kernel function curve is equal to the test profile curve. Therefore, by performing deconvolution processing on the test profile curve corresponding to the line pair card test image and the ideal profile curve corresponding to the line pair card image, the target kernel function curve can be obtained.

[0045] In S140, the X-ray source focal point size is determined based on the target kernel function curve.

[0046] The X-ray source focal point size can be used to evaluate a resolution level of the X-ray source.

[0047] For example, Gaussian fitting can be performed on the target kernel function curve to obtain a Gaussian fitting curve corresponding to the target kernel function curve, and then the X-ray source focal point size is determined according to the Gaussian fitting curve corresponding to the target kernel function curve.

[0048] According to the embodiments of the present application, the target kernel function curve is determined by using the deconvolution method, and then the X-ray source focal point size is determined according to the target kernel function curve, so that the focal point size is automatically determined, the focal point size determination is reliable, and the accuracy of the focal point size is improved.

[0049] Embodiment Two

[0050] FIG. 7 is a flowchart of an X-ray source focal point size determination method according to an embodiment of the present application. The method of this embodiment can be combined with any of the optional solutions of the X-ray source focal point size determination methods provided in the above embodiments. The X-ray source focal point size determination method provided in this embodiment is based on the above embodiments. Optionally, the determination of the X-ray source focal point size based on the target convolution kernel function curve includes: performing Gaussian fitting on the target convolution kernel function curve to obtain a Gaussian fitting curve corresponding to the target convolution kernel function curve; and determining the X-ray source focal point size based on the Gaussian fitting curve corresponding to the target convolution kernel function curve.

[0051] As shown in FIG. 7, the method includes the following steps.

[0052] S210: Obtain a test profile curve diagram corresponding to a line pair card test image.

[0053] S220: Obtain an ideal profile curve diagram corresponding to a line pair card image.

[0054] S230: Perform deconvolution processing based on the test profile curve diagram corresponding to the line pair card test image and the ideal profile curve diagram corresponding to the line pair card image to obtain a target convolution kernel function curve.

[0055] S240: Perform Gaussian fitting on the target convolution kernel function curve to obtain a Gaussian fitting curve corresponding to the target convolution kernel function curve.

[0056] S250: Determine the X-ray source focal point size based on the Gaussian fitting curve corresponding to the target convolution kernel function curve.

[0057] For example, the determination of the X-ray source focal point size based on the Gaussian fitting curve corresponding to the target convolution kernel function curve includes: taking a half-height width of the Gaussian fitting curve corresponding to the target convolution kernel function curve as the X-ray source focal point size.

[0058] The half-height width refers to a full width at half maximum (FWHM) of the Gaussian fitting curve.

[0059] Optionally, before the test profile curve diagram corresponding to the line pair card test image is obtained, the X-ray source focal point size determination method further includes: importing an initial line pair card test image; and in response to a framing operation of a user on the initial line pair card test image, obtaining the line pair card test image.

[0060] The initial line pair card test image refers to a line pair card image projected on a detector plane, and the line pair card test image is a framed region of the initial line pair card test image by the user.

[0061] The embodiment of the present application determines the X-ray source focal point size based on the Gaussian fitting curve corresponding to the target convolution kernel function curve, realizes the automatic determination of the focal point size, makes the determination of the focal point size have a basis, and improves the accuracy of the focal point size.

[0062] Embodiment three

[0063] FIG. 8 is a structural schematic diagram of an X-ray source focal point size determination device provided by the embodiment three of the present application. As shown in FIG. 8, the device comprises:

[0064] The test profile curve graph acquisition module 310 is configured to acquire a test profile curve graph corresponding to the wire-on-card test image.

[0065] The ideal profile curve graph acquisition module 320 is configured to acquire an ideal profile curve graph corresponding to the wire-on-card image.

[0066] The curve deconvolution processing module 330 is configured to perform deconvolution processing based on the test profile curve graph corresponding to the wire-on-card test image and the ideal profile curve graph corresponding to the wire-on-card image, to obtain a target convolution kernel function curve.

[0067] The X-ray source focal point size determination module 340 is configured to determine the X-ray source focal point size based on the target convolution kernel function curve.

[0068] The embodiment of the present application realizes the determination of the target convolution kernel function curve by the deconvolution method, then determines the X-ray source focal point size according to the target convolution kernel function curve, realizes the automatic determination of the focal point size, makes the determination of the focal point size have a basis, and improves the accuracy of the focal point size.

[0069] In some optional embodiments, the test profile curve graph acquisition module 310 comprises:

[0070] The pixel gray value acquisition unit is configured to acquire the gray value of all pixels in the wire-on-card test image.

[0071] The test profile curve graph generation unit is configured to generate the test profile curve graph corresponding to the wire-on-card test image based on the gray value of all pixels in the wire-on-card test image.

[0072] In some optional embodiments, the test profile curve graph generation unit is configured to:

[0073] Determine the gray value of each row of pixels in the wire-on-card test image.

[0074] performing multi-line averaging on the gray scale values of each row of pixels in the line-pair card test image, and generating a test profile curve corresponding to the line-pair card test image based on the multi-line averaging result, wherein the horizontal axis of the test profile curve is a pixel, and the vertical axis of the test profile curve is a gray scale value.

[0075] In some optional embodiments, the ideal profile curve obtaining module 320 is configured to:

[0076] obtain the pixel size of the detector, the number of line pairs, the line width, and the line spacing;

[0077] generate an ideal profile curve corresponding to the line-pair card image based on the pixel size of the detector, the number of line pairs, the line width, and the line spacing, wherein the horizontal axis of the ideal profile curve is a pixel, and the vertical axis of the ideal profile curve is a gray scale value.

[0078] In some optional embodiments, the X-ray source focal point size determining module 340 includes:

[0079] a Gaussian fitting unit configured to perform Gaussian fitting on the target convolution kernel function curve to obtain a Gaussian fitting curve corresponding to the target convolution kernel function curve;

[0080] a focal point size extraction unit configured to determine the X-ray source focal point size based on the Gaussian fitting curve corresponding to the target convolution kernel function curve.

[0081] In some optional embodiments, the focal point size extraction unit is configured to:

[0082] take the half-height width of the Gaussian fitting curve corresponding to the target convolution kernel function curve as the X-ray source focal point size.

[0083] In some optional embodiments, the X-ray source focal point size determining apparatus includes:

[0084] an initial line-pair card test image importing module configured to import an initial line-pair card test image before the test profile curve corresponding to the line-pair card test image is obtained;

[0085] a line-pair card test image framing module configured to obtain a line-pair card test image in response to a framing operation of a user on the initial line-pair card test image.

[0086] The X-ray source focal point size determining apparatus provided in the embodiments of the present application can perform the X-ray source focal point size determining method provided in any of the embodiments of the present application, and has the corresponding function modules and beneficial effects of performing the method.

[0087] Embodiment Four

[0088] FIG. 9 shows a structural schematic diagram of an electronic device 10 that can be used to implement embodiments of the present application. The electronic device is used to represent various forms of digital computers, such as laptops, desktops, workstations, personal digital assistants, servers, blade servers, mainframes, and other appropriate computers. The electronic device can also represent various forms of mobile devices, such as personal digital assistants, cellular telephones, smartphones, wearable devices (e.g., headsets, glasses, watches, etc.), and other similar computing devices. The components shown here, their connections and relationships, and their functions, are meant to be examples only.

[0089] As shown in FIG. 9, the electronic device 10 includes at least one processor 11, and a memory, such as a Read Only Memory (ROM) 12, a Random Access Memory (RAM) 13, etc., which is communicatively connected to the at least one processor 11, wherein the memory stores computer programs that can be executed by the at least one processor. The processor 11 can perform various appropriate actions and processes according to the computer programs stored in the Read Only Memory (ROM) 12 or loaded from the storage unit 18 into the Random Access Memory (RAM) 13. In the RAM 13, various programs and data required for the operation of the electronic device 10 can also be stored. The processor 11, the ROM 12, and the RAM 13 are connected to each other through a bus 14. An Input / Output (I / O) interface 15 is also connected to the bus 14.

[0090] Various components in the electronic device 10 are connected to the I / O interface 15, including an input unit 16, such as a keyboard, a mouse, etc.; an output unit 17, such as various types of displays, a speaker, etc.; a storage unit 18, such as a magnetic disk, an optical disk, etc.; and a communication unit 19, such as a network card, a modem, a wireless communication transceiver, etc. The communication unit 19 allows the electronic device 10 to exchange information / data with other devices through a computer network, such as the Internet, and / or various telecommunication networks.

[0091] The processor 11 can be various general and / or special-purpose processing components with processing and computing capabilities. Some examples of the processor 11 can include a central processing unit (CPU), a graphic processing unit (GPU), various special-purpose artificial intelligence (AI) computing chips, various processors running machine learning model algorithms, a digital signal processor (DSP), and any appropriate processor, controller, microcontroller, etc. The processor 11 performs various methods and processes described above, such as the X-ray source focal spot size determination method, which includes:

[0092] obtaining a test profile curve graph corresponding to the line pair card test image;

[0093] obtaining an ideal profile curve graph corresponding to the line pair card image;

[0094] performing deconvolution processing based on the test profile curve graph corresponding to the line pair card test image and the ideal profile curve graph corresponding to the line pair card image to obtain a target convolution kernel function curve;

[0095] determining the X-ray source focal spot size based on the target convolution kernel function curve.

[0096] In some embodiments, the X-ray source focal spot size determination method can be implemented as a computer program tangibly embodied in a computer readable storage medium, such as the storage unit 18. In some embodiments, part or all of the computer program can be loaded and / or installed onto the electronic device 10 via the ROM 12 and / or the communication unit 19. When the computer program is loaded onto the RAM 13 and executed by the processor 11, one or more steps of the X-ray source focal spot size determination method described above can be performed. Alternatively, in other embodiments, the processor 11 can be configured to perform the X-ray source focal spot size determination method by any other appropriate means, such as by means of firmware.

[0097] The various embodiments of the systems and techniques described above can be implemented in digital electronic circuitry, integrated circuitry, a Field-Programmable Gate Array (FPGA), an Application Specific Integrated Circuit (ASIC), an Application Specific Standard Parts (ASSP), a System on Chip (SOC), a Complex Programmable Logic Device (CPLD), computer hardware, firmware, software, and / or combinations thereof. These various embodiments can include implementation in one or more computer programs that are executable and / or interpretable on a programmable system including at least one programmable processor, which can be special or general purpose, coupled to receive data and instructions from, and to transmit data and instructions to, a storage system, at least one input device, and at least one output device.

[0098] Computer programs implementing methods of the present application can be written in any combination of one or more programming languages. These computer programs can be provided to a processor of a general purpose computer, special purpose computer, or other programmable data processing apparatus to produce a machine, such that the computer program, when executed by the processor, implements the functions / operations specified in the flow diagrams and / or block diagrams. The computer program can run on machines of the same architecture or on different architectures than those described without departing from the scope of the application. The computer program can be provided using any

[0099] In the context of this application, a computer readable storage medium can be a tangible medium that can contain or store a computer program for use by or in connection with an instruction execution system, apparatus, or device. A computer readable storage medium can be an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any suitable combination of the foregoing. Alternatively, a computer readable storage medium can be a machine readable signal medium. Examples of a machine readable signal medium can include an electrical connection (based on one or more wires), a portable computer diskette, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM), a flash memory, a fiber optic device, a compact disc-read only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.

[0100] To provide for interaction with a user, the systems and techniques described here can be implemented on an electronic device having a display device (e.g., a Cathode Ray Tube (CRT), a Liquid Crystal Display (LCD), or a monitor) for displaying information to the user and a keyboard and a pointing device (e.g., a mouse or a trackball) by which the user can provide input to the electronic device. Other kinds of devices can be used to provide for interaction with a user as well; for example, feedback provided to the user can be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user can be received in any form, including acoustic, speech, or tactile input.

[0101] The systems and techniques described here can be implemented in a computing system that includes a back end component (e.g., as a data server), or that includes a middleware component (e.g., an application server), or that includes a front end component (e.g., a user computer having a graphical user interface or a Web browser through which a user can interact with an implementation of the systems and techniques described here), or any combination of such back end, middleware, or front end components. The components of the system can be interconnected by any form or medium of digital data communication (e.g., a communication network). Examples of communication networks include a Local Area Network (LAN), a Wide Area Network (WAN), a blockchain network, and the Internet.

[0102] The computing system can include clients and servers. A client and server are generally remote from each other and typically interact through a communication network. The relationship of client and server arises by virtue of computer programs running on the respective computers and having a client-server relationship to each other. The server can be a cloud server, also known as a cloud computing server or cloud host, which is a host product in the cloud computing service system, to solve the defects of large management difficulty and weak business scalability in traditional physical host and virtual private server (VPS) services.

[0103] It should be understood that the steps shown in the above forms of flow can be reordered, added or deleted. For example, the steps described in the present application can be executed in parallel, sequentially or in different order, as long as the desired results of the technical solutions of the present application can be achieved.

Claims

1. A method for determining a focal spot size of an X-ray source, comprising: obtaining a test profile curve corresponding to a line-on-card test image; obtaining an ideal profile curve corresponding to a line-on-card image; performing deconvolution processing based on the test profile curve corresponding to the line-on-card test image and the ideal profile curve corresponding to the line-on-card image to obtain a target kernel function curve; determining the focal spot size of the X-ray source based on the target kernel function curve.

2. The method of claim 1, wherein, The obtaining of the test profile curve corresponding to the line-on-card test image comprises: obtaining gray values of all pixels in the line-on-card test image; generating the test profile curve corresponding to the line-on-card test image based on the gray values of all pixels in the line-on-card test image.

3. The method of claim 2, wherein, The generating of the test profile curve corresponding to the line-on-card test image based on the gray values of all pixels in the line-on-card test image comprises: determining the gray values of each row of pixels in the line-on-card test image; performing multi-row averaging based on the gray values of each row of pixels in the line-on-card test image, and generating the test profile curve corresponding to the line-on-card test image based on the multi-row averaging result, wherein the horizontal axis of the test profile curve is pixel, and the vertical axis of the test profile curve is gray value.

4. The method of claim 1, wherein, The obtaining of the ideal profile curve corresponding to the line-on-card image comprises: obtaining a pixel size of a detector, a number of line pairs, a line width and a line spacing; generating the ideal profile curve corresponding to the line-on-card image based on the pixel size of the detector, the number of line pairs, the line width and the line spacing, wherein the horizontal axis of the ideal profile curve is pixel, and the vertical axis of the ideal profile curve is gray value.

5. The method of claim 1, wherein, The determining of the focal spot size of the X-ray source based on the target kernel function curve comprises: performing Gaussian fitting on the target kernel function curve to obtain a Gaussian fitting curve corresponding to the target kernel function curve; determining the focal spot size of the X-ray source based on the Gaussian fitting curve corresponding to the target kernel function curve.

6. The method of claim 5, wherein, The determining of the focal spot size of the X-ray source based on the Gaussian fitting curve corresponding to the target kernel function curve comprises: taking a half-height width of the Gaussian fitting curve corresponding to the target kernel function curve as the focal spot size of the X-ray source. 7.The method of any one of claims 1-6, before the obtaining of the test profile curve corresponding to the line-on-card test image, the method further comprises: importing an initial line-on-card test image; in response to a box selection operation of a user on the initial line-on-card test image, obtaining the line-on-card test image. 8.An apparatus for determining a focal spot size of an X-ray source, comprising: a test profile curve obtaining module configured to obtain a test profile curve corresponding to a line-on-card test image; an ideal profile curve obtaining module configured to obtain an ideal profile curve corresponding to a line-on-card image; a curve deconvolution processing module configured to perform deconvolution processing based on the test profile curve corresponding to the line-on-card test image and the ideal profile curve corresponding to the line-on-card image to obtain a target kernel function curve; a focal spot size determining module configured to determine the focal spot size of the X-ray source based on the target kernel function curve.

9. An electronic device comprising: at least one processor; and a memory communicatively connected to the at least one processor; wherein the memory stores a computer program executable by the at least one processor, the computer program being executed by the at least one processor to enable the at least one processor to perform the method of any one of claims 1-7.

10. A computer readable storage medium storing computer instructions for causing a processor to implement the method of any one of claims 1-7 when executed.

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