Optoelectronic unit for use with an automatic test equipment system

Abstract

An optoelectronic unit (6) for use with an automatic test equipment system (1), the automatic test equipment system (1) comprising a plurality of channel cards (10a-n), wherein the optoelectronic unit (6) comprises at least one optical circuit (6a) and a plurality of optoelectronic transducers (13a, 13b, 14), wherein the optoelectronic unit (6) is adapted to connect with contacts of the automatic test equipment system (1), and wherein the optoelectronic unit (6) is configured to transfer signals originating from at least one first channel card (10a) of the plurality of channel cards (10a-n) to at least one second channel card (10b) of the plurality of channel cards (10a-n) or back to the first channel card (10a) and / or from the at least one second channel card (10b) to the at least one first channel card (10a) or back to the second channel card (10b).

Description

[0001] August 9, 2024

[0002] ADVANTEST CORPORATION M / ADVA-020-PC PA / TY / ml

[0003] OPTOELECTRONIC UNIT FOR USE WITH AN AUTOMATIC TEST EQUIPMENT SYSTEM

[0004] Description

[0005] The present invention relates to an optoelectronic unit for use with an automatic test equipment (ATE) system and to an automatic test equipment system (ATE).

[0006] An automatic test equipment (ATE) system is an apparatus that performs tests on electronic devices, known as devices under test (DUT), using automation to perform measurements and evaluate test results.

[0007] An ATE system usually comprises a controller and a test head hosting a plurality of channel cards. The channel cards are connected to a device under test (DUT) interface being connected to a device under test (DUT) board, which hosts the DUT.

[0008] Typically, the channel cards transmit an electrical signal as a stimulus to the DUT for testing the DUT. The DUT responds to the stimulus with a signal being transmitted to the channel card. The signal is acquired and analyzed to compute a result of the DUT.

[0009] However, during the prototyping of a channel card and / or during manufacturing of a channel card, the channel card itself has to be tested by an automatic test equipment system. For this purpose, test load boards a re provided, which are connected to a first channel card and a second channel card, or from connections on a first / second channel card back to other connections on the same board, via the DUT board. In such a scenario the first channel card is configured to test the second channel card, or elements of itself. In the following, for ease of description, the testing of different channel cards will be described: this explicitly 2 M / ADVA-020-PC also includes the possibility of the channel cards and system self-testing elements of only one channel card.

[0010] The test boards create an electrical connection between the first channel card and the second channel card to transmit the electrical signals. However, if at all, these purely electrical test boards are only slightly reconfigurable. Hence, if the second channel card to be tested changes due to reconfiguration, the test load board might not be usable anymore and a new test load board has to be designed. Moreover, the electrical signals might undergo degrading effects like EMI or other electrical coupling phenomenon.

[0011] Hence, it is an object of the present invention to provide a unit for use with an automatic test equipment system that provides an increased adaptability to differently designed channel cards.

[0012] The problem is solved by an appropriately configured optoelectronic unit for use with an automatic test system (ATE).

[0013] According to the invention, an optoelectronic unit for use with an automatic test equipment system is provided, wherein the automatic test equipment system comprises a plurality of channel cards, wherein at least one first channel card of the plurality of channel cards and at least one second channel card of the plurality of channel cards are provided . The optoelectronic unit comprises at least one optical circuit and a plurality of optoelectronic transducers, being preferably connected to the at least one optical circuit and is adapted to connect with contacts of the automatic test equipment system, e.g. contacts of a DUT board or of a Device under test (DUT) interface of the automatic test equipment system. According to the invention, the optoelectronic unit is configured to transfer signals originating from the at least one first channel card to the at least one second channel card and / or from the at least one second channel card to the at least one first channel card.

[0014] Preferably, the first channel card is a channel card different, particularly a channel card physically different, to the second channel card. In particular, the first channel card and the second channel card may be of different species of channel cards, e.g. digital channel card, or analogue channel card or radio frequency (RF) channel card, or the first channel card and the second channel card may be of the same species of channel card. 3 M / ADVA-020-PC

[0015] Due to the optoelectronic transducers, signals originating e.g. from the first channel card may be transferred or converted from an electrical domain into an optical domain so that the signals are transferred in the optical domain through the optical circuit. Due to the transfer of signals in the optical domain, signal degradation due to interferences is reduced. The optoelectronic transducers then convert the signals from the optical domain back into the electrical domain to transmit those to the second channel card . Particularly, the at least one optical circuit manipulates and / or transmits and / or reflects and / or attenuates the optical signals. Moreover, signals are transferred between channel cards, i.e. at least one first channel card and at least one second channel card, so that the channel cards may be tested.

[0016] In a further embodiment, at least one optoelectronic transducer of the plurality of optoelectronic transducers is assigned to the first channel card and / or at least one optoelectronic transducer of the plurality of optoelectronic transducers is assigned to the second channel card. Being assigned to a channel card means that the at least one optoelectronic transducer is configured to receive signals from and / or transmit signals to the channel card, to which the optoelectronic transducer is assigned. Hence, the at least one optoelectronic transducer assigned to the first channel card is configured to receive signals from and / or transmit signals to the first channel card. Additionally, the at least one optoelectronic transducer assigned to the second channel card is configured to receive signals from and / or transmit signals to the second channel card. In particular, the signals are transmitted from the channel cards via the DUT board and / or the DUT interface to the assigned channel cards and vice versa.

[0017] In a further embodiment, the plurality of optoelectronic transducers comprise at least one first optoelectronic transducer being configured to convert signals from the electrical domain to the optical domain and / or at least one second optoelectronic transducer configured to convert signals from the optical domain into the electrical domain. In particular, the optoelectronic unit comprises only first optoelectronic transducers and / or second optoelectronic transducers .

[0018] Particularly, the plurality of optoelectronic transducers comprise bidirectional transducers. Hence, the optoelectronic transducers can convert the signal form the electrical domain to the optical domain and vice versa so that a single transducer for each transducing direction is not necessary. Hence, the amount of 4 M / ADVA-020-PC optoelectronic transducers may be reduced. In particular, the optoelectronic unit comprises only bidirectional transducers.

[0019] In an embodiment the at least one optoelectronic transducer comprises a photodiode to convert signals form the optical domain to electrical domain. Thus, signals in the optical domain can be transferred into the electrical domain based on their optical properties.

[0020] In a further embodiment, the at least one optoelectronic transducer comprises a laser diode and / or a light-emitting diode to convert signals from the electrical domain to the optical domain. Hence, signals in the electrical domain can be transferred into signals in the optical domains having a specific optical properties, e.g. a specific wavelength.

[0021] In an alternative embodiment, a light source is provided being connected to the at least one optoelectronic transducer comprises. Accordingly, the transducers may not comprise laser diodes or light-emitting diodes, as the light is provided from a light source being preferably a light source of the automatic test equipment system or a light source being remote to the automatic test equipment system. The light emitted by the light source is preferably transported by optical fibres form the light source to the respective optoelectronic transducers. Due to the light source, the size of the transducers can be reduced, as no laser diode or light-emitting diode is necessary.

[0022] The optoelectronic unit performs in particular signal processing of the signals in the optical domain and / or the electrical domain. Hence, the signals transmitted through optical circuit may be further adapted, so they do not interfere with each other. Signal processing of signals in the optical domain particularly includes amplification and / or attenuation and / or switching and / or modulation and / or filtering. The optoelectronic unit preferably performs signal processing in the electrical domain comprising analogue signal processing and / or digital signal processing. The signal may particularly be operated and / or controlled by a software on a controller of the automatic test equipment system and / or by the optoelectronic unit. The optoelectronic unit preferably comprises a processing unit for the signal processing of the signal in the optical domain and / or the electrical domain is preferably and / or for transducing the signal. 5 M / ADVA-020-PC

[0023] In an embodiment, the plurality of optoelectronic transducers are at least partially interconnected by the optoelectronic unit, particularly by the at least one optical circuit, in particular via optical switches and / or optical cables, e.g. optical fibres. At least partially interconnected means that at least a part of the plurality of optoelectronic transducers is interconnected by the optoelectronic unit. Hence, signals can be transferred between each of the optoelectronic transducers, particularly via interconnected optical fibres. Hence, signals can be transmitted to each of the channel cards via the optoelectronic transducers assigned to the respective channel cards. Hence, the optoelectronic unit can be used in a variety of different settings.

[0024] The optoelectronic unit, in particular the at least one optical circuit, preferably comprises a plurality of optical fibres and / or a plurality of optical switches. Signals in the optical domain are particularly transmitted via the optical cables, e.g. optical fibres, between the plurality of optoelectronic transducers. Hence, each optoelectronic transducer may be connected to a specific optical fibre, wherein the optical fibres are preferably interconnected by the optical switches. The switches may preferably be used to distribute or to route the signals in the optical domain through the optical fibres corresponding to the optoelectronic transducer there the signal shall be transmitted to. Alternatively, at plurality of optoelectronic transducers may be connected to a matrix of optical fibres.

[0025] In a preferred embodiment, the at least one optical circuit is reconfigurable. In particular, the optical circuit is reconfigurable by software and / or by reconfiguring or reconnecting the interconnections between the optical cables, e.g. optical fibres. Hence, the optical circuit can be adapted to test individual and / or redesigned channel cards and / or to specific components of the automatic test equipment system which is to be tested.

[0026] The problem is additionally solved by an appropriately configured optoelectronic unit for use with an automatic test system (ATE).

[0027] According to the invention, an automatic test equipment (ATE) system is provided comprising a plurality of channel cards, a device under test (DUT) board and an optoelectronic unit as described above. At least one first channel card of the plurality of channel cards and at least one second channel card of the plurality of channel cards are provided, wherein preferably, the automatic test equipment system, particularly the at least one first channel card, is configured to test the at 6 M / ADVA-020-PC least one second channel card. Hence, particularly the at least one second channel card is a channel card to be tested and the at least one first channel card is the channel card testing the second channel card. Hence, the automatic test equipment system is particularly configured to test itself and / or the at least one second channel card and / or a component of the automatic test equipment system.

[0028] In a first step of operation, the automatic test equipment system is configured to transmit a first signal from the at least one first channel card to the at least one second channel card via the optoelectronic unit. In particular, the first signal is transmitted from the at least one first channel card via a device under test (DUT) interface and / or the DUT board to the optoelectronic unit. The optoelectronic unit transmits the first signal via the DUT board and / or the DUT interface to the at least one second channel card. In particular, the second channel card receives the first signal transmitted by the first channel card.

[0029] In an alternative or additional step of operation, the automatic test equipment system is configured to transmit a second signal from the second channel card to the first channel card via the optoelectronic unit. In particular, the second signal is transmitted from the at least one second channel card via the DUT board and / or the DUT interface to the optoelectronic unit. The optoelectronic unit transmits the second signal via the DUT board and / or the DUT interface to the at least one first channel card. In particular, the first channel card receives the second signal transmitted by the second channel card.

[0030] In a next step, the second signal received by the at least one first channel card in response to the first signal is analysed and / or evaluated by the a utomatic test equipment system. In particular, the automatic test equipment system compares an expected second signal from the at least one second channel card in response to the first signal with the received second signal.

[0031] Hence, the automatic test equipment system can test whether the received second signal corresponds to an expected second signal. Thus, the automatic test equipment system can test "itself" by testing its components. By use of the optoelectronic unit, the first and the second signal may be transferred or converted from an electrical domain into an optical domain so that signal degradation due to interferences is reduced. Hence, an improved testing of the automatic test equipment system is provided. Particularly, the at least one optical 7 M / ADVA-020-PC circuit manipulates and / or transmits and / or reflects and / or attenuates the optical signals.

[0032] In an embodiment, the at least one second channel card transmits the second signal in response to the first signal. The second signal may thus be an echo of the second channel card to the reception of the first signal and / or a response to the first signal.

[0033] Preferably, the second channel card receives the first signal and performs certain operations and / or procedures and / or processing based on the first signal. Hence, the first signal particularly instructs the second channel card to perform certain operations and / or procedures and / or processing. In particular, the second signal transmitted by the second channel card contains results and / or information about the performed operations and / or procedures and / or processing. The information and / or the results transmitted in by the second signal are preferably evaluated and / or analysed by the automatic test equipment system for testing the second channel card.

[0034] In a preferred embodiment, the optoelectronic unit is an integral part of the DUT board. Hence, a complex connection or wiring between the DUT board and the optoelectronic unit can be avoided. In an alternative embodiment, the optoelectronic unit is, particularly removable, attached to the DUT board.

[0035] Preferably, the automatic test equipment system is further configured to transmit the first signal from the first channel card to the optoelectronic unit in electrical domain, transfer the first electrical from the electrical domain into an optical domain by means of the at least one optoelectronic transducer assigned to the first channel card, transmit the first signal in optical domain via the at least one optical circuit to the at least one optical transducer assigned to the second channel card, and convert the first signal from the optical domain into the electrical domain by means of the at least one optoelectronic transducer assigned to the second channel card. Particularly, the first signal is then transmitted to the at least one second channel card.

[0036] In a further embodiment, the automatic test equipment system is further configured to transmit the second signal from the second channel card to the optoelectronic unit in electrical domain, transfer the second signal from the electrical domain into an optical domain by means of the at least one 8 M / ADVA-020-PC optoelectronic transducer assigned to the second channel card, transmit the second signal in optical domain via the at least one optical circuit to the at least one optoelectronic transducer assigned to the first channel card, and convert the second signal from the optical domain into the electrical domain by means of the at least one optoelectronic transducer assigned to the first channel card. Particularly, the second signal is then transmitted to the at least one first channel card.

[0037] By converting the first signal and / or the second signal from the electrical domain to the optical domain, the first and / or second signal may be easily transferred via the optical circuit. Particularly, signals in the optical domain can be managed easily because of minimal or negligible degrading effects, e.g. electromagnetic interference and / or transmission line coupling phenomenon and / or other Electrical Coupling phenomenon.

[0038] In a further embodiment, the automatic test equipment system further comprises a controller. The controller is preferably configured to control the automatic test equipment system and / or the signal processing of the optoelectronic unit and / or the signal routing of the optoelectronic unit. Hence, the controller may control the test of the channel cards and / or the analyzation of the test results.

[0039] The second signal which is received by the first channel card and / or the first signal being received by the second channel card is preferably transmitted to the controller. The controller is in particular configured to analyse and / or evaluate the second signal.

[0040] The signals, in particular the first signal and / or the second signal, contains data and / or pieces of data.

[0041] In an embodiment, the automatic test equipment system includes a test head, wherein the test head comprises the plurality of channel cards. Hence, the at least one first channel card and the at least one second channel card are preferably located on the same test head. Hence, the first signal is particularly transmitted from the at least one first channel card on the test head via the optoelectronic unit to the at least one second channel card on the same test head. The same applies vice versa for the second signal. 9 M / ADVA-020-PC

[0042] The above and further features and advantages of the invention will become more readily apparent from the following detailed description of preferred embodiments of the invention with reference to the accompanying drawings, in which like reference signs designate like features, and in which

[0043] Fig. 1 is a schematic diagram of an automatic test equipment system;

[0044] Fig. 2 is a schematic diagram of the automatic test equipment system of

[0045] Fig. 1 comprising a first embodiment of the optoelectronic;

[0046] Fig. 3a is a schematic diagram of an optoelectronic transducer unit of the first embodiment of the optoelectronic unit of Fig. 2;

[0047] Fig. 3b is a schematic diagram of an optoelectronic transducer unit of the first embodiment of the optoelectronic unit of Fig. 2

[0048] Fig. 4 is a schematic diagram of the automatic test equipment system of Fig. 1 comprising a second embodiment of the of the optoelectronic unit; and

[0049] Fig. 5 is a schematic diagram of an optoelectronic transducer unit of the second embodiment of the optoelectronic unit of Fig. 4.

[0050] Fig. 1 depicts an automatic test equipment system 1 comprising a controller 2 and a test head 3. The controller 2 is connected to the test head 3 via a data link 5. The test head 3 typically comprises a plurality of channel cards lOa-lOn, which are interconnected by and to the data link 5. The automatic test equipment system 1 further comprises a device under test (DUT) interface 9 connected to the channel cards lOa-lOn.

[0051] The DUT interface 9 is connected to a device under test (DUT) board 8 which is connected to an optoelectronic unit 6. The optoelectronic unit 6 is configured and configurable to transmit or route signals from one channel card to another channel card. Alternatively, the optoelectronic unit 6 may be an integral part of the DUT board 8.

[0052] Referring to Fig 1 as an example, a first channel card 10a of the plurality of channel cards lOa-lOn transmits a first signal 11 to a second channel card 10b of 10 M / ADVA-020-PC the plurality of channel cards lOa-lOn, typically but not necessarily being a channel card different to the first channel card 10a. The first signal 11 is transmitted from the first channel card 10a via the DUT interface 9 and the DUT board 8 to the optoelectronic unit 6. The optoelectronic unit 6 converts or transfers the first signal 11 from an electrical domain 11a to an optical domain lib. After passing through the optical unit 6, the first signal 11 is converted from the optical domain lib to the electrical domain 11a. The optoelectronic unit 6 then transmits the first signal 11 to the second channel card 10b via the DUT board 8 and the DUT interface 9.

[0053] The second channel card 10b receives the first signal 11 and performs certain operations and / or procedures and / or processing based on the information obtained from the first signal 11. The results of these operations and / or procedures and / or processing may then be transmitted back to the first channel card 10a as a second signal 12. The second signal 12 is transmitted via the DUT interface 9 and the DUT board 8 to the optoelectronic unit 6 converting the second signal 12 from an electrical domain 12a to an optical domain 12b. After passing through the optoelectronic unit 6, the second signal 12 is converted from the optical domain 12b to the electrical domain and is transmitted to the first channel card via the DUT board 8 and the DUT interface 9.

[0054] The first channel card 10a receives the second signal 12. The second signal 12 is then evaluated and / or analyzed by the controller 2 and / or the first channel card 10a. Hence, it may be analyzed whether the received second signal 12 corresponds to an expected response of the second channel card 10b.

[0055] Hence, the automatic test equipment system 1 of the invention may be used for testing the second channel card 10b. Hence, the second channel card 10b can be tested prior to its use for testing devices under test.

[0056] The use of the optoelectronic unit 6 provides the effect that it can be easily reconfigured and / or adapted to different second channel cards 10b to be tested. In particular, it can be more readily reconfigured than a purely electrical test load board of the known art. Furthermore, the first and the second signals 11, 12 are transferred into the optical domain and are then transmitted through the optoelectronic unit 6 via an optical circuit 6a so that minimal or negligible degrading effects like e.g. electromagnetic interference and / or transmission line coupling phenomenon and / or other electrical coupling phenomenon, occur. 11 M / ADVA-020-PC

[0057] Fig. 2 discloses a first embodiment of the optoelectronic unit 6 of the automatic test equipment system 1. The optoelectronic unit 6 comprises an optical circuit unit 6a and a processing unit 6b. The processing unit 6b contains a plurality of first optoelectronic transducers 13a for converting a signal from the electrical domain into the optical domain. Moreover, the processing unit 6b contains a plurality of second optoelectronic transducers 13b for converting a signal from the optical domain into the electrical domain. At least one first optoelectronic transducer 13a and at least one second optoelectronic transducer 13b are assigned to the first channel card 10a via the DUT board 8 and via the DUT interface 9. Moreover, at least one first optoelectronic transducer 13a and at least one second optoelectronic transducer 13b are assigned to the second channel card 10b via the DUT board 8 and via the DUT interface 9. The optical circuit 6a comprises, preferably, a plurality of optical fibres and / or other suitable optical connections to route first and the second signal 11, 12 in the optical domain form from the associated optoelectronic transducer assigned to the first channel card 10a to the associated optoelectronic transducer assigned to the second channel card 10b and vice versa. By use of the optical fibres and / or other suitable optical connections, the optical circuit 6a can be easily modified, by redirection of the optical fibres and / or the other suitable optical connections. Hence, the optical circuit can be adapted to a variety of different channel cards lOa-n and / or automatic test equipment systems 1.

[0058] By way of example and as shown in Fig. 2, the first channel card 10a transmits the first signal 11 in the electrical domain 11a via the DUT interface 9 and the DUT board 8 to the first optoelectronic transducer 13a assigned to the first channel card 10a. As shown in Fig. 3a, the first optoelectronic transducer 13a comprises a signal processing unit 18 conducting analogue signal processing and / or digital signal processing of the first signal 11 in the electrical domain 11a. A laser diode 15 or a light-emitting diode is connected to the output of the signal processing unit 18 and is provided for converting the first signal 11 from the electrical domain 11a into the optical domain lib. The first optoelectronic transducer 13a further comprises an optical switch 17 to route the first signal 11 now existing in the optical domain to a certain fibre of the optical circuit 6a so that this may be transferred through the optoelectronic unit 6 and then through to ultimately be connected to the second channel card 10b or back to the first channel card 10a. Hence, the signal 11 may be routed to the correct channel card 10a, 10b. 12 M / ADVA-020-PC

[0059] Referring back to Fig. 2, the first signal 11 in the optical domain lib is transmitted via the optical circuit 6a to a second optoelectronic transducer 13b assigned to the second channel card 10b via the DUT board 8 and the DUT interface 9. During the transmission of the signal through the optoelectronic unit 6, the optical circuit 6a might perform signal processing, e.g. amplification and / or attenuation and / or switching and / or modulation and / or filtering, in the optical domain lib equivalent of the first signal 11.

[0060] The second optoelectronic transducer 13b (Fig. 3b) comprises a switch 17, a photodiode 16 and signal processing unit 18 each analogous to the first optoelectronic transducer 13a. The switch 17 of the second optoelectronic transducer 13b may be configured to connect the second optoelectronic transducer 13b with a certain optical fibre being ultimately assigned through to the first channel card 10a via the DUT board 8 and the DUT interface 9.

[0061] Therefore, the signal 11 may be routed to the second optoelectronic transducer 13b which is ultimately assigned through to the second channel card 10b. The first signal 11 in the optical domain lib received by the second optoelectronic transducer 13b is converted back into the electrical domain 11a, by the photodiode 16, and may be further processed in the processing unit 18. The converted signal now corresponds in its original electrical domain equivalent of the first signal 11 as transmitted by the first channel card 10a.

[0062] Referring back to Fig. 2, the first signal 11 in the electrical domain 11a is transmitted via the DUT board 8 and the DUT interface 9 to the second channel card 10b or back to the first channel card 10a.

[0063] In response to receipt of the first signal 11, the second channel card 10b, for example, may transmit the second signal 12 in the electrical domain 12a via the DUT interface 9 and the DUT board 8 to a first optoelectronic transducer 13a assigned to the second channel card 10b. The first optoelectronic transducer 13a may conduct signal processing in the signal processing unit 18 and convert the second signal 12 from the electrical domain 12a into the optical domain 12b.

[0064] The second signal 12 now existing in the optical domain 12b is routed via the optical switch 17 and the optoelectronic circuit 6a to the second optoelectronic transducer 13a assigned, ultimately, to the first channel card 10a via the DUT board 8 and the DUT interface 9 as delineated above with reference to the first signal 11. The second optoelectronic transducer 13b receives the signal 12 in its 13 M / ADVA-020-PC optical domain 12b via the switch 17 and converts the second signal 12 form its optical domain 12b back to the original electrical domain 12a as delineated above with reference to the first signal 11.

[0065] After signal processing by the signal processing unit 18, the second signal 12 is transmitted in its electrical domain form 12a to the first channel card 10a via the DUT board 8 and the DUT interface 9. The first channel card 10a preferably transmits the second signal 12 to the controller 2. The second signal 12 is then evaluated and / or analysed by the first channel card 10a and / or the controller 2.

[0066] According to a second embodiment of the optoelectronic unit 6 as shown in Fig. 4, the processing unit 6b comprises a bidirectional optoelectronic transducer 14, wherein at least one bidirectional optoelectronic transducer 14 is assigned to the first channel card 10a and to the second channel card 10b via the DUT board 8 and via the DUT interface 9.

[0067] As depicted in Fig. 5, the bidirectional optoelectronic transducer 14 comprises a processing unit 18 to perform signal processing of the signal in the electrical domain 11a, 12a and an optical switch 17 as delineated above with reference to the first and the second optoelectronic transducer 13a, 13b.

[0068] The bidirectional optoelectronic transducer 14 additionally comprises a bidirectional transducer 19 to convert the signal 11, 12 from the electrical domain 11a, 12a to the optical domain lib, 12b and vice versa. The bidirectional transducer 19 may comprise a photodiode and a laser diode, preferably assigned in parallel. Hence, compared to the first embodiment of the optoelectronic unit 6, the number of signal processing units 18 and / or optical switches 17 can be reduced.

[0069] According to the second embodiment of the optoelectronic unit 6 and by way of example, the first signal is converted from the electrical domain 11a to the optical domain lib via the bidirectional optoelectronic transducer 14 assigned to the first channel card 10a via the DUT board 8 and the DUT interface 9. The first signal 11 is then transmitted in the optical domain li b to the bidirectional optoelectronic transducer 14 assigned to the second channel card 10b via the DUT board 8 and the DUT interface 9, which converts the first signal 11 from the optical domain lib back into the electrical domain 11a. The first signal 11 is then 14 M / ADVA-020-PC transmitted to the second channel card 10b via the DUT board 8 and the DUT interface 9.

[0070] The second channel card 10b may also transmit a second signal 12, either in response to the first signal 11 or by way of the testing regime, to the bidirectional optoelectronic transducer 14 assigned to the second channel card 10b via the DUT board 8 and the DUT interface 9 to convert the second signal 12 from the electrical domain 12a to the optical domain 12b. Hence, the same bidirectional optoelectronic transducer 14 that converted the first signal 11 from the optical domain lib to the electrical domain 11a will be reused.

[0071] The second signal 12 is transmitted to the bidirectional optoelectronic transducer 14 assigned to the first channel card 10a via the DUT board 8 and the DUT interface 9 to convert the second signal 12 from the optical domain 12b back into the electrical domain 12a. For this conversion, the same bidirectional optoelectronic transducer 14 is used that converted the first signal 11 from the electrical domain 11a to the optical domain lib.

[0072] Afterwards conversion to the electrical domain the second signal 12 is transmitted to the first channel card 10a via the DUT board 8 and the DUT interface 9 and / or further to the controller 2 for evaluation and / or analysing as described above.

[0073] In a further embodiment, the first optoelectronic transducer 13a and / or the second optoelectronic transducer 13b and / or the bidirectional optoelectronic transducer 14 do not comprise a laser diode 16 or a light emitting diode. The light for transducing the signal in the electrical domain to the optical domain is instead provided by a central light source being remote to the test head 3 or being remote to the whole automatic test equipment system . The external light source may be connected to the first optoelectronic transducer 13a and / or the second optoelectronic transducer 13b and / or the bidirectional optoelectronic transducer 14 by means of an optical fibre, or other suitable connection.

[0074] As delineated above, the optoelectronic unit 6 may be used in the ATE system 1 to route signals 11, 12 from a first channel card 10a to a second channel card 10b and vice versa. For use in other ATE systems, the optoelectronic unit 6 simply needs to be connected to the DUT board 8 of the other ATE system or, if the optoelectronic unit 6 is an integral part of the DUT board 8, the DUT board 8 of said ATE system may be exchanged by the DUT board 8 comprising the 15 M / ADVA-020-PC optoelectronic unit 6. Hence, the optoelectronic unit 6 may be used in any ATE system for testing certain components, e.g. channel cards, of the ATE system.

[0075] List of reference signs

[0076] 1 automatic test equipment system

[0077] 2 controller

[0078] 3 test head

[0079] 5 data link

[0080] 6 optoelectronic unit

[0081] 6a optical circuit

[0082] 6b processing unit

[0083] 8 DUT board

[0084] 9 DUT interface lOa-n channel card

[0085] 11 first signal

[0086] 11a electrical form of first signal lib optical form of first signal

[0087] 12 second signal

[0088] 12a electrical form of second signal

[0089] 12b optical form of second signal

[0090] 13a optoelectronic transducer

[0091] 13b optoelectronic transducer

[0092] 14 bidirectional optoelectronic transducer

[0093] 15 laser diode

[0094] 16 photodiode

[0095] 17 optical switch

[0096] 18 signal processing unit

[0097] 19 bidirectional transducer

Claims

August 9, 2024ADVANTEST CORPORATION M / ADVA-020-PC PA / TY / mlOPTOELECTRONIC UNIT FOR USE WITH AN AUTOMATIC TEST EQUIPMENT SYSTEMClaims1. An optoelectronic unit (6) for use with an automatic test equipment system (1), the automatic test equipment system (1) comprising a plurality of channel cards (lOa-n), wherein the optoelectronic unit (6) comprises at least one optical circuit (6a) and a plurality of optoelectronic transducers (13a, 13b, 14), wherein the optoelectronic unit (6) is adapted to connect with contacts of the automatic test equipment system (1), and wherein the optoelectronic unit (6) is configured to transfer signals originating from at least one first channel card (10a) of the plurality of channel cards (lOa-n) to at least one second channel card (10b) of the plurality of channel cards (lOa-n) or back to the first channel card (10a) and / or from the at least one second channel card (10b) to the at least one first channel card (10a) or back to the second channel card (10b).

2. Optoelectronic unit (6) according to claim 1, wherein at least one of the plurality of optoelectronic transducers (13a, 13b, 14) is assigned to the first channel card (10a), wherein the at least one optoelectronic transducer (13a, 13b, 14) assigned to the first channel card (10a) is configured to receive signals (11, 12) from and / or transmit signals (11, 12) to the first channel card (10a), and / or wherein at least one of the plurality of optoelectronic transducers (13a, 13b, 14) is assigned to the second channel card (10b), wherein the at least one optoelectronic transducer (13a, 13b, 14) assigned to the second channel card (10b) is configured to receive signals (11, 12) from and / or2 M / ADVA-20-PC transmit signals (11, 12) to the second channel card (10b).

3. Optoelectronic unit (6) according to claim 1 or 2, wherein the plurality of optoelectronic transducers comprise at least one first optoelectronic transducer (13a) being configured to convert signals (11, 12) from the electrical domain (11a, 12a) to the optical domain (lib, 12b), and / or at least one second optoelectronic transducer (13b) being configured to convert signals (11, 12) in the optical domain (lib, 12b) to the electrical domain (11a, 12a).

4. Optoelectronic unit (6) according any one of the preceding claims, wherein the plurality of optoelectronic transducers comprise bidirectional transducers (14) configured to convert signals (11, 12) from the electrical domain (11a, 12a) to the optical domain (lib, 12b) and to convert signals (11, 12) from the optical domain (lib, 12b) to the electrical domain (11a, 12a).

5. Optoelectronic unit (6) according any one of the preceding claims, wherein the at least one optoelectronic transducer ( 13b, 14) comprises a photodiode (16) to convert the signals (11, 12) from the optical domain (lib, 12b) to the electrical domain (11a, 12a).

6. Optoelectronic unit (6) according any one of the preceding claims, wherein the at least one optoelectronic transducer ( 13a, 14) comprises a laser diode (15) and / or a light-emitting diode to convert the signals (11, 12) from the electrical domain (11a, 12a) to the optical domain (lib, 12b).

7. Optoelectronic unit (6) according any one of the preceding claims, wherein a light source is provided being connected to the at least one optoelectronic transducer (13b, 14).

8. Optoelectronic unit (6) according to any one of the preceding claims, wherein the optoelectronic unit (6) performs signal processing of the signals (11, 12) in the optical domain (lib, 12b) and / or in the electrical domain (11a, lib).3 M / ADVA-20-PC9. Optoelectronic unit (6) according to any of the preceding claims, wherein the plurality of optoelectronic transducers (13a, 13b, 14) are, at least partially, interconnected by the optoelectronic unit (6).

10. Optoelectronic unit (6) according to any one of the preceding claims, wherein the optoelectronic unit (6) comprises a plurality of optical fibres and / or of optical switches.

11. Optoelectronic unit (6) according to any one of the preceding claims, wherein the at least one optical unit (6) is reconfigurable.

12. Automatic test equipment system (1) comprising a plurality of channel cards (lOa-n), a device under test (DUT) board (8), and an optoelectronic unit (6) according to any one of the preceding claims, wherein at least one first channel card (10a) of the plurality of channel cards (lOa-n) and at least one second channel card (10b) of the plurality of channel cards (lOa-n) are provided, wherein preferably the automatic test equipment system (1) is configured to test the at least one second channel card (10b), wherein the automatic test equipment system (1) is configured to:- transmit a first signal (11) from the first channel card (10a) to the second channel card (10b) via the optoelectronic unit (6), and / or- transmit a second signal (12) from the second channel card (10b) to the first channel card (10a) via the optoelectronic unit (6),- evaluate and / or analyse the first signal (11) and / or the second signal (12).

13. Automatic test equipment system (1) according to claim 12, wherein the second channel card (12) transmits the second signal (12) in response to the first signal.

14. Automatic test equipment system (1) according to claim 12 or 13, wherein the second channel card (10b) receives the first signal (11) and performs operations and / or procedures and / or processing based on the first signal (11), wherein in particular the second signal (12) transmitted by the second channel card (10b) contains results and / or information4 M / ADVA-20-PC about the performed operations and / or procedures and / or processing.

15. Automatic test equipment system (1) according to claims 12-14, wherein the optoelectronic unit (6) is an integral part of the device under test (DUT) board (8) or is attached to or attachable to the device under test (DUT) board (8).

16. Automatic test equipment system (1) according to claims 12-15, wherein the automatic test equipment system (1) is further configured to:- transmit the first signal (11) from the first channel card (10a) to the optoelectronic unit (6) in electrical domain (11a),- transfer the first signal (11) from the electrical domain (11a) into an optical domain (lib) by means of the at least one optoelectronic transducer (13a, 14) assigned to the first channel card (10a),- transmit the first signal (11) in the optical domain (lib) via the at least one optical circuit (6a) to the at least one optical transducer (13b, 14) assigned to the second channel card (10b), and- convert the first signal (11) from the optical domain (lib) into the electrical domain (11a) by means of the at least one optoelectronic transducer (13b, 14) assigned to the second channel card (10b).

17. Automatic test equipment system (1) according to claims 12-16, wherein the automatic test equipment system (1) is further configured to:- transmit the second signal (12) from the second channel card (10b) to the optoelectronic unit (6) in electrical domain (12a),- transfer the second signal (12) from the electrical domain (12a) into an optical domain (12b) by means of the at least one optoelectronic transducer (13a, 14) assigned to the second channel card (10b),- transmit the second signal (12) in the optical domain (12b) via the at least one optical circuit (6a) to the at least one optical transducer (13b, 14) assigned to the first channel card (10a), and- convert the second signal (12) from the optical domain (12b) into the electrical domain (12a) by means of the at least one optoelectronic transducer (13b, 14) assigned to the first channel card (10a).

18. Automatic test equipment system (1) according claims 12-17, wherein the automatic test equipment system (1) further comprises a controller (2) being preferably configured to control the automatic test equipment5 M / ADVA-20-PC system (1) and / or the signal processing and / or the signal routing of the optoelectronic unit (6).

19. Automatic test equipment system (1) according to claims 12-18, wherein the first signal (11) and / or the second signal (12) is transferred to the controller (2), wherein the controller (2) analyses and / or evaluates the second signal (12).

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